Testing device of intelligent power module

Abstract

The invention discloses a test device of an intelligent power module. The test device of the intelligent power module comprises a first test board; a second side, deviating from the first test board, of the second test board in the thickness direction is provided with an installation area; the second side of the second test board is provided with a plurality of test external connection seats, the test external connection seats are suitable for outputting test results, the plurality of test external connection seats are arranged at the outer side of the installation area in the circumferential direction at intervals, and the projection of the first adapter and / or the second adapter on the second side of the second test board is set as adapter projection. The projections of the adapter are arranged between the test external connection seat and the installation area at intervals in the radial direction. Therefore, the plurality of testing external connection seats are arranged, the testing external connection seats are electrically connected with the jacks, and the projections of the adapter seats are radially arranged between the testing external connection seats and the mounting area at intervals, so that the testing device can test the intelligent power module more conveniently and quickly; and the pins of the intelligent power module are not damaged in the testing process.

Description

Technical Field

[0001] The present invention relates to the field of semiconductor technology, and in particular to a testing device for an intelligent power module. Background Art

[0002] In the power semiconductor industry, every time a new intelligent power module is developed, its performance needs to be tested. In order to achieve the performance test of the intelligent power module, a corresponding test device needs to be set up.

[0003] In the related art, when testing the intelligent power module, the intelligent power module is usually welded to the test device. Both installation and disassembly take a lot of time, and frequent disassembly and assembly will cause the solder pad to fall off and cannot be used again, making it impossible to form an efficient and reliable testing method. Summary of the invention

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, one object of the present invention is to provide a test device for an intelligent power module, which has a higher test efficiency.

[0005] The testing device of the intelligent power module according to the embodiment of the present invention comprises: a first test board, a plurality of power supply access sockets are arranged on the first test board, the power supply access sockets are suitable for selectively accessing the power supply for the operation of the intelligent power module to be tested, and a plurality of first adapter sockets are also arranged on the first test board, and the first adapter sockets are electrically connected to the power supply access sockets; a second test board, a plurality of second adapter sockets are arranged on the second test board in the thickness direction toward the first side of the first test board, and the plurality of second adapter sockets are arranged one by one opposite to the plurality of first adapter sockets, one of the first adapter socket and the second adapter socket is a jack socket, and the other is a pin socket, and the jack socket and the pin socket are detachably plugged and electrically connected; the second test board is away from the first test board in the thickness direction. A mounting area is provided on the second side of the test board, and the mounting area is suitable for mounting the intelligent power module to be tested. A plurality of sockets are provided at circumferential intervals on the edge of the mounting area, and the sockets are electrically connected to the second adapter, and the sockets are suitable for being detachably plugged and electrically connected to the pins of the intelligent power module to be tested; a plurality of test external sockets are provided on the second side of the second test board, and the test external sockets are electrically connected to the sockets, and the test external sockets are suitable for outputting test results. The plurality of test external sockets are circumferentially spaced on the outer side of the mounting area, and the projection of the first adapter and / or the second adapter on the second side of the second test board is set as the adapter projection, and the adapter projections are radially spaced between the test external socket and the mounting area.

[0006] Therefore, by arranging multiple test external sockets on the second side of the second test board, the test external sockets are electrically connected to the jacks, and the adapter projections are radially spaced between the test external sockets and the installation area. This not only makes it more convenient and quick for the test device to test the intelligent power module, but also does not damage the pins of the intelligent power module during the test process, thereby improving the structural reliability of the intelligent power module. In some examples of the present invention, the power access socket and the first adapter socket are both arranged on the same side of the thickness direction of the first test board, the projection of the second test board on the first test board is set as the test board projection, and a plurality of the power access sockets are arranged at circumferential intervals on the outer side of the test board projection.

[0007] In some examples of the present invention, the test external socket is a test pin socket, and at least one of the plurality of test pin sockets is selectively short-circuited with a short-circuit cap.

[0008] In some examples of the present invention, the testing device of the intelligent power module also includes a rotating fixing member, a first fixing hole is provided on the first test board, and a second fixing hole is provided on the second test board, the first fixing hole and the second fixing hole correspond to each other and are suitable for corresponding to the mounting hole on the intelligent power module to be tested, and the rotating fixing member is suitable for sequentially penetrating the mounting hole, the second fixing hole and the first fixing hole on the intelligent power module to be tested, and connecting and fixing the intelligent power module to be tested, the first test board and the second test board.

[0009] In some examples of the present invention, the first fixing hole and the second fixing hole are both threaded holes, the rotating fixing member includes a handle portion and a screw portion, the screw portion is suitable for sequentially penetrating the mounting hole, the second fixing hole and the first fixing hole on the intelligent power module to be tested, and the handle portion is arranged at the end of the screw portion away from the first test board.

[0010] In some examples of the present invention, a claw spring is welded on an edge of the second test board corresponding to the installation area, and the plug hole is arranged in the claw spring.

