A chip testing device

Abstract

The present invention discloses a chip testing device, which relates to the technical field of chip testing and can achieve the limit of the chip grasping mechanism to prevent the suction head from damaging the chip. A chip testing device includes a frame, a plurality of test boards, a chip storage tray, a chip grasping mechanism, and a test fixture. The test boards are used to test the performance of the chips. The chip storage tray is arranged on the frame. The chip storage tray is used to store the chips to be detected and the detected chips. The chip grasping mechanism is arranged on the frame. The chip grasping mechanism includes a support frame, a translation frame, a sliding seat, and a grasping component. The grasping component is driven by a cylinder. When the grasping component grasps the chip and contacts the test station on the test board, the cylinder is at the maximum output stroke. By measuring the maximum stroke of the cylinder, the maximum stroke after the chip grasping mechanism grasps the chip is exactly to place the chip on the test position of the test fixture, which can prevent the unstable stroke of the cylinder from damaging the test board.

Description

Technical Field

[0001] The present invention relates to the technical field of chip testing, and particularly to a chip testing device. Background Art

[0002] Currently, there is a common problem of insufficient positioning accuracy of the grasping mechanism in chip testing devices. When using a suction device driven by a cylinder to handle chips, due to inaccurate stroke control, there is a risk of damaging the chips or the test board, significantly increasing the hidden costs of production. Summary of the Invention

[0003] An object of the present invention is to at least solve one of the technical problems existing in the prior art, and provide a chip testing device that can limit the chip grasping mechanism and prevent the suction head from damaging the chips.

[0004] A chip testing device according to an embodiment of the present invention includes a frame, a plurality of test boards, a chip storage tray, a chip grasping mechanism, and a test fixture. The plurality of test boards are arranged on the frame and are used for testing the performance of chips; the chip storage tray is arranged on the frame and is used for storing the chips to be detected and the detected chips; the chip grasping mechanism is arranged on the frame, and the chip grasping mechanism includes a support frame, a translation frame, a sliding seat, and a grasping component. The support frame is arranged on the frame and is located on both sides of the plurality of test boards. The translation frame is slidably arranged on the support frame along the X-axis, and the translation frame is located above the plurality of test boards. The sliding seat is slidably arranged on the translation frame along the Y-axis. The grasping component is arranged on the sliding seat in a liftable manner, and the grasping component is driven by a cylinder. When the grasping component grasps a chip and contacts the test station on the test board, the cylinder is at its maximum output stroke; the test fixture is arranged on the test board and is used for clamping the chip to complete the test.

[0005] At least, it has the following beneficial effects: A chip testing device includes a frame, several test boards, a chip storage tray, a chip grasping mechanism, and a test fixture. The several test boards are arranged on the frame. The test boards are used to test the performance of the chips. The chip storage tray is arranged on the frame. The chip storage tray is used to store the chips to be detected and the detected chips. The chip grasping mechanism is arranged on the frame. The chip grasping mechanism includes a support frame, a translation frame, a sliding seat, and a grasping component. The support frame is arranged on the frame and located on both sides of the several test boards. The translation frame is slidably arranged on the support frame along the X-axis. The translation frame is located above the several test boards. The sliding seat is slidably arranged on the translation frame along the Y-axis. The grasping component is arranged on the sliding seat in a liftable manner. The grasping component is driven by a cylinder. When the grasping component grasps the chip and contacts the test station on the test board, the cylinder is at the maximum output stroke. The test fixture is arranged on the test board. The test fixture is used to clamp the chip to complete the test. By measuring the maximum stroke of the cylinder and selecting a support frame with a suitable height, the maximum stroke after the chip grasping mechanism grasps the chip is exactly to place the chip on the test position of the test fixture, which can maximally avoid the situation that the unstable cylinder stroke is likely to damage the test board.

[0006] According to some embodiments of the present invention, the grasping component includes a mounting plate, a lifting cylinder, a lifting seat, a negative pressure suction head, and a fixture unlocking kit. The mounting plate is arranged on the sliding seat. The lifting cylinder is arranged on the mounting plate. The lifting seat is connected to the output end of the lifting cylinder. The lifting cylinder is used to drive the lifting seat to lift and lower. The negative pressure suction head is arranged on the lifting seat. The negative pressure suction head is used to suck the chip. The fixture unlocking kit is arranged on the lifting seat. The fixture unlocking kit rises and falls with the lifting seat. The fixture unlocking kit can be inserted into and unlock the test fixture.

[0007] According to some embodiments of the present invention, the test fixture includes a fixture bottom plate, a pressing support, a pressing plate, a torsion spring, and a protective plate. The fixture bottom plate is arranged on the test board. The middle of the fixture bottom plate has a through groove. The through groove corresponds to the test position of the test board. The chip can be placed in the through groove. The pressing support is arranged on the fixture bottom plate. There are two groups of pressing supports. The two groups of pressing supports are respectively located on both sides of the through groove. There are two pressing plates. The two pressing plates are respectively hinged to the two pressing supports. The pressing plate includes a pressing end and an unlocking end. The pressing end can press the chip towards the through groove. The torsion spring connects the pressing support and the pressing plate. The torsion spring drives the pressing end to press towards the through groove.

