In-vitro diagnosis system fault processing circuit, in-vitro diagnosis system and in-vitro diagnosis method

Abstract

The invention discloses an in-vitro diagnosis system fault processing circuit, an in-vitro diagnosis system and an in-vitro diagnosis method, the circuit is applied to at least one in-vitro diagnosis device in the in-vitro diagnosis system, and the circuit comprises an in-vitro diagnosis device MCU; the equivalent resistance module is respectively connected with the in-vitro diagnosis equipment MCU and an internal circuit of the in-vitro diagnosis equipment, and is used for receiving a potential signal sent by the in-vitro diagnosis equipment MCU and outputting a voltage division potential after voltage division with the internal circuit based on the potential signal; when the in-vitro diagnosis equipment works normally, the partial potential is in a preset normal potential interval; when the in-vitro diagnosis equipment works abnormally, the partial potential is not in the normal potential interval. The overall fault processing efficiency of the in-vitro diagnosis system can be improved.

Description

Technical Field

[0001] The present invention relates to the technical field of medical equipment detection, and in particular to an in vitro diagnostic system fault processing circuit, an in vitro diagnostic system and a method. Background Art

[0002] In current in vitro diagnostic systems, communication bus technology is mostly used between the hardware modules of various in vitro diagnostic devices for serial data transmission and command control. For example, the common RS485 and CAN buses can only send commands and read data to the bus node modules that are working normally. When the node module fails and does not respond, the entire in vitro diagnostic system can only be repaired through alarm prompts and system power-off. It is impossible to identify whether a certain node does not respond to bus commands or the in vitro diagnostic system as a whole fails. And when a node does not respond to bus commands, it is impossible to determine whether the node module connection is loose or the system is frozen. It is time-consuming to shut down and disassemble the machine for inspection, which affects the startup time.

[0003] Therefore, there is a need for an in vitro diagnostic system fault processing circuit that can automatically detect faulty node modules in the in vitro diagnostic system and reset them without shutting down the system, thereby improving the overall fault processing efficiency of the in vitro diagnostic system. Summary of the invention

[0004] In order to solve the technical problem of low efficiency in fault processing of in vitro diagnostic systems, the present invention provides an in vitro diagnostic system fault processing circuit, in vitro diagnostic equipment and system. The specific technical solutions are as follows:

[0005] The present invention provides an in vitro diagnostic system fault processing circuit, which is applied to at least one in vitro diagnostic device in the in vitro diagnostic system, comprising:

[0006] In vitro diagnostic equipment MCU;

[0007] The equivalent resistance module is connected to the MCU of the in vitro diagnostic device and the internal circuit of the in vitro diagnostic device, respectively, and is used to receive the potential signal sent by the MCU of the in vitro diagnostic device, and output the divided potential after the potential signal and the internal circuit are divided;

[0008] When the in vitro diagnostic device is operating normally, the divided voltage potential is within the preset normal potential range;

[0009] When the in vitro diagnostic device operates abnormally, the divided voltage potential is not in the normal potential range.

[0010] The in vitro diagnostic system fault processing circuit provided by the present invention converts the fault state of the internal circuit of the in vitro diagnostic device into the potential information of the equivalent resistance module according to the voltage division between the equivalent resistance module and the internal circuit of the in vitro diagnostic device, so as to facilitate the feedback of the current fault condition of the in vitro diagnostic device.

[0011] In some embodiments, the present invention provides an in vitro diagnostic system fault processing circuit, further comprising:

[0012] A dip switch is provided on each in vitro diagnostic device. The dip switch is connected to the equivalent resistance module and is used to set the resistance value of the current equivalent resistance module according to the dip address input to the dip switch, so that the resistance value of the equivalent resistance module in each in vitro diagnostic device is different.

[0013] The in vitro diagnostic system fault processing circuit provided by the present invention is configured with a dip switch on each in vitro diagnostic device in the in vitro diagnostic system, and the resistance value of each equivalent resistance module is set according to the dip switch. This facilitates sampling of the total potential information of each in vitro diagnostic device according to the different resistance values ​​of the equivalent resistance modules of each in vitro diagnostic system. It is then determined based on the total potential information which specific in vitro diagnostic systems' equivalent resistance modules have output potential information that has changed, thereby confirming the fault condition of the internal circuit of each in vitro diagnostic device.

[0014] In some embodiments, the present invention provides an in vitro diagnostic system fault processing circuit, further comprising:

[0015] A first PWM voltage modulation module is connected to the MCU of the in vitro diagnostic device and is used to modulate the potential signal sent by the node device MCU;

[0016] The voltage filtering module is connected to the first PWM voltage modulation module and the equivalent resistance module respectively, and is used for filtering the modulated potential signal after receiving the potential signal modulated by the first PWM voltage modulation module, and outputting the filtered potential signal to the equivalent resistance module.

[0017] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic system fault processing circuit, which is applied to at least one in vitro diagnostic device in an in vitro diagnostic system, comprising:

[0018] In vitro diagnostic equipment MCU;

[0019] A voltage window detection module is used to receive a detection voltage transmitted by an external device and output a corresponding voltage reset signal according to the detection voltage and a preset voltage window;

[0020] The delay module is connected to the output end of the voltage window detection module and the reset pin of the MCU of the in vitro diagnostic device, respectively, and is used for receiving the voltage reset signal and delaying the output of the voltage reset signal to the reset pin;

[0021] The counting module is connected to the delay module and the power supply of the in vitro diagnostic device respectively, and is used to control the power supply of the in vitro diagnostic device to restart when the voltage reset signal output by the delay unit reaches a preset number of times.

[0022] The in vitro diagnostic system fault processing circuit provided by the present invention enables the in vitro diagnostic device to generate a corresponding voltage reset signal according to whether the detection voltage is within the voltage window, controls the current in vitro diagnostic device to receive the corresponding detection voltage when a fault occurs, and automatically performs a voltage reset operation.

[0023] In some implementations, the voltage window detection module specifically includes:

[0024] A first comparator, wherein a non-inverting input terminal of the first comparator receives a detection voltage, and an inverting input terminal of the first comparator is connected to a voltage window;

[0025] A second comparator, wherein an inverting input terminal of the second comparator receives a detection voltage, and a non-inverting input terminal of the second comparator is connected to a voltage window;

[0026] An AND gate, wherein an input terminal of the AND gate is connected to an output terminal of the first comparator and an output terminal of the second comparator, and the AND gate outputs a voltage reset signal when the detection voltage is within the voltage window.

[0027] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic system fault processing circuit, which is applied to at least one in vitro diagnostic device in an in vitro diagnostic system, including the above-mentioned in vitro diagnostic system fault processing circuit.

