Measuring device and production equipment

Abstract

The invention relates to a measuring device and production equipment, the measuring device comprises a measuring module, a driving platform, a transfer structure and an illumination assembly, and the measuring module comprises a camera; the driving platform is provided with a measuring area corresponding to the detection range of the camera; the transferring structure is movably arranged on the driving platform, the transferring structure can move to the measuring area, the transferring structure comprises a support, a carrying beam erected on the support and a jig arranged on the carrying beam, and the jig is used for picking up a workpiece; the lighting assembly comprises a first backlight assembly and a second backlight assembly, the first backlight assembly is arranged on the carrying beam and faces the jig, the second backlight assembly is located in the measuring area at least when the transferring structure is located in the measuring area, and the second backlight assembly is located at the position away from the camera relative to the carrying beam along the optical axis of the camera; wherein the carrying beam is rotationally connected with the support, the carrying beam can rotate to the position where the first backlight assembly faces the camera, and the carrying beam can rotate to the position where the jig and the workpiece are located between the camera and the second backlight assembly in a suspended mode.

Description

Technical Field

[0001] The present application relates to the field of measurement technology, and in particular to a measuring device and production equipment. Background Art

[0002] With the development of science and technology, in order to achieve specific and complex functions, various devices and equipment have higher and higher requirements for the precision of their components. Therefore, it is usually necessary to conduct defect detection and size measurement on products before they leave the factory to eliminate defective products. The traditional technology is similar to the way of defect detection and measurement of products. The camera is used with a light source to obtain the image of the product to be inspected, and the image is analyzed to determine whether the product meets the requirements. For the defect detection and measurement methods in traditional technology, the light source illumination method is an important factor affecting the quality of the image obtained by the camera.

[0003] However, in current defect detection and measurement methods, there is a problem that the acquired images are inconvenient to process due to insufficient lighting. Summary of the invention

[0004] Based on this, it is necessary to provide a measuring device and production equipment to address the problem of inconvenience in product inspection and measurement caused by insufficient lighting.

[0005] On one hand, the present application provides a measuring device, which includes a measuring module, a driving platform, a transfer structure and an illumination component, wherein the measuring module includes a camera; the driving platform is provided with a measuring area corresponding to the detection range of the camera; the transfer structure is movably provided on the driving platform, and the transfer structure can move to the measuring area, the transfer structure includes a bracket, a carrier beam mounted on the bracket and a fixture provided on the carrier beam, and the fixture is used to pick up a workpiece; the illumination component includes a first backlight component and a second backlight component, the first backlight component is provided on the carrier beam and faces the fixture, the second backlight component is located in the measuring area at least when the transfer structure is in the measuring area, and along the optical axis of the camera, the second backlight component is located at a position relative to the carrier beam away from the camera; wherein the carrier beam is rotatably connected to the bracket, the carrier beam can be rotated to a position where the first backlight component faces the camera, and the carrier beam can be rotated to a position where the fixture and the workpiece are suspended between the camera and the second backlight component.

[0006] In one embodiment, the first backlight assembly and the fixture are disposed on the same side of the carrier beam.

[0007] In one embodiment, the orthographic projection of the jig on the first backlight assembly is located within the orthographic projection of the workpiece picked up by the jig on the first backlight assembly.

[0008] In one of the embodiments, the fixture is configured as a light-transmitting member or a partially light-transmitting member, and the illumination light provided by the first backlight assembly can pass through the fixture to provide illumination to the workpiece.

[0009] In one of the embodiments, a plurality of the jigs are arranged at intervals along a reference direction, and the first backlight assembly and / or the second backlight assembly are arranged in a long strip extending along the reference direction so that the provided illumination light can cover the area where the jigs are located.

[0010] In one embodiment, a plurality of the jigs are arranged at intervals along a reference direction, the first backlight assembly and / or the second backlight assembly comprises a plurality of lighting parts arranged at intervals along the reference direction, and the plurality of lighting parts correspond to the plurality of the jigs to provide lighting.

[0011] In one embodiment, the transfer structure also includes a driving member, the carrier beam is hollow and rotates around a first axis relative to the bracket, the first backlight assembly is provided with a plurality of through holes, a plurality of driving members are arranged in the carrier beam and pass through the through holes to partially extend out of the carrier beam, and the plurality of driving members are respectively connected to a plurality of the jigs to drive the plurality of the jigs to rotate synchronously and independently around a second axis; the second axis intersects with the first axis.

[0012] In one embodiment, the first axis is perpendicular to the second axis.

[0013] In one embodiment, the first backlight assembly is configured in a plate shape, and the second axis is perpendicular to the first backlight assembly.

[0014] In one embodiment, the driving platform is connected to the bracket to drive the transfer structure to move to the measuring area, and the second backlight assembly is disposed in the measuring area and faces the camera.

[0015] In one embodiment, the driving platform includes a driving component and a panel covering the driving component, a partial structure of the bracket extends between the driving component and the panel and is connected to the driving component, and the second backlight assembly is fixed to a side of the panel facing the camera.

[0016] In one embodiment, the second backlight assembly is disposed at a portion of the bracket that is away from the camera relative to the carrier beam and faces the side where the camera is located.

