System and method for automatic testing

Abstract

The invention provides a system for automatic testing. The system comprises a testing platform, a testing platform supporting piece and an oscilloscope. The test platform comprises a multi-port radio frequency switch module box, a signal connection jig and a plurality of connecting lines configured to connect a plurality of first joints of the multi-port radio frequency switch module box and a plurality of second joints of the signal connection jig. The multi-port radio frequency switch module box comprises a radio frequency switch module and a controller. The signal connection jig is connected with a universal interface of an object to be tested. The controller is connected to the radio frequency switch module and configured to provide a first signal to the object under test. The signal connection jig receives a second signal from the object to be tested and transmits the second signal to the multi-port radio frequency switch module box through a plurality of connection lines. The high-speed switch suite supporting piece comprises a pair of supporting arms, a supporting beam, a first rotating mechanism and a second rotating mechanism. The oscilloscope receives the second signal from the multi-port radio frequency switch module box and is configured to display the second signal.

Description

Technical Field

[0001] The present disclosure generally relates to systems and methods for multi-channel automatic testing, and more particularly to systems and methods for automatic testing of universal interfaces of a device under test. Background Art

[0002] Generally speaking, electronic products require the use of printed circuit boards (PCBs) to fix integrated circuits and other electronic components to perform specific functions through signal transmission. For example, a display adapter can be electrically connected to a motherboard and transmit signals through a specific data exchange method (or bus). For example, a display adapter can be electrically connected to the motherboard through a high-speed peripheral component interconnect (Peripheral Component Interconnect Express, PCIe) transmission method. Furthermore, the display adapter and the motherboard can have unique connectors and slots (ports) to connect to each other. In this way, PCIe can have connections with 2, 4, 8, 16, and 32 channels, thereby having high-efficiency transmission capabilities.

[0003] When a tester tests a slot of a DUT (e.g., a motherboard), a test platform is often needed to connect the DUT and test each channel of the DUT in sequence. However, the DUTs are often configured differently, so it is necessary to manually adjust the connection between the test platform and the DUT repeatedly, which is time-consuming and inconvenient. On the other hand, in the conventional technology, it is often necessary to re-switch the controller to test each channel in sequence, which also causes time-consuming problems.

[0004] Therefore, the present disclosure provides an automatic testing system and method, so as to provide a convenient automatic testing system and method. Summary of the invention

[0005] The embodiment of the present disclosure discloses a system for automatic testing, the system comprising: a test platform, a test platform support and an oscilloscope. The test platform includes a radio frequency switch module box, a signal connection fixture and a plurality of connection lines configured to connect a plurality of first connectors of the radio frequency switch module box and a plurality of second connectors of the signal connection fixture. The radio frequency switch module box includes a radio frequency switch module and a controller. The signal connection fixture is connected to a universal interface of a test object. The controller is connected to the radio frequency switch module and configured to provide a first signal to the test object. The signal connection fixture receives a second signal from the test object and transmits the second signal to the radio frequency switch module box via a plurality of connection lines. The oscilloscope receives the second signal from the radio frequency switch module box and is configured to display the second signal. The test platform support includes: a pair of support arms, a support beam, a first rotating mechanism and a second rotating mechanism. The support arm is configured to extend in a first direction. The two ends of the support beam are each engaged with one of the support arms and the support beam is configured to extend in a second direction perpendicular to the first direction. The first rotating mechanism has a first end connected to the support beam and a second end configured to rotate a rotating shaft on a first plane perpendicular to the first direction. The second rotating mechanism has a first end connected to the second end of the first rotating mechanism and a second end configured to rotate the RF switch module box on a second plane perpendicular to the rotating shaft.

[0006] The embodiment of the present disclosure discloses a method for automatic testing, the method comprising: connecting a controller to a radio frequency switch module box, wherein the radio frequency switch module box is configured on a test platform support; connecting a universal interface of a test object to a signal connection fixture, wherein the signal connection fixture is connected to the radio frequency switch module box via a plurality of connection lines; connecting the radio frequency switch module box to an oscilloscope; the test object receives a first signal from the controller and transmits a second signal to the oscilloscope; and after transmitting the second signal to the oscilloscope, the test object receives a third signal from the controller and transmits a fourth signal to the oscilloscope. The test platform support comprises: a pair of support arms, a support beam, a first rotating mechanism and a second rotating mechanism. The pair of support arms is configured to extend in a first direction. The two ends of the support beam are each engaged with one of the pair of support arms and the support beam is configured to extend in a second direction perpendicular to the first direction. The first rotating mechanism has a first end connected to the support beam and a second end configured to rotate a rotating shaft on a first plane perpendicular to the first direction. The second rotating mechanism has a first end connected to the second end of the first rotating mechanism and a second end configured to rotate the RF switch module box on a second plane perpendicular to the rotating shaft.

