System and method for detecting defects of insulating layer of electromagnetic wire

Abstract

A flaw detection system for use with an electrical wire includes an outer housing and a detection assembly located within the housing. The detection assembly includes a plurality of emitters and a plurality of detectors positioned around an inspection area through which the wire passes. Each pair of adjacent emitters is spaced not more than 30 degrees, and each of the plurality of detectors is positioned across the examination region with the corresponding emitter. Each transmitter is configured to transmit a signal measured by a corresponding detector, and the detection assembly is configured to detect one or more defects on the surface of the wire based on a change in the signal measured by one or more of the plurality of detectors.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims priority to U.S. Provisional Application No. 63 / 350,235, filed on June 8, 2022, entitled “SYSTEM AND METHOD FOR DETECTING DEFECTS IN ELECTROMAGNET WIRE INSULATION,” the contents of which are incorporated herein by reference in their entirety. Technical Field

[0003] Embodiments of the present disclosure generally relate to systems, devices, and methods for detecting defects in insulation layers of magnet wires, and more particularly, to systems, devices, and methods for non-contact and online detection of defects in insulation layers of magnet wires having different cross-sectional shapes. Background Art

[0004] Magnet wire, also known as winding wire or magnetic winding wire, is used in a variety of motors and devices, such as inverter drive motors, motor starter generators, transformers, etc. Magnet wire typically includes an insulating layer, such as a polymeric enameled wire insulation, formed around a center conductor. The enameled wire insulation is formed by brushing a varnish onto the wire and then curing the varnish in an oven to remove the solvent, thereby forming a thin layer of enameled wire. This process is repeated until the desired enameled wire structure or thickness is achieved. In the process of forming the enameled wire or other insulating layers, undesirable surface cracks or defects, such as enameled wire blisters or protrusions, may be inadvertently formed. In some cases, defects can reduce the performance of the magnet wire or cause premature failure of the magnet wire insulation.

[0005] During magnet wire production, it is desirable to inspect the magnet wire insulation for surface cracks or defects. Several conventional wire inspection systems have been developed. Some systems utilize spring-loaded guide rollers and identify defects based on the movement of the guide rollers; however, these systems require contact with the wire and may cause damage to the insulation. Detecting relatively small defects with a guide roller system can also be very difficult. Other conventional systems direct a laser onto the wire and utilize a complementary oxide semiconductor ("CMOS") or similar sensor to detect light reflected from the wire. Defects are identified based on detecting changes in the reflected light. However, systems utilizing lasers and CMOS sensors can be very expensive. Other optical inspection systems direct light onto the wire and detect defects based on how the light is scattered from the wire or how the amount of light detected changes.

[0006] Known conventional detection systems (e.g., conventional laser detection systems, optical detection systems, and guide roller systems) are unable to detect defects on all portions of the outer surface of an electromagnetic wire. For example, conventional systems can only detect defects on the flat side of a rectangular electromagnetic wire. Conventional systems typically include only two detection axes capable of inspecting the flat surface of a rectangular wire. However, rectangular or shaped electromagnetic wires typically include a flat side and rounded or shaped corners. Due to the flow of varnish when coating the wire, defects may occur at the rounded corners of a rectangular wire. Conventional detection systems are unable to inspect and detect defects on the bending radius of the wire corners, which may result in the production and sale of unqualified electromagnetic wires. Therefore, there is a need for improved systems, devices, and methods for detecting defects in the insulation layer of an electromagnetic wire. In addition, there is a need for improved systems, devices, and methods that facilitate non-contact and online detection of relatively small defects in electromagnetic wires having different cross-sectional shapes. BRIEF DESCRIPTION OF THE DRAWINGS

[0007] The detailed description is set forth with reference to the accompanying drawings. In the drawings, the left-most digit of a reference number identifies the drawing in which the reference number first appears. The use of the same reference number in different drawings indicates similar or identical items; however, various embodiments may utilize elements and / or components that differ from those shown in the drawings. In addition, the drawings are provided to illustrate example embodiments described herein and are not intended to limit the scope of the present disclosure.

[0008] Figure 1A A perspective view is shown of an example system for detecting defects in magnet wire insulation, according to an illustrative embodiment of the present disclosure.

[0009] Figure 1B Show Figure 1A Exploded perspective view of an example system.

[0010] Figure 1C Show Figure 1A An end view of an example system.

[0011] Figure 1D Show Figure 1A Figure 2. Top view of an example system.

[0012] Figure 1E Show Figure 1A Side view of an example system.

[0013] Figure 1F Show Figure 1A A cutaway perspective view of a portion of an example system.

[0014] Figure 1G Show Figure 1A A top view of a portion of an example system.

[0015] Figure 1H Show Figure 1AA cross-sectional view of a portion of an example system.

[0016] Figure 2A A perspective view is shown of an example inspection assembly that may be incorporated into a flaw inspection system according to an illustrative embodiment of the present disclosure.

[0017] Figure 2B Show Figure 2A A side view of an example detection assembly.

[0018] Figure 2C Show Figure 2A A cross-sectional view of an example detection assembly.

[0019] Figure 2D Shown can be combined with FIG. 2A to FIG. 2C Schematic cross-sectional view of an example optical ring in a detection assembly.

[0020] Figure 3 A schematic diagram showing an example emitter and detector pair that may be incorporated into a detection assembly according to an illustrative embodiment of the present disclosure.

[0021] Figure 4 A perspective schematic diagram shows a detector that may be incorporated into a detection assembly according to an illustrative embodiment of the present disclosure.

[0022] Figure 5 A cross-sectional view of an example rectangular magnet wire that may be inspected by a defect detection system according to an illustrative embodiment of the present disclosure is shown.

[0023] Figure 6 An example detection signal that may be generated by a detector of a flaw detection system is shown according to an illustrative embodiment of the present disclosure.

[0024] Figure 7 A perspective view is shown of an example protective sleeve that may be used to feed wires into a defect detection system according to an illustrative embodiment of the present disclosure.

[0025] Figures 8A-8B Another example protective sleeve that may be used in conjunction with a flaw detection system is shown in accordance with an illustrative embodiment of the present disclosure.

[0026] Fig. 9 A flow chart depicting an example method for inspecting magnet wire using a non-contact flaw detection system is shown in accordance with an illustrative embodiment of the present disclosure. DETAILED DESCRIPTION

[0027] Certain embodiments of the present disclosure relate to systems and devices for online non-contact detection of defects or flaws in electromagnetic wires. The defect detection system may include a detection assembly positioned within a housing. The detection assembly may include a plurality of emitters (e.g., light emitting diodes, etc.) and a plurality of detectors (e.g., photodiodes, etc.), the plurality of emitters being configured to project corresponding light signals onto and through the electromagnetic wire, and each of the plurality of detectors being separately configured to detect the light signal of the corresponding emitter. The detection assembly may identify defects in the insulation layer of the electromagnetic wire based on detecting changes in the amplitude of light received by one or more detectors. Any number of emitter and detector pairs may be incorporated into the detection assembly as desired, such as twelve emitter and detector pairs that allow inspection of the electromagnetic wire along twelve axes.

[0028] According to one aspect of the present disclosure, the transmitters may be spaced apart along the ring or positioned at different points along the ring, and the electromagnetic wire to be inspected may pass approximately through the center of the ring. In addition, each group of adjacent transmitters may be spaced apart from each other along the ring so that the detection system can identify defects on any portion of the outer surface of the electromagnetic wire. For example, the transmitters may be spaced apart by approximately 15 degrees along the circumference or perimeter of the ring. In certain embodiments, the transmitters may be spaced apart so that defects may be identified on any portion of the outer surface of a rectangular electromagnetic wire having rounded corners or curved corners. For typical sizes and configurations of shaped rectangular wires, it has been found that the transmitters should be spaced no more than 17 degrees apart to adequately detect defects having a magnitude as small as 20 microns (e.g., defects less than 22 microns, defects less than 25 microns, etc.) on any portion of the outer surface of the wire (i.e., flat surfaces and rounded corners).