[0028] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic system fault processing circuit, which is applied to at least one control device in the in vitro diagnostic system, and the control device is communicatively connected with at least one in vitro diagnostic device in the in vitro diagnostic system, comprising:

[0029] A resistor voltage divider module, used for receiving the voltage divider potential sent by the in vitro diagnostic device and converting the voltage divider potential into a detection voltage;

[0030] The analog-to-digital conversion module is connected to the resistor voltage divider module and is used to receive the detection voltage and convert the detection voltage into a detection signal;

[0031] The control device MCU is connected to the analog-to-digital conversion module, and is used to receive the detection signal, and output the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system according to the detection signal and a preset detection voltage truth table.

[0032] The in vitro diagnostic system fault processing circuit provided by the present invention converts the resistance signal into a detection voltage signal by setting a resistance voltage divider module in the control device, so that the control device MCU can determine the fault status of each in vitro diagnostic device according to the detection voltage and the detection voltage truth table signal.

[0033] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic system fault processing circuit, which is applied to at least one control device in the in vitro diagnostic system, and the control device is communicatively connected with at least one in vitro diagnostic device in the in vitro diagnostic system, comprising:

[0034] The control device MCU is used to output the fault status of each in vitro diagnostic device in the in vitro diagnostic system;

[0035] A fault reset unit, connected to the control device MCU, is used to output a corresponding reset voltage according to the fault state of each in vitro diagnostic device;

[0036] The second PWM voltage modulation unit is connected to the fault reset unit and is used for performing PWM modulation on the reset voltage and then outputting it.

[0037] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic system fault processing circuit, applied to at least one control device in an in vitro diagnostic system, including an in vitro diagnostic system fault processing circuit according to claim 7 and claim 8.

[0038] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic device in an in vitro diagnostic system, characterized in that it includes the above-mentioned in vitro diagnostic system fault processing circuit.

[0039] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic system, including a control device and at least one in vitro diagnostic device, wherein the control device is communicatively connected to the at least one in vitro diagnostic device,

[0040] In vitro diagnostic equipment includes in vitro diagnostic equipment MCU;

[0041] The equivalent resistance module is connected to the MCU of the in vitro diagnostic device and the internal circuit of the in vitro diagnostic device, respectively, and is used to receive the potential signal sent by the MCU of the in vitro diagnostic device, and output the divided potential to the control device based on the potential signal and the internal circuit voltage division;

[0042] A voltage window detection module, used to receive a detection voltage transmitted by a control device, and output a corresponding voltage reset signal according to the detection voltage and a preset voltage window;

[0043] The delay module is connected to the output end of the voltage window detection module and the reset pin of the MCU of the in vitro diagnostic device, respectively, and is used for receiving the voltage reset signal and delaying the output of the voltage reset signal to the reset pin;

[0044] A counting module, connected to the delay module and the power supply of the in vitro diagnostic device respectively, and used to control the power supply of the in vitro diagnostic device to restart when the voltage reset signal output by the delay unit reaches a preset number of times;

[0045] The control device includes a resistor voltage-dividing module for receiving the voltage-dividing potential sent by the in vitro diagnostic device and converting the voltage-dividing potential into a detection voltage;

[0046] The analog-to-digital conversion module is connected to the resistor voltage divider module and is used to receive the detection voltage and convert the detection voltage into a detection signal;

[0047] The control device MCU is connected to the analog-to-digital conversion module, and is used to receive the detection signal, and output the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system according to the detection signal and a preset detection voltage truth table.

[0048] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic system control method, which is applied to the above-mentioned in vitro diagnostic system, comprising the steps of:

[0049] The control device sends task execution instructions to each in vitro diagnostic device;

[0050] When it is detected that any in vitro diagnostic device does not respond to the task execution instruction, the control device sends a fault detection signal to each in vitro diagnostic device;

[0051] After receiving the fault detection signal, the MCU of the in vitro diagnostic equipment outputs the divided voltage potential to the control device;

[0052] The control device outputs the detection voltage corresponding to the fault state of each in vitro diagnostic device to each in vitro diagnostic device according to the detection voltage truth table and the voltage division potential;

[0053] After receiving the detection voltage, the in vitro diagnostic device generates a corresponding voltage reset signal according to the detection voltage;

[0054] After the in vitro diagnostic device executes the voltage reset task for a preset number of times, the power supply of the current in vitro diagnostic device is controlled to restart.

[0055] The in vitro diagnostic system control method provided by the present invention uses an equivalent resistance module set in the in vitro diagnostic device and a resistance voltage divider module set in the control device to realize that when the in vitro diagnostic device fails to respond to the task execution instruction, the fault condition of each in vitro diagnostic device is fed back to the control device through a resistance signal composed of the potential information at both ends of the equivalent resistor, and the specific in vitro diagnostic devices that have failed are identified in the control device according to the detection voltage truth table, thereby realizing accurate feedback, identification, resetting and other operations of the faulty devices in the in vitro diagnostic system, automatically performing fault processing in the in vitro diagnostic system, and improving the overall fault processing efficiency of the in vitro diagnostic system.

[0056] The in vitro diagnostic system fault processing circuit, in vitro diagnostic equipment and system provided by the present invention have at least one of the following technical effects:

[0057] (1) According to the voltage division between the equivalent resistance module and the internal circuit of the in vitro diagnostic device, the fault state of the internal circuit of the in vitro diagnostic device is converted into the potential information of the equivalent resistance module, so as to facilitate the feedback of the current fault condition of the in vitro diagnostic device;

[0058] (2) By setting a dip switch on each in vitro diagnostic device in the in vitro diagnostic system and setting the resistance value of each equivalent resistance module according to the dip switch, it is convenient to sample the total potential information of each in vitro diagnostic device according to the different resistance values ​​of the equivalent resistance module of each in vitro diagnostic system, and then determine which in vitro diagnostic system's equivalent resistance module output potential information has changed according to the total potential information, thereby confirming the fault condition of the internal circuit of each in vitro diagnostic device;

[0059] (3) Realize that the in vitro diagnostic device generates a corresponding voltage reset signal according to whether the detection voltage is within the voltage window, and controls the current in vitro diagnostic device to receive the corresponding detection voltage when a fault occurs, and automatically performs a voltage reset operation;

[0060] (4) By setting a resistor voltage divider module in the control device, the resistance signal is converted into a detection voltage signal, so that the control device MCU can determine the fault status of each in vitro diagnostic device according to the detection voltage and the detection voltage truth table signal;

[0061] (5) By setting up an equivalent resistance module in the in vitro diagnostic device and a resistance voltage divider module in the control device, when the in vitro diagnostic device fails to respond to a task execution instruction, the fault condition of each in vitro diagnostic device is fed back to the control device through a resistance signal composed of the potential information at both ends of the equivalent resistor, and the control device identifies which specific in vitro diagnostic devices have failed based on the detection voltage truth table, thereby achieving accurate feedback, identification, and reset of the faulty devices in the in vitro diagnostic system, automatically performing fault handling in the in vitro diagnostic system, and improving the overall fault handling efficiency of the in vitro diagnostic system. BRIEF DESCRIPTION OF THE DRAWINGS

