Expression editing method and device, electronic equipment and storage medium
By performing combined operations and fast parsing of expression algorithms in the expression editor, the problem of slow analysis and calculation speed in wafer defect detection in the prior art is solved, and more accurate defect detection and product quality improvement are achieved.
Patent Information
- Application Number
- CN202411583584.X
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2024-11-07
- Publication Date
- 2025-02-25
AI Technical Summary
The prior art has slow parsing and computing speed when editing expressions in wafer defect detection, which cannot meet the user's need to not disclose the calculation method, resulting in insufficient accuracy of defect detection.
By directly inputting the expression algorithm in a unified format directly on the panel of the expression editor page, the expression algorithm is combined to obtain the target expression algorithm of the wafer data and performing rapid analysis to determine the defects of the wafer data.
It realizes rapid analysis and more accurate defect detection, improving product quality.
Smart Images
Figure CN119512426A_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the field of computer technology, and in particular to an expression editing method, device, electronic device and storage medium. Background Art
[0002] In the fields of computer and education, it is usually necessary to input computer and mathematical expressions, so the corresponding expression editor is needed. In the process of wafer defect detection, the historical collected data is usually queried. According to the data characteristics of the parameters, an algorithm is created under the parameters or the expression algorithm is obtained by editing the expression, so that in actual production, new values can be calculated according to the expression algorithm for defect detection. However, the existing technology for editing expressions is direct parsing, and the parsing and calculation are relatively slow. When users have undisclosed calculation methods in production, directly editing the expression cannot meet the needs. Therefore, how to quickly parse and improve the accuracy of wafer data defect detection has become a technical issue that cannot be underestimated. Summary of the invention
[0003] In view of this, the purpose of the present application is to provide an expression editing method, device, electronic device and storage medium, by directly inputting an expression algorithm in a unified format into the panel of the expression editor page, combining the expression algorithm to obtain the target expression algorithm of the wafer data, and quickly parsing the target expression algorithm, so as to more accurately determine the defects of the wafer data and improve the quality of the product.
[0004] The present application provides a method for editing an expression, the method comprising:
[0005] Obtain the wafer data to be detected, and detect whether there is an expression algorithm corresponding to the wafer data to be detected among the multiple first reference expression algorithms in the drop-down box options on the expression editor page;
[0006] If it does not exist, multiple second reference expression algorithms are screened out from the multiple first reference expression algorithms in the drop-down box options, and the multiple second reference expression algorithms are combined and analyzed to determine the target expression algorithm of the wafer data to be detected;
[0007] The wafer data to be inspected is processed based on the target expression algorithm to determine a result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
[0008] In a possible implementation manner, the combining operation and parsing of the plurality of second reference expression algorithms to determine the target expression algorithm for the wafer data to be inspected includes:
[0009] Performing a combination operation on a plurality of said second reference expression algorithms based on a conditional judgment and / or an operation operator selected by a user to determine a combined expression algorithm;
[0010] The combined expression algorithm is parsed based on a grammar rule parser to determine a parsing result;
[0011] Based on the parsing result, it is determined whether the combined expression algorithm is a target expression algorithm.
[0012] In a possible implementation manner, determining whether the combined expression algorithm is a target representation algorithm based on the parsing result includes:
[0013] If the parsing result is failure, the combined expression algorithm is modified and parsed again;
[0014] If the parsing result is successful, the combined expression algorithm is used as the target expression algorithm.
[0015] In a possible implementation manner, multiple second reference expression algorithms are screened out from multiple first reference expression algorithms in the drop-down box options, multiple second reference expression algorithms are combined and tested, and after the target expression algorithm of the wafer data to be detected is determined, the expression editing method further includes:
[0016] Edit and modify the target expression algorithm based on user needs in the expression editing area to generate a modified expression algorithm, and set parameter values of the edited and modified target expression algorithm in the expression parameter setting area;
[0017] Based on the grammar rule parser, the modified expression algorithm and parameter values are parsed to determine the parsing result;
[0018] If the analysis result is successful, the wafer data to be inspected is processed based on the modified expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
[0019] In a possible implementation manner, the target expression algorithm is edited and modified based on user needs in the expression editing area, including:
[0020] During the process of editing and modifying the target expression algorithm, if the edited and modified target expression algorithm does not conform to the grammatical rules, an error reminder will be given in the expression editing area, and the information on the grammatical rule errors will be marked with colors.