[0029] The detection system may include a variety of other suitable components as desired. In some embodiments, the detection system may include one or more wire guides (e.g., guide rollers, etc.) configured to position the electromagnetic wire for inspection within the detection assembly. In some embodiments, one or more suitable mounting rails may facilitate positioning the detection system on an electromagnetic wire production line so that defect detection can be performed in an in-line manner. In some embodiments, the detection system may include one or more suitable air ducts or ventilation components that facilitate removal of unwanted debris within the detection system and / or cooling of internal components.

[0030] Other embodiments of the present disclosure relate to methods for detecting defects in electromagnetic wires online and contactlessly. A plurality of emitters (e.g., light emitting diodes, etc.) and corresponding detectors may be arranged and positioned along the periphery of a ring. In certain embodiments, the emitters may be spaced apart by no more than 30 degrees, such as spaced apart by no more than 17 degrees or spaced apart by approximately 15 degrees. Each detector may be spaced apart from a corresponding emitter on the ring. The electromagnetic wire may pass roughly through the center of the ring. When the electromagnetic wire passes through the ring, the emitters may each continuously project a corresponding light signal onto the wire and pass through the wire, and the corresponding detectors may each detect the light signal of the corresponding emitter. Based on changes in the amplitude of light received by one or more detectors, defects or flaws in the insulation layer of the electromagnetic wire may be identified. Defects may be counted over the desired longitudinal length of the wire as desired, and any number of suitable alarms or warnings may be generated.

[0031] Embodiments of the present disclosure will now be described more fully hereinafter with reference to the accompanying drawings, in which certain embodiments of the present disclosure are shown. However, the present invention may be implemented in many different forms and should not be construed as limited to the embodiments set forth herein; rather, these embodiments are provided so that the present disclosure will be thorough and complete and will fully convey the scope of the invention to those skilled in the art. The same numbers refer to the same elements throughout.

[0032] Figure 1A-1H An example defect detection system 100 is depicted that can be used to inspect and detect defects in magnet wire insulation in an online and non-contact manner. Specifically, Figure 1A shows a perspective view of system 100; Figure 1B An exploded perspective view showing components of system 100; Figure 1C An end view of the system is shown; Figure 1D A top view of the system 100 is shown; Figure 1E A side view of the system 100 is shown; Figure 1F A cutaway view of a portion 175 of the system 100 (the portion of the system 100 defined by the housing 105 excluding the mounting rails and wire guides) is shown; Figure 1G A top view showing a portion 175 of the system 100; and Figure 1H A cross-sectional view of a portion 175 of the system 100 is shown, taken along line AA'. Figure 1A-1H The example system 100 is described in detail.

[0033] The defect detection system 100 may include at least one housing 105, a mounting rail 110, and a detection assembly 115. Figure 1F and Figure 1HAs shown, the detection assembly 115 can be positioned within the housing 105. The housing 105 can provide a variety of benefits, including, but not limited to, protecting one or more internal components of the system 100 from physical damage, preventing or limiting dust or debris from damaging one or more internal components, and / or shielding one or more internal components from electrical noise or electrical interference. In some embodiments, the housing 105 can be formed from a single or unitary component and, as desired, can include one or more access panels or other features that allow access to the internal components of the system 100. In other embodiments, the housing 105 can include multiple components that are selectively attached or connected to each other (e.g., to facilitate access to the internal components to set up or perform maintenance on the system 100). The housing 105 can include any suitable number of components, as desired. For example, Figure 1A-1H As depicted, housing 105 may include top 105A and two sides 105B, 105C. Components 105A-C may be connected together via any suitable attachment means, such as bolts, clips, etc. In other embodiments, housing 105 may include more or less than three components.

[0034] The housing 105 can be formed of a variety of suitable materials and / or combinations of materials. For example, the housing 105 can be formed of a metal material (e.g., steel, etc.), a metal alloy, a plastic (e.g., ABS plastic, polycarbonate, etc.), etc. As required, the components 105A-C can all be formed of the same material, or alternatively, at least two components 105A-C can be formed of different materials. In addition, the housing 105 can be formed with a variety of suitable sizes (e.g., length, width, height, cross-sectional area, etc.). In some embodiments, the size of the housing 105 can be based at least in part on the size of the electromagnetic wire to be evaluated by the system 100. For many conventional sizes of electromagnetic wire, the system 100 can be designed to have a relatively small size, thereby allowing the system 100 to be easily installed in a relatively small space of the electromagnetic wire production line. For example, the system 100 can occupy a volume of about one cubic foot (0.028 cubic meters) or less. Therefore, the size of the housing 105 can be appropriately set to fit within a small footprint of the entire system 100. In one example embodiment, housing 105 may have a width "W1" of approximately 7.5 inches (190.5 mm), a longitudinal length "L1" of approximately 9.5 inches (241.3 mm), and a height "H1" of approximately 10.969 inches (278.61 mm). Additionally, system 100 may have a width "W2" of approximately 13 inches (330.2 mm), a longitudinal length "L2" of approximately 24.0 inches (609.6 mm), and a height "H2" of approximately 11.29 inches (286.77 mm). In other embodiments, different dimensions may be used to accommodate other wire sizes or to accommodate evaluation of insulation components other than magnet wire.

[0035] The mounting rail 110 can facilitate installation or positioning of the system 100 within a manufacturing environment, such as in a magnet wire production line. Other components of the system 100, such as the housing 105 and any suitable number of wire guides 140A-D, can be attached to the mounting rail 110 via any suitable attachment means, such as bolts, clips, brackets, etc. The mounting rail 110 can include any suitable number of components as desired. Figures 1A to 1E As shown, the mounting rail 110 may include a base or bottom rail 110A and two top rail sections 110B, 110C that may be attached to the bottom rail 110A. Other numbers of components may be used in other embodiments. In other embodiments, the system 100 may include other types of mounting brackets (e.g., brackets fixed to a housing, etc.) or other suitable components as an alternative to the mounting rail 110.

[0036] In some embodiments, the housing 105 can be fixed or attached to the bottom rail 110A. In addition, the bottom rail 110A can facilitate the installation of the system 100 on the wire production line. The system 100 can be oriented in any suitable direction of the wire production line, such as horizontally or vertically. The top rail sections 110B, 110C can be attached to the bottom rail 110A via any suitable attachment assembly (e.g., bolts, pins, clips, etc.), such as the mounting plates 120A-D shown. As shown, the first top rail section 110B can be positioned adjacent to the first end of the housing 105, and the second top rail section 110C can be positioned adjacent to the second end or opposite end of the housing 105. The top rail sections 110B, 110C can facilitate the selective positioning of the wire guides 140A-D on the opposite ends of the housing 105. Additionally, top rail segments 110B, 110C (and any components mounted thereon) may be selectively removed from or selectively moved along bottom rail 110A to facilitate access to other components of system 100 (e.g., detection assembly 115) and / or to facilitate threading or positioning of magnet wire within system 100. As shown, mounting plates 120A-D (or other suitable attachment components) may be removed to remove top rail segments 110B, 110C or to reposition (e.g., slide, etc.) top rail segments 110B, 110C along the length of bottom rail 110A.

[0037] The mounting rail 110 and / or the mounting brackets 120A-D may be formed of a variety of suitable materials and / or combinations of materials. For example, the mounting rail 110 and / or the mounting brackets 120A-D may be formed of metal materials (e.g., steel, etc.), metal alloys, plastics (e.g., ABS plastic, polycarbonate, etc.), etc. In addition, the mounting rail 110 and / or the mounting brackets 120A-D may be formed with a variety of suitable dimensions (e.g., length, width, height, cross-sectional area, etc.).

