Alarm lamp tracing point control method and device for simulation cabinet, medium and product

Abstract

The invention relates to the field of alarm lamp point tracing control, in particular to an alarm lamp point tracing control method and device for a simulation cabinet, a medium and a product, and the method comprises the steps: obtaining the fault position and fault parameter information of abnormal equipment when the abnormal equipment is detected, the fault parameter information comprises fault types, exception duration and the number of associated devices, and the fault types comprise temperature exception, storage exception, power supply exception and network exception; determining a corresponding influence score based on the fault parameter information, and determining a corresponding point tracing area of the abnormal equipment in the simulation cabinet based on the influence score and the fault position, the point tracing area being an area in an alarm lamp array in the simulation cabinet; based on a fault type corresponding to the fault parameter information, determining a tracing point color and a tracing point color depth; and controlling a point tracing area corresponding to the abnormal equipment based on the point tracing color and the point tracing color depth. According to the invention, the accuracy of dotting control of the alarm lamp is improved.

Description

Technical Field

[0001] The present application relates to the field of alarm light tracing control, and in particular to an alarm light tracing control method, device, medium and product for a simulated cabinet. Background Art

[0002] The alarm light on the simulated cabinet is a warning device used to indicate the operating status or abnormal conditions of the equipment in the computer room. When the simulated cabinet is used to detect the operating status of the equipment in the computer room, it is convenient to quickly detect the abnormality when the equipment in the computer room has an abnormality, and promptly notify the relevant operation and maintenance personnel through the alarm system to quickly respond to and handle the abnormal situation, thereby reducing the impact of equipment damage on the stable operation and data security of other equipment in the computer room.

[0003] Traditional point-tracing control methods often rely on preset fixed thresholds to determine the status of equipment and trigger corresponding alarm signals. However, with the continuous expansion of the scale of data centers and the increase in the number and types of equipment in cabinets, this method of only using fixed thresholds to determine the status of equipment and trigger corresponding alarm signals has certain limitations when facing complex and changeable operating environments. Therefore, it may lead to lower accuracy in point-tracing control of alarm lights, which may affect the immediacy of feedback of abnormal situations. Summary of the invention

[0004] In order to improve the accuracy of point tracing control of warning lights, embodiments of the present application provide a method, device, medium and product for controlling point tracing of warning lights of a simulated cabinet.

[0005] In a first aspect, the present application provides a method for controlling the alarm light points of a simulated cabinet, which adopts the following technical solution: A method for controlling the point drawing of an alarm light of a simulated cabinet, comprising: When an abnormal device is detected, the fault location and fault parameter information of the abnormal device are obtained, wherein the fault parameter information includes the fault type, duration of the abnormality, and the number of associated devices, wherein the fault type includes temperature abnormality, storage abnormality, power supply abnormality, and network abnormality; Determine a corresponding impact score based on the fault parameter information, and determine a corresponding dotted area of ​​the abnormal device in the simulated cabinet based on the impact score and the fault location, wherein the dotted area is an area in the alarm light array in the simulated cabinet; Determine the color and depth of the plotted points based on the fault type corresponding to the fault parameter information; A marking area corresponding to the abnormal device is controlled based on the marking color and the marking color depth.

[0006] By adopting the above technical solution, by analyzing the fault location and fault parameter information of the abnormal equipment, it is convenient to quantitatively evaluate the impact caused by the failure of the abnormal equipment, and it is also convenient for relevant personnel to intuitively analyze and view the abnormal situation, and then determine the tracing area corresponding to the abnormal equipment through the impact score obtained after the quantitative evaluation, so as to improve the adaptability between the tracing area and the abnormal situation, that is, it is convenient to improve the accuracy of determining the tracing area. In addition, the warning light in the tracing area is controlled based on the warning light color and color depth that are adapted to the abnormal situation, that is, different fault urgency and types are reflected by warning lights of different colors and different color depths, so as to enrich the display method of the warning light in the tracing area, thereby also facilitating the improvement of the accuracy of the tracing control of the warning light, and then facilitating the relevant operation and maintenance personnel to quickly identify and locate the abnormal equipment, and take corresponding measures based on the display color and color depth of the warning light in the tracing area.

[0007] In a possible implementation manner, determining a corresponding impact score based on the fault parameter information includes: Based on the fault parameter information and the preset star diagram, determine the abnormal star diagram corresponding to the abnormal device, each data axis in the abnormal star diagram corresponds to a fault parameter, and the fault point on the data axis represents the fault value of the corresponding fault parameter; Connecting all fault points included in the abnormal star diagram to obtain a fault connection area, and determining the fault area of ​​the fault connection area based on the fault value corresponding to each fault point; Based on the fault region area and score mapping relationship, the impact score corresponding to the fault region area is determined, and the score mapping relationship is the corresponding relationship between the fault region area and the impact score.

[0008] By adopting the above technical solution, by organizing the fault parameter information corresponding to the abnormal equipment into an abnormal star diagram, it is convenient to intuitively display the different fault parameters corresponding to the abnormal equipment, and can also intuitively display the fault degree of each fault parameter. In addition, by connecting all the fault points in the abnormal star diagram and calculating the area of ​​the fault region, it is convenient to comprehensively analyze the overall impact between different fault parameters. Finally, by quantifying the area of ​​the fault region to determine the corresponding impact score, it is convenient to improve the efficiency and accuracy of analyzing and processing the fault parameter information.

