Method, device and equipment for determining maturity of hydrocarbon source rock based on Raman spectrum

Through Raman spectral surface sweep method and standardized treatment, the problem of high technical level assessment of source rock maturity in the prior art is solved, and the accurate assessment of source rock maturity is achieved, especially in the characterization of scopic-polluted source rocks is effective.

CN119619097APending Publication Date: 2025-03-14PETROCHINA CO LTD

Patent Information

Application Number
CN202311175782.8
Authority / Receiving Office
CN · China
Patent Type
Applications(China)
Current Assignee / Owner
Filing Date
2023-09-12
Publication Date
2025-03-14

AI Technical Summary

Technical Problem

The prior art has high requirements for the operator's technical level when evaluating the maturity of source rocks, and it is difficult to effectively characterize the maturity of scopic-deficient source rocks.

Method used

The Raman spectral surface scanning method is used to scan the source rocks. By determining the intensity values ​​and mean values ​​of multiple scan data, the standardization process is carried out to determine the target spectrum, and the maturity of the source rocks is evaluated.

Benefits of technology

Accurate and efficient evaluation of the maturity of source rocks is achieved, and the requirements for operators' technical level are reduced, especially when characterizing scopic-polluted source rocks are particularly effective.

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Abstract

The invention discloses a hydrocarbon source rock maturity determination method, device and equipment based on Raman spectrum. The method comprises the following steps: scanning a to-be-detected hydrocarbon source rock by adopting a Raman spectrum surface scanning method, and determining a plurality of scanning data, the Raman spectrum surface scanning method being used for analyzing the structural data of the to-be-detected hydrocarbon source rock; based on the plurality of scanning data, determining intensity values of a plurality of scanning points on the to-be-detected hydrocarbon source rock, and calculating a mean value of the plurality of scanning data, the intensity values being used for representing scanning results of the scanned points of the to-be-detected hydrocarbon source rock; based on the mean value, performing standardization processing on the intensity values of the plurality of scanning points, and determining a target spectrum; and determining the maturity of the hydrocarbon source rock to be detected based on the target spectrum. The technical problem that in the prior art, maturity evaluation has high requirements for the technical level of operators is solved.
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Description

Technical Field

[0001] The present invention relates to the technical field of petroleum geological exploration, and in particular to a method, device and equipment for determining the maturity of hydrocarbon source rocks based on Raman spectroscopy. Background Art

[0002] Maturity is an important indicator for evaluating the hydrocarbon generation and product properties of organic matter, and has been widely and deeply studied for a long time. Usually, the thermal maturity of organic-rich mudstone is evaluated by optically analyzing the vitrinite microscopic components using microscopic technology to obtain the vitrinite reflectance (%Ro). This method has high requirements on the technical level of the operator and requires the correct distinction between vitrinite and other microscopic components. At the same time, it encounters great difficulties in characterizing the formations before the Devonian (vascular plants did not appear) and lacking terrestrial higher plant input. Therefore, characterizing the maturity of vitrinite-poor source rocks is a difficult point in field research.

[0003] To address the above-mentioned problems, no effective solution has been proposed yet. Summary of the invention

[0004] The embodiments of the present invention provide a method, device and equipment for determining the maturity of source rocks based on Raman spectroscopy, so as to at least solve the technical problem in the prior art that maturity assessment has high requirements on the technical level of operators.

[0005] According to one aspect of an embodiment of the present invention, a method for determining the maturity of a source rock based on Raman spectroscopy is provided, comprising: scanning a source rock to be detected using a Raman spectroscopy surface scanning method to determine a plurality of scanning data, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected; based on the plurality of scanning data, determining the intensity values ​​of a plurality of scanning points on the source rock to be detected, and obtaining the average of the plurality of scanning data, wherein the intensity values ​​are used to characterize the scanning results of the scanned points of the source rock to be detected; based on the average, standardizing the intensity values ​​of the plurality of scanning points to determine a target spectrum; and determining the maturity of the source rock to be detected based on the target spectrum.

