Alloy resistance test needle card

Abstract

The invention discloses an alloy resistor test probe card, and relates to the technical field of test probe cards. One embodiment comprises a seat body, the seat body is provided with a fine adjustment mechanism, the fine adjustment mechanism is connected with a bearing seat, the bearing seat is provided with an elastic abutting mechanism, the elastic abutting mechanism is connected with a mounting seat, the mounting seat is provided with a plurality of probe pieces, and the elastic abutting mechanism is configured to enable the probe pieces to abut against a chip. And the fine tuning mechanism is configured to drive the probe piece to move so as to adjust the position of the contact point. According to the invention, part of probes are difficult to change, and the accuracy of test points can be ensured.

Description

Technical Field

[0001] The present application relates to the technical field of test pin cards, and in particular to an alloy resistance test pin card. Background Art

[0002] The test probe card is an important test device in the semiconductor manufacturing process. It is a test interface instrument, mainly used to test bare cores. It connects the test machine and the resistance chip to transmit signals to test the chip parameters. The probe card plays an important role in the semiconductor industry and can help detect the performance and function of the chip.

[0003] Typically, in alloy resistance testing, in order to improve the detection efficiency of the chip, the test needle card is mainly composed of a plurality of sleeve probes arranged and installed on a carrier according to the test requirements for assembly. Such a sleeve probe usually consists of a probe and a sleeve. The probe is slidably inserted in the sleeve and an elastic member is connected between the probe and the sleeve. The elastic member provides the probe with the resistance required for the test. In addition, in order to facilitate the accuracy of the probe's resistance contact point, a gap is provided between the probe and the sleeve for the probe to move. The gap for the probe to move is used to facilitate the user to fine-tune a single probe.

[0004] Regarding the above-mentioned related schemes, the inventor believes that the following defects exist: when the supporting base shakes, some probes may move slightly, and the slightly moved probes will cause the contact points, i.e., the test points, to change in position, which in turn will cause abnormal test signal transmission. To maintain normal testing, workers are required to check and identify the abnormally moved probes one by one and adjust their positions to ensure the accuracy of the contact points, and the adjustment process is relatively difficult. Summary of the invention

[0005] In order to make it difficult for some probes to move abnormally and ensure the accuracy of the test points, the present application provides an alloy resistance test needle card.

[0006] The alloy resistance test pin card provided in this application adopts the following technical solution: An alloy resistance test needle card, comprising a seat body, the seat body is equipped with a fine-tuning mechanism, the fine-tuning mechanism is connected to a bearing seat, the bearing seat is equipped with an elastic resistance mechanism, the elastic resistance mechanism is connected to a mounting seat, the mounting seat is equipped with a plurality of probe pieces, the elastic resistance mechanism is configured to enable the probe pieces to resist a chip, and the fine-tuning mechanism is configured to drive the probe pieces to move to adjust the contact point position; The elastic resistance mechanism includes a guide connection member, which is connected to a mounting seat, and the mounting seat is slidably connected to a bearing seat via the guide connection member; an elastic member is sleeved on the guide connection member, one end of the elastic member is connected to the bearing seat, and the other end is connected to the mounting seat.

[0007] By adopting the above technical solution, the elastic resistance mechanism provides elastic resistance force for multiple probe parts. Since all probe parts are installed on the mounting seat and a single probe part does not have micro-motion capability, when the mounting seat shakes, all probe parts will move synchronously away from the test point instead of only a single or part of the probe parts moving abnormally. The fine-tuning mechanism can drive the supporting seat to move, thereby driving the mounting seat to move, and then synchronously fine-tuning the positions of multiple probe parts to ensure that all test points are accurate.

[0008] Preferably, the fine-tuning mechanism includes a driving component 1 and a driving component 2, the base body has an inner cavity, the driving component 1 and the driving component 2 are both arranged in the inner cavity and the driving component 1 and the driving component 2 are connected, the driving component 1 is configured to be self-locking, and the supporting base is connected to the driving component 2.