[0009] In one possible implementation, the method further includes: Acquire network topology connection information corresponding to the simulated cabinet, and determine the association level between the abnormal device and each associated device based on the network topology connection information; Determine the impact level corresponding to each fault type based on the fault type and impact level mapping relationship, wherein the impact level mapping relationship is the corresponding relationship between the fault type and the impact level; Based on the association level and the impact level, determining the impact level of each associated device, and determining the color depth of the associated plot point corresponding to the associated warning light of each associated device based on each impact level; Based on the color depth of the associated plotting point of each associated device, the associated warning light corresponding to each associated device in the plotting point area is controlled.

[0010] By adopting the above technical solution, by analyzing and determining the association level between the abnormal device and each associated device, and the impact level corresponding to the fault type of the abnormal device, it is convenient to analyze the impact degree of the associated device. Since the association level between different associated devices and the abnormal device may be different, by setting different display colors for the warning lights corresponding to the associated devices suffering from different impact degrees, it is convenient to improve the richness of the warning light display in the plotted area. In addition, it is also convenient for relevant operation and maintenance personnel to intuitively view the impact of different associated devices.

[0011] In one possible implementation, the method further includes: When the color depth of the tracing point corresponding to the abnormal device is higher than the preset color depth, the cyclic flashing frequency corresponding to the tracing point color depth is determined based on the mapping relationship between the tracing point color depth and the cyclic flashing frequency, wherein the cyclic flashing frequency mapping relationship is the corresponding relationship between the tracing point color depth and the cyclic flashing frequency; Determine the lighting order of the associated warning lights corresponding to each associated device based on the impact degree corresponding to each associated device; Based on the cyclic flashing frequency and the lighting order of each associated device, the associated warning lights contained in the plotted area are controlled.

[0012] By adopting the above technical solution, the color depth of the tracing points corresponding to the abnormal devices is analyzed, and when the color depth of the tracing points is high, the lighting sequence and the cycle flashing frequency of the associated devices in the tracing point area are adjusted in time, thereby facilitating the timeliness of the discovery of abnormal situations.

[0013] In one possible implementation, the method further includes: Identify the number of warning lights included in the plotted area; When the number of the warning lights is higher than a first preset threshold, determining a target flickering frequency corresponding to the impact score based on the mapping relationship between the impact score and the flickering frequency, wherein the flickering frequency mapping relationship is a corresponding relationship between the impact score and the target flickering frequency; A target warning light corresponding to the abnormal device is identified from the plotted area, and the target warning light is controlled based on the target flashing frequency.

[0014] By adopting the above technical solution, when there are a large number of warning lights in the marking area, the target flashing frequency of the target warning light corresponding to the abnormal equipment is increased, so that the relevant operation and maintenance personnel can locate the abnormal equipment in the marking area in a timely and accurate manner. In addition, the corresponding target flashing frequency is determined by the impact score of the abnormal equipment, so that the relevant operation and maintenance personnel can accurately locate the abnormal situation of the abnormal equipment by checking the flashing frequency.

[0015] In one possible implementation, the method further includes: When the number of the warning lights is higher than a second preset threshold, identifying the color depth of the associated plotted points corresponding to the associated warning lights of each associated device; Based on the color depth of the associated plotted points corresponding to each associated device, an indicator light array area is determined, wherein the average color depth corresponding to the color depth of the associated plotted points of all associated warning lights in the indicator light array area is lower than a preset average threshold; Based on the fault location and the preset guide mark, the warning light guide mark is controlled to be displayed in the indicator light array area, and the displayed warning light guide mark points to the target warning light.

[0016] By adopting the above technical solution, when there are a large number of warning lights in the tracing area, the warning light guide mark is displayed based on the fault position of the abnormal equipment, so that the relevant operation and maintenance personnel can accurately locate the abnormal equipment from the tracing area. In addition, the indicator light array area is determined by analyzing the color depth of the associated tracing points of the associated warning lights, rather than randomly displaying the warning light guide mark from the tracing area. This is convenient for guiding the fault position of the abnormal equipment and avoiding blocking the fault conditions of more important associated equipment.

[0017] In a second aspect, the present application provides an electronic device, which adopts the following technical solution: An electronic device, comprising: at least one processor; Memory; At least one application, wherein the at least one application is stored in a memory and configured to be executed by at least one processor, and the at least one application is configured to: execute the above-mentioned alarm light tracing control method for a simulated cabinet.

[0018] In a third aspect, the present application provides a computer-readable storage medium, which adopts the following technical solution: A computer-readable storage medium includes: a computer program that can be loaded by a processor and execute the above-mentioned alarm light tracing control method for a simulated cabinet.

[0019] In a fourth aspect, the present application provides a computer program product, which adopts the following technical solution: A computer program product includes a computer program, and when the computer program is executed by a processor, the computer program implements the above-mentioned alarm light tracing control method for a simulated cabinet.

