Chip testing equipment

Abstract

The invention discloses chip testing equipment, which belongs to the technical field of chip testing, and is characterized in that the chip testing equipment comprises a support frame, a hollow motor, a rotary drum, a chip testing disc, a feeding adapter, a discharging adapter and a cooling pipe, the rotary drum is connected with the hollow motor, the chip testing disc is connected with the rotary drum and is provided with a cooling channel, the feeding adapter is provided with a feeding channel, and the discharging adapter is provided with a discharging channel; the inlet end of the feeding channel communicates with a refrigerant source, the feeding adapter comprises a first machine body and a first connector, the first machine body is connected with the side wall of the hollow motor, the first connector is arranged at the outlet end of the feeding channel and rotationally connected with the first machine body, the discharging adapter comprises a second machine body and a second connector, the second machine body is connected with the supporting frame, and the second connector is arranged at the outlet end of the feeding channel. A discharging channel is formed in the first machine body, the second connector is arranged at the inlet end of the discharging channel and rotationally connected with the second machine body, the first connector and the second connector are both connected with the chip testing disc through the cooling pipe, and the effect of reducing the refrigerant leakage phenomenon is achieved.

Description

Technical Field

[0001] The present application relates to the field of chip testing technology, and in particular to a chip testing device. Background Art

[0002] After the chip is produced, it needs to be tested for performance under three temperatures (high temperature, room temperature and low temperature, the temperature range is -55℃ to 155℃) and high pressure (300psi). The traditional test method usually uses a single test seat to fix the chips one by one. This method not only increases the workload of the operator, but also has low overall test efficiency. In view of this, the multi-chip multi-function high-voltage test equipment disclosed by the Chinese utility model patent CN215575512U is an improved device. The equipment mainly includes a rotating carrier plate mounted above the rack platform, a rotating mechanism is arranged at one end of the rotating carrier plate, a temperature conduction plate is arranged in the rotating carrier plate, a temperature control infusion tube is connected to the temperature conduction plate, a metal test plate is arranged on the temperature conduction plate, and a plurality of independent chip chambers are opened on the metal test plate. The metal test plate is tightly attached to a pressing cover through a snap mechanism, and the bottom end of the pressing cover is provided with a pressing strip around the edge of the metal test plate, and the inner side of the pressing strip is provided with a plurality of evenly distributed pressure inlet holes and a plurality of test probe groups corresponding to the chip chambers. The multi-chip multi-function high-voltage test equipment can provide a high-voltage, three-temperature and rotating test environment, satisfying multi-chip multi-function testing at one time, improving detection efficiency and reducing labor intensity; the evenly distributed pressure air inlet holes and the pressed rubber strips ensure that each chip chamber is pressurized evenly, avoiding the impact of high-voltage concentration on test accuracy.

[0003] However, in actual applications, it was found that although the above equipment can well meet the predetermined functional requirements, there are still certain defects in the part involving the refrigeration system. Specifically, in the process of using refrigerant to transmit through pipelines to create low temperatures, although the relevant components will be placed in a nearly moisture-free dry environment to reduce the risk of condensation, due to being in a low temperature state for a long time, the pipelines that transport the refrigerant will inevitably become brittle or even hardened to a certain extent. The refrigerant pipeline is retracted and released by a disc. After the equipment has been running for a period of time, it is very easy for the refrigerant to leak at the moving end and joints of the refrigerant pipeline, which will affect the cooling ability of the equipment. Summary of the invention

[0004] In order to reduce the occurrence of refrigerant leakage, the present invention provides a chip testing device.

[0005] The present invention provides a chip testing device that adopts the following technical solution: A chip testing device comprises a support frame; A hollow motor connected to the support frame; A rotating drum, one end of which is connected to the driving end of the hollow motor; A chip test tray, one end of which is connected to the rotating drum and the other end of which is rotatably connected to the support frame, and a cooling channel for a refrigerant to pass through is provided in the chip test tray; A feed adapter and a discharge adapter, the feed adapter and the discharge adapter are respectively arranged on both sides of the support frame, the feed adapter comprises a first body and a first connector, the first body is connected to the support frame, a feed channel connected to a refrigerant source is provided in the first body, the first connector is provided at the outlet end of the feed channel and is rotatably connected to the first body; the discharge adapter comprises a second body and a second connector, the second body is connected to the support frame, a discharge channel is provided in the second body, the second connector is provided at the inlet end of the discharge channel and is rotatably connected to the second body; and A cooling pipe, the feed adapter and the chip test disk, the chip test disk and the discharge adapter are both connected through the cooling pipe, and the cooling pipe connected to the feed adapter passes through the inside of the rotating drum and the hollow motor; The feed channel, the cooling tube, the temperature reduction channel and the discharge channel form a feed passage for the refrigerant to pass through.

