Chip test method, system and device, storage medium and product

Abstract

The invention discloses a chip test method, system and device, a storage medium and a product, and the method comprises the steps: obtaining a to-be-executed test command through a chip automatic test device, and calling a function from a target dynamic link library to write the test command and a parameter corresponding to the test command into a shared memory; reading the test command and the parameters corresponding to the test command from the shared memory through the plug-in instrument, and executing test operation according to the test command and the parameters corresponding to the test command to obtain a test result; calling a function from the target dynamic link library through the plug-in instrument to write a test result into the shared memory; reading a test result from the shared memory through the chip automatic test equipment; wherein the target dynamic link library is imported into the chip automatic test equipment and the plug-in instrument in advance. According to the chip testing method disclosed by the invention, data transmission is performed through the shared memory, so that the testing efficiency is improved, and meanwhile, the testing stability can be improved.

Description

Technical Field

[0001] The present invention relates to the field of computer technology, and in particular to a chip testing method, system, device, storage medium and product. Background Art

[0002] Automatic Test Equipment (ATE) is an automated device specifically used for chip testing. It performs various tests on the chip to evaluate its performance, function and reliability to ensure that the chip meets the design requirements. As the chip becomes more integrated and powerful, a single ATE tester may not be able to fully cover the chip functions. In this case, an external instrument is needed to test the chip. According to the external instrument method, it can be divided into two situations: the external instrument can be directly controlled by the ATE software and the external instrument has its own software control.

[0003] In the case where the external instrument has its own software control, ATE cannot directly control the external instrument. In the prior art, ATE and the external instrument generally transmit data through TCP / IP. The ATE machine software port sends data, the external instrument port receives data, and then performs corresponding test actions based on the data, and then sends the test results back to the ATE end through TCP / IP.

[0004] Due to the TCP / IP protocol itself, communication itself requires hundreds of milliseconds, which is a long time for ATE machines. In addition, due to possible reasons such as network congestion, media damage, delay timeout, network configuration, etc., packet loss may occur during TCP / IP transmission, resulting in transmission abnormalities. In addition, if both sides want to communicate normally, both sides need to configure the port, IP address, subnet mask, default gateway, DNS server, etc., which requires testers to have a deeper understanding of these, and the initial configuration is more complicated. Summary of the invention

[0005] The present invention provides a chip testing method, system, device, storage medium and product to achieve efficient and stable chip testing.

[0006] According to one aspect of the present invention, a chip testing method is provided, comprising:

[0007] Obtaining a test command to be executed through a chip automatic test device, calling a function from a target dynamic link library to write the test command and parameters corresponding to the test command into a shared memory;

[0008] Reading the test command and the parameters corresponding to the test command from the shared memory through an external instrument, executing a test operation according to the test command and the parameters corresponding to the test command, and obtaining a test result;

[0009] Calling a function from the target dynamic link library through the external instrument to write the test result into the shared memory;

[0010] Reading the test result from the shared memory through the chip automatic test equipment;

[0011] The target dynamic link library is pre-imported into the chip automatic test equipment and the external instrument.

[0012] Furthermore, the shared memory corresponds to the target dynamic link library, and the data in the shared memory is defined by the target dynamic link library as readable, writable and shareable data.

[0013] Further, calling a function from a target dynamic link library to write the test command and parameters corresponding to the test command into a shared memory includes:

[0014] Calling a task setting function from the target dynamic link library and writing the test command into the task setting function;

[0015] Calling a target command function from the target dynamic link library according to the test command, and writing parameters corresponding to the test command into the target command function;

[0016] The values ​​of the task setting function and the target command function are written into the shared memory.

[0017] Further, reading the test command and the parameters corresponding to the test command from the shared memory through the plug-in instrument includes:

[0018] Reading the value of the task setting function from the shared memory through the external instrument to obtain the test command;

[0019] The value of the target command function is read from the shared memory according to the test command to obtain parameters corresponding to the test command.

[0020] Further, calling a function from the target dynamic link library through the plug-in instrument to write the test result into the shared memory includes:

[0021] Calling the task setting function from the target dynamic link library through the plug-in instrument, and writing the test result into the task setting function;

[0022] Writing the value of the task setting function into the shared memory.