[0020] In summary, the present application includes at least one of the following beneficial technical effects: By analyzing the fault location and fault parameter information of the abnormal equipment, it is convenient to quantitatively evaluate the impact of the abnormal equipment after the fault occurs, and it is also convenient for relevant personnel to intuitively analyze and view the abnormal situation. The impact score obtained after the quantitative evaluation is used to determine the tracing area corresponding to the abnormal equipment, so as to improve the adaptability between the tracing area and the abnormal situation, that is, it is convenient to improve the accuracy of determining the tracing area. In addition, the warning lights in the tracing area are controlled based on the warning light color and color depth that are compatible with the abnormal situation, that is, different fault urgency and types are reflected by warning lights of different colors and different color depths, so as to enrich the display method of the warning lights in the tracing area, thereby facilitating the improvement of the accuracy of tracing control of the warning lights, and then facilitating the relevant operation and maintenance personnel to quickly identify and locate the abnormal equipment, and take corresponding measures based on the display color and color depth of the warning lights in the tracing area.

[0021] When there are a large number of warning lights in the marking area, the warning light guide mark is displayed based on the fault position of the abnormal equipment, so that the relevant operation and maintenance personnel can accurately locate the abnormal equipment from the marking area. In addition, the indicator light array area is determined by analyzing the color depth of the associated marking points of the associated warning lights, rather than randomly displaying the warning light guide mark from the marking area. This is convenient for guiding the fault position of the abnormal equipment and avoiding blocking the fault conditions of more important associated equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a flow chart of a method for controlling the alarm light points of a simulated cabinet in an embodiment of the present application; Figure 2 It is a schematic diagram of a process for determining a warning light guidance mark in an embodiment of the present application; Figure 3 It is a structural schematic diagram of an electronic device in an embodiment of the present application. DETAILED DESCRIPTION

[0023] The following is combined with Figure 1-3 This application is described in further detail.

[0024] After reading this specification, those skilled in the art may make non-creative modifications to this embodiment as needed, but such modifications are protected by patent law as long as they are within the scope of the claims of this application.

[0025] In order to make the purpose, technical solution and advantages of the embodiments of the present application clearer, the technical solution in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0026] It should be noted that in the optional embodiments of the present application, the object information and other related data involved, when the embodiments in the present application are applied to specific products or technologies, need to obtain the permission or consent of the object, and the collection, use and processing of the relevant data need to comply with the relevant laws, regulations and standards of the relevant countries and regions. In other words, if the embodiments of the present application involve data related to the object, it needs to be obtained with the authorization and consent of the object, the authorization and consent of the relevant departments, and in compliance with the relevant laws, regulations and standards of the country and region. If personal information is involved in the embodiments, the acquisition of all personal information needs to obtain the consent of the individual. If sensitive information is involved, the separate consent of the information subject needs to be obtained. The embodiments also need to be implemented with the authorization and consent of the object.

[0027] Specifically, the embodiment of the present application provides a method for controlling the alarm light tracing points of a simulated cabinet, which is executed by an electronic device, which can be a server or a terminal device, wherein the server can be an independent physical server, or a server cluster or distributed system composed of multiple physical servers, or a cloud server providing cloud computing services. The terminal device can be a smart phone, a tablet computer, a laptop computer, a desktop computer, etc., but is not limited thereto. The terminal device and the server can be directly or indirectly connected via wired or wireless communication, which is not limited in the embodiment of the present application.

[0028] refer to Figure 1 , Figure 1 1 is a flow chart of a method for controlling alarm light points of a simulated cabinet in an embodiment of the present application, the method comprising S101-S104, wherein: S101: When an abnormal device is detected, the fault location and fault parameter information of the abnormal device are obtained. The fault parameter information includes the fault type, duration of the abnormality, and the number of associated devices. The fault types include temperature abnormality, storage abnormality, power abnormality, and network abnormality.

[0029] Specifically, the abnormal equipment in the computer room can be promptly identified by monitoring and analyzing the computer room work log, wherein the computer room work log generally contains information such as the status, operation, maintenance activities and possible fault reports of each computer room equipment in daily operation, and the method of detecting abnormal equipment is not specifically limited in the embodiments of this application. The fault location of the abnormal equipment is the location where the abnormal equipment is set in the simulated cabinet. Since there are a large number of simulated cabinets in the computer room, and each simulated cabinet generally contains multiple devices, it is impossible to promptly and accurately locate the abnormal equipment based solely on the fault location of the abnormal equipment.

[0030] Different fault types have different characteristics. For example, when the operating temperature of a device deviates from the optimal range required for standard operation, the fault type of the device can be determined to be abnormal temperature. Too high a temperature may cause the device to overheat and automatically shut down or be damaged. Too low a temperature may cause the internal parts of the device to deform, affecting normal operation. When the work log of the computer room detects that a device has data loss, reduced read and write performance, self-test or diagnostic tools report faults or signs of physical damage, the fault type of the device can be determined to be storage abnormality. For business systems that rely on data storage, storage abnormalities will cause service interruptions. When the work log of the computer room detects that a device has power outages, abnormal power indicator lights, voltage fluctuations, abnormal current, UPS failures, PDU failures, frequent device restarts, or power failure alarms, the fault type of the device can be determined to be power abnormality. Sudden power outages may damage storage devices such as hard disks, resulting in data loss. When the work log of the computer room detects that a device has network connection interruptions, network protocol problems, network security problems, and abnormal prompts from network diagnostic tools, the fault type of the device can be determined to be network abnormality.

[0031] Since the operation of monitoring and analyzing the work log of the computer room is not carried out in real time, when an abnormal device is detected, the abnormal situation of the abnormal device may have lasted for a period of time, and the duration of abnormality corresponding to different abnormal devices is different. Due to the different functions, interface types and communication protocols of different devices in the computer room, different devices have different associated devices, that is, different devices may also have different numbers of associated devices.