[0021] In a possible implementation manner, the first reference expression algorithm is constructed by the following steps:
[0022] Obtain a code file uploaded to a backend service interface, verify and parse the code file, and determine a first reference expression algorithm in the code file;
[0023] On the expression management page, the first reference expression algorithm is added based on the algorithm name of the first reference expression algorithm, so that the algorithm name of the first reference expression algorithm is displayed in the drop-down box option, and the definition content of the first reference expression algorithm is displayed in the expression editing area.
[0024] The embodiment of the present application also provides an expression editing device, the expression editing device comprising:
[0025] A detection module is used to obtain wafer data to be detected, and detect whether there is an expression algorithm corresponding to the wafer data to be detected in multiple first reference expression algorithms in the drop-down box options on the expression editor page;
[0026] An expression algorithm combination module is used to select multiple second reference expression algorithms from multiple first reference expression algorithms in the drop-down box options if they do not exist, perform combination operations and analytical processing on the multiple second reference expression algorithms, and determine the target expression algorithm for the wafer data to be detected;
[0027] The processing module is used to process the wafer data to be inspected based on the target expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
[0028] In a possible implementation manner, when the expression algorithm combination module is used to perform a combination operation and analysis processing on the plurality of second reference expression algorithms to determine the target expression algorithm for the wafer data to be detected, the expression algorithm combination module is specifically used to:
[0029] Performing a combination operation on a plurality of said second reference expression algorithms based on a conditional judgment and / or an operation operator selected by a user to determine a combined expression algorithm;
[0030] The combined expression algorithm is parsed based on a grammar rule parser to determine a parsing result;
[0031] Based on the parsing result, it is determined whether the combined expression algorithm is a target expression algorithm.
[0032] An embodiment of the present application also provides an electronic device, comprising: a processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate through the bus, and when the machine-readable instructions are executed by the processor, the steps of the expression editing method as described above are performed.
[0033] An embodiment of the present application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the expression editing method as described above are executed.
[0034] An expression editing method, device, electronic device and storage medium provided in an embodiment of the present application, the expression editing method comprising: obtaining wafer data to be inspected, and detecting whether there is an expression algorithm corresponding to the wafer data to be inspected in the multiple first reference expression algorithms in the drop-down box options of the expression editor page; if not, screening out multiple second reference expression algorithms from the multiple first reference expression algorithms in the drop-down box options, and performing combination operations and analysis processing on the multiple second reference expression algorithms to determine the target expression algorithm of the wafer data to be inspected; processing the wafer data to be inspected based on the target expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value. By directly inputting the expression algorithm in a unified format into the panel of the expression editor page, combining the expression algorithm to obtain the target expression algorithm of the wafer data, and quickly parsing the target expression algorithm, the defects of the wafer data can be more accurately determined, thereby improving the quality of the product.
[0035] In order to make the above-mentioned objects, features and advantages of the present application more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS
[0036] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the present application and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these drawings without paying creative work.
[0037] Figure 1 A flowchart of an expression editing method provided in an embodiment of the present application;
[0038] Figure 2 A schematic diagram of an expression editing method provided in an embodiment of the present application;
[0039] Figure 3 One of the structural schematic diagrams of an expression editing device provided in an embodiment of the present application;
[0040] Figure 4 A second structural diagram of an expression editing device provided in an embodiment of the present application;
[0041] Figure 5 A schematic diagram of the structure of an electronic device provided in an embodiment of the present application. DETAILED DESCRIPTION
[0042] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, the technical scheme in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all of the embodiments. The components of the embodiments of the present application usually described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the application claimed for protection, but merely represents the selected embodiments of the present application. Based on the embodiments of the present application, each other embodiment obtained by those skilled in the art without making creative work belongs to the scope of protection of the present application.
