LabDCT characterization method of large-size thin-layer material

Abstract

The invention provides a LabDCT characterization method of a large-size thin-layer material, and relates to the technical field of materials. A thin-layer material is fixedly attached to the interior of a hollow pipe or arranged outside the hollow pipe in a sleeving mode, the hollow pipe with the thin-layer material is placed in LabDCT equipment for characterization, and the thin-layer material comprises a foil material and a thin-film material. According to the method, the hollow pipe is arranged, the thin-layer material is attached to the interior of the hollow pipe or arranged outside the hollow pipe in a sleeving mode, the thin-layer material is placed in the LabDCT equipment for characterization analysis, the size of the LabDCT characterization material can be effectively increased, the application range of the LabDCT equipment is widened, and the device and the operation method are simple, feasible and low in use cost. Important information such as internal crystal orientation and grain size of the thin-layer material with special geometrical morphology can be obtained through representation of a common method, and further development of scientific research of the thin-layer material and development of an inspection method of the industrial thin-layer material are promoted.

Description

Technical Field

[0001] The present invention relates to the technical field of materials, and in particular to a LabDCT characterization method for large-size thin-layer materials. Background Art

[0002] Thin-layer materials such as foils are widely used in industry and daily life due to their light weight, good ductility and conductivity. For example, copper foil is one of the basic materials in the electronics industry and lithium batteries due to its good conductivity. It is widely used in the production of printed circuit boards and copper-clad laminates. Aluminum foil is often used in the manufacture of lightweight components and thermal control systems in the aerospace field due to its excellent properties of light weight and high thermal conductivity. With the advancement of science and technology and the development of new materials, the application field of foils is constantly expanding and has become one of the indispensable materials in modern industry.

[0003] Further research on materials is inseparable from high-precision characterization of materials. For example, LabDCT (Laboratory Diffraction Contrast Tomography) is a three-dimensional crystal structure analysis technology that can reveal information such as crystal orientation and grain size inside the material, which is helpful for further in-depth analysis of the material. However, the penetration ability of X-rays used in the current LabDCT technology limits the size of samples that can be analyzed, especially for metal samples, the maximum size (or sample observation range) is length × width ≤ 5 × 0.8 mm. 2 Sheet samples, or cylindrical samples with a diameter of ≤φ1mm can be used to reduce exposure time and improve resolution, thereby obtaining more accurate results. If it is a material with a high atomic number, the size needs to be 20% to 40% smaller. Therefore, for the analysis of large-sized samples, special equipment configuration or other technologies are required. Thin-layer materials, especially metal foils, are used in large sizes in practical applications, so people often expect a larger characterization range. The existing LabDCT technology cannot meet the characterization and analysis of large-sized thin-layer materials. Therefore, the development of characterization methods for large-sized thin-layer materials using LabDCT technology is not only important for the development and research of materials, but also has important significance for expanding the application scope of this technology. Summary of the invention

[0004] The purpose of the present invention is to provide a LabDCT characterization method for large-sized thin-layer materials, so as to achieve the technical effect that LabDCT can characterize and analyze large-sized thin-layer materials.

[0005] The present invention is achieved through the following technical solutions:

[0006] The method comprises fixing a thin layer of material in a hollow tube or sleeved outside the hollow tube, and placing the hollow tube with the thin layer of material in a LabDCT device for characterization, wherein the thin layer of material comprises a foil material and a film material.

[0007] In order to better implement the present invention, further, the material of the hollow tube includes but is not limited to quartz, plastic or a material that can be transmitted by X-rays, and the material of the hollow tube has a crystal structure difference with the thin layer material to be detected.

[0008] In order to better implement the present invention, further, the hollow tube is provided with a fixing opening for fixing the thin layer material.

[0009] In order to better implement the present invention, further, the cross-section of the hollow tube includes but is not limited to circular, square or triangular.

[0010] The beneficial effect of the present invention is that the present invention sets a hollow tube, fixes the thin layer material inside the hollow tube or sets it outside the hollow tube, and places it in the LabDCT device for characterization and analysis. This method can effectively increase the size of the thin layer material characterized by LabDCT to length × width ≥ 60 × 0.8 mm 2 , broadening the application scope of LabDCT. The device and operation method provided by the present invention are simple and feasible, and have low use cost.

[0011] Characterization by common methods can provide important information such as the special geometric morphology of large-scale thin-layer materials and their internal crystal orientation and grain size, which is conducive to promoting the further development of thin film material scientific research and the development of industrial inspection methods. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] In order to more clearly illustrate the technical solution of the present invention, the accompanying drawings required for use in the present invention will be briefly introduced below. It should be understood that the following accompanying drawings only show certain embodiments of the present invention and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other related drawings can be obtained based on these accompanying drawings without paying creative work.