[0023] Further, reading the test result from the shared memory by the chip automatic test equipment includes:

[0024] Reading the value of the task setting function from the shared memory through the chip automatic test equipment;

[0025] The read value of the task setting function is used as the test result.

[0026] According to another aspect of the present invention, there is provided a chip testing system, comprising a chip automatic testing device and an external instrument;

[0027] The chip automatic test equipment is used to obtain a test command to be executed, and call a function from a target dynamic link library to write the test command and parameters corresponding to the test command into a shared memory;

[0028] The external instrument is used to read the test command and the parameters corresponding to the test command from the shared memory, perform the test operation according to the test command and the parameters corresponding to the test command and obtain the test result, and call the function from the target dynamic link library to write the test result into the shared memory;

[0029] The chip automatic test equipment is used to read the test result from the shared memory;

[0030] The target dynamic link library is pre-imported into the chip automatic test equipment and the external instrument.

[0031] Optionally, the shared memory corresponds to the target dynamic link library, and the target dynamic link library defines the data in the shared memory as readable, writable and shareable data.

[0032] Optionally, the chip automatic testing equipment is also used for:

[0033] Calling a task setting function from the target dynamic link library and writing the test command into the task setting function;

[0034] Calling a target command function from the target dynamic link library according to the test command, and writing parameters corresponding to the test command into the target command function;

[0035] The values ​​of the task setting function and the target command function are written into the shared memory.

[0036] Optionally, the external instrument is also used for:

[0037] Reading the value of the task setting function from the shared memory to obtain the test command;

[0038] The value of the target command function is read from the shared memory according to the test command to obtain parameters corresponding to the test command.

[0039] Optionally, the external instrument is also used for:

[0040] Calling the task setting function from the target dynamic link library and writing the test result into the task setting function;

[0041] Writing the value of the task setting function into the shared memory.

[0042] Optionally, the chip automatic testing equipment is also used for:

[0043] Reading the value of the task setting function from the shared memory;

[0044] The read value of the task setting function is used as the test result.

[0045] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0046] at least one processor; and

[0047] a memory communicatively connected to the at least one processor; wherein,

[0048] The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the chip testing method described in any embodiment of the present invention.

[0049] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the chip testing method described in any embodiment of the present invention when executed.

[0050] According to another aspect of the present invention, a computer program product is provided. The computer program product includes a computer program / instruction. When the computer program / instruction is executed by a processor, the steps of the chip testing method described in any embodiment of the present invention are implemented.

[0051] The chip testing method disclosed in the present invention comprises: obtaining a test command to be executed through a chip automatic test device, calling a function from a target dynamic link library to write the test command and the parameters corresponding to the test command into a shared memory; reading the test command and the parameters corresponding to the test command from the shared memory through an external instrument, performing a test operation according to the test command and the parameters corresponding to the test command and obtaining a test result; calling a function from a target dynamic link library through an external instrument to write the test result into a shared memory; reading the test result from the shared memory through the chip automatic test device; wherein the target dynamic link library is pre-imported into the chip automatic test device and the external instrument. The chip testing method disclosed in the present invention transmits data through a shared memory, which can greatly reduce the time of data transmission between the chip automatic test device and the external instrument compared to the traditional TCP / IP method, improves the test efficiency, and at the same time, the data in the shared memory is not prone to packet loss, which can improve the test stability, and after the dynamic link library is written for the first time, the chip automatic test device and the external instrument only need to be imported to call, without other hardware and software configuration.

