Photoelectric tester of perovskite photovoltaic module and testing method thereof

Abstract

The invention belongs to the technical field of electrical testing, and relates to a photoelectric tester of a perovskite photovoltaic module and a testing method thereof.The photoelectric tester comprises a sample objective table, a laser system, a relative movement system and a data acquisition system, the laser system carries out laser irradiation on the surface of a certain test area of a perovskite photovoltaic module test sample placed on the sample objective table, and the data acquisition system tests and collects photoelectric parameter change data of the test sample under laser irradiation. The laser system comprises a laser, a laser shaping module and a laser head assembly, the laser shaping module receives laser emitted by the laser, performs shaping treatment on the laser according to a set shape, and performs energy homogenization treatment on the laser in the set shape; and the shaped laser is irradiated on the surface of the test area of the test sample through the laser head assembly. According to the invention, laser irradiation is carried out on the test area, the photoelectric parameters of the test area are collected, and reference is provided for improving the technological process of the perovskite photovoltaic module.

Description

Technical Field

[0001] The invention belongs to the technical field of electrical testing, and in particular relates to a photoelectric tester for a perovskite photovoltaic module and a testing method thereof. Background Art

[0002] The best test method for evaluating the performance of photovoltaic modules in the photovoltaic industry is IV testing. For example, for thin-film solar cells, by measuring the IV of thin-film solar cell modules, the comprehensive power generation of the photovoltaic module can be determined, and the open circuit voltage, short circuit current, fill factor of each sub-cell, and the peak voltage and peak current of the photovoltaic module can be averaged. Moreover, through the test data of JV in light and JV in dark state, the series resistance and parallel resistance of the photovoltaic module as a whole can be obtained by data fitting. The above electrical tests are all for evaluating the entire photovoltaic module, and it is difficult to accurately obtain the electrical characteristics of a certain point or a certain area of ​​the photovoltaic module. In actual production, it is very important to be able to judge the electrical parameters of different positions in a large photovoltaic module, which is very critical to improving the efficiency of photovoltaic module products. Summary of the invention

[0003] The technical problem to be solved by the present invention is to provide a photoelectric tester and a testing method for a perovskite photovoltaic module, set up a laser system and a data acquisition system, perform local laser irradiation on a certain test area of ​​a perovskite photovoltaic module test sample, collect photoelectric parameter change data of the test area, and thus obtain the photoelectric characteristics of all test areas of the perovskite photovoltaic module test sample.

[0004] The present invention is implemented in this way, providing an optoelectronic tester for perovskite photovoltaic modules, including a sample stage, a laser system, a relative movement system and a data acquisition system, the sample stage and the laser system are arranged at intervals from each other, the laser system performs laser irradiation on the surface of a certain test area of ​​the perovskite photovoltaic module test sample placed on the sample stage, the data acquisition system tests and collects the optoelectronic parameter change data generated by light conversion of the test sample under laser irradiation, and the relative movement system drives the sample stage and the laser system to move relative to each other, so that the laser system performs laser irradiation on each test area on the test sample in turn. The optoelectronic parameter is at least one of photocurrent, photovoltage, power generation and photovoltage attenuation. The laser system includes a laser, a laser shaping module and a laser head assembly, the laser shaping module receives the laser emitted by the laser, and shapes the laser according to a set shape, and performs energy homogenization on the laser within the set shape, and the shaped laser is irradiated onto the test area surface of the test sample through the laser head assembly.

[0005] Furthermore, the data acquisition system includes at least one of a photocurrent module, a photovoltage module, a power generation module and a photovoltage attenuation module. The data acquisition system also obtains a photoelectric parameter spectrum of all test areas of the test sample based on the collected photoelectric parameter change data of each test area. The photoelectric parameter spectrum is a corresponding photocurrent spectrum (mapping), photovoltage spectrum (mapping), power generation spectrum (mapping) and photovoltage attenuation spectrum (mapping).

[0006] Furthermore, the photocurrent module includes an ammeter, which performs current testing on the test area according to a set program; the photovoltage module includes a voltmeter, which performs voltage testing on the test area according to a set program; the power generation module includes a set electronic load connected to the positive and negative poles of the test sample, and the power generation module measures the power value of the electronic load, which is equivalent to the power generation power of the test area; the photovoltage attenuation module includes an oscilloscope, which displays the photovoltage attenuation curve of the test area.

[0007] Furthermore, a mounting block for fixing the laser head assembly is arranged on the relative movement system, and the relative movement system drives the laser head assembly to move along the X and Y directions of the sample stage, and the movement area of ​​the laser head assembly corresponds to the area where all the test areas of the test sample are located.