[0017] In one embodiment, the bracket includes a column and a connecting plate, the two columns are arranged at an interval, the connecting plate is connected between the two columns, the connecting plate is connected to the driving platform, the two ends of the carrier beam are respectively rotatably connected to the two columns, and relative to the connecting plate, the carrier beam is closer to the side where the camera is located; the second backlight assembly is arranged on the bracket in the area between the carrier beam and the connecting plate, and extends laterally out of the space clamped by the carrier beam and the connecting plate.

[0018] In one embodiment, the measuring device also includes a base and a frame mounted on the base, the driving platform and the lighting assembly are both disposed on the base, the measuring module also includes a light source, the light source provides lighting for the camera to shoot, and the camera and the light source are both disposed on the frame.

[0019] On the other hand, the present application provides a production equipment, which includes the measuring device as described above.

[0020] In the above-mentioned measuring device, the first backlight assembly and the fixture are both arranged on the carrier beam, and the first backlight assembly faces the fixture. When the carrier beam rotates relative to the bracket to the position where the first backlight assembly faces the camera, the first backlight assembly faces the fixture and the camera, so the illumination light provided by the first backlight assembly can highlight the outer contour of the workpiece picked up by the fixture, that is, provide a backlight effect, so that the camera can obtain a high-contrast image, which is convenient for measurement and analysis. Further, the second backlight assembly is in the measurement area. Moreover, in the direction pointed by the optical axis of the camera, the second backlight assembly is located at a position far away from the camera relative to the carrier beam, so the carrier beam can be easily rotated to a position where the fixture and the workpiece are suspended between the camera and the second backlight assembly. At this time, the illumination light of the second backlight assembly can also highlight the outer contour of the workpiece picked up by the fixture, that is, provide a backlight effect for measurement and analysis. It is easy to understand that the carrier beam is switched between the position where the illumination is provided by the first backlight assembly and the position where the illumination is provided by the second backlight assembly by rotating. As the carrier beam rotates, the posture of the workpiece located on the carrier beam also changes accordingly. That is to say, the posture of the workpiece when illuminated by the first backlight assembly is different from that when illuminated by the second backlight assembly. The posture of the workpiece can be switched by rotating the carrier beam so that the first backlight assembly and the second backlight assembly can provide backlight illumination respectively, thereby fully measuring the dimensions of the workpiece in all directions. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1a A side view of an exemplary detection device provided in one embodiment of the present application.

[0022] Figure 1b for Figure 1a A side view of the exemplary detection device after the rotating structure is rotated by a certain angle.

[0023] Figure 2 A side view of a measuring device provided in one embodiment of the present application.

[0024] Figure 3 for Figure 2 A schematic diagram of the distribution of the transfer structure, the lighting assembly and the measuring module in the measuring device when the carrying beam is in the first detection position is shown.

[0025] Figure 4 for Figure 2 A schematic diagram of the distribution of the transfer structure, the lighting assembly and the measuring module in the measuring device when the carrying beam is at the second detection position.

[0026] Figure 5 for Figure 2 A schematic isometric view of the transfer structure and drive platform in the measuring device shown.

[0027] Figure 6 for Figure 2 Axonometric diagram of the transfer structure in the measuring device shown.

[0028] Figure 7 This is a front view of the transfer structure provided in the second aspect of an embodiment of the present application.

[0029] Figure 8 This is a top view of a first backlight assembly provided in the third aspect of an embodiment of the present application.

[0030] Figure numerals: 10, measuring device; 100, measuring module; 110, camera; 120, light source; 200, transfer structure; 210, bracket; 211, column; 212, connecting plate; 220, load beam; 230, fixture; 240, driving member; 300, lighting component; 301, lighting unit; 310, first backlight component; 311, perforation; 320, second backlight component; 400, driving platform; 401, measuring area; 410, driving component; 420, panel; 500, frame; 20, workpiece; 30, carrier; 31, supporting structure; 32, rotating structure; 33, picking structure; 40, product; 41, top surface; 42, side surface; U, first rotation axis; O1, first axis; O2, second axis; L, optical axis; L0, lighting light; K, reference direction; S, distribution direction. DETAILED DESCRIPTION

[0031] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0032] In the description of the present application, it should be understood that if the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or position relationship indicated by these terms is based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application.

[0033] In addition, if the terms "first" or "second" appear, these terms are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, if the term "plurality" appears, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0034] In this application, unless otherwise clearly specified and limited, if the terms "installed", "connected", "connected", "fixed" and the like appear, these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0035] In the present application, unless otherwise clearly specified and limited, if there is a description that a first feature is "above" or "below" a second feature, etc., or similar descriptions appear, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "above" and "above" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. The first feature being "below", "below" and "below" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0036] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. If an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. If any, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are for illustrative purposes only and do not represent the only implementation method.