[0052] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0053] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0054] Figure 1 is a flow chart of a chip testing method provided according to the first embodiment of the present invention;

[0055] Figure 2 It is a schematic diagram of a data transmission process between a chip automatic test device and an external instrument provided according to the first embodiment of the present invention;

[0056] Figure 3 is a schematic diagram of the structure of a chip testing system provided according to Embodiment 2 of the present invention;

[0057] Figure 4 It is a structural schematic diagram of an electronic device for implementing the chip testing method of the third embodiment of the present invention. DETAILED DESCRIPTION

[0058] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0059] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0060] Embodiment 1

[0061] Figure 1 This is a flowchart of a chip testing method provided in the first embodiment of the present invention. This embodiment is applicable to the case where chip automatic testing equipment and external instruments are used to perform chip testing. The method can be executed by a chip testing system. The chip testing system can be implemented in the form of hardware and / or software. The chip testing system can be configured in an electronic device. Figure 1 As shown, the method includes:

[0062] S110, obtaining a test command to be executed through a chip automatic test device, calling a function from a target dynamic link library to write the test command and parameters corresponding to the test command into a shared memory.

[0063] Among them, chip automatic test equipment (Automatic Test Equipment, ATE) is an automated equipment specially used for chip testing. It evaluates the performance, function and reliability of the chip by performing various tests on the chip to ensure that the chip meets the design requirements. Dynamic Link Library (DLL) is the basis of Windows operating system. Many APIs of the system can be implemented in the form of dynamic link library. The target dynamic link library is a dynamic link library created in advance before chip testing according to the requirements of chip testing, which contains the functions required for chip testing.

[0064] In this embodiment, the modules that realize certain specific functions in the chip testing process can be encapsulated into functions, and then the functions are placed in the target dynamic link library to be called by other functions or codes.

[0065] Specifically, when process A calls a dynamic link library, the dynamic link library is loaded, and the system allocates a virtual memory space corresponding to the dynamic link library and gives the virtual memory space to process A. Based on this virtual memory space, the dynamic link library can map its own code page and data page to the corresponding position of process A. Similarly, if process B is started at this time, it also needs to call the same dynamic link library. The system will also allocate virtual memory space to process B. The dynamic link library will map the code page and data page to the address space of process B based on the existing content of the virtual memory. Therefore, only one copy of the dynamic link library code is needed in the virtual memory space to share it among multiple processes, which makes it possible to realize multi-hardware bus shared memory through the dynamic link library. Just start from the virtual memory space allocated by the system to the dynamic link library and save the data here, then all processes accessing the dynamic link library will share the data.

[0066] In this embodiment, the shared memory corresponds to the target dynamic link library, and the data in the shared memory is defined as readable, writable and shareable data through the target dynamic link library. When performing chip testing, after the chip automatic test equipment obtains the test command to be executed, it can call the function required by the test command from the pre-created target dynamic link library, and write the test command and the parameters corresponding to the test command into the shared memory corresponding to the target dynamic link library.

[0067] Specifically, before performing chip testing, you can first create a target dynamic link library and define the functions therein. The steps are as follows (taking C++ language as an example):

[0068] (1) In the integrated development environment, choose to create a new project.

[0069] (2) Select the appropriate development language and platform in the project, select Dynamic Link Library in the application settings, and click Create.

[0070] (3) In the newly created dynamic link library project, create a new header file and define the import type of the function. At the same time, declare the functions used in the dynamic link library. In addition to the basic data writing and data reading functions, you also need to define instrument operation-related functions according to the types of different chip test instruments. For example, for a signal source instrument, you need to define the waveform output type, waveform output frequency, phase, analog level and other information.

[0071] (4) Create a new source file and define the export type of the function. At the same time, include the header file defined in step (3). Use preprocessing instructions to define multiple sets of shared data and assign initial values. At the same time, use the linker to indicate that the data defined by the preprocessing instructions is readable, writable, and shareable.

[0072] In this embodiment, the target dynamic link library is pre-imported into the chip automatic test equipment and the external instrument.

[0073] Specifically, after the target dynamic link library is created and the functions therein are defined, the target dynamic link library can be imported into the chip automatic test equipment and the plug-in instrument before the chip test is performed, and the steps are as follows:

[0074] (1) In the programming interface of the chip automatic test equipment ATE, create a new project, then create a new header file, and define the import type of the function as, and redeclare all the functions defined in the target dynamic link library. Perform the same operation on the external instrument end.

[0075] (2) In the programming interface of the chip automatic test equipment ATE, based on the newly created project, create a new source file, import the newly created header file in step (1) through the #include keyword, and import the built target dynamic link library through the preprocessing instruction. Perform the same operation on the external instrument end.