[0009] By adopting the above technical solution, drive component 1 and drive component 2 can drive the support base to move slightly to adjust the position of all probe components. Since drive component 1 can be self-locking, this structure can ensure the stability of multiple probe components during testing.

[0010] Preferably, the driving component 1 includes a rotating rod, the base body has a through hole connected to the inner cavity, the rotating rod is passed through and rotatably connected to the through hole, the rotating rod extends out of the base body and is equipped with a handwheel; the rotating rod is connected to a worm, the worm is connected to a worm wheel and the worm wheel can be self-locking, the worm wheel is rotatably connected to the base body, and the worm wheel is connected to the driving component 2.

[0011] By adopting the above technical solution, turning the hand wheel can drive the rotating rod to rotate, thereby driving the worm to rotate, and the rotation of the worm will drive the worm wheel to rotate, thereby inputting power to the driving component 2. In the above solution, only the worm can be used as a power output end, and the worm wheel cannot be used as a power input end.

[0012] Preferably, the second driving component includes a gear, which is connected to the worm wheel and can rotate with the worm wheel, the seat body is slidably connected to a rack, the gear is connected to the rack, the rack is connected to a connecting rod, and the connecting rod is connected to the supporting seat.

[0013] By adopting the above technical solution, the rotation of the worm wheel will drive the gear to rotate, thereby driving the rack to move, and then driving the bearing seat to move through the connecting rod.

[0014] Preferably, a limiting block is further mounted on the bearing seat, the mounting seat includes an abutment portion at the end, the limiting block contacts the limiting portion, and the limiting block is used to limit the movement stroke of the mounting seat.

[0015] By adopting the above technical solution, the limiting block can prevent the mounting seat from moving too far.

[0016] Preferably, the probe member includes a connecting block, the connecting block is connected to the probe, the mounting seat is provided with a receiving groove, and the connecting block is fit and clamped in the receiving groove; the mounting seat is also equipped with an elastic clamping assembly and a locking assembly, the elastic clamping assembly is used to elastically clamp the connecting block in the receiving groove, and the locking assembly is used to lock the connecting block in the receiving groove.

[0017] By adopting the above technical solution, the elastic pressing component can use elasticity to initially press the connection block into the receiving groove, and the connection block can be installed and removed, while the locking component can lock the connection block into the receiving groove, and the connection block cannot be moved. The elastic pressing component is used for quick disassembly of the connection block, and the locking component is used to ensure the stability of the probe during testing.

[0018] Preferably, the elastic clamping assembly includes a clamping piece, a receiving groove is opened on the groove wall of the receiving groove, the clamping piece is slidably connected to the receiving groove, and a return spring is also provided in the receiving groove, one end of the return spring is connected to the clamping piece, and the other end is connected to the receiving groove; when the connecting block is inserted into the receiving groove, the return spring is compressed and the clamping piece moves away from the receiving groove.

[0019] By adopting the above technical solution, when the connecting block is inserted into the receiving groove, the reset spring is compressed and the clamping piece moves away from the receiving groove; after the connecting block completely enters the receiving groove, the clamping piece presses the connecting block into the receiving groove under the action of the reset spring.

[0020] Preferably, the clamping member includes a sliding portion slidably connected to the accommodating groove, one end of the sliding portion is connected to a return spring, and the other end of the sliding portion is connected to an upper inclined guide portion and a lower inclined guide portion, and the upper inclined guide portion and the lower inclined guide portion are both used to guide the connecting block to be inserted into the accommodating groove.

[0021] By adopting the above technical solution, when the connecting block is inserted into the receiving groove, it will contact the upward inclined guide part or the downward inclined guide part, and under the action of force, the sliding part will slide.

[0022] Preferably, the locking assembly includes a sliding column, the mounting seat is penetrated by a connecting hole, the sliding column is inserted into the connecting hole and the sliding column and the connecting hole are slidably connected; the sliding column is connected to a locking piece, and the sliding column is configured to be able to drive the locking piece to move so as to maintain / release the lock of the connecting block; the mounting seat is also provided with a locking piece capable of locking the sliding column.

