Life characteristic parameter determination method and device, equipment, storage medium and product

Abstract

The invention relates to a life characteristic parameter determination method and device, equipment, a storage medium and a product. The method comprises the following steps: by acquiring first detection data and second detection data of each performance parameter of a target electronic component, determining failure time of each performance parameter based on the first detection data, the second detection data, a technical requirement value of each performance parameter in an initial state of the target electronic component and a preset duration, and then the service life characteristic parameters are determined from the performance parameters according to the failure time of the performance parameters, so that the accuracy of determining the service life characteristic parameters can be improved. Moreover, according to the life characteristic parameter determination method provided by the embodiment of the invention, the calculation step of life characteristic parameter determination is simplified, the calculation resource is saved, and the efficiency of life characteristic parameter determination is improved.

Description

Technical Field

[0001] The present application relates to the technical field of electronic component life prediction, and in particular to a method, device, equipment, storage medium and product for determining life characteristic parameters. Background Art

[0002] Electronic components are the basis of electronic products. Therefore, it is very important to study their storage reliability. Storage life has been clearly proposed as an assessment indicator for studying storage reliability. However, electronic components often have multiple performance parameters. Therefore, how to effectively identify the performance parameters that can characterize their life, that is, life characteristic parameters, from the numerous performance parameters has become a technical problem that needs to be solved in this field.

[0003] At present, life characteristic parameters are often determined from a large number of performance parameters through methods such as T-test or grey correlation analysis. However, these methods have the problem of low accuracy when determining life characteristic parameters. Summary of the invention

[0004] Based on this, it is necessary to provide a method, device, equipment, storage medium and product for determining life characteristic parameters that can improve the accuracy of determining life characteristic parameters in response to the above technical problems.

[0005] In a first aspect, the present application provides a method for determining life characteristic parameters. The method comprises:

[0006] Acquire first detection data and second detection data of each performance parameter of the target electronic component; the first detection data is the detection data of the performance parameter of the target electronic component in the initial state, and the second detection data is the detection data of the performance parameter of the target electronic component after natural storage for a preset time period;

[0007] Determine the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset time;

[0008] From each of the performance parameters, a life characteristic parameter is determined according to the failure time of each of the performance parameters.

[0009] In one embodiment, the determining of the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset time length includes:

[0010] Determining a degradation rate of the performance parameter according to the first detection data, the second detection data and the preset time length;

[0011] The failure time of the performance parameter is determined according to the degradation rate of the performance parameter, the technical requirement value and the first detection data.

[0012] In one embodiment, the first detection data includes: a plurality of first data obtained by detecting the performance parameter multiple times; the second detection data includes: a plurality of second data obtained by detecting the performance parameter multiple times; and determining the degradation rate of the performance parameter according to the first detection data, the second detection data and the preset time length includes:

[0013] Determine a first average value of the plurality of first data and a second average value of the plurality of second data;

[0014] A degradation rate of the performance parameter is determined according to the first average value, the second average value, and the preset time length.

[0015] In one embodiment, determining the degradation rate of the performance parameter according to the first average value, the second average value and the preset time length includes:

[0016] Determine an average value change according to the second average value and the first average value;

[0017] A first ratio between the average value change and the preset time length is determined as the degradation rate.

[0018] In one embodiment, determining the failure time of the performance parameter according to the degradation rate of the performance parameter, the technical requirement value and the first detection data includes:

[0019] Determining a value of the performance parameter distance to failure according to the technical requirement value and the first detection data;

[0020] A second ratio between the value of the performance parameter distance to failure and the degradation rate is determined as the failure time of the performance parameter.

[0021] In one embodiment, determining the life characteristic parameter from each of the performance parameters according to the failure time of each of the performance parameters includes:

[0022] Sort the failure time of each performance parameter in ascending order;

[0023] The performance parameter corresponding to the minimum failure time is determined as the life characteristic parameter.