[0076] Optionally, the method of calling a function from a target dynamic link library to write a test command and parameters corresponding to the test command into a shared memory may be: calling a task setting function from the target dynamic link library, and writing the test command into the task setting function; calling a target command function from the target dynamic link library according to the test command, and writing the parameters corresponding to the test command into the target command function; and writing the values ​​of the task setting function and the target command function into shared memory.

[0077] Specifically, the task setting function and the target command function are both pre-defined in the target dynamic link library. The task setting function can assign the data passed into the function to the shared data defined in the preprocessing instruction, and the target command function is a function corresponding to a specific chip test command. The test command is a specific chip test command that needs to be executed at present. For example, the task setting function can be pre-defined as Set_task in the target dynamic link library. After the chip automatic test equipment obtains the test command to be executed, the test command can be written into Set_task (for example, if the test command is to send frequency, the string "Send_waveform" can be written into the Set_task function). Then, according to the test command, the target command function is called from the target dynamic link library, and the parameters corresponding to the test command are written into the target command function (for example, if the test command is to set the frequency, the specific frequency value to be set can be written into the corresponding target command function). Finally, the values ​​of the task setting function and the target command function are written into the shared memory.

[0078] Furthermore, a flag function may be predefined in the target dynamic link library to indicate that there is data in the shared memory that needs to be read. For example, a flag function Set_status may be predefined in the target dynamic link library. After the chip automatic test equipment writes the values ​​of the task setting function and the target command function into the shared memory, the value of the Set_status function may be set to 1. When the external instrument reads the value of Set_status as 1, it may read the test command and the corresponding parameters from the shared memory.

[0079] S120, reading the test command and the parameters corresponding to the test command from the shared memory through the external instrument, executing the test operation according to the test command and the parameters corresponding to the test command, and obtaining the test result.

[0080] The external instrument is an external instrument of the chip automatic test equipment, which is used to assist the chip automatic test equipment to complete chip testing. The external instrument in this embodiment has independent software control and cannot be directly controlled by the chip automatic test equipment.

[0081] In this embodiment, after the chip automatic test device writes the values ​​of the task setting function and the target command function into the shared memory, the external instrument can read the test command and the parameters corresponding to the test command from the shared memory, and perform the test operation accordingly to obtain the test result. For example, if the test command is to set the frequency, the external instrument sets the chip frequency according to the specific frequency parameters, and collects the chip frequency as the test result and sends it to the chip automatic test device.

[0082] Optionally, the method of reading the test command and the parameters corresponding to the test command from the shared memory through the plug-in instrument can be: reading the value of the task setting function from the shared memory through the plug-in instrument to obtain the test command; reading the value of the target command function from the shared memory according to the test command to obtain the parameters corresponding to the test command.

[0083] Specifically, when there are test commands and corresponding parameters that need to be read by the external instrument in the shared memory, the external instrument can call the task acquisition function from the target dynamic link library, and then use the task acquisition function to read the test command of the chip automatic test equipment writing task setting function from the shared memory, and then determine the target command function corresponding to the test command according to the test command, and read the value of the target command function from the shared memory. The value of the target command function is the parameter corresponding to the test command. According to the test command and the corresponding parameters, the external instrument can perform the corresponding test operation.

[0084] For example, you can predefine the task acquisition function Get_task in the target dynamic link library, and use the Get_task function to read the test command string written into the task setting function Set_task of the chip automatic test equipment from the shared memory (if the test command is to send frequency, the string written into the Set_task function is "Send_waveform"). After obtaining the test command string, you can obtain the test command by parsing the string.

[0085] Furthermore, according to the predefined flag function in the target dynamic link library that indicates that there is data that needs to be read in the shared memory, the plug-in instrument can be made to loop to determine the value of the flag function, thereby confirming whether it is necessary to read the test command and parameters from the shared memory. For example, the target dynamic link library predefines the flag function Set_status, and the chip automatic test equipment writes the values ​​of the task setting function and the target command function into the shared memory and sets the value of the Set_status function to 1. The plug-in instrument loop determines the function value of Set_status, and when the function value of Set_status is read as 1, it jumps out of the loop to read the test command and parameters from the shared memory, and sets the value of the Set_status function to 0, indicating that the data has been read.

