Quartz sensor testing device

Abstract

According to the quartz sensor testing device, a quartz sensor is fixedly installed on a support through a fastener and a reed, the support is in signal connection with a measurement and control circuit through an embedded tail welding pin, the measurement and control circuit is fixedly connected with a bottom plate through a fastener and a shock absorber assembly, overall shock absorption is achieved, and signal interference is isolated; a flat top, a flexible conductive material and a welding pin structure are adopted in a position hole, corresponding to a sensor pin, of the support, the sensor pin is inserted into a corresponding lead hole of the support, the flat top and the flexible conductive material are compressed to achieve stable connection, the welding pin is connected with a measurement and control circuit signal, and a shielding plate in the support is connected with a power signal ground to achieve signal shielding. The quartz sensor test screening device is used for quartz sensor test screening, reduces interference, improves test stability and accuracy, and is convenient to disassemble and easy to replace.

Description

Technical Field

[0001] The invention relates to the technical field of inertial instrument testing, and in particular to a quartz sensor testing device. Background Art

[0002] The quartz sensor is the sensitive core component of the assembled micro-inertial instrument. The supporting circuit can be assembled into a quartz inertial instrument, and its performance determines the performance of the quartz inertial instrument.

[0003] The quartz sensor is mainly composed of a quartz sensitive structure, a shell and lead pins. The overall structure adopts an airtight package and has the characteristics of small size and precise structure. The core sensitive element of the quartz sensor is a quartz sensitive structure. The sensitive structure works based on the piezoelectric effect of the quartz crystal and the Coriolis vibration principle. The piezoelectric effect causes the driving end to vibrate. When the sensor rotates axially, the Coriolis inertial force causes the driving end to generate a vibration component that is coupled to the detection end. The electrode on the detection end generates a sensitive charge signal proportional to the angular velocity and the driving vibration displacement through the piezoelectric effect. The charge signal is amplified and demodulated to obtain a DC output proportional to the input angular velocity. The angular velocity signal can be finally obtained by measuring the voltage.

[0004] The quartz sensitive structure mainly adopts the process method of micro-machining. Based on the anisotropic process characteristics of quartz materials, coupling stiffness errors will occur during the movement of the sensor. After the quartz sensitive structure is packaged, the output zero position changes under temperature conditions. The quartz sensor needs to be screened and tested for temperature performance levels.

[0005] The output signal of the quartz sensor is weak and easily interfered. During the screening test, it is necessary to isolate the external signal interference such as the sensor's own micro-displacement and micro-vibration. The sensor is small in size, resulting in coupling between the input strong signal and the output weak signal, which needs to be shielded. At the same time, it meets the requirements of accurate testing, fast installation, disassembly and convenient replacement. The most accurate way to test and screen is to assemble the product into an inertial instrument for temperature testing. The assembly process is complicated. The sensor is an independent component. Unqualified products need to be disassembled during testing, which is easy to generate a large number of waste components, resulting in waste of resources and cannot meet the requirements of fast installation and disassembly. The Chinese patent CN 111964690A uses screw locking and round hole sockets to test the quartz meter head, which is relatively easy to install, but there are problems such as the round hole socket is easy to loosen, it is inconvenient to disassemble and replace accessories, and poor contact. The retest rate is high, and it is impossible to quickly and accurately evaluate the temperature performance of the quartz sensor. Summary of the invention

[0006] The present invention aims to solve at least one of the technical problems existing in the prior art.

[0007] To this end, the present invention provides a quartz sensor testing device. The testing device of the present invention is anti-interference, high in accuracy, easy to disassemble, and convenient to replace accessories, which solves the performance testing problem of quartz sensors under temperature change conditions, effectively improves production efficiency, and meets mass production needs.