[0024] In a second aspect, the present application also provides a device for determining life characteristic parameters. The device comprises:

[0025] An acquisition module, used to acquire first detection data and second detection data of each performance parameter of a target electronic component; the first detection data is detection data of the performance parameter of the target electronic component in an initial state, and the second detection data is detection data of the performance parameter of the target electronic component after natural storage for a preset time period;

[0026] A first determination module, configured to determine the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset time;

[0027] The second determination module is used to determine the life characteristic parameter from each of the performance parameters according to the failure time of each of the performance parameters.

[0028] In a third aspect, the present application further provides a computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps of any of the above methods when executing the computer program.

[0029] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which implements the steps of any of the above methods when executed by a processor.

[0030] In a fifth aspect, the present application also provides a computer program product, including a computer program, which implements the steps of any of the above methods when executed by a processor.

[0031] The above-mentioned life characteristic parameter determination method, device, equipment, storage medium and product obtain the first detection data and the second detection data of each performance parameter of the target electronic component, determine the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset duration, and then determine the life characteristic parameter from each performance parameter according to the failure time of each performance parameter, thereby improving the accuracy of the life characteristic parameter determination. In addition, the life characteristic parameter determination method provided in the embodiment of the present application simplifies the calculation steps for determining the life characteristic parameter, saves computing resources, and improves the efficiency of determining the life characteristic parameter. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] FIG1 is an internal structure diagram of a computer device provided in an embodiment of the present application;

[0033] FIG2 is a schematic flow chart of a method for determining life characteristic parameters provided in an embodiment of the present application;

[0034] FIG3 is a schematic diagram of a flow chart of a method for determining an expiration time provided in an embodiment of the present application;

[0035] FIG4 is a schematic diagram of a flow chart of a degradation rate determination method provided in an embodiment of the present application;

[0036] FIG5 is a flow chart of another method for determining a degradation rate provided in an embodiment of the present application;

[0037] FIG6 is a flow chart of another method for determining failure time provided in an embodiment of the present application;

[0038] FIG7 is a flow chart of another method for determining life characteristic parameters provided in an embodiment of the present application;

[0039] 8 is a flow chart of a method for evaluating characteristic parameters of natural storage life of electronic components based on performance degradation provided in an embodiment of the present application;

[0040] FIG. 9 is a structural block diagram of a device for determining life characteristic parameters provided in an embodiment of the present application. DETAILED DESCRIPTION

[0041] In order to make the purpose, technical solution and advantages of the present application more clearly understood, the present application is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and are not used to limit the present application.

[0042] Electronic components are the basis of electronic products. Therefore, it is very important to study their storage reliability. Storage life has been clearly proposed as an assessment indicator for studying storage reliability. However, electronic components often have multiple performance parameters. Therefore, how to effectively identify the performance parameters that can characterize their life, that is, life characteristic parameters, from the numerous performance parameters has become a technical problem that needs to be solved in this field.

[0043] At present, life characteristic parameters are often determined from a large number of performance parameters through methods such as T-test or grey correlation analysis. However, these methods have the problem of low accuracy when determining life characteristic parameters.

[0044] The method for determining life characteristic parameters provided in an embodiment of the present application can be applied in an application environment as shown in Figure 1. Figure 1 is an internal structure diagram of a computer device provided in an embodiment of the present application. The computer device may be a server, and its internal structure diagram may be as shown in Figure 1. The computer device includes a processor, a memory, and a network interface connected via a system bus. Among them, the processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The network interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a method for determining life characteristic parameters is implemented.

[0045] Those skilled in the art will understand that the structure shown in FIG. 1 is merely a block diagram of a partial structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0046] In one embodiment, as shown in FIG. 2 , FIG. 2 is a flow chart of a method for determining a life characteristic parameter provided in an embodiment of the present application. The method can be applied to the computer device in FIG. 1 . The method includes the following steps:

[0047] S201, obtaining first detection data and second detection data of each performance parameter of a target electronic component.