[0008] According to some embodiments of the present invention, the fixture unlocking kit includes a plurality of guide posts, a plurality of return springs, a movable plate, and an unlocking plug. The plurality of guide posts are arranged on the lifting seat. The movable plate is slidably arranged on the guide posts. A protrusion is provided at the lower end of the guide posts to prevent the movable plate from detaching from the guide posts. The return springs are sleeved on the guide posts. One end of each return spring abuts against the lifting seat, and the other end abuts against the movable plate. The unlocking plug is arranged on the movable plate. When the unlocking plug moves downward, it can press the unlocking end to lift the pressing end.

[0009] According to some embodiments of the present invention, an unlocking avoidance groove is provided on the fixture bottom plate, and the unlocking avoidance groove is used to avoid the unlocking end.

[0010] According to some embodiments of the present invention, the chip grasping mechanism further includes a stroke adjustment component. The stroke adjustment component is connected to the grasping component, and the stroke adjustment component is used to adjust the limit distance of the negative pressure suction head.

[0011] According to some embodiments of the present invention, the stroke adjustment component includes a mounting post, a sleeve, a sliding pin, and a locking post. The mounting post is arranged on the lifting seat. The sleeve is movably sleeved on the mounting post. A plurality of fixing holes are provided on the sleeve, and the plurality of fixing holes are evenly distributed along the circumferential direction of the sleeve. A chute is provided on the sleeve, and the chute is a spiral long groove. The sliding pin is inserted into the mounting post, and the sliding pin can freely slide in the chute. The diameter of the sliding pin is equal to the width of the chute. A plurality of locking screw holes are provided on the mounting post, and the plurality of locking screw holes are divided into two groups. The two groups of locking screw holes are respectively evenly arranged along the circumferential direction of the mounting post. The number of each group of locking screw holes is equal to the number of the fixing holes. The locking post passes through the fixing hole and is screwed into the locking screw hole. The lengths of the two groups of locking screw holes from the end of the mounting post are different.

[0012] According to some embodiments of the present invention, the locking post includes a threaded end and a knob end, and the surface of the knob end is provided with knurling.

[0013] According to some embodiments of the present invention, a plurality of chip placement grooves are provided on the chip storage tray. Material taking avoidance grooves are provided on both sides of the chip placement grooves. The chip placement grooves are used to accommodate chips, and the material taking avoidance grooves are used to avoid the unlocking plug.

[0014] According to some embodiments of the present invention, an arc surface is provided at the lower end of the unlocking plug.

[0015] Additional aspects and advantages of the present invention will be given in part in the following description, become apparent in part from the following description, or be understood through the practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The present invention will be further described below in conjunction with the drawings and embodiments;

[0017] Figure 1 Structural schematic diagram of a preferred embodiment of the present invention Figure 1 ;

[0018] Figure 2 Structural schematic diagram of a preferred embodiment of the present invention Figure 2 (The housing is omitted);

[0019] Figure 3 Structural schematic diagram of a preferred embodiment of the present invention Figure 3 (The housing and the frame are omitted);

[0020] Figure 4 Structural schematic diagram of the grasping component of a preferred embodiment of the present invention;

[0021] Figure 5 Structural schematic diagram of the stroke adjustment component of a preferred embodiment of the present invention;

[0022] Figure 6 Cross-sectional view of the stroke adjustment component of a preferred embodiment of the present invention;

[0023] Figure 7 Structural schematic diagram of the mounting post of a preferred embodiment of the present invention;

[0024] Figure 8 Structural schematic diagram of the sleeve of a preferred embodiment of the present invention;

[0025] Figure 9 Structural schematic diagram of the test board and the chip storage tray of a preferred embodiment of the present invention;

[0026] Figure 10 is Figure 9 Partial enlarged view at A in;

[0027] Figure 11 is Figure 9 Partial enlarged view at B in;

[0028] Figure 12 Structural schematic diagram of the test fixture of a preferred embodiment of the present invention Figure 1 ;

[0029] Figure 13 Cross-sectional view of the test fixture of a preferred embodiment of the present invention

[0030] Figure 14 Structural schematic diagram of the test fixture of a preferred embodiment of the present invention Figure 2 ;

[0031] Figure 15 is Figure 14Partial enlarged view at position C in the [Chinese context];

[0032] Reference numerals:

[0033] Frame 10;

[0034] A number of test boards 20;

[0035] Chip storage tray 30, chip placement groove 31, pick-up avoidance groove 32;

[0036] Chip grasping mechanism 40;

[0037] Support frame 41, translation frame 42, sliding seat 43, grasping component 44, mounting plate 441, lifting cylinder 442, lifting seat 443, negative pressure suction head 444, fixture unlocking kit 445, guide post 445a, return spring 445b, movable plate 445c, unlocking plug 445d, stroke adjustment component 45, mounting post 451, locking screw hole 451a, sleeve 452, fixing hole 452a, chute 452b, sliding pin 453, locking post 454, threaded end 454a, knob end 454b,

[0038] Test fixture 50, fixture bottom plate 51, through groove 511, unlocking avoidance groove 512, pressing bracket 52, pressing plate 53, pressing end 531, unlocking end 532, torsion spring 54, protection plate 55. Detailed implementation manners

[0039] In the description of the present invention, it should be understood that for the orientation descriptions, such as up, down, front, back, left, right, etc., the orientation or positional relationship indicated is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present invention.

