Power supply circuit, device and method, storage medium and test station

Abstract

The invention relates to the technical field of electronic circuits, and discloses a power supply circuit, device and method, a storage medium and a test workstation, and the circuit comprises a first switching module and an auxiliary power supply; the first switching module is respectively connected with a product to be tested, a first system power supply of the test station and an auxiliary power supply; the first switching module is used for disconnecting a loop between the first system power supply and the to-be-tested product and conducting a loop between the auxiliary power supply and the to-be-tested product for power supply when the current test station finishes the test; and the first switching module is also used for disconnecting the loop between the auxiliary power supply and the to-be-tested product when the to-be-tested product arrives at the next test station, and conducting the loop between the first system power supply and the to-be-tested product for power supply, so that the next test station tests the to-be-tested product. Compared with the prior art, the product to be tested does not need to be powered off and powered on again, and the test efficiency is improved.

Description

Technical Field

[0001] The present application relates to the field of electronic circuit technology, and in particular to a power supply circuit, device, method, storage medium and test station. Background Art

[0002] With the popularization of automated assembly line testing of embedded products (Device Under Test, DUT), DUT needs to be tested for function and performance at multiple test stations. There will be a power-on startup process during the transfer between test stations, that is, when the transfer carrier carrying DUT arrives at a test station, it needs to be connected to the system power supply of the test station first, so that the DUT is powered on and started, and then tested in the test station. After the test is completed, the connection with the system power supply of the test station is disconnected, the DUT is powered off and transported to the next test station via the transfer carrier, and the above process is repeated until it passes through all test stations.

[0003] However, it takes about 1 to 2 minutes to power on the existing DUT, which results in a lot of time being wasted during the process, greatly reducing the test efficiency. Therefore, how to achieve uninterrupted power supply to the DUT is an urgent problem to be solved. Summary of the invention

[0004] The main purpose of the present application is to provide a power supply circuit, device, method, storage medium and test station, aiming to solve the existing technical problem of how to achieve uninterrupted power supply to DUT.

[0005] To achieve the above object, the present application provides a power supply circuit, the circuit comprising: a first switching module and an auxiliary power supply;

[0006] The first switching module is respectively connected to the product to be tested, the first system power supply of the test station and the auxiliary power supply;

[0007] The first switching module is used to disconnect the circuit between the first system power supply and the product to be tested, and to connect the circuit between the auxiliary power supply and the product to be tested for power supply when the test of the current test station is completed;

[0008] The first switching module is also used to disconnect the circuit between the auxiliary power supply and the product to be tested, and to connect the circuit between the first system power supply and the product to be tested to provide power when the product to be tested arrives at the next test station, so that the next test station can test the product to be tested.

[0009] In one embodiment, the circuit further includes: a gap compensation module and a second switching module;

[0010] The second switching module is respectively connected to the gap compensation module, the product to be tested and the first switching module;

[0011] The second switching module is used to conduct the circuit between the gap compensation module and the product to be tested before the circuit between the first system power supply and the product to be tested is disconnected, so that the gap compensation module can supply power to the product to be tested when the circuit between the first system power supply and the product to be tested is disconnected;

[0012] The second switching module is further used to disconnect the circuit between the gap compensation module and the product to be tested after the circuit between the first system power supply and the product to be tested is connected.

[0013] In one embodiment, the second switching module is further used to connect the loop between the gap compensation module and the first switching module when the test of the current test station is completed, so that the first switching module charges the gap compensation module through the first system power supply;

[0014] The first switching module is further used to disconnect the circuit between the first system power supply and the product to be tested after charging is completed, and to connect the circuit between the auxiliary power supply and the product to be tested for power supply.

[0015] In one embodiment, the second switching module is further used to supply power to the product to be tested through the gap compensation module when the circuit between the auxiliary power supply and the product to be tested is disconnected.

[0016] In one embodiment, the second switching module is further configured to charge the gap compensation module through the auxiliary power supply when the loop between the auxiliary power supply and the product to be tested is connected.

[0017] In one embodiment, the auxiliary power supply is also connected to a second system power supply of the test station;

[0018] The second system power supply is used to charge the auxiliary power supply when the loop between the first system power supply and the product to be tested is connected.

[0019] In addition, to achieve the above objectives, the present application also provides a power supply device, which includes the power supply circuit as described above.

[0020] In addition, to achieve the above-mentioned purpose, the present application also provides a power supply method, which is applied to a processor in a test station, wherein the test station also includes a first system power supply, and the processor and the first system power supply are both connected to the power supply circuit as described above, and the method includes:

[0021] When the test is completed, outputting a first switching signal to the first switching module, so that the first switching module disconnects the loop between the first system power supply and the product to be tested, and connects the loop between the auxiliary power supply of the power supply circuit and the product to be tested for power supply;

[0022] When the next product to be tested arrives, a second switching signal is output to the first switching module of the power supply circuit, so that the first switching module disconnects the loop between the auxiliary power supply and the product to be tested, and connects the loop between the first system power supply and the product to be tested for power supply.