[0038] Continuing with reference to system 100, the detection assembly 115 can be mounted within the housing 105 using a variety of suitable components. For example, end caps 125A, 125B can be positioned on opposite ends of the detection assembly 115. The end caps 125A, 125B can be part of the housing 105 or can be fixed to the housing 105, and the detection assembly 115 can be directly or indirectly fixed to the end caps 125A, 125B. In certain embodiments, one or more suitable spacers 130A, 130B can be positioned between the end caps 125A, 125B and the detection assembly 115. As shown, a single spacer is positioned on opposite ends of the detection assembly 115; however, other numbers of spacers (or no spacers) can also be used. The end caps 125A, 125B and the spacers 130A, 130B can have any suitable size and / or be formed of any suitable material, such as a metallic material, a metal alloy, a plastic, etc.

[0039] The system 100 may optionally include any suitable number of wire guides that facilitate keeping the wires in a desired position within the detection assembly 115 for inspection. As shown, the system 100 may include a plurality of wire guide rollers, such as horizontal guide rollers 140A, 140C, respectively positioned on opposite ends of the housing 105 and vertical guide rollers 140B, 140D, respectively positioned on opposite ends of the housing 105. Other suitable types of wire guides (e.g., molds, funnels, etc.) may be used in other embodiments and will be understood by those skilled in the art. As shown, the guide rollers 140A-D may be mounted or fixed to the top rail sections 110B, 110C, thereby allowing the guide rollers 140A-D to be selectively removed or repositioned. In other embodiments, the guide rollers 140A-D (and / or other wire guides) may be positioned within the housing 105.

[0040] The guide rollers 140A-D can facilitate guiding and maintaining the position of the wire as the wire travels through the detection assembly 115. For example, when the wire enters the detection assembly 115, the first horizontal roller 140A can assist in maintaining the horizontal position of the wire, and the first vertical roller 140B can assist in maintaining the vertical position of the wire. Similarly, when the wire leaves the detection assembly 115, the second horizontal roller 140C can assist in maintaining the horizontal position of the wire, and the second vertical roller 140D can assist in maintaining the vertical position of the wire. As a result, the wire can pass through the desired area of ​​the detection assembly 115 to facilitate inspection of defects in the insulation layer of the wire. It should be understood that the functions of the horizontal rollers and the vertical guide rollers can be reversed or otherwise changed depending on the positioning of the system 100 in the wire production line (e.g., vertical positioning, horizontal positioning, etc.). Reference to the horizontal and vertical guide rollers is merely for the convenience of understanding of this article.

[0041] With reference to one of the guide rollers (e.g., the first horizontal roller 140A), the guide roller (commonly referred to as roller 140) may include a pair of rollers 145A, 145B, and the wire may be positioned between the two rollers 145A, 145B. In some embodiments, the first roller 145A may have a fixed position, and the second roller 145B may be spring mounted. As a result, wires of different sizes may be positioned within the guide roller 140. In other embodiments, other suitable devices may be utilized to adjust and fix the position of the rollers 145A, 145B to accommodate different wire sizes. In addition, the rollers 145A, 145B may be formed of a variety of suitable materials, such as metal materials (e.g., hardened steel, etc.), metal alloys, plastics, etc.

[0042] In some embodiments, guide rollers 140A-D may be mounted directly on or fixed to top rail segments 110B, 110C. In other embodiments, guide rollers 140A-D may be fixed to mounting blocks 150A, 150B, which are attached to top rail segments 110B, 110C. For example, first vertical guide roller 140A and first horizontal guide roller 140B may be attached to first mounting block 150A, and first mounting block 150A may be attached to first top rail segment 110B. Similarly, second vertical guide roller 140C and second horizontal guide roller 140D may be attached to second mounting block 150B, and second mounting block 150B may be attached to second top rail segment 110C. The mounting blocks 150A, 150B may serve as spacers that assist in the proper positioning of the guide rollers 140A-D at the inlet and outlet of the detection assembly 115 .

[0043] The detection component 115 can evaluate the wires passing through it in a non-contact and online manner (for example, when (multiple) insulation layers are formed on the wires), and detect or identify defects or flaws on the surface of the wires or on the surface of the wire insulation layer. For example, the detection component 115 can identify bubbles protruding from the surface of the enameled wire or other wire insulation layer. According to aspects of the present disclosure, the detection component may include a plurality of emitters (such as light emitting diodes, laser LEDs, etc.) and a plurality of detectors (such as photodiodes, etc.), the plurality of emitters being configured to project corresponding light signals onto and through the electromagnetic wires, and each of the plurality of detectors being separately configured to detect the light signal output by the corresponding emitter. Figure 1H Several example emitters 180A-C and detectors 185A-C are shown in a cross-sectional view of . The detection assembly 115 can identify defects in the insulation layer of the electromagnetic wire based on detecting changes in the amplitude of light received by one or more detectors. The use of light emitting diodes ("LEDs") and photodiodes in the detection assembly 115 can result in the system 100 having lower costs than conventional detection systems (e.g., detection systems using lasers and CMOS sensors, etc.) and / or the system 110 having relatively low voltage requirements and / or power consumption (e.g., approximately 5 watts or less of power consumption). For example, the system 100 can operate at low voltages (e.g., 15 VDC, 12 VDC, etc.). In other embodiments, the detection assembly 115 may include other types of emitters and detectors, such as lasers and CMOS sensors, etc.

[0044] Each emitter (generally referred to as emitter 180) can be configured to emit or project a variety of suitable optical signals. For example, each emitter 180 can include a light emitting diode ("LED") configured to emit light at approximately 700 nm. Other suitable wavelengths of light can also be used as desired. In addition, as described below with reference to Figure 3 As explained in more detail, the light from the emitters 180 can be focused on a desired area via any suitable number of filtering devices and / or lenses. Each detector (generally referred to as detector 185) can be configured to detect light from a corresponding emitter 180. For example, each detector 185 can include a photodiode that focuses on a wavelength of light associated with the emitter 180 (e.g., 700 nm, etc.). As described below with reference to Figure 3 and Figure 4 As explained in more detail, the signal received by detector 185 may be focused using any suitable number of filtering devices (eg, slit plates, etc.).

[0045] Any number of emitter and detector pairs may be incorporated into the detection assembly 115, such as twelve emitter and detector pairs that allow inspection of the electromagnetic wire along twelve axes. In various embodiments, the detection assembly 115 may include 6, 8, 9, 10, 12, 14, 15, or more numbers of emitter and detector pairs. In addition, the detection assembly 115 may be configured to inspect the electromagnetic wire via any suitable number of axes. According to aspects of the present disclosure, the emitter and detector pairs may be spaced around the periphery of the inspection area 190 within the detection assembly 115, and the electromagnetic wire may pass through the inspection area 190. For example, the emitters may be spaced along a ring or circle or positioned at different points along the ring or circle, and the electromagnetic wire to be inspected may pass approximately through the center of the ring. In some embodiments, the emitter and detector pairs positioned within the ring or along the circumference of the ring may be referred to as an optical ring. In other embodiments, the emitter and detector pairs may be positioned along the periphery of a shape other than a circle (e.g., an ellipse, etc.), and the data signals measured by the various detectors may be processed accordingly to detect defects.

[0046] In some embodiments, the emitters may be positioned completely around the optical ring. In other embodiments, such as Figure 2D As shown, the emitters may occupy approximately 180 degrees around the optical ring. The detectors may then occupy approximately 180 degrees around the other half of the optical ring, such that each detector is positioned across the optical ring with a corresponding emitter. In certain embodiments, each emitter may direct a light beam onto and through the electromagnetic wire such that light passes on either side of the wire. As a result, a single light beam may facilitate inspection of two opposing portions of the outer surface of the wire (e.g., top and bottom surfaces, left and right surfaces, opposing corners, etc.).