[0006] By adopting the above technical solution, when the chip is subjected to low-temperature testing, the refrigerant medium is first introduced into the feed channel, so that the refrigerant passes through the entire feed channel and is discharged from the outlet end of the discharge channel to achieve freezing treatment of the chip. The hollow motor starts to drive the rotating drum to rotate, and the rotating drum drives the chip test disk to rotate. The chip test disk is connected to the cooling pipe, so the cooling pipe rotates with the chip test disk, and the cooling pipe with the feed adapter drives the first connector to rotate, and the cooling pipe with the discharge adapter drives the second connector to rotate, ensuring the continuous low-temperature environment during the chip test process. At the same time, through the design of the feed adapter and the discharge adapter, the occurrence of leakage between the cooling pipe and the refrigerant source joint is greatly reduced, ensuring the smoothness and sealing of the refrigerant flow path, and improving the refrigeration efficiency of the entire system.

[0007] Preferably, the feed adapter further includes a first fixed head, the first fixed head is arranged at the inlet port of the feed channel, the first fixed head is fixedly connected to the first body, and the first fixed head is used to connect to the refrigerant source pipeline.

[0008] By adopting the above technical solution, the first fixed head is used to connect to the refrigerant source, thereby stably providing refrigerant and ensuring the continuity and reliability of the refrigerant supply in the cooling channel during the chip testing process.

[0009] Preferably, a plurality of first convex rings are provided on the outer wall of the first connector away from one end of the cooling tube, a first sealing ring is provided between every two adjacent first convex rings, and the first sealing ring is sleeved on the first connector to achieve sealing between the first connector and the first body.

[0010] By adopting the above technical solution, the sealing effect between the first connector and the first body is significantly improved, reducing the possibility of refrigerant leakage and ensuring the stability and safety of the chip testing equipment operation.

[0011] Preferably, the first connector is provided with a first bearing, and the first bearing is connected to the first body to realize the rotation of the first connector and the first body.

[0012] By adopting the above technical solution, the first connector can be flexibly rotated relative to the first body, ensuring that the feed adapter is stably connected to the inside of the drum during the rotation of the drum, while reducing the possibility of wear or damage caused by mechanical movement, thereby improving the reliability and stability of the operation of the entire chip testing equipment.

[0013] Preferably, the discharge adapter further includes a second fixed head, the second fixed head is arranged at the outlet end of the discharge channel, the second connecting head is fixedly connected to the second body, and the second connecting head is used to release the refrigerant.

[0014] By adopting the above technical solution, the discharge adapter includes a second fixed head, the second fixed head is arranged at the outlet end of the discharge channel, the second connecting head is fixedly connected to the second body, and the second connecting head is used to release the refrigerant, thereby ensuring that the refrigerant can flow out of the chip test disk stably, thereby improving the cooling efficiency and reliability of the test process.

[0015] Preferably, the outer wall of the second connector away from one end of the cooling tube is ringed with a plurality of second convex rings, a second sealing ring is provided between every two adjacent second convex rings, and the second sealing ring is sleeved on the second connector to achieve sealing between the second connector and the second body.

[0016] By adopting the above technical solution, a second convex ring and a second sealing ring structure are added to the outer wall of the second connector, thereby improving the sealing performance between the discharge adapter and the second body, reducing the possibility of refrigerant leakage, and ensuring the stable operation of the entire cooling system.

[0017] Preferably, the second connector is provided with a second bearing, and the second bearing is connected to the second body to realize the rotation of the second connector and the second body.

[0018] By adopting the above technical solution, the second connecting head can rotate freely relative to the second body, which ensures the smoothness of the discharging process and reduces wear, thereby improving the stability and service life of the entire equipment during operation.

[0019] Preferably, the support frame is connected to a safety cover, the safety cover is arranged on a side of the hollow motor away from the chip test disk, and the first body is connected to the safety cover.

[0020] By adopting the above technical solution and setting a safety cover to cover the hollow motor, the safety and stability of the equipment are improved, the possibility of the hollow motor being interfered by external factors during operation is reduced, and the continuity and reliability of the chip testing process are ensured.