[0023] In addition, to achieve the above-mentioned purpose, the present application also provides a storage medium, on which a power supply program is stored, and when the power supply program is executed by a processor, the steps of the power supply method described above are implemented.

[0024] In addition, to achieve the above-mentioned purpose, the present application also provides a test station, which includes: a first system power supply, a memory, a processor, and a power supply program stored in the memory and executable on the processor, and when the power supply program is executed by the processor, the steps of the power supply method described above are implemented.

[0025] The present application provides a power supply circuit, device, method, storage medium and test station, the circuit comprising: a first switching module and an auxiliary power supply; the first switching module is respectively connected to the product to be tested, the first system power supply of the test station and the auxiliary power supply; the first switching module is used to disconnect the circuit between the first system power supply and the product to be tested, and to connect the circuit between the auxiliary power supply and the product to be tested for power supply when the test of the current test station is completed; the first switching module is also used to disconnect the circuit between the auxiliary power supply and the product to be tested, and to connect the circuit between the first system power supply and the product to be tested for power supply when the product to be tested arrives at the next test station, so that the next test station can test the product to be tested.

[0026] Since the present application is provided with a first switching module and an auxiliary power supply, the first switching module can disconnect the circuit between the first system power supply of the test station and the product to be tested when the test of the current test station is completed, and connect the circuit between the auxiliary power supply and the product to be tested for power supply; and when the product to be tested arrives at the next test station, disconnect the circuit between the auxiliary power supply and the product to be tested, and connect the circuit between the first system power supply of the next test station and the test product for power supply, so that the next test station can test the product to be tested. Compared with the existing product to be tested, which needs to be powered off after the test of the current test station is completed, and then powered on again when arriving at the next test station, the present application can power the product to be tested through the auxiliary power supply after the test of the current test station is completed, and continue to power the product to be tested through the system power supply of the next test station when arriving at the next test station, thereby eliminating the need to power off and power on again, thereby improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the present application and, together with the description, serve to explain the principles of the present application.

[0028] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative labor.

[0029] Figure 1 This is a schematic diagram of the structure of the first embodiment of the power supply circuit of the present application;

[0030] Figure 2 This is a circuit schematic diagram of the first embodiment of the power supply circuit of the present application;

[0031] Figure 3 This is a schematic diagram of the structure of the second embodiment of the power supply circuit of the present application;

[0032] Figure 4 This is a circuit schematic diagram of the first state of the second embodiment of the power supply circuit of the present application;

[0033] Figure 5 This is a circuit schematic diagram of the second state of the second embodiment of the power supply circuit of the present application;

[0034] Figure 6 This is a circuit schematic diagram of the third state of the second embodiment of the power supply circuit of the present application;

[0035] Figure 7 This is a circuit schematic diagram of the fourth state of the second embodiment of the power supply circuit of the present application;

[0036] Figure 8 This is a circuit schematic diagram of the fifth state of the second embodiment of the power supply circuit of the present application;

[0037] Fig. 9 This is a flow chart of the first embodiment of the power supply method of the present application;

[0038] Fig.10 This is a schematic diagram of the test station structure of the hardware operating environment involved in the embodiment of the present application.

[0039] Description of Figure Numbers:

[0040]

[0041]

[0042] The realization of the purpose, functional features and advantages of this application will be further explained in conjunction with embodiments and with reference to the accompanying drawings. DETAILED DESCRIPTION

[0043] It should be understood that the specific embodiments described herein are only used to explain the technical solutions of the present application and are not used to limit the present application.

[0044] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0045] It should be noted that all directional indications in the embodiments of the present application (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0046] In addition, the descriptions of "first", "second", etc. in this application are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In addition, the technical solutions between the various embodiments can be combined with each other, but they must be based on the ability of ordinary technicians in this field to implement them. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0047] It is understandable that with the popularization of automated assembly line testing of embedded products (Device Under Test, DUT), DUT needs to be tested for function and performance at multiple test stations. There will be a power-on startup process during the transfer between test stations. That is, when the transfer conveyor carrying the DUT arrives at a test station, it needs to be connected to the system power supply of the test station first, so that the DUT can be powered on and started before being tested in the test station. After the test is completed, the connection with the system power supply of the test station is disconnected, the DUT is powered off and transported to the next test station via the transfer conveyor, and the above process is repeated until it passes through all test stations.

[0048] However, it takes about 1 to 2 minutes to power on the existing DUT, which results in a lot of time being wasted during the process, greatly reducing the test efficiency. Therefore, how to achieve uninterrupted power supply to the DUT is an urgent problem to be solved.

[0049] Therefore, in order to solve the above defects, the present embodiment provides a power supply circuit, which is provided with a first switching module and an auxiliary power supply. The first switching module can disconnect the circuit between the first system power supply of the test station and the product to be tested when the test of the current test station is completed, and conduct the circuit between the auxiliary power supply and the product to be tested for power supply; and when the product to be tested arrives at the next test station, disconnect the circuit between the auxiliary power supply and the product to be tested, and conduct the circuit between the first system power supply of the next test station and the test product for power supply, so that the next test station can test the product to be tested. Compared with the existing product to be tested, which needs to be powered off after the test of the current test station is completed, and then powered on again when arriving at the next test station, the present embodiment can power the product to be tested through the auxiliary power supply after the test of the current test station is completed, and continue to power the product to be tested through the system power supply of the next test station when arriving at the next test station, so that there is no need to power off and power on again, thereby improving the test efficiency.