[0008] The technical solution of the present invention is as follows: a quartz sensor testing device is provided, the testing device comprising: a bracket, a shielding plate, a plurality of springs, a plurality of first fasteners, a plurality of flexible conductive materials, a plurality of flat tops, a plurality of second fasteners, a plurality of vibration damper assemblies, a measurement and control circuit and a bottom plate, wherein:

[0009] The upper end of the bracket is provided with a groove, and the quartz sensor is arranged in the groove. A plurality of first fasteners are arranged in a one-to-one correspondence with a plurality of springs. One end of any of the springs is fixed to the upper end surface of the bracket by the corresponding first fastener. The spring can be rotated back and forth, and the other end of the spring can be selectively pressed on the quartz sensor to fix the quartz sensor in the groove; the lower end of the bracket is provided with a plurality of welding pins, and the bracket is welded to the measurement and control circuit through the welding pins; a plurality of mounting holes are provided inside the bracket corresponding to the positions of the sensor pins, which are uniformly matched with the plurality of welding pins, the plurality of pins of the quartz sensor, the plurality of flexible conductive materials and the plurality of flat tops. It should be arranged that the flexible conductive material and the flat top are sequentially arranged in the corresponding mounting hole, and the hole has a limit to prevent the flat top from coming out during use. The flexible conductive material is also connected to the corresponding welding pin. When the pin of the quartz sensor is installed downward in the mounting hole, the flexible conductive material is pressed by the flat top to achieve stable electrical connection of the sensor; the shielding plate is connected to the power signal ground inside the bracket to achieve signal shielding between the sensor input and output; the flexible conductive material is composed of a mixture of conductive glue, indium particles and silicone rubber, and the mass ratio is 10% to 30% of conductive glue, 45% to 85% of indium particles, and 5% to 25% of silicone rubber;

[0010] The measurement and control circuit is fixedly connected to the base plate via a second fastener and a shock absorber assembly.

[0011] Furthermore, the diameter of the indium particles is 100 μm-200 μm.

[0012] Furthermore, the testing device further comprises a shell, the shell is fixedly connected to the base plate, and all components of the testing device except the base plate are arranged in the shell.

[0013] Furthermore, the first fastener is a locking screw.

[0014] Furthermore, the second fastener is a screw.

[0015] Furthermore, the testing device further comprises a gasket, and the gasket is arranged between the second fastener and the shock absorber assembly.

[0016] The above technical scheme meets the requirements of interference signal isolation and rapid installation and disassembly by designing a quartz sensor test device, adopting an integral vibration reduction assembly, bracket, and reed to compress the sensor; by designing a special bracket, adopting grooves and mounting holes, fastener locking, compression flat top, flexible conductive materials, welding pins and shielding methods, a stable electrical connection is achieved, poor contact is reduced, and problems such as weak output signal, shielding isolation, and susceptibility to external interference are solved, thereby improving test accuracy; the reed is used to rotate back and forth to realize convenient installation and fixation of the quartz sensor and improve test efficiency; the integral vibration reduction fastener fixing method is adopted to meet the needs of rapid replacement of accessories and facilitate batch testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The included drawings are used to provide a further understanding of the embodiments of the present invention, which constitute a part of the specification, are used to illustrate the embodiments of the present invention, and together with the text description, explain the principles of the present invention. Obviously, the drawings in the following description are only some embodiments of the present invention, and for ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0018] Figure 1 It is a structural schematic diagram of a quartz sensor testing device provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0019] It should be noted that, in the absence of conflict, the embodiments in this application and the features in the embodiments can be combined with each other. The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. The following description of at least one exemplary embodiment is actually only illustrative and is by no means intended to limit the present invention and its application or use. Based on the embodiments in the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0020] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0021] Unless otherwise specifically stated, the relative arrangement of the parts and steps described in these embodiments, numerical expressions and numerical values ​​do not limit the scope of the present invention. At the same time, it should be understood that, for ease of description, the sizes of the various parts shown in the accompanying drawings are not drawn according to the actual proportional relationship. The technology, method and equipment known to ordinary technicians in the relevant field may not be discussed in detail, but in appropriate cases, the technology, method and equipment should be regarded as a part of the authorization specification. In all examples shown and discussed here, any specific value should be interpreted as being merely exemplary, rather than as a limitation. Therefore, other examples of exemplary embodiments may have different values. It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once a certain item is defined in an accompanying drawing, it does not need to be further discussed in subsequent drawings.