[0013] Figure 1 A top view of a cylindrical hollow tube provided by the present invention;

[0014] Figure 2 A side view of a cylindrical hollow tube provided by the present invention;

[0015] Figure 3 A front view of a cylindrical hollow tube provided by the present invention;

[0016] Figure 4 A three-dimensional diagram of placing a copper foil in a hollow tube provided by the present invention;

[0017] Figure 5 A front view of placing a copper foil in a hollow tube provided by the present invention;

[0018] Figure 6 A side view of placing a copper foil in a hollow tube provided by the present invention;

[0019] Figure 7 A three-dimensional diagram of placing a copper foil in a hollow tube provided by the present invention;

[0020] Figure 8 A front view of the copper foil placed in a hollow tube provided by the present invention;

[0021] Fig. 9 A side view of the copper foil placed in a hollow tube provided by the present invention;

[0022] Fig.10 An experimental diagram of a cylindrical hollow tube provided by the present invention with materials placed therein being placed in a LabDCT device;

[0023] Fig.11 This is a result diagram obtained after characterization by LabDCT equipment using this method in Example 1;

[0024] Fig.12 This is a result diagram obtained after characterization with a LabDCT device using this method in Example 1. DETAILED DESCRIPTION

[0025] The technical solution of the present invention will be described below in conjunction with the accompanying drawings of the present invention.

[0026] It should be noted that similar reference numerals and letters represent similar items in the following drawings, so once an item is defined in one drawing, it does not need to be further defined and explained in the subsequent drawings. At the same time, in the description of the present invention, the terms "first", "second", etc. are only used to distinguish the description and cannot be understood as indicating or implying relative importance.

[0027] Embodiment 1:

[0028] A LabDCT characterization method for large-size thin-layer materials: the thin-layer material is fixedly attached to a hollow tube or sleeved outside a hollow tube, and the hollow tube with the thin-layer material is placed in a LabDCT device for characterization. The hollow tube material has a different crystal structure from the thin-layer material to be detected, and preferably uses a material that can be transmitted by X-rays, such as quartz and plastic, and a fixed port is opened on the hollow tube, such as Figure 1-3 As shown, the cross-section of the hollow tube is circular, square, triangular or other conventional shapes.

[0029] In this embodiment, the hollow tube is made of quartz, with a circular cross section and a diameter of 20 mm. The length of the fixed opening is 15 mm and the width is 2 mm. The copper foil is fixedly applied to the surface of the hollow tube, and one end of the copper foil is inserted into the fixed opening for fixing. Figure 4-9 shown.

[0030] The hollow tube with copper foil was placed in the LabDCT equipment for characterization, such as Fig.10 , the characterization morphology is obtained as Fig.11 As shown in the figure, the length of the annealed electrolytic polycrystalline copper foil sample tested can reach nearly 63mm.

[0031] Embodiment 2:

[0032] A LabDCT characterization method for large-size thin-layer materials: the thin-layer material is fixedly attached to a hollow tube or sleeved outside a hollow tube, and the hollow tube with the thin-layer material is placed in a LabDCT device for characterization. The hollow tube material has a different crystal structure from the thin-layer material to be detected, preferably quartz, plastic or a material that can be transmitted by X-rays, and a fixed opening is opened on the hollow tube, such as Figure 1-3 As shown, the cross-section of the hollow tube is circular, square, triangular or other conventional shapes.

[0033] In this embodiment, the hollow tube is made of quartz, has a circular cross section, a diameter of 20 mm, a fixed opening slot length of 15 mm, and a width of 2 mm. The copper foil is fixedly applied to the surface of the hollow tube, and one end of the copper foil is inserted into the fixed opening. Figure 4-9 As shown, the hollow tube with copper foil is placed in a heating furnace and annealed at 1040°C for 60 min in an Ar and H2 atmosphere (excluding the 60 min heating time), the annealing pressure is 101.325 kPa, the Ar flow rate is 500 sccm, the H2 flow rate is 40 sccm, and then air-cooled to room temperature and taken out.

[0034] The treated copper foil and hollow tube were placed in LabDCT equipment for characterization, such as Fig.10 As shown, the characterization morphology is shown in Fig.12 As shown in the figure, the length of the annealed rolled polycrystalline copper foil sample tested can reach nearly 65 mm.

[0035] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. Therefore, the protection scope of the present invention should be based on the protection scope of the claims.

Claims

1. A LabDCT characterization method for large-size thin-layer materials, characterized in that: The method comprises fixing a thin layer of material in a hollow tube or sleeved outside the hollow tube, and placing the hollow tube with the thin layer of material in a LabDCT device for characterization, wherein the thin layer of material comprises a foil material and a film material.

2. The characterization method according to claim 1, characterized in that The material of the hollow tube includes but is not limited to quartz, plastic or a material that is transparent to X-rays, and the material of the hollow tube has a crystal structure difference with the thin layer material to be detected.

3. The characterization method according to claim 1, characterized in that The hollow tube is provided with a fixing opening for fixing the thin layer material.

4. The characterization method according to claim 1, characterized in that The cross-section of the hollow tube includes but is not limited to circular, square or triangular.

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