[0050] For ease of understanding, the following combination Figures 1 to 8 The power supply circuit provided in the embodiment of the present application is described in detail.

[0051] Reference Figure 1 , Figure 1 Schematic diagram of the structure of the first embodiment of the power supply circuit of the present application, the first embodiment of the power supply circuit of the present application is proposed, such as Figure 1 As shown, in this embodiment, the power supply circuit includes: a first switching module and an auxiliary power supply;

[0052] The first switching module is respectively connected to the product to be tested, the first system power supply of the test station, and the auxiliary power supply.

[0053] It is understandable that the power supply circuit provided in this embodiment can be a circuit for powering any product to be tested, for example, it can be a circuit for powering the above-mentioned DUT, and of course it can also be a circuit for powering other products. This embodiment uses the power supply of DUT to illustrate, and thus the above-mentioned product to be tested can be the above-mentioned DUT.

[0054] It is also understandable that the first switching module may be a module with an on-off switching function, such as a relay, etc., and this embodiment does not limit this. The test station may be a station for testing the DUT. The test station in this embodiment is similar to the traditional one and may be equipped with the first system power supply to power the DUT, so this embodiment will not elaborate on this. The auxiliary power supply may be a power supply for powering the product to be tested, and its voltage may be consistent with the first system power supply.

[0055] The first switching module is used to disconnect the circuit between the first system power supply and the product to be tested, and to connect the circuit between the auxiliary power supply and the product to be tested for power supply when the test of the current test station is completed;

[0056] The first switching module is also used to disconnect the circuit between the auxiliary power supply and the product to be tested, and to connect the circuit between the first system power supply and the product to be tested to provide power when the product to be tested arrives at the next test station, so that the next test station can test the product to be tested.

[0057] like Figure 1 As shown, the power supply circuit in this embodiment can be set in the power supply device, and the power supply device can be set on the circulation vehicle, and then can be circulated in each test station together with the product to be tested. The specific setting position can be set according to the actual situation, and this embodiment does not limit this. And in actual use, the power supply device can be continuously connected to the product to be tested, and when the product to be tested is in the process of circulation, the power supply device is not connected to the test station until it arrives at a certain test station, and the power supply device is connected to the test station, and disconnected from the test station when the test is completed, until it arrives at the next test station, and then connected to the next test station, and so on, until all tests are completed.

[0058] It should be understood that when the current test station is testing the product to be tested, the first switching module can disconnect the loop between the auxiliary power supply and the product to be tested, and can connect the loop between the first system power supply of the current test station and the product to be tested to provide power;

[0059] After the current test station completes the test of the product to be tested, the first switching module can disconnect the loop between the first system power supply of the current test station and the product to be tested, and connect the loop between the auxiliary power supply and the product to be tested, and supply power to the product to be tested through the auxiliary power supply; since it is not necessary to supply power through the first system power supply of the current test station at this time, the power supply device can be disconnected from the current test station, and the product to be tested can be transferred to the next test station through the transfer vehicle;

[0060] When the product to be tested arrives at the next test station, the power supply device can be connected to the next test station, and the first switching module can disconnect the loop between the auxiliary power supply and the product to be tested, and connect the loop between the first system power supply of the next test station and the product to be tested, and power the product to be tested through the first system power supply of the next test station, and repeat this cycle until all tests are completed.

[0061] To sum up, since the product to be tested can be powered by an auxiliary power supply when the circulation carrier circulates the product to be tested, compared with the existing product to be tested, which needs to be powered off after the test at the current test station is completed, and then powered on again when it arrives at the next test station, this embodiment can power the product to be tested by an auxiliary power supply after the test at the current test station is completed, and continue to power the product to be tested by the system power supply of the next test station when it arrives at the next test station, thereby eliminating the need to power off and power on again, thereby improving test efficiency.

[0062] Furthermore, in order to enable the first switching module to detect that the test of the current test station is completed and to detect that the product to be tested arrives at the next test station, this embodiment can be implemented by a processor in the test station, and continue as follows: Figure 1 As shown, in this embodiment, in addition to the above-mentioned first system power supply, each test station may also be provided with a processor. When the product to be tested is transferred to the current test station, the first switching module can be connected to the processor of the current test station. When the testing of the product to be tested is completed, the first switching module can be disconnected from the processor of the current test station and connected to the processor of the next test station when arriving at the next test station.

[0063] Specifically, in this embodiment, a unified interface may be provided on the power supply device to achieve connection and disconnection with the first system power supply and the processor of the test station through different pins.