[0023] By adopting the above technical solution, pulling the sliding column can drive the locking piece to move so as to maintain / release the lock on the connecting block, that is, pulling the sliding column can complete the switching of the connecting block to be detachable / non-detachable, and the locking piece can be used to lock the sliding column to prevent the sliding column from accidentally moving.

[0024] Preferably, the connection block is made of epoxy resin, and the connection block and the probe are an integrated structure.

[0025] In summary, the present invention includes at least one of the following beneficial technical effects: 1. The elastic resistance mechanism provides elastic resistance for multiple probes. Since all probes are mounted on the mounting seat, when the mounting seat shakes, all probes will move synchronously away from the test point instead of only one or part of the probes moving. The fine-tuning mechanism can drive the bearing seat to move, thereby driving the mounting seat to move, and then fine-tuning the positions of multiple probes synchronously to ensure that all test points are accurate. 2. The elastic pressing component can be used to initially press the connection block into the receiving groove by elasticity, and the connection block can be installed and removed at this time, while the locking component can be used to lock the connection block into the receiving groove, and the connection block cannot be moved at this time. The elastic pressing component is used for quick disassembly of the connection block, and the locking component is used to ensure the stability of the probe during testing; 3. Pulling the sliding column can drive the locking piece to move so as to maintain / release the lock on the connecting block, that is, pulling the sliding column can complete the switching of the connecting block to be detachable / non-detachable, and the locking piece can be used to lock the sliding column to prevent the sliding column from moving accidentally. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a schematic diagram of the overall structure of the alloy resistance test needle card in the embodiment of the present application; Figure 2 It is a cross-sectional view of the alloy resistance test needle card; Figure 3 It is a cross-sectional view used to reflect the fine-tuning mechanism; Figure 4 It is a structural diagram for reflecting the elastic resistance mechanism; Figure 5 It is a schematic diagram for reflecting the structure of the locking component; Figure 6 yes Figure 2 Enlarged view of part A.

[0027] Markings in the attached drawings: 1, seat body; 11, inner cavity; 12, through hole; 13, receiving notch; 14, slide rail; 2, fine adjustment mechanism; 21, drive component 1; 211, rotating rod; 212, hand wheel; 213, worm; 214, worm wheel; 22, drive component 2; 221, gear; 222, rack; 223, connecting rod; 3, bearing seat; 31, slider; 32, limiting block; 4, elastic conflict mechanism; 41, guide connecting member; 42, elastic member; 5, installation Seat; 51, abutment portion; 52, receiving groove; 53, accommodating groove; 54, connecting hole; 6, probe member; 61, connecting block; 62, probe; 7, elastic clamping assembly; 71, clamping member; 711, sliding portion; 712, upper oblique guide portion; 713, lower oblique guide portion; 72, return spring; 8, locking assembly; 81, sliding column; 82, locking member; 821, vertical plate; 822, upper baffle; 8221, sub-baffle portion; 823, lower baffle; 83, locking member. DETAILED DESCRIPTION

[0028] The present invention is further described in detail below in conjunction with the accompanying drawings.

[0029] In the description of the present invention, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., and orientations or positional relationships indicated are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0030] The embodiment of the present application discloses an alloy resistance test pin card, which is used to ensure the accuracy of the test points. In this embodiment, 3×5 test points are taken as an example.

[0031] Reference Figure 1 and Figure 2 The alloy resistor test needle card includes a seat body 1, the seat body 1 is equipped with a fine-tuning mechanism 2, the fine-tuning mechanism 2 is connected to a bearing seat 3, the fine-tuning mechanism 2 can drive the bearing seat 3 to move laterally, the bearing seat 3 is equipped with an elastic resistance mechanism 4, the elastic resistance mechanism 4 is connected to a mounting seat 5, and the mounting seat 5 is equipped with multiple probe pieces 6. In this embodiment, there are 15 probe pieces 6, and the probe pieces 6 are distributed in 3×5 rows and columns. The elastic resistance mechanism 4 can make the probe pieces 6 resist the chip. The elastic resistance mechanism 4 provides elastic resistance force for multiple probe pieces 6 to meet the test requirements. The fine-tuning mechanism 2 can drive the probe pieces 6 to move to adjust the contact point position, that is, the test point position.