[0037] The detection device in the conventional technology usually includes a base, a detection module and a carrier 30, and the carrier 30 and the detection module are both arranged on the base. The detection module includes a camera and a light source, and the detection module is usually supported by the base, so that the camera and the light source are at a higher position relative to the carrier 30, which is convenient for detection. Figure 1a and Figure 1b The carrier 30 generally includes a support structure 31, a rotating structure 32 and a picking structure 33. The support structure 31 is connected to the base. The rotating structure 32 is disposed on the support structure 31 and can rotate relative to the support structure 31 around a first rotation axis U. The picking structure 33 is used to pick up the product 40. The picking structure 33 is disposed on the top surface of the rotating structure 32. Figure 1a As shown, when the picking structure 33 rotates with the rotating structure 32 until the top surface 41 of the product 40 faces the detection module, the detection module can detect the top surface 41 of the product 40. Figure 1b As shown, when the picking structure 33 rotates with the rotating structure 32 until the side 42 of the product 40 faces the detection module, the detection module can detect the side 42 of the product 40. However, as mentioned above, since the light source 120 and the camera are set up together and are located at a high position relative to the carrier 30, when the detection device needs to measure the size of the product 40, the lighting is often insufficient, and it is difficult to effectively distinguish the edge wheel contour of the product 40 from the background, resulting in greater difficulty in processing the acquired image.

[0038] In order to solve the above problems, the inventor of the present application provides a measuring device, which includes a measuring module, a transfer structure and an illumination component. The measuring module is used to detect and measure the workpiece picked up by the transfer structure. The transfer structure includes a bracket, a carrier beam and a fixture. The carrier beam is rotatably mounted on the bracket, and the fixture is arranged on the carrier beam and used to pick up the workpiece. The illumination component includes a first backlight component and a second backlight component. The first backlight component is arranged on the carrier beam and faces the fixture. Therefore, when the carrier beam rotates to the side where the fixture is located and faces the measuring module, the top surface of the workpiece faces the measuring module accordingly. The first backlight component can provide a backlight effect to highlight the outer contour of the workpiece. The second backlight component can be opposite to the measuring module. When it is necessary to detect the side of the workpiece, the carrier beam can be driven to flip relative to the bracket, so that the workpiece extends from the side into the space sandwiched by the second backlight component and the measuring module, and is arranged in a suspended state. As a result, the second backlight component can provide a backlight effect when the side of the workpiece is detected, highlighting the outer contour of the workpiece in another direction. Therefore, the measuring device provided by the present application can measure the dimensions of at least two surfaces of a workpiece at the same time. The measuring module provided by each embodiment of the present application is described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0039] See also Figure 2 , Figure 2 This is a side view of a measuring device provided in one embodiment of the present application. The measuring device 10 provided in one embodiment of the present application can perform defect detection and measurement on a workpiece 20. In each embodiment, the measuring device 10 is described by taking measurement as an example. It should be understood that the same is true when the measuring device 10 performs defect detection on the workpiece 20, so it will not be described separately.

[0040] See also Figures 2 to 4In one embodiment, the measuring device 10 includes a measuring module 100, a transfer structure 200, an illumination assembly 300 and a driving platform 400, wherein the transfer structure 200 is used to pick up a workpiece 20. The measuring module 100 includes a camera 110, and the camera 110 is used to perform appearance inspection and measurement on the workpiece 20 located within its detection range. The driving platform 400 is provided with a measuring area 401 corresponding to the detection range of the camera 110. The transfer structure 200 is movably disposed on the driving platform 400, and the transfer structure 200 can move to the measuring area 401. When the transfer structure 200 is in the measuring area 401, the workpiece 20 picked up by the transfer structure 200 can be measured. The transfer structure 200 includes a bracket 210, a carrier beam 220 and a fixture 230, wherein the carrier beam 220 is mounted on the bracket 210, and the fixture 230 is disposed on the carrier beam 220, and the fixture 230 is used to pick up the workpiece 20. The lighting assembly 300 includes a first backlight assembly 310 and a second backlight assembly 320. The first backlight assembly 310 is disposed on the carrier beam 220 and faces the fixture 230. The second backlight assembly 320 is located in the measurement area 401 at least when the transfer structure 200 is in the measurement area 401. In addition, along the optical axis L of the camera 110, the second backlight assembly 320 is located at a position away from the camera 110 relative to the carrier beam 220. The carrier beam 220 is rotatably connected to the bracket 210, and the carrier beam 220 can be rotated to a position where the first backlight assembly 310 faces the camera 110, and the carrier beam 220 can be rotated to a position where the fixture 230 and the workpiece 20 are suspended between the camera 110 and the second backlight assembly 320.

[0041] In the above-mentioned measuring device 10, the first backlight assembly 310 and the fixture 230 are both disposed on the carrier beam 220, and the first backlight assembly 310 faces the fixture 230. Figure 3 When the beam 220 rotates relative to the bracket 210 to a position where the first backlight assembly 310 faces the camera 110, the first backlight assembly 310 faces the fixture 230 and the camera 110. Therefore, the illumination light provided by the first backlight assembly 310 can highlight the outer contour of the workpiece 20 picked up by the fixture 230, that is, provide a backlight effect, so that the camera 110 can obtain a high-contrast image, which is convenient for measurement and analysis. Figure 4, further, the second backlight assembly 320 is in the measurement area 401. Moreover, in the direction pointed by the optical axis L of the camera 110, the second backlight assembly 320 is located at a position far away from the camera 110 relative to the carrier beam 220, so the carrier beam 220 can be easily rotated to a position where the fixture 230 and the workpiece 20 are suspended between the camera 110 and the second backlight assembly 320. At this time, the illumination light of the second backlight assembly 320 can also highlight the outer contour of the workpiece 20 picked up by the fixture 230, that is, provide a backlight effect for measurement and analysis. It is easy to understand that the carrier beam 220 switches between the position where the illumination is provided by the first backlight assembly 310 and the position where the illumination is provided by the second backlight assembly 320 by rotating. As the carrier beam 220 rotates, the posture of the workpiece 20 located on the carrier beam 220 also changes accordingly. That is to say, the posture of the workpiece 20 when illuminated by the first backlight assembly 310 is different from the posture of the workpiece 20 when illuminated by the second backlight assembly 320. The posture of the workpiece 20 can be switched by rotating the carrier beam 220, so that the first backlight assembly 310 and the second backlight assembly 320 provide backlight illumination respectively, and the dimensions of the workpiece 20 in various directions can be fully measured.