[0043] First, the application scenarios to which the present application is applicable are introduced. The present application can be applied in the field of computer technology.
[0044] Research has found that in the fields of computer and education and academics, it is usually necessary to input computers and mathematical expressions, so the corresponding expression editor is needed. In the process of wafer defect detection, the historical collected data is usually queried. According to the data characteristics of the parameters, an algorithm is created under the parameters or the expression algorithm is obtained by editing the expression, so that in actual production, new values can be calculated according to the expression algorithm for defect detection. However, the existing technology for editing expressions is direct parsing, and the parsing and calculation are relatively slow. When users have undisclosed calculation methods in production, directly editing expressions cannot meet the needs. Therefore, how to quickly parse and improve the accuracy of wafer data defect detection has become a technical issue that cannot be underestimated.
[0045] Based on this, an embodiment of the present application provides an expression editing method, which directly inputs an expression algorithm in a unified format into the panel of the expression editor page, combines the expression algorithms to obtain the target expression algorithm of the wafer data, and quickly parses the target expression algorithm, thereby more accurately determining the defects of the wafer data and improving the quality of the product.
[0046] See also Figure 1 , Figure 1This is a flow chart of an expression editing method provided in an embodiment of the present application. Figure 1 As shown in , the expression editing method provided by the embodiment of the present application includes:
[0047] S101: Acquire wafer data to be inspected, and detect whether there is an expression algorithm corresponding to the wafer data to be inspected among multiple first reference expression algorithms in the drop-down box options on the expression editor page.
[0048] In this step, the wafer data to be inspected sent by the user is obtained, and it is detected whether there is an expression algorithm that can process the wafer data to be inspected among the multiple first reference expression algorithms in the drop-down box options on the expression editor page.
[0049] Among them, the first reference expression algorithm includes: Max, Mean, Slope, Range, Slope, Media, HitCountAbove and other algorithms.
[0050] In a possible implementation manner, the first reference expression algorithm is constructed by the following steps:
[0051] A: Obtain the code file uploaded to the background service interface, verify and parse the code file, and determine the first reference expression algorithm in the code file.
[0052] Here, the code file uploaded to the background service interface is obtained, the code file is verified and parsed, and the verified code file is parsed to determine the first reference expression algorithm in the code file.
[0053] B: Add the first reference expression algorithm based on the algorithm name of the first reference expression algorithm on the expression management page, so that the algorithm name of the first reference expression algorithm is displayed in the drop-down box option, and the definition content of the first reference expression algorithm is displayed in the expression editing area.
[0054] Here, the first reference expression algorithm is added according to its algorithm name on the expression management page, so that the algorithm name of the first reference expression algorithm is displayed in the drop-down box option, and the definition content of the first reference expression algorithm is displayed in the expression editing area.
[0055] In addition to obtaining the first reference expression algorithm externally, the expression algorithm can also be written directly in the expression editing area, and the written expression algorithm can be used as the first reference expression algorithm.
[0056] Here, in the background service extension algorithm, write the calculation method in the code class file in a unified format, and then upload the class file in the background service interface. The system will verify the uploaded class file, parse the algorithm in the class according to the predetermined format, and dynamically upload and load it into the relevant service memory without shutting down the system's various microservices to achieve real-time loading of the algorithm, and then add a matching algorithm through the method name in the expression management page.
[0057] Here, in actual production, some of the user's monitoring calculation methods are not public. To meet user needs, write the calculation method in the code class file, and then upload the class file in the background service interface. The system will verify the uploaded class file, parse the algorithm in the class according to the predetermined format, and dynamically upload and load it to the relevant service memory without stopping the system's microservices to achieve real-time loading of the algorithm. Then add a matching algorithm by the method name on the expression management page. When the algorithm name can be checked in the drop-down box of the expression editor, the expression editing area will display the content of the algorithm definition (return method name (parameters) for example: return Max(x);), and will not display the specific calculation method expression. When parsing the expression calculation, call the algorithm expression for calculation, which can ensure that users can easily expand the calculation function.