[0006] Optionally, the Raman spectroscopy surface scanning method is used to scan the source rock to be detected to determine multiple scanning data, including: obtaining a source rock sample, and preprocessing the source rock sample to determine the source rock to be detected, wherein the preprocessing includes: source rock thickness processing and source rock side length processing; using a laser confocal Raman spectrometer to scan the source rock to be detected to determine the scanning data, wherein the excitation wavelength of the laser confocal Raman spectrometer is 532nm, the acquisition time is 20s, and the wavenumber range is 1000-2000cm-1.

[0007] Optionally, before determining the intensity value of the above-mentioned scanning data and calculating the average of the above-mentioned scanning data, the above-mentioned method also includes: determining an initial spectral curve based on the above-mentioned multiple scanning data; performing baseline calibration processing on the above-mentioned initial spectral curve based on a preset baseline, and determining the initial spectral curve after the baseline calibration processing; determining multiple target scanning data corresponding to the initial spectral curve after the baseline calibration processing, wherein the above-mentioned multiple target scanning data are the above-mentioned multiple scanning data after the baseline calibration processing.

[0008] Optionally, the above-mentioned intensity values ​​are standardized based on the above-mentioned mean to determine the target spectrum, including: determining the standard deviation based on the above-mentioned intensity values ​​and the above-mentioned mean; standardizing the above-mentioned intensity values ​​based on the above-mentioned standard deviation and the above-mentioned mean to determine the standardized intensity value; determining the above-mentioned target spectrum based on the above-mentioned standardized intensity value.

[0009] Optionally, the above-mentioned determination of the maturity of the source rock to be detected based on the above-mentioned target spectrum includes: determining a first peak and a second peak of the above-mentioned target spectrum, wherein the above-mentioned first peak is smaller than the above-mentioned second peak; obtaining a peak difference between the above-mentioned second peak and the first peak, and using the above-mentioned peak difference to represent the maturity of the above-mentioned source rock to be detected.

[0010] According to another aspect of an embodiment of the present invention, a device for determining the maturity of a source rock based on Raman spectroscopy is also provided, comprising: a scanning module, used to scan the source rock to be detected by using a Raman spectroscopy surface scanning method, and determine a plurality of scanning data, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected; a first determination module, used to determine the intensity values ​​of a plurality of scanning points on the source rock to be detected based on the plurality of scanning data, and to obtain the average of the plurality of scanning data, wherein the intensity value is used to characterize the scanning result of the scanned point of the source rock to be detected; a processing module, used to standardize the intensity values ​​of the plurality of scanning points based on the average value, and determine the target spectrum; and a second determination module, used to determine the maturity of the source rock to be detected based on the target spectrum.

[0011] According to another aspect of an embodiment of the present invention, a non-volatile storage medium is provided, wherein the non-volatile storage medium stores a plurality of instructions, wherein the instructions are suitable for being loaded by a processor and executing any one of the above-mentioned methods for determining the maturity of hydrocarbon source rocks based on Raman spectroscopy.

[0012] According to another aspect of an embodiment of the present invention, a processor is further provided, and the processor is used to run a program, wherein the program is configured to execute any one of the above-mentioned methods for determining the maturity of source rocks based on Raman spectroscopy when running.

[0013] According to another aspect of an embodiment of the present invention, there is also provided an electronic device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor is configured to run the computer program to execute any one of the above-mentioned methods for determining the maturity of source rocks based on Raman spectroscopy.