[0032] Since all probe components 6 are installed on the mounting base 5 and a single probe component 6 does not have the ability to fine-tune, when the mounting base 5 shakes, all probe components 6 will move synchronously away from the test point instead of only a single or part of the probe components 6 moving abnormally; and when all probe components 6 deviate from the test point, the fine-tuning mechanism 2 can be used to drive the supporting base 3 to move laterally, thereby driving the mounting base 5 to move laterally, and then synchronously fine-tuning the positions of multiple probe components 6 to ensure that all test points are accurate.

[0033] Reference Figure 2 and Figure 3 The fine-tuning mechanism 2 includes a driving component 1 21 and a driving component 2 22. The seat body 1 has an inner cavity 11. The driving component 1 21 and the driving component 2 22 are both arranged in the inner cavity 11 and connected to each other. The driving component 1 21 is configured to be self-locking. The bearing seat 3 is connected to the driving component 2 22. Specifically, the driving component 1 21 includes a rotating rod 211. The seat body 1 has a through hole 12 connected to the inner cavity 11. The rotating rod 211 is passed through and rotatably connected to the through hole 12. The rotating rod 211 extends outside the seat body 1 and is equipped with a hand wheel 212. Rotating the hand wheel 212 can drive the rotating rod 211 to rotate. The rotating rod 211 is connected to a worm 213. The worm 213 is connected to a worm wheel 214. The worm wheel 214 can self-lock. The worm wheel 214 cannot be used as a power input end to input power. The worm wheel 2 14 is rotatably connected to the seat body 1; the driving component 22 includes a gear 221, the gear 221 is connected to the worm gear 214, the gear 221 can rotate with the worm gear 214, the seat body 1 is slidably connected with a rack 222, the gear 221 is meshingly connected to the rack 222, the rotation of the gear 221 will drive the rack 222 to move left and right, the rack 222 is connected to a plurality of connecting rods 223, and the plurality of connecting rods 223 are connected to the bearing seat 3. The seat body 1 is also provided with a receiving notch 13 for the movement of the plurality of connecting rods 223.

[0034] Rotating the handwheel 212 will drive the rotating rod 211, the worm 213, the worm wheel 214 and the gear 221 to rotate. The rotation of the gear 221 will drive the rack 222 to move left and right, thereby driving the supporting seat 3 to move left and right through multiple connecting rods 223. The supporting seat 3 that moves left and right will drive the mounting seat 5 to move left and right, thereby driving multiple probe parts 6 to move left and right.

[0035] Reference Figure 3 and Figure 4 In order to guide the movement of the load-bearing member, a slider 31 is fixedly installed on the upper end of the load-bearing seat 3, and a slide rail 14 is installed on the lower end of the seat body 1. The slide rail 14 is arranged along the left and right directions, and the slider 31 is slidably connected to the slide rail 14; in addition, the load-bearing seat 3 is suspended under the seat body 1 by connecting the slider 31 and the slide rail 14.

[0036] Reference Figure 3 and Figure 4The elastic resistance mechanism 4 includes a guide connecting member 41, which is connected to the mounting seat 5, and the mounting seat 5 is slidably connected to the bearing seat 3 through the guide connecting member 41. Specifically, in the present embodiment, the guide connecting member 41 is preferably a detachable linear bearing; an elastic member 42 is sleeved on the guide connecting member 41, one end of the elastic member 42 is connected to the bearing seat 3, and the other end is connected to the mounting seat 5, and the elastic member 42 is preferably a spring.

[0037] The support seat 3 can move slightly up and down. If the force on the support seat 3 is released after the slight movement, the support seat 3 will be reset under the action of the elastic member 42; moving the application downward can make multiple probe members 6 contact the test point, and the spring is in a compressed state.