[0032] S102: Determine a corresponding impact score based on the fault parameter information, and determine a corresponding dotted area of ​​the abnormal device in the simulated cabinet based on the impact score and the fault location, where the dotted area is an area in the alarm light array in the simulated cabinet.

[0033] Specifically, the fault parameter information includes different fault parameters and fault values ​​corresponding to each fault parameter. When determining the corresponding impact score based on the fault parameter information, it can be determined based on the different fault parameters and the fault values ​​corresponding to each fault parameter, and the score mapping relationship corresponding to each fault parameter. Finally, the sub-impact scores corresponding to all fault parameters are integrated to obtain the impact score, wherein the score mapping relationship corresponding to each fault parameter includes sub-impact scores corresponding to different fault values. Each score mapping relationship can be determined by relevant staff based on historical experimental data and uploaded to the electronic device. The specific content is not specifically limited in the embodiments of the present application.

[0034] Furthermore, in order to improve the efficiency and accuracy of analyzing and processing the fault parameter information, determining the corresponding impact score based on the fault parameter information may specifically include: Based on the fault parameter information and the preset star diagram, determine the abnormal star diagram corresponding to the abnormal equipment, each data axis in the abnormal star diagram corresponds to a fault parameter, and the fault point on the data axis represents the fault value of the corresponding fault parameter; connect all the fault points contained in the abnormal star diagram to obtain the fault connection area, and determine the fault area area of ​​the fault connection area based on the fault value corresponding to each fault point; based on the mapping relationship between the fault area area and the score, determine the impact score corresponding to the fault area area, and the score mapping relationship is the corresponding relationship between the fault area area and the impact score.

[0035] Specifically, the preset star diagram contains multiple data axes. The number of data axes contained in the preset star diagram may be consistent with the number of fault parameters contained in the fault parameter information, or may not be consistent. The preset star diagram needs to be adjusted according to the fault parameter information. The number of data axes contained in the abnormal star diagram corresponding to the abnormal device is consistent with the number of fault parameters, and each data axis corresponds to a fault parameter. Since different data axes correspond to different fault parameters, the set fault intervals corresponding to different data axes are also different. For example, the set fault interval corresponding to data axis a is 5 degrees, and the set fault interval corresponding to data axis b is 10 seconds. According to the fault parameter information, the fault value is written into the corresponding data axis in the preset star diagram to obtain the abnormal star diagram.

[0036] The abnormal star diagram contains multiple fault points, each data axis corresponds to a fault point, and after connecting each fault point in sequence, the fault connection area corresponding to the abnormal equipment can be obtained. After normalizing the fault coordinates corresponding to each fault point, the fault normalized coordinates corresponding to each fault point can be obtained. According to each fault normalized coordinate corresponding to the fault connection area, the corresponding fault area is calculated. The larger the fault area, the higher the corresponding impact score, which can be determined based on the score mapping relationship, wherein the score mapping relationship is the correspondence between the fault area and the impact score. The specific content is not specifically limited in the embodiment of the present application, and can be determined by relevant staff based on historical experimental data and uploaded to the electronic device.

[0037] After determining the impact score corresponding to the fault parameter information, the area corresponding to the impact score can be determined based on the area mapping relationship, and then the plotted area can be determined based on the fault location and the area. The center of the plotted area is the warning light corresponding to the abnormal device, and the area corresponding to the plotted area is the area of ​​the area. Each device in the simulated cabinet corresponds to at least one warning light, and all the warning lights constitute the warning light array of the simulated cabinet. The plotted area is part of the warning light array.

[0038] S103: Determine the color and depth of the plotted points based on the fault type corresponding to the fault parameter information.

[0039] Specifically, different dot colors are used to represent different fault types. For example, red can be used to represent fault type a, green can be used to represent fault type b, and yellow can be used to represent fault type c. Different fault types are distinguished by dot colors, which is convenient for relevant staff to directly determine the corresponding fault type based on the dot color of the dot area. When the fault type is determined, the different severity levels can also be represented by the dot color depth. The corresponding dot color depth can be determined based on the duration of the abnormality and the number of associated devices and the depth correspondence. The longer the duration of the abnormality and the greater the number of associated devices, the deeper the corresponding dot color depth. The depth correspondence contains dot color depths corresponding to different durations of the abnormality and different numbers of associated devices, which can be determined by relevant staff based on historical experimental data and uploaded to the electronic device. The specific content is not specifically limited in the embodiments of this application.

[0040] S104: Controlling the plotting area corresponding to the abnormal device based on the plotting color and the plotting color depth.

[0041] Specifically, the tracing area is controlled based on the tracing color and the tracing color depth, that is, the warning lights in the tracing area are controlled to light up based on the tracing color and the tracing color depth, so as to prompt relevant operation and maintenance personnel to discover abnormal situations in time.