[0048] The first detection data is the detection data of the performance parameters of the target electronic component in the initial state, and the second detection data is the detection data of the performance parameters of the target electronic component after being naturally stored for a preset period of time.

[0049] Exemplarily, a detection device such as a sensor may be provided to obtain first detection data and second detection data of various performance parameters of the target electronic component.

[0050] Optionally, the first detection data includes at least one first data, and the second detection data includes at least one second data.

[0051] In an exemplary embodiment, the detection data of the performance parameters of the target electronic component in the initial state can be repeatedly measured by the detection device to obtain a plurality of first data, and the plurality of first data can be used as the first detection data.

[0052] Similarly, the detection device can be used to repeatedly measure the detection data of the performance parameters of the target electronic components after natural storage for a preset period of time to obtain multiple second data, and the multiple second data can be used as the second detection data.

[0053] In addition, the preset time length of natural storage of the target electronic components can also be determined according to actual needs. For example, if the preset time length is 20 years, the target electronic components need to be stored in a natural environment for 20 years, and the second detection data of the target electronic components after 20 years is obtained.

[0054] S202, determining the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset time.

[0055] In a possible implementation, the degradation rate of the performance parameter may be determined based on the first detection data, the second detection data, and a preset time period.

[0056] Exemplarily, the degradation rate of the performance parameter can be determined based on the first detection data, the second detection data, and the preset time length in the following manner: determine the data difference between the first detection data and the second detection data, and use the ratio between the data difference and the preset time length as the degradation rate.

[0057] Alternatively, if the first detection data includes multiple first data and the second detection data includes multiple second data, the first average value of the multiple first data in the first detection data and the second average value of the multiple second data in the second detection data can be determined, and then the degradation rate of the performance parameter can be determined based on the first average value, the second average value, and the preset time length.

[0058] After the degradation rate of the performance parameter is determined, the failure time of each performance parameter can be determined according to the first detection data, the technical requirement value of the target electronic component in the initial state, and the preset time.

[0059] Optionally, determining the failure time of each performance parameter according to the first detection data, the technical requirement value of the target electronic component in the initial state, and the preset time can be achieved by the following method:

[0060] The value of the performance parameter distance to failure is determined according to the first detection data and the technical requirement value of the target electronic component in the initial state, and then the ratio between the value of the performance parameter distance to failure and the preset time length is determined as the failure time.

[0061] S203, determining a life characteristic parameter from each performance parameter according to the failure time of each performance parameter.

[0062] Optionally, the performance parameter corresponding to the minimum failure time may be determined as the life characteristic parameter.

[0063] Alternatively, a preset threshold may be determined, and the performance parameter corresponding to the failure time less than the preset threshold may be determined as the parameter to be selected. The life characteristic parameter may then be determined based on the detection difficulty of each parameter to be selected, or the correlation between each parameter to be selected and the life of the target electronic component.

[0064] For example, the parameter to be selected with the least detection difficulty can be determined as the life characteristic parameter. Alternatively, the parameter to be selected with the greatest correlation can be determined as the life characteristic parameter.

[0065] In the embodiment of the present application, by obtaining the first detection data and the second detection data of each performance parameter of the target electronic component, based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset duration, the failure time of each performance parameter is determined, and then from each performance parameter, according to the failure time of each performance parameter, the life characteristic parameter is determined, thereby improving the accuracy of the determination of the life characteristic parameter. In addition, the method for determining the life characteristic parameter provided in the embodiment of the present application simplifies the calculation steps for determining the life characteristic parameter, saves computing resources, and improves the efficiency of determining the life characteristic parameter.

[0066] Referring to FIG. 3 , FIG. 3 is a flow chart of a method for determining failure time provided in an embodiment of the present application. This embodiment involves a possible implementation method of determining the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset duration. Based on the above embodiment, the above S202 includes the following steps:

[0067] S301, determining a degradation rate of a performance parameter according to first detection data, second detection data and a preset time length.

[0068] Optionally, a data difference between the first detection data and the second detection data may be determined, and a ratio between the data difference and a preset time length is used as the degradation rate.