[0014] In an embodiment of the present invention, a Raman spectroscopy surface scanning method is adopted to scan the source rock to be detected, and a plurality of scanning data are determined, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected; based on the plurality of scanning data, the intensity values ​​of a plurality of scanning points on the source rock to be detected are determined, and the average of the plurality of scanning data is obtained, wherein the intensity value is used to characterize the scanning result of the scanned point of the source rock to be detected; based on the average, the intensity values ​​of the plurality of scanning points are standardized to determine the target spectrum; based on the target spectrum, the maturity of the source rock to be detected is determined, thereby achieving the purpose of obtaining the target spectrum based on the Raman spectroscopy surface scanning technology and using the standardized data processing method, thereby realizing the technical effect of accurately determining the maturity of the source rock, thereby solving the technical problem in the prior art that the maturity assessment has high requirements on the technical level of the operator. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0016] Figure 1 is a flow chart of a method for determining maturity of source rocks based on Raman spectroscopy according to an embodiment of the present invention;

[0017] Figure 2 The diagram is a schematic structural diagram of a device for determining the maturity of a source rock based on Raman spectroscopy according to an embodiment of the present invention. DETAILED DESCRIPTION

[0018] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0019] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0020] Raman spectroscopy is a technique for rapidly, accurately and non-destructively characterizing the structural properties of carbon-based materials. The G (graphite) peak is generated by the planar stretching vibration of carbon atoms in the sp2 carbon structure, and the D (defect) peak is generated by the Raman-active A1g vibration caused by carbon lattice defects, representing the disorder of carbon atoms. During the maturation of organic matter, the carbon structure arrangement changes from disorder to order, that is, the degree of aromatization gradually increases, which is reflected in the Raman spectrum as the G peak and D peak move to high and low wavenumbers, respectively. Therefore, the Raman band separation index (RBS) is a potential indicator for characterizing vitrinite-poor source rocks. However, source rocks usually have multiple microscopic components such as exinite, vitrinite, inertinite and bitumen. Organic matter is highly heterogeneous, and different types of microscopic components have different RBS at the same maturity (%Ro).

[0021] The vitrinite reflectance test was conducted on a Zeiss microscope equipped with a J&M MSP200 microphotometer. Before the measurement, the microscope was calibrated with standard samples (sapphire 0.59% Ro, yttrium aluminum garnet 0.90% Ro, gadolinium gallium garnet 1.721% Ro), and the correlation of the fitting working curve exceeded 0.9999. The single polarized light random reflectance mode was selected for testing, with a collection area of ​​2μm×2μm and 50 collection points. The Ro test process follows the standard coal petrographic regulations (GB / T 6948-2008). The key to Ro measurement is to identify vitrinite, which is black-gray-gray-white under oil immersion reflection, with irregular morphology and no fluorescence under blue light excitation. The Ro of 16 source rock samples ranged from 0.52% to 1.45% (Table 1).

[0022] Table 1

[0023]

[0024] According to an embodiment of the present invention, an embodiment of a method for determining the maturity of source rocks based on Raman spectroscopy is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described may be executed in an order different from that shown here.

[0025] Figure 1 is a flow chart of a method for determining the maturity of source rocks based on Raman spectroscopy according to an embodiment of the present invention, such as Figure 1 As shown, the method comprises the following steps:

[0026] Step S102, scanning the source rock to be detected by using a Raman spectroscopy surface scanning method to determine a plurality of scanning data, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected;

[0027] Step S104, based on the plurality of scanning data, determining the intensity values ​​of the plurality of scanning points on the source rock to be detected, and obtaining the average of the plurality of scanning data, wherein the intensity value is used to characterize the scanning result of the scanned point of the source rock to be detected;

[0028] Step S106, based on the mean value, standardize the intensity values ​​of the plurality of scanning points to determine a target spectrum;

[0029] Step S108, determining the maturity of the source rock to be detected based on the target spectrum.

[0030] In an embodiment of the present invention, the execution body of the method for determining the maturity of a source rock based on Raman spectroscopy provided in the above steps S102 to S108 is a source rock maturity determination system based on Raman spectroscopy, and the above system is used to scan the source rock to be detected using a Raman spectroscopy surface scanning method to determine multiple scanning data, wherein the above Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected; based on the above multiple scanning data, the intensity values ​​of multiple scanning points on the source rock to be detected are determined, and the average of the above multiple scanning data is obtained, wherein the above intensity value is used to characterize the scanning results of the scanned points of the source rock to be detected; based on the above average, the intensity values ​​of the above multiple scanning points are standardized to determine the target spectrum; based on the above target spectrum, the maturity of the source rock to be detected is determined.