[0064] In actual use, for the processor of the current test station, when it is detected that the test of the current product to be tested is completed, the first switching signal can be output to the first switching module. After receiving the first switching signal, the first switching module can know that the test of the current test station is completed, and then disconnect the loop between the first system power supply of the current test station and the current product to be tested, and connect the loop between the auxiliary power supply and the current product to be tested for power supply, and finally disconnect the connection with the power supply device, and wait for the arrival of the power supply device corresponding to the next product to be tested;

[0065] When the current test station detects the arrival of the next product to be tested, it can be connected to the corresponding power supply device, and after the connection, it can output a second switching signal to the corresponding first switching module. After receiving the second switching signal, the first switching module can know that the current test station has arrived, and then the first switching module disconnects the loop between the auxiliary power supply and the corresponding product to be tested, and connects the loop between the first system power supply of the current test station and the product to be tested for power supply.

[0066] Furthermore, in order to enable the auxiliary power supply to continue to supply power, the present embodiment can also charge the auxiliary power supply to improve the sustainable use capability, as follows: Figure 1 As shown, in this embodiment, the auxiliary power supply is also connected to the second system power supply of the test station;

[0067] The second system power supply is used to charge the auxiliary power supply when the loop between the first system power supply and the product to be tested is connected.

[0068] It should be noted that the second system power supply can be a power supply for charging the auxiliary power supply in the test station. In this embodiment, a second system power supply can be additionally provided in the test station. Of course, the second system power supply can also be the same power supply as the first system power supply, and this embodiment does not limit this. However, in order to facilitate subsequent understanding, this embodiment uses two system power supplies for description.

[0069] It should also be noted that the second system power supply can be connected to the processor (not shown in the figure), that is, after the step of outputting the second switching signal to the first switching module of the power supply circuit when the next product to be tested arrives, the method further includes:

[0070] When it is detected that the loop between the first system power supply and the product to be tested is connected, a charging signal is output to the second system power supply, so that the second system power supply charges the auxiliary power supply.

[0071] In actual use, when the processor detects that the first switching module connects the circuit between the first system power supply and the product to be tested, it can output a charging signal to the second system power supply. After receiving the charging signal, the second system power supply can charge the auxiliary power supply.

[0072] Further, refer to Figure 2 , Figure 2 This is a circuit schematic diagram of the first embodiment of the power supply circuit of the present application, such as Figure 2 As shown, in this embodiment, the first switching module includes: a first relay K1;

[0073] The power supply end of the first relay K1 (i.e., the first pin of the first relay K1) is connected to the first power supply end of the auxiliary power supply (i.e., the fifth pin of the auxiliary power supply), the first input end of the first relay K1 (i.e., the second pin of the first relay K1) is connected to the second power supply end of the auxiliary power supply (i.e., the fourth pin of the auxiliary power supply), the output end of the first relay K1 (i.e., the third pin of the first relay K1) is connected to the product to be tested, the second input end of the first relay K1 (i.e., the fourth pin of the first relay K1) is connected to the first system power supply of the test station, the control end of the first relay K1 (i.e., the fifth pin of the first relay K1) is connected to the processor of the test station (i.e., Figure 2 The auxiliary power supply is connected to the system IO-0 in the test station, the charging end of the auxiliary power supply (i.e. the first pin of the auxiliary power supply) is connected to the second system power supply of the test station, and the first grounding end of the auxiliary power supply (i.e. the second pin of the auxiliary power supply) and the second grounding end of the auxiliary power supply (i.e. the third pin of the auxiliary power supply) are both grounded.

[0074] It is understood that the auxiliary power supply can be connected to the auxiliary power supply through the fifth pin (i.e. Figure 2 The auxiliary power supply 1) supplies power to the first relay K1 to ensure that the first relay K1 works normally. In actual use, when the test of the product to be tested is completed, the processor can output a first switching signal to the fifth pin of the first relay K1. After receiving the first switching signal, the first relay K1 can control the fourth pin of the first relay K1 to be disconnected from the third pin of the first relay K1, thereby disconnecting the loop between the first system power supply of the current test station and the current product to be tested, and control the third pin of the first relay K1 to be connected to the second pin of the first relay K1, thereby connecting the loop between the auxiliary power supply and the current product to be tested for power supply (i.e. Figure 2 Auxiliary power supply 2);

[0075] On the contrary, when the product to be tested enters the current test station, the processor can output a second switching signal to the fifth pin of the first relay K1. After receiving the second switching signal, the first relay K1 can control the third pin of the first relay K1 to be disconnected from the second pin of the first relay K1, thereby disconnecting the loop between the auxiliary power supply and the product to be tested, and control the third pin of the first relay K1 to be connected to the fourth pin of the first relay K1, thereby connecting the loop between the first system power supply of the test station and the product to be tested for power supply, so that the test station can perform testing; at the same time, during the test process, the second system power supply can charge the auxiliary power supply (i.e. Figure 2 (Current charging).