[0069] Alternatively, if the first detection data includes multiple first data and the second detection data includes multiple second data, then the first average value of the multiple first data in the first detection data and the second average value of the multiple second data in the second detection data can be determined, and then the average value change between the first average value and the second average value can be determined, and the ratio between the average value change and the preset time length is used as the degradation rate.

[0070] S302, determining the failure time of the performance parameter according to the degradation rate of the performance parameter, the technical requirement value and the first detection data.

[0071] Optionally, the value of the performance parameter distance to failure can be determined based on the first detection data and the technical requirement value of the target electronic component in the initial state, and then the ratio between the value of the performance parameter distance to failure and the preset time length is determined as the failure time.

[0072] Alternatively, it is also possible to determine a first average value of multiple first data in the first detection data, and then determine the value of the performance parameter distance to failure based on the first average value and the technical requirement value of the target electronic component in the initial state, and determine the ratio between the value of the performance parameter distance to failure and the preset time length as the failure time.

[0073] In the embodiment of the present application, the degradation rate of the performance parameter is determined according to the first detection data, the second detection data and the preset duration, and then the failure time of the performance parameter is determined according to the degradation rate of the performance parameter, the technical requirement value and the first detection data, so that the life characteristic parameter can be determined from each performance parameter based on the failure time, thereby improving the accuracy of determining the life characteristic parameter. In addition, determining the life characteristic parameter from each performance parameter based on the failure time simplifies the calculation steps for determining the life characteristic parameter, saves computing resources, and improves the efficiency of determining the life characteristic parameter.

[0074] The first detection data includes: a plurality of first data obtained by detecting the performance parameter for multiple times; the second detection data includes: a plurality of second data obtained by detecting the performance parameter for multiple times.

[0075] Referring to Figure 4, Figure 4 is a flow chart of a degradation rate determination method provided in an embodiment of the present application. This embodiment relates to a possible implementation method of how to determine the degradation rate of a performance parameter based on first detection data, second detection data and a preset duration. Based on the above embodiment, the above S301 includes the following steps:

[0076] S401, determining a first average value of a plurality of first data and a second average value of a plurality of second data.

[0077] In a possible implementation, the detection device may repeatedly measure the detection data of the performance parameter of the target electronic component in the initial state to obtain a plurality of first data, and then determine a first average value of the plurality of first data. .

[0078] Optionally, the detection device may be used to repeatedly measure the detection data of the performance parameters of the target electronic component after the target electronic component is naturally stored for a preset time to obtain a plurality of second data, and then determine the second average value of the plurality of second data according to the following formula (1): :

[0079] (1)

[0080] In formula (1), is the number of repeated measurements, For the The second data is measured.

[0081] S402: Determine a degradation rate of a performance parameter according to the first average value, the second average value, and a preset time length.

[0082] Exemplarily, the average value change amount can be determined based on the second average value and the first average value, and then a first ratio between the average value change amount and a preset time length can be determined as the degradation rate.

[0083] Alternatively, the average change can be determined based on the second average and the first average, and then a first ratio between the average change and a preset time length can be determined. Finally, the first ratio is corrected based on a preset coefficient, and the corrected first ratio is determined as the degradation rate.

[0084] In the embodiment of the present application, the first average value of multiple first data and the second average value of multiple second data are determined, and the degradation rate of the performance parameter is determined based on the first average value, the second average value and the preset time, so that the failure time of each performance parameter can be determined based on the degradation rate of each performance parameter, which simplifies the calculation steps for determining the life characteristic parameter, saves computing resources, and improves the efficiency of determining the life characteristic parameter. In addition, determining the degradation rate of the performance parameter based on the first average value and the second average value can also reduce data errors and improve the accuracy of the degradation rate calculation.