[0007] Embodiments of the present disclosure disclose a fixture for a radio frequency switch module box, which includes: a support member, a first moving member, a second moving member, and a rotating assembly. The support member is connected to a base and configured to move relative to the base and move substantially along a first direction. The first moving member is connected to the support member and configured to move relative to the support member and move substantially along a second direction; wherein the second direction is substantially perpendicular to the first direction. The second moving member is connected to the first moving member and configured to move relative to the first moving member and move substantially along a third direction; wherein the third direction is substantially perpendicular to the second direction and also substantially perpendicular to the first direction. The rotating assembly is connected to the second moving member and the radio frequency switch module box, and is configured to cause the radio frequency switch module box to rotate substantially around a first axis and / or rotate around a second axis, wherein the first axis is substantially perpendicular to the second axis. BRIEF DESCRIPTION OF THE DRAWINGS

[0008] The above and other aspects, features, and advantages of various embodiments of the present disclosure will become more apparent from the following description in conjunction with the accompanying drawings.

[0009] Figure 1 A schematic diagram depicting a system for automatic testing according to an embodiment of the present disclosure.

[0010] Figure 2 A schematic diagram depicting a test platform and an oscilloscope in a system for automatic testing according to an embodiment of the present disclosure.

[0011] Figure 3A , Figure 3B , Figure 3C , Figure 3D , Figure 3E and Figure 3F A schematic diagram depicting a test platform support according to an embodiment of the present disclosure.

[0012] Figure 4 A flowchart depicting automatic testing according to an embodiment of the present disclosure.

[0013] Figure 5 A view of a radio frequency switch module box in a system for automatic testing according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0014] Embodiments of the present disclosure recognize that when measuring various electronic devices with high-frequency universal interfaces, a measurement system with increased functions is required to reduce the time consumed for performing repetitive actions and further improve the efficiency of the measurement itself.

[0015] The embodiments of the present disclosure recognize that the provided test platform includes an RF switch module box, which integrates multiple RF switches and can provide different input and output channel combinations as needed. Through the multi-channel switching characteristics of the RF switch module box, multiple channels under test of the object under test can be connected at one time, and different set measurement signals can be switched to different channels under test through a controller during the entire measurement process, so as to provide a function that does not require repeated plugging and unplugging of the oscilloscope connector or repeated powering on and off of the object under test to move the channel under test.

[0016] The embodiments disclosed herein provide a test platform support, which at least has the function of carrying a radio frequency switch module box, and the test platform support provides the function of moving and adjusting the direction in various dimensions to change the direction of the radio frequency switch module box in accordance with the height, position and orientation of the interface of the object under test, so that the radio frequency switch module box is in a relatively appropriate position between the object under test, the signal connection fixture and the oscilloscope. This can avoid the connection lines between the above devices being too long or having too many turns. In the measurement of high-frequency signals, the length or turns of the connection lines may cause the high-frequency signals to attenuate.

[0017] The following description with reference to the accompanying drawings is provided to assist in a comprehensive understanding of the exemplary embodiments of the present disclosure as defined by the claims and their equivalents. The following description includes various specific details to assist in that understanding, but such details should be regarded as merely exemplary. Therefore, one of ordinary skill in the art will recognize that various changes and modifications may be made to the embodiments described herein without departing from the scope and spirit of the present disclosure. Some of the process steps depicted may be combined as integrated process steps. In addition, descriptions of well-known functions and configurations may be omitted for clarity and conciseness.

[0018] The terms and words used in the following description and claims are not limited to the bibliographical meanings, but are merely used to enable a clear and consistent understanding of the present disclosure. Therefore, it should be apparent to those of ordinary skill in the art that the following description of exemplary embodiments of the present disclosure is provided for illustration purposes only and not for the purpose of limiting the present disclosure as defined by the appended claims and their equivalents.

[0019] It should be understood that the singular forms "a," "an," and "the" include plural referents unless the context dictates otherwise. Thus, for example, reference to "a component surface" includes reference to one or more of such surfaces unless the context dictates otherwise.