[0058] S102: If it does not exist, then select multiple second reference expression algorithms from the multiple first reference expression algorithms in the drop-down box options, perform combination operations and analysis processing on the multiple second reference expression algorithms, and determine the target expression algorithm for the wafer data to be detected.
[0059] In this step, if it does not exist, multiple second reference expression algorithms are screened out from the multiple first reference expression algorithms in the drop-down box options, and the multiple second reference expression algorithms are combined and analyzed to determine the target expression algorithm for the wafer data to be tested.
[0060] In a possible implementation manner, the combining operation and parsing of the plurality of second reference expression algorithms to determine the target expression algorithm for the wafer data to be inspected includes:
[0061] (1) Based on the conditional judgment and / or operation operator selected by the user, a combination operation is performed on multiple second reference expression algorithms to determine a combined expression algorithm.
[0062] Here, a plurality of second reference expression algorithms are combined using conditional judgments and / or operation operators selected by the user to determine a combined expression algorithm.
[0063] Among them, the operation operators include regular unary / binary operators such as +-* / ++--&&||, and the conditional judgments include other conditional judgments such as if / else, while, for, etc.
[0064] (2): Based on the grammar rule parser, the combined expression algorithm is parsed to determine the parsing result.
[0065] Here, the grammar rule parser is used to parse the combined expression algorithm to determine the parsing result.
[0066] In this solution, in order to meet the needs of users to customize and edit expressions, the Antlr3 tool is used to build a syntax analyzer, which generates a parser by defining grammar rules and grammar actions. Parse expressions quickly and calculate results in order of priority. The speed of parsing expressions using Antlr3 is fast, the grammar rules are clear and easy to read, easy to maintain and update, and powerful error handling. It can handle more complex grammatical structures and provide more efficient and reliable parsing solutions. According to the defined grammar, the corresponding lexical analyzer and parser class are generated, which can recognize and parse the input expression, and the generated grammar rule parser is used to parse the input expression algorithm to obtain the parse tree.
[0067] Among them, the grammar rules include: ① Supports conventional unary / binary operators such as +-* / ++--&&||, and also supports the ternary operator of value2. The priority of the operation is defined (when using (), the expression in () is calculated first). ② Supports if / else, while, for conditional judgment, for (initialization expression; loop condition; iteration statement) { / / loop body}, the statement executed before entering the loop body for the first time can be empty. When the loop condition bool type expression is empty, it will enter an infinite loop, unless the return is used in the loop body to end the entire iteration statement. The statement executed after each loop ends can be an empty loop body, and the statement of each loop must be enclosed in {}. while (loop condition) { / / loop body}, the loop condition bool type expression cannot be empty, and the statement of each loop in the loop body is enclosed in {}. ③ Support Int / Double / String / Bool / ArrayOfInt / ArrayOfDouble / ArrayOfString types. ④ Define variables and assign values: Any variable in the script must be defined before use. When defining a variable, it is not necessary to define the type and must assign a value.
[0068] (3): Based on the analysis result, determine whether the combined expression algorithm is the target representation algorithm.
[0069] Here, it is determined whether the combined expression algorithm is the target expression algorithm based on the parsing result.
[0070] In a possible implementation manner, determining whether the combined expression algorithm is a target representation algorithm based on the parsing result includes:
[0071] If the parsing result is failure, the combined expression algorithm is modified and re-parsed; if the parsing result is success, the combined expression algorithm is used as the target expression algorithm.
[0072] Here, if the parsing result is failure, the combined expression algorithm is modified and re-parsed; if the parsing result is success, the combined expression algorithm is used as the target expression algorithm.
[0073] In a possible implementation manner, multiple second reference expression algorithms are screened out from multiple first reference expression algorithms in the drop-down box options, multiple second reference expression algorithms are combined and tested, and after the target expression algorithm of the wafer data to be detected is determined, the expression editing method further includes:
[0074] I: In the expression editing area, the target expression algorithm is edited and modified based on user needs to generate a modified expression algorithm, and in the expression parameter setting area, parameter values of the edited and modified target expression algorithm are set.