[0085] Referring to FIG. 5 , FIG. 5 is a flow chart of another degradation rate determination method provided in an embodiment of the present application. This embodiment relates to a possible implementation method of how to determine the degradation rate of a performance parameter based on a first average value, a second average value and a preset duration. Based on the above embodiment, the above S402 includes the following steps:

[0086] S501, determining an average value change amount according to the second average value and the first average value.

[0087] For example, the average change can be expressed as .

[0088] S502: Determine a first ratio between the average value change and the preset time length as a degradation rate.

[0089] In one embodiment, the degradation rate can be determined by the following formula (2): :

[0090] (2)

[0091] In formula (2), The preset duration.

[0092] In an embodiment of the present application, the change in the average value is determined based on the second average value and the first average value, and then the first ratio between the change in the average value and the preset time length is determined as the degradation rate, so that the failure time of each performance parameter can be determined based on the degradation rate of each performance parameter, which simplifies the calculation steps for determining the life characteristic parameters, saves computing resources, and improves the efficiency of determining the life characteristic parameters.

[0093] Referring to FIG. 6 , FIG. 6 is a flow chart of another method for determining failure time provided in an embodiment of the present application. This embodiment relates to a possible implementation method of determining the failure time of a performance parameter based on the degradation rate of the performance parameter, the technical requirement value and the first detection data. Based on the above embodiment, the above S302 includes the following steps:

[0094] S601, determining a value of a performance parameter distance to failure according to a technical requirement value and first detection data.

[0095] In a possible implementation, the detection device may repeatedly measure the detection data of the performance parameter of the target electronic component in the initial state to obtain a plurality of first data, and then determine a first average value of the plurality of first data. Then according to the technical requirement value and the first average value Determine how close a performance parameter is to failure.

[0096] Exemplarily, the value of the performance parameter distance to failure can be expressed as: .in, It is the technical requirement value.

[0097] S602: Determine a second ratio between the value of the performance parameter distance to failure and the degradation rate as the failure time of the performance parameter.

[0098] For example, the failure time of the performance parameter can be determined by the following formula (3): :

[0099] (3)

[0100] In the embodiment of the present application, the value of the distance to failure of the performance parameter is determined according to the technical requirement value and the first detection data, and the second ratio between the distance to failure of the performance parameter and the degradation rate is determined as the failure time of the performance parameter, so that the life characteristic parameter can be determined from each performance parameter based on the failure time, thereby improving the accuracy of determining the life characteristic parameter. In addition, determining the life characteristic parameter from each performance parameter based on the failure time simplifies the calculation steps for determining the life characteristic parameter, saves computing resources, and improves the efficiency of determining the life characteristic parameter.

[0101] Referring to FIG. 7 , FIG. 7 is a flow chart of another method for determining life characteristic parameters provided in an embodiment of the present application. This embodiment involves a possible implementation method of how to determine the life characteristic parameters from various performance parameters according to the failure time of each performance parameter. Based on the above embodiment, the above S203 includes the following steps:

[0102] S701, sort the failure time of each performance parameter in ascending order.

[0103] S702, determining the performance parameter corresponding to the minimum failure time as the life characteristic parameter.

[0104] In the embodiment of the present application, the failure time of each performance parameter is sorted in ascending order, and then the minimum failure time is determined from the sorted failure times, and the performance parameter corresponding to the minimum failure time is determined as the life characteristic parameter, so that the key parameter that causes the earliest failure of the electronic component can be determined from each performance parameter, and the performance parameter corresponding to the minimum failure time is used as the limit case, which can improve the reliability and safety of the electronic component. In addition, determining the performance parameter corresponding to the minimum failure time as the life characteristic parameter also simplifies the calculation steps for determining the life characteristic parameter, saves computing resources, and improves the efficiency of determining the life characteristic parameter.

[0105] Referring to FIG8 , FIG8 is a flow chart of a method for evaluating characteristic parameters of natural storage life of electronic components based on performance degradation provided in an embodiment of the present application. The method comprises the following steps:

[0106] S801, obtaining first detection data and second detection data of each performance parameter of a target electronic component.