[0020] For purposes of the following description, terms such as "upper," "lower," "right," "left," "vertical," "horizontal," "top," "bottom," and derivatives thereof, shall relate to the disclosed structures and methods as oriented in the accompanying drawings. Terms such as "above," "overlying," "top," "on top of," "on top of," or "on top of" mean that a first component is present on a second component, wherein intervening components may be present between the first and second components. The terms "directly contacting" or "contacting" mean that a first component and a second component are connected without any other components at the interface of the two components.

[0021] In order not to obscure the presentation of the embodiments of the present disclosure, in the following detailed description, some processing steps or operations known in the art may be combined for presentation and for illustration purposes, and in some examples may not have been described in detail. In other examples, some processing steps or operations known in the art may not be described at all. It should be understood that the following description is quite focused on the unique features or components of the various embodiments of the present disclosure.

[0022] In this specification, references to "one embodiment", "other embodiments", "another embodiment", "an embodiment", etc. indicate that the described embodiment may include a particular feature, structure, or characteristic, but each embodiment may not necessarily include the particular feature, structure, or characteristic. In addition, such phrases do not necessarily refer to the same embodiment. In addition, when a particular feature, structure, or characteristic is described in conjunction with an embodiment, it should be understood that it is within the scope of those skilled in the art to implement this feature, structure, or characteristic in conjunction with other embodiments, whether or not explicitly described.

[0023] Reference will now be made in detail to the embodiments of the present disclosure, examples of which are illustrated in the accompanying drawings, wherein like reference numerals refer to like elements throughout.

[0024] Figure 1 A schematic diagram of a system 10 for automatic testing according to an embodiment of the present disclosure is depicted. As depicted, Figure 1 The invention discloses a system 10 for automatic testing, which comprises a test platform 11, a test platform support 13 and an oscilloscope 15. The test platform 11 comprises a radio frequency switch module box 111, a signal connection fixture 112 and a plurality of connection lines 113 configured to connect a plurality of first connectors of the radio frequency switch module box 111 and a plurality of second connectors of the signal connection fixture 112. The radio frequency switch module box 111 comprises a radio frequency switch module and a controller (such as Figure 2The signal connection fixture 112 is connected to a universal interface of a DUT 12. The controller is connected to the RF switch module box 111 and configured to provide a first signal to the DUT 12. The signal connection fixture 112 receives a second signal from the DUT 12 and transmits the second signal to the RF switch module box 111 via a plurality of connection lines 113. The oscilloscope 15 receives the second signal from the RF switch module box 111 and is configured to display the second signal.

[0025] The test platform support 13 includes: a pair of support arms 131, a support beam 132, a rotating mechanism 133, a rotating mechanism 134, a slider 135, a bottom plate 136 and a connecting member 137. The pair of support arms 131 are movably disposed on the bottom plate 136, and the opposite ends of the support beam 132 are respectively connected to the top ends of the support arms 131. The slider 135 can move relative to the support beam 132. One side of the slider 135 is connected to the top end of the connecting member 309, and the connecting member 309 is connected to the support beam 132 via the slider 135. The rotating mechanism 133 is disposed at the bottom end of the connecting member 309, and the rotating mechanism 133 can rotate relative to the connecting member 309 in the z direction. The rotating mechanism 134 rotates with the rotating mechanism 133 in a pivotable manner. The detailed structure of the test platform support 13 will be described in detail in the content related to FIG. 3.

[0026] In certain embodiments of the present disclosure, the universal interface of the DUT is a high-speed Peripheral Component Interconnect Express (PCIe) interface or a Universal Serial Bus-C (USB-C) interface.

[0027] Figure 2 A schematic diagram depicting a test platform 21 and an oscilloscope 25 in a system for automatic testing according to an embodiment of the present disclosure. Figure 2 Describe the connection relationship between the components of the test platform 21 and the oscilloscope 25. Figure 2As shown, the test platform 21 includes a radio frequency switch module box 211, a signal connection fixture 212, and a plurality of connection lines 213 configured to connect a plurality of connectors of the radio frequency switch module box 211 and a plurality of connectors of the signal connection fixture 212. The radio frequency switch module box 211 includes a radio frequency switch module 2111 and a controller 2114. The signal connection fixture 212 is used to connect to a universal interface of a test object. The controller 214 is connected to the radio frequency switch module 2111 and is configured to provide a first signal to the test object via the radio frequency switch module box 211, the plurality of connection lines 213, and the signal connection fixture 212. In certain embodiments of the present disclosure, the test object generates a second signal in response to the first signal, and the signal connection fixture 212 receives the second signal from the test object and transmits the second signal to the radio frequency switch module box 211 via the plurality of connection lines 213. The oscilloscope 25 receives the second signal from the RF switch module box 211 and is configured to display the waveform of the second signal for user interpretation or further analysis.