[0086] S130, calling a function from a target dynamic link library through an external instrument to write the test result into a shared memory.

[0087] In this embodiment, after the external instrument performs the test operation according to the test command and the parameters corresponding to the test command and obtains the test result, the test result can be written into the shared memory by calling a function from the target dynamic link library for the chip automatic test equipment to read.

[0088] Optionally, the method of writing the test result into the shared memory by calling a function from the target dynamic link library through the plug-in instrument may be: calling a task setting function from the target dynamic link library through the plug-in instrument, writing the test result into the task setting function; and writing the value of the task setting function into the shared memory.

[0089] Specifically, a task setting function can be predefined in the target dynamic link library. When the plug-in instrument writes the test result into the shared memory, the predefined task setting function can be called from the target dynamic link library to write the test data into the task setting function. For example, if the task setting function is Set_task, the plug-in instrument can assign the test result to the Set_task function. Then the value of the task setting function is written into the shared memory.

[0090] Furthermore, according to the predefined flag function in the target dynamic link library that indicates that there is data that needs to be read in the shared memory, the chip automatic test equipment can be made to loop to determine the value of the flag function, thereby confirming whether it is necessary to read the test result from the shared memory. For example: the target dynamic link library predefines the flag function Set_status, and the chip automatic test equipment sets the value of the Set_status function to 1 after writing the values ​​of the task setting function and the target command function into the shared memory; the external instrument loop determines the function value of Set_status, and when the function value of Set_status is read as 1, it jumps out of the loop to read the test command and parameters from the shared memory, and sets the value of the Set_status function to 0, and then executes the test operation and writes the test result into the shared memory, and then sets the value of the Set_status function to 1, indicating that the test data has been written.

[0091] S140, reading the test result from the shared memory through the chip automatic test equipment.

[0092] In this embodiment, after the external instrument writes the test result into the shared memory, the chip automatic test equipment detects that the data in the shared memory is updated and can read the test result from the shared memory.

[0093] Optionally, the method of reading the test result from the shared memory through the chip automatic test equipment may be: reading the value of the task setting function from the shared memory through the chip automatic test equipment; and using the read value of the task setting function as the test result.

[0094] Specifically, when there are test results in the shared memory that need to be read by the chip automatic test equipment, the chip automatic test equipment can call the task acquisition function from the target dynamic link library, and then use the task acquisition function to read the test results of the task setting function written by the plug-in instrument from the shared memory. For example, the pre-defined task acquisition function in the target dynamic link library is Get_task, and the task setting function is Set_task. The Get_task function can be used to read the value of Set_task from the shared memory, and the value read by the Get_task function is the test result.

[0095] Further, according to the predefined flag function in the target dynamic link library for indicating that there is data to be read in the shared memory, the chip automatic test device can be made to cyclically determine the value of the flag function, thereby confirming whether it is necessary to read the test result from the shared memory. For example: the target dynamic link library predefines the flag function Set_status, and the chip automatic test device writes the values ​​of the task setting function and the target command function into the shared memory, then sets the value of the Set_status function to 1, then waits for tens of milliseconds (adjusted according to the time of the test on the plug-in instrument end), and then cyclically reads the value of the Set_status function; when the plug-in instrument reads that the function value of Set_status is 1, it reads the test command and parameters from the shared memory, and sets the value of the Set_status function to 0, then performs the test operation and writes the test result into the shared memory, and then sets the value of the Set_status function to 1; after the chip automatic test device reads that the value of the Set_status function is 1, it reads the value of the task setting function from the shared memory, obtains the test result, and finally sets the value of the Set_status function to 0, completing the data transmission of this test.

