Stable chip test fixture and test equipment

Abstract

The invention relates to the technical field of chip testing jigs, in particular to a stable chip testing jig and testing device.The stable chip testing jig comprises multiple sets of jig bodies, a containing cavity is formed in the side face of each jig body, a waste box is movably installed in each containing cavity, and a testing set is arranged on the upper side of each jig body; a detection group is arranged on the upper side of the jig main body corresponding to the accommodating cavity, and an auxiliary group is arranged on the other side of the jig main body corresponding to the test group; the testing group comprises a testing cavity and a penetrating groove, a connecting core body and a testing plate are movably arranged in the testing cavity and the penetrating groove, and a supporting plate and a limiting rod are arranged on the side face of the testing plate; the detection group comprises a connecting cavity and a matching cavity. By arranging the test fixture and the test group and the detection group in the test fixture, mechanical triggering, pressing and limiting of the chip can be realized, stability and effectiveness of the chip during testing are ensured, an electric control structure is omitted due to a mechanical structure, and the cost is effectively controlled.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing jigs, and in particular to a stable chip testing jig and testing equipment. Background Art

[0002] Chip testing is a very important part of the chip manufacturing process. The test fixture is a device used to test the chip. The pressure plate on the test fixture is used to fix the chip so as to fix the test base on the table. During the testing process, when the test of a batch of products is completed, the base of the test fixture needs to be replaced and re-fixed before continuing to test the next batch of products; In order to realize automated testing, multiple groups of test fixtures are set up to transfer and test chips with three-axis transfer mechanical devices and suction devices. After the existing fixtures are installed in the test equipment, the chips are generally pressed and fixed by pneumatic devices, which causes high costs. In addition, after the existing test fixture detects the chip, the unqualified chip is sucked by the suction device as needed and placed in the waste area, affecting work efficiency. For this reason, we propose a stable chip test fixture and test equipment. Summary of the invention

[0003] In order to overcome the technical problems existing in the above-mentioned prior art, the present invention provides a stable chip testing fixture and testing equipment.

[0004] In order to solve the above technical problems, the present invention provides the following technical solutions: a stable chip test fixture: comprising a plurality of fixture bodies, a storage cavity is provided on the side of the fixture body, a waste box is movably installed inside the storage cavity, a test group is provided on the upper side of the fixture body, a detection group is provided on the upper side of the fixture body corresponding to the storage cavity position, and an auxiliary group is provided on the other side of the fixture body corresponding to the test group position; The test group includes a test cavity and a through slot, wherein a connecting core and a test plate are movably arranged inside the test cavity and the through slot, and a support plate and a limit rod are arranged on the sides of the test plate; The detection group includes a connecting cavity and a matching cavity, wherein a trigger rod and a support frame are movably arranged inside the connecting cavity and the matching cavity, and a limit block is arranged on the side of the support frame; The auxiliary group comprises a connecting groove, and a first push plate and a second push plate are movably arranged inside the connecting groove.

[0005] Furthermore, the test group includes a test cavity opened on the upper side of the fixture body, a through groove opened in the center of the bottom wall of the test cavity, a connecting core body movably installed inside the through groove, a test plate fixedly installed on the side of the connecting core body and the test plate movably arranged inside the test cavity, movable cavities are mirrored on the inner walls on both sides of the test cavity, a movable plate is movably installed inside the movable cavity, a support plate is movably installed at the recess of the movable plate and the support plate extends to the internal position of the test cavity, an elastic plate is fixedly connected to the side of the first spring and the inner side of the elastic plate, and a first spring is fixedly connected to the bottom side of the movable plate and the bottom wall of the movable cavity.

[0006] Furthermore, the test group also includes matching grooves opened on the inner walls of both sides of the test cavity, the limiting rod is movably installed inside the matching groove, and an elastic tube is fixedly connected between the side surface of the limiting rod and the wall surface of the matching groove.

[0007] Furthermore, the detection group includes a connecting cavity opened inside the fixture body, and the connecting cavity passes through the inside of the matching groove and is arranged on the upper side of the movable cavity. The matching cavity is opened between the inner walls of the connecting cavity and passes through the fixture body to be connected with the test cavity and the storage cavity. The trigger rod is movably installed inside the connecting cavity, and a second spring is fixedly connected between the side of the trigger rod and the inner wall of the connecting cavity.