[0022] like Figure 1 As shown, in one embodiment of the present invention, a quartz sensor 1 test device is provided, which includes: a bracket 2, a shielding plate 14, a plurality of springs 4, a plurality of first fasteners 3, a plurality of flexible conductive materials 12, a plurality of flat tops 11, a plurality of second fasteners 5, a plurality of damper assemblies 7, a measurement and control circuit 8 and a bottom plate 9, wherein: the upper end of the bracket 2 is provided with a groove, the quartz sensor 1 is arranged in the groove, the plurality of first fasteners 3 are arranged one by one with the plurality of springs 4, one end of any of the springs 4 is fixed to the upper end surface of the bracket 2 by the corresponding first fastener 3, the springs 4 can be rotated back and forth, and the other end of the springs 4 can be selectively pressed on the quartz sensor 1 to fix the quartz sensor 1 in the groove; the lower end of the bracket 2 is provided with a plurality of welding pins 13, the bracket 2 is welded to the measurement and control circuit 8 through the welding pins; the bracket 2 is provided with a plurality of The mounting holes are arranged one by one with the plurality of welding pins 13, the plurality of pins of the quartz sensor 1, the plurality of flexible conductive materials 12 and the plurality of flat tops 11, wherein the flexible conductive material 12 and the flat tops 11 are arranged in the corresponding mounting holes in sequence, and the flexible conductive material 12 is also connected with the corresponding welding pins 13. When the pins of the quartz sensor 1 are installed downward in the mounting holes, the flexible conductive material 12 is pressed by the flat tops 11 to achieve stable electrical connection of the sensor; the shielding plate 14 is connected to the power signal ground inside the bracket 2 to achieve signal shielding between the sensor input and output; the flexible conductive material 12 is composed of a mixture of conductive glue, indium particles and silicone rubber, and the mass ratio is 10% to 30% of conductive glue, 45% to 85% of indium particles, and 5% to 25% of silicone rubber; the measurement and control circuit 8 is fixedly connected to the bottom plate 9 through the second fastener 5 and the shock absorber assembly 7.

[0023] That is, the quartz sensor 1 is fixedly mounted on the bracket 2 through the fasteners and the reed 4, and the bracket 2 realizes signal connection with the measurement and control circuit 8 through the embedded tail welding pin 13. The measurement and control circuit 8 is fixedly connected with the bottom plate 9 through the fasteners and the shock absorber assembly 7 to realize overall vibration reduction and reduce signal interference. The flat top 11, flexible conductive material and welding pin 13 structure are used in the hole of the bracket 2. The sensor pin is inserted into the hole of the bracket 2, and the flat top 11 and the flexible conductive material are compressed to achieve stable connection. The welding pin 13 is connected to the measurement and control circuit 8 signal, and the shielding plate 14 in the bracket is connected to the power signal ground to achieve shielding.

[0024] By applying the above technical scheme, the isolation of interference signals and the need for rapid installation and disassembly are achieved by adopting an overall vibration reduction component, a bracket, and a reed to compress the sensor. By designing the bracket, opening grooves and mounting holes, fastener locking, compressing the flat top, flexible conductive materials, and shielding methods, a stable electrical connection is achieved, poor contact is reduced, and problems such as weak output signal, signal shielding, and susceptibility to external interference are solved, thereby improving test accuracy. At the same time, the reed is used to rotate back and forth to achieve convenient installation and fixation of the quartz sensor, and the overall vibration reduction fastener fixing method is adopted to meet the needs of rapid installation, disassembly, and replacement of accessories, which is easy for batch testing and improves test efficiency.

[0025] Preferably, the diameter of the indium particles is 100 μm-200 μm.

[0026] Preferably, the testing device further comprises a housing 10 , wherein the housing 10 is fixedly connected to the base plate 9 , and all components of the testing device except the base plate 9 are arranged in the housing 10 .

[0027] That is, the housing 10 is placed on the bottom plate 9, and the vibration absorber assembly 7 and the housing 10 can isolate interference such as external vibration.

[0028] According to an embodiment of the present invention, the first fastener 3 is a locking screw.

[0029] According to an embodiment of the present invention, the second fastener 5 is a screw.

[0030] Preferably, the testing device further comprises a gasket 6 , and the gasket 6 is arranged between the second fastener 5 and the shock absorber assembly 7 .

[0031] The testing device of the present invention is described in detail below with reference to a specific embodiment.