[0075] Here, in the expression editing area, the target expression algorithm is edited and modified according to user needs to generate a modified expression algorithm, and in the expression parameter setting area, the parameter values of the edited and modified target expression algorithm are set.
[0076] The expression editing area is used to display expressions and supports custom modification of expressions. The Max algorithm maintained on the expression management page does not display the specific expression algorithm in the editing area, but is displayed in the form of algorithm name and parameters. The expression parameter setting area is used to set the type and data source of the expression algorithm.
[0077] Here, to meet the specific needs of users, you can edit the expression algorithm in the expression editing area. The expression supports if / else, while, for conditional judgment, +-* / ++--&&|| and other conventional unary / binary operators. You can enter other algorithm expressions (in the expression management page) for combination. When editing the expression algorithm, if the edited expression does not conform to the rules, there will be an error prompt. The parameters in the expression can be selected from the drop-down box according to the collection parameters (for example, each collected parameter may be an array [7,6,7,7,7,7,3,7,6,8,7,...]). The expression supports Int / Double (Array) and other types. After the expression is tested and calculated correctly, save it. Example: return Max(x)+10; Explanation: x represents a variable, and the collection parameter can be selected from the drop-down box (for example: the parameter is an array [7,6,7,7,7,7,3,7,6,8,7] and the result of the calculation is 18).
[0078] II: Based on the grammar rule parser, the modified expression algorithm and parameter values are parsed to determine the parsing result.
[0079] Here, the modified expression algorithm and parameter values are parsed according to the grammar rule parser to determine the parsing result.
[0080] III: If the analysis result is successful, the wafer data to be inspected is processed based on the modified expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
[0081] Here, if the analysis result is successful, the wafer data to be inspected is processed according to the modified expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
[0082] In a possible implementation manner, the target expression algorithm is edited and modified based on user needs in the expression editing area, including:
[0083] During the process of editing and modifying the target expression algorithm, if the edited and modified target expression algorithm does not conform to the grammatical rules, an error reminder will be given in the expression editing area, and the information on the grammatical rule errors will be marked with colors.
[0084] Here, during the process of editing and modifying the target expression algorithm, if the edited and modified target expression algorithm does not conform to the grammatical rules, an error reminder will be given in the expression editing area, and the information on the grammatical rule errors will be color-coded.
[0085] In the present application, the page composition of the expression editor is as follows: Algorithm drop-down box: The data in the drop-down box is the algorithm maintained by the expression management page. After selecting the algorithm, the expression of the algorithm is displayed in the editing expression area, and then the data source of the parameter can be set in the parameter setting area. Expression editing area: The display area of the expression, which supports custom modification of the expression. Expression parameter setting area: Parameters are parameters in the expression, which set the type and data source of the expression. Expression editing error display area: Displays an error prompt when the expression is edited incorrectly. Test button: Test the result of the expression calculation based on the input parameter value. Test result display area: Displays the value of the test expression calculation result. Save button: Saves the content set in the expression editor.
[0086] S103: Processing the wafer data to be inspected based on the target expression algorithm to determine result values of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result values.
[0087] In this step, the wafer data to be inspected is processed according to the target expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
[0088] In a specific embodiment, check the collected raw data and draw a line graph of the data, observe the characteristics of the line graph, and determine whether there is an algorithm suitable for the characteristics in the expression management. If there is a suitable algorithm, select it through the drop-down box. If there is no suitable algorithm in the system, you can check the algorithm in the drop-down box of the expression editor. The expression editing area will display the content of the algorithm (return method name (parameters)), and will not display the specific calculation method expression. Set the parameter value in the expression parameter setting area, and then click the test button to test whether the calculation is successful according to the grammatical parsing expression. If the test is successful, check whether it is necessary to expand and edit the expression based on the algorithm. If not, end. If necessary, directly edit the expression in the expression editing area according to the needs, flexibly expand the expression, set the parameter value in the expression parameter setting area, and then click the test button to test whether the calculation is successful according to the grammatical parsing expression. Save after the test is successful.