[0028] In certain embodiments of the present disclosure, the RF switch module 2111 combines a single RF switch with a designed PCB carrier to achieve modular functions, which can facilitate future combination changes and maintenance.

[0029] In some embodiments of the present disclosure, the signal connection fixture 212 is used to provide a universal interface connection for the object under test. In some embodiments of the present disclosure, the universal interface of the object under test can be a high-speed peripheral component interconnect (PCIe) interface or a type C universal serial bus (USB-C) interface. In some embodiments of the present disclosure, different interfaces can be provided with signal connection fixtures 212 to achieve different test requirements and changes.

[0030] In some embodiments of the present disclosure, the controller 2114 is used for signal switching. The controller 2114 can modify, compile and control the program according to the test standard specification or according to the user's needs to achieve the purpose of testing. In some embodiments of the present disclosure, the controller 2114 can further include a computer, which can provide the function of modifying, compiling and controlling the program.

[0031] In certain embodiments of the present disclosure, the RF switch module may be further connected to a Cable Modem Terminal System (CMTS).

[0032] Figure 3A , Figure 3B , Figure 3C , Figure 3D , Figure 3E , Figure 3F A test platform support according to one embodiment of the present disclosure is depicted.

[0033] Figure 3A A view depicting a test platform support according to an embodiment of the present disclosure. The test platform support 30 includes: a pair of support arms 301A and 301B, a support beam 302, a rotation mechanism 303, and a rotation mechanism 304. The support arms 301A and 301B are configured to extend generally in the z-direction. One end 3021 of the support beam 302 is coupled to the support arm 301A. The opposite other end 3023 of the support beam 302 is coupled to the support arm 301B. The support beam 302 is configured to extend in the y-direction perpendicular to the z-direction.

[0034] like Figure 3A As shown, the rotating mechanism 303 is connected to the connecting member 309, and the connecting member 309 is connected to the support beam 302 via a slider 305; further, the rotating mechanism 303 is further connected to the rotating mechanism 304, and the rotating mechanism 304 is connected to the RF switch module box 311. In certain embodiments of the present disclosure, the rotating mechanism 304 has a pivot 304i, and the RF switch module box 311 is configured to be pivotally connected to the rotating mechanism 304 via the pivot 304i.

[0035] The rotating mechanism 303 is configured to rotate an object connected thereto approximately around an axis Z1; in some embodiments of the present disclosure, the rotating mechanism 303 is configured to rotate the rotating mechanism 304 connected thereto approximately around the Z1 axis, and because the RF switch module box 311 is connected to the rotating mechanism 304, the rotating mechanism 303 can also simultaneously rotate the RF switch module box 311 approximately around the Z1 axis. In some embodiments of the present disclosure, the Z1 axis extends approximately along the z direction.

[0036] As described above, the rotating mechanism 304 has a pivot 304i, so the rotating mechanism 304 can make an object connected thereto pivot approximately around an X1 axis through the pivot 304i. In certain embodiments of the present disclosure, the RF switch module box 311 can pivot approximately around the X1 axis through the pivot 304i of the rotating mechanism 304.

[0037] In some embodiments of the present disclosure, the support beam 302 has a slide rail, and the slider 305 is configured to slide along the slide rail of the support beam 302. In other words, the slider 305 can move relative to the support beam 302 and move substantially along the x-direction. In some embodiments of the present disclosure, the connecting member 309 is movably connected to the slider 305. In some embodiments of the present disclosure, the connecting member 309 is configured to move relative to the slider 305 and move substantially along the z-direction.

[0038] In some embodiments of the present disclosure, the test platform support 30 further includes a base plate 306, wherein the base plate 306 includes a pair of slide rails 307A and 307B extending along the y direction, wherein the test platform support 30 further includes a pair of sliders 308A and 308B. The slider 308A is configured to slide along the slide rail 307A, and the slider 308B is configured to slide along the slide rail 307B. In some embodiments of the present disclosure, the support arm 301A is configured on the slider 308A, and the support arm 301B is configured on the slider 308B. In this way, the support arm 301A can move along the slide rail 307A via the slider 308A, and the support arm 301B can move along the slide rail 307B via the slider 308B; in other words, the support arms 301A and 301B can move approximately in the y direction via the sliders 308A and 308B.