[0042] like Figure 4 As shown, the workpiece 20 is suspended between the camera 110 and the second backlight assembly 320 . Suspended means that the illumination light L0 provided by the second backlight assembly 320 and directed toward the workpiece 20 is not blocked by other structures except for being blocked by the workpiece 20 , so the outer contour of the workpiece 20 can be highlighted.

[0043] The second backlight assembly 320 is located in the measuring area 401 at least when the transfer structure 200 is in the measuring area 401. Figure 2 In the first aspect, the second backlight assembly 320 can be directly disposed in the measuring area 401 and facing the camera 110, so that when the carrier beam 220 rotates until the workpiece 20 is located between the second backlight assembly 320 and the camera 110, the second backlight assembly 320 can provide a backlight effect to facilitate measurement. Figure 7 In the second aspect, the second backlight assembly 320 can also be arranged at a position on the bracket 210 that is relatively far from the camera 110 relative to the carrier beam 220, so that the second backlight assembly 320 can move to the measurement area 401 with the transfer structure 200 as a whole. At this time, the carrier beam 220 can also rotate to a position where the workpiece 20 is located between the second backlight assembly 320 and the camera 110. In the following embodiments, two different arrangements of the second backlight assembly 320 will be described in combination with specific components of the transfer structure 200.

[0044] It is understandable that the first backlight assembly 310 is closer to the carrier beam 220 relative to the fixture 230 so as to provide backlight illumination. The above-mentioned first backlight assembly 310 facing the vector measurement module 100 means that the light-emitting side of the first backlight assembly 310 faces the camera 110. For the convenience of explanation in each embodiment, when the first backlight assembly 310 faces the camera 110, the position of the carrier beam 220 relative to the bracket 210 is recorded as the first detection position. When the fixture 230 and the workpiece 20 are suspended between the second backlight assembly 320 and the camera 110, the position of the carrier beam 220 relative to the bracket 210 is recorded as the second detection position. The angle of rotation of the carrier beam 220 relative to the bracket 210 from the first detection position to the second detection position is recorded as the switching angle.

[0045] like Figure 3 As shown in FIG. 1 , the carrier beam 220 is in the first detection position. Figure 4 As shown, the carrier beam 220 is in the second detection position. When the carrier beam 220 is in the first detection position, in the image acquired by the camera 110, the area of ​​the first backlight assembly 310 that is not blocked by the workpiece 20 is relatively bright, while the area of ​​the first backlight assembly 310 that is blocked by the workpiece 20 is relatively dark. By comparing the bright area with the dark area, the outline of the workpiece 20 can be easily determined, and the size of the workpiece 20 can be analyzed and obtained. The same is true when the carrier beam 220 is in the second detection position, so it will not be repeated.

[0046] See also Figures 2 to 4 , further, take the first backlight assembly 310 and the fixture 230 disposed on the top surface of the carrier beam 220 as an example. Figure 3 When the top surface of the beam 220 faces the camera 110 (i.e., the beam 220 is at the first detection position), the upper end surface of the workpiece 20 picked up by the fixture 230 also faces the camera 110. Under the backlight of the first backlight assembly 310, the camera 110 can easily obtain the relevant dimensions (such as length and width) of the upper end surface of the workpiece 20. Figure 4 , when the carrier beam 220 is rotated relative to the bracket 210 through the switching angle as mentioned above, so that the top surface of the carrier beam 220 faces the side, one side of the circumference of the workpiece 20 picked up by the fixture 230 will face the camera 110. Under the backlight effect of the second backlight assembly 320, the camera 110 can easily obtain the relevant dimensions of the side circumference of the workpiece 20 (such as thickness dimension, width dimension or length dimension). For a workpiece 20 that is roughly plate-shaped, after being detected at the first detection position and the second detection position respectively, the dimensions of the workpiece 20 in various directions can be determined. Of course, the measurement module 100 is not limited to measuring the overall dimensions of the workpiece 20. For example, in some embodiments, the dimensions of the local structure on the workpiece 20 can also be measured, which can be set according to actual needs.

[0047] In one embodiment, the specific value of the switching angle may be between 0-180°, and the specific value of the switching angle may be 15°, 30°, 45°, 60°, 75°, 90°, 120°, 150°, etc. The specific value of the switching angle may be specifically designed according to the shape of the workpiece 20 and the specific shape of the part to be inspected. For example, the switching angle may be configured to be 90°, so as to measure the workpiece 20 whose upper end surface is perpendicular to the side circumference.