[0047] In addition, each set of adjacent emitters can be spaced apart from one another along the ring so that the detection system 115 can identify defects on any portion of the surface of the electromagnetic wire. For example, the emitters can be spaced apart by approximately 15 degrees along the circumference or perimeter of the optical ring. The detection system 115 can be used to evaluate electromagnetic wires having any suitable cross-sectional shape, such as circular, rectangular, triangular, elliptical, hexagonal, or octagonal cross-sectional shapes, or any cross-sectional shape having a convex geometry. In certain embodiments, the emitters can be spaced apart so that defects can be identified on any portion of the surface of an electromagnetic wire having any suitable cross-sectional shape. For example, the emitters can be spaced apart so that defects can be identified on any portion of the surface of a rectangular electromagnetic wire having rounded corners or curved corners.

[0048] Typically, rectangular magnet wires used in certain applications (e.g., automotive applications, etc.) can have short sides between about 1.0 mm and about 3.0 mm and long sides between about 2.0 mm and about 5.0 mm. In other embodiments, the rectangular wire can have sides between 0.2 mm and 20 mm. In addition, the corners of the magnet wire can account for any suitable percentage of the (multiple) sides of the wire. For example, the curved corners can be located in the last 1-50% of the length of a given side (i.e., the portion of the length that would result in an actual rectangle without curved corners), such as in the last 1-25%, 1-10%, or 1-5% of the length of a given side. These sides include the short sides (or thick sides) and the long sides (or flat sides) of the rectangular wire. Based on the difference in the length of the sides, a given angle can account for a first percentage of a first side (e.g., 1-50% of the short side) while accounting for a second percentage of a second side (e.g., a flat side or a long side). In some embodiments, the wire can include four flat sides and four corresponding rounded corners or curved corners. In other embodiments, the wire may include a flat top and bottom with completely rounded or curved sides (or thickness). In addition, a given corner may be formed with any suitable bend radius. In other words, the circle defining the curve within the corner may have any suitable radius. For typical sizes and configurations of shaped rectangular wires, it has been found that the emitters should be spaced no more than 17 degrees apart (e.g., 17 degrees around the optical ring, 17 degrees along a circle or perimeter formed around the inspection area) to adequately detect defects on any portion of the outer surface of the wire (i.e., flat surfaces and rounded corners), where the defects have a magnitude as small as 20 microns (e.g., protrusions from the outer surface of the wire) (e.g., defects or flaws less than 22 microns, 25 microns, etc.). In other embodiments, adequate detection may be achieved using emitters spaced less than 17 degrees apart or spaced more than 17 degrees apart. For example, in some embodiments, the emitters in the optical ring may be spaced no more than 10, 12, 15, 17, 20, 25, or 30 degrees apart.

[0049] In some embodiments, the emitter and detector pairs can all be positioned at approximately the same cross-sectional locations along the longitudinal length of the detection assembly 115. In other embodiments, at least two emitter / detector pairs can be positioned at different cross-sectional locations along the longitudinal length of the detection assembly 115. For example, each pair can be positioned at a different longitudinally spaced location. In other embodiments, groups of pairs can be located at longitudinally spaced locations. For example, triplets of emitter / detector pairs can be positioned at longitudinally spaced locations. For a detection assembly 115 comprising twelve emitter / detector emitter / detector pairs, four triplets of pairs can be positioned at four longitudinally spaced locations. As a result of the longitudinally spaced emitter / detector pairs or groupings of pairs, the optical ring can be formed to have a smaller diameter and / or the volume of the system 100 can be reduced. See below for details. Figures 2A-2DAn example of the detection assembly 115 and its optical ring is described in more detail. Figure 3 and Figure 4 The operation of an example emitter and detector pair is explained in more detail.

[0050] Continue to refer Figures 1A-1H , the system 100 may optionally include one or more air ducts, such as air duct 155. The air duct 155 may facilitate the supply or input of pressurized air into the housing 105 via a suitable ventilation system or air supply device (not shown). The pressurized air may assist in removing and / or keeping debris outside the housing 105. As a result, the internal components of the system 100 (e.g., the optical ring of the detection component 115) may be maintained in better working condition and kept clean. In addition, the pressurized air may assist in cooling one or more internal components of the system 100, such as internal computing devices (e.g., circuit boards, electronic boards, microcontrollers, etc.), transmitters, etc. As desired, any number of suitable cooling or air flow channels may be incorporated into the housing and / or various internal components of the system 100 to facilitate cooling. In addition to or as an alternative to using the air duct 155, any number of other suitable cooling devices may be incorporated into the system 100, such as one or more fluid flow channels, heat synchronizers, etc.

[0051] The housing 105 may also include any suitable number of openings, slots, or access areas, such as the slot 160 shown, to facilitate feeding one or more cables or wires to the system 100 and / or internal components of the system 100. For example, one or more power and / or control cables may be fed through the slot 160 or other suitable openings. In some embodiments, a suitable cable feedthrough 165 or connector block may be applied to cover the slot 160, prevent debris from entering the housing 105, and / or provide a mechanical connection point for one or more cables. For example, a cable may be connected to the feedthrough 165 on the outside of the housing 105, and a corresponding internal cable may be connected to an internal component (e.g., a computing device, etc.) of the system 100 from the inside of the feedthrough 165. In this regard, if the system 100 is moved or if an external force is applied to the system 100, the internal cable is less likely to be disconnected. In other embodiments, cables and / or wires may be fed to and from the system 100 via a sealing gasket or other sealing assembly.

[0052] The system 100 may include any suitable number of computing devices to control the operation of the system 100. A variety of suitable computing devices may be used as desired, such as circuit boards, programmable logic arrays, microcontrollers, microcomputers, etc. Alternatively, the system 100 may be controlled via one or more external computing devices that communicate with various components of the system 100. The computing device may perform a variety of suitable operations as desired, including, but not limited to, determining wire size or establishing a baseline for wires to be inspected, providing control signals to emitters and detectors, receiving data from detectors, processing and evaluating received data, identifying defects, counting defects, determining the size of defects, generating suitable alarms or output signals, and / or communicating with any suitable number of external devices or systems. In an example embodiment, the computing device may be configured to receive a variety of signals or data, such as line speed input, one or more thresholds (e.g., defect amplitude thresholds, defect count thresholds, etc.), one or more reset signals, etc. Based on its calculations and processing, the computing device may be configured to output any number of suitable signals, such as one or more identified defect counts (e.g., counts of different defect sizes), defect amplitudes, defect longitudinal lengths, identification information of the emitter / detector pair that identified the defect, handshake signals, etc. The computing system may also be configured to store various suitable data, such as count data of one or more sizes of defects (e.g., small, medium, large, etc.), etc. In addition to the one or more computing devices, the system 100 may also include various suitable noise filter circuits to facilitate improved detection within the detection assembly 115.

[0053] The system 100 can provide a variety of benefits or advantages over existing electromagnetic wire detection systems. First, the system 100 can have a relatively small size (e.g., small volume, small footprint, etc.), which allows the system to be installed in a variety of locations and / or any suitable direction or orientation (e.g., horizontal, vertical, etc.) on the wire. Due to the use of relatively inexpensive LED emitters and photodetectors, the system 100 can also have a lower cost than certain conventional detection systems (such as detection systems using lasers and CMOS sensors). It may also be relatively easy to repair the components and optical rings of the system 100 from a time and cost perspective. If one or more of the emitters / detectors are inoperable, the system 100 can also be able to continue to operate and detect defects in the wire. For example, even if there may be one or more blind spots in the inspection area 190 and / or the minimum size of the detectable defect may increase, the system 100 can be used with less than twelve emitter / detector pairs.

[0054] In operation, the system 100 can evaluate or inspect the wire in a non-contact and non-destructive manner. The system 100 can also be operated in an online manner, for example, when producing the magnet wire. In addition, the system 100 can be able to provide real-time feedback when identifying flaws or defects. Based on the coverage of the emitter / detector pairs, the system 100 can be able to detect small defects (e.g., defects as small as 20 microns in magnitude, defects less than 25 microns, etc.) on any portion of the outer surface of the magnet wire having a variety of cross-sectional areas (e.g., rectangular wires with rounded corners, etc.).