[0021] Preferably, the feed adapter cover is externally covered with a first box body, the first box body is connected to both the safety cover and the first body, and the inner wall of the first box body is connected to an anti-frost insulation layer.

[0022] By adopting the above technical solution, the first box not only effectively isolates the external environment and reduces the possibility of frost on the inner wall of the first box during the transmission of the refrigerant, but the anti-frost insulation layer further enhances the insulation effect and ensures the temperature stability of the refrigerant before entering the chip test disk.

[0023] Preferably, the outside of the discharge adapter is covered with a second box body, the second box body is connected to both the support frame and the second body, and the inner wall of the second box body is connected to an anti-frost insulation layer.

[0024] By adopting the above technical solution, the second box body can not only physically isolate the external environment, but also the anti-frost insulation layer on its inner wall can reduce the occurrence of frost or ice on the discharge adapter and its surrounding areas when working under low temperature conditions, thereby ensuring the stable operation and safety of the entire chip testing equipment in a low temperature environment.

[0025] In summary, the present invention has the following beneficial effects: When the chip is tested at low temperature, the refrigerant medium is first introduced into the feed channel, so that the refrigerant passes through the entire feed channel and is discharged from the outlet end of the discharge channel to achieve freezing of the chip. The hollow motor starts to drive the drum to rotate, and the drum drives the chip test disk to rotate. The chip test disk is connected to the cooling pipe, so the cooling pipe rotates with the chip test disk, and the cooling pipe with the feed adapter drives the first connector to rotate, and the cooling pipe with the discharge adapter drives the second connector to rotate, ensuring the continuous low temperature environment during the chip test process. At the same time, through the design of the feed adapter and the discharge adapter, the leakage of the cooling pipe and the refrigerant source joint is greatly reduced, ensuring the smoothness and sealing of the refrigerant flow path, and improving the refrigeration efficiency of the entire system. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 The present invention is a schematic diagram of the overall structure of a chip testing device.

[0027] Figure 2 This is a schematic diagram of the location of the cooling pipe.

[0028] Figure 3 yes Figure 2 Enlarged schematic diagram of part A.

[0029] Figure 4 yes Figure 2 Schematic diagram of the enlarged portion B.

[0030] Description of reference numerals: 1. Support frame; 11. First bracket; 12. Second bracket; 2. Hollow motor; 21. Safety cover; 3. Rotating drum; 31. Chip test plate; 4. Feed adapter; 41. First body; 411. Feed channel; 42. First connector; 421. First sealing ring; 422. First bearing; 43. First fixed head; 5. First box; 6. Discharge adapter; 61. Second body; 611. Discharge channel; 62. Second connector; 621. Second sealing ring; 622. Second bearing; 63. Second fixed head; 7. Second box; 8. Cooling pipe. DETAILED DESCRIPTION

[0031] The present invention is further described in detail below in conjunction with the accompanying drawings.

[0032] A chip testing device, referring to Figure 1 and Figure 2 , including a support frame 1, a hollow motor 2, a rotating drum 3, a chip test disc 31, a feed adapter 4, a discharge adapter 6 and a cooling pipe 8. The hollow motor 2 is fixedly connected to the support frame 1. One end of the rotating drum 3 is fixedly connected to the driving end of the hollow motor 2. One end of the chip test disc 31 is fixedly connected to the rotating drum 3, and the other end passes through the support frame 1 and is rotatably connected to the support frame 1, and a cooling channel for the refrigerant to pass through is provided in the chip test disc 31.

[0033] Reference Figure 2 , Figure 3 and Figure 4, the feed adapter 4 and the discharge adapter 6 are respectively arranged on both sides of the support frame 1. The feed adapter 4 includes a first body 41 and a first connector 42. The first body 41 is connected to the support frame 1. A feed channel 411 connected to the refrigerant source is provided in the first body 41. The first connector 42 is provided at the outlet end of the feed channel 411 and is rotatably connected to the first body 41. The discharge adapter 6 includes a second body 61 and a second connector 62. The second body 61 is connected to the support frame 1. A discharge channel 611 is provided in the first body 41. The second connector 62 is provided at the inlet end of the discharge channel 611 and is rotatably connected to the second body 61. The feed adapter 4 and the chip test disk 31, and the chip test disk 31 and the discharge adapter 6 are both connected through a cooling pipe 8. The cooling pipe 8 connected to the feed adapter 4 passes through the inside of the drum 3 and the hollow motor 2. Among them, the feed channel 411, the cooling pipe 8, the temperature reduction channel and the discharge channel 611 form a feed passage for the refrigerant to pass through.