[0048] See also Figure 3 and Figure 4 In one embodiment, the direction from the fixture 230 to the carrier beam 220 is recorded as the distribution direction S. Figure 3 When the carrier beam 220 is at the first detection position, the distribution direction S may be parallel to the optical axis L of the camera 110. Figure 4 , when the carrier beam 220 is in the second detection position, the distribution direction S can be perpendicular to the optical axis L of the camera 110. That is to say, when the carrier beam 220 is in the second detection position, the jig 230 and the carrier beam 220 are roughly distributed in a horizontal direction relative to the roughly vertical optical axis L of the camera 110. Thus, the bracket 210 and the carrier beam 220 can support the jig 230 and the workpiece 20 picked up by the jig 230 to be stably located between the second backlight assembly 320 and the camera 110 without blocking the illumination light L0 of the second backlight assembly 320 directed toward the jig 230 and the workpiece 20, that is, the jig 230 and the workpiece 20 picked up by the jig 230 are in a suspended state as described in each embodiment.

[0049] See also Figure 3 and Figure 4 In one embodiment, the first backlight assembly 310 and the fixture 230 are disposed on the same side of the carrier beam 220, so the first backlight assembly 310 can more directly and fully provide illumination to the fixture 230 and the workpiece 20 picked up by the fixture 230. Of course, when the workpiece 20 has a larger size, the first backlight assembly 310 can also be arranged on the circumferential side of the carrier beam 220 to fully provide illumination to the workpiece 20.

[0050] See also Figure 3 In one embodiment, the orthographic projection of the jig 230 on the first backlight assembly 310 is located within the orthographic projection of the workpiece 20 picked up by the jig 230 on the first backlight assembly 310. In other words, the jig 230 can be constructed to be sufficiently small relative to the workpiece 20 to reduce the probability that the jig 230 blocks the illumination light of the first backlight assembly 310 and is misjudged as the outer contour of the workpiece 20, thereby improving the measurement accuracy and effectiveness. The orthographic projection described in this embodiment can be an orthographic projection along the optical axis L direction of the camera 110 when the carrier beam 220 is in the first detection position.

[0051] See also Figure 3In one embodiment, the fixture 230 is configured as a light-transmitting member or a partially light-transmitting member, that is, the illumination light provided by the first backlight assembly 310 can pass through the fixture 230 to provide illumination to the workpiece 20, so as to reduce the probability that the fixture 230 blocks the illumination light of the first backlight assembly 310 and is misjudged as the outer contour of the workpiece 20, thereby improving the measurement accuracy and effectiveness. In short, the partial structure of the fixture 230 that has the risk of blocking the workpiece can be configured to have a light-transmitting property.

[0052] See also Figure 5 and Figure 6 In one embodiment, the carrier beam 220 rotates relative to the bracket 210 about the first axis O1, and the fixture 230 can rotate relative to the carrier beam 220 about the second axis O2. The second axis O2 intersects the first axis O1. In this embodiment, the fixture 230 is also capable of rotating relative to the carrier beam 220, which can enrich the posture of the fixture 230 in the measurement area 401, so that different sides of the workpiece 20 can be rotated to a position facing the camera 110, so as to improve the comprehensiveness and efficiency of measurement.

[0053] Furthermore, the transfer structure 200 further includes a driving member 240 and a driver (not shown in the figure, the same below). The carrier beam 220 is hollow. The first backlight assembly 310 is provided with a plurality of through holes 311, and a plurality of driving members 240 are arranged in the carrier beam 220 and pass through the through holes 311 to partially extend out of the carrier beam 220. The plurality of driving members 240 are respectively connected to the plurality of fixtures 230 to drive the plurality of fixtures 230 to rotate around the second axis O2. Figure 4 , taking the case where the beam 220 is located at the second detection position and the workpiece 20 is roughly plate-shaped, as mentioned above, at this time, one side of the workpiece 20 faces the camera 110, and driving the fixture 230 to rotate can make different side surfaces of the workpiece 20 face the camera 110 respectively. Thus, on the one hand, specific structural features on different side surfaces of the workpiece 20 can be measured. On the other hand, different outer contour dimensions of the workpiece 20 can also be measured, for example, when the long side surface faces the camera 110, the length of the workpiece 20 can be measured, and when the wide side surface faces the camera 110, the width of the workpiece 20 can be measured.

[0054] Furthermore, the driver may be disposed in the carrier beam 220 and connected to the carrier beam 220 and the bracket 210 to drive the carrier beam 220 to rotate relative to the bracket 210 .

[0055] In one embodiment, the plurality of driving members 240 can drive the plurality of fixtures 230 to rotate synchronously around the second axis O2 to perform measurements in batches.

[0056] In another embodiment, the plurality of driving members 240 can also drive the plurality of jigs 230 to rotate independently around the second axis O2. Thus, the posture of the workpiece 20 picked up by any jig 230 can be adjusted in a targeted manner to improve the consistency of the posture of the workpiece 20. That is, when the posture of one or part of the workpieces 20 is different from the posture of other workpieces 20, driving the workpiece 20 to rotate a certain angle can make the postures of all workpieces 20 tend to be consistent, so as to facilitate batch measurement. It should be noted that the different postures of the workpieces 20 will not only cause the area of ​​the workpiece 20 that needs to be measured to be unable to be correctly displayed on the measurement module. For measurement, if the consistency of the posture of the workpiece 20 is poor, it means that at least part of the workpiece 20 is not in the expected posture to be measured during measurement, then the result obtained by measuring this part of the workpiece 20 cannot reflect the actual physical quantity of the workpiece 20, resulting in low reliability of the measurement result.

