Particle flight state monitoring method and device based on improved double-slit spectrometer

Abstract

The invention provides a particle flight state monitoring method and device based on an improved double-slit spectrograph, and the method comprises the steps: feeding particles into a plasma spray gun through a powder feeder, spraying the particles to a target surface, and capturing an optical signal of the particles through the improved double-slit spectrograph in a particle flight process; in the improved double-slit spectrometer, optical signals of particles with different particle sizes are separated through double-slit design, and optical signals with different wavelengths are separated through a dichroic mirror; after the separated optical signals are focused by a receiving surface of a photoelectric detector, respectively recording signal waveforms of the two slits, and carrying out filtering, feature extraction and parameter calculation on the optical signals through the photoelectric detector to obtain particle parameters; and the process parameters of the powder feeder and the plasma spray gun are dynamically adjusted through the PID controller in combination with the particle parameters. The problems that in the prior art, the particle flight state monitoring precision is low, the efficiency is low, and real-time feedback cannot be achieved are solved.

Description

Technical Field

[0001] The present application relates to the technical field of particle flight status monitoring, and in particular to a particle flight status monitoring method and device based on an improved double-slit spectrometer. Background Art

[0002] In the prior art, commonly used methods for monitoring particle flight status include thermocouple method, laser Doppler velocimetry (LDV) and image processing method.

[0003] However, the thermocouple method measures the particle temperature through direct contact, but its response speed is slow and its measurement accuracy is low, especially in high-speed flying particles. In addition, the fragility of thermocouples also limits their application in spraying processes.

[0004] Laser Doppler velocimetry (LDV) is mainly used to measure the flying speed of particles, but this method can only provide the average speed of particles and cannot accurately obtain information such as the temperature and particle size of each particle. At the same time, LDV has low measurement efficiency and cannot simultaneously obtain the flying status of multiple particles during high-speed spraying.

[0005] The image processing method uses a high-speed camera to obtain images of particles, and then uses image processing technology to extract flight state parameters. However, this method faces a large amount of calculation, especially when there are a large number of particles and the flight speed is fast. The real-time performance of the calculation is poor and it is difficult to meet the needs of real-time monitoring. In addition, the equipment cost is high, which increases the overall investment of the system.

[0006] In general, existing technologies generally have problems such as low measurement accuracy, low efficiency, and poor real-time feedback, and are unable to meet the needs of accurate, efficient, and real-time monitoring of particle flight status in the coating preparation process. Summary of the invention

[0007] The present application aims to solve one of the technical problems in the related art at least to some extent.

[0008] To this end, the first objective of the present application is to propose a particle flight state monitoring method based on an improved double-slit spectrometer.

[0009] The second object of the present application is to propose a particle flight state monitoring device based on an improved double-slit spectrometer.

[0010] The third objective of the present application is to provide an electronic device.

[0011] A fourth objective of the present application is to provide a computer-readable storage medium.

[0012] A fifth object of the present application is to provide a computer program product.

[0013] To achieve the above-mentioned purpose, the first embodiment of the present application proposes a particle flight state monitoring method based on an improved double-slit spectrometer, comprising:

[0014] The particles are fed into the plasma spray gun through a powder feeder and sprayed onto the target surface, and during the flight of the particles, the optical signals of the particles are captured by an improved double-slit spectrometer;

[0015] In the improved double-slit spectrometer, light signals of particles of different sizes are separated by a double-slit design, and light signals of different wavelengths are separated by a dichroic mirror;

[0016] After the separated light signal is focused by the receiving surface of the photodetector, the signal waveforms of the two slits are recorded respectively, and the light signal is filtered, feature extracted and parameter calculated by the photodetector to obtain the particle parameters;

[0017] The process parameters of the powder feeder and the plasma spray gun are dynamically adjusted by combining the particle parameters through a PID controller.

[0018] Optionally, before calculating the particle parameters, the light signal collected by the photodetector is processed as follows, including:

[0019] Using Kalman filtering method to remove random noise in the optical signal;

[0020] Analyzing the spectrum of the optical signal by Fourier transform to extract particle-related features;

[0021] The peak value and waveform distribution of the optical signal are detected using a wavelet transform method.