[0089] For further information, see Figure 2 , Figure 2 A schematic diagram of an expression editing method provided in an embodiment of the present application. Figure 2As shown, S201: Check whether there is an expression algorithm corresponding to the wafer data to be detected among the multiple first reference expression algorithms in the drop-down box options, S202: If so, select a suitable expression algorithm in the drop-down box options to process the wafer data to be detected and determine the result value of the wafer data to be detected, S203: If not, select a suitable reference expression algorithm from the multiple first reference expression algorithms in the drop-down box options to perform combination operations, S204: Use the grammar rule parser to test the combined expression algorithm, S205: If the test fails, reselect a suitable expression algorithm in the drop-down box options to construct the expression algorithm, S206: If the test is successful, check whether to extend and edit the expression, S207: If so, modify the expression in the expression editor and test it using the grammar rule parser, and after the test is successful, process the wafer data to be detected and determine the result value of the wafer data to be detected.
[0090] In this application, an expression editor is used to select an algorithm or edit an expression, quickly parse the expression calculation results, and flexibly extend the algorithm for real-time detection, so as to more accurately detect product defects and improve product quality.
[0091] An expression editing method provided in an embodiment of the present application includes: obtaining wafer data to be inspected, and detecting whether there is an expression algorithm corresponding to the wafer data to be inspected in the multiple first reference expression algorithms in the drop-down box options of the expression editor page; if not, screening out multiple second reference expression algorithms from the multiple first reference expression algorithms in the drop-down box options, and performing combination operations and analysis processing on the multiple second reference expression algorithms to determine the target expression algorithm of the wafer data to be inspected; processing the wafer data to be inspected based on the target expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value. By directly inputting the expression algorithm in a unified format into the panel of the expression editor page, combining the expression algorithm to obtain the target expression algorithm of the wafer data, and quickly parsing the target expression algorithm, the defects of the wafer data can be more accurately determined, thereby improving the quality of the product.
[0092] See also Figure 3 , Figure 4 , Figure 3 One of the structural schematic diagrams of an expression editing device provided in an embodiment of the present application; Figure 4 This is a second structural diagram of an expression editing device provided in an embodiment of the present application. Figure 3 As shown in , the expression editing device 300 includes:
[0093] The detection module 310 is used to obtain the wafer data to be detected, and detect whether there is an expression algorithm corresponding to the wafer data to be detected in the multiple first reference expression algorithms in the drop-down box options of the expression editor page;
[0094] The expression algorithm combination module 320 is used to select multiple second reference expression algorithms from multiple first reference expression algorithms in the drop-down box options if they do not exist, perform combination operations and analysis processing on the multiple second reference expression algorithms, and determine the target expression algorithm of the wafer data to be detected;
[0095] The processing module 330 is used to process the wafer data to be inspected based on the target expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
[0096] Further, when the expression algorithm combination module 320 is used to perform a combination operation and an analysis process on the plurality of the second reference expression algorithms to determine the target expression algorithm for the wafer data to be detected, the expression algorithm combination module 320 is specifically used to:
[0097] Performing a combination operation on a plurality of said second reference expression algorithms based on a conditional judgment and / or an operation operator selected by a user to determine a combined expression algorithm;
[0098] The combined expression algorithm is parsed based on a grammar rule parser to determine a parsing result;
[0099] Based on the parsing result, it is determined whether the combined expression algorithm is a target expression algorithm.
[0100] Further, when the expression algorithm combination module 320 is used to determine whether the combined expression algorithm is a target representation algorithm based on the parsing result, the expression algorithm combination module 320 is specifically used to:
[0101] If the parsing result is failure, the combined expression algorithm is modified and parsed again;
[0102] If the parsing result is successful, the combined expression algorithm is used as the target expression algorithm.