[0039] Figure 3B The figure depicts that the RF switch module box 311 can be moved in the y direction via the test platform support 30. As described above, the support arms 301A and 301B can be moved substantially in the y direction via the sliders 308A and 308B. Figure 3A and 3B The support beam 302 is connected to the support arms 301A and 301B, and the RF switch module box 311 is connected to the support beam 302 via the rotating mechanisms 303 and 304; therefore, when the support arms 301A and 301B can move along the slide rails 307A and 308B via the sliders 308A and 308B, the RF switch module box 311 is driven to move along the extension direction of the slide rails 307A and 308B; that is, the RF switch module box 311 can move approximately in the y direction via the sliders 308A and 308B relative to the slide rails 307A and 308B.

[0040] Figure 3C The figure depicts that the RF switch module box 311 can be moved in the x direction via the test platform support 30. As described above, the slider 305 is configured to move along the extension direction of the support beam 302, that is, the slider 305 can move substantially along the x direction. Figure 3A and 3C As shown, the RF switch module box 311 is connected to the slider 305 through the connector 309; therefore, when the slider 305 moves approximately in the x-direction along the slide rail of the support beam 302, the RF switch module 311 is driven to move approximately in the x-direction.

[0041] Figure 3D The figure depicts that the RF switch module box 311 can be moved in the z direction via the test platform support 30. As described above, the connector 309 is configured to move substantially in the z direction relative to the slider 305. Figure 3A and 3DThe RF switch module box 311 is connected to the connecting member 309; therefore, when the connecting member 309 moves approximately along the z direction relative to the slider 305, the RF switch module box 311 is driven to move approximately in the z direction.

[0042] Figure 3E The RF switch module box 311 can be rotated approximately around the Z1 axis via the test platform support 30. As mentioned above, the rotating mechanism 303 is configured to allow an object connected thereto to rotate approximately around an axis Z1. Figure 3A and 3E The RF switch module box 311 is connected to the rotating mechanism 303 , so the RF switch module 311 can rotate approximately around an axis Z1 via the rotating mechanism 303 .

[0043] Figure 3F The RF switch module box 311 can be rotated approximately around the X1 axis via the test platform support 30. As mentioned above, the rotating mechanism 304 can have a pivot 304i, which is configured to allow an object connected thereto to pivot approximately around the pivot 304i, that is, to rotate approximately around the X1 axis. Figure 3A and 3F The RF switch module box 311 is pivotally connected to the rotating mechanism 304 , so the RF switch module 311 can be pivoted approximately around the pivot 304 i via the rotating mechanism 304 , that is, rotate approximately around the axis X1 .

[0044] Based on the above, it can be understood that the test platform support 30 can drive the RF switch module 311 to move linearly in the x-direction, y-direction and z-direction, and can also drive the RF switch module box 311 to rotate around two mutually perpendicular axes (x1 axis and z1 axis). In this way, the user can operate the RF switch module box 311 through the test fixture support 30, and can easily move the RF switch module box 311 to the desired position and / or rotate it to the desired direction, thereby further improving the efficiency of the test work.

[0045] Figure 4 A flow chart for automatic testing according to one embodiment of the present disclosure is depicted.

[0046] Figure 4The flowchart depicted is about a method 40 for automatic testing, the method comprising: starting with step 401, connecting a controller to a radio frequency switch module, wherein the radio frequency switch module is configured on a test platform support via a box. In step 402, a device under test (DUT) is placed and a universal interface of the DUT is connected to a signal connection fixture. In step 404, the signal connection fixture is connected to the radio frequency switch module via a plurality of connecting wires, and the radio frequency switch module is connected to an oscilloscope, that is, the connecting wires are installed for all channels to be tested at one time. Then, in step 405, the system is turned on, at which time the DUT receives a first signal from the controller and transmits a second signal to the oscilloscope for measurement in step 406. After the second signal is transmitted to the oscilloscope for measurement, step 407 determines whether all channels to be tested have completed measurement. If it is determined that there are still channels to be tested that have not completed measurement, the process switches to step 408. At this time, without adjusting the connection line and restarting the machine, the controller further transmits a third signal different from the second signal. The DUT receives the third signal from the controller and transmits the fourth signal to the oscilloscope to return to step 406 for measurement. If it is determined in step 407 that all channels to be tested have completed measurement, the process switches to step 409 to remove the DUT. For example, after the universal interface of the signal connection fixture is unplugged from the DUT, the process enters step 410 to end the measurement.