[0011] In some examples of the present invention, the plurality of power supply access sockets include a brake unit power supply access socket, a rectifier unit power supply access socket and an inverter unit power supply access socket, the brake unit power supply access socket is suitable for selectively accessing the power supply for the brake unit of the intelligent power module to be tested, the rectifier unit power supply access socket is suitable for selectively accessing the power supply for the rectifier unit of the intelligent power module to be tested, and the inverter unit power supply access socket is suitable for selectively accessing the power supply for the inverter unit of the intelligent power module to be tested; the plurality of the first adapter sockets include a brake unit The first adapter of the brake unit, the first adapter of the rectifier unit and the first adapter of the inverter unit, the first adapter of the brake unit and the power access socket of the brake unit are electrically connected, the second adapter of the brake unit is electrically connected to the power access socket of the rectifier unit, and the first adapter of the inverter unit is electrically connected to the power access socket of the inverter unit; a plurality of the second adapters include a second adapter of the brake unit, a second adapter of the rectifier unit and a second adapter of the inverter unit, the second adapter of the brake unit is detachably plugged and electrically connected to the first adapter of the brake unit, and the second adapter of the rectifier unit is electrically connected to the first adapter of the inverter unit. The adapter is detachably plugged and electrically connected to the first adapter of the rectifier unit, and the second adapter of the inverter unit is detachably plugged and electrically connected to the first adapter of the inverter unit; the plurality of sockets include a brake unit socket, a rectifier unit socket and an inverter unit socket, the brake unit socket is electrically connected to the second adapter of the brake unit, the rectifier unit socket is electrically connected to the second adapter of the rectifier unit, the inverter unit socket is electrically connected to the second adapter of the inverter unit, and the brake unit socket is suitable for being plugged and electrically connected to the brake unit pin of the intelligent power module to be tested The rectifier unit socket is suitable for being electrically connected to the rectifier unit pins of the intelligent power module to be tested, and the inverter unit socket is suitable for being electrically connected to the inverter unit pins of the intelligent power module to be tested; the multiple test external sockets include a brake unit test external socket, a rectifier unit test external socket and an inverter unit test external socket, the brake unit test external socket is suitable for being electrically connected to the brake unit socket, the rectifier unit test external socket is suitable for being electrically connected to the rectifier unit socket, and the inverter unit test external socket is suitable for being electrically connected to the inverter unit socket.

[0012] In some examples of the present invention, a plurality of the brake unit test external sockets are located at the first end of the first direction of the second test board; a plurality of the inverter unit test external sockets include a plurality of inverter unit upper bridge test external sockets and a plurality of inverter unit lower bridge test external sockets, a plurality of the inverter unit lower bridge test external sockets are located at the first end of the first direction of the second test board and are spaced apart from a plurality of the brake unit power supply access sockets in the second direction, a portion of the plurality of inverter unit upper bridge test external sockets are located at the second end of the first direction of the second test board, and another portion of the plurality of inverter unit upper bridge test external sockets are located at the third end of the second direction of the second test board; a portion of the plurality of rectifier unit test external sockets are located at the fourth end of the second direction of the second test board, and another portion of the plurality of rectifier unit test external sockets are located at the second end of the first direction of the second test board, wherein the first end and the second end of the second test board are arranged relative to each other in the first direction, and the third end and the fourth end of the second test board are arranged relative to each other in the second direction.

[0013] In some examples of the present invention, compared to the inverter unit upper bridge test external socket, the rectifier unit test external socket located at the second end of the second test board in the first direction is closer to the fourth end of the second test board in the second direction.

[0014] In some examples of the present invention, compared to the brake unit test external socket, a portion of the multiple inverter unit lower bridge test external sockets is closer to the third end of the second test board in the second direction, and another portion of the multiple inverter unit lower bridge test external sockets is located between two adjacent brake unit test external sockets. Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which: Figure 1 is a schematic diagram of a testing device for an intelligent power module according to an embodiment of the present invention; Figure 2 is a schematic diagram of a first test board of an intelligent power module according to an embodiment of the present invention; Figure 3 is a schematic diagram of a second test board of an intelligent power module according to an embodiment of the present invention; Figure 4 is a schematic diagram of a second test board of an intelligent power module according to an embodiment of the present invention; Figure 5is a circuit topology diagram of an intelligent power module according to an embodiment of the present invention.