[0062] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0063] Figure 1 This is an example diagram of a fault processing circuit of an in vitro diagnostic system used in an in vitro diagnostic device according to the present invention;

[0064] Figure 2 This is an example diagram of an in vitro diagnostic system fault processing circuit including a dip switch applied to an in vitro diagnostic device of the present invention;

[0065] Figure 3 This is an example diagram of an in vitro diagnostic system fault processing circuit including a first PWM voltage modulation module and a voltage filtering module applied to an in vitro diagnostic device according to the present invention;

[0066] Figure 4 An exemplary diagram of a fault processing circuit of an in vitro diagnostic system used in an in vitro diagnostic device according to the present invention;

[0067] Figure 5 This is an example diagram of a voltage window detection module in a fault processing circuit of an in vitro diagnostic system applied to an in vitro diagnostic device of the present invention;

[0068] Figure 6 Another exemplary diagram of a fault processing circuit of an in vitro diagnostic system applied to an in vitro diagnostic device of the present invention;

[0069] Figure 7 This is an example diagram of a fault processing circuit of an in vitro diagnostic system applied to a control device of the present invention;

[0070] Figure 8 An exemplary diagram of a fault processing circuit of an in vitro diagnostic system applied to a control device of the present invention;

[0071] Fig. 9 Another example diagram of a fault processing circuit of an in vitro diagnostic system applied to a control device of the present invention;

[0072] Fig.10 This is an example diagram of a bus in an in vitro diagnostic system of the present invention;

[0073] Fig.11 The present invention is a flow chart of a method for controlling an in vitro diagnostic system.

[0074] Numbers in the figure: in vitro diagnostic equipment MCU-100, equivalent resistance module-200, dip switch-300, first PWM voltage modulation module-400, voltage filter module-500, voltage window detection module-600, first comparator-610, second comparator-620, AND gate-630, delay module-700, counting module-800, power supply of in vitro diagnostic equipment-900, resistance voltage divider module-10, analog-to-digital conversion module-20, control device MCU-30, fault reset unit-40 and second PWM voltage modulation unit-50. DETAILED DESCRIPTION

[0075] In the following description, specific details such as specific system structures, technologies, etc. are provided for the purpose of illustration rather than limitation, so as to provide a thorough understanding of the embodiments of the present application. However, it should be clear to those skilled in the art that the present application may also be implemented in other embodiments without these specific details. In other cases, detailed descriptions of well-known systems, devices, circuits, and methods are omitted to prevent unnecessary details from obstructing the description of the present application.

[0076] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or collections.

[0077] In order to simplify the drawings, only the parts related to the present invention are schematically shown in each figure, and they do not represent the actual structure of the product. In addition, in order to simplify the drawings and facilitate understanding, in some figures, only one of the parts with the same structure or function is schematically drawn or marked. In this article, "one" not only means "only one", but also means "more than one".

[0078] It should be further understood that the term “and / or” used in the specification and appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0079] In addition, in the description of the present application, the terms "first", "second", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.

[0080] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the specific implementation methods of the present invention will be described below with reference to the accompanying drawings. Obviously, the accompanying drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings and other implementation methods can be obtained based on these drawings without creative work.

[0081] One embodiment of the present invention, as Figure 1 As shown, the present invention provides an in vitro diagnostic system fault processing circuit, which is applied to at least one in vitro diagnostic device in the in vitro diagnostic system, and includes an in vitro diagnostic device MCU100 and an equivalent resistance module 200.

[0082] Among them, the equivalent resistance module 200 is respectively connected to the in vitro diagnostic device MCU100 and the internal circuit of the in vitro diagnostic device, and is used to receive the potential signal sent by the in vitro diagnostic device MCU100, and output the divided potential after dividing the potential signal and the internal circuit; when the in vitro diagnostic device works normally, the divided potential is in a preset normal potential range; when the in vitro diagnostic device works abnormally, the divided potential is not in the normal potential range.

[0083] Specifically, the equivalent resistance module 200 and the internal circuit of the in vitro diagnostic device are connected in series in the total circuit of the in vitro diagnostic device MCU100. Since the resistance value of the equivalent resistance module 200 of the in vitro diagnostic device is constant, the equivalent resistance module 200 and the internal circuit of the in vitro diagnostic device are voltage-divided, and then under normal working conditions, the potential information at both ends of the equivalent resistance module 200 is constant and is in a preset normal potential range; when a fault occurs in the internal circuit of the in vitro diagnostic device and causes the equivalent resistance of the internal circuit to change, the voltage-divided potential after the voltage-divided potential of the equivalent resistance module 200 and the internal circuit of the in vitro diagnostic device changes, and the voltage-divided potential is not in the normal potential range, thereby realizing feedback of the corresponding internal circuit fault condition of the in vitro diagnostic device according to the different voltage-divided potentials of the equivalent resistance module 200.

[0084] The in vitro diagnostic system fault processing circuit provided in this embodiment converts the fault state of the internal circuit of the in vitro diagnostic device into the potential information of the equivalent resistance module according to the voltage division between the equivalent resistance module and the internal circuit of the in vitro diagnostic device, so as to facilitate the feedback of the current fault condition of the in vitro diagnostic device.

[0085] In one embodiment, Figure 2As shown, an in vitro diagnostic system fault processing circuit provided by the present invention also includes a dip switch 300. The dip switch 300 is set on each in vitro diagnostic device. The dip switch 300 is connected to the equivalent resistance module 200 and is used to set the resistance value of the current equivalent resistance module 200 according to the dip address input to the dip switch 300, so that the resistance value of the equivalent resistance module 200 in each in vitro diagnostic device is different.

[0086] Specifically, after the resistance value of the equivalent resistance module 200 in each in vitro diagnostic device is set to be different according to the dip switch 300, the voltage-dividing potential at both ends of the equivalent resistance module 200 in each in vitro diagnostic device is input into the control device in the in vitro diagnostic system through the bus. Under normal working conditions, the voltage-dividing potential at both ends of the equivalent resistance module 200 in each in vitro diagnostic device is constant, and the total potential in the bus is the normal working potential. When a certain in vitro diagnostic device in the in vitro diagnostic system fails, resulting in a change in the equivalent resistance of the internal circuit (i.e., from a normal working equivalent resistance value to an abnormal working equivalent resistance value), the voltage-dividing potential of the equivalent resistance module 200 input into the bus in the in vitro diagnostic device changes (i.e., from a normal working voltage-dividing potential value to an abnormal working voltage-dividing potential value). Since the original equivalent resistance of the equivalent resistance module 200 in each in vitro diagnostic device is different and constant, when the voltage-dividing potential of the equivalent resistance module 200 in a certain in vitro diagnostic device changes, it can be confirmed according to the total potential in the bus which in vitro diagnostic device or devices the voltage-dividing potential of the equivalent resistance module 200 changes, and then the device information such as the device number of the in vitro diagnostic device with the failure is determined.