[0055] System 100 may include a variety of other components as desired. For example, system 100 may include any number and type of emitters / detectors, a variety of cooling components, wire guides, mounting components, and / or computing devices (or controllers). As another example, system 100 may be capable of wired and / or wireless communication with external systems or devices. It should be understood that various embodiments of the present disclosure may include more than the above referenced embodiments. Figures 1A-1H More or fewer components than those illustrated and described. Indeed, the illustrated system 100 is provided by way of non-limiting example only.

[0056] Figures 2A-2D shows a method that can be incorporated into a defect detection system such as Figures 1A-1H An exemplary detection component 200 in the system 100 of FIG. Figures 2A-2D The detection assembly 200 can be used as Figures 1A-1H Detection component 115. Specifically, Figure 2A A perspective view of an example detection assembly 200 is shown; Figure 2B A side view of an example detection assembly 200 is shown; Figure 2C shows a cross-sectional view of an example detection assembly 200 taken along line BB'; and Figure 2D A schematic cross-sectional view of an example optical ring 220 that may be incorporated into detection assembly 200 is shown.

[0057] The detection assembly 200 may include a suitable housing 205 in which a plurality of emitters 210A-L and detectors 215A-L may be positioned. In various embodiments, the housing 205 may be formed of a variety of suitable materials as desired, including but not limited to one or more plastics (e.g., ABS plastic, polycarbonate, etc.) or polymer materials, etc. In addition, the housing 205 may be formed using a variety of suitable techniques, such as additive manufacturing (e.g., 3D printing), molding, casting, etc. Any suitable number of emitters 210A-L and detectors 215A-L may be positioned within the housing 205 as desired, such as six or more pairs of emitters and detectors, or Figures 2A-2D The twelve pairs of emitters 210A-L and detectors 215A-L are shown in FIG. Figures 2A-2D As shown and referenced above Figures 1A-1H Described in more detail, emitters 210A-L and detectors 215A-L may be positioned within an optical ring 220 surrounding an inspection region 225 through which electromagnetic wires may be passed for inspection.

[0058] As shown, emitters 210A-L can occupy approximately 180 degrees around optical ring 220. Detectors 215A-L can then occupy approximately 180 degrees around the other half of optical ring 220, such that each detector (generally referred to as detector 215) is positioned across optical ring 220 with a corresponding emitter (generally referred to as emitter 210). Additionally, as shown, groups of emitter and detector pairs can be positioned at longitudinally spaced locations along the length of detection assembly 200. For example, triplets of emitter / detector pairs can be positioned at longitudinally spaced locations along the longitudinal length of detection assembly 200. For an example detection assembly 200 including twelve emitter / detector pairs, four triplets of emitter / detector pairs can be positioned at four longitudinally spaced locations. For example, a first trio of emitters 210A, 210E, 210I and corresponding detectors 215A, 215E, 215I may be positioned at a first longitudinally spaced location; a second trio of emitters 210B; 210F, 210J and corresponding detectors 215B, 215F, 215J may be positioned at a second longitudinally spaced location; a third trio of emitters 210C, 210G, 210K and corresponding detectors 215C, 215G, 215K may be positioned at a third longitudinally spaced location; and a fourth trio of emitters 210D, 210H, 210L and corresponding detectors 215D, 215H, 215L may be positioned at a fourth longitudinally spaced location. Other positioning of emitter / detector pairs may be utilized in other embodiments, and the positioning shown is provided by way of non-limiting example only.

[0059] In addition, if Figure 2D As shown, each set of adjacent emitters (e.g., emitters 210A and 210B, emitters 210B and 210C, etc.) within optical ring 220 can be spaced apart from one another along ring 220 so that detection system 200 can identify flaws on any portion of the surface of the electromagnetic wire. For example, the emitters can be spaced approximately 15 degrees apart along the circumference or perimeter of optical ring 220. In some embodiments, the emitters in optical ring 220 can be spaced no more than 10, 12, 15, or 17 degrees apart. In other embodiments, adjacent emitters can be spaced no more than 30 degrees apart.

[0060] Continue to refer Figure 2A-2C, an example protective sleeve 250 is shown. The protective sleeve 250 can be optionally inserted into the detection assembly 200 to facilitate the insertion or positioning of the electromagnetic wire into the detection assembly 200 and passing through the detection assembly 200. The protective sleeve 250 can prevent the electromagnetic wire from damaging the detection assembly 200 and / or any of the emitters 210A-L and detectors 215A-L. Once the electromagnetic wire is properly positioned, the protective sleeve 250 can be removed, allowing the electromagnetic wire to be analyzed for defects. Figure 7 Example protective sleeves, such as sleeve 250, are described in further detail. In other embodiments, other suitable protective devices and / or components can be used in association with detection assembly 200.

[0061] As desired, the detection assembly 200 may include a variety of other configurations. For example, the detection assembly 200 may include different numbers of emitter / detector pairs (e.g., at least six pairs, at least eight pairs, etc.). In addition, the emitter / detector pairs may be positioned at a variety of suitable locations within the detection assembly 200. As desired, any suitable number of cooling channels (e.g., cooling channels that facilitate pressurized air circulation, etc.) and / or cooling devices (e.g., heat synchronizers, etc.) may be incorporated into the detection assembly 200. It should be understood that various embodiments of the present disclosure may include more than the above referenced embodiments. Figures 2A-2D Indeed, the illustrated detection assembly 200 is provided by way of non-limiting example only.

[0062] Figure 3 It is shown that it can be combined with a detection component (such as Figures 1A-1H The detection component 115 or Figures 2A-2D Schematic diagram of an example emitter and detector pair 300 in a detection assembly 200 of FIG. 300 . The pair 300 may include a suitable emitter 305, such as an LED emitter or a laser LED configured to output light of a desired wavelength (e.g., 700 nm, etc.). In addition, the pair 300 may include a suitable detector 310, such as a photodiode configured to detect light output by the corresponding emitter 305 (e.g., a photodiode focused on a 700 nm wavelength, etc.). The emitter 305 may output a light signal to and through the electromagnetic wire 315 being evaluated for defects, and the light signal may be detected by the detector 310. Based on changes in the amount of light detected, it may be determined whether there is a defect or flaw on the electromagnetic wire 315. For example, a reduction in light received by the detector 310 may indicate a larger profile of the wire 315 and / or its insulation layer, thereby indicating a defect protruding from the wire 315.

[0063] Continue to refer Figure 3In various embodiments, a variety of suitable filtering and / or focusing devices may be incorporated into the emitter / detector pair 300 as desired. For example, light output by the emitter 305 may pass through a suitable pinhole plate 320 or other filtering device that limits the emitted light. Additionally, the light may be focused via any number of suitable lenses and / or focusing devices, such as a plano-convex lens 325, which directs the emitted light in a parallel direction across the wire 315 and toward the detector 310. A suitable slit plate 330, such as a 200 micron slit plate, and / or any other suitable filtering device may limit the light signal passing through the detector 310. In this regard, the detected light signal may be primarily focused on the output of the emitter 305, and noise from other emitters in the detection assembly may be reduced.

[0064] Figure 4 It is shown that it can be combined with a detection component (such as Figures 1A-1H The detection component 115 or Figures 2A-2D 200) in a perspective view of an example detector 400. In some embodiments, the example detector 400 may be from Figure 3 The detector 310. Figure 4 As shown, light output by an emitter (e.g., emitter 305) can be detected by a corresponding detector 410 (such as a corresponding photodiode). The output light can contact and pass through the electromagnetic wire 415, which is evaluated before being detected by the detector 410. As desired, one or more suitable slit plates 430 or other filtering devices can limit or filter the light reaching the detector 410. In operation, the detector 410 can continuously measure the amount of received light in real time at any suitable sampling rate. Based on changes in the amount of received light (e.g., a decrease in received light), defects on the electromagnetic wire 415 or on the electromagnetic wire insulation can be identified, and the size of the defect (e.g., amplitude, longitudinal length) can be measured and / or determined. As shown in FIG. Figure 4 As shown, the light signal can pass through the electromagnetic wire 415 on opposite portions of the outer surface (eg, top and bottom surfaces, etc.). Thus, the emitter and detector pair can be used to identify defects on multiple portions of the outer surface of the electromagnetic wire 415.