[0016] Reference numerals: 100. Testing device; 10. First test board; 11. Power supply access socket; 111. Brake unit power supply access socket; 112. Rectifier unit power supply access socket; 113. Inverter unit power supply access socket; 12. First adapter; 121. First adapter of brake unit; 122. First adapter of rectifier unit; 123. First adapter of inverter unit; 13. First fixing hole; 20, second test board; 201, first end; 202, second end; 203, third end; 204, fourth end; 21. Second adapter; 211. Second adapter of brake unit; 212. Second adapter of rectifier unit; 213. Second adapter of inverter unit; 22. Installation area; 23, socket; 231, brake unit socket; 232, rectifier unit socket; 233, inverter unit socket; 24, test external socket; 241, brake unit test external socket; 242, rectifier unit test external socket; 243, inverter unit test external socket; 2431, inverter unit upper bridge test external socket; 2432, inverter unit lower bridge test external socket; 25. Second fixing hole; 26. Claw spring; 30. Rotating fixing member; 31. Handle; 40. Short-circuit cap. DETAILED DESCRIPTION

[0017] Embodiments of the present invention are described in detail below. The embodiments described with reference to the accompanying drawings are exemplary. Embodiments of the present invention are described in detail below.

[0018] Reference below Figure 1-Figure 5 A testing device 100 for an intelligent power module according to an embodiment of the present invention is described.

[0019] Combination Figure 1-Figure 4 As shown, the testing device 100 of the intelligent power module according to the present invention may mainly include: a first testing board 10 and a second testing board 20 .

[0020] Among them, the first test board 10 is provided with a plurality of power access sockets 11, and the power access sockets 11 are suitable for selectively connecting to the power supply for the operation of the intelligent power module to be tested. The first test board 10 is also provided with a plurality of first adapter sockets 12, and the first adapter sockets 12 are electrically connected to the power access sockets 11. The second test board 20 is provided with a plurality of second adapter sockets 21 on the first side of the first test board 10 in the thickness direction, and the plurality of second adapter sockets 21 are arranged one by one opposite to the plurality of first adapter sockets 12. One of the first adapter sockets 12 and the second adapter sockets 21 is a socket 23 seat, and the other is a pin seat. The socket 23 seat and the pin seat can be detachably plugged and electrically connected. The second side of the second test board 20 in the thickness direction away from the first test board 10 is provided with an installation area 22, and the installation area 22 is suitable for installing the intelligent power module to be tested. A plurality of sockets 23 are arranged at circumferential intervals on the edge of the installation area 22, and the sockets 23 are electrically connected to the second adapter socket 21. The sockets 23 are suitable for being detachably plugged and electrically connected with the pins of the intelligent power module to be tested.

[0021] Specifically, when the test device 100 is working, it is necessary to electrically connect the first test board 10 and the second test board 20, and then electrically connect the intelligent power module to the second test board 20, so that the first test board 10 can be connected to the power supply for the operation of the intelligent power module to be tested, providing basic support and services, and the second test board 20 is used for gate input and voltage / current measurement, and the pins of the intelligent power module can be led out to the first test board 10 and the second test board 20, so that the power supply input and voltage / current measurement of the intelligent power module can be realized, thereby ensuring the normal operation of the test device 100 of the intelligent power module.

[0022] By arranging a plurality of first adapter seats 12 on the first test board 10 and a plurality of second adapter seats 21 on one side of the first direction of the second test board 20, a detachable plug-in electrical connection between the first test board 10 and the second test board 20 can be achieved through the plug-in cooperation between the first adapter seats 12 and the second adapter seats 21, which can not only ensure the stability of the electrical connection and improve the reliability of the test device 100, but also facilitate the dismantling of the first test board 10 and the second test board 20, and facilitate replacement and upgrading.

[0023] Among them, one of the first adapter seat 12 and the second adapter seat 21 can be a socket seat, and the other can be a pin seat. It can be understood that the socket seat is provided with a plurality of sockets, and the pin seat is provided with a plurality of pins, so that only the pins need to be inserted into the sockets to achieve the plug-in matching between the first adapter seat 12 and the second adapter seat 21, which can not only improve the speed and accuracy, improve the assembly efficiency of the test device 100, but also improve the stability and reliability, and improve the reliability of the test device 100.

[0024] Furthermore, by providing an installation area 22 on the second side of the second test board 20 away from the first test board 10 in the thickness direction, and providing a plurality of sockets 23 at circumferential intervals at the edge of the installation area 22, the sockets 23 are electrically connected to the second adapter 21, so that the intelligent power module to be tested can be set in the installation area 22, and the pins of the tested intelligent power module can be detachably plugged and electrically connected to the sockets 23, so that the installation of the intelligent power module to be tested on the test device 100 can be achieved, and the detachable electrical connection of the intelligent power module on the second test board 20 and even the test device 100 can be achieved, thereby reducing the inconvenience caused by welding and disassembly, facilitating the installation and replacement of the intelligent power module, and improving the convenience of testing.

[0025] In addition, a plurality of test external sockets 24 are arranged on the second side of the second test board 20. The test external sockets 24 are electrically connected to the socket 23. The test external sockets 24 are suitable for outputting test results. The plurality of test external sockets 24 are arranged circumferentially at intervals on the outer side of the installation area 22. The projection of the first adapter seat 12 and / or the second adapter seat 21 on the second side of the second test board 20 is set as the adapter seat projection. The adapter seat projection is radially spaced between the test external socket 24 and the installation area 22.