[0087] The in vitro diagnostic system fault processing circuit provided in this embodiment is configured with a dip switch on each in vitro diagnostic device in the in vitro diagnostic system, and the resistance value of each equivalent resistance module is set according to the dip switch. This facilitates sampling of the total potential information of each in vitro diagnostic device according to the different resistance values ​​of the equivalent resistance module of each in vitro diagnostic system. It is then determined based on the total potential information which specific in vitro diagnostic systems' equivalent resistance module output potential information has changed, thereby confirming the fault condition of the internal circuit of each in vitro diagnostic device.

[0088] In some embodiments, Figure 3 As shown, an in vitro diagnostic system fault processing circuit provided by the present invention further includes a first PWM voltage modulation module 400 and a voltage filtering module 500 .

[0089] Among them, the first PWM voltage modulation module 400 is connected to the in vitro diagnostic equipment MCU100, and is used to modulate the potential signal sent by the node device MCU. The voltage filtering module 500 is respectively connected to the first PWM voltage modulation module 400 and the equivalent resistance module 200, and is used to receive the potential signal modulated by the first PWM voltage modulation module 400, filter the modulated potential signal, and output the filtered potential signal to the equivalent resistance module 500.

[0090] In some embodiments, Figure 4 As shown, according to another aspect of the present invention, the present invention also provides an in vitro diagnostic system fault processing circuit, which is applied to at least one in vitro diagnostic device in the in vitro diagnostic system, including an in vitro diagnostic device MCU100, a voltage window detection module 600, a delay module 700, a counting module 800 and a power supply 900 of the in vitro diagnostic device.

[0091] Among them, the voltage window detection module 600 is used to receive the detection voltage transmitted by the external device, and output the corresponding voltage reset signal according to the detection voltage and the preset voltage window. The delay module 700 is respectively connected to the output end of the voltage window detection module 600 and the reset pin of the in vitro diagnostic equipment MCU100, and is used to receive the voltage reset signal and delay the output of the voltage reset signal to the reset pin; the counting module 800 is respectively connected to the delay module 700 and the power supply 900 of the in vitro diagnostic equipment, and is used to control the power supply 900 of the in vitro diagnostic equipment to restart when the delay unit 700 outputs the voltage reset signal for a preset number of times.

[0092] Specifically, Figure 5 As shown, the voltage window detection module 600 specifically includes a first comparator 610, a second comparator 620 and an AND gate 630. The non-inverting input terminal of the first comparator 610 receives the detection voltage, and the inverting input terminal of the first comparator 610 is connected to the window voltage; the inverting input terminal of the second comparator 620 receives the detection voltage, and the non-inverting input terminal of the second comparator 620 is connected to the window voltage; the input terminal of the AND gate 630 is connected to the output terminal of the first comparator 610 and the output terminal of the second comparator 620, and the AND gate 630 outputs a voltage reset signal when the detection voltage is in the voltage window, and does not output a voltage reset signal when the detection voltage is not in the voltage window.

[0093] Exemplarily, the inverting input terminal of the first comparator 610 and the non-inverting input terminal of the second comparator 620 are connected to the voltage filtering circuit and the PWM modulation circuit in sequence, and the window voltage output by the PWM modulation circuit is input to the inverting input terminal of the first comparator 610 and the non-inverting input terminal of the second comparator 620 after passing through the voltage filtering circuit.

[0094] The in vitro diagnostic system fault processing circuit provided in this embodiment enables the in vitro diagnostic device to generate a corresponding voltage reset signal according to whether the detection voltage is within the voltage window, and controls the current in vitro diagnostic device to receive the corresponding detection voltage when a fault occurs, and automatically performs a voltage reset operation.

[0095] In one embodiment, the in vitro diagnostic device MCU100 is connected to a network chip, and transmits the received reset signal to a corresponding processing device or server through the network chip as data backup or alarm prompt information.

[0096] In some embodiments, Figure 6 As shown, according to another aspect of the present invention, the present invention also provides an in vitro diagnostic system fault processing circuit, which is applied to at least one in vitro diagnostic device in an in vitro diagnostic system, including the above-mentioned in vitro diagnostic system fault processing circuit, that is, including an in vitro diagnostic device MCU100, an equivalent resistance module 200, a dip switch 300, a voltage window detection module 600, a delay module 700, a counting module 800 and a power supply 900 of the in vitro diagnostic device.

[0097] Among them, the equivalent resistance module 200 is respectively connected to the in vitro diagnostic device MCU100 and the internal circuit of the in vitro diagnostic device, and is used to receive the potential signal sent by the in vitro diagnostic device MCU100, and output the divided potential after dividing the potential signal and the internal circuit; when the in vitro diagnostic device works normally, the divided potential is in a preset normal potential range; when the in vitro diagnostic device works abnormally, the divided potential is not in the normal potential range.

[0098] Specifically, the equivalent resistance module 200 and the internal circuit of the in vitro diagnostic device are connected in series in the total circuit of the in vitro diagnostic device MCU100. Since the resistance value of the equivalent resistance module 200 of the in vitro diagnostic device is constant, the equivalent resistance module 200 and the internal circuit of the in vitro diagnostic device are voltage-divided, and then under normal working conditions, the potential information at both ends of the equivalent resistance module 200 is constant and is in a preset normal potential range; when a fault occurs in the internal circuit of the in vitro diagnostic device and causes the equivalent resistance of the internal circuit to change, the voltage-divided potential after the voltage-divided potential of the equivalent resistance module 200 and the internal circuit of the in vitro diagnostic device changes, and the voltage-divided potential is not in the normal potential range, thereby realizing feedback of the corresponding internal circuit fault condition of the in vitro diagnostic device according to the different voltage-divided potentials of the equivalent resistance module 200.

[0099] A dip switch 300 is provided on each in vitro diagnostic device, and the dip switch 300 is connected to the equivalent resistance module 200 and is used to set the resistance value of the current equivalent resistance module 200 according to the dip address input to the dip switch 300, so that the resistance value of the equivalent resistance module 200 in each in vitro diagnostic device is different.