[0065] References Figure 3 and Figure 4 The emitters and detectors described are provided by way of non-limiting examples only. In other embodiments of the present disclosure, a variety of other suitable emitters and detectors may be used as desired. In addition, any suitable filtering and / or focusing device or assembly may be utilized.

[0066] Figure 5 shows that a defect detection system such as Figures 1A to 1H100 ). A cross-sectional view of an example rectangular magnet wire 500 inspected by the system 100 .

[0067] The rectangular wire 500 can have four sides, such as long sides 505A-B (i.e., top and bottom sides) and short sides 510A-B (i.e., left and right sides) as shown. In addition, the corners of the wire can be curved, rounded, or otherwise shaped so that the two sides do not come together at a 90-degree angle. The corner can occupy any suitable portion of the two sides that intersect each other, such as between 1% and 10% of the respective lengths of the two sides. In addition, the corner can be formed with a variety of suitable bend radii. Based on typical rectangular wire sizes used in certain magnet wire applications (e.g., automotive applications), the detection system can be configured and / or optimized to detect defects on any portion of the surface of the magnet wire 500, which includes any of the sides 505A-B, 510A-B and / or any of the curved, rounded, or non-square corners. In some embodiments, the detection system can be configured to detect defects as small as 20 microns (e.g., defects less than 22 microns, defects less than 25 microns, etc.). It should be understood that the detection system is not limited to inspecting rectangular wires. In fact, the inspection system can also be used to inspect wires having other suitable cross-sectional shapes (eg, circular, rectangular with sharp corners, etc.).

[0068] Figure 6 Example detection signals 600 that may be generated by a detector of a flaw detection system (such as the system of FIG. 1-H ) are shown. A first example 605 depicts the detection of a defect or flaw by a trio of detectors. As shown, due to the angle of emitted light from the corresponding emitters across the defect, one detector in the trio records a higher defect amplitude than the other two detectors. The highest amplitude detected may be utilized when outputting and / or recording the amplitude of the identified defect. Additionally, it should be noted that the longitudinal length of the defect may also be determined utilizing line speed (i.e., line speed provided to the detection system, etc.) and a variety of suitable techniques, such as identifying rising and falling edges of the defect or determining the total length that the amount of light measured differs from a baseline. Continued with reference to Figure 6 , the second example 610 depicts a defect detected by a single detector. Additionally, the third example 615 depicts a measurement signal of the detector when a defect is not present or is not identified on the electromagnetic wire. It should be understood that when a defect is not present, a baseline signal can be established and the baseline amount of light detected can be based at least in part on the size of the electromagnetic wire being evaluated. Defects can then be identified based on changes in the amplitude of the measured light.

[0069] In certain embodiments, one or more suitable devices and / or components may be utilized to protect the defect detection system (i.e., Figures 1A-1H The detection device of the system 100 (ie, Figures 1A-1H The detection device 115 shown in or Figures 2A-2D ) and protect the emitters and detectors associated with the detection device from damage. Figure 7 A perspective view of an example protective sleeve 700 that may be used to feed wires into a defect detection system according to an illustrative embodiment of the present disclosure is shown. The protective sleeve 700 may be selectively inserted into a detection assembly to protect the device and then removed to allow evaluation or analysis of the magnet wire.

[0070] refer to Figure 7 , the example protective sleeve 700 may include two sleeve assemblies 705, 710 having different diameters. In this regard, the second assembly 710 may be inserted or positioned within the first assembly 705. In addition, the first assembly 705 may include a first longitudinally extending opening 715 or slit along its periphery that allows the magnet wire to be inserted into the first longitudinally extending cavity or channel 720. Similarly, the second assembly 710 may include a second longitudinally extending opening 725 along its periphery that allows the magnet wire to be inserted into the second longitudinally extending cavity or channel 730. In operation, the second assembly 710 may be positioned within the cavity 720 of the first assembly 705 such that the corresponding openings 715, 725 of the two assemblies 705, 710 are not aligned with each other. The magnet wire may then be longitudinally fed through the protective sleeve 700 such that it is within the cavity 730 of the second assembly 710 (and therefore within the cavity 720 of the first assembly 705). The protective sleeve 700 (and the wires) can then be inserted into and / or through the detection assembly, and the wires can be prevented from contacting or damaging the emitter or detector by the protective sleeve. The wires can also be positioned within an appropriate wire guide, such as Figures 1A-1E Wire guides 140A-D shown in . Once the wires have been fed through the detection assembly, the protective sleeve 700 can be removed from the detection assembly. At least one of the first assembly 705 or the second assembly 710 can then be twisted or rotated so that the two openings 715, 725 are aligned with each other. As a result, the wires can pass through the two openings 715, 725 and the protective sleeve 700 can be removed from the wire production line. The wires can then be evaluated by the detection assembly. A similar process can be used in reverse to remove the wires. The protective sleeve 700 can be formed of a variety of suitable materials and / or combinations of materials, including but not limited to one or more plastics (e.g., ABS plastic, polycarbonate, etc.) or polymer materials, etc.

[0071] Figures 8A-8B Another example protective sleeve 800 is shown that may be used to protect a defect detection system (ie, a Figures 1A-1H The detection device of the system 100 (ie, Figures 1A-1H The detection device 115 shown in or Figures 2A-2D ) and protect the emitters and detectors associated with the detection device from damage. Specifically, Fig. 8A shows a side view of an example protective sleeve, and Figure 8B Schematic diagrams of the protective sleeve 800 at different positions within the detection assembly are shown. Figure 7 Compared with the protective sleeve 700, Figures 8A-8B The protective sleeve can remain within the detection assembly during inspection of the magnet wire.

[0072] The protective sleeve 800 may include a main body portion 805 formed of any number of suitable materials, including but not limited to one or more plastics (e.g., ABS plastic, polycarbonate, etc.) or polymer materials, etc. In addition, a longitudinally extending cavity or channel 810 may extend through the main body portion 805. In operation, the electromagnetic wire can be fed through the channel 810. In some embodiments, the protective sleeve 800 may include a suitable flange 815 positioned at one end (or two longitudinally opposite ends) of the sleeve 800. The flange 815 can assist in guiding the wire into the channel 810 and / or can control the amount of movement allowed by the protective sleeve 800 within the detection assembly. In some embodiments, the protective sleeve 800 can be formed as a separate or integral structure.

[0073] According to one aspect of the present disclosure, a plurality of openings 820 or slots can be formed through the body 805 into the channel 810. These openings 820 can be selectively aligned with the emitters and detectors of the detection assembly. For example, Figure 8B Example positioning 830, 835 of the protective sleeve 800 within the detection assembly is shown. When the sleeve 800 is in the first position 830, the opening will not be aligned with the emitter and detector. As a result, the emitter and detector can be protected by the body portion 805 from dust or debris and from damage caused by the magnet wire. The magnet wire can be fed through the channel 810 and the detection assembly without damaging the emitter and detector. The protective sleeve 800 can then be adjusted or moved to the second position 835, in which the opening 820 is aligned with the emitter and detector. Therefore, the detection assembly can evaluate defects in the magnet wire.

[0074] The protective sleeve 800 can be moved in a variety of suitable directions to selectively align the openings with the emitters and detectors. Figure 8BAs shown, in some embodiments, the protective sleeve 800 can be moved in the longitudinal direction. In other embodiments, the protective sleeve 800 can be twisted or rotated within the detection assembly. In addition, a variety of suitable methods or techniques can be used to adjust the position of the protective sleeve 800. In some embodiments, one or more motors (e.g., servo motors, etc.) can be used to automatically adjust the position of the sleeve 800. In other embodiments, the position of the protective sleeve 800 can be manually adjusted. As needed, when the protective sleeve 800 does not need to be moved, any number of suitable pins, tabs or other devices can be used to keep it in the desired position.