[0022] Optionally, the particle parameters include particle flight speed, and the calculation formula of the particle flight speed is:

[0023]

[0024] Among them, v p is the flying speed of the particle, s is the fixed distance between the double slits, and TOF is the time difference of the particle passing through the two slits, which is obtained by the time difference of the signal of the two slits recorded by the photoelectric detector.

[0025] Optionally, the particle parameters include particle temperature, and the particle temperature is calculated based on a dual wavelength ratio method, including:

[0026] Record the radiation intensities E(λ1) and E(λ2) of two different spectral wavelengths λ1 and λ2 respectively;

[0027] The radiation ratio R is calculated based on the radiation intensity E(λ1) and E(λ2), and the formula is:

[0028]

[0029] The particle temperature T(k) is calculated as follows:

[0030]

[0031] Wherein, K2 is a constant related to the optical properties of the granular material, and ln is a natural logarithmic function.

[0032] Optionally, the particle parameters include particle size, and the calculation formula of the particle size is:

[0033]

[0034] Among them, D p is the particle diameter, E(λ1) is the radiation intensity of the spectral wavelength λ1, DC is the normalization factor, and the calculation formula is:

[0035] DC=K3ε(λ1)

[0036] Where K3 is the normalization constant and ε(λ1) is the emissivity of the granular material at the spectral wavelength λ1.

[0037] To achieve the above-mentioned purpose, the second embodiment of the present application proposes a particle flight state monitoring device based on an improved double-slit spectrometer, comprising:

[0038] A capture module is used to feed particles into the plasma spray gun through a powder feeder and spray them onto a target surface, and to capture optical signals of the particles using an improved double-slit spectrometer during the particle flight process;

[0039] A separation module, used to separate light signals of particles of different sizes by a double slit design and to separate light signals of different wavelengths by a dichroic mirror in the improved double slit spectrometer;

[0040] A processing module, used for recording the signal waveforms of the two slits respectively after the separated light signals are focused by the receiving surface of the photodetector, and filtering, feature extraction and parameter calculation of the light signals through the photodetector to obtain particle parameters;

[0041] The industrial parameter adjustment module is used to dynamically adjust the process parameters of the powder feeder and the plasma spray gun in combination with the particle parameters through a PID controller.

[0042] To achieve the above-mentioned purpose, the third aspect of the present application provides an electronic device, including: a processor, and a memory communicatively connected to the processor;

[0043] The memory stores computer-executable instructions;

[0044] The processor executes the computer-executable instructions stored in the memory to implement the method as described in any one of the first aspects.

[0045] To achieve the above-mentioned purpose, the fourth aspect embodiment of the present application proposes a computer-readable storage medium, in which computer-readable storage medium is stored computer execution instructions, and when the computer execution instructions are executed by a processor, they are used to implement the method as described in any one of the first aspects.

[0046] To achieve the above-mentioned purpose, the fifth aspect of the present application proposes a computer program product, which implements any method in the first aspect when executed by a processor.

[0047] The technical solution provided by the embodiments of the present application brings at least the following beneficial effects:

[0048] Compared with the prior art, this application uses an improved double-slit spectrometer to achieve high-precision real-time monitoring of particle temperature, velocity and particle size through precise optical measurement technology. This method can synchronously measure more than 1,000 particles per second through a highly sensitive photoelectric detector, a double-slit design and a signal processing algorithm, significantly improving the monitoring efficiency, and can provide real-time feedback of measurement results through a PID control algorithm, adjust industrial parameters in the coating preparation process, and achieve closed-loop control. Specifically, this application can improve the measurement accuracy of particle temperature to ±0.5°C, the velocity measurement accuracy to ±0.05m / s, and the particle size measurement accuracy to ±1μm, meeting the high-precision requirements in complex processes such as high-speed spraying.

[0049] Additional aspects and advantages of the present application will be given in part in the description below, and in part will become apparent from the description below, or will be learned through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0050] The above and / or additional aspects and advantages of the present application will become apparent and easily understood from the following description of the embodiments in conjunction with the accompanying drawings, in which:

[0051] Figure 1 A schematic diagram of a flow chart of a particle flight state monitoring method based on an improved double-slit spectrometer provided in an embodiment of the present application;

[0052] Figure 2 A schematic diagram of the structure of a particle flight state monitoring system based on an improved double-slit spectrometer provided in an embodiment of the present application;

[0053] Figure 3 A schematic diagram of the working principle of the improved double-slit spectrometer provided in the embodiment of the present application;

[0054] Figure 4 A schematic diagram of the structure of a particle flight state monitoring device based on an improved double-slit spectrometer provided in an embodiment of the present application. DETAILED DESCRIPTION

[0055] Embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present application, and should not be construed as limiting the present application.