[0026] Specifically, after the test device 100 tests the parameters of the intelligent power module, it is necessary to output the test results through the output device. By setting a plurality of test external sockets 24 on the second side of the second test board 20, the test external sockets 24 are electrically connected to the jacks 23, so that only the output device needs to be electrically connected to the test external sockets 24, and there is no need to connect the output device to the pins of the intelligent power module, so that the electrical connection between the test device 100 and the output device can be achieved, and the test results can be output, so that not only the test device 100 can test the intelligent power module more conveniently and quickly, but also the pins of the intelligent power module will not be damaged during the test process, and the structural reliability of the intelligent power module can be improved.

[0027] Furthermore, multiple test external sockets 24 are arranged at circumferential intervals on the outer side of the installation area 22, and the projections of the first adapter 12 and the second adapter 21 on the second side of the second test board 20 are set as adapter projections, and the adapter projections are radially spaced between the test external sockets 24 and the installation area 22. In this way, the relative positions of the first adapter 12, the second adapter 21, the test external socket 24 and the installation area 22 can be optimized, so that the installation area 22 is located on the inside and the test external socket 24 is located on the outside, thereby facilitating the arrangement of the intelligent power module on the test device 100 and the electrical connection between the output device and the test external socket 24, thereby avoiding the problem of misconnection and improving the reliability of the test device 100.

[0028] Therefore, by arranging a plurality of test external sockets 24 on the second side of the second test board 20, the test external sockets 24 are electrically connected to the sockets 23, and the adapter projections are radially spaced between the test external sockets 24 and the mounting area 22. This not only makes it more convenient and quick for the test device 100 to test the intelligent power module, but also does not cause damage to the pins of the intelligent power module during the test process, thereby improving the structural reliability of the intelligent power module.

[0029] Combination Figure 1-Figure 4 As shown, the power supply socket 11 and the first adapter socket 12 are both arranged on the same side of the thickness direction of the first test board 10, and the projection of the second test board 20 on the first test board 10 is set as the test board projection, and multiple power supply sockets 11 are arranged circumferentially at intervals on the outer side of the test board projection.

[0030] Specifically, the power supply socket 11 and the first adapter socket 12 can be set on the same side of the thickness direction of the first test board 10. When assembling the test device 100, this side of the first test board 10 is set toward the second test external socket 24, and the first adapter socket 12 is electrically connected to the second adapter socket 21 by plugging.

[0031] In addition, the projection of the second test board 20 on the first test board 10 is set as the test board projection, and multiple power access sockets 11 are arranged at circumferential intervals on the outer side of the test board projection, that is: after the first test board 10 and the second test board 20 are connected, in the thickness direction, the second test board 20 does not cover the power access socket 11, so that it is convenient to position the power access socket 11 and connect the power access socket 11 to the power supply, which can make the power connection of the test device 100 more convenient and reliable.

[0032] Combination Figure 1 and Figure 3 As shown, the test external socket 24 is a test pin socket, and at least one of the plurality of test pin sockets is selectively inserted into and short-circuited with the short-circuit cap 40 .

[0033] Specifically, when performing parameter testing on the inverter unit of the intelligent power module and testing one of the inverter chips in the inverter unit, in order to avoid mis-conduction of other inverter chips, the gate and emitter of other inverter chips need to be short-circuited by welding to ensure that they are in the off state.

[0034] Different from the prior art that uses welding to short-circuit, which requires frequent wire welding, not only is the test device complicated and the test efficiency low, but also due to frequent wire welding, the module is in direct contact with the high temperature of the electric soldering iron, which can easily damage the IGBT module. The present application sets the test external socket 24 as a test pin socket, and the test circuit can be built by connecting the short-circuit cap 40 to the test external socket 24, and the test switching of different inverter chips in the inverter unit can be realized by only switching the connection between the short-circuit cap 40 and different test external sockets 24. Not only can the test be made more convenient and quick, the test efficiency can be improved, but also the structural reliability of the intelligent power module can be guaranteed.

[0035] Combination Figure 1-Figure 4 As shown, the testing device 100 for the intelligent power module may also include a rotating fixture 30, a first fixing hole 13 is provided on the first test board 10, and a second fixing hole 25 is provided on the second test board 20, the first fixing hole 13 and the second fixing hole 25 correspond to each other and are suitable for corresponding to the mounting hole on the intelligent power module to be tested, and the rotating fixture 30 is suitable for sequentially penetrating the mounting hole, the second fixing hole 25 and the first fixing hole 13 on the intelligent power module to be tested, and connecting and fixing the intelligent power module to be tested, the first test board 10 and the second test board 20.