[0057] See also Figure 5 and Figure 6 In one embodiment, the driving member 240 includes an output shaft, and the output shaft of the driving member 240 passes through the through hole 311 to be connected to the fixture 230. The first axis O1 may be perpendicular to the second axis O2.

[0058] See also Figure 6 In one embodiment, the first backlight assembly 310 is configured in a plate shape, and the second axis O2 may be perpendicular to the first backlight assembly 310 .

[0059] See also Figure 2 In one embodiment, the measuring device 10 further includes a base (not shown in the figure, the same below) and a frame 500, the frame 500 is mounted on the base, and the driving platform 400 and the lighting assembly 300 are both mounted on the base. The measuring module 100 is mounted on the frame 500. Furthermore, the camera 110 is mounted on the frame 500, so that the camera 110 has a higher position relative to the transfer structure 200 and the lighting assembly 300, which is convenient for measurement.

[0060] See also Figure 2 , combined with Figure 5 In one embodiment, the driving platform 400 is disposed on the base, and the driving platform 400 is connected to the bracket 210 to drive the transfer structure 200 to move relative to the base. In other words, the transfer structure 200 may have the ability to move under the driving action of the driving platform 400, for example, the driving platform 400 drives the transfer structure 200 to move to the measuring area 401, and other positions outside the measuring area 401 (such as the loading position, the unloading position, etc.). As mentioned above, the second backlight assembly 320 may be disposed in the measuring area 401 and facing the camera 110. With such a configuration, when the second backlight assembly 320 is required to provide lighting for measurement, the carrier beam 220 can be driven to flip sideways, so that the fixture 230 and the workpiece 20 are suspended between the camera 110 and the second backlight assembly 320.

[0061] like Figure 6 and Figure 7 , further, the carrier beam 220 can be arranged at a distance from the driving platform 400, and the distance is configured to accommodate the second backlight assembly 320. Thus, the carrier beam 220 can pass through and remain at the position where the second backlight assembly 320 is located on the driving platform 400 without obstacles. For example, when the carrier beam 220 is in the first detection position, the first backlight assembly 310 needs to face the camera 110 and be aligned with the camera 110. That is, combined with Figure 2 As shown, at this time, the carrier beam 220, the first backlight assembly 310, the fixture 230 and the workpiece 20 will be located between the camera 110 and the second backlight assembly 320. The configuration of this interval can accommodate the second backlight assembly 320, which can reduce the probability of collision and interference when the transfer structure 200 moves to the location of the second backlight assembly 320.

[0062] Please also read Figures 2 to 4 In one embodiment, when the carrying beam 220 switches from the first detection position to the second detection position, the bracket 210 can also be synchronously driven to move laterally by a certain distance, so that the workpiece 20 can be more accurately located between the camera 110 and the second backlight assembly 320. Of course, in another embodiment, the second backlight assembly 320 can be directly configured to have a sufficiently large size, and in this case, the transfer structure 200 does not need to be moved.

[0063] See also Figure 5 In one embodiment, the driving platform 400 includes a driving component 410 and a panel 420, and the panel 420 covers the driving component 410. Part of the structure of the bracket 210 extends between the driving component 410 and the panel 420, and is connected to the driving component 410. The second backlight assembly 320 is fixedly arranged on the side of the panel 420 facing the camera 110. The driving component 410 can be configured with a gear drive, a belt drive, a chain drive, a pneumatic drive or a hydraulic drive, which can be selected according to actual needs and is not limited in this application. It can be understood that no matter which motion drive mode is used, it is expected that the driving component 410 will have a part of moving components. Therefore, the driving platform 400 configured in this application also includes a panel 420 covering the driving component 410, and the panel 420 can provide an installation base for the second backlight assembly 320, so that the second backlight assembly 320 can be stably installed on the driving platform 400.

[0064] like Figure 7As shown, in one embodiment, the second backlight assembly 320 can also be disposed at a position of the bracket 210 that is relatively far from the camera 110 relative to the carrier beam 220 and faces the side where the camera 110 is located. Thus, when the carrier beam 220 rotates to the second detection position, the fixture 230 and the workpiece 20 can be suspended between the second backlight assembly 320 and the camera 110.

[0065] Furthermore, since the second backlight assembly 320 disposed on the bracket 210 can be synchronously moved to the measuring area 401 with the transfer structure 200, that is, the second backlight assembly 320 can be in the measuring area 401 at the same time as the transfer structure 200 to provide lighting. In other words, for the second backlight assembly 320 provided in each embodiment, when it is fixed in the measuring area 401, it is obvious that it always remains in the measuring area 401. When the second backlight assembly 320 is fixed in the bracket 210, the second backlight assembly 320 can be moved to the measuring area 401 together with the transfer structure 200. Therefore, the second backlight assembly 320 is located in the measuring area 401 at least when the transfer structure 200 is in the measuring area 401.