[0031] As an optional embodiment, based on Raman spectroscopy scanning technology, the Python Z-score (Z-score) standardized data processing method is used to obtain the target spectrum (TS), and a regression equation between the vitrinite reflectance (% Ro) and the RBS obtained from the TS is established. The two show a strong correlation (R 2=0.8487), and the results show that the maturity of vitrinite-poor source rocks can be effectively characterized based on Raman spectroscopy.

[0032] Through the embodiment of the present invention, a regression formula of the Raman maturity parameter RBS and the vitrinite reflectance (%Ro) is established, which provides an important reference for characterizing the maturity of vitrinite-poor source rocks.

[0033] In an optional embodiment, the Raman spectroscopy surface scanning method is used to scan the source rock to be detected to determine multiple scanning data, including: obtaining a source rock sample, and preprocessing the source rock sample to determine the source rock to be detected, wherein the preprocessing includes: source rock thickness processing and source rock side length processing; using a laser confocal Raman spectrometer to scan the source rock to be detected to determine the scanning data, wherein the excitation wavelength of the laser confocal Raman spectrometer is 532nm, the acquisition time is 20s, and the wavenumber range is 1000-2000cm-1.

[0034] As an optional embodiment, a test range of 500 μm × 500 μm is selected in the rock slice, the number of test points is 100, the scanning range does not need to consider the type and distribution of organic matter, and the coverage of a single microscopic component is required not to exceed 4 test points. At room temperature, a HORIBA LabRAM HR laser confocal Raman spectrometer is used for in-situ Raman spectroscopy testing, with an excitation wavelength of 532 nm, a signal acquisition time of 20 s for each test, and a wave number range of 1000-2000 cm -1 .

[0035] In an optional embodiment, before determining the intensity value of the above-mentioned scanning data and calculating the average value of the above-mentioned scanning data, the above-mentioned method also includes: determining an initial spectral curve based on the above-mentioned multiple scanning data; performing baseline calibration processing on the above-mentioned initial spectral curve based on a preset baseline to determine the initial spectral curve after the baseline calibration processing; determining multiple target scanning data corresponding to the initial spectral curve after the baseline calibration processing, wherein the above-mentioned multiple target scanning data are the above-mentioned multiple scanning data after the baseline calibration processing.

[0036] As an optional embodiment, in order to reduce the influence of background noise and artifacts, baseline calibration is required. Baseline fitting is performed through the selected baseline points, and the calibration is completed by subtracting the baseline from the full spectrum. This process can be performed on Origin2019Pro.

[0037] In an optional embodiment, the above-mentioned intensity values ​​are standardized based on the above-mentioned mean to determine the target spectrum, including: determining the standard deviation based on the above-mentioned intensity values ​​and the above-mentioned mean; standardizing the above-mentioned intensity values ​​based on the above-mentioned standard deviation and the above-mentioned mean to determine the standardized intensity values; determining the above-mentioned target spectrum based on the above-mentioned standardized intensity values.

[0038] As an optional embodiment, the mean (μ) and standard deviation (σ) of 100 raw data are calculated, and the intensity value (Intensity) at each wave number is standardized. The processing formula is:

[0039]

[0040]

[0041] Among them, x i is the intensity value of the sample, x * is the standardized intensity value. The processed data conforms to the standard normal distribution, that is, the mean is 0 and the standard deviation is 1. This process is performed on the Normalization module of Python. The result of standardizing the intensity values ​​of 100 Raman spectra at all wavenumbers is to obtain a target spectrum (Target spectrum, referred to as TS).

[0042] Alternatively, the Sadezky band selection method (Sadezky et al., 2005) was used, including five combined bands D4, D1, D3, G and D2 at approximately 1200 cm -1 , 1350cm -1 , 1500cm -1 , 1580cm -1 and 1620cm -1 Considering the inherent Lorentzian properties of the oscillator model, the Lorentzian peak shape is used to fit the Raman spectrum. The entire process of deconvolution is flexible, and the parameters related to curve fitting, such as the position, width and height of the peak, can be adjusted during this process.