[0075] Figure 7-8B The protective sleeves 700, 800 shown in the drawings are non-limiting examples of components that can be used to protect the detection assembly from damage during insertion and / or removal of the magnet wire. Various other suitable protective devices and / or components can be used in other embodiments. For example, a defect detection system (e.g., Figures 1A-1H The system 100 may include any number of automated covers, movable shutters, or other devices that can be selectively closed or moved in front of the emitters and detectors during insertion and / or removal of wires.

[0076] Fig. 9 is a flow chart depicting an example method 900 for inspecting magnet wire using a non-contact flaw detection system according to an illustrative embodiment of the present disclosure. The method 900 may be performed by and / or used in association with a variety of flaw detection systems, such as Figures 1A to 1H The example system 100 shown in FIG. 9 and described in more detail above. The method 900 may begin at block 905. At block 905, a plurality of emitters and corresponding detectors may be provided, the plurality of emitters and corresponding detectors being configured to inspect the magnetic wire for defects. Any suitable number of emitters and detectors may be provided (e.g., more than six emitter / detector pairs, more than eight pairs, etc.), such as twelve emitters and twelve corresponding detectors. As described above with reference to FIG. Figures 1A to 1H and FIG. 2A to FIG. 2D Explained in more detail, the emitters and detectors can be positioned around the inspection area in which the wire is positioned. For example, the emitters and detectors can be positioned along the perimeter of the ring. In addition, in some embodiments, each group of adjacent emitters within the ring can be positioned to be spaced no more than 17 degrees apart or spaced no more than 30 degrees apart. For example, each group of adjacent emitters can be positioned to be spaced approximately 15 degrees apart. The corresponding detector for each emitter can be positioned with the emitter spanning the ring. In addition, the emitter / detector pairs can be positioned at any suitable location along the longitudinal length of the detection assembly. For example, triplets or groups of emitter / detector pairs can be positioned at four longitudinally spaced locations.

[0077] At block 910, a plurality of emitters and detectors may be powered. In addition, any suitable number of thresholds (e.g., noise thresholds, one or more defect thresholds, etc.) may be provided to the detectors. The electromagnetic wire to be inspected may then be passed through an inspection region between the emitters and the detectors. Each emitter may emit or project light onto and through the electromagnetic wire, and the light may be measured by a corresponding detector. According to one aspect of the present disclosure, light may be projected and detected in a non-contact manner and in a continuous manner as the electromagnetic wire passes through the inspection region.

[0078] At box 915, as the electromagnetic wire passes through the inspection area, the electromagnetic wire can be evaluated for flaws or defects, and the signals captured by each detector are evaluated. In particular, the detector can identify or detect changes in the amplitude of the received light signal. For example, a decrease in the amount of light received can indicate the presence of a defect protruding from the wire. The detector can be sampled at any suitable rate. At box 920, it can be determined whether the detected amplitude change of one or more detectors exceeds one or more baseline values ​​and / or thresholds. For example, it can be determined whether the difference between the detected light signal and the baseline amount is greater than a minimum threshold and / or whether the detected change exceeds a noise threshold. If it is determined at box 920 that the signal from the detector does not exceed any minimum value or baseline threshold for identifying defects, the operation can continue at box 915 and the wire can continue to be monitored. However, if it is determined at box 920 that the signal from one or more detectors includes an amplitude change that exceeds one or more minimum thresholds, the operation can continue at box 925.

[0079] At block 925, a defect or flaw may be identified on the wire, and one or more dimensions of the defect may be determined. For example, the magnitude of the defect may be determined. In the event that multiple detectors have identified the defect, then the magnitude may be determined as the maximum magnitude identified by the multiple detectors. Additionally, in certain embodiments, the longitudinal length of the defect may be determined. For example, the start and end points of the defect may be identified. The longitudinal length may be calculated using the line speed of the wire as it passes through the inspection area.

[0080] At box 930, one or more suitable counts stored and / or output by the detection system can be incremented or adjusted. For example, a count that tracks the total number of defects identified can be incremented. As another example, based on the determined defect magnitude, an appropriate count for a given defect size can be incremented. In certain embodiments, counts can be maintained for any suitable number of defect sizes or size ranges (such as small, medium, and large defects). At box 935, one or more suitable alarms can be optionally generated and output based on the detection of the defect. For example, one or more defect counts, the size of the identified defect, and identification information of one or more detectors used to identify the defect can be output as an alarm message. As another example, a visual indication (e.g., an LED light, a display, etc.) can be output on the defect detection system.

[0081] At box 940, it can be determined whether continued manufacturing or production of the magnet wire should be stopped. For example, it can be determined whether the identified defects exceed a maximum threshold of allowable defects on the wire. As another example, it can be determined whether the total number of defects for a given length of wire exceeds a maximum threshold. If it is determined at box 940 that production should not be stopped, operation can continue at box 920 and the wire can continue to be monitored. However, if it is determined at box 940 that production should be stopped, operation can continue at box 945 and a suitable stop command or alarm can be output. Method 900 can end after 945 or when the transmitter and detector are powered off.

[0082] As required, method 900 may include more or fewer operations than those shown in FIG. 8. In addition, as required, some operations of method 900 may be performed in parallel or in parallel. Fig. 9 In fact, method 900 is provided only by way of non-limiting example.

[0083] Unless specifically stated otherwise or otherwise understood in the context of use, conditional language such as "can," "can," "may," or "may" is generally intended to convey that certain embodiments may include and other embodiments do not include certain features, elements, and / or operations. Thus, such conditional language is generally not intended to imply that features, elements, and / or operations are in any way necessary for one or more embodiments, or that one or more embodiments must include logic for determining whether such features, elements, and / or operations are included or to be performed in any certain embodiments, with or without user input or prompting. Indeed, the illustrated system 900 is provided by way of non-limiting example only. Having benefited from the teachings presented in the foregoing description and associated drawings,

[0084] Many modifications and other embodiments of the disclosure set forth herein will be apparent. Therefore, it should be understood that the disclosure is not limited to certain embodiments disclosed, and modifications and other embodiments are intended to be included within the scope of the appended claims. Although certain terms are employed herein, they are used only in a general and descriptive sense, and not for the purpose of limitation.

Claims

1. A defect detection system, comprising: External housing; and A detection assembly, the detection assembly is positioned in the external housing, the detection assembly comprising: a plurality of emitters and a plurality of detectors, the plurality of emitters and the plurality of detectors being positioned around an inspection area through which the wire passes, wherein each pair of adjacent emitters included in the plurality of emitters are spaced apart by no more than 30 degrees, and each of the plurality of detectors is positioned across the inspection area with a corresponding emitter included in the plurality of emitters, Each of the plurality of emitters is configured to emit a signal that is measured by a corresponding detector, and the detection component is configured to detect one or more defects on the surface of the wire based on changes in the signals measured by one or more of the plurality of detectors.

2. The system of claim 1, wherein each pair of adjacent transmitters included in the plurality of transmitters are spaced apart by no more than 17 degrees.

3. The system of claim 1, wherein the detection component is configured to detect defects extending 20 microns from the surface of the wire.

4. The system of claim 1, wherein the detection component is configured to detect defects on any portion of a surface of the wire.

5. The system of claim 1, wherein the wire comprises a rectangular wire having rounded corners.

6. The system of claim 1, wherein the detection component is further configured to determine a magnitude of a detected defect.

7. The system of claim 1, wherein the detection component is further configured to determine a longitudinal length of a detected defect based at least in part on a speed at which the wire traverses the inspection region.

8. The system of claim 1, wherein the plurality of emitters comprises twelve emitters and the plurality of detectors comprises twelve detectors.