[0042] For the embodiments of the present application, by analyzing the fault location and fault parameter information of the abnormal equipment, it is convenient to quantitatively evaluate the impact caused by the failure of the abnormal equipment, and it is also convenient for relevant personnel to intuitively analyze and view the abnormal situation, and then determine the tracing area corresponding to the abnormal equipment through the impact score obtained after the quantitative evaluation, so as to improve the adaptability between the tracing area and the abnormal situation, that is, it is convenient to improve the accuracy when determining the tracing area. In addition, the warning lights in the tracing area are controlled based on the warning light color and color depth that are adapted to the abnormal situation, that is, different fault urgency and types are reflected by warning lights of different colors and different color depths, so as to enrich the display method of the warning lights in the tracing area, thereby also facilitating the improvement of the accuracy of the tracing control of the warning lights, and then facilitating the relevant operation and maintenance personnel to quickly identify and locate the abnormal equipment, and take corresponding measures based on the display color and color depth of the warning lights in the tracing area.

[0043] Furthermore, the tracing area may include only the warning light corresponding to the abnormal device, or may include multiple warning lights. When the tracing area includes multiple warning lights, the method provided in the embodiment of the present application further includes: The network topology connection information corresponding to the simulated cabinet is obtained, and the association level between the abnormal device and each associated device is determined based on the network topology connection information; based on the mapping relationship between the fault type and the impact level, the impact level corresponding to each fault type is determined, and the impact level mapping relationship is the corresponding relationship between the fault type and the impact level; based on the association level and the impact level, the degree of impact of each associated device is determined, and based on each degree of impact, the color depth of the associated drawing point of the associated alarm light corresponding to each associated device is determined; based on the color depth of the associated drawing point of each associated device, the associated alarm light corresponding to each associated device in the drawing area is controlled.

[0044] Specifically, the location and connection relationship of each device in the simulated cabinet in the network can be analyzed through the network topology connection information. The association level between the abnormal device and each other device can be determined based on the level, distance and connection path of each device in the network. The warning lights corresponding to other devices and the warning lights corresponding to the abnormal device together constitute the point drawing area. Among them, the network topology connection information corresponding to the simulated cabinet can be sorted by relevant staff and uploaded to the electronic device. The topology structure corresponding to the network topology connection information can be star, ring, bus, tree, or mesh. The specific topology structure is not specifically limited in the embodiment of this application, as long as it can characterize the connection relationship between the various devices in the simulated cabinet.

[0045] Devices that are directly or indirectly associated with abnormal devices and whose corresponding associated warning lights are located in the plotted area are associated devices of the abnormal devices. Devices that are directly connected to the abnormal devices have the highest corresponding association level. Devices that are indirectly connected to the abnormal devices through other devices have corresponding association levels that need to be determined based on the complexity and length of the connection path. The higher the complexity and the longer the path length, the smaller the corresponding association level. When determining the complexity of the connection path, the connection path between the abnormal device and the associated device can be determined first, and the number of devices passed in the connection path, the degree of connectivity corresponding to each passed device, and the number of loops can be counted. The more devices passed, the higher the degree of connectivity, and the larger the number of loops, the smaller the corresponding association level. The complexity of the corresponding connection path can be determined based on the complexity correspondence relationship. The complexity correspondence relationship includes different complexities corresponding to the number of devices passed, the degree of connectivity, and the number of loops. The specific content is not specifically limited in the embodiments of the present application and can be modified by relevant technical personnel according to actual needs.

[0046] Different fault types correspond to different impact levels, that is, different fault types of abnormal devices generate different fault impact values. For example, when the fault type is a, the fault impact value generated by the abnormal device may be 80; when the fault type is b, the fault impact value generated by the abnormal device may be 60; when the fault type is c, the fault impact value generated by the abnormal device may be 100. The impact levels corresponding to different fault types can be determined according to the impact level mapping relationship. The higher the impact level, the higher the corresponding fault impact value.

[0047] The impact absorption rates corresponding to different association levels are also different. For example, the impact absorption rate of the first-level association level is 80%, that is, when the association level between the associated device and the abnormal device is the first-level association level, the associated device will absorb 80% of the fault impact value caused by the abnormal device; the impact absorption rate of the second-level association level is 60%, that is, when the association level between the associated device and the abnormal device is the second-level association level, the associated device will absorb 60% of the fault impact value caused by the abnormal device. After determining the association level corresponding to each associated device, based on the impact absorption rate corresponding to each association level and the fault impact value corresponding to the fault type of the abnormal device, the affected fault value of each associated device is determined. The affected fault value is the result of multiplying the impact absorption rate and the fault impact value.

[0048] The higher the affected fault value, the higher the corresponding affected degree. The corresponding relationship between the affected fault value and the affected degree is not specifically limited in the embodiment of the present application, and can be determined by relevant staff based on historical experimental data and uploaded to the electronic device. After determining the affected degree corresponding to each associated device, the associated plotting color depth of the associated warning light in the plotting area is adjusted based on the affected degree, instead of using the plotting color depth consistent with the corresponding warning light of the abnormal device. For example, when the color of the plotting area corresponding to the abnormal device is red, the plotting color depth of the corresponding warning light of the abnormal device can correspond to positive red, while the color corresponding to the plotting color depth of the corresponding warning light of the associated device a can be coral red, and the color corresponding to the plotting color depth of the corresponding warning light of the associated device b can be pink, wherein the affected degree corresponding to the associated device a is higher than the affected degree corresponding to the associated device b, and therefore, the associated plotting color depth corresponding to the associated device a is higher than the associated plotting color depth corresponding to the associated device b. The color depth of the associated plotted points corresponding to different degrees of influence can be determined based on the depth mapping relationship. The depth mapping relationship is the correspondence between the degree of influence and the color depth of the associated plotted points. The specific content of the depth mapping relationship is not specifically limited in the embodiments of the present application and can be determined by relevant staff based on historical experimental data and uploaded to the electronic device.