[0036] In this way, when the intelligent power module with test is set on the test device 100 and the pins of the intelligent power module are inserted into the jacks 23 accordingly to test the parameters of the intelligent power module, the mounting hole on the intelligent power module, the second fixing hole 25 on the second test board 20, and the first fixing hole 13 on the first test board 10 can also be made to correspond to each other, and then the rotating fixing part 30 is sequentially passed through the mounting hole, the second fixing hole 25 and the first fixing hole 13 and tightened, so that the intelligent power module to be tested, the second test board 20 and the first test board 10 can be connected and fixed, which can improve the stability of the installation and setting of the intelligent power module on the test device 100 and ensure the reliable progress of the test process.

[0037] Furthermore, the first fixing hole 13 and the second fixing hole 25 are both threaded holes, and the rotating fixing member 30 can mainly include a handle portion 31 and a screw portion, and the screw portion is suitable for sequentially penetrating the mounting hole, the second fixing hole 25 and the first fixing hole 13 on the intelligent power module to be tested, and the handle portion 31 is arranged at the end of the screw portion away from the first test board 10.

[0038] Specifically, by making the first fixing hole 13 and the second fixing hole 25 both threaded holes, the rotating fixing member 30 can mainly include a handle portion 31 and a screw portion that are linked to each other. In this way, when the intelligent power module to be tested is set on the test device 100, the staff can operate the handle portion 31 to make the screw portion pass through the mounting hole, and rotate the rotating fixing member 30 to make the screw portion threadedly connected to the second fixing hole 25 and the first fixing hole 13 in turn, so that the intelligent power module to be tested can be detachably fixed on the test device 100, which not only makes the fixation of the intelligent power module to be tested on the test device 100 simpler and more reliable, but also facilitates the disassembly of the intelligent power module to be tested on the test device 100, and further facilitates the test switching of different intelligent power modules.

[0039] Combination Figure 1 and Figure 4 As shown, a claw spring 26 is welded on the edge of the second test board 20 corresponding to the mounting area 22 , and an insertion hole 23 is provided in the claw spring 26 .

[0040] Specifically, a claw spring 26 can be welded on the edge of the second test board 20 corresponding to the installation area 22, and a socket 23 is set in the claw spring 26. It can be understood that the claw spring 26 has good elasticity and conductivity. In this way, when the intelligent power module is set in the installation area 22, the pin of the intelligent power module can be inserted into the socket 23 of the claw spring 26. The claw spring 26 elastically cooperates with the pin, and the claw spring 26 can tightly clamp the pin, thereby improving the stability and reliability of the electrical connection between the pin of the intelligent power module and the test device 100.

[0041] Furthermore, the claw spring 26 is reusable and can adapt to multiple testing operations of the test device 100 and can be plugged in and out multiple times without being easily damaged, thereby effectively improving the working efficiency and reliability of the test device 100 .

[0042] Combination Figure 2-Figure 4 As shown, the multiple power supply sockets 11 may include a brake unit power supply socket 111, a rectifier unit power supply socket 112, and an inverter unit power supply socket 113. The brake unit power supply socket 111 is suitable for selectively connecting to the power supply for the brake unit of the intelligent power module to be tested, the rectifier unit power supply socket 112 is suitable for selectively connecting to the power supply for the rectifier unit of the intelligent power module to be tested, and the inverter unit power supply socket 113 is suitable for selectively connecting to the power supply for the inverter unit of the intelligent power module to be tested.

[0043] The plurality of first adapters 12 may include a brake unit first adapter 121, a rectifier unit first adapter 122, and an inverter unit first adapter 123. The brake unit first adapter 121 is electrically connected to the brake unit power supply access socket 111, the brake unit second adapter 211 is electrically connected to the rectifier unit power supply access socket 112, and the inverter unit first adapter 123 is electrically connected to the inverter unit power supply access socket 113. Optionally, some brake unit first adapters 121 and some inverter unit first adapters 123 may be integrated.

[0044] The plurality of second adapters 21 may include a brake unit second adapter 211, a rectifier unit second adapter 212, and an inverter unit second adapter 213. The brake unit second adapter 211 is detachably plugged and electrically connected to the brake unit first adapter 121, the rectifier unit second adapter 212 is detachably plugged and electrically connected to the rectifier unit first adapter 122, and the inverter unit second adapter 213 is detachably plugged and electrically connected to the inverter unit first adapter 123.

[0045] The plurality of sockets 23 may include a brake unit socket 231, a rectifier unit socket 232, and an inverter unit socket 233. The brake unit socket 231 is electrically connected to the brake unit second adapter 211, the rectifier unit socket 232 is electrically connected to the rectifier unit second adapter 212, the inverter unit socket 233 is electrically connected to the inverter unit second adapter 213, the brake unit socket 231 is suitable for being plugged and electrically connected to the brake unit pin of the intelligent power module to be tested, the rectifier unit socket 232 is suitable for being plugged and electrically connected to the rectifier unit pin of the intelligent power module to be tested, and the inverter unit socket 233 is suitable for being plugged and electrically connected to the inverter unit pin of the intelligent power module to be tested.