[0096] Figure 2This is a schematic diagram of a data transmission process between a chip automatic test device and an external instrument provided by an embodiment of the present invention. As shown in the figure, before data transmission, the chip automatic test device end (hereinafter referred to as process A) and the external instrument end (hereinafter referred to as process B) both import the target dynamic link library written according to the chip test requirements. After process B starts running, it can read the value of the flag function Set_status by calling the predefined flag acquisition function Get_status from the target dynamic link library. The default value of the flag function Set_status is 0, indicating that there is no data to be read in the shared memory. After process A obtains the test command to be executed, it writes the test command into the predefined task setting function Set_task in the target dynamic link library, and writes the parameters required by the test command into the corresponding target command function. Finally, the values ​​of the task setting function and the target command function are written into the shared memory, and the value of the flag function Set_status is set to 1. After process B reads the function value of Set_status as 1 through Get_status, it calls the predefined task acquisition function Get_task from the target dynamic link library, uses Get_task to read the test command in Set_task from the shared memory, parses the command and further reads the target command function to obtain relevant parameters, and finally sets the value of the flag function Set_status to 0. Process B controls the external instrument to perform corresponding operations according to the test command and parameters. If there is a return value, the return value is assigned to the Set_task function. If there is no return value, the completed instruction is assigned to the Set_task function, and then the Set_status function value is set to 1. After waiting for a period of time (according to the time setting of the external instrument test), it continues to read the function value of Set_status through Get_status. After process A sets the value of the flag function Set_status to 1, it also waits for a while (according to the time setting of the plug-in instrument test), and then calls the Get_status function from the target dynamic link library to read the value of the flag function Set_status. When the function value of Set_status is 1, it calls the Get_task function to read the function value of Set_task in the shared memory, obtains the test result written by process B, and finally sets the Set_status function value to 0. This continues until this round of data transfer is completed.

[0097] The chip testing method disclosed in the present invention first obtains the test command to be executed through the chip automatic test equipment, calls the function from the target dynamic link library to write the test command and the parameters corresponding to the test command into the shared memory; then reads the test command and the parameters corresponding to the test command from the shared memory through the external instrument, performs the test operation according to the test command and the parameters corresponding to the test command and obtains the test result; then calls the function from the target dynamic link library through the external instrument to write the test result into the shared memory; finally reads the test result from the shared memory through the chip automatic test equipment; wherein the target dynamic link library is pre-imported into the chip automatic test equipment and the external instrument. The chip testing method disclosed in the present invention transmits data through the shared memory, which can greatly reduce the time of data transmission between the chip automatic test equipment and the external instrument compared with the traditional TCP / IP method, improves the test efficiency, and the data in the shared memory is not prone to packet loss, which can improve the test stability, and after the dynamic link library is written for the first time, the chip automatic test equipment and the external instrument only need to be imported to call, without other hardware and software configuration.

[0098] Embodiment 2

[0099] Figure 3 A schematic diagram of the structure of a chip testing system provided in the second embodiment of the present invention is shown in FIG. Figure 3 As shown, the system includes: chip automatic testing equipment 310 and external instrument 320.

[0100] The chip automatic test equipment 310 is used to obtain the test command to be executed, and call the function from the target dynamic link library to write the test command and the parameters corresponding to the test command into the shared memory.

[0101] The external instrument 320 is used to read the test command and the parameters corresponding to the test command from the shared memory, execute the test operation according to the test command and the parameters corresponding to the test command and obtain the test result, and call the function from the target dynamic link library to write the test result into the shared memory.

[0102] The chip automatic test equipment 310 is used to read the test result from the shared memory.

[0103] The target dynamic link library is pre-imported into the chip automatic test equipment 310 and the external instrument 320 .

[0104] Optionally, the shared memory corresponds to a target dynamic link library, and the target dynamic link library defines data in the shared memory as readable, writable, and shareable data.

[0105] Optionally, the chip automatic test equipment 310 is also used for:

[0106] Call the task setting function from the target dynamic link library and write the test command into the task setting function; call the target command function from the target dynamic link library according to the test command and write the parameters corresponding to the test command into the target command function; write the values ​​of the task setting function and the target command function into the shared memory.

[0107] Optionally, the external instrument 320 is also used for:

[0108] The value of the task setting function is read from the shared memory to obtain the test command; the value of the target command function is read from the shared memory according to the test command to obtain the parameters corresponding to the test command.