[0047] Figure 5 A diagram depicting a radio frequency switch module box in a system for automatic testing according to an embodiment of the present disclosure.

[0048] like Figure 5 As shown, in one embodiment of the present disclosure, the RF switch module box 50 combines the RF switch monomer 51 or 52 with the designed PCB carrier 53 to achieve modular functions, which can facilitate future combination changes and maintenance. By combining multiple different types of RF switch monomers (such as monomer 51, monomer 52 or other monomers) Figure 5 The RF switch module box 50 can provide various input and output connections as required, such as Figure 5 As shown, monomer 51 includes a plurality of connectors 511 , and monomer 52 includes a plurality of connectors 521 .

[0049] While the present disclosure has been shown and described with reference to certain exemplary embodiments thereof, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the spirit and scope of the present disclosure as defined by the appended claims and their equivalents.

[0050] The description of various embodiments of the present disclosure has been presented for illustrative purposes, but the description is not intended to be exhaustive or limited to the disclosed embodiments. Many modifications and variations will be apparent to those of ordinary skill in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is selected to best explain the principles of one or more embodiments, practical applications, or technical improvements over technologies found in the marketplace, or to enable other persons of ordinary skill in the art to understand the embodiments disclosed herein.

[0051] Explanation of symbols

[0052] 10: System

[0053] 11: Test Platform

[0054] 12: Object to be tested

[0055] 13:Test platform support

[0056] 15: Oscilloscope

[0057] 21: Test Platform

[0058] 25: Oscilloscope

[0059] 30: System

[0060] 40: Methods

[0061] 50: RF switch module box

[0062] 51: Monomer

[0063] 52: Monomer

[0064] 53:PCB carrier

[0065] 111:RF switch module box

[0066] 112: Signal connection fixture

[0067] 113:Connecting wire

[0068] 131: Support arm

[0069] 132:Support beam

[0070] 133: Rotating mechanism

[0071] 134: Rotating mechanism

[0072] 135: Slider

[0073] 136: Bottom plate

[0074] 137: Connector

[0075] 211: RF switch module box

[0076] 212: Signal connection fixture

[0077] 213:Connecting line

[0078] 301A: Support arm

[0079] 301B: Support arm

[0080] 302: Support beam

[0081] 303: Rotating mechanism

[0082] 304: Rotating mechanism

[0083] 304i shaft

[0084] 305: Slider

[0085] 306: Base

[0086] 307A: Slide rail

[0087] 307B: Slide rail

[0088] 308A: Slider

[0089] 308B: Slider

[0090] 309: Connector

[0091] 311: RF switch module box

[0092] 401: Steps

[0093] 402: Steps

[0094] 403: Steps

[0095] 404: Steps

[0096] 405: Steps

[0097] 406: Steps

[0098] 407: Steps

[0099] 408: Steps

[0100] 409: Steps

[0101] 410: Steps

[0102] 511: Connector

[0103] 521: Connector

[0104] 2111:RF switch module

[0105] 2114:Controller

[0106] 3021: End

[0107] 3023: End

[0108] 3031: End

[0109] 3033: End

Claims

1. A system for automatic testing, the system comprising: A test platform, comprising: A radio frequency switch module box, comprising a radio frequency switch module and a controller; a signal connection fixture; and A plurality of connection lines configured to connect a plurality of first connectors of the RF switch module box and a plurality of second connectors of the signal connection fixture, wherein the signal connection fixture is connected to a universal interface of a DUT; and wherein the controller is connected to the RF switch module and configured to provide a first signal to the DUT, wherein the signal connection fixture receives a second signal from the DUT and transmits the second signal to the RF switch module via the plurality of connection lines; A test platform support, comprising: A pair of support arms, which are configured to extend in a first direction; a support beam, both ends of which are respectively engaged with an upper end of one of the pair of support arms and configured to extend in a second direction perpendicular to the first direction; a first rotating mechanism having a first end connected to the second support beam and a second end configured to rotate a rotating shaft on a first plane perpendicular to the first direction; and a second rotating mechanism having a first end connected to the second end of the first rotating mechanism and a second end configured to rotate the RF switch module box on a second plane perpendicular to the rotation axis; and An oscilloscope receives the second signal from the RF switch module box and is configured to display the second signal.