[0043] In an optional embodiment, the maturity of the above-mentioned source rock to be detected is determined based on the above-mentioned target spectrum, including: determining a first peak and a second peak of the above-mentioned target spectrum, wherein the above-mentioned first peak is smaller than the above-mentioned second peak; obtaining a peak difference between the above-mentioned second peak and the first peak, and using the above-mentioned peak difference to represent the maturity of the above-mentioned source rock to be detected.

[0044] As an optional embodiment, RBS (G peak-D1 peak) is calculated from TS of 16 samples, and the calculation results are shown in Table 1. The RBS range of the 16 samples is 234.84 cm -1 To 263.65cm -1 , has a strong positive correlation with the vitrinite reflectance, and the regression equation is as follows (R 2 =0.8487):

[0045] RBS=29.315*%Ro+218.89③

[0046] Optionally, the maturity of the vitrinite-poor source rock sample (number X) is obtained using regression formula ③, and the RBS of the TS of the sample is 245.86 cm -1 The equivalent vitrinite reflectance is 0.92% VRE, calculated from Formula 3. Based on the rock pyrolysis parameter T max The converted maturity is 0.90%Ro, and the maturity calculated based on the nanomechanical properties of organic matter using atomic force microscopy (AFM) is 0.91%Ro, which are consistent results.

[0047] Through the above steps, Raman surface scanning technology was used to select a test range of 500μm×500μm, with 100 test points. The scanning range does not need to consider the type and distribution of organic matter, and the coverage of a single microscopic component cannot exceed 4 test points. A representative Raman spectral data set of source rock samples at the same maturity was obtained. Compared with the traditional Raman spectra of a single microscopic component, the heterogeneity of the sample was fully considered. The Python Z-score standardization method was used to process the intensity value of each wave number, not a simple linear average, and finally a target spectrum (TS) was obtained.

[0048] Through the above steps, there is a strong correlation between the RBS obtained from TS and the vitrinite reflectance, which shows that TS is not affected by the type and distribution of organic matter and can effectively characterize the maturity of vitrinite-poor source rocks.

[0049] According to an embodiment of the present invention, there is also provided an embodiment of a device for implementing the above-mentioned method for determining the maturity of source rocks based on Raman spectroscopy. Figure 2 is a schematic diagram of the structure of a device for determining the maturity of a source rock based on Raman spectroscopy according to an embodiment of the present invention. Figure 2 As shown, the above device includes: a scanning module 20, a first determination module 22, a processing module 24 and a second determination module 26, wherein:

[0050] A scanning module 20 is used to scan the source rock to be detected by using a Raman spectroscopy surface scanning method to determine a plurality of scanning data, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected;

[0051] A first determination module 22 is used to determine the intensity values ​​of multiple scanning points on the source rock to be detected based on the multiple scanning data, and to obtain the average of the multiple scanning data, wherein the intensity value is used to characterize the scanning result of the scanned point of the source rock to be detected;

[0052] A processing module 24 is used to perform standardization processing on the intensity values ​​of the plurality of scanning points based on the mean value to determine a target spectrum;

[0053] The second determination module 26 is used to determine the maturity of the source rock to be detected based on the target spectrum.

[0054] It should be noted here that the above-mentioned acquisition module 40, calculation module 42, determination module 44 and judgment module 46 correspond to steps S102 to S108 in Example 1, and the four modules and the corresponding steps implement the same instances and application scenarios, but are not limited to the contents disclosed in the above-mentioned Example 1.

[0055] It should be noted that the preferred implementation of this embodiment can refer to the relevant description in Example 1, which will not be repeated here.

[0056] According to an embodiment of the present invention, an embodiment of a computer-readable storage medium is also provided. Optionally, in this embodiment, the computer-readable storage medium can be used to store the program code executed by the method for determining the maturity of source rocks based on Raman spectroscopy provided in the above embodiment 1.