[0038] Reference Figure 4 The bearing seat 3 is also provided with a limiting block 32, and the mounting seat 5 includes an abutment portion 51 at the end, and the upper end of the limiting block 32 contacts the lower end of the abutment portion 51, and the limiting block 32 is used to limit the up and down movement of the mounting seat 5. In addition, the limiting block 32 is connected to the bearing seat 3 by bolts.

[0039] Reference Figure 5 and Figure 6 The structures of multiple probe parts 6 are the same. Take the structure of one of the probe parts 6 as an example: the probe part 6 includes a connecting block 61, the connecting block 61 is connected to the probe 62, and a receiving groove 52 is opened on the mounting seat 5. The connecting block 61 is fit and clamped in the receiving groove 52. The upper end of the connecting block 61 is flush with the upper end of the mounting seat 5, and the lower end of the connecting block 61 is flush with the lower end of the mounting seat 5. Specifically, in order to ensure the stable connection between the connecting block 61 and the probe 62, the material of the connecting block 61 is epoxy resin. After the epoxy resin is cured, it has good smoothness and corrosion resistance. The connecting block 61 and the probe 62 are an integrated structure.

[0040] It should be noted that: in the present embodiment, the receiving grooves 52 are provided in 3 rows and 6 columns. After the probe members 6 in the 3 rows and 5 columns in the present embodiment are installed, there is still 1 column of receiving grooves 52 left.

[0041] Reference Figure 5 and Figure 6 The mounting seat 5 is also equipped with an elastic pressing component 7 and a locking component 8. The elastic pressing component 7 is used to elastically press the connecting block 61 into the receiving groove 52, and the locking component 8 is used to lock the connecting block 61 into the receiving groove 52.

[0042] The elastic pressing assembly 7 can be used to initially press the connection block 61 against the receiving groove 52 by elasticity, and the connection block 61 can be installed and removed at this time, and the locking assembly 8 can be used to lock the connection block 61 in the receiving groove 52, and the connection block 61 cannot be moved at this time. The elastic pressing assembly 7 can facilitate the quick disassembly of the connection block 61, and the locking assembly 8 can ensure the stability of the probe 62 during testing.

[0043] Reference Figure 5 and Figure 6 The elastic pressing assembly 7 includes a pressing member 71. The groove wall of the receiving groove 52 is provided with a receiving groove 53. The pressing member 71 is slidably connected to the receiving groove 53. The pressing member 71 is arranged in close contact with the receiving groove 53. The pressing member 71 can move left and right. A return spring 72 is also arranged in the receiving groove 53. The right end of the return spring 72 is connected to the pressing member 71, and the left end of the return spring is connected to the receiving groove 53. Under normal conditions, when the connecting block 61 is not inserted into the receiving groove 52, the return spring 72 is in a relaxed state, and the right end of the pressing member 71 is in the receiving groove 52; when the connecting block 61 is inserted into the receiving groove 53, the return spring 72 is compressed, and the pressing member 71 moves away from the receiving groove 52. At this time, the pressing member 71 is in the receiving groove 53.

[0044] Reference Figure 5 and Figure 6 Specifically, the clamping member 71 includes a sliding portion 711 slidably connected to the accommodating groove 53, one end of the sliding portion 711 is connected to the reset spring 72, and the other end of the sliding portion 711 is connected to an upper inclined guide portion 712 and a lower inclined guide portion 713, both of which are inclined inwardly in a direction away from the reset spring 72, and are used to guide the connecting block 61 to be inserted into the accommodating groove 52.

[0045] Reference Figure 5 The locking assembly 8 includes a sliding column 81, combined with Figure 2 The mounting seat 5 is penetrated by a connecting hole 54, which is arranged along the front-to-back direction. The sliding column 81 is penetrated by the connecting hole 54 and the sliding column 81 is slidably connected to the connecting hole 54, so that the sliding column 81 can move forward and backward; the sliding column 81 is connected to a locking piece 82, and the sliding column 81 can drive the locking piece 82 to move back and forth so as to maintain / release the lock on the connecting block 61; the mounting seat 5 is also provided with a locking piece 83 that can lock the sliding column 81, and the locking piece 83 can lock the sliding column 81 so that the sliding column 81 cannot move. The specific structure of the locking piece 83 is the prior art and will not be repeated here.