[0008] Furthermore, the laser is any one of a semiconductor laser, a solid laser and a fiber laser.

[0009] Furthermore, the set shape for shaping by the laser shaping module is circular, square or rectangular.

[0010] The present invention is implemented in this way, and also provides a photoelectric testing method for a perovskite photovoltaic module, wherein the testing method uses the photoelectric tester for the perovskite photovoltaic module as described above to perform the test, and comprises the following steps: Step 1: Place the perovskite photovoltaic module sample to be electrically tested on the sample stage, electrically connect the data acquisition system to the test sample, and start the relative movement system to align the laser head assembly of the laser system with the test area on the test sample; Step 2: Start the laser system, the laser head assembly irradiates the test area with laser, and the data acquisition system tests and collects the photoelectric parameter change data of the test area; Step 3: Restart the relative movement system to align the laser head assembly of the laser system with another test area on the test sample, repeat step 2, test and collect the optoelectronic parameter change data of the test area, until the optoelectronic parameter test of all the test areas on the test sample is completed.

[0011] Compared with the prior art, the present invention provides an optoelectronic tester and a test method for a perovskite photovoltaic module. The optoelectronic tester includes a sample stage, a laser system, a relative movement system, and a data acquisition system. The laser system performs laser irradiation on the surface of a test area of ​​a perovskite photovoltaic module test sample placed on the sample stage. The data acquisition system tests and collects the optoelectronic parameter change data generated by light conversion of the test sample under laser irradiation. The relative movement system drives the sample stage and the laser system to move relative to each other, so that the laser system performs laser irradiation on each test area on the test sample in turn. The laser system includes a laser, a laser shaping module, and a laser head assembly. The laser shaping module receives the laser emitted by the laser, and shapes the laser according to a set shape, and performs energy homogenization on the laser within the set shape. The shaped laser is irradiated onto the test area surface of the test sample through the laser head assembly. The present invention sets up a laser system and a data acquisition system to perform local laser irradiation on a certain test area of ​​a perovskite photovoltaic module test sample, collect photoelectric parameter change data of the test area, thereby obtaining the photoelectric characteristics of all test areas of the perovskite photovoltaic module test sample, and providing data reference and evaluation standards for improving the process of the perovskite photovoltaic module. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a schematic diagram of the structural principle of a preferred embodiment of the optoelectronic tester for the perovskite photovoltaic module of the present invention.

[0013] Explanation of the reference numerals: 1 - sample stage, 2 - laser system, 3 - data acquisition system, 4 - laser, 5 - laser shaping module, 6 - laser head assembly, A - test sample. DETAILED DESCRIPTION

[0014] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0015] Please refer to Figure 1 As shown, a preferred embodiment of an optoelectronic tester for a perovskite photovoltaic module of the present invention includes a sample stage 1, a laser system 2, a relative movement system (not shown in the figure) and a data acquisition system 3.

[0016] The sample stage 1 and the laser system 2 are arranged at intervals from each other. The laser system 2 performs laser irradiation on the surface of a certain test area of ​​the perovskite photovoltaic module test sample A placed on the sample stage. The data acquisition system 3 tests and collects the photoelectric parameter change data generated by light conversion of the test sample A under laser irradiation according to the set requirements. The relative movement system drives the sample stage 1 and the laser system 2 to move relative to each other, so that the laser system 2 performs laser irradiation on each test area on the test sample A in turn. Among them, the photoelectric parameter is at least one of photocurrent, photovoltage, power generation and photovoltage attenuation. The test route and test sequence for testing each test area are preset.

[0017] The photoelectric tester of the present invention can simultaneously test the photocurrent, photovoltage, power generation power and photovoltage attenuation of a perovskite photovoltaic module test sample A, thereby providing a comprehensive photoelectric tester for a perovskite photovoltaic module.

[0018] The laser system 2 includes a laser 4, a laser shaping module 5 and a laser head assembly 6. The laser shaping module 5 receives the laser emitted by the laser 4, shapes the laser according to a set shape, and performs energy homogenization on the laser within the set shape according to set requirements. The shaped laser is irradiated onto the surface of the test area of ​​the test sample A through the laser head assembly 6. The purpose of setting the laser shaping module 5 is to shape the laser with energy Gaussian distribution into a platform beam, so as to ensure that the laser incident on the surface of the test area is uniform, so that the photoelectric reaction irradiated into each test area is consistent. The laser head assembly 6 irradiates the test area with laser in the direction indicated by the arrow, so that the test area undergoes a photoelectric reaction, and the photoelectric conversion causes the photoelectric parameters of the test sample A to change.