[0056] In response to the problems existing in the prior art, the embodiments of the present application provide a particle flight state monitoring method and device based on an improved double-slit spectrometer, which can achieve high-precision, high-efficiency real-time monitoring of the particle flight state, thereby significantly improving the coating quality and consistency and reducing production costs.

[0057] Figure 1 A schematic diagram of a particle flight state monitoring method based on an improved double-slit spectrometer provided in an embodiment of the present application, which is applied to Figure 2 The embodiment shows a particle flight state monitoring system based on an improved double-slit spectrometer.

[0058] like Figure 2 As shown, the system includes a powder feeder, a plasma spray gun, a sensor probe, an improved double-slit spectrometer, a signal collector, and an output and controller.

[0059] The radar point cloud acquisition method based on the graduated guide rail shown in the embodiment of the present application is described in detail below. Figure 1 As shown, the method comprises the following steps:

[0060] Step 101, particles are fed into a plasma spray gun through a powder feeder and sprayed onto a target surface. During the flight of the particles, an improved double-slit spectrometer is used to capture optical signals of the particles.

[0061] In the embodiment of the present application, the powder feeder is responsible for conveying particles into the plasma spray gun.

[0062] Specifically, the function of the powder feeder is to accurately control the supply amount and flow rate of particles to ensure that the particles enter the spray gun evenly. After the particles are transported from the powder feeder to the spray gun, they are heated by the high-temperature plasma of the spray gun and sprayed onto the target surface for coating, spraying or other surface treatment processes.

[0063] Then, as the particles are ejected from the spray gun and fly to the target surface, the improved double-slit spectrometer uses a sensor probe to capture the optical signals emitted by these particles in real time. The spectrometer adopts a double-slit design, one slit is used to introduce the optical signals of the particles into the spectrometer through a light beam, and the other slit is used to ensure that the signals emitted by particles of different sizes are effectively distinguished.

[0064] Step 102, in the improved double-slit spectrometer, separate the light signals of particles with different sizes by using a double-slit design, and separate the light signals of different wavelengths by using a dichroic mirror.

[0065] In the present application, refer to Figure 3 The improved double-slit spectrometer achieves precise separation of particle light signals through its unique design.

[0066] First, the double slit design plays a key role in the spectrometer. The arrangement of the two slits enables the spectrometer to effectively separate the light signals emitted by particles of different sizes. Since the difference in particle size will result in different wavelengths and intensities of their scattered light, the double slit design helps to separate the signals of particles of different sizes through physical structural separation, reducing signal overlap or interference, and further improving the accuracy of particle measurement.

[0067] Secondly, the use of dichroic mirrors helps to separate light signals of different wavelengths. Dichroic mirrors can selectively reflect or transmit light of different wavelengths according to the wavelength of light, further optimizing the extraction of light signals so that signals of different wavelengths can be accurately distinguished. This is crucial for simultaneously analyzing different parameters such as particle temperature (usually through thermal radiation signals) and particle size (related to scattering signals).

[0068] Step 103, after the separated light signal is focused by the receiving surface of the photodetector, the signal waveforms of the two slits are recorded respectively, and the light signal is filtered, feature extracted and parameter calculated by the photodetector to obtain the particle parameters.

[0069] In this step, the separated light signal is first focused by the receiving surface of the photodetector, and the two slit signal waveforms obtained after double slit separation are recorded. Since the double slit design can effectively distinguish the signals of particles of different sizes, the signal of each particle can be recorded and analyzed separately, reducing signal interference and improving measurement accuracy.

[0070] Next, these signals are further processed by photodetectors (such as InGaAs photodiode arrays), which mainly include filtering, feature extraction, and parameter calculation. Photodetectors have high sensitivity and a wide dynamic range, can capture weak signals, and do not saturate high-intensity signals, ensuring the reliability of signal acquisition.

[0071] Specifically, before calculating the particle parameters, the Kalman filter method is first used to remove random noise in the optical signal. Kalman filtering is a recursive estimation method that can effectively extract the real particle signal from the noisy signal, reduce the error caused by environmental noise or equipment interference, and improve the accuracy of the signal.