[0032] like Figure 1As shown, a quartz sensor testing device includes a bracket 2, a vibration damper assembly 7, a measurement and control circuit 8, a base plate 9, a housing 10, etc. The quartz sensor 1 is fixedly mounted on the bracket 2 by means of a locking screw and a reed 4. The reed 4 can be rotated back and forth without being disassembled to conveniently install and fix the quartz sensor 1; the bracket 2 is welded to the measurement and control circuit 8 by means of a welding pin 13 embedded in the tail to achieve electrical connection, output the sensor signal to the measurement and control circuit 8, and obtain the sensor performance through external signal collection and analysis; the bracket 2 is easy to disassemble and assemble, and has an installation hole inside to facilitate the insertion and removal of the sensor, and there is a flexible conductive material 12 inside the installation hole The flexible conductive material is a mixture of 2g conductive glue, 4.5g indium particles (diameter 100μm-200μm) and 1g silicone rubber. When the pins of the sensor are installed downward, the flexible conductive material 12 is pressed by the flat top 11 to achieve stable electrical connection of the sensor. At the same time, a shielding plate 14 is used inside the bracket to connect to the power signal ground to achieve signal shielding between the sensor input and output, thereby achieving the purpose of anti-interference; the measurement and control circuit 8 is fixedly connected to the base plate 9 by screws, gaskets 6, and shock absorber components 7, which is easy to replace. The housing 10 is placed on the base plate 9, and the shock absorber components 7 and the housing 10 can isolate external vibration and other interference.

[0033] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0034] In addition, it should be noted that the use of terms such as "first" and "second" to limit components is only for the convenience of distinguishing the corresponding components. If not otherwise stated, the above terms have no special meaning and therefore cannot be understood as limiting the scope of protection of the present invention.

[0035] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. For those skilled in the art, the present invention may have various modifications and variations. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A quartz sensor testing device, characterized in that: The test device comprises: a bracket, a shielding plate, a plurality of springs, a plurality of first fasteners, a plurality of flexible conductive materials, a plurality of flat tops, a plurality of second fasteners, a plurality of shock absorber assemblies, a measurement and control circuit and a bottom plate, wherein: The upper end of the bracket is provided with a groove, and the quartz sensor is arranged in the groove. A plurality of first fasteners are arranged in a one-to-one correspondence with a plurality of springs. One end of any of the springs is fixed to the upper end surface of the bracket by the corresponding first fastener. The spring can be rotated back and forth, and the other end of the spring can be selectively pressed on the quartz sensor to fix the quartz sensor in the groove; the lower end of the bracket is provided with a plurality of welding pins, and the bracket is welded to the measurement and control circuit through the welding pins; a plurality of mounting holes are provided inside the bracket corresponding to the positions of the sensor pins, which are uniformly matched with the plurality of welding pins, the plurality of pins of the quartz sensor, the plurality of flexible conductive materials and the plurality of flat tops. It should be arranged that the flexible conductive material and the flat top are sequentially arranged in the corresponding mounting hole, and the hole has a limit to prevent the flat top from coming out during use. The flexible conductive material is also connected to the corresponding welding pin. When the pin of the quartz sensor is installed downward in the mounting hole, the flexible conductive material is pressed by the flat top to achieve stable electrical connection of the sensor; the shielding plate is connected to the power signal ground inside the bracket to achieve signal shielding between the sensor input and output; the flexible conductive material is composed of a mixture of conductive glue, indium particles and silicone rubber, and the mass ratio is 10% to 30% of conductive glue, 45% to 85% of indium particles, and 5% to 25% of silicone rubber; The measurement and control circuit is fixedly connected to the base plate via a second fastener and a shock absorber assembly.

2. A quartz sensor testing device according to claim 1, characterized in that: The diameter of the indium particles is 100 μm-200 μm.

3. A quartz sensor testing device according to claim 1, characterized in that: The testing device further comprises a shell, which is fixedly connected to the bottom plate, and all components of the testing device except the bottom plate are arranged in the shell.

4. A quartz sensor testing device according to claims 1-3, characterized in that: The first fastener is a locking screw.

5. A quartz sensor testing device according to claim 4, characterized in that: The second fastener is a screw.

6. A quartz sensor testing device according to claim 1, characterized in that: The test apparatus also includes a shim disposed between the second fastener and the shock absorber assembly.

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