[0076] This embodiment is provided with a first switching module and an auxiliary power supply. The first switching module can disconnect the circuit between the first system power supply of the test station and the product to be tested when the test of the current test station is completed, and connect the circuit between the auxiliary power supply and the product to be tested for power supply; and when the product to be tested arrives at the next test station, disconnect the circuit between the auxiliary power supply and the product to be tested, and connect the circuit between the first system power supply of the next test station and the test product for power supply, so that the next test station can test the product to be tested. Compared with the existing product to be tested, which needs to be powered off after the test of the current test station is completed, and then powered on again when arriving at the next test station, this embodiment can power the product to be tested through the auxiliary power supply after the test of the current test station is completed, and continue to power the product to be tested through the system power supply of the next test station when arriving at the next test station, so that there is no need to power off and power on again, thereby improving the test efficiency.

[0077] Reference Figure 3 , Figure 3 This is a structural schematic diagram of a second embodiment of a power supply circuit of the present application. Based on the above-mentioned first embodiment, the second embodiment of the power supply circuit of the present application is proposed.

[0078] Considering that when the first switching module is switching, the product to be tested may not be powered on for a period of time, in order to further achieve uninterrupted power supply, Figure 3 As shown, in this embodiment, the circuit further includes: a gap compensation module and a second switching module;

[0079] The second switching module is connected to the gap compensation module, the product to be tested and the first switching module respectively.

[0080] It should be noted that the gap compensation module may be a module that supplies power to the product to be tested during the switching process of the first switching module, and may be a module with a battery, which is not limited in this embodiment.

[0081] It should also be noted that the second switching module may be a module with an on-off switching function, such as a relay, etc., and this embodiment does not limit this.

[0082] The second switching module is used to conduct the circuit between the gap compensation module and the product to be tested before the circuit between the first system power supply and the product to be tested is disconnected, so that the gap compensation module can supply power to the product to be tested when the circuit between the first system power supply and the product to be tested is disconnected;

[0083] The second switching module is further used to disconnect the circuit between the gap compensation module and the product to be tested after the circuit between the first system power supply and the product to be tested is connected.

[0084] It is understandable that when the test station completes the test of the product to be tested, it is necessary to disconnect the loop between the first system power supply and the product to be tested, and before that, the second switching module can connect the loop between the gap compensation module and the product to be tested, so that the first switching module can power the product to be tested through the gap compensation module during the process of disconnecting the loop between the first system power supply and the product to be tested and connecting the loop between the auxiliary power supply and the product to be tested; and after the loop between the first system power supply and the product to be tested is connected, the second switching module can control the loop between the gap module and the product to be tested to be disconnected.

[0085] Further, in order to control the on and off of the second switching module, continue as follows Figure 3 As shown, in this embodiment, the second switching module may be connected to the processor;

[0086] Before the step of outputting the first switching signal to the first switching module, the method further includes:

[0087] Outputting a third switching signal to the second switching module so that the second switching module conducts the loop between the gap compensation module of the power supply circuit and the product to be tested, and supplies power to the product to be tested through the gap compensation module when the loop between the first system power supply and the product to be tested is disconnected;

[0088] After the step of outputting the second switching signal to the first switching module of the power supply circuit when the next product to be tested arrives, the method further includes:

[0089] Outputting a fourth switching signal to the second switching module so that the second switching module disconnects the loop between the gap compensation module and the product to be tested.

[0090] In actual use, when the test station is finished testing, the third switching signal can be output to the second switching module first. After receiving the third switching signal, the second switching module can conduct the loop between the gap compensation module and the product to be tested. Then the processor can output the first switching signal to the first switching module. Since the gap compensation module is already connected to the product to be tested at this time, the product to be tested can also be powered by the gap compensation module during the switching process of the first switching module.

[0091] When the next product to be tested arrives at the testing station, the second switching module still maintains the circuit conduction between the gap compensation module and the product to be tested. After the first switching module conducts the circuit between the first system power supply and the product to be tested, the processor can output a fourth switching signal to the second switching module to make the second switching module disconnect the circuit between the gap compensation module and the product to be tested.

[0092] Further, refer to Figure 4 , Figure 4 This is a circuit schematic diagram of the first state of the second embodiment of the power supply circuit of the present application, such as Figure 4 As shown, in this embodiment, the second switching module includes: a second relay K2;

[0093] The power supply end of the second relay K2 (i.e., the first pin of the second relay K2) is connected to the first power supply end of the auxiliary power supply (i.e., the fifth pin of the auxiliary power supply), the input end of the second relay K2 (i.e., the second pin of the second relay K2) is connected to the output end of the gap compensation module, the ground end of the gap compensation module is grounded, the output end of the second relay K2 (i.e., the third pin of the second relay K2) is connected to the product to be tested and the output end of the first relay K1, the control end of the second relay K2 (i.e., the fifth pin of the second relay K2) is connected to the processor of the test station (i.e., Figure 4 System IO-1) connection.