[0103] Further, such as Figure 4 As shown, the expression editing device 300 further includes an editing module 340, and the editing module 340 is used to:
[0104] Edit and modify the target expression algorithm based on user needs in the expression editing area to generate a modified expression algorithm, and set parameter values of the edited and modified target expression algorithm in the expression parameter setting area;
[0105] Based on the grammar rule parser, the modified expression algorithm and parameter values are parsed to determine the parsing result;
[0106] If the analysis result is successful, the wafer data to be inspected is processed based on the modified expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
[0107] Furthermore, when the editing module 340 is used to edit and modify the target expression algorithm based on user requirements in the expression editing area, the editing module 340 is specifically used to:
[0108] During the process of editing and modifying the target expression algorithm, if the edited and modified target expression algorithm does not conform to the grammatical rules, an error reminder will be given in the expression editing area, and the information on the grammatical rule errors will be marked with colors.
[0109] Further, such as Figure 4 As shown, the expression editing device 300 further includes an expression algorithm building module 350, and the expression algorithm building module 350 builds the first reference expression algorithm through the following steps:
[0110] Obtain a code file uploaded to a backend service interface, verify and parse the code file, and determine a first reference expression algorithm in the code file;
[0111] On the expression management page, the first reference expression algorithm is added based on the algorithm name of the first reference expression algorithm, so that the algorithm name of the first reference expression algorithm is displayed in the drop-down box option, and the definition content of the first reference expression algorithm is displayed in the expression editing area.
[0112] An expression editing device provided by an embodiment of the present application includes: a detection module, which is used to obtain wafer data to be detected, and detect whether there is an expression algorithm corresponding to the wafer data to be detected in the multiple first reference expression algorithms in the drop-down box options of the expression editor page; an expression algorithm combination module, which is used to screen out multiple second reference expression algorithms from the multiple first reference expression algorithms in the drop-down box options if there is not, and perform combination operations and analysis processing on the multiple second reference expression algorithms to determine the target expression algorithm of the wafer data to be detected; a processing module, which is used to process the wafer data to be detected based on the target expression algorithm to determine the result value of the wafer data to be detected, so as to determine whether the wafer to be detected has defects according to the result value. By directly inputting the expression algorithm in a unified format into the panel of the expression editor page, the expression algorithm is combined to obtain the target expression algorithm of the wafer data, and the target expression algorithm is quickly parsed, so as to more accurately determine the defects of the wafer data and improve the quality of the product.
[0113] See also Figure 5 , Figure 5 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present application. Figure 5 As shown in , the electronic device 500 includes a processor 510 , a memory 520 and a bus 530 .
[0114] The memory 520 stores machine-readable instructions executable by the processor 510. When the electronic device 500 is running, the processor 510 communicates with the memory 520 via the bus 530. When the machine-readable instructions are executed by the processor 510, the above-mentioned Figure 1 as well as Figure 2 The steps of the expression editing method in the method embodiment shown, the specific implementation method can be found in the method embodiment, and will not be repeated here.
[0115] The present application also provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, the computer program can execute the above-mentioned Figure 1 as well as Figure 2 The steps of the expression editing method in the method embodiment shown, the specific implementation method can be found in the method embodiment, and will not be repeated here.
[0116] Those skilled in the art can clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.
[0117] In the several embodiments provided in the present application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, and the indirect coupling or communication connection of devices or units can be electrical, mechanical or other forms.
[0118] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
[0119] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.
[0120] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a non-volatile computer-readable storage medium that is executable by a processor. Based on this understanding, the technical solution of the present application can essentially be embodied in the form of a software product, or in other words, the part that contributes to the prior art or the part of the technical solution. The computer software product is stored in a storage medium, including several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.
[0121] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present application, which are used to illustrate the technical solutions of the present application, rather than to limit them. The protection scope of the present application is not limited thereto. Although the present application is described in detail with reference to the above-mentioned embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-mentioned embodiments within the technical scope disclosed in the present application, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application. Therefore, the protection scope of the present application shall be based on the protection scope of the claims.