[0019] The data acquisition system 3 includes at least one of a photocurrent module, a photovoltage module, a power generation module, and a photovoltage attenuation module (not shown in the figure). The data acquisition system 3 also obtains the photoelectric parameter spectrum of all the test areas of the test sample A based on the collected photoelectric parameter change data of each test area. The photoelectric parameter spectrum is the corresponding photocurrent spectrum, photovoltage spectrum, power generation spectrum, and photovoltage attenuation spectrum. The data acquisition system 3 is conductively connected to the perovskite photovoltaic module test sample A through a wire.

[0020] Among them, the photocurrent spectrum can judge the band gap of the absorption layer at different positions of the entire perovskite photovoltaic module, the quality of the preparation of the electron transport layer and the hole transport layer. The photovoltage spectrum can evaluate the light absorption of the entire perovskite photovoltaic module at different positions, so as to judge the quality of the absorption layer; horizontal comparison can also evaluate the quality of the transmission layer before and after the absorption layer. The power generation spectrum can evaluate the power generation of the entire perovskite photovoltaic module at different positions. By comparing different positions, the cause of the abnormal power of the perovskite photovoltaic module can be found; by horizontal comparison, reference suggestions and evaluation standards can be made for the process. The photovoltage attenuation spectrum can evaluate the defects inside the absorption layer of the perovskite photovoltaic module at different positions. According to the photovoltage attenuation at the actual position, horizontal comparison can be made to make suggestions for improving the overall performance of the perovskite photovoltaic module.

[0021] If the laser emitted by the laser system 2 is a pulsed light, the photovoltage attenuation at different positions of the perovskite photovoltaic module can also be accurately measured. According to the attenuation curve fitting, the carrier concentration at different positions of the perovskite photovoltaic module can be measured. At the same time, according to the packaging structure of the perovskite photovoltaic module and the absorption of each film layer, a laser of a selected wavelength is used to focus on each film layer. For the packaged perovskite photovoltaic module, if the defect position is detected, the defect can be repaired by laser in real time to avoid further expansion of the defect of the perovskite photovoltaic module. For single-point defects, first locate the defect point, move the laser head assembly 6 to the defect point, use the laser to focus on the single-point defect, perform laser processing on it, and repair or insulate the single-point defect.

[0022] Specifically, the photocurrent module includes an ammeter, which performs a current test of the test area according to a set program. The impedance value of the ammeter is 10Ω~500Ω, which is manually adjusted according to the input current range. The photovoltage module includes a voltmeter, which performs a voltage test of the test area according to a set program. The test results are an open-circuit voltage of the test area. The impedance of the voltmeter is 10MΩ. The power generation module includes a set electronic load connected to the positive and negative poles of the test sample. The power value of the electronic load measured by the power generation module is equivalent to the power generation of the test area. The photovoltage attenuation module includes an oscilloscope, which displays the photovoltage attenuation curve of the test area. At this time, if the laser 4 is a pulsed laser, the pulse width of the laser 4 needs to be set according to the test requirements.

[0023] A mounting block for fixing the laser head assembly is arranged on the relative movement system. The relative movement system drives the laser head assembly to move along the X and Y directions of the sample stage. The moving area of ​​the laser head assembly corresponds to the area where the entire test area of ​​the test sample is located. The relative movement system includes a fixed bracket, an X-direction moving device and a Y-direction moving device. The Y-direction moving device is fixed on the X-direction moving device. The X-direction moving device is arranged on the fixed bracket to move along the X direction of the fixed bracket. The mounting block is arranged on the Y-direction moving device. The laser head assembly 6 is fixed on the mounting block. The X direction and the Y direction are perpendicular to each other.

[0024] The laser 4 is any one of a semiconductor laser, a solid laser and a fiber laser. The laser to be used is determined according to the band gap of the test sample A. If it is a perovskite photovoltaic module, due to the strong absorption coefficient of perovskite, the wavelength can be from 470 to 630 nm. A relatively cheap 532 nm green laser can be used.

[0025] The laser shaping module 5 performs shaping in a set shape of a circle, a square or a rectangle. A suitable shaping shape is selected according to the actual situation of the test area.

[0026] A positioning device is provided on the sample stage 1, and the perovskite photovoltaic module test sample A to be tested is placed on the sample stage 1, and is positioned by the positioning device to ensure that the position of the test sample A after placement is the same each time.