[0094] It is understood that the auxiliary power supply can be connected to the auxiliary power supply through the fifth pin (i.e. Figure 4 The auxiliary power supply 1) supplies power to the second relay K2 to ensure the normal operation of the second relay K2. In actual use, when the processor is finished testing at the test station, it can first output the third switching signal to the fifth pin of the second relay K2. After receiving the third switching signal, the second relay K2 can control the second pin of the second relay K2 to be connected with the third pin of the second relay K2. Then the processor can output the first switching signal to the first switching module. Since the gap compensation module is already connected to the product to be tested at this time, the product to be tested can also be powered by the gap compensation module during the switching process of the first switching module.

[0095] When the next product to be tested arrives at the test station, the second pin of the second relay K2 is connected to the third pin of the second relay K2 at this time. After the first switching module connects the loop between the first system power supply and the product to be tested, the processor can output a fourth switching signal to the fifth pin of the second relay K2. After the second relay K2 receives the third switching signal, it can control the second pin of the second relay K2 to be disconnected from the third pin of the second relay K2.

[0096] It should be emphasized that Figure 4 The circuit schematic diagram of the power supply circuit in the first state, which may be a state in which the circuit between the first system power supply and the product to be tested needs to be disconnected after the test station is finished. At this time, the processor may first output a third switching signal to the second relay K2, and the second relay K2 starts to conduct the third pin of the second relay K2 with the second pin of the second relay K2; after the conduction, the processor may output a first switching signal to the first relay K1, and the first relay K1 starts to switch the third pin of the first relay K1 from the fourth pin of the first relay K1 to the second pin of the first relay K1.

[0097] Furthermore, in order to improve the sustainable power supply capability of the gap compensation module, in this embodiment, the gap compensation module can also be charged, as follows: Figure 4 As shown, in this embodiment,

[0098] The second switching module is further used to connect the loop between the gap compensation module and the first switching module when the test of the current test station is completed, so that the first switching module charges the gap compensation module through the first system power supply;

[0099] The first switching module is further used to disconnect the circuit between the first system power supply and the product to be tested after charging is completed, and to connect the circuit between the auxiliary power supply and the product to be tested for power supply.

[0100] It should be understood that continuing Figure 4 As shown, when the test is completed, the second relay K2 can connect the third pin of the second relay K2 with the second pin of the second relay K2. Since the third pin of the first relay K1 is connected with the fourth pin of the first relay K1 at this time, the gap compensation module can be charged while powering the product to be tested through the first system power supply.

[0101] It should also be understood that the gap compensation module in this embodiment may also be connected to a processor (not shown in the figure) so that the processor can detect the charging status of the gap compensation module, that is, the step of outputting the first switching signal to the first switching module includes:

[0102] When the gap compensation module is fully charged, a first switching signal is output to the first switching module.

[0103] In actual use, the processor can detect whether the charging of the gap compensation module is completed according to the charging status of the gap compensation module; if it is not completed, the first switching signal is not output to the first relay K1, and the gap compensation module continues to be charged through the first system unit; if it is completed, the first switching signal is output to the first relay K1, so that the first relay K1 disconnects the third pin of the first relay K1 from the fourth pin of the first relay K1, and connects with the second pin of the first relay K1. Since the third pin of the second relay K2 is connected with the second pin of the second relay K2 during this process, the gap compensation module can be used to power the product to be tested. For details, please refer to Figure 5 , Figure 5 This is a circuit schematic diagram of the second state of the second embodiment of the power supply circuit of the present application, such as Figure 5 As shown, the second state may be a state in which the third pin of the first relay K1 switches from the fourth pin of the first relay K1 to the second pin of the first relay K1 after the gap compensation module is fully charged.

[0104] When the first relay K1 connects the auxiliary power supply to the product to be tested, it can be disconnected from the current test station and transported to the next test station. Figure 6 , Figure 6 This is a circuit schematic diagram of the third state of the second embodiment of the power supply circuit of the present application, such as Figure 6 As shown, the third state can be the state during the process of transporting the product to be tested to the next test station. During this process, the auxiliary power supply can continuously power the product to be tested. At the same time, since the gap compensation module is also connected to the product to be tested, in order to further improve the sustainable power supply, in this embodiment, the second switching module is also used to charge the gap compensation module through the auxiliary power supply when the loop between the auxiliary power supply and the product to be tested is connected.

[0105] It should be noted that, in this process, the auxiliary power supply can not only supply power to the product to be tested, but also charge the gap compensation module through the second relay K2.

[0106] Furthermore, when the product to be tested arrives at the next test station, the auxiliary power supply must be disconnected from the product to be tested, and then Figure 7 , Figure 7 This is a circuit schematic diagram of the fourth state of the second embodiment of the power supply circuit of this application. The fourth state may be the state when the product to be tested arrives at the next test station. Figure 7As shown, in this state, the second switching module is also used to power the product to be tested through the gap compensation module when the circuit between the auxiliary power supply and the product to be tested is disconnected.

[0107] In actual use, the processor can detect the arrival of the next product to be tested, and then the processor can output a second switching signal to the first relay K1. The first relay K1 can also know that it has arrived at the next test station, and then when receiving the second switching signal, it can control the third pin of the first relay K1 to be disconnected from the second pin of the first relay K1 and connected to the fourth pin of the first relay K1. During this switching process, the third pin of the second relay K2 is continuously connected to the second pin of the second relay K2, and then the product to be tested can be powered through the gap compensation module.