[0100] Specifically, after the resistance value of the equivalent resistance module 200 in each in vitro diagnostic device is set to be different according to the dip switch 300, the voltage-dividing potential at both ends of the equivalent resistance module 200 in each in vitro diagnostic device is input into the control device in the in vitro diagnostic system through the bus. Under normal working conditions, the voltage-dividing potential at both ends of the equivalent resistance module 200 in each in vitro diagnostic device is constant, and the total potential in the bus is the normal working potential. When a certain in vitro diagnostic device in the in vitro diagnostic system fails, resulting in a change in the equivalent resistance of the internal circuit (i.e., from a normal working equivalent resistance value to an abnormal working equivalent resistance value), the voltage-dividing potential of the equivalent resistance module 200 input into the bus in the in vitro diagnostic device changes (i.e., from a normal working voltage-dividing potential value to an abnormal working voltage-dividing potential value). Since the original equivalent resistance of the equivalent resistance module 200 in each in vitro diagnostic device is different and constant, when the voltage-dividing potential of the equivalent resistance module 200 in a certain in vitro diagnostic device changes, it can be confirmed according to the total potential in the bus which in vitro diagnostic device or devices the voltage-dividing potential of the equivalent resistance module 200 changes, and then the device information such as the device number of the in vitro diagnostic device with the failure is determined.

[0101] Among them, the voltage window detection module 600 is used to receive the detection voltage transmitted by the external device, and output the corresponding voltage reset signal according to the detection voltage and the preset voltage window. The delay module 700 is respectively connected to the output end of the voltage window detection module 600 and the reset pin of the in vitro diagnostic equipment MCU100, and is used to receive the voltage reset signal and delay the output of the voltage reset signal to the reset pin; the counting module 800 is respectively connected to the delay module 700 and the power supply 900 of the in vitro diagnostic equipment, and is used to control the power supply 900 of the in vitro diagnostic equipment to restart when the delay unit 700 outputs the voltage reset signal for a preset number of times.

[0102] Specifically, Figure 5 As shown, the voltage window detection module 600 specifically includes a first comparator 610, a second comparator 620 and an AND gate 630. The non-inverting input terminal of the first comparator 610 receives the detection voltage, and the inverting input terminal of the first comparator 610 is connected to the window voltage; the inverting input terminal of the second comparator 620 receives the detection voltage, and the non-inverting input terminal of the second comparator 620 is connected to the window voltage; the input terminal of the AND gate 630 is connected to the output terminal of the first comparator 610 and the output terminal of the second comparator 620, and the AND gate 630 outputs a voltage reset signal when the detection voltage is in the voltage window, and does not output a voltage reset signal when the detection voltage is not in the voltage window.

[0103] Exemplarily, the inverting input terminal of the first comparator 610 and the non-inverting input terminal of the second comparator 620 are connected to the voltage filtering circuit and the PWM modulation circuit in sequence, and the window voltage output by the PWM modulation circuit is input to the inverting input terminal of the first comparator 610 and the non-inverting input terminal of the second comparator 620 after passing through the voltage filtering circuit.

[0104] In some embodiments, Figure 7 As shown, according to another aspect of the present invention, the present invention also provides an in vitro diagnostic system fault processing circuit, which is applied to at least one control device in the in vitro diagnostic system, and the control device is communicatively connected to at least one in vitro diagnostic device in the in vitro diagnostic system, including a resistor voltage divider module 10, an analog-to-digital conversion module 20 and a control device MCU30.

[0105] Among them, the resistor voltage divider module 10 is used to receive the voltage divider potential sent by the in vitro diagnostic device and convert the voltage divider potential into a detection voltage; the analog-to-digital conversion module 20 is connected to the resistor voltage divider module 20, used to receive the detection voltage, and convert the detection voltage into a detection signal; the control device MCU30 is connected to the analog-to-digital conversion module 20, used to receive the detection signal, and according to the detection signal and a preset detection voltage truth table, outputs the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system.

[0106] Specifically, the resistor voltage divider module 10 is connected to a constant current source, and the external input voltage division potential is converted into a detection voltage through the series resistor voltage divider principle. After analog-to-digital conversion, a detection digital signal is generated, and the detection digital signal is compared with a preset detection voltage truth table. Since the potential information sent by the equivalent resistor module when each in vitro diagnostic device fails is different, the digital signals corresponding to various fault conditions in the in vitro diagnostic system are different. The detection voltage truth table stores the detection digital signals corresponding to the failure of each in vitro diagnostic device in the in vitro diagnostic system and the failure of some in vitro diagnostic devices at the same time. According to the digital signal and the detection voltage truth table, the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system is output.

[0107] For example, an amplifier may be provided between the resistor voltage divider module 10 and the analog-to-digital conversion module 20 to amplify the detection digital signal and then input it into the control device MCU 30 .

[0108] The in vitro diagnostic system fault processing circuit provided in this embodiment converts the resistance signal into a detection voltage signal by setting a resistance voltage divider module in the control device, so that the control device MCU can determine the fault status of each in vitro diagnostic device according to the detection voltage and the detection voltage truth table signal.

[0109] In some embodiments, Figure 8As shown, according to another aspect of the present invention, the present invention also provides an in vitro diagnostic system fault processing circuit, which is applied to at least one control device in the in vitro diagnostic system, and the control device is communicatively connected to at least one in vitro diagnostic device in the in vitro diagnostic system, including: a control device MCU30, a fault reset unit 40 and a second PWM voltage modulation unit 50.

[0110] The control device MCU30 is used to output the fault status of each in vitro diagnostic device in the in vitro diagnostic system; the fault reset unit 40 is connected to the control device MCU30 and is used to output the corresponding reset voltage according to the fault status of each in vitro diagnostic device; the second PWM voltage modulation unit 50 is connected to the fault reset unit 40 and is used to perform PWM modulation on the reset voltage and then output it.

[0111] Specifically, when the control device MCU30 identifies the device information such as the device number of different faulty in vitro diagnostic devices based on the detection voltage, it will send a reset voltage with different potentials. Since the voltage window value in the voltage window detection module of each in vitro diagnostic device is different, the reset voltage does not output a voltage reset signal after passing through the voltage window detection module in the normally working in vitro diagnostic device, or the output voltage reset signal contains control information for not resetting. After the reset voltage passes through the voltage window detection module in the abnormally working in vitro diagnostic device, a voltage reset signal is output, or the output voltage reset signal contains control information for resetting, thereby controlling the in vitro diagnostic device to reset.

[0112] In some embodiments, Fig. 9 As shown, according to another aspect of the present invention, the present invention also provides an in vitro diagnostic system fault processing circuit, which is applied to at least one control device in the in vitro diagnostic system, including a resistor voltage divider module 10, an analog-to-digital conversion module 20, a control device MCU30, a fault reset unit 40 and a second PWM voltage modulation unit 50.

[0113] The resistor voltage divider module 10 is used to receive the voltage divider potential sent by the in vitro diagnostic device and convert the voltage divider potential into a detection voltage; the analog-to-digital conversion module 20 is connected to the resistor voltage divider module 20, for receiving the detection voltage and converting the detection voltage into a detection signal; the control device MCU30 is connected to the analog-to-digital conversion module 20, for receiving the detection signal, and outputting the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system according to the detection signal and a preset detection voltage truth table.