[0008] Furthermore, the detection group also includes a support frame fixedly connected between the trigger rods, a fixed block is fixedly installed on the side of the support frame, a limit block is movably arranged on the lower side of the fixed block, an elastic block is fixedly connected between the limit block and the side of the fixed block, and a visual tester is fixedly installed on the upper side of the support frame.

[0009] Furthermore, the auxiliary group includes a connecting groove opened on the inner wall of the test cavity, the first push plate is movably installed inside the connecting groove, the second push plate is arranged on the side of the first push plate and the second push plate is rotatably connected to the first push plate through a circular shaft, and a third spring is fixedly connected to the side between the second push plate and the fixture body.

[0010] A stable chip testing device, comprising the stable chip testing fixture; It includes a test equipment body, which is arranged on the lower side of the fixture body. The test module inside the test equipment body can be connected with the connecting core through an interface. Positioning blocks are symmetrically and equidistantly fixed on the upper side of the workbench of the test equipment body. A material tray is arranged on the upper side of the test equipment body. A three-axis transfer device is arranged on the upper side of the test equipment body, and a material transfer group is arranged on the side of the three-axis transfer device.

[0011] Furthermore, the material transfer group includes a mounting frame fixedly installed on the side of the vertical electric slide slider of the three-axis transfer device, a suction module is vertically fixedly installed on the lower side of the mounting frame, a first electric push rod is arranged on the side of the mounting frame, a second electric push rod is fixedly installed on the side of the vertical electric slide slider of the three-axis transfer device, and a matching block is fixedly installed on the output end of the second electric push rod.

[0012] Compared with the prior art, the present invention can achieve the following beneficial effects: 1. The present invention can realize mechanical triggering and pressing limit of the chip by setting a test fixture and the test group and detection group therein, thereby ensuring stability and effectiveness during chip testing, and the mechanical structure omits the electrical control structure, effectively controlling the cost.

[0013] 2. The present invention provides a material transfer group and a test fixture and an auxiliary group therein, which can trigger the unqualified chips to be pushed out of the test chamber and collected in a waste box after the chip is tested, so that the suction module does not need to suck and place the unqualified chips. When the chip is unqualified, the suction module can directly suck the material, and then the matching block triggers the second push plate, and then the suction module can directly place the chip for testing, which effectively improves the efficiency of testing the chip.

[0014] 3. The present invention sets up a test device and a material transfer group therein. After the chip is sucked in by the suction module, the second electric push rod can push the matching block to perform a slight deviation correction operation on the chip, thereby ensuring the subsequent stable contact and connection between the chip and the test board, thereby improving the stability of chip automation.

[0015] 4. The present invention provides a support plate and its peripheral components, and the support plate can provide elastic support for the chip, so that after the chip is tested, it can be separated from the test plate by elastic force, which is convenient for chip removal and subsequent waste collection operations.

[0016] 5. The present invention provides components such as a test board and a connecting core body, and the test board can be directly pulled out of the test cavity by a tool, so that the test board can be directly replaced. During installation, the test board is directly inserted into the test cavity, and the connecting core body is connected to the interface of the test equipment main body workbench to achieve circuit connectivity between the test board and the test equipment main body, which is convenient for rapid installation and disassembly of different chips.

[0017] 6. The present invention provides a first push plate and a second push plate and other components. When the first push plate and the second push plate are pushed inside the connecting groove, the first push plate can push the waste chips to collect them. When the second push plate is manually pulled out of the connecting groove, it bends downward to squeeze the bottom of the test equipment body to assist the jig body in completing the disassembly, thereby expanding the functionality of the jig.

[0018] 7. The present invention modularizes the test fixture, and all internal components are mechanical structures, which saves costs and allows the test fixture to be set up and used according to needs, making the test use flexible and changeable. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 It is a schematic diagram of the overall structure of the present invention; Figure 2 It is a partial structural schematic diagram of the fixture of the present invention; Figure 3 It is a schematic diagram of a partial cross-sectional structure of a test group of the present invention; Figure 4 It is a schematic diagram of the cross-sectional structure of the fixture body of the present invention; Figure 5 It is a schematic diagram of the partial structure of the test group of the present invention; Figure 6 This is a schematic diagram of the partial explosion structure of the auxiliary group of the present invention; Figure 7 It is a partial structural schematic diagram of the three-axis transfer device of the present invention; Figure 8 It is a schematic diagram of the partial explosion structure of the three-axis transfer device of the present invention.