2. The system according to claim 1, wherein the universal interface of the DUT is a high-speed peripheral component interconnect Express (PCIe) interface or a Universal Serial Bus-C (USB-C) interface.

3. A system according to claim 1, wherein the support beam has a first slide rail extending along the second direction, wherein the test platform support further includes a first slider configured to slide along the first slide rail, and wherein the first end of the first rotating machine is connected to the second support beam via the first slider.

4. A system according to claim 1, wherein the test platform support further includes a base plate, wherein the base plate includes a pair of second slide rails extending along a third direction perpendicular to the first direction and the second direction, wherein the test platform support further includes a pair of second sliders configured to slide along one of the pair of second slide rails respectively, and wherein the pair of support arms are each configured on one of the pair of second sliders.

5. The system according to claim 1, wherein the RF switch module is further connected to a Cable Modem Terminal System (CMTS).

6. A method for automatic testing, the method comprising: A controller is connected to a radio frequency switch module to form a radio frequency switch module box, wherein the radio frequency switch module box is configured on a test platform support, and the test platform support includes: a support arm configured to extend in a first direction; a support beam having one end engaged with the support arm and configured to extend in a second direction perpendicular to the first direction; a first rotating mechanism having a first end connected to the support beam and a second end configured to rotate a rotating shaft in a first plane perpendicular to the first direction; and a second rotating mechanism having a first end connected to the second end of the first rotating mechanism and a second end configured to rotate the RF switch module box on a second plane perpendicular to the rotating shaft; Connecting a universal interface of a DUT to a signal connection fixture, wherein the signal connection fixture is connected to the RF switch module box via a plurality of connection lines; Connecting the radio frequency switch module box to an oscilloscope; The object under test receives a first signal from the controller and transmits a second signal to the oscilloscope; and After transmitting the second signal to the oscilloscope, the DUT receives a third signal from the controller and transmits a fourth signal to the oscilloscope. 7 . The method of claim 6 , wherein after transmitting the second signal to the oscilloscope, without removing the plurality of connection lines, receiving the third signal from the controller and transmitting the fourth signal to the oscilloscope.

8. The method according to claim 6, wherein the universal interface of the DUT is a high-speed peripheral component interconnect Express (PCIe) interface or a Universal Serial Bus-C (USB-C) interface.

9. The method according to claim 6, wherein the support beam has a first slide rail extending along the second direction, wherein the test platform support further includes a first slider configured to slide along the first slide rail, and wherein the first end of the first rotating mechanism is connected to the support beam via the first slider.

10. The method according to claim 6, wherein the test platform support further includes a base plate, wherein the base plate includes a pair of second slide rails extending along a third direction perpendicular to the first direction and the second direction, wherein the test platform support further includes a pair of second sliders configured to slide along one of the pair of second slide rails respectively, and wherein the pair of support arms are respectively configured on one of the pair of second sliders.

11. A fixture for a radio frequency switch module box, comprising: a support member connected to a base and configured to move relative to the base and generally along a first direction; a first moving member connected to the support member and configured to move relative to the support member and substantially along a second direction; wherein the second direction is substantially perpendicular to the first direction; a second moving member connected to the first moving member and configured to move relative to the first moving member and substantially along a third direction; wherein the third direction is substantially perpendicular to the second direction and substantially perpendicular to the first direction; and A rotating assembly is connected to the second moving member and the RF switch module box, and is configured to allow the RF switch module box to rotate approximately around a first axis and / or around a second axis, wherein the first axis is approximately perpendicular to the second axis.

12. The fixture according to claim 11, wherein the rotating assembly comprises: a first rotating mechanism connected to the second moving member and configured to rotate the RF switch module box substantially around the first axis; and A second rotating mechanism is connected to the first rotating mechanism and the RF switch module box, and is configured to allow the RF switch module box to rotate approximately around the second axis. The fixture according to claim 12 , wherein the first axis extends substantially along the third direction.

14. The fixture according to claim 11, wherein the RF switch module box is configured to be moved adjacent to a DUT, and / or configured to be rotated so that a plurality of connection lines of the RF switch module box can be connected to the DUT. 15 . The fixture according to claim 14 , wherein the radio frequency switch module is configured to perform one-time connection to a plurality of channels to be tested of the object to be tested.

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