[0046] The plurality of test external sockets 24 may include a brake unit test external socket 241, a rectifier unit test external socket 242, and an inverter unit test external socket 243. The brake unit test external socket 241 is suitable for being electrically connected to the brake unit socket 231, the rectifier unit test external socket 242 is suitable for being electrically connected to the rectifier unit socket 232, and the inverter unit test external socket 243 is suitable for being electrically connected to the inverter unit socket 233.

[0047] As described above, the assembly of the test device 100 can be achieved through the sequential electrical connection between the brake unit power supply access socket 111, the brake unit first adapter socket 121, the brake unit second adapter socket 211, the brake unit jack 231 and the brake unit test external socket 241, as well as the sequential electrical connection between the rectifier unit power supply access socket 112, the rectifier unit first adapter socket 122, the rectifier unit second adapter socket 212, the rectifier unit jack 232 and the intelligent power module test external socket 24, and the sequential electrical connection between the inverter unit power supply access socket 113, the inverter unit first adapter socket 123, the inverter unit second adapter socket 213, the inverter unit jack 233 and the inverter unit test external socket 243.

[0048] In this way, when the intelligent power module to be tested is set on the test device 100, it is only necessary to electrically connect the inverter unit of the intelligent power module to the inverter unit jack 233, to electrically connect the rectifier unit of the intelligent power module to the rectifier unit jack 232, and to electrically connect the inverter unit of the intelligent power module to the inverter unit jack 233. This can achieve accurate setting of each unit of the intelligent power module to be tested on the test device 100, which is convenient for the test device 100 to test and output the parameters of each unit of the intelligent power module.

[0049] Combination Figure 3 As shown, the multiple inverter unit test external sockets 243 may include multiple inverter unit upper bridge test external sockets 2431 and multiple inverter unit lower bridge test external sockets 2432. Specifically, the inverter unit includes six inverter chips, and the inverter chip may include an upper bridge inverter chip and a lower bridge inverter chip. There are three upper bridge inverter chips and three lower bridge inverter chips. The three upper bridge inverter chips correspond to the three lower bridge inverter chips one by one. An upper bridge inverter chip and a lower bridge inverter chip are connected in series to form an inverter group, and the three inverter groups are arranged in parallel with each other. The three inverter groups correspond to the U phase, the V phase and the W phase respectively.

[0050] By making multiple inverter unit test external sockets 243 include multiple inverter unit upper bridge test external sockets 2431 and multiple inverter unit lower bridge test external sockets 2432, the inverter unit upper bridge test external sockets 2431 can correspond to the test data of the output upper bridge inverter chip, and the inverter unit lower bridge test external sockets 2432 can correspond to the test data of the output lower bridge inverter chip.

[0051] Combination Figure 3As shown, multiple brake unit test external sockets 241 are located at the first end 201 of the first direction of the second test board 20, multiple inverter unit lower bridge test external sockets 2432 are located at the first end 201 of the first direction of the second test board 20 and are spaced apart from multiple brake unit power supply access sockets 111 in the second direction, a portion of the multiple inverter unit upper bridge test external sockets 2431 are located at the second end 202 of the first direction of the second test board 20, another portion of the multiple inverter unit upper bridge test external sockets 2431 are located at the third end 203 of the second direction of the second test board 20, a portion of the multiple rectifier unit test external sockets 242 are located at the fourth end 204 of the second direction of the second test board 20, and another portion of the multiple rectifier unit test external sockets 242 are located at the second end 202 of the first direction of the second test board 20, wherein the first end 201 and the second end 202 of the second test board 20 are arranged relative to each other in the first direction, and the third end 203 and the fourth end 204 of the second test board 20 are arranged relative to each other in the second direction.

[0052] In this way, the layout of multiple brake unit test external sockets 241, multiple inverter unit lower bridge test external sockets 2432, multiple inverter unit upper bridge test external sockets 2431, and multiple rectifier unit test external sockets 242 on the second test board 20 can be more uniform and reasonable, so that the multiple test external sockets 24 can be adapted to the layout of the brake unit, inverter unit and rectifier unit inside the intelligent power module, thereby facilitating the setting of the intelligent power module to be tested on the test device 100.

[0053] Combination Figure 3 As shown, compared with the inverter unit upper bridge test external socket 2431, the rectifier unit test external socket 242 located at the second end 202 in the first direction of the second test board 20 is closer to the fourth end 204 of the second test board 20 in the second direction. In this way, the layout of the multiple inverter unit upper bridge test external sockets 2431 and the multiple rectifier unit test external sockets 242 located at the second end 202 in the first direction of the second test board 20 can be made more reasonable, so that they are compatible with the layout of the inverter unit and the rectifier unit inside the intelligent power module.

[0054] Combination Figure 3 As shown, compared with the brake unit test external socket 241, a part of the multiple inverter unit lower bridge test external sockets 2432 is closer to the third end 203 of the second test board 20 in the second direction, and another part of the multiple inverter unit lower bridge test external sockets 2432 is located between two adjacent brake unit test external sockets 241. In this way, the layout of the multiple inverter unit lower bridge test external sockets 2432 and the multiple brake unit test external sockets 241 located at the second end 202 in the first direction of the second test board 20 can be made more reasonable, so that they are compatible with the layout of the inverter unit and the brake unit inside the intelligent power module.