[0046] Reference Figure 5 Specifically, the locking member 82 includes a vertical plate 821 connected to the sliding column 81, combined with Figure 4, the vertical plate 821 is connected with an upper baffle 822 and a lower baffle 823, the upper baffle 822 is slidably connected to the upper end of the mounting seat 5, and the lower baffle 823 is slidably connected to the lower end of the mounting seat 5. More specifically, the upper baffle 822 and the lower baffle 823 have the same structure, and the structure of the upper baffle 822 is taken as an example: the upper baffle 822 includes a plurality of sub-baffle portions 8221, and the plurality of sub-baffle portions 8221 are divided into 5 groups corresponding to the 5 columns of probe members 6, and each group of probe members 6 is composed of 2 sub-baffle portions 8221, and along the end surface direction of the mounting seat 5, the 2 sub-baffle portions 8221 are respectively located on both sides of the probe 62 and the lower ends of the 2 sub-baffle portions 8221 are in contact with the upper end of the connecting block 61.

[0047] After releasing the lock of the sliding column 81 by the locking piece 83, the sliding column 81 is pushed so that the sliding column 81 drives the vertical plate 821 to move away from the mounting seat 5, and the vertical plate 821 drives the upper baffle plate 822 and the lower baffle plate 823 to move, thereby releasing the obstruction of multiple connecting blocks 61. At this time, the probe 62 together with the connecting block 61 can be moved out of the receiving groove 52, and the user can determine the number of installed probe members 6 according to actual testing requirements; when conducting a test, it is necessary to pull the sliding column 81 so that the sliding column 81 drives the vertical plate 821 to move toward the mounting seat 5, and the vertical plate 821 drives the upper baffle plate 822 and the lower baffle plate 823 to move, thereby maintaining the obstruction of multiple connecting blocks 61. At this time, the connecting block 61 together with the probe 62 cannot escape from the receiving groove 52.

[0048] The implementation principle of the alloy resistance test needle card in the embodiment of the present application is: Rotating the handwheel 212 drives the rotating rod 211, the worm 213, the worm wheel 214 and the gear 221 to rotate. The rotation of the gear 221 drives the rack 222 to move left and right, thereby driving the supporting seat 3 to move left and right through multiple connecting rods 223. The supporting seat 3 that moves left and right drives the mounting seat 5 to move left and right, thereby driving multiple probes 62 to move left and right and then fine-tune the test points.

[0049] The embodiments of this specific implementation method are all preferred embodiments of the present invention, and are not intended to limit the protection scope of the present invention. Therefore, any equivalent changes made based on the structure, shape, and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. An alloy resistance test needle card, characterized in that: The invention comprises a seat body (1), the seat body (1) being provided with a fine adjustment mechanism (2), the fine adjustment mechanism (2) being connected to a bearing seat (3), the bearing seat (3) being provided with an elastic resistance mechanism (4), the elastic resistance mechanism (4) being connected to a mounting seat (5), the mounting seat (5) being provided with a plurality of probe members (6), the elastic resistance mechanism (4) being configured to enable the probe members (6) to resist against a chip, and the fine adjustment mechanism (2) being configured to drive the probe members (6) to move so as to adjust the contact point position; The elastic resistance mechanism (4) comprises a guide connecting member (41), the guide connecting member (41) is connected to the mounting seat (5), and the mounting seat (5) is slidably connected to the bearing seat (3) through the guide connecting member (41); an elastic member (42) is sleeved on the guide connecting member (41), one end of the elastic member (42) is connected to the bearing seat (3), and the other end is connected to the mounting seat (5).