[0072] Then, the spectrum of the signal is analyzed by Fourier transform to extract relevant features of the particles. Fourier transform can convert the time domain signal into a frequency domain signal, thereby identifying the periodic changes in the particle movement, such as flight speed, temperature fluctuations, etc., and obtaining more accurate particle parameters through frequency domain information.

[0073] In addition, the peak value and waveform distribution of the optical signal are detected by wavelet transform method. Wavelet transform can analyze in both time domain and frequency domain at the same time, and is suitable for extracting local features in the signal, such as temperature change, velocity change and particle size information of the particle. In this way, the key features in the optical signal can be accurately detected, and the state parameters of the particle can be further extracted.

[0074] Finally, by calculating the particle parameters of the filtered light signal, the system can obtain detailed information such as the temperature, velocity and particle size of each particle, thereby providing accurate data support for subsequent process control and optimization.

[0075] In the embodiment of the present application, first, the calculation formula of the particle flight speed is:

[0076]

[0077] Among them, v p is the flying speed of the particle, s is the fixed distance between the double slits, and TOF is the time difference of the particle passing through the two slits, which is obtained by recording the time difference of the signals of the two slits by the photodetector.

[0078] Secondly, the calculation of particle temperature is based on the dual-wavelength ratio method. In this method, the radiation intensities E(λ1) and E(λ2) of two different spectral wavelengths λ1 and λ2 are first recorded respectively. Then the radiation ratio R is calculated based on the radiation intensities E(λ1) and E(λ2), as follows:

[0079]

[0080] Finally, the particle temperature T(k) is calculated using the formula:

[0081]

[0082] Wherein, K2 is a constant related to the optical properties of the granular material, and ln is a natural logarithmic function.

[0083] Finally, the particle size is calculated as:

[0084]

[0085] Among them, D p is the particle diameter, E(λ1) is the radiation intensity of the spectral wavelength λ1, DC is the normalization factor, and the calculation formula is:

[0086] DC=K3ε(λ1)

[0087] Where K3 is the normalization constant and ε(λ1) is the emissivity of the granular material at the spectral wavelength λ1.

[0088] Through the above calculations, the system can accurately extract the flight speed, temperature and particle size information of each particle. These parameters provide precise data support for subsequent process control and optimization, thereby improving the quality and consistency of the coating preparation process.

[0089] Step 104 , dynamically adjusting the process parameters of the powder feeder and the plasma spray gun by combining the particle parameters through a PID controller.

[0090] In the embodiment of the present application, the process parameters of the powder feeder and the plasma spray gun are dynamically adjusted by combining the particle parameters obtained above through the PID controller, thereby optimizing the coating preparation process.

[0091] First, a signal acquisition device (such as National Instruments' PXI-6143) is used to collect particle parameters during particle flight. The device supports a sampling rate of up to 2MS (million samples) per second and can quickly collect information such as particle flight speed, temperature, and particle size. This ensures that the system can obtain accurate data in real time during high-speed and high-frequency spraying processes.

[0092] In the output and controller, in order to process massive amounts of real-time data, the embodiment of the present application adopts a parallel signal processing architecture based on FPGA. This architecture can process signals in parallel on multiple channels, ensuring that during real-time monitoring, the system can quickly analyze and process a large amount of measurement data, thereby reducing delays and providing timely feedback to the control system.

[0093] In addition, the embodiment of the present application also adopts a design of distributed collection and parallel processing, which means that the data of multiple measurement points can be collected and processed synchronously, improving the overall monitoring efficiency. In this way, the system can not only comprehensively monitor various parameters of the particle flight process, but also coordinate work between multiple monitoring points to ensure the integrity and efficient processing of the data.

[0094] In terms of the control system, the core of the output and controller of the embodiment of the present application uses an industrial computer as the main control unit and runs a real-time operating system (such as VxWorks or QNX). The real-time operating system ensures that the system processes and responds to all sensor data with extremely high real-time performance, meeting the requirements of the coating preparation process for rapid feedback and adjustment.