[0108] Further, when the third pin of the first relay K1 is connected to the fourth pin of the first relay K1, Figure 8 , Figure 8 : is a circuit schematic diagram of the fifth state of the second embodiment of the power supply circuit of the present application. The fifth state may be a state in which the third pin of the first relay K1 is connected to the fourth pin of the first relay K1. Figure 8 As shown, when the third pin of the first relay K1 is connected to the fourth pin of the first relay K1, the product to be tested can be powered by the first system power supply, and the test station starts testing. At the same time, the processor can output a charging signal to the second system power supply so that the second system power supply charges the auxiliary power supply, and the processor can output a fourth switching signal to the second relay K2, and the second relay K2 can disconnect the third pin of the second relay K2 from the second pin of the second relay K2.

[0109] When the test station is finished, you can return to Figure 4 , the processor outputs a third switching signal to the second relay K2, and the second relay K2 connects the third pin of the second relay K2 with the second pin of the second relay K2, and the cycle continues until all tests are completed.

[0110] In addition, to achieve the above-mentioned purpose, an embodiment of the present application further provides a power supply device, which includes the power supply circuit as described above.

[0111] Other embodiments or specific implementation methods of the electronic device of the present application can refer to the embodiments of the above-mentioned power supply circuits, which will not be described in detail here.

[0112] In addition, to achieve the above purpose, the present application also provides a power supply method, referring to Fig. 9 , Fig. 9 This is a flow chart of the first embodiment of the power supply method of the present application. Fig. 9As shown, in this embodiment, the method is applied to a processor in a test station, the test station also includes a first system power supply, the processor and the first system power supply are both connected to the power supply circuit as described above, and the method includes:

[0113] Step S10: when the test is completed, output a first switching signal to the first switching module, so that the first switching module disconnects the loop between the first system power supply and the product to be tested, and connects the loop between the auxiliary power supply of the power supply circuit and the product to be tested for power supply;

[0114] Step S20: When the next product to be tested arrives, output a second switching signal to the first switching module of the power supply circuit, so that the first switching module disconnects the loop between the auxiliary power supply and the product to be tested, and connects the loop between the first system power supply and the product to be tested for power supply.

[0115] This embodiment is provided with a first switching module and an auxiliary power supply. The first switching module can disconnect the circuit between the first system power supply of the test station and the product to be tested when the test of the current test station is completed, and connect the circuit between the auxiliary power supply and the product to be tested for power supply; and when the product to be tested arrives at the next test station, disconnect the circuit between the auxiliary power supply and the product to be tested, and connect the circuit between the first system power supply of the next test station and the test product for power supply, so that the next test station can test the product to be tested. Compared with the existing product to be tested, which needs to be powered off after the test of the current test station is completed, and then powered on again when arriving at the next test station, this embodiment can power the product to be tested through the auxiliary power supply after the test of the current test station is completed, and continue to power the product to be tested through the system power supply of the next test station when arriving at the next test station, so that there is no need to power off and power on again, thereby improving the test efficiency.

[0116] As an implementation mode, the test station further includes a second system power supply, wherein the second system power supply is connected to the processor and the auxiliary power supply;

[0117] After the step of outputting a second switching signal to the first switching module of the power supply circuit when the next product to be tested arrives, the method further includes:

[0118] When it is detected that the loop between the first system power supply and the product to be tested is connected, a charging signal is output to the second system power supply, so that the second system power supply charges the auxiliary power supply.

[0119] As an implementation mode, the processor is further connected to a second switching module of the power supply circuit;

[0120] Before the step of outputting the first switching signal to the first switching module, the method further includes:

[0121] Outputting a third switching signal to the second switching module, so that the second switching module conducts the loop between the gap compensation module of the power supply circuit and the product to be tested, and supplies power to the product to be tested through the gap compensation module when the loop between the first system power supply and the product to be tested is disconnected;

[0122] After the step of outputting a second switching signal to the first switching module of the power supply circuit when the next product to be tested arrives, the method includes:

[0123] Outputting a fourth switching signal to the second switching module so that the second switching module disconnects the loop between the gap compensation module and the product to be tested.

[0124] As an implementation method, the processor is also connected to the gap compensation module;

[0125] The step of outputting the first switching signal to the first switching module includes:

[0126] When the gap compensation module is fully charged, a first switching signal is output to the first switching module.

[0127] Other embodiments or specific implementation methods of the power supply method of the present application can refer to the embodiments of the above-mentioned power supply circuits and will not be repeated here.

[0128] In addition, an embodiment of the present application further proposes a storage medium, on which a power supply program is stored. When the power supply program is executed by a processor, the steps of the power supply method described above are implemented.

[0129] Other embodiments or specific implementations of the storage medium of the present application can refer to the embodiments of the above-mentioned power supply methods, which will not be repeated here.