[0066] See also Figure 6 and Figure 7 Further, the bracket 210 includes a column 211 and a connecting plate 212, the two columns 211 are arranged at an interval, the connecting plate 212 is connected between the two columns 211, and the connecting plate 212 can be used to connect with the driving platform 400. The two ends of the load beam 220 are rotatably connected to the two columns 211 respectively. Moreover, relative to the connecting plate 212, the load beam 220 is closer to the side where the camera 110 is located. The second backlight assembly 320 can be arranged on the bracket 210 between the load beam 220 and the connecting plate 212, so as to provide backlight for the measurement of the workpiece when the overall movement of the transfer structure 200 is performed.

[0067] like Figure 7 Further, the second backlight assembly 320 may be disposed on the side of the connecting plate 212 facing the beam 220, that is, the side of the connecting plate 212 facing the camera 110. Alternatively, the second backlight assembly 320 may be connected to the region of the column 211 between the beam 220 and the connecting plate 212, so that the second backlight assembly 320 is further away from the camera 110 relative to the beam 220.

[0068] It should be noted that when the second backlight assembly 320 is arranged on the connecting plate 212, it does not affect the transmission connection between the connecting plate 212 and the driving platform 400. For example, the side of the connecting plate 212 facing away from the camera 110 can be arranged to be transmission-connected with the driving platform 400. Alternatively, taking the driving platform 400 being driven by a screw nut as an example, the connecting plate 212 can be provided with a threaded transmission hole (not shown in the figure, the same below), and the screw of the driving platform 400 is provided with the threaded transmission hole and cooperates with the threaded transmission in the threaded transmission hole to drive the transfer structure 200 to move. Since the components included in the driving platform 400 are located on the side facing away from the camera 110 relative to the second backlight assembly 320, they will not block the illumination light of the second backlight assembly 320.

[0069] In one embodiment, when the second backlight assembly 320 is disposed on the bracket 210, the second backlight assembly 320 may be configured to have a sufficiently large illumination size, so that when the carrier beam 220 rotates to the second detection position, the orthographic projection of the workpiece 20 along the optical axis L of the camera 110 can be located on the second backlight assembly 320. In other words, the second backlight assembly 320 may be configured to have a sufficient size, so that when the carrier beam 220 rotates to the second detection position, the workpiece 20 can be located between the second backlight assembly 320 and the camera 110. For example, the second backlight assembly 320 may be configured to extend laterally outward to outside the space sandwiched by the carrier beam 220 and the bracket 210.

[0070] In one embodiment, the second backlight assembly 320 may also be configured as a plate. Furthermore, the second backlight assembly 320 and the first backlight assembly 310 may be arranged in parallel. The plate-shaped first backlight assembly 310 and the second backlight assembly 320 facilitate providing a range lighting effect to cover the area where the fixture 230 and the workpiece 20 picked up by the fixture 230 are located.

[0071] See also Figure 5 In one embodiment, a plurality of fixtures 230 are arranged at intervals along the reference direction K. The first backlight assembly 310 and / or the second backlight assembly 320 are arranged in a long strip shape along the reference direction K so that the provided illumination light can cover the area where the fixtures 230 are located.

[0072] See also Figure 8 In another embodiment, the first backlight assembly 310 and / or the second backlight assembly 320 includes a plurality of lighting units 301 arranged at intervals along the reference direction K, and the plurality of lighting units 301 correspond to the plurality of jigs 230 to provide lighting for the workpieces 20 picked up by the corresponding jigs 230. The number of lighting units 301 may be the same as the number of jigs 230, and in this case, the lighting units 301 can provide lighting for the jigs 230 in a one-to-one correspondence.

[0073] See also Figure 8, the lighting unit 301 and the fixture 230 are not limited to a one-to-one correspondence. In combination with the above, the output shaft of the driving member 240 passes through the through hole 311 of the first backlight assembly 310 and is connected to the fixture 230. At this time, the through hole 311 can be formed by the two adjacent lighting units 301. In other words, one lighting unit 301 can correspond to the half area of ​​the two adjacent workpieces 20 close to each other. That is, the lighting unit 301 located between the two fixtures 230 is used to correspond to the right half of the workpiece 20 located on the left and the left half of the workpiece 20 located on the right, providing backlight illumination for them. Of course, the lighting unit 301 can also have other corresponding modes with the fixture 230, which will not be repeated here one by one, and can be designed according to actual needs. It can be understood that when the second backlight assembly 320 includes the above-mentioned lighting unit 301, and when the first backlight assembly 310 and the second backlight assembly 320 both include the above-mentioned lighting unit 301, it is the same as the above, so it will not be repeated.

[0074] It should be emphasized that, although the first backlight assembly 310 and the second backlight assembly 320 are used as an example to illustrate the lighting effect in the measuring device 10 in each embodiment of the present application, the measuring device 10 provided in each embodiment of the present application is not limited to providing the lighting effect only through the first backlight assembly 310 and the second backlight assembly 320. Figure 2 In one embodiment, the measuring module 100 further includes a light source 120 . The light source 120 and the camera 110 are both disposed on the frame 500 . The light source 120 provides lighting for the camera 110 to improve the shooting clarity of the camera 110 .