[0057] Optionally, in this embodiment, the computer-readable storage medium may be located in any computer terminal in a computer terminal group in a computer network, or in any mobile terminal in a mobile terminal group.

[0058] Optionally, in this embodiment, the computer-readable storage medium is configured to store program codes for executing the following steps: scanning the source rock to be detected using a Raman spectroscopy surface scanning method to determine a plurality of scanning data, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected; determining the intensity values ​​of a plurality of scanning points on the source rock to be detected based on the plurality of scanning data, and obtaining the average of the plurality of scanning data, wherein the intensity values ​​are used to characterize the scanning results of the scanned points of the source rock to be detected; standardizing the intensity values ​​of the plurality of scanning points based on the average to determine the target spectrum; and determining the maturity of the source rock to be detected based on the target spectrum.

[0059] Optionally, the computer-readable storage medium is configured to store program codes for executing the following steps: obtaining a source rock sample, and preprocessing the source rock sample to determine the source rock to be detected, wherein the preprocessing includes: source rock thickness processing and source rock side length processing; using a laser confocal Raman spectrometer to scan the source rock to be detected to determine the scanning data, wherein the excitation wavelength of the laser confocal Raman spectrometer is 532nm, the acquisition time is 20s, and the wavenumber range is 1000-2000cm-1.

[0060] Optionally, the computer-readable storage medium is configured to store program codes for executing the following steps: determining an initial spectral curve based on the multiple scanning data; performing baseline calibration processing on the initial spectral curve based on a preset baseline to determine the initial spectral curve after the baseline calibration processing; determining multiple target scanning data corresponding to the initial spectral curve after the baseline calibration processing, wherein the multiple target scanning data are the multiple scanning data after the baseline calibration processing.

[0061] Optionally, the computer-readable storage medium is configured to store program codes for executing the following steps: determining a standard deviation based on the intensity value and the mean; standardizing the intensity value based on the standard deviation and the mean to determine a standardized intensity value; and determining the target spectrum based on the standardized intensity value.

[0062] Optionally, the computer-readable storage medium is configured to store program codes for executing the following steps: determining a first peak and a second peak of the target spectrum, wherein the first peak is smaller than the second peak; obtaining a peak difference between the second peak and the first peak, and using the peak difference to represent the maturity of the source rock to be detected.

[0063] According to an embodiment of the present invention, an embodiment of a processor is also provided. Optionally, in this embodiment, the computer-readable storage medium can be used to store the program code executed by the method for determining the maturity of source rocks based on Raman spectroscopy provided in the above embodiment 1.

[0064] An embodiment of the present application provides an electronic device, which includes a processor, a memory, and a program stored in the memory and executable on the processor. When the processor executes the program, the following steps are implemented: a Raman spectroscopy surface scanning method is used to scan a source rock to be detected, and a plurality of scanning data are determined, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected; based on the plurality of scanning data, intensity values ​​of a plurality of scanning points on the source rock to be detected are determined, and an average of the plurality of scanning data is calculated, wherein the intensity values ​​are used to characterize the scanning results of the scanned points of the source rock to be detected; based on the average, the intensity values ​​of the plurality of scanning points are standardized to determine a target spectrum; based on the target spectrum, the maturity of the source rock to be detected is determined.

[0065] The present application also provides a computer program product, which, when executed on a data processing device, is suitable for executing a program that is initialized with the following method steps: using a Raman spectroscopy surface scanning method to scan the source rock to be detected, and determining a plurality of scanning data, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected; based on the plurality of scanning data, determining the intensity values ​​of a plurality of scanning points on the source rock to be detected, and obtaining the average of the plurality of scanning data, wherein the intensity value is used to characterize the scanning results of the scanned points of the source rock to be detected; based on the average, standardizing the intensity values ​​of the plurality of scanning points to determine a target spectrum; and based on the target spectrum, determining the maturity of the source rock to be detected.