[0095] Finally, the control system uses the PID control algorithm to calculate the required adjustment amount based on the preset control target and the real-time acquired particle parameters (flight speed, temperature and particle size), and dynamically adjusts the process parameters of the powder feeder and plasma spray gun in real time. Common adjustment items include spraying power, air flow speed, etc. to ensure that the spraying process is always in the best working condition. Through the PID control algorithm, the system can quickly respond to changes in particle state and adjust related process parameters in real time. This process ensures the stability and consistency of the coating preparation process, ensuring that the flight state of each particle meets the requirements, thereby improving the quality of the coating.

[0096] In order to implement the above-mentioned embodiment, the present application also proposes a particle flight state monitoring device based on an improved double-slit spectrometer. Figure 4 The schematic diagram of the structure of a particle flight state monitoring device based on an improved double-slit spectrometer provided in an embodiment of the present application. Figure 4 As shown, the device comprises:

[0097] The capture module 100 is used to feed particles into the plasma spray gun through a powder feeder and spray them onto the target surface. During the flight of the particles, the optical signals of the particles are captured by using an improved double-slit spectrometer.

[0098] The separation module 200 is used to separate the optical signals of particles of different sizes by using a double slit design in the improved double slit spectrometer, and to separate the optical signals of different wavelengths by using a dichroic mirror;

[0099] The processing module 300 is used to record the signal waveforms of the two slits respectively after the separated light signals are focused by the receiving surface of the photodetector, and to filter, extract features and calculate parameters of the light signals through the photodetector to obtain particle parameters;

[0100] The industrial parameter adjustment module 400 is used to dynamically adjust the process parameters of the powder feeder and the plasma spray gun in combination with the particle parameters through a PID controller.

[0101] In order to implement the above embodiments, the present application also proposes an electronic device, comprising: a processor, and a memory communicatively connected to the processor; the memory stores computer-executable instructions; the processor executes the computer-executable instructions stored in the memory to implement the method provided by the above embodiments.

[0102] In order to implement the above embodiments, the present application also proposes a computer-readable storage medium, in which computer-executable instructions are stored. When the computer-executable instructions are executed by a processor, they are used to implement the methods provided by the above embodiments.

[0103] In order to implement the above embodiments, the present application also proposes a computer program product, including a computer program, which implements the methods provided by the above embodiments when executed by a processor.

[0104] The collection, storage, use, processing, transmission, provision and disclosure of user personal information involved in this application are in compliance with relevant laws and regulations and do not violate public order and good morals.

[0105] It should be noted that personal information from users should be collected for legitimate and reasonable purposes and should not be shared or sold outside of these legitimate uses. In addition, such collection / sharing should be carried out after receiving the user's informed consent, including but not limited to notifying the user to read the user agreement / user notice and sign the agreement / authorization including authorization of relevant user information before the user uses the function. In addition, any necessary steps should be taken to protect and safeguard access to such personal information data and ensure that others who have access to personal information data comply with its privacy policy and procedures.

[0106] The present application is expected to provide an implementation scheme for users to selectively block the use or access of personal information data. That is, the present disclosure is expected to provide hardware and / or software to prevent or block access to such personal information data. Once the personal information data is no longer needed, the risk can be minimized by limiting data collection and deleting the data. In addition, when applicable, such personal information is de-identified to protect the privacy of the user.

[0107] In the description of the aforementioned embodiments, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0108] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0109] Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, fragment or portion of code comprising one or more executable instructions for implementing the steps of a custom logical function or process, and the scope of the preferred embodiments of the present application includes alternative implementations in which functions may not be performed in the order shown or discussed, including performing functions in a substantially simultaneous manner or in the reverse order depending on the functions involved, which should be understood by technicians in the technical field to which the embodiments of the present application belong.

[0110] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute the instructions), or in combination with these instruction execution systems, devices or apparatuses. For the purpose of this specification, "computer-readable medium" can be any device that can contain, store, communicate, propagate or transmit a program for use by an instruction execution system, device or apparatus, or in combination with these instruction execution systems, devices or apparatuses. More specific examples of computer-readable media (a non-exhaustive list) include the following: an electrical connection with one or more wires (electronic device), a portable computer disk box (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), a fiber optic device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium and then editing, interpreting or processing in other suitable ways if necessary, and then stored in a computer memory.

[0111] It should be understood that the various parts of the present application can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, multiple steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0112] A person skilled in the art may understand that all or part of the steps in the method for implementing the above-mentioned embodiment may be completed by instructing related hardware through a program, and the program may be stored in a computer-readable storage medium, which, when executed, includes one or a combination of the steps of the method embodiment.