[0049] By setting different display colors for the warning lights corresponding to the associated devices that are affected to different degrees, it is convenient to improve the richness of the warning light display in the plotted area. In addition, it is also convenient for relevant operation and maintenance personnel to intuitively view the impact of different associated devices.

[0050] Furthermore, in order to improve the timeliness of the discovery of abnormal situations, when the color depth of the tracing point corresponding to the abnormal device is higher than the preset color depth, the cyclic flashing frequency corresponding to the tracing point color depth is determined based on the mapping relationship between the tracing point color depth and the cyclic flashing frequency, and the cyclic flashing frequency mapping relationship is the correspondence between the tracing point color depth and the cyclic flashing frequency; based on the corresponding degree of impact of each associated device, the lighting order of the associated warning lights corresponding to each associated device is determined; based on the cyclic flashing frequency and the lighting order of each associated device, the associated warning lights contained in the tracing point area are controlled.

[0051] Specifically, the specific value of the preset color depth is not specifically limited in the embodiment of the present application. When the color depth of the mapping point corresponding to the abnormal device is higher than the preset color depth, the abnormal situation corresponding to the abnormal device may be more serious. At this time, the probability of the mapping area being discovered in time can be increased by adjusting the lighting order and cyclic flashing frequency of each associated warning light in the mapping area, rather than keeping it static.

[0052] The cyclic flashing frequency is the cyclic lighting cycle, that is, the interval to complete a cyclic lighting. The higher the color depth of the dot, the higher the corresponding cyclic flashing frequency. For example, when the color depth of the dot is a, the corresponding cyclic flashing frequency is 10 seconds / time. That is, when the color depth of the dot corresponding to the warning light of the abnormal device is detected to be a, the associated warning lights in the dot area are controlled to light up in sequence within 10 seconds and then all turned off, and then light up in sequence within the next 10 seconds until the dot area is discovered or responded to by relevant staff. The cyclic flashing frequency mapping relationship includes cyclic flashing frequencies corresponding to different dot color depths. The specific content is not specifically limited in the embodiments of this application and can be set by relevant technical personnel.

[0053] Different degrees of influence correspond to different lighting orders, and the degree of influence of the associated warning lights corresponding to the lighting order is from high to low. For example, there are 6 associated warning lights in the plotting area. The sequence of associated warning lights obtained by sorting the 6 associated warning lights from high to low according to the degree of influence is associated warning light a, associated warning light b, associated warning light c, associated warning light e, associated warning light f, associated warning light d, and associated warning light g. The lighting order corresponding to the 6 associated warning lights is also associated warning light a, associated warning light b, associated warning light c, associated warning light e, associated warning light f, associated warning light d, and associated warning light g. By analyzing the color depth of the plotting points corresponding to the abnormal equipment, and timely adjusting the lighting order and cyclic flashing frequency of the associated equipment in the plotting area when the color depth of the plotting points is high, it is convenient to improve the timeliness of abnormal situations being discovered.

[0054] Furthermore, in order to facilitate relevant operation and maintenance personnel to promptly and accurately locate abnormal devices in the mapping area, the method provided in the embodiment of the present application also includes: Identify the number of warning lights included in the dotted area; when the number of warning lights is higher than a first preset threshold, determine the target flashing frequency corresponding to the impact score based on the mapping relationship between the impact score and the flashing frequency, and the flashing frequency mapping relationship is the corresponding relationship between the impact score and the target flashing frequency; identify the target warning light corresponding to the abnormal device from the dotted area, and control the target warning light based on the target flashing frequency.

[0055] Specifically, when the number of warning lights in the mapping area is large, it may affect the timeliness and accuracy of the relevant operation and maintenance personnel in discovering the target warning lights corresponding to the abnormal equipment. Therefore, when the number of warning lights in the mapping area is higher than the first preset threshold, the target flashing frequency of the target warning light can be adjusted based on the impact score of the abnormal equipment. The higher the impact score, the higher the target flashing frequency corresponding to the target warning light. The flashing frequency mapping relationship includes target flashing frequencies corresponding to different impact scores, and the specific content is not specifically limited in the embodiments of the present application.

[0056] By increasing the target flashing frequency of the target warning light corresponding to the abnormal device when there are a large number of warning lights in the marking area, it is convenient for relevant operation and maintenance personnel to locate the abnormal device in the marking area in a timely and accurate manner. In addition, by determining the corresponding target flashing frequency through the impact score of the abnormal device, it is convenient for relevant operation and maintenance personnel to accurately locate the abnormal situation of the abnormal device by checking the flashing frequency.

[0057] Furthermore, the method provided in the embodiment of the present application further includes S201-S203, such as Figure 2 As shown, where: S201: When the number of warning lights is higher than a second preset threshold, identifying the color depth of the associated plotted points corresponding to the associated warning lights of each associated device.

[0058] S202: Determine an indicator light array area based on the color depth of the associated drawing points corresponding to each associated device, and indicate that a color depth average corresponding to the color depth of the associated drawing points of all associated warning lights in the indicator light array area is lower than a preset average threshold.