[0130] In addition, the present application also provides a test station, referring to Fig.10 , Fig.10 This is a schematic diagram of the test station structure of the hardware operating environment involved in the embodiment of the present application.

[0131] like Fig.10As shown, the test station may include: a processor 1001, such as a central processing unit (CPU), a communication bus 1002, a user interface 1003, a network interface 1004, and a memory 1005. Among them, the communication bus 1002 is used to realize the connection and communication between these components. The user interface 1003 may include a display screen (Display), and the optional user interface 1003 may also include a standard wired interface and a wireless interface. The wired interface of the user interface 1003 may be a USB interface in this application. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a wireless fidelity (Wireless-Fidelity, Wi-Fi) interface). The memory 1005 may be a high-speed random access memory (Random Access Memory, RAM), or a stable memory (Non-volatile Memory, NVM), such as a disk memory. The memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0132] Those skilled in the art will understand that Fig.10 The structure shown in the figure does not constitute a limitation on the test station, and may include more or less components than shown in the figure, or combine certain components, or arrange the components differently.

[0133] like Fig.10 As shown, the memory 1005 identified as a computer storage medium may include an operating system, a network communication module, a user interface module, and a signal recognition program.

[0134] exist Fig.10 In the test station shown, the network interface 1004 is mainly used to connect to the background server and communicate data with the background server; the user interface 1003 is mainly used to connect to the user device; the test station calls the power supply program stored in the memory 1005 through the processor 1001, and executes the steps of the power supply method provided in the embodiment of the present application.

[0135] Other embodiments or specific implementation methods of the test station of the present application can refer to the embodiments of the above-mentioned power supply methods, which will not be repeated here.

[0136] The above are only preferred embodiments of the present application, and are not intended to limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A power supply circuit, characterized in that: The circuit comprises: a first switching module and an auxiliary power supply; The first switching module is respectively connected to the product to be tested, the first system power supply of the test station and the auxiliary power supply; The first switching module is used to disconnect the circuit between the first system power supply and the product to be tested, and to connect the circuit between the auxiliary power supply and the product to be tested for power supply when the test of the current test station is completed; The first switching module is also used to disconnect the circuit between the auxiliary power supply and the product to be tested, and to connect the circuit between the first system power supply and the product to be tested to provide power when the product to be tested arrives at the next test station, so that the next test station can test the product to be tested.

2. The circuit according to claim 1, characterized in that The circuit further includes: a gap compensation module and a second switching module; The second switching module is respectively connected to the gap compensation module, the product to be tested and the first switching module; The second switching module is used to conduct the circuit between the gap compensation module and the product to be tested before the circuit between the first system power supply and the product to be tested is disconnected, so that the gap compensation module can supply power to the product to be tested when the circuit between the first system power supply and the product to be tested is disconnected; The second switching module is further used to disconnect the circuit between the gap compensation module and the product to be tested after the circuit between the first system power supply and the product to be tested is connected.

3. The circuit according to claim 2, characterized in that The second switching module is further used to connect the loop between the gap compensation module and the first switching module when the test of the current test station is completed, so that the first switching module charges the gap compensation module through the first system power supply; The first switching module is further used to disconnect the circuit between the first system power supply and the product to be tested after charging is completed, and to connect the circuit between the auxiliary power supply and the product to be tested for power supply.

4. The circuit according to claim 2, characterized in that The second switching module is further used to supply power to the product to be tested through the gap compensation module when the circuit between the auxiliary power supply and the product to be tested is disconnected.

5. The circuit according to claim 2, characterized in that The second switching module is further configured to charge the gap compensation module through the auxiliary power supply when the loop between the auxiliary power supply and the product to be tested is connected.

6. The circuit according to any one of claims 1 to 5, characterized in that The auxiliary power supply is also connected to the second system power supply of the test station; The second system power supply is used to charge the auxiliary power supply when the loop between the first system power supply and the product to be tested is connected.

7. A power supply device, characterized in that: The device comprises a power supply circuit as claimed in any one of claims 1 to 6.

8. A power supply method, characterized in that: The method is applied to a processor in a test station, the test station further comprising a first system power supply, the processor and the first system power supply are both connected to a power supply circuit as claimed in any one of claims 1 to 6, and the method comprises: When the test is completed, outputting a first switching signal to the first switching module, so that the first switching module disconnects the loop between the first system power supply and the product to be tested, and connects the loop between the auxiliary power supply of the power supply circuit and the product to be tested for power supply; When the next product to be tested arrives, a second switching signal is output to the first switching module of the power supply circuit, so that the first switching module disconnects the loop between the auxiliary power supply and the product to be tested, and connects the loop between the first system power supply and the product to be tested for power supply.

9. A storage medium, characterized in that: The storage medium stores a power supply program, and when the power supply program is executed by the processor, the steps of the power supply method according to claim 8 are implemented.

10. A test station, characterized in that: The test station comprises: a first system power supply, a memory, a processor, and a power supply program stored in the memory and executable on the processor, wherein the power supply program implements the steps of the power supply method according to claim 8 when executed by the processor.

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