[0020] Among them: 1. fixture body; 11. storage cavity; 12. waste box; 2. test group; 21. test cavity; 22. through slot; 23. connecting core; 24. test plate; 25. movable cavity; 251. movable plate; 252. support plate; 253. elastic plate; 254. first spring; 26. matching groove; 261. limit rod; 262. elastic tube; 3. detection group; 31. connecting cavity; 311. trigger rod; 32. matching cavity; 33. second Spring; 34, support frame; 341, fixed block; 342, limit block; 343, elastic block; 35, visual tester; 4, auxiliary group; 41, connecting groove; 42, first push plate; 43, second push plate; 44, third spring; 5, test equipment body; 51, positioning block; 6, material tray; 7, three-axis transfer device; 701, mounting frame; 702, suction module; 703, first electric push rod; 704, second electric push rod; 705, matching block. DETAILED DESCRIPTION

[0021] In order to make the technical means, creative features, objectives and effects achieved by the present invention easy to understand, the present invention is further described below in conjunction with specific embodiments, but the following embodiments are only preferred embodiments of the present invention, not all. Based on the embodiments in the implementation mode, other embodiments obtained by those skilled in the art without creative work all belong to the protection scope of the present invention. The experimental methods in the following embodiments, unless otherwise specified, are conventional methods, and the materials, reagents, etc. used in the following embodiments, unless otherwise specified, can all be obtained from commercial channels.