[0034] When the chip is subjected to low temperature testing, a refrigerant medium is first introduced into the feed channel 411, so that the refrigerant passes through the entire feed channel and is discharged from the outlet end of the discharge channel 611 to achieve freezing treatment of the chip. The hollow motor 2 starts to drive the rotating drum 3 to rotate, and the rotating drum 3 drives the chip test disk 31 to rotate. The chip test disk 31 is connected to the cooling pipe 8, so the cooling pipe 8 rotates with the chip test disk 31, and the cold pipe with the feed adapter 4 drives the first connector 42 to rotate, and the cooling pipe 8 with the discharge adapter 6 drives the second connector 62 to rotate, ensuring the operation of a continuous low temperature environment during the chip test process. At the same time, through the design of the feed adapter 4 and the discharge adapter 6, the occurrence of leakage between the cooling pipe 8 and the refrigerant source joint is greatly reduced, ensuring the smoothness and sealing of the refrigerant flow path, and improving the refrigeration efficiency of the entire system.

[0035] Reference Figure 1 and Figure 2 The support frame 1 includes a first bracket 11 and a second bracket 12, and the first bracket 11 and the second bracket 12 are arranged at intervals. The hollow motor 2 is fixedly connected to the first bracket 11, and the axis of the rotating drum 3 coincides with the axis of the hollow motor 2. The chip test plate 31 is rotatably connected to the second bracket 12.

[0036] Reference Figure 2 A safety cover 21 is fixedly connected to the side of the first bracket 11 away from the chip test disk 31. The safety cover 21 is arranged on the side of the hollow motor 2 away from the chip test disk 31 to improve the safety and stability of the equipment.

[0037] Reference Figure 2 and Figure 3The first connector 42 is arranged horizontally, and the axis of the first connector 42 coincides with the axis of the hollow motor 2. The thickness of the second end of the first connector 42 gradually increases from the end wall, which has a guiding effect and facilitates the insertion of the cooling pipe 8. The outer side of the first connector 42 is ringed with a first protrusion to achieve the fixation of the first connector 42 and the cooling pipe 8.

[0038] Reference Figure 3 , one end of the first connector 42 away from the cooling pipe 8 extends into the first body 41. A first convex ring is provided around one end of the first connector 42 away from the cooling pipe 8. There are multiple first convex rings. In this embodiment, there are four first convex rings. A first sealing ring 421 is provided between each two adjacent first convex rings. The three first sealing rings 421 are sleeved on the first connector 42 to achieve sealing between the outer side of the first connector 42 and the first body 41.

[0039] The sealing effect between the first connector 42 and the first body 41 is significantly improved, reducing the possibility of refrigerant leakage and ensuring the stability and safety of the chip testing equipment operation.

[0040] Reference Figure 3 A first bearing 422 is further provided between the first connector 42 and the first body 41. The first bearing 422 is sleeved on the first connector 42 and fixedly connected to the first body 41. The first bearing 422 is located in the middle of the first connector 42 and embedded in the first body 41.

[0041] The first connector 42 can be flexibly rotated relative to the first body 41, ensuring that the feed adapter 4 is stably connected to the inside of the drum 3 during the rotation of the drum 3, while reducing the possibility of wear or damage caused by mechanical movement, thereby improving the reliability and stability of the entire chip testing equipment.

[0042] Reference Figure 3 The feed adapter 4 also includes a first fixed head 43. The first fixed head 43 is vertically inserted into the first body 41 and fixedly connected to the first body 41 for connecting the refrigerant source pipeline. The inlet end and the outlet end of the feed channel 411 are 90 degrees, and the first fixed head 43 is arranged at the inlet end of the feed channel 411.

[0043] Reference Figure 2 and Figure 3 The thickness of the bottom end of the first fixing head 43 gradually increases from the end wall, which is convenient for inserting the refrigerant source pipeline and installing the refrigerant source pipeline. The outer wall of the first fixing head 43 is provided with a first protrusion, which is convenient for installing and fixing the first fixing head 43.

[0044] Reference Figure 3The first housing 41 is covered with a first box 5, and the first box 5 is fixedly connected to the safety cover 21. An anti-frost insulation layer is fixedly connected to the inner wall of the first box 5. The first fixed head 43 passes through the first box 5 and extends to the outside.