[0114] Specifically, the resistor voltage divider module 10 is connected to a constant current source, and the external input voltage division potential is converted into a detection voltage through the series resistor voltage divider principle. After analog-to-digital conversion, a detection digital signal is generated, and the detection digital signal is compared with a preset detection voltage truth table. Since the potential information sent by the equivalent resistor module when each in vitro diagnostic device fails is different, the digital signals corresponding to various fault conditions in the in vitro diagnostic system are different. The detection voltage truth table stores the detection digital signals corresponding to the failure of each in vitro diagnostic device in the in vitro diagnostic system and the failure of some in vitro diagnostic devices at the same time. According to the digital signal and the detection voltage truth table, the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system is output.

[0115] The control device MCU30 is used to output the fault status of each in vitro diagnostic device in the in vitro diagnostic system; the fault reset unit 40 is connected to the control device MCU30 and is used to output the corresponding reset voltage according to the fault status of each in vitro diagnostic device; the second PWM voltage modulation unit 50 is connected to the fault reset unit 40 and is used to PWM modulate the reset voltage and then output

[0116] Specifically, when the control device MCU30 identifies the device information such as the device number of different faulty in vitro diagnostic devices based on the detection voltage, it will send a reset voltage with different potentials. Since the voltage window value in the voltage window detection module of each in vitro diagnostic device is different, the reset voltage does not output a voltage reset signal after passing through the voltage window detection module in the normally working in vitro diagnostic device, or the output voltage reset signal contains control information for not resetting. After the reset voltage passes through the voltage window detection module in the abnormally working in vitro diagnostic device, a voltage reset signal is output, or the output voltage reset signal contains control information for resetting, thereby controlling the in vitro diagnostic device to reset.

[0117] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic device in an in vitro diagnostic system, comprising the above-mentioned in vitro diagnostic system fault processing circuit.

[0118] In some embodiments, according to another aspect of the present invention, the present invention further provides an in vitro diagnostic system, including a control device and at least one in vitro diagnostic device, the control device is communicatively connected to at least one in vitro diagnostic device, and the in vitro diagnostic device includes an in vitro diagnostic device MCU100, an equivalent resistance module 200, a dip switch 300, a voltage window detection module 600, a delay module 700, a counting module 800 and a power supply 900 of the in vitro diagnostic device.

[0119] Among them, the equivalent resistance module 200 is respectively connected to the in vitro diagnostic device MCU100 and the internal circuit of the in vitro diagnostic device, and is used to receive the potential signal sent by the in vitro diagnostic device MCU100, and output the divided potential after dividing the potential signal and the internal circuit; when the in vitro diagnostic device works normally, the divided potential is in a preset normal potential range; when the in vitro diagnostic device works abnormally, the divided potential is not in the normal potential range.

[0120] Specifically, the equivalent resistance module 200 and the internal circuit of the in vitro diagnostic device are connected in series in the total circuit of the in vitro diagnostic device MCU100. Since the resistance value of the equivalent resistance module 200 of the in vitro diagnostic device is constant, the equivalent resistance module 200 and the internal circuit of the in vitro diagnostic device are voltage-divided, and then under normal working conditions, the potential information at both ends of the equivalent resistance module 200 is constant and is in a preset normal potential range; when a fault occurs in the internal circuit of the in vitro diagnostic device and causes the equivalent resistance of the internal circuit to change, the voltage-divided potential after the voltage-divided potential of the equivalent resistance module 200 and the internal circuit of the in vitro diagnostic device changes, and the voltage-divided potential is not in the normal potential range, thereby realizing feedback of the corresponding internal circuit fault condition of the in vitro diagnostic device according to the different voltage-divided potentials of the equivalent resistance module 200.

[0121] A dip switch 300 is provided on each in vitro diagnostic device, and the dip switch 300 is connected to the equivalent resistance module 200 and is used to set the resistance value of the current equivalent resistance module 200 according to the dip address input to the dip switch 300, so that the resistance value of the equivalent resistance module 200 in each in vitro diagnostic device is different.

[0122] Specifically, after the resistance value of the equivalent resistance module 200 in each in vitro diagnostic device is set to be different according to the dip switch 300, the voltage-dividing potential at both ends of the equivalent resistance module 200 in each in vitro diagnostic device is input into the control device in the in vitro diagnostic system through the bus. Under normal working conditions, the voltage-dividing potential at both ends of the equivalent resistance module 200 in each in vitro diagnostic device is constant, and the total potential in the bus is the normal working potential. When a certain in vitro diagnostic device in the in vitro diagnostic system fails, resulting in a change in the equivalent resistance of the internal circuit (i.e., from a normal working equivalent resistance value to an abnormal working equivalent resistance value), the voltage-dividing potential of the equivalent resistance module 200 input into the bus in the in vitro diagnostic device changes (i.e., from a normal working voltage-dividing potential value to an abnormal working voltage-dividing potential value). Since the original equivalent resistance of the equivalent resistance module 200 in each in vitro diagnostic device is different and constant, when the voltage-dividing potential of the equivalent resistance module 200 in a certain in vitro diagnostic device changes, it can be confirmed according to the total potential in the bus which in vitro diagnostic device or devices the voltage-dividing potential of the equivalent resistance module 200 changes, and then the device information such as the device number of the in vitro diagnostic device with the failure is determined.

[0123] Among them, the voltage window detection module 600 is used to receive the detection voltage transmitted by the external device, and output the corresponding voltage reset signal according to the detection voltage and the preset voltage window. The delay module 700 is respectively connected to the output end of the voltage window detection module 600 and the reset pin of the in vitro diagnostic equipment MCU100, and is used to receive the voltage reset signal and delay the output of the voltage reset signal to the reset pin; the counting module 800 is respectively connected to the delay module 700 and the power supply 900 of the in vitro diagnostic equipment, and is used to control the power supply 900 of the in vitro diagnostic equipment to restart when the delay unit 700 outputs the voltage reset signal for a preset number of times.

[0124] Specifically, Figure 5 As shown, the voltage window detection module 600 specifically includes a first comparator 610, a second comparator 620 and an AND gate 630. The non-inverting input terminal of the first comparator 610 receives the detection voltage, and the inverting input terminal of the first comparator 610 is connected to the window voltage; the inverting input terminal of the second comparator 620 receives the detection voltage, and the non-inverting input terminal of the second comparator 620 is connected to the window voltage; the input terminal of the AND gate 630 is connected to the output terminal of the first comparator 610 and the output terminal of the second comparator 620, and the AND gate 630 outputs a voltage reset signal when the detection voltage is in the voltage window, and does not output a voltage reset signal when the detection voltage is not in the voltage window.