[0066] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0067] In the above embodiments of the present invention, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0068] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only schematic. For example, the division of the units can be a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.

[0069] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0070] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0071] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, magnetic disk or optical disk and other media that can store program codes.

[0072] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principle of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.

Claims

1. A method for determining the maturity of source rocks based on Raman spectroscopy, characterized in that: include: Scanning the source rock to be detected by a Raman spectroscopy surface scanning method to determine a plurality of scanning data, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected; Based on the multiple scanning data, determine the intensity values ​​of multiple scanning points on the source rock to be detected, and calculate the average of the multiple scanning data, wherein the intensity value is used to characterize the scanning result of the scanned point of the source rock to be detected; Based on the mean value, the intensity values ​​of the plurality of scanning points are standardized to determine a target spectrum; Based on the target spectrum, the maturity of the source rock to be detected is determined.

2. The method according to claim 1, characterized in that The Raman spectroscopy surface scanning method is used to scan the source rock to be detected, and multiple scanning data are determined, including: Acquire a source rock sample, and pre-process the source rock sample to determine the source rock to be detected, wherein the pre-processing includes: source rock thickness processing and source rock side length processing; The source rock to be detected is scanned by a laser confocal Raman spectrometer to determine the scanning data, wherein the excitation wavelength of the laser confocal Raman spectrometer is 532nm, the acquisition time is 20s, and the wave number range is 1000-2000cm -1 .

3. The method according to claim 1, characterized in that Before determining the intensity value of the scan data and obtaining the average value of the scan data, the method further includes: Based on the plurality of scanning data, determining an initial spectral curve; Performing a baseline calibration process on the initial spectral curve based on a preset baseline to determine an initial spectral curve after the baseline calibration process; A plurality of target scanning data corresponding to the initial spectral curve after the baseline calibration process is determined, wherein the plurality of target scanning data are the plurality of scanning data after the baseline calibration process.

4. The method according to claim 3, characterized in that The step of normalizing the intensity value based on the mean value to determine the target spectrum includes: determining a standard deviation based on the intensity values ​​and the mean; Based on the standard deviation and the mean, the intensity value is standardized to determine a standardized intensity value; Based on the normalized intensity values, the target spectrum is determined.

5. The method according to any one of claims 1 to 4, characterized in that Determining the maturity of the source rock to be detected based on the target spectrum includes: Determining a first peak and a second peak of the target spectrum, wherein the first peak is smaller than the second peak; A peak difference between the second peak and the first peak is obtained, and the peak difference is used to represent the maturity of the source rock to be detected.

6. A device for determining the maturity of source rocks based on Raman spectroscopy, characterized in that: include: A scanning module, used for scanning the source rock to be detected by using a Raman spectroscopy surface scanning method to determine a plurality of scanning data, wherein the Raman spectroscopy surface scanning method is used to analyze the structural data of the source rock to be detected; A first determination module is used to determine the intensity values ​​of multiple scanning points on the source rock to be detected based on the multiple scanning data, and to obtain the average of the multiple scanning data, wherein the intensity value is used to characterize the scanning result of the scanned point of the source rock to be detected; A processing module, configured to perform standardization processing on the intensity values ​​of the plurality of scanning points based on the mean value to determine a target spectrum; The second determination module is used to determine the maturity of the source rock to be detected based on the target spectrum.

7. A non-volatile storage medium, characterized in that: The non-volatile storage medium stores a plurality of instructions, and the instructions are suitable for being loaded by a processor and executing the method for determining the maturity of a source rock based on Raman spectroscopy as described in any one of claims 1 to 5.

8. A processor, characterized in that: The processor is used to run a program, wherein the program is configured to execute the method for determining the maturity of a source rock based on Raman spectroscopy as described in any one of claims 1 to 5 when running.

9. An electronic device, comprising a memory and a processor, characterized in that: The memory stores a computer program, and the processor is configured to run the computer program to execute the method for determining the maturity of a source rock based on Raman spectroscopy as described in any one of claims 1 to 5.

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