[0075] In one embodiment, the camera 110 and the light source 120 are recorded as a measuring component, and the measuring module 100 may include multiple measuring components. For example, the number of measuring components is the same as the number of fixtures 230 of the transfer structure 200, so as to measure the workpieces 20 picked up by each fixture 230 one by one. The transfer structure 200 and the measuring module 100 corresponding to the workpiece 20 picked up by the transfer structure 200 are recorded as the same measurement group. The measuring device 10 may include multiple measurement groups, that is, the measuring device 10 includes multiple transfer structures 200 and multiple measurement modules 100. For example Figure 2 As shown, the measuring device 10 includes two measuring groups, and the measuring modules 100 included in the two measuring groups can be arranged on opposite sides of the frame 500. It should be noted that, in another embodiment, multiple transfer structures 200 can also share a measuring module 100, and the multiple transfer structures 200 can be driven by the driving platform 400 to alternately move to the measuring area 401 of the measuring module 100.

[0076] An embodiment of the present application further provides a production device, which includes the measuring device 10 described in each embodiment. Since the production device includes all the features of the measuring device 10, the production device also includes all the technical effects of the measuring device 10 described above.

[0077] Furthermore, the production equipment may also include a loading device and an unloading device. The loading device is used to transport the workpiece 20 to the measuring device 10, and the unloading device is used to receive the workpiece 20 that has been measured by the measuring device 10 and classify the workpiece 20 according to the measurement results.

[0078] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0079] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the patent application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent application shall be subject to the attached claims.

Claims

1. A measuring device, characterized in that: The measuring device comprises: A measurement module, including a camera; A driving platform having a measuring area corresponding to the detection range of the camera; A transfer structure, movably disposed on the driving platform, the transfer structure can move to the measuring area, the transfer structure comprises a bracket, a carrier beam mounted on the bracket and a fixture disposed on the carrier beam, the fixture is used to pick up the workpiece; an illumination assembly, comprising a first backlight assembly and a second backlight assembly, wherein the first backlight assembly is disposed on the carrier beam and faces the fixture, and the second backlight assembly is located in the measurement area at least when the transfer structure is in the measurement area, and is along the optical axis of the camera, and the second backlight assembly is located at a position relatively to the carrier beam and away from the camera; The carrier beam is rotatably connected to the bracket, and the carrier beam can be rotated to a position where the first backlight assembly faces the camera, and the carrier beam can be rotated to a position where the fixture and the workpiece are suspended between the camera and the second backlight assembly.

2. The measuring device according to claim 1, characterized in that: The first backlight assembly and the fixture are arranged on the same side of the carrier beam.

3. The measuring device according to claim 2, characterized in that: The orthographic projection of the jig on the first backlight assembly is located within the orthographic projection of the workpiece picked up by the jig on the first backlight assembly.

4. The measuring device according to claim 1, characterized in that: The fixture is configured as a light-transmitting member or a partially light-transmitting member, and the illumination light provided by the first backlight assembly can pass through the fixture to provide illumination to the workpiece.

5. The measuring device according to claim 1, characterized in that: The plurality of jigs are arranged at intervals along a reference direction, and the first backlight assembly and / or the second backlight assembly are arranged in a strip shape extending along the reference direction, so that the provided illumination light can cover the area where the jigs are located.

6. The measuring device according to claim 1, characterized in that: The plurality of jigs are arranged at intervals along a reference direction, the first backlight assembly and / or the second backlight assembly comprises a plurality of lighting parts arranged at intervals along the reference direction, and the plurality of lighting parts correspond to the plurality of jigs to provide lighting.

7. The measuring device according to claim 1, characterized in that: The transfer structure also includes a driving member. The carrier beam is hollow and rotates relative to the bracket around a first axis. The first backlight assembly is provided with a plurality of through holes. A plurality of driving members are arranged in the carrier beam and pass through the through holes to partially extend out of the carrier beam. The plurality of driving members are respectively connected to a plurality of fixtures to drive the plurality of fixtures to rotate synchronously and independently around a second axis. The second axis intersects with the first axis.

8. The measuring device according to claim 7, characterized in that: The first axis is perpendicular to the second axis; and / or The first backlight assembly is configured in a plate shape, and the second axis is perpendicular to the first backlight assembly.

9. The measuring device according to claim 1, characterized in that: The driving platform is connected to the bracket to drive the transfer structure to move to the measuring area. The second backlight assembly is arranged in the measuring area and faces the camera.

10. The measuring device according to claim 9, characterized in that: The driving platform includes a driving component and a panel covering the driving component. Part of the structure of the bracket extends between the driving component and the panel and is connected to the driving component. The second backlight assembly is fixed on a side of the panel facing the camera.

11. The measuring device according to claim 1, characterized in that: The second backlight assembly is arranged at a position of the bracket which is relatively far from the camera and faces the side where the camera is located.

12. The measuring device according to claim 11, characterized in that: The bracket includes a column and a connecting plate, the two columns are spaced apart, the connecting plate is connected between the two columns, the connecting plate is connected to the driving platform, the two ends of the beam are respectively rotatably connected to the two columns, and relative to the connecting plate, the beam is closer to the side where the camera is located; The second backlight assembly is arranged on the bracket in a region between the carrier beam and the connecting plate, and extends laterally outward to the outside of a space sandwiched by the carrier beam and the connecting plate.

13. The measuring device according to claim 1, characterized in that: It also includes a base and a frame mounted on the base, the driving platform and the lighting assembly are both arranged on the base, the measuring module also includes a light source, the light source provides lighting for the camera to shoot, and the camera and the light source are both arranged on the frame.

14. A production equipment, characterized in that: The production equipment comprises the measuring device according to any one of claims 1 to 13.

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