[0055] Combination Figure 1-Figure 5 As shown, the inverter chip of the intelligent power module is IGBT (Insulate-Gate Bipolar Transistor), and the test device 100 tests the on-state voltage drop of the IGBT4 of the intelligent power module as an example. The jacks 23 and the test external sockets 24 can be numbered on the first test board 10 and the second test board 20 so that they correspond to the pin numbers inside the intelligent power module.

[0056] First, the test external sockets 24 labeled 15 and 17 need to be short-circuited, the test external sockets 24 labeled 6 and 7 need to be short-circuited, the test external sockets 24 labeled 13 and 17 need to be short-circuited, the test external sockets 24 labeled 8 and 9 need to be short-circuited, and the test external sockets 24 labeled 12 and 14 need to be short-circuited through the short-circuit caps 40. That is, the gates and emitters of the remaining five non-test IGBTs need to be short-circuited.

[0057] Then, the power supply sockets 11 marked with numbers 18 and 5 of the first test board 10 are electrically connected to the external power supply through banana plugs to realize the power input to the IGBT to be tested.

[0058] Then, the test external sockets 24 labeled 4 and 5 on the second test board 20 are connected to the gate of the IGBT 4 , and the output device is connected to the test external sockets 24 labeled 18 and 5 .

[0059] In this way, the test circuit can be built and the test can be completed with normal input current.

[0060] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0061] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials, or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example.

[0062] Although the embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the claims and their equivalents.

Claims

1. A test device for an intelligent power module, characterized in that: include: A first test board (10), wherein the first test board (10) is provided with a plurality of power supply sockets (11), wherein the power supply sockets (11) are suitable for selectively connecting to a power supply for operating an intelligent power module to be tested, and the first test board (10) is further provided with a plurality of first adapter sockets (12), wherein the first adapter sockets (12) are electrically connected to the power supply sockets (11); A second test board (20), wherein a plurality of second adapter seats (21) are arranged on a first side of the second test board (20) in a thickness direction facing the first test board (10), the plurality of second adapter seats (21) are arranged opposite to the plurality of first adapter seats (12) one by one, one of the first adapter seats (12) and the second adapter seats (21) is a socket seat, and the other is a pin seat, and the socket seat and the pin seat are detachably plugged and electrically connected; A mounting area (22) is provided on a second side of the second test board (20) in a thickness direction facing away from the first test board (10), the mounting area (22) being suitable for mounting an intelligent power module to be tested, a plurality of plug holes (23) are provided at intervals along a circumference of an edge of the mounting area (22), the plug holes (23) being electrically connected to the second adapter (21), and the plug holes (23) being suitable for being detachably plugged and electrically connected to pins of the intelligent power module to be tested; The second side of the second test board (20) is provided with a plurality of test external sockets (24), the test external sockets (24) being electrically connected to the socket (23), the test external sockets (24) being suitable for outputting test results, the plurality of test external sockets (24) being arranged at intervals in the circumferential direction on the outer side of the mounting area (22), the projection of the first adapter seat (12) and / or the second adapter seat (21) on the second side of the second test board (20) being set as the adapter seat projection, the adapter seat projection being arranged at intervals in the radial direction between the test external sockets (24) and the mounting area (22).

2. The test device for the intelligent power module according to claim 1, characterized in that: The power supply socket (11) and the first adapter socket (12) are both arranged on the same side of the first test board (10) in the thickness direction, the projection of the second test board (20) on the first test board (10) is set as the test board projection, and a plurality of the power supply sockets (11) are arranged at intervals in the circumferential direction outside the test board projection.

3. The testing device for the intelligent power module according to claim 1, characterized in that: The test external connection seat (24) is a test pin seat, and at least one of the plurality of test pin seats is selectively inserted into a short-circuit cap (40) for short-circuiting.

4. The testing device for the intelligent power module according to claim 1, characterized in that: The invention also comprises a rotating fixing member (30), wherein the first test board (10) is provided with a first fixing hole (13), and the second test board (20) is provided with a second fixing hole (25), the first fixing hole (13) and the second fixing hole (25) correspond to each other and are suitable for corresponding to the mounting hole on the intelligent power module to be tested, and the rotating fixing member (30) is suitable for sequentially penetrating the mounting hole on the intelligent power module to be tested, the second fixing hole (25), and the first fixing hole (13), and connecting and fixing the intelligent power module to be tested, the first test board (10), and the second test board (20).

5. The testing device for the intelligent power module according to claim 4, characterized in that: The first fixing hole (13) and the second fixing hole (25) are both threaded holes, the rotating fixing member (30) comprises a handle portion (31) and a screw portion, the screw portion being suitable for sequentially penetrating a mounting hole on an intelligent power module to be tested, the second fixing hole (25), and the first fixing hole (13), the handle portion (31) being arranged at an end of the screw portion away from the first test board (10).