[0113] In addition, each functional unit in each embodiment of the present application may be integrated into a processing module, or each unit may exist physically separately, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.

[0114] The storage medium mentioned above may be a read-only memory, a magnetic disk or an optical disk, etc. Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limiting the present application. A person of ordinary skill in the art may change, modify, replace and modify the above embodiments within the scope of the present application.

[0115] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps recorded in this application can be executed in parallel, sequentially or in different orders, as long as the expected results of the technical solution of this application can be achieved, and this document is not limited here.

[0116] The above specific implementations do not constitute a limitation on the protection scope of this application. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions and improvements made within the spirit and principles of this application should be included in the protection scope of this application.

Claims

1. A particle flight state monitoring method based on an improved double-slit spectrometer, characterized in that: The following steps are involved: The particles are fed into the plasma spray gun through a powder feeder and sprayed onto the target surface, and during the flight of the particles, the optical signals of the particles are captured by an improved double-slit spectrometer; In the improved double-slit spectrometer, light signals of particles of different sizes are separated by a double-slit design, and light signals of different wavelengths are separated by a dichroic mirror; After the separated light signal is focused by the receiving surface of the photodetector, the signal waveforms of the two slits are recorded respectively, and the light signal is filtered, feature extracted and parameter calculated by the photodetector to obtain the particle parameters; The process parameters of the powder feeder and the plasma spray gun are dynamically adjusted by combining the particle parameters through a PID controller.

2. The method according to claim 1, characterized in that Before calculating the particle parameters, the light signal collected by the photodetector is processed as follows, including: Using Kalman filtering method to remove random noise in the optical signal; Analyzing the spectrum of the optical signal by Fourier transform to extract particle-related features; The peak value and waveform distribution of the optical signal are detected using a wavelet transform method.

3. The method according to claim 2, characterized in that The particle parameters include particle flight speed, and the calculation formula of the particle flight speed is: Among them, v p is the flying speed of the particle, s is the fixed distance between the double slits, and TOF is the time difference of the particle passing through the two slits, which is obtained by the time difference of the signal of the two slits recorded by the photoelectric detector.

4. The method according to claim 3, characterized in that The particle parameters include particle temperature, which is calculated based on a dual wavelength ratio method, including: Record the radiation intensities E(λ1) and E(λ2) of two different spectral wavelengths λ1 and λ2 respectively; The radiation ratio R is calculated based on the radiation intensity E(λ1) and E(λ2), and the formula is: The particle temperature T(k) is calculated as follows: Wherein, K2 is a constant related to the optical properties of the granular material, and ln is a natural logarithmic function.

5. The method according to claim 4, characterized in that The particle parameters include particle size, and the calculation formula of the particle size is: Among them, D p is the particle diameter, E(λ1) is the radiation intensity of the spectral wavelength λ1, DC is the normalization factor, and the calculation formula is: DC=K3ε(λ1) Where K3 is the normalization constant and ε(λ1) is the emissivity of the granular material at the spectral wavelength λ1.

6. A particle flight state monitoring device based on an improved double-slit spectrometer, characterized in that: include: A capture module is used to feed particles into the plasma spray gun through a powder feeder and spray them onto a target surface, and to capture optical signals of the particles using an improved double-slit spectrometer during the particle flight process; A separation module, used to separate light signals of particles of different sizes by a double slit design and to separate light signals of different wavelengths by a dichroic mirror in the improved double slit spectrometer; A processing module, used for recording the signal waveforms of the two slits respectively after the separated light signals are focused by the receiving surface of the photodetector, and filtering, feature extraction and parameter calculation of the light signals through the photodetector to obtain particle parameters; The industrial parameter adjustment module is used to dynamically adjust the process parameters of the powder feeder and the plasma spray gun in combination with the particle parameters through a PID controller.

7. An electronic device, characterized in that: include: A processor, and a memory communicatively connected to the processor; The memory stores computer-executable instructions; The processor executes the computer-executable instructions stored in the memory to implement the method according to any one of claims 1 to 5.

8. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer-executable instructions, which are used to implement the method according to any one of claims 1 to 5 when executed by a processor.

9. A computer program product, characterized in that The invention comprises a computer program, which implements the method according to any one of claims 1 to 5 when being executed by a processor.

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