[0027] The present invention also discloses a photoelectric testing method for a perovskite photovoltaic module. The testing method uses the photoelectric testing instrument for the perovskite photovoltaic module as described above to perform the test, and comprises the following steps: Step 1: Place the perovskite photovoltaic module sample to be electrically tested on the sample stage 1, electrically connect the data acquisition system 3 to the positive and negative electrodes of the output terminal of the test sample A, and start the relative movement system to align the laser head assembly 6 of the laser system 2 with the test area on the test sample.

[0028] Step 2: Start the laser system 2, the laser head assembly 6 irradiates the test area with laser, and the data acquisition system 3 tests and collects the photoelectric parameter change data of the test area.

[0029] Step 3: restart the relative movement system to align the laser head assembly 6 of the laser system 2 with another test area on the test sample A; repeat step 2 to test and collect the optoelectronic parameter change data of the test area until the optoelectronic parameter test of all the test areas on the test sample A is completed.

[0030] According to the test results of all the test areas of the test sample A, the optoelectronic parameter spectrum corresponding to the test sample A is drawn. The optoelectronic parameter spectrum includes a photocurrent spectrum, a photovoltage spectrum, a power generation spectrum and a photovoltage attenuation spectrum.

[0031] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A photoelectric tester for a perovskite photovoltaic module, characterized in that: The invention comprises a sample stage, a laser system, a relative movement system and a data acquisition system. The sample stage and the laser system are arranged at intervals from each other. The laser system performs laser irradiation on the surface of a certain test area of ​​a perovskite photovoltaic module test sample placed on the sample stage. The data acquisition system tests and collects the photoelectric parameter change data generated by light conversion of the test sample under laser irradiation. The relative movement system drives the sample stage and the laser system to move relative to each other, so that the laser system performs laser irradiation on each test area on the test sample in turn. The photoelectric parameter is at least one of photocurrent, photovoltage, power generation and photovoltage attenuation. The laser system comprises a laser, a laser shaping module and a laser head assembly. The laser shaping module receives the laser emitted by the laser, shapes the laser according to a set shape, and performs energy homogenization on the laser within the set shape. The shaped laser is irradiated onto the test area surface of the test sample through the laser head assembly.

2. The photoelectric tester of a perovskite photovoltaic module according to claim 1, characterized in that: The data acquisition system includes at least one of a photocurrent module, a photovoltage module, a power generation module and a photovoltage attenuation module. The data acquisition system also obtains a photoelectric parameter spectrum of all test areas of the test sample based on the collected photoelectric parameter change data of each test area. The photoelectric parameter spectrum is a corresponding photocurrent spectrum, photovoltage spectrum, power generation spectrum and photovoltage attenuation spectrum.

3. The optoelectronic tester for a perovskite photovoltaic module according to claim 2, characterized in that: The photocurrent module includes an ammeter, which performs current testing on the test area according to a set program; the photovoltage module includes a voltmeter, which performs voltage testing on the test area according to a set program; the power generation module includes a set electronic load connected to the positive and negative poles of the test sample, and the power generation module measures the power value of the electronic load, which is equivalent to the power generation power of the test area; the photovoltage attenuation module includes an oscilloscope, which displays the photovoltage attenuation curve of the test area.

4. The photoelectric tester for a perovskite photovoltaic module according to claim 1, characterized in that: A mounting block for fixing the laser head assembly is arranged on the relative movement system. The relative movement system drives the laser head assembly to move along the X and Y directions of the sample stage. The moving area of ​​the laser head assembly corresponds to the area where all the test areas of the test sample are located.

5. The photoelectric tester for a perovskite photovoltaic module according to claim 1, characterized in that: The laser is any one of a semiconductor laser, a solid laser and a fiber laser.

6. The photoelectric tester for a perovskite photovoltaic module according to claim 1, characterized in that: The laser shaping module performs shaping processing in a set shape of a circle, a square or a rectangle.

7. A photoelectric testing method for a perovskite photovoltaic module, characterized in that: The testing method is performed using a photoelectric tester for a perovskite photovoltaic module as claimed in any one of claims 1 to 6, comprising the following steps: Step 1: Place the perovskite photovoltaic module sample to be electrically tested on the sample stage, electrically connect the data acquisition system to the test sample, and start the relative movement system to align the laser head assembly of the laser system with the test area on the test sample; Step 2: Start the laser system, the laser head assembly irradiates the test area with laser, and the data acquisition system tests and collects the photoelectric parameter change data of the test area; Step 3: Restart the relative movement system to align the laser head assembly of the laser system with another test area on the test sample, repeat step 2, test and collect the optoelectronic parameter change data of the test area, until the optoelectronic parameter test of all the test areas on the test sample is completed.

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