[0022] Example: Figures 1 to 6 As shown, a stable chip test fixture and test equipment, including multiple sets of fixture bodies 1, the fixture body 1 is a rectangular body with circular grooves equidistantly opened at four corners, a storage cavity 11 is opened on the side of the fixture body 1, the storage cavity 11 is a rectangular cavity, a waste box 12 is movably installed inside the storage cavity 11, and the waste box 12 is a rectangular box with a hollow upper side, a test group 2 for testing chips is arranged on the upper side of the fixture body 1, a detection group 3 for assisting stable testing is arranged on the upper side of the fixture body 1 corresponding to the storage cavity 11, and an auxiliary group 4 for assisting in disassembling the fixture body 1 and removing bad chips is arranged on the other side of the fixture body 1 corresponding to the test group 2; The test group 2 can be used to test the chip stably and facilitate the subsequent chip sorting and material selection; The test group 2 includes a test cavity 21 opened on the upper side of the fixture body 1. The test cavity 21 is a rectangular cavity. A through groove 22 penetrating the fixture body 1 is opened at the center of the bottom wall of the test cavity 21. The through groove 22 is a cylindrical cavity. A connecting core 23 is movably installed inside the through groove 22. The connecting core 23 is a cylinder with a signal interface on the bottom side. The connecting core 23 can be electrically connected to subsequent components. When the chip is tested, the circuit is connected. The side of the connecting core 23 is fixedly installed. There is a test board 24 and the test board 24 is movably arranged inside the test cavity 21. The test board 24 is electrically connected to the connecting core 23 through wires. The test board 24 is an integrated circuit board with a test electrical hole. An active cavity 25 is mirrored on the inner wall of both sides of the test cavity 21. The active cavity 25 is an "L"-shaped cavity. A movable plate 251 is movably installed inside the active cavity 25. The movable plate 251 is a "C"-shaped plate. A support plate 252 is movably installed at the notch of the movable plate 251. The support plate 252 is 52 extends to the internal position of the test cavity 21, the support plate 252 is a trapezoidal plate, and the elastic plate 253 is fixedly connected to the side of the first spring 254 and the inner side of the elastic plate 253. The elastic plate 253 is a plate with a continuous "W"-shaped cross-section. The first spring 254 is fixedly connected to the bottom side of the movable plate 251 and the bottom wall of the movable cavity 25 at equal distances; specifically, when the test board 24 is taken out of the test cavity 21 by a tool, the connecting core 23 slides out synchronously, and the connecting core 23 disconnects the circuit connection of the test board 24. The test board 24 can be replaced according to the chip. When the test board 24 is replaced, the test board 24 squeezes the support plate 252 to push the elastic plate 253 to deform and slide into the movable plate 251 to avoid interference. When the chip is tested synchronously, the support plate 252 supports the chip. When the chip is pressed and contacted with the test board 24, the movable plate 251 is driven to push the first spring 254 to deform. After the test, the first spring 254 can make the support plate 252 drive the chip to separate from the test board 24; The inner walls of both sides of the test cavity 21 are symmetrically inclined and provided with matching grooves 26 corresponding to the positions of the active cavity 25. The matching grooves 26 are convex cylindrical grooves. A limiting rod 261 is movably installed inside the matching groove 26 and the limiting rod 261 extends out of the matching groove 26. The limiting rod 261 is a "T"-shaped round rod made of rubber material with a spherical side. An elastic tube 262 is fixedly connected between the side of the limiting rod 261 and the wall of the matching groove 26 and the elastic tube 262 is movably sleeved on the side of the limiting rod 261. The elastic tube 262 is a cylinder with a continuous "W"-shaped cross section. Specifically, before and after the test, the limiting rod 261 is not pushed. Under the elastic force of the elastic tube 262, the limiting rod 261 slides into the matching groove 26. During the test, the chip contacts the test board 24, and the limiting rod 261 is squeezed by subsequent components to slide out of the matching groove 26 to perform a press-limit operation on the chip. The detection group 3 can be used to perform visual testing on the chip to determine whether the chip is in place, and can trigger other components; The detection group 3 includes a connecting cavity 31 symmetrically opened inside the fixture body 1, and the connecting cavity 31 passes through the matching groove 26 and is arranged on the upper side of the movable cavity 25. The connecting cavity 31 is a rectangular cavity, and a matching cavity 32 is opened between the inner walls of the connecting cavity 31, and the matching cavity 32 penetrates the fixture body 1 and is connected with the test cavity 21 and the storage cavity 11. The matching cavity 32 is an "L"-shaped cavity. A trigger rod 311 is movably installed inside the connecting cavity 31, and the trigger rod 311 is correspondingly fitted to the side position of the limit rod 261. The trigger rod 311 is a rectangular rod with trapezoidal grooves equidistantly opened on the side. The trigger rod 311 pushes the limit rod 261 to slide out of the matching groove 26 by default. When the trigger rod 311 is pushed, the limiting rod 261 will gradually slide into the trapezoidal groove on the side of the trigger rod 311 under the elastic force of the elastic tube 262. A second spring 33 is fixedly connected between the side of the trigger rod 311 and the inner wall of the connecting cavity 31. The elastic force of the second spring 33 is much greater than the sum of the elastic tube 262 and the first spring 254. Specifically, the trigger rod 311 is pushed by the subsequent components to squeeze the second spring 33 to deform. At this time, the trigger rod 311 loses the push on the limiting rod 261 to make it avoid the chip. On the contrary, the trigger rod 311 is not pushed and resets under the elastic force of the second spring 33, pushing the limiting rod 261 to press the chip. A support frame 34 is fixedly connected between the trigger rods 311 and the support frame 34 is movably arranged inside the matching cavity 32 and extends out. The support frame 34 is a rectangular frame. A fixed block 341 is fixedly installed on the side of the support frame 34 close to the test board 24. The fixed block 341 is a rectangular block. A limit block 342 is movably arranged on the lower side of the fixed block 341. The limit block 342 is a trapezoidal block. An elastic block 343 is mirror-fixedly connected between the limit block 342 and the side of the fixed block 341. The elastic block 343 is an arc block made of elastic material. A visual tester 35 is fixedly installed on the upper side. The visual tester 35 is an existing technology and will not be described in detail here. Specifically, the support frame 34 can be pushed by subsequent components to drive the connecting cavity 31 to move synchronously. Before the test, the support frame 34 drives the visual tester 35 to move accordingly to avoid the chip. During the test, the support frame 34 is reset and moved. At this time, the limit block 342 is squeezed on the side of the chip. The limit block 342 pushes the elastic block 343 to deform to further limit the chip. The synchronous visual tester 35 can perform a visual test on the chip to observe whether the chip is in place. The auxiliary group 4 can be used to sort the tested chips, reduce the repeated suction of waste chips, and manually assist the disassembly operation of the fixture body 1; The auxiliary group 4 includes a connecting groove 41 which is opened on the inner wall of the test cavity 21 away from the matching cavity 32 and passes through the fixture body 1. The connecting groove 41 is a rectangular groove. A first push plate 42 is movably installed inside the connecting groove 41. The first push plate 42 is a convex-shaped plate. A second push plate 43 is arranged on the side of the first push plate 42 and the second push plate 43 is rotatably connected to the first push plate 42 through a circular shaft. The second push plate 43 is movably arranged inside the connecting groove 41 and extends out of its internal position. The second push plate 43 is an "L"-shaped plate and one side is concave. A third spring 44 is symmetrically fixedly connected to the side of the second push plate 43 and the fixture body 1; specifically, during sorting, after the chip test is completed, the support plate 252 lifts and detaches from the test plate 24, and the second push plate 43 is pushed to make the first push plate 42 slide inside the connection groove 41, pushing the chip to the inside of the matching cavity 32 and dropping it into the waste box 12 for collection. During disassembly, the second push plate 43 is manually pulled out of the connection groove 41, and pressed downward to rotate the second push plate 43, at which time the second push plate 43 squeezes the bottom component to assist the fixture body 1 in completing the disassembly; like Figure 1 , Figure 7 and Figure 8 As shown, a test equipment body 5 is arranged on the lower side of the fixture body 1. The test equipment body 5 is a rectangular control cabinet, and an electric control module, a test module and a power supply group are integrated inside. The test module inside the test equipment body 5 can be connected with the connecting core 23 through an interface. Positioning blocks 51 are symmetrically and equidistantly fixedly installed on the upper side of the workbench of the test equipment body 5, and the fixture body 1 is connected to the side position of the positioning block 51. The positioning block 51 is a cylindrical block. A material tray 6 is equidistantly arranged on the upper side of the test equipment body 5. The material tray 6 is a rectangular tray with grooves on the side. A three-axis transfer device 7 is arranged on the upper side of the test equipment body 5, and the three-axis transfer device 7 completely covers the fixture body 1. The three-axis transfer device 7 is a three-way construction of multiple groups of electric slides, which can realize three-axis transfer operation, and a material transfer group is arranged on the side of the three-axis transfer device 7. The chip picking operation can be performed by setting the material transfer group, and can be used in conjunction with other components of the trigger fixture; The material transfer group includes a mounting frame 701 fixedly mounted on the side of the vertical electric slide slider of the three-axis transfer device 7, the mounting frame 701 is a rectangular frame, a suction module 702 is vertically fixedly mounted on the lower side of the mounting frame 701, and the suction module 702 is connected to the air supply through an air pipe, the suction module 702 is composed of an air pipe and an air nozzle, and can perform pneumatic suction and material removal operations on the chip, a first electric push rod 703 is arranged on the side of the mounting frame 701 close to the fixture body 1, and the first electric push rod 703 is fixedly mounted in the internal position of the mounting frame 701, a second electric push rod 704 is fixedly mounted on the side of the vertical electric slide slider of the three-axis transfer device 7, and the second electric push rod 704 is arranged on the lower side of the mounting frame 701, and the second electric push rod 704 is arranged on the lower side of the mounting frame 701. The output end of 04 is fixedly installed with a matching block 705, and the matching block 705 is a "C"-shaped plastic block with a cone on the inner side; specifically, the three-axis transfer device 7 drives the mounting frame 701 and the second electric push rod 704 to move freely in three axes, and the suction module 702 can attract the chip. Before the test, the second electric push rod 704 pushes the matching block 705 to slightly correct the position of the chip attracted by the suction module 702, and the first electric push rod 703 can push the support frame 34 to trigger the subsequent operation of the fixture. After the test, the first electric push rod 703 still pushes the support frame 34, and then the second electric push rod 704 pushes the matching block 705 to squeeze the second push plate 43 to slide, triggering the subsequent operation of the fixture.