[0107] S802, determining a first average value of the first detection data and a second average value of the second detection data.

[0108] S803: Determine a degradation rate of the performance parameter according to the first average value, the second average value, and a preset time length.

[0109] S804, determining a value of a performance parameter distance to failure according to the technical requirement value and the first detection data.

[0110] S805: Determine a second ratio between the value of the performance parameter distance to failure and the degradation rate as the failure time of the performance parameter.

[0111] S806, sorting the failure time of each performance parameter in ascending order.

[0112] S807, determining the performance parameter corresponding to the minimum failure time as the life characteristic parameter.

[0113] It should be understood that, although the various steps in the flowcharts involved in the above-mentioned embodiments are displayed in sequence according to the indication of the arrows, these steps are not necessarily executed in sequence according to the order indicated by the arrows. Unless there is a clear explanation in this article, the execution of these steps does not have a strict order restriction, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts involved in the above-mentioned embodiments can include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a part of the steps or stages in other steps.

[0114] Based on the same inventive concept, the embodiment of the present application also provides a device for determining life characteristic parameters for implementing the method for determining life characteristic parameters involved above. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme recorded in the method above, so the specific limitations in one or more embodiments of the device for determining life characteristic parameters provided below can refer to the limitations of the method for determining life characteristic parameters above, and will not be repeated here.

[0115] In one embodiment, as shown in FIG. 9 , FIG. 9 is a structural block diagram of a device for determining a life characteristic parameter provided in an embodiment of the present application, and the device 900 includes:

[0116] Acquisition module 901 is used to acquire first detection data and second detection data of each performance parameter of the target electronic component; the first detection data is the detection data of the performance parameter of the target electronic component in the initial state, and the second detection data is the detection data of the performance parameter after the target electronic component is naturally stored for a preset period of time.

[0117] The first determination module 902 is used to determine the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset time.

[0118] The second determination module 903 is used to determine the life characteristic parameter from each performance parameter according to the failure time of each performance parameter.

[0119] In one embodiment, the first determining module 902 includes:

[0120] The first determining unit is used to determine the degradation rate of the performance parameter according to the first detection data, the second detection data and the preset time length.

[0121] The second determination unit is used to determine the failure time of the performance parameter according to the degradation rate of the performance parameter, the technical requirement value and the first detection data.

[0122] In one embodiment, the first determining unit includes:

[0123] The first determining subunit is used to determine a first average value of a plurality of first data and a second average value of a plurality of second data.

[0124] The second determining subunit is used to determine the degradation rate of the performance parameter according to the first average value, the second average value and the preset time length.

[0125] In one of the embodiments, the second determination subunit is specifically configured to determine a change in the average value based on the second average value and the first average value; and determine a first ratio between the change in the average value and a preset time length as the degradation rate.

[0126] In one embodiment, the second determining unit includes:

[0127] The third determination subunit is used to determine the value of the performance parameter distance to failure according to the technical requirement value and the first detection data.

[0128] The fourth determination subunit is used to determine the second ratio between the value of the performance parameter distance to failure and the degradation rate as the failure time of the performance parameter.

[0129] In one embodiment, the second determining module 903 includes:

[0130] The sorting unit is used to sort the failure time of each performance parameter in ascending order.

[0131] The third determining unit is used to determine the performance parameter corresponding to the minimum failure time as the life characteristic parameter.

[0132] Each module in the above-mentioned life characteristic parameter determination device can be implemented in whole or in part by software, hardware and a combination thereof. Each of the above-mentioned modules can be embedded in or independent of a processor in a computer device in the form of hardware, or can be stored in a memory in a computer device in the form of software, so that the processor can call and execute the corresponding operations of each of the above modules.

[0133] In one embodiment, a computer device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and when the processor executes the computer program, the following steps are implemented:

[0134] Acquire first detection data and second detection data of each performance parameter of the target electronic component; the first detection data is the detection data of the performance parameter of the target electronic component in the initial state, and the second detection data is the detection data of the performance parameter after the target electronic component is naturally stored for a preset time period;

[0135] Determine the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset time;

[0136] From each performance parameter, determine the life characteristic parameter according to the failure time of each performance parameter.