[0125] Exemplarily, the inverting input terminal of the first comparator 610 and the non-inverting input terminal of the second comparator 620 are connected to the voltage filtering circuit and the PWM modulation circuit in sequence, and the window voltage output by the PWM modulation circuit is input to the inverting input terminal of the first comparator 610 and the non-inverting input terminal of the second comparator 620 after passing through the voltage filtering circuit.

[0126] The control device includes a resistor voltage dividing module 10 , an analog-to-digital conversion module 20 , a control device MCU 30 , a fault reset unit 40 and a second PWM voltage modulation unit 50 .

[0127] The resistor voltage divider module 10 is used to receive the voltage divider potential sent by the in vitro diagnostic device and convert the voltage divider potential into a detection voltage; the analog-to-digital conversion module 20 is connected to the resistor voltage divider module 20, for receiving the detection voltage and converting the detection voltage into a detection signal; the control device MCU30 is connected to the analog-to-digital conversion module 20, for receiving the detection signal, and outputting the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system according to the detection signal and a preset detection voltage truth table.

[0128] Specifically, the resistor voltage divider module 10 is connected to a constant current source, and the external input voltage division potential is converted into a detection voltage through the series resistor voltage divider principle. After analog-to-digital conversion, a detection digital signal is generated, and the detection digital signal is compared with a preset detection voltage truth table. Since the potential information sent by the equivalent resistor module when each in vitro diagnostic device fails is different, the digital signals corresponding to various fault conditions in the in vitro diagnostic system are different. The detection voltage truth table stores the detection digital signals corresponding to the failure of each in vitro diagnostic device in the in vitro diagnostic system and the failure of some in vitro diagnostic devices at the same time. According to the digital signal and the detection voltage truth table, the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system is output.

[0129] The control device MCU30 is used to output the fault status of each in vitro diagnostic device in the in vitro diagnostic system; the fault reset unit 40 is connected to the control device MCU30, and is used to output the corresponding reset voltage according to the fault status of each in vitro diagnostic device; the second PWM voltage modulation unit 50 is connected to the fault reset unit 40, and is used to PWM modulate the reset voltage and then output it.

[0130] Specifically, when the control device MCU30 identifies the device information such as the device number of different faulty in vitro diagnostic devices based on the detection voltage, it will send a reset voltage with different potentials. Since the voltage window value in the voltage window detection module of each in vitro diagnostic device is different, the reset voltage does not output a voltage reset signal after passing through the voltage window detection module in the normally working in vitro diagnostic device, or the output voltage reset signal contains control information for not resetting. After the reset voltage passes through the voltage window detection module in the abnormally working in vitro diagnostic device, a voltage reset signal is output, or the output voltage reset signal contains control information for resetting, thereby controlling the in vitro diagnostic device to reset.

[0131] In one embodiment, the present invention also provides an in vitro diagnostic system, including a control device and at least one in vitro diagnostic device, wherein the at least one in vitro diagnostic device includes an in vitro diagnostic device MCU100 and an equivalent resistance module 200, and the control device includes a resistance voltage divider module 10, an analog-to-digital conversion module 20 and a control device MCU30.

[0132] In one embodiment, the present invention also provides an in vitro diagnostic system, comprising a control device and at least one in vitro diagnostic device, wherein the control device comprises a control device MCU30, a fault reset unit 40 and a second PWM voltage modulation unit 50, and the at least one in vitro diagnostic device comprises an in vitro diagnostic device MCU100, a first PWM voltage modulation module 400 and a voltage filtering module 500.

[0133] In one embodiment, Fig.10As shown, the in vitro diagnostic system provided above also includes a communication bus, and the communication bus includes a first branch, a second branch, a third branch, a fourth branch, a fifth branch and a sixth branch.

[0134] The first branch is a DC positive branch, which is used to connect the positive power pole of each in vitro diagnostic device; the second branch is a DC negative branch, which is used to connect the negative power pole of each in vitro diagnostic device; the third branch is the positive access terminal of the serial bus differential signal; the fourth branch is the negative access terminal of the serial bus differential signal; the fifth branch is the connection status detection line of each in vitro diagnostic device, which is used to transmit the detection voltage; the sixth branch is the reset signal transmission line of each in vitro diagnostic device, which is used to transmit the reset signal.

[0135] In some embodiments, according to another aspect of the present invention, Fig.11 As shown, the present invention also provides an in vitro diagnostic system control method, which is applied to the above-mentioned in vitro diagnostic system, comprising the steps of:

[0136] S100 The control device sends a task execution instruction to each in vitro diagnostic device.

[0137] S200 When it is detected that any in vitro diagnostic device does not respond to the task execution instruction, the control device sends a fault detection signal to each in vitro diagnostic device.

[0138] After receiving the fault detection signal, the S300 in vitro diagnostic device MCU outputs a divided voltage potential to the control device.

[0139] S400 The control device outputs the detection voltage corresponding to the fault state of each in vitro diagnostic device to each in vitro diagnostic device according to the detection voltage truth table and the voltage division potential.

[0140] After receiving the detection voltage, the S500 in vitro diagnostic device generates a corresponding voltage reset signal according to the detection voltage.

[0141] After the S600 in vitro diagnostic device executes the voltage reset task for a preset number of times, it controls the power supply of the current in vitro diagnostic device to restart.

[0142] The in vitro diagnostic system control method provided in this embodiment uses an equivalent resistance module set in the in vitro diagnostic device and a resistance voltage divider module set in the control device to realize that when the in vitro diagnostic device fails to respond to the task execution instruction, the fault condition of each in vitro diagnostic device is fed back to the control device through a resistance signal composed of the potential information at both ends of the equivalent resistor, and the specific in vitro diagnostic device that has failed is identified in the control device according to the detection voltage truth table, thereby realizing accurate feedback, identification, resetting and other operations of the faulty device in the in vitro diagnostic system, automatically performing fault handling in the in vitro diagnostic system, and improving the overall fault handling efficiency of the in vitro diagnostic system.

[0143] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0144] Those of ordinary skill in the art will appreciate that the units and steps of each example described in conjunction with the embodiments disclosed herein can be implemented with electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed with hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of this application.

[0145] In the embodiments provided in the present application, it should be understood that the disclosed in vitro diagnostic system fault processing circuit, in vitro diagnostic equipment and system can be implemented in other ways. For example, the above-described in vitro diagnostic system fault processing circuit, in vitro diagnostic equipment and system embodiment is only schematic. For example, the division of the modules or units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or modules can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the communication connection between each other shown or discussed can be through some interfaces, communication connections of devices or units or integrated circuits, which can be electrical, mechanical or other forms.

[0146] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0147] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0148] It should be noted that the above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principle of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.