[0059] Specifically, the second preset threshold is higher than the first preset threshold, and the second preset threshold may be 15 or 20. The specific value of the second preset threshold is not specifically limited in the embodiment of the present application, and may be set by relevant technical personnel according to actual conditions. When the number of warning lights is higher than the second preset threshold, an indicator array area may be determined within the plotted area, and the indicator mark may be used to point to the target warning light corresponding to the abnormal device.

[0060] Since different associated plotted point color depths correspond to different degrees of influence, it is necessary to consider and analyze the associated plotted point color depth of each associated warning light when determining the indicator light array area, wherein multiple initial indicator light array areas can be determined from the plotted point area according to a preset indication standard, and then, based on the color depth average corresponding to each initial indicator light array area, the initial indicator light array area with a color depth average lower than a preset average threshold is determined as the indicator light area, wherein the preset indication standard can be determined by a preset guidance mark, that is, the minimum number of warning lights required to fully display the preset indication mark.

[0061] S203: Based on the fault location and the preset guide mark, a warning light guide mark is controlled to be displayed in the indicator light array area, and the displayed warning light guide mark points to the target warning light.

[0062] Specifically, the preset guide mark can be an arrow, a straight line, a curve, etc. The specific preset guide mark is not specifically limited in the embodiment of the present application, and can be set by relevant technical personnel according to actual needs. When there are a large number of warning lights in the tracing area, the warning light guide mark is displayed based on the fault position of the abnormal equipment, which is convenient for relevant operation and maintenance personnel to accurately locate the abnormal equipment from the tracing area. In addition, the indicator light array area is determined by analyzing the color depth of the associated tracing points of the associated warning lights, rather than randomly displaying the warning light guide mark from the tracing area. This is convenient for guiding the fault position of the abnormal equipment while avoiding blocking the fault conditions of more important associated equipment.

[0063] An electronic device is provided in an embodiment of the present application, such as Figure 3 As shown, Figure 3 The electronic device 300 shown includes: a processor 301 and a memory 303. The processor 301 and the memory 303 are connected, such as through a bus 302. Optionally, the electronic device 300 may also include a transceiver 304. It should be noted that in actual applications, the transceiver 304 is not limited to one, and the structure of the electronic device 300 does not constitute a limitation on the embodiments of the present application.

[0064] The processor 301 may be a CPU (Central Processing Unit), a general-purpose processor, a DSP (Digital Signal Processor), an ASIC (Application Specific Integrated Circuit), an FPGA (Field Programmable Gate Array) or other programmable logic devices, transistor logic devices, hardware components or any combination thereof. It may implement or execute various exemplary logic blocks, modules and circuits described in conjunction with the disclosure of this application. The processor 301 may also be a combination that implements computing functions, such as a combination of one or more microprocessors, a combination of a DSP and a microprocessor, etc.

[0065] The bus 302 may include a path to transmit information between the above components. The bus 302 may be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus. The bus 302 may be divided into an address bus, a data bus, a control bus, etc. For ease of representation, Figure 3 The fact that only one line is used in the diagram does not mean that there is only one bus or only one type of bus.

[0066] The memory 303 may be a ROM (Read Only Memory) or other types of static storage devices that can store static information and instructions, a RAM (Random Access Memory) or other types of dynamic storage devices that can store information and instructions, or an EEPROM (Electrically Erasable Programmable Read Only Memory), a CD-ROM (Compact Disc Read Only Memory) or other optical disk storage, optical disk storage (including compressed optical disk, laser disk, optical disk, digital versatile disk, Blu-ray disk, etc.), a magnetic disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store the desired program code in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto.

[0067] The memory 303 is used to store the application code for executing the solution of the present application, and the execution is controlled by the processor 301. The processor 301 is used to execute the application code stored in the memory 303 to implement the contents shown in the above method embodiment.

[0068] The electronic devices include, but are not limited to, mobile terminals such as mobile phones, laptop computers, digital broadcast receivers, PDAs (personal digital assistants), PADs (tablet computers), PMPs (portable multimedia players), vehicle-mounted terminals (such as vehicle-mounted navigation terminals), and fixed terminals such as digital TVs, desktop computers, etc. It can also be a server, etc. Figure 3 The electronic device shown is merely an example and should not bring any limitation to the functions and scope of use of the embodiments of the present application.

[0069] An embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored. When the computer-readable storage medium is run on a computer, the computer can execute the corresponding content in the aforementioned method embodiment.

[0070] The embodiment of the present application provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, the method in any of the above embodiments is implemented. Compared with the related art, in the embodiment of the present application, by analyzing the fault location and fault parameter information of the abnormal device, it is convenient to quantitatively evaluate the impact caused by the abnormal device after the fault occurs, and it is also convenient for relevant personnel to intuitively analyze and view the abnormal situation, and then determine the corresponding point drawing area of ​​the abnormal device by the impact score obtained after the quantitative evaluation, so as to improve the adaptability between the point drawing area and the abnormal situation, that is, to improve the accuracy of determining the point drawing area, and in addition, based on the color and color depth of the warning light adapted to the abnormal situation, the warning light in the point drawing area is controlled, that is, different fault urgency and types are reflected by warning lights of different colors and different color depths, so as to enrich the display mode of the warning light in the point drawing area, thereby also facilitating the improvement of the accuracy of the point drawing control of the warning light, and then facilitating the relevant operation and maintenance personnel to quickly identify and locate the abnormal device, and take corresponding measures based on the display color and color depth of the warning light in the point drawing area.