9. The system of claim 1, wherein each pair of adjacent transmitters in the plurality of transmitters are spaced 15 degrees apart in a circle around the inspection area.

10. The system of claim 1, wherein at least one of the plurality of emitters comprises a light emitting diode.

11. The system of claim 1 , wherein at least one of the plurality of detectors comprises a photodetector.

12. The system of claim 1, wherein the plurality of emitters are grouped into a plurality of subsets, and each of the plurality of subsets is positioned at a respective spaced location along a longitudinal length of the detection assembly.

13. The system of claim 12, wherein each of the plurality of subsets comprises three transmitters.

14. The system of claim 1, further comprising at least one wire guide configured to maintain a position of the wire within the inspection region.

15. The system of claim 14, wherein the at least one wire guide comprises at least one vertical guide roller and at least one horizontal guide roller.

16. The system of claim 14, wherein the at least one wire guide comprises guide rollers including a first guide roller having a fixed position, and a second guide roller that is spring loaded such that its position can be adjusted based on the size of the wire.

17. The system of claim 1, further comprising an air duct through which a ventilation system can force pressurized air into the system.

18. The system of claim 1, wherein the total volume of the system is less than one cubic foot.

19. The system of claim 1, further comprising a protective sleeve selectively insertable into the inspection area to facilitate positioning the wire within the inspection area.

20. The system of claim 19, wherein the protective sleeve comprises: a first component having a first longitudinally extending passage and a first longitudinally extending slot on a periphery of the first component opening into the first passage; and a second component having a second longitudinally extending passage and a second longitudinally extending slot on a periphery of the second component opening into the second passage, Wherein the second channel is configured to be positioned within the first channel and rotate.

21. The system of claim 1, wherein the wire does not contact the detection assembly.

22. A defect detection system comprising: External housing; and A detection assembly, the detection assembly is positioned in the external housing, the detection assembly comprising: at least six emitter and detector pairs positioned around an inspection region through which the wire passes, wherein each detector is positioned across the inspection region with a corresponding emitter, Each emitter is configured to emit a signal measured by a corresponding detector, and the detection component is configured to detect one or more defects on the surface of the wire based on changes in the signals measured by one or more of the plurality of detectors.

23. The system of claim 22, wherein each set of adjacent transmitters are spaced no more than 30 degrees apart from one another along a ring formed around the inspection region.

24. The system of claim 22, wherein each set of adjacent transmitters are spaced no more than 17 degrees apart from one another along a ring formed around the inspection region.

25. The system of claim 22, wherein the detection assembly is configured to detect defects extending 20 microns from a surface of the wire.

26. The system of claim 22, wherein the detection component is configured to detect defects on any portion of a surface of the wire.

27. The system of claim 22, wherein the wire comprises a rectangular wire having rounded corners.

28. The system of claim 22, wherein the detection component is further configured to determine a magnitude of a detected defect.

29. The system of claim 22, wherein the detection component is further configured to determine a longitudinal length of a detected defect based at least in part on a speed at which the wire traverses the inspection region.

30. The system of claim 22, wherein the system comprises at least twelve emitter and detector pairs positioned around the inspection region.

31. The system of claim 30, wherein each group of adjacent transmitters are spaced 15 degrees apart from one another along a ring formed around the inspection region.

32. The system of claim 22, wherein at least one emitter comprises a light emitting diode.

33. The system of claim 22, wherein at least one detector comprises a photodetector.

34. The system of claim 22, wherein a first subset of the at least six emitters and a second subset of the at least six emitters are positioned at respective spaced locations along a longitudinal length of the detection assembly.

35. The system of claim 34, wherein each of the first subset and the second subset comprises three transmitters.

36. The system of claim 22, further comprising at least one wire guide configured to maintain a position of the wire within the inspection region.

37. The system of claim 36, wherein the at least one wire guide comprises at least one vertical guide roller and at least one horizontal guide roller.

38. The system of claim 36, wherein the at least one wire guide comprises guide rollers including a first guide roller having a fixed position, and a second guide roller that is spring loaded such that its position can be adjusted based on the size of the wire.

39. The system of claim 22, further comprising an air duct through which a ventilation system can force pressurized air into the system.

40. The system of claim 22, wherein the total volume of the system is less than one cubic foot.

41. The system of claim 22, further comprising a protective sleeve selectively insertable into the inspection region to facilitate positioning of the wire within the inspection region.

42. The system of claim 41, wherein the protective sleeve comprises: a first component having a first longitudinally extending passage and a first longitudinally extending slot on a periphery of the first component opening into the first passage; and a second component having a second longitudinally extending passage and a second longitudinally extending slot on a periphery of the second component opening into the second passage, Wherein the second channel is configured to be positioned within the first channel and rotate.

43. The system of claim 22, wherein the wire does not contact the detection component.

44. A defect detection system comprising: External housing; and A detection assembly, the detection assembly is positioned in the external housing, the detection assembly comprising: a plurality of emitters and detectors positioned about an inspection region through which a rectangular wire having rounded corners passes, wherein each detector is positioned across the inspection region with a corresponding emitter, wherein each emitter is configured to emit a respective signal across a respective portion of an outer surface of the wire, each detector is configured to detect a respective signal of a corresponding emitter, and the detection assembly is configured to detect one or more defects on the outer surface of the wire based on changes in the signals measured by one or more of the detectors, Wherein the detection assembly is configured to detect one or more defects having a respective amplitude of 20 microns on any portion of the outer surface.

45. A method for detecting defects on a surface of an electric wire, the method comprising: providing a plurality of emitters and a plurality of detectors, the plurality of emitters and the plurality of detectors surrounding an inspection area through which the wire passes, wherein each pair of adjacent emitters included in the plurality of emitters are spaced apart by no more than 30 degrees, and each of the plurality of detectors is positioned across the inspection area with a corresponding emitter included in the plurality of emitters, Passing the wire through the inspection area; transmitting a respective signal from each of the plurality of transmitters, wherein each signal is measured by a corresponding one of the plurality of detectors; and One or more defects on the electrical line are detected based on changes in one or more of the corresponding signals measured by the plurality of detectors.

46. ​​The method of claim 45, wherein providing a plurality of emitters comprises providing a plurality of emitters wherein each pair of adjacent emitters are spaced no more than 17 degrees apart.

47. The method of claim 45, wherein detecting one or more defects comprises detecting one or more defects in a non-contact manner.

48. The method of claim 45, wherein: Transmitting a respective signal from each of the plurality of transmitters includes projecting an optical signal onto the wire.

49. The method of claim 45, wherein detecting one or more defects comprises detecting one or more defects extending 20 microns from a surface of the wire.

50. The method of claim 45, wherein passing a wire through the inspection region comprises passing a wire having a rectangular cross-sectional shape with rounded corners.

51. The method of claim 45, further comprising determining a magnitude of a detected defect.

52. The method of claim 45, further comprising determining a longitudinal length of a defect based at least in part on a speed at which the wire traverses the inspection region.

53. The method of claim 45, wherein providing a plurality of emitters and a plurality of detectors comprises providing twelve emitters and twelve detectors.

54. The method of claim 45, wherein providing a plurality of transmitters comprises providing a plurality of transmitters, wherein each pair of adjacent transmitters in the plurality of transmitters are spaced 15 degrees apart.

55. The method of claim 45, wherein providing a plurality of emitters comprises providing at least one light emitting diode.

56. The method of claim 45, wherein providing a plurality of detectors comprises providing at least one photodiode.

57. The method of claim 45, wherein providing a plurality of transmitters comprises providing a plurality of transmitters, wherein a subset of the plurality of transmitters are located at a plurality of longitudinally spaced apart locations.

58. The method of claim 45, further comprising guiding the wire as it passes through the inspection region.

59. The system of claim 58, wherein guiding the wire comprises guiding the wire using at least one vertical guide roller and at least one horizontal guide roller.

60. The method of claim 45, further comprising generating an alert based on detecting one or more defects.

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