[0023] Working principle: Before the test: First, place the material tray 6 filled with materials on the upper side of the test equipment body 5, and control the three-axis transfer device 7 through the test equipment body 5 to drive the material transfer group to perform material picking operation; In the second step, the suction module 702 sucks the chip inside the corresponding material tray 6, and then the second electric push rod 704 pushes the matching block 705 to slightly correct the position of the chip; In the third step, the three-axis transfer device 7 drives the mounting frame 701 to move to the upper side of the fixture body 1. At this time, the first electric push rod 703 pushes the support frame 34 to move inside the matching cavity 32. At this time, the fixing block 341 slides into the matching cavity 32, and the trigger rod 311 moves synchronously so that the limiting rod 261 slides down to the trapezoidal groove position of the trigger rod 311 under the elastic force of the elastic tube 262. At this time, the limiting rod 261 slides into the matching groove 26 and the connecting cavity 31 to avoid interference with the chip; During the test: In the first step, the three-axis transfer device 7 drives the suction module 702 to place the sucked chip downward inside the test chamber 21, and the chip contacts the side of the support plate 252. The chip is pressed to contact and engage with the test plate 24, and the movable plate 251 presses the first spring 254 downward to store energy, and the suction module 702 loses the suction of the chip, completing the material placement; In the second step, the first electric push rod 703 is retracted and reset, and the support frame 34 loses the push-pull function. The trigger rod 311 and the support frame 34 are reset through the elastic force of the second spring 33. The trigger rod 311 squeezes the limit rod 261 to make it slide out of the matching groove 26 to squeeze and limit the chip at multiple points. The synchronous limit block 342 also squeezes and contacts the side of the chip to limit it. At this time, the three-axis transfer device 7 can drive the suction module 702 to take other chips. The third step is to test the chip position through the visual tester 35 to determine whether it is in place. If it is not in place, the suction module 702 returns to pick up the material, and the position is corrected again through the matching block 705. If it is in place, the test equipment body 5 is connected to the test board 24 through the connecting core 23 to test the magnetic variables and electrical variables of the chip to determine whether the chip is qualified. After the test: In the first step, after the chip test is completed, the three-axis transfer device 7 drives the mounting frame 701 to move to the upper side of the corresponding fixture body 1, and the first electric push rod 703 pushes the support frame 34 to move, and the subsequent operation is determined according to the chip test results; In the second step, when the chip is tested to be qualified, the support frame 34 is pushed, and the limit block 342 and the limit rod 261 do not interfere with the chip. The support plate 252 drives the chip to move upward under the elastic force of the first spring 254, so that it is separated from the test plate 24. The qualified chip is sucked by the suction module 702 and placed back into the material tray 6, and then the material removal test is continued; In the third step, when the chip is unqualified, the support frame 34 is pushed as above. At this time, the limit block 342 and the limit rod 261 do not interfere with the chip, and the support plate 252 drives the chip to move upward to separate it from the test plate 24. Different from this, at this time, the suction module 702 sucks a group of chips to the upper side of the fixture body 1, and the second electric push rod 704 pushes the matching block 705 to contact the second push plate 43. The second push plate 43 drives the first push plate 42 to slide inside the connecting groove 41 to push the chip into the matching cavity 32 and drop it into the waste box 12 for collection. Then the suction module 702 can place the test material and continue the subsequent operation; In the fourth step, when the entire fixture body 1 and the internal components need to be replaced, the test plate 24 and the connecting core 23 can be directly pulled out according to the basis. When the test plate 24 is pulled out, the support plate 252 is squeezed and slides into the movable plate 251 to avoid it. Conversely, during installation, the support plate 252 can be manually pressed to avoid the installation and replacement of the test plate 24. In addition, the second push plate 43 is manually pulled out of the connecting groove 41, and the second push plate 43 can be pressed downward to squeeze the bottom test equipment body 5 to assist the fixture body 1 in completing the disassembly.