2. The alloy resistance test needle card according to claim 1, characterized in that: The fine adjustment mechanism (2) comprises a driving component 1 (21) and a driving component 2 (22); the seat body (1) is provided with an inner cavity (11); the driving component 1 (21) and the driving component 2 (22) are both arranged in the inner cavity (11) and connected to each other; the driving component 1 (21) is configured to be self-locking; and the bearing seat (3) is connected to the driving component 2 (22).

3. The alloy resistance test needle card according to claim 2, characterized in that: The driving component 1 (21) comprises a rotating rod (211); the base (1) is provided with a through hole (12) communicating with the inner cavity (11); the rotating rod (211) is passed through and rotatably connected to the through hole (12); the rotating rod (211) extends outside the base (1) and is provided with a hand wheel (212); the rotating rod (211) is connected to a worm (213); the worm (213) is connected to a worm wheel (214); and the worm wheel (214) and the worm (213) are capable of self-locking; the worm wheel (214) is rotatably connected to the base (1); and the worm wheel (214) is connected to the driving component 2 (22).

4. The alloy resistance test needle card according to claim 3, characterized in that: The second driving component (22) comprises a gear (221), the gear (221) is connected to the worm gear (214) and the gear (221) can rotate together with the worm gear (214), the seat body (1) is slidably connected with a rack (222), the gear (221) is connected to the rack (222), the rack (222) is connected to a connecting rod (223), and the connecting rod (223) is connected to the bearing seat (3).

5. The alloy resistance test needle card according to claim 1, characterized in that: A limiting block (32) is also mounted on the bearing seat (3); the mounting seat (5) comprises a contact portion (51) at the end; the limiting block (32) contacts the limiting portion; and the limiting block (32) is used to limit the movement stroke of the mounting seat (5).

6. The alloy resistance test needle card according to claim 1, characterized in that: The probe member (6) comprises a connecting block (61), the connecting block (61) is connected to a probe (62), a receiving groove (52) is formed on the mounting seat (5), and the connecting block (61) is fitted and clamped in the receiving groove (52); the mounting seat (5) is also provided with an elastic pressing component (7) and a locking component (8), the elastic pressing component (7) is used to elastically press the connecting block (61) into the receiving groove (52), and the locking component (8) is used to lock the connecting block (61) into the receiving groove (52).

7. The alloy resistance test needle card according to claim 6, characterized in that: The elastic clamping assembly (7) comprises a clamping member (71), a receiving groove (53) is formed on the groove wall of the receiving groove (52), the clamping member (71) is slidably connected to the receiving groove (53), a return spring (72) is also arranged in the receiving groove (53), one end of the return spring (72) is connected to the clamping member (71), and the other end is connected to the receiving groove (53); when the connecting block (61) is inserted into the receiving groove (52), the return spring (72) is compressed, and the clamping member (71) moves in a direction away from the receiving groove (52).

8. The alloy resistance test needle card according to claim 7, characterized in that: The pressing member (71) comprises a sliding portion (711) slidably connected to the receiving groove (53); one end of the sliding portion (711) is connected to the return spring (72); the other end of the sliding portion (711) is connected to an upper inclined guide portion (712) and a lower inclined guide portion (713); the upper inclined guide portion (712) and the lower inclined guide portion (713) are both used to guide the connection block (61) to be inserted into the receiving groove (52).

9. The alloy resistance test needle card according to claim 6, characterized in that: The locking assembly (8) comprises a sliding column (81); the mounting seat (5) is penetrated by a connecting hole (54); the sliding column (81) is inserted into the connecting hole (54) and the sliding column (81) and the connecting hole (54) are slidably connected; the sliding column (81) is connected to a locking member (82); the sliding column (81) is configured to drive the locking member (82) to move so as to maintain / release the locking of the connecting block (61); and the mounting seat (5) is also provided with a locking member (83) capable of locking the sliding column (81).

10. The alloy resistance test needle card according to claim 6, characterized in that: The material of the connection block (61) is epoxy resin, and the connection block (61) and the probe (62) are an integrated structure.

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