6. The testing device for the intelligent power module according to claim 1, characterized in that: A claw spring (26) is welded to the edge of the second test plate (20) corresponding to the installation area (22), and the insertion hole (23) is arranged in the claw spring (26).

7. The testing device for an intelligent power module according to claim 1, characterized in that: The plurality of power supply access sockets (11) include a brake unit power supply access socket (111), a rectifier unit power supply access socket (112) and an inverter unit power supply access socket (113); the brake unit power supply access socket (111) is suitable for selectively accessing a power supply for operating a brake unit of an intelligent power module to be tested; the rectifier unit power supply access socket (112) is suitable for selectively accessing a power supply for operating a rectifier unit of an intelligent power module to be tested; and the inverter unit power supply access socket (113) is suitable for selectively accessing a power supply for operating an inverter unit of an intelligent power module to be tested; The plurality of first adapters (12) include a first adapter for a brake unit (121), a first adapter for a rectifier unit (122), and a first adapter for an inverter unit (123); the first adapter for the brake unit (121) is electrically connected to the brake unit power supply access socket (111); the second adapter for the brake unit (211) is electrically connected to the rectifier unit power supply access socket (112); and the first adapter for the inverter unit (123) is electrically connected to the inverter unit power supply access socket (113); The plurality of second adapters (21) include a brake unit second adapter (211), a rectifier unit second adapter (212) and an inverter unit second adapter (213); the brake unit second adapter (211) is detachably plugged and electrically connected to the brake unit first adapter (121); the rectifier unit second adapter (212) is detachably plugged and electrically connected to the rectifier unit first adapter (122); and the inverter unit second adapter (213) is detachably plugged and electrically connected to the inverter unit first adapter (123); The plurality of sockets (23) include a brake unit socket (231), a rectifier unit socket (232) and an inverter unit socket (233); the brake unit socket (231) is electrically connected to the brake unit second adapter (211); the rectifier unit socket (232) is electrically connected to the rectifier unit second adapter (212); the inverter unit socket (233) is electrically connected to the inverter unit second adapter (213); the brake unit socket (231) is suitable for being plugged and electrically connected to a brake unit pin of an intelligent power module to be tested; the rectifier unit socket (232) is suitable for being plugged and electrically connected to a rectifier unit pin of an intelligent power module to be tested; and the inverter unit socket (233) is suitable for being plugged and electrically connected to an inverter unit pin of an intelligent power module to be tested; The plurality of test external sockets (24) include a brake unit test external socket (241), a rectifier unit test external socket (242) and an inverter unit test external socket (243); the brake unit test external socket (241) is suitable for being electrically connected to the brake unit socket (231); the rectifier unit test external socket (242) is suitable for being electrically connected to the rectifier unit socket (232); and the inverter unit test external socket (243) is suitable for being electrically connected to the inverter unit socket (233).

8. The testing device for the intelligent power module according to claim 7, characterized in that: A plurality of brake unit test external sockets (241) are located at a first end (201) in a first direction of the second test board (20); The plurality of inverter unit test external sockets (243) include a plurality of inverter unit upper bridge test external sockets (2431) and a plurality of inverter unit lower bridge test external sockets (2432); the plurality of inverter unit lower bridge test external sockets (2432) are located at the first end (201) of the second test board (20) in the first direction and are spaced apart from the plurality of brake unit power supply access sockets (111) in the second direction; a portion of the plurality of inverter unit upper bridge test external sockets (2431) are located at the second end (202) of the second test board (20) in the first direction, and another portion of the plurality of inverter unit upper bridge test external sockets (2431) are located at the third end (203) of the second test board (20) in the second direction; A portion of the plurality of rectifier unit test external sockets (242) is located at the fourth end (204) of the second test board (20) in the second direction, and another portion of the plurality of rectifier unit test external sockets (242) is located at the second end (202) of the second test board (20) in the first direction, wherein the first end (201) and the second end (202) of the second test board (20) are arranged relative to each other in the first direction, and the third end (203) and the fourth end (204) of the second test board (20) are arranged relative to each other in the second direction.

9. The testing device for the intelligent power module according to claim 9, characterized in that: Compared to the inverter unit upper bridge test external socket (2431), the rectifier unit test external socket (242) located at the second end (202) in the first direction of the second test board (20) is closer to the fourth end (204) of the second test board (20) in the second direction.

10. The testing device for the intelligent power module according to claim 9, characterized in that: Compared to the brake unit test external socket (241), a portion of the multiple inverter unit lower bridge test external sockets (2432) are closer to the third end (203) of the second test board (20) in the second direction, and another portion of the multiple inverter unit lower bridge test external sockets (2432) are located between two adjacent brake unit test external sockets (241).

Images