Claims

1. An in vitro diagnostic system fault processing circuit, characterized in that: At least one in vitro diagnostic device used in an in vitro diagnostic system, including: In vitro diagnostic equipment MCU; An equivalent resistance module, connected to the in vitro diagnostic device MCU and the internal circuit of the in vitro diagnostic device, respectively, for receiving a potential signal sent by the in vitro diagnostic device MCU, and outputting a divided potential based on the potential signal and the internal circuit after voltage division; When the in vitro diagnostic device is operating normally, the divided voltage potential is in a preset normal potential range; When the in vitro diagnostic device operates abnormally, the divided voltage potential is not within the normal potential interval.

2. The in vitro diagnostic system fault processing circuit according to claim 1, characterized in that: Also includes: A dip switch is provided on each of the in vitro diagnostic devices, and the dip switch is connected to the equivalent resistance module, and is used to set the resistance value of the current equivalent resistance module according to the dip address input into the dip switch, so that the resistance value of the equivalent resistance module in each in vitro diagnostic device is different.

3. The in vitro diagnostic system fault processing circuit according to claim 1, characterized in that: Also includes: A first PWM voltage modulation module, connected to the in vitro diagnostic device MCU, and used for modulating the potential signal sent by the node device MCU; The voltage filtering module is connected to the first PWM voltage modulation module and the equivalent resistance module respectively, and is used for filtering the modulated potential signal after receiving the potential signal modulated by the first PWM voltage modulation module, and outputting the filtered potential signal to the equivalent resistance module.

4. An in vitro diagnostic system fault processing circuit, characterized in that: At least one in vitro diagnostic device used in an in vitro diagnostic system, including: In vitro diagnostic equipment MCU; A voltage window detection module, used for receiving a detection voltage transmitted by an external device, and outputting a corresponding voltage reset signal according to the detection voltage and a preset voltage window; A delay module, connected to the output end of the voltage window detection module and the reset pin of the in vitro diagnostic device MCU, respectively, for receiving the voltage reset signal and delaying the output of the voltage reset signal to the reset pin; The counting module is connected to the delay module and the power supply of the in vitro diagnostic device respectively, and is used to control the power supply of the in vitro diagnostic device to restart when the delay unit outputs the voltage reset signal for a preset number of times.

5. The in vitro diagnostic system fault processing circuit according to claim 4, characterized in that: The voltage window detection module specifically includes: A first comparator, wherein a non-inverting input terminal of the first comparator receives the detection voltage, and an inverting input terminal of the first comparator is connected to the voltage window; A second comparator, wherein an inverting input terminal of the second comparator receives the detection voltage, and a non-inverting input terminal of the second comparator is connected to the voltage window; An AND gate, wherein an input terminal of the AND gate is connected to an output terminal of the first comparator and an output terminal of the second comparator, and the AND gate outputs a voltage reset signal when the detection voltage is within the voltage window.

6. An in vitro diagnostic system fault processing circuit, characterized in that: At least one in vitro diagnostic device used in an in vitro diagnostic system comprises the in vitro diagnostic system fault processing circuit according to claim 1 and claim 4.

7. An in vitro diagnostic system fault processing circuit, characterized in that: Applicable to at least one control device in an in vitro diagnostic system, the control device being communicatively connected to at least one in vitro diagnostic device in the in vitro diagnostic system, comprising: A resistor voltage-dividing module, used for receiving the voltage-dividing potential sent by the in vitro diagnostic device and converting the voltage-dividing potential into a detection voltage; an analog-to-digital conversion module, connected to the resistor voltage divider module, and configured to receive the detection voltage and convert the detection voltage into a detection signal; The control device MCU is connected to the analog-to-digital conversion module, and is used to receive the detection signal, and output the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system according to the detection signal and a preset detection voltage truth table.

8. An in vitro diagnostic system fault processing circuit, characterized in that: Applicable to at least one control device in an in vitro diagnostic system, the control device being communicatively connected to at least one in vitro diagnostic device in the in vitro diagnostic system, comprising: A control device MCU, used for outputting the fault status of each in vitro diagnostic device in the in vitro diagnostic system; A fault reset unit, connected to the control device MCU, and configured to output a corresponding reset voltage according to the fault state of each of the in vitro diagnostic devices; The second PWM voltage modulation unit is connected to the fault reset unit and is used for performing PWM modulation on the reset voltage and then outputting it.

9. An in vitro diagnostic system fault processing circuit, characterized in that: At least one control device used in an in vitro diagnostic system comprises an in vitro diagnostic system fault processing circuit as described in claim 7 and claim 8.

10. An in vitro diagnostic system, characterized in that: It comprises a control device and at least one in vitro diagnostic device, wherein the control device is respectively connected to at least one in vitro diagnostic device for communication. The in vitro diagnostic device includes an in vitro diagnostic device MCU; an equivalent resistance module, connected to the in vitro diagnostic device MCU and the internal circuit of the in vitro diagnostic device, respectively, for receiving a potential signal sent by the in vitro diagnostic device MCU, and outputting a divided potential to the control device based on the potential signal and the internal circuit voltage division; A voltage window detection module, used for receiving the detection voltage transmitted by the control device, and outputting a corresponding voltage reset signal according to the detection voltage and a preset voltage window; A delay module, connected to the output end of the voltage window detection module and the reset pin of the in vitro diagnostic device MCU, respectively, for receiving the voltage reset signal and delaying the output of the voltage reset signal to the reset pin; A counting module, connected to the delay module and the power supply of the in vitro diagnostic device, respectively, and used to control the power supply of the in vitro diagnostic device to restart when the delay unit outputs the voltage reset signal for a preset number of times; The control device includes a resistor voltage division module, which is used to receive the voltage division potential sent by the in vitro diagnostic device and convert the voltage division potential into a detection voltage; an analog-to-digital conversion module, connected to the resistor voltage divider module, and configured to receive the detection voltage and convert the detection voltage into a detection signal; The control device MCU is connected to the analog-to-digital conversion module, and is used to receive the detection signal, and output the detection voltage corresponding to the fault state of each in vitro diagnostic device in the in vitro diagnostic system according to the detection signal and a preset detection voltage truth table.

11. A method for controlling an in vitro diagnostic system, characterized in that: The in vitro diagnostic system as claimed in claim 10 comprises the steps of: The control device sends a task execution instruction to each of the in vitro diagnostic devices; When it is detected that any of the in vitro diagnostic devices does not respond to the task execution instruction, the control device sends a fault detection signal to each of the in vitro diagnostic devices; After receiving the fault detection signal, the in vitro diagnostic device MCU outputs the divided voltage potential to the control device; The control device outputs the detection voltage corresponding to the fault state of each of the in vitro diagnostic devices to each of the in vitro diagnostic devices according to the detection voltage truth table and the voltage division potential; After receiving the detection voltage, the in vitro diagnostic device generates the corresponding voltage reset signal according to the detection voltage; After the in vitro diagnostic device executes the voltage reset task for the preset number of times, the in vitro diagnostic device controls the power supply of the current in vitro diagnostic device to restart.

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