[0024] The embodiments of the present invention are described in detail above with reference to the accompanying drawings, but the present invention is not limited thereto, and various changes can be made within the knowledge scope of technicians in the relevant technical field without departing from the purpose of the present invention.

Claims

1. A stable chip test fixture, comprising a plurality of sets of fixture bodies (1), characterized in that: A storage cavity (11) is provided on the side of the jig body (1), a waste material box (12) is movably installed inside the storage cavity (11), a test group (2) is provided on the upper side of the jig body (1), a detection group (3) is provided on the upper side of the jig body (1) at a position corresponding to the storage cavity (11), and an auxiliary group (4) is provided on the other side of the jig body (1) at a position corresponding to the test group (2); The test group (2) comprises a test cavity (21) and a through slot (22), wherein a connecting core (23) and a test plate (24) are movably provided inside the test cavity (21) and the through slot (22), and a support plate (252) and a limit rod (261) are respectively provided on the side surfaces of the test plate (24); The detection group (3) comprises a connecting cavity (31) and a matching cavity (32), wherein a trigger rod (311) and a support frame (34) are movably provided inside the connecting cavity (31) and the matching cavity (32), and a limit block (342) is provided on the side of the support frame (34); The auxiliary group (4) comprises a connecting groove (41), and a first push plate (42) and a second push plate (43) are movably arranged inside the connecting groove (41).