[0109] Optionally, the external instrument 320 is also used for:

[0110] Call the task setting function from the target dynamic link library, write the test result into the task setting function; write the value of the task setting function into the shared memory.

[0111] Optionally, the chip automatic test equipment 310 is also used for:

[0112] The value of the task setting function is read from the shared memory; the value of the task setting function is used as the test result.

[0113] The chip testing system provided in the embodiment of the present invention can execute the chip testing method provided in any embodiment of the present invention, and has the corresponding functional modules and beneficial effects of the execution method.

[0114] Embodiment 3

[0115] Figure 4 A schematic diagram of the structure of an electronic device 10 that can be used to implement an embodiment of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0116] like Figure 4As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0117] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0118] The processor 11 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 performs the various methods and processes described above, such as a chip testing method.

[0119] In some embodiments, the chip testing method may be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the chip testing described above may be performed. Alternatively, in other embodiments, the processor 11 may be configured to perform the chip testing method in any other appropriate manner (e.g., by means of firmware).

[0120] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0121] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0122] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in combination with an instruction execution system, device or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0123] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0124] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0125] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0126] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0127] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A chip testing method, characterized in that: The method comprises: Obtaining a test command to be executed through a chip automatic test device, calling a function from a target dynamic link library to write the test command and parameters corresponding to the test command into a shared memory; Reading the test command and the parameters corresponding to the test command from the shared memory through an external instrument, executing a test operation according to the test command and the parameters corresponding to the test command, and obtaining a test result; Calling a function from the target dynamic link library through the external instrument to write the test result into the shared memory; Reading the test result from the shared memory through the chip automatic test equipment; The target dynamic link library is pre-imported into the chip automatic test equipment and the external instrument.

2. The method according to claim 1, characterized in that The shared memory corresponds to the target dynamic link library, and the target dynamic link library defines data in the shared memory as readable, writable and shareable data.

3. The method according to claim 2, characterized in that Calling a function from a target dynamic link library to write the test command and the parameters corresponding to the test command into a shared memory includes: Calling a task setting function from the target dynamic link library and writing the test command into the task setting function; Calling a target command function from the target dynamic link library according to the test command, and writing parameters corresponding to the test command into the target command function; The values ​​of the task setting function and the target command function are written into the shared memory.

4. The method according to claim 3, characterized in that Reading the test command and the parameters corresponding to the test command from the shared memory through the external instrument includes: Reading the value of the task setting function from the shared memory through the external instrument to obtain the test command; The value of the target command function is read from the shared memory according to the test command to obtain parameters corresponding to the test command.

5. The method according to claim 3, characterized in that: Calling a function from the target dynamic link library through the external instrument to write the test result into the shared memory includes: Calling the task setting function from the target dynamic link library through the plug-in instrument, and writing the test result into the task setting function; Writing the value of the task setting function into the shared memory.

6. The method according to claim 5, characterized in that Reading the test result from the shared memory by the chip automatic test equipment includes: Reading the value of the task setting function from the shared memory through the chip automatic test equipment; The read value of the task setting function is used as the test result.

7. A chip testing system, characterized in that: include: Chip automatic testing equipment and external instruments; The chip automatic test equipment is used to obtain a test command to be executed, and call a function from a target dynamic link library to write the test command and parameters corresponding to the test command into a shared memory; The external instrument is used to read the test command and the parameters corresponding to the test command from the shared memory, perform the test operation according to the test command and the parameters corresponding to the test command and obtain the test result, and call the function from the target dynamic link library to write the test result into the shared memory; The chip automatic test equipment is used to read the test result from the shared memory; The target dynamic link library is pre-imported into the chip automatic test equipment and the external instrument.

8. An electronic device, characterized in that: The electronic device comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can perform the chip testing method according to any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the chip testing method according to any one of claims 1 to 6 when executed.

10. A computer program product comprising a computer program / instructions, characterized in that When the computer program / instructions are executed by a processor, the steps of the chip testing method according to any one of claims 1 to 6 are implemented.

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