[0137] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0138] Determining a degradation rate of a performance parameter according to the first detection data, the second detection data, and a preset time period;

[0139] The failure time of the performance parameter is determined according to the degradation rate of the performance parameter, the technical requirement value and the first detection data.

[0140] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0141] Determine a first average value of the plurality of first data, and a second average value of the plurality of second data;

[0142] A degradation rate of the performance parameter is determined according to the first average value, the second average value, and the preset time length.

[0143] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0144] Determining a change in the average value based on the second average value and the first average value;

[0145] A first ratio between the average value change and the preset time length is determined as the degradation rate.

[0146] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0147] Determining a value of a performance parameter distance to failure according to the technical requirement value and the first detection data;

[0148] A second ratio between the magnitude of the performance parameter distance to failure and the degradation rate is determined as the failure time of the performance parameter.

[0149] In one embodiment, when the processor executes the computer program, the processor further implements the following steps:

[0150] Sort the failure time of each performance parameter from small to large;

[0151] The performance parameter corresponding to the minimum failure time is determined as the life characteristic parameter.

[0152] In one embodiment, a computer readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the following steps are implemented:

[0153] Acquire first detection data and second detection data of each performance parameter of the target electronic component; the first detection data is the detection data of the performance parameter of the target electronic component in the initial state, and the second detection data is the detection data of the performance parameter after the target electronic component is naturally stored for a preset time period;

[0154] Determine the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset time;

[0155] From each performance parameter, determine the life characteristic parameter according to the failure time of each performance parameter.

[0156] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0157] Determining a degradation rate of a performance parameter according to the first detection data, the second detection data, and a preset time period;

[0158] The failure time of the performance parameter is determined according to the degradation rate of the performance parameter, the technical requirement value and the first detection data.

[0159] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0160] The second detection data and the preset time duration determine the degradation rate of the performance parameter, including:

[0161] Determine a first average value of the plurality of first data, and a second average value of the plurality of second data;

[0162] A degradation rate of the performance parameter is determined according to the first average value, the second average value, and the preset time length.

[0163] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0164] Determining a change in the average value based on the second average value and the first average value;

[0165] A first ratio between the average value change and the preset time length is determined as the degradation rate.

[0166] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0167] Determining a value of a performance parameter distance to failure according to the technical requirement value and the first detection data;

[0168] A second ratio between the magnitude of the performance parameter distance to failure and the degradation rate is determined as the failure time of the performance parameter.

[0169] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0170] Sort the failure time of each performance parameter from small to large;

[0171] The performance parameter corresponding to the minimum failure time is determined as the life characteristic parameter.

[0172] In one embodiment, a computer program product is provided, comprising a computer program, which, when executed by a processor, implements the following steps:

[0173] Acquire first detection data and second detection data of each performance parameter of the target electronic component; the first detection data is the detection data of the performance parameter of the target electronic component in the initial state, and the second detection data is the detection data of the performance parameter after the target electronic component is naturally stored for a preset time period;

[0174] Determine the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset time;

[0175] From each performance parameter, determine the life characteristic parameter according to the failure time of each performance parameter.

[0176] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0177] Determining a degradation rate of a performance parameter according to the first detection data, the second detection data, and a preset time period;

[0178] The failure time of the performance parameter is determined according to the degradation rate of the performance parameter, the technical requirement value and the first detection data.

[0179] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0180] The second detection data and the preset time duration determine the degradation rate of the performance parameter, including:

[0181] Determine a first average value of the plurality of first data, and a second average value of the plurality of second data;

[0182] A degradation rate of the performance parameter is determined according to the first average value, the second average value, and the preset time length.

[0183] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0184] Determining a change in the average value based on the second average value and the first average value;

[0185] A first ratio between the average value change and the preset time length is determined as the degradation rate.