2. A stable chip testing fixture according to claim 1, characterized in that: The test group (2) comprises a test cavity (21) provided on the upper side of the fixture body (1); a through groove (22) provided at the center of the bottom wall of the test cavity (21); a connecting core (23) movably mounted inside the through groove (22); a test plate (24) fixedly mounted on the side of the connecting core (23) and movably arranged inside the test cavity (21); movable cavities (25) mirror-imaged on the inner walls of both sides of the test cavity (21); a movable plate (251) movably mounted inside the movable cavity (25); a support plate (252) movably mounted at a notch of the movable plate (251) and extending to a position inside the test cavity (21); a first spring (254) having a side surface and an inner side of the elastic plate (253) fixedly connected to the elastic plate (253); and a first spring (254) having a bottom surface and a bottom wall of the movable cavity (25) fixedly connected to the first spring (254).

3. A stable chip testing fixture according to claim 2, characterized in that: The test group (2) further comprises matching grooves (26) provided on the inner walls of both sides of the test cavity (21); a limit rod (261) is movably mounted inside the matching groove (26); and an elastic tube (262) is fixedly connected between the side surface of the limit rod (261) and the wall surface of the matching groove (26).

4. A stable chip testing fixture according to claim 3, characterized in that: The detection group (3) comprises a connecting cavity (31) disposed inside the fixture body (1), the connecting cavity (31) passing through the inside of the matching groove (26) and arranged at an upper side of the movable cavity (25), a matching cavity (32) disposed between inner walls of the connecting cavity (31) and passing through the fixture body (1) to communicate with the test cavity (21) and the storage cavity (11), a trigger rod (311) being movably mounted inside the connecting cavity (31), and a second spring (33) being fixedly connected between a side surface of the trigger rod (311) and an inner wall of the connecting cavity (31).

5. A stable chip testing fixture according to claim 4, characterized in that: The detection group (3) further comprises a support frame (34) fixedly connected between the trigger rods (311); a fixed block (341) is fixedly mounted on the side of the support frame (34); a limit block (342) is movably arranged on the lower side of the fixed block (341); an elastic block (343) is fixedly connected between the limit block (342) and the side of the fixed block (341); and a visual tester (35) is fixedly mounted on the upper side of the support frame (34).

6. A stable chip testing fixture according to claim 5, characterized in that: The auxiliary group (4) comprises a connecting groove (41) provided on the inner wall of the test cavity (21); a first push plate (42) is movably mounted inside the connecting groove (41); a second push plate (43) is arranged on a side of the first push plate (42) and the second push plate (43) is rotatably connected to the first push plate (42) via a circular shaft; and a third spring (44) is fixedly connected to the side between the second push plate (43) and the fixture body (1).

7. A stable chip testing device, characterized in that: A stable chip test fixture comprising any one of claims 1 to 6; The invention comprises a test equipment body (5), wherein the test equipment body (5) is arranged on the lower side of the fixture body (1), a test module inside the test equipment body (5) can be connected to a connecting core (23) by means of an interface, positioning blocks (51) are symmetrically and equidistantly fixedly mounted on the upper side of a workbench of the test equipment body (5), a material tray (6) is arranged on the upper side of the test equipment body (5), a three-axis transfer device (7) is arranged on the upper side of the test equipment body (5), and a material transfer group is arranged on the side of the three-axis transfer device (7).

8. The stable chip testing device according to claim 7, characterized in that: The material transfer group comprises a mounting frame (701) fixedly mounted on the side of a vertical electric slide block of a three-axis transfer device (7); a material suction module (702) is vertically fixedly mounted on the lower side of the mounting frame (701); a first electric push rod (703) is arranged on the side of the mounting frame (701); a second electric push rod (704) is fixedly mounted on the side of the vertical electric slide block of the three-axis transfer device (7); and a matching block (705) is fixedly mounted on the output end of the second electric push rod (704).

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