Claims
1. A method for editing an expression, characterized in that: The expression editing method comprises: Obtain the wafer data to be detected, and detect whether there is an expression algorithm corresponding to the wafer data to be detected among the multiple first reference expression algorithms in the drop-down box options on the expression editor page; If it does not exist, multiple second reference expression algorithms are screened out from the multiple first reference expression algorithms in the drop-down box options, and the multiple second reference expression algorithms are combined and analyzed to determine the target expression algorithm of the wafer data to be detected; The wafer data to be inspected is processed based on the target expression algorithm to determine a result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
2. The expression editing method according to claim 1, characterized in that: The combining operation and parsing of the plurality of second reference expression algorithms to determine the target expression algorithm of the wafer data to be inspected includes: Performing a combination operation on a plurality of said second reference expression algorithms based on a conditional judgment and / or an operation operator selected by a user to determine a combined expression algorithm; The combined expression algorithm is parsed based on a grammar rule parser to determine a parsing result; Based on the parsing result, it is determined whether the combined expression algorithm is a target expression algorithm.
3. The expression editing method according to claim 2, characterized in that: The determining, based on the parsing result, whether the combined expression algorithm is a target representation algorithm comprises: If the parsing result is failure, the combined expression algorithm is modified and parsed again; If the parsing result is successful, the combined expression algorithm is used as the target expression algorithm.
4. The expression editing method according to claim 1, characterized in that: After screening out a plurality of second reference expression algorithms from a plurality of first reference expression algorithms in the drop-down box options, performing combination operations and test processing on the plurality of second reference expression algorithms, and determining a target expression algorithm for the wafer data to be detected, the expression editing method further includes: Edit and modify the target expression algorithm based on user needs in the expression editing area to generate a modified expression algorithm, and set parameter values of the edited and modified target expression algorithm in the expression parameter setting area; Based on the grammar rule parser, the modified expression algorithm and parameter values are parsed to determine the parsing result; If the analysis result is successful, the wafer data to be inspected is processed based on the modified expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
5. The expression editing method according to claim 4, characterized in that: In the expression editing area, the target expression algorithm is edited and modified based on user needs, including: During the process of editing and modifying the target expression algorithm, if the edited and modified target expression algorithm does not conform to the grammatical rules, an error reminder will be given in the expression editing area, and the information on the grammatical rule errors will be marked with colors.
6. The expression editing method according to claim 1, characterized in that: The first reference expression algorithm is constructed by the following steps: Obtain a code file uploaded to a backend service interface, verify and parse the code file, and determine a first reference expression algorithm in the code file; On the expression management page, the first reference expression algorithm is added based on the algorithm name of the first reference expression algorithm, so that the algorithm name of the first reference expression algorithm is displayed in the drop-down box option, and the definition content of the first reference expression algorithm is displayed in the expression editing area.
7. An expression editing device, characterized in that: The expression editing device comprises: A detection module is used to obtain wafer data to be detected, and detect whether there is an expression algorithm corresponding to the wafer data to be detected in multiple first reference expression algorithms in the drop-down box options on the expression editor page; An expression algorithm combination module is used to select multiple second reference expression algorithms from multiple first reference expression algorithms in the drop-down box options if they do not exist, perform combination operations and analytical processing on the multiple second reference expression algorithms, and determine the target expression algorithm for the wafer data to be detected; The processing module is used to process the wafer data to be inspected based on the target expression algorithm to determine the result value of the wafer data to be inspected, so as to determine whether the wafer to be inspected has defects according to the result value.
8. The expression editing device according to claim 7, characterized in that: When the expression algorithm combination module is used to perform combination operation and analysis processing on the plurality of the second reference expression algorithms to determine the target expression algorithm of the wafer data to be detected, the expression algorithm combination module is specifically used to: Performing a combination operation on a plurality of said second reference expression algorithms based on a conditional judgment and / or an operation operator selected by a user to determine a combined expression algorithm; The combined expression algorithm is parsed based on a grammar rule parser to determine a parsing result; Based on the parsing result, it is determined whether the combined expression algorithm is a target expression algorithm.
9. An electronic device, characterized in that: include: A processor, a memory and a bus, wherein the memory stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor and the memory communicate through the bus, and the machine-readable instructions are executed by the processor to execute the steps of the expression editing method as described in any one of claims 1 to 6.
10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the steps of the expression editing method according to any one of claims 1 to 6 are executed.