[0045] The first box body 5 not only effectively isolates the external environment and reduces the possibility of frost on the inner wall of the first box body 5 during the transmission of the refrigerant, but the anti-frost insulation layer further enhances the insulation effect and ensures the temperature stability of the refrigerant before entering the chip test disk 31.

[0046] Reference Figure 2 and Figure 4 The second connector 62 is arranged horizontally, and the thickness of the second connector 62 at one end close to the cooling tube 8 gradually increases from the end wall, which has a guiding effect and facilitates the insertion of the cooling tube 8. A second protrusion is arranged around the outer side of the second connector 62 to fix the second connector 62 and the cooling tube 8.

[0047] Reference Figure 4 , one end of the second connector 62 away from the cooling pipe 8 extends into the second body 61. A second convex ring is provided around one end of the second connector 62 away from the cooling pipe 8. There are multiple second convex rings. In this embodiment, there are four second convex rings. A second sealing ring 621 is provided between each two adjacent second convex rings. The three second sealing rings 621 are sleeved on the second connector 62 to achieve sealing between the outer side of the second connector 62 and the second body 61.

[0048] The second convex ring and the second sealing ring 621 structure are added to the outer wall of the second connector 62, thereby improving the sealing performance between the discharge adapter 6 and the second body 61, reducing the possibility of refrigerant leakage, and ensuring the stable operation of the entire cooling system.

[0049] Reference Figure 4 A second bearing 622 is further provided between the second connector 62 and the second body 61. The second bearing 622 is sleeved on the second connector 62 and fixedly connected to the second body 61. The second bearing 622 is located in the middle of the second connector 62 and embedded in the second body 61.

[0050] The second connecting head 62 can rotate freely relative to the second body 61, which ensures the smoothness of the discharging process and reduces wear, thereby improving the stability and service life of the entire equipment during operation.

[0051] Reference Figure 4 The discharge adapter 6 also includes a second fixed head 63. The inlet end and the outlet end of the discharge channel 611 are arranged at 90 degrees, and the second fixed head 63 is vertically inserted into the second body 61 and fixedly connected to the second body 61. The second fixed head 63 is arranged at the outlet end of the discharge channel 611.

[0052] Reference Figure 2 and Figure 4 The thickness of the bottom end of the second fixing head 63 gradually increases from the end wall, which is convenient for inserting the cold medium source pipeline. The outer wall of the second fixing head 63 is provided with a second protrusion, which is convenient for fixing the cold medium source pipeline.

[0053] Reference Figure 2 and Figure 4 The second body 61 is covered with a second box 7, and the second box 7 is fixedly connected to the safety cover 21. An anti-frost insulation layer is fixedly connected to the inner wall of the second box 7. The second fixed head 63 passes through the second box 7 and extends to the outside.

[0054] The second box body 7 can not only physically isolate the external environment, but also the anti-frost insulation layer on its inner wall can reduce the occurrence of frost or ice on the discharge adapter 6 and its surrounding areas when working under low temperature conditions, thereby ensuring the stable operation and safety of the entire chip testing equipment in a low temperature environment.

[0055] Reference Figure 3 One end of the cooling tube 8 connected to the feed adapter 4 is plugged into the first connector 42 to fix the cooling tube 8 to the first protrusion. The other end of the cooling tube 8 connected to the feed adapter 4 is plugged into the chip test disk 31 to communicate with the cooling channel.

[0056] Reference Figure 4 One end of the cooling tube 8 connected to the discharge adapter 6 is plugged into the chip test plate 31 to achieve communication with the cooling channel. The other end of the cooling tube 8 connected to the discharge adapter 6 is plugged into the second connector 62 to fix the cooling tube 8 and the second protrusion.

[0057] The use principle of the present application is as follows: when the chip is tested at low temperature, a refrigerant medium is first introduced into the feed channel 411, so that the refrigerant passes through the entire feed channel and is discharged from the outlet end of the discharge channel 611 to achieve freezing treatment of the chip. The hollow motor 2 starts to drive the rotating drum 3 to rotate, and the rotating drum 3 drives the chip test disk 31 to rotate. The chip test disk 31 is connected to the cooling pipe 8, so the cooling pipe 8 rotates with the chip test disk 31, and the cold pipe with the feed adapter 4 drives the first connector 42 to rotate, and the cooling pipe 8 with the discharge adapter 6 drives the second connector 62 to rotate, ensuring the operation of the continuous low temperature environment during the chip test process. At the same time, through the design of the feed adapter 4 and the discharge adapter 6, the occurrence of leakage between the cooling pipe 8 and the refrigerant source joint is greatly reduced, ensuring the smoothness and sealing of the refrigerant flow path, and improving the refrigeration efficiency of the entire system.