[0186] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0187] Determining a value of a performance parameter distance to failure according to the technical requirement value and the first detection data;

[0188] A second ratio between the magnitude of the performance parameter distance to failure and the degradation rate is determined as the failure time of the performance parameter.

[0189] In one embodiment, when the computer program is executed by a processor, the following steps are also implemented:

[0190] Sort the failure time of each performance parameter from small to large;

[0191] The performance parameter corresponding to the minimum failure time is determined as the life characteristic parameter.

[0192] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to the memory, database or other medium used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetoresistive random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in each embodiment provided in this application may include at least one of a relational database and a non-relational database. Non-relational databases may include distributed databases based on blockchains, etc., but are not limited to this. The processor involved in each embodiment provided in this application may be a general-purpose processor, a central processing unit, a graphics processor, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., but are not limited to this.

[0193] The technical features of the above embodiments may be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0194] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the present application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the present application shall be subject to the attached claims.

Claims

1. A method for determining life characteristic parameters, characterized in that: The method comprises: Acquire first detection data and second detection data of each performance parameter of the target electronic component; the first detection data is the detection data of the performance parameter of the target electronic component in the initial state, and the second detection data is the detection data of the performance parameter after the target electronic component is naturally stored for a preset time period; Determine the failure time of each of the performance parameters based on the first detection data, the second detection data, the technical requirement value of each of the performance parameters in the initial state of the target electronic component, and the preset time; From each of the performance parameters, a life characteristic parameter is determined according to the failure time of each of the performance parameters.

2. The method according to claim 1, characterized in that: The determining the failure time of each performance parameter based on the first detection data, the second detection data, the technical requirement value of each performance parameter in the initial state of the target electronic component, and the preset time length includes: Determining a degradation rate of the performance parameter according to the first detection data, the second detection data and the preset time length; The failure time of the performance parameter is determined according to the degradation rate of the performance parameter, the technical requirement value and the first detection data.

3. The method according to claim 2, characterized in that The first detection data includes: a plurality of first data obtained by detecting the performance parameter multiple times; the second detection data includes: a plurality of second data obtained by detecting the performance parameter multiple times; and determining the degradation rate of the performance parameter according to the first detection data, the second detection data and the preset time length includes: Determine a first average value of the plurality of first data and a second average value of the plurality of second data; A degradation rate of the performance parameter is determined according to the first average value, the second average value, and the preset time length.

4. The method according to claim 3, characterized in that The determining the degradation rate of the performance parameter according to the first average value, the second average value and the preset time length includes: Determine an average value change according to the second average value and the first average value; A first ratio between the average value change and the preset time length is determined as the degradation rate.

5. The method according to claim 2, characterized in that: The determining the failure time of the performance parameter according to the degradation rate of the performance parameter, the technical requirement value and the first detection data includes: Determining a value of the performance parameter distance to failure according to the technical requirement value and the first detection data; A second ratio between the value of the performance parameter distance to failure and the degradation rate is determined as the failure time of the performance parameter.

6. The method according to any one of claims 1 to 5, characterized in that: Determining the life characteristic parameter from each of the performance parameters according to the failure time of each of the performance parameters includes: The failure time of each performance parameter is sorted in ascending order; The performance parameter corresponding to the minimum failure time is determined as the life characteristic parameter.

7. A device for determining life characteristic parameters, characterized in that: The device comprises: An acquisition module, used to acquire first detection data and second detection data of each performance parameter of a target electronic component; the first detection data is detection data of the performance parameter of the target electronic component in an initial state, and the second detection data is detection data of the performance parameter of the target electronic component after natural storage for a preset time period; A first determination module, configured to determine the failure time of each of the performance parameters based on the first detection data, the second detection data, the technical requirement value of each of the performance parameters in the initial state of the target electronic component, and the preset time; The second determination module is used to determine the life characteristic parameter from each of the performance parameters according to the failure time of each of the performance parameters.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

10. A computer program product, comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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