[0071] It should be understood that, although the steps in the flowchart of the accompanying drawings are displayed in sequence as indicated by the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least a part of the steps in the flowchart of the accompanying drawings may include multiple sub-steps or multiple stages, and these sub-steps or stages are not necessarily executed at the same time, but can be executed at different times, and their execution order is not necessarily sequential, but can be executed in turn or alternately with other steps or at least a part of the sub-steps or stages of other steps.

[0072] The above description is only a partial implementation method of the present application. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present application. These improvements and modifications should also be regarded as the scope of protection of the present application.

Claims

1. A method for controlling the alarm light points of a simulated cabinet, characterized in that: include: When an abnormal device is detected, the fault location and fault parameter information of the abnormal device are obtained, wherein the fault parameter information includes the fault type, duration of the abnormality, and the number of associated devices, wherein the fault type includes temperature abnormality, storage abnormality, power supply abnormality, and network abnormality; Determine a corresponding impact score based on the fault parameter information, and determine a corresponding dotted area of ​​the abnormal device in the simulated cabinet based on the impact score and the fault location, wherein the dotted area is an area in the alarm light array in the simulated cabinet; Determine the color and depth of the plotted points based on the fault type corresponding to the fault parameter information; A marking area corresponding to the abnormal device is controlled based on the marking color and the marking color depth.

2. According to the method for controlling the alarm light points of a simulated cabinet according to claim 1, it is characterized in that: Determining a corresponding impact score based on the fault parameter information includes: Based on the fault parameter information and the preset star diagram, determine the abnormal star diagram corresponding to the abnormal device, each data axis in the abnormal star diagram corresponds to a fault parameter, and the fault point on the data axis represents the fault value of the corresponding fault parameter; Connecting all fault points included in the abnormal star diagram to obtain a fault connection area, and determining the fault area of ​​the fault connection area based on the fault value corresponding to each fault point; Based on the fault region area and score mapping relationship, the impact score corresponding to the fault region area is determined, and the score mapping relationship is the corresponding relationship between the fault region area and the impact score.

3. The method for controlling the alarm light points of a simulated cabinet according to claim 1, characterized in that: Also includes: Acquire network topology connection information corresponding to the simulated cabinet, and determine the association level between the abnormal device and each associated device based on the network topology connection information; Determine the impact level corresponding to each fault type based on the mapping relationship between the fault type and the impact level, wherein the impact level mapping relationship is the corresponding relationship between the fault type and the impact level; Based on the association level and the impact level, determining the impact level of each associated device, and determining the color depth of the associated plot point corresponding to the associated warning light of each associated device based on each impact level; Based on the color depth of the associated plotting point of each associated device, the associated warning light corresponding to each associated device in the plotting point area is controlled.

4. The method for controlling the alarm light points of a simulated cabinet according to claim 3 is characterized in that: Also includes: When the color depth of the tracing point corresponding to the abnormal device is higher than the preset color depth, the cyclic flashing frequency corresponding to the tracing point color depth is determined based on the mapping relationship between the tracing point color depth and the cyclic flashing frequency, wherein the cyclic flashing frequency mapping relationship is the corresponding relationship between the tracing point color depth and the cyclic flashing frequency; Determine the lighting order of the associated warning lights corresponding to each associated device based on the impact degree corresponding to each associated device; Based on the cyclic flashing frequency and the lighting order of each associated device, the associated warning lights contained in the plotted area are controlled.

5. The method for controlling the alarm light points of a simulated cabinet according to claim 3 is characterized in that: Also includes: Identify the number of warning lights included in the plotted area; When the number of the warning lights is higher than a first preset threshold, determining a target flickering frequency corresponding to the impact score based on the mapping relationship between the impact score and the flickering frequency, wherein the flickering frequency mapping relationship is a corresponding relationship between the impact score and the target flickering frequency; A target warning light corresponding to the abnormal device is identified from the plotted area, and the target warning light is controlled based on the target flashing frequency.

6. The method for controlling the alarm light points of a simulated cabinet according to claim 5, characterized in that: Also includes: When the number of the warning lights is higher than a second preset threshold, identifying the color depth of the associated plotted points corresponding to the associated warning lights of each associated device; Based on the color depth of the associated plotted points corresponding to each associated device, an indicator light array area is determined, wherein the color depth average corresponding to the color depth of the associated plotted points of all associated warning lights in the indicator light array area is lower than a preset average threshold value; Based on the fault location and the preset guide mark, the warning light guide mark is controlled to be displayed in the indicator light array area, and the displayed warning light guide mark points to the target warning light.

7. An electronic device, characterized in that: The electronic device includes: at least one processor; Memory; At least one application, wherein the at least one application is stored in a memory and configured to be executed by at least one processor, and the at least one application is configured to: execute a warning light tracing control method for a simulated cabinet as described in any one of claims 1-6.

8. A computer-readable storage medium, characterized in that: include: A computer program is stored which can be loaded by a processor and execute a method for controlling the tracing points of an alarm light for a simulated cabinet as described in any one of claims 1 to 6.

9. A computer program product, characterized in that It includes a computer program, which, when executed by a processor, implements the steps of a method for controlling alarm light tracing points of a simulated cabinet according to any one of claims 1 to 6.

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