[0058] The embodiments of this specific implementation method are all preferred embodiments of the present invention, and are not intended to limit the protection scope of the present invention. Therefore, any equivalent changes made based on the structure, shape, and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A chip testing device, characterized in that: It comprises a support frame (1); A hollow motor (2), wherein the hollow motor (2) is connected to the support frame (1); A rotating drum (3), one end of which is connected to the driving end of the hollow motor (2); A chip test plate (31), one end of which is connected to the rotating drum (3) and the other end of which is rotatably connected to the support frame (1), and a cooling channel for a refrigerant to pass through is provided in the chip test plate (31); A feed adapter (4) and a discharge adapter (6), wherein the feed adapter (4) and the discharge adapter (6) are respectively arranged on two sides of the support frame (1), the feed adapter (4) comprises a first body (41) and a first connector (42), the first body (41) is connected to the support frame (1), a feed channel (411) connected to a refrigerant source is provided in the first body (41), the first connector (42) is arranged at the outlet end of the feed channel (411), and is rotatably connected to the first body (41); the discharge adapter (6) comprises a second body (61) and a second connector (62), the second body (61) is connected to the support frame (1), a discharge channel (611) is provided in the second body (61), the second connector (62) is arranged at the inlet end of the discharge channel (611), and is rotatably connected to the second body (61); as well as A cooling pipe (8), wherein the feed adapter (4) and the chip test disk (31), and the chip test disk (31) and the discharge adapter (6) are both connected via the cooling pipe (8), and the cooling pipe (8) connected to the feed adapter (4) passes through the inside of the rotating drum (3) and the hollow motor (2); The feed channel (411), the cooling pipe (8), the cooling channel and the discharge channel (611) form a feed channel for the refrigerant to pass through.

2. A chip testing device according to claim 1, characterized in that: The feed adapter (4) also includes a first fixed head (43), the first fixed head (43) is arranged at the inlet port of the feed channel (411), the first fixed head (43) is fixedly connected to the first body (41), and the first fixed head (43) is used to connect the refrigerant source pipeline.

3. A chip testing device according to claim 1, characterized in that: The outer wall of the first connector (42) away from one end of the cooling pipe (8) is ringed with a plurality of first convex rings, and a first sealing ring (421) is provided between every two adjacent first convex rings. The first sealing ring (421) is sleeved on the first connector (42) to achieve sealing between the first connector (42) and the first body (41).

4. A chip testing device according to claim 1, characterized in that: The first connecting head (42) is sleeved with a first bearing (422), and the first bearing (422) is connected to the first body (41) to realize the rotation of the first connecting head (42) and the first body (41).

5. The chip testing device according to claim 1, characterized in that: The discharge adapter (6) also includes a second fixed head (63), the second fixed head (63) is arranged at the outlet end of the discharge channel (611), the second connecting head (62) is fixedly connected to the second body (61), and the second connecting head (62) is used to release the refrigerant.

6. The chip testing device according to claim 1, characterized in that: The outer wall of the second connector (62) away from one end of the cooling pipe (8) is provided with a plurality of second convex rings, and a second sealing ring (621) is provided between every two adjacent second convex rings. The second sealing ring (621) is sleeved on the second connector (62) to achieve sealing between the second connector (62) and the second body (61).

7. The chip testing device according to claim 1, characterized in that: The second connecting head (62) is sleeved with a second bearing (622), and the second bearing (622) is connected to the second machine body (61) to realize the rotation of the second connecting head (62) and the second machine body (61).

8. The chip testing device according to claim 1, characterized in that: The support frame (1) is connected to a safety cover (21), the safety cover (21) is arranged on a side of the hollow motor (2) away from the chip test disk (31), and the first body (41) is connected to the safety cover (21).

9. A chip testing device according to claim 8, characterized in that: The feed adapter (4) is externally covered with a first box body (5), the first box body (5) is connected to both the safety cover (21) and the first machine body (41), and the inner wall of the first box body (5) is connected to an anti-frost insulation layer.

10. The chip testing device according to claim 1, characterized in that: The discharge adapter (6) is externally coated with a second box body (7), the second box body (7) is connected to both the support frame (1) and the second machine body (61), and the inner wall of the second box body (7) is connected to an anti-frost insulation layer.

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