[0040] In the description of the present invention, if the first and second are described only for the purpose of distinguishing technical features, it cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features or implicitly indicating the sequence of the indicated technical features.

[0041] In the description of the present invention, unless otherwise clearly defined, words such as set, install, connect, etc. should be understood in a broad sense. Those skilled in the art can reasonably determine the specific meanings of the above words in the present invention in combination with the specific content of the technical solution.

[0042] Refer to Figures 1 to 15, a chip testing device includes a frame 10, a plurality of test boards 20, a chip storage tray 30, a chip grasping mechanism 40, and a test fixture 50. The plurality of test boards 20 are arranged on the frame 10. The test boards 20 are used to test the performance of chips. The chip storage tray 30 is arranged on the frame 10. The chip storage tray 30 is used to store the chips to be detected and the detected chips. The chip grasping mechanism 40 is arranged on the frame 10. The chip grasping mechanism 40 includes a support frame 41, a translation frame 42, a sliding seat 43, and a grasping component 44. The support frame 41 is arranged on the frame 10 and located on both sides of the plurality of test boards 20. The translation frame 42 is slidably arranged on the support frame 41 along the X-axis. The translation frame 42 is located above the plurality of test boards 20. The sliding seat 43 is slidably arranged on the translation frame 42 along the Y-axis. The grasping component 44 is arranged on the sliding seat 43 in a liftable manner. The grasping component 44 is driven by a cylinder. When the grasping component 44 grasps a chip and contacts the test station on the test board 20, the cylinder is at its maximum output stroke. The test fixture 50 is arranged on the test board 20. The test fixture 50 is used to clamp the chip to complete the test.

[0043] It should be noted that by calculating the maximum stroke of the cylinder and selecting a support frame 41 with a suitable height, the maximum stroke after the chip grasping mechanism 40 grasps the chip is exactly to place the chip on the test position of the test fixture 50, which can maximally avoid the situation that the unstable cylinder stroke is likely to damage the test board 20.

[0044] It should be noted that the sliding of the translation frame 42 along the Y-axis direction and the sliding of the sliding seat 43 along the X-axis direction are driven by two sets of driving devices. The driving devices can be selected as motors cooperating with lead screws, or linear motors and other devices for driving.

[0045] It should be noted that the X-axis direction and Y-axis direction described in the text are the X-axis direction and Y-axis direction shown in the coordinate system of the accompanying drawings of the specification. Figure 2 in the accompanying drawings of the specification.

[0046] Refer to Figure 4 , the grasping component 44 includes a mounting plate 441, a lifting cylinder 442, a lifting seat 443, a negative pressure suction head 444, and a fixture unlocking kit 445. The mounting plate 441 is arranged on the sliding seat 43. The lifting cylinder 442 is arranged on the mounting plate 441. The lifting seat 443 is connected to the output end of the lifting cylinder 442. The lifting cylinder 442 is used to drive the lifting seat 443 to lift and lower. The negative pressure suction head 444 is arranged on the lifting seat 443. The negative pressure suction head 444 is used to suck the chip. The fixture unlocking kit 445 is arranged on the lifting seat 443. The fixture unlocking kit 445 lifts and lowers with the lifting seat 443. The fixture unlocking kit 445 can be inserted into and unlock the test fixture 50.

[0047] It can be understood that the positioning of the chip can be achieved through the test fixture 50, and at the same time, the chip can be pressed tightly on the test position of the test board 20 to avoid the influence of poor contact on the chip test.

[0048] Referring to Figures 12 to 15 , the test fixture 50 includes a fixture bottom plate 51, a pressing bracket 52, a pressing plate 53, a torsion spring 54 and a protective plate 55. The fixture bottom plate 51 is arranged on the test board 20. The middle part of the fixture bottom plate 51 has a through groove 511. The through groove 511 corresponds to the test position of the test board 20. The chip can be placed in the through groove 511. The pressing bracket 52 is arranged on the fixture bottom plate 51. There are two groups of pressing brackets 52. The two groups of pressing brackets 52 are respectively located on both sides of the through groove 511. There are two pressing plates 53. The two pressing plates 53 are respectively hinged to the two pressing brackets 52. The pressing plate 53 includes a pressing end 531 and an unlocking end 532. The pressing end 531 can press the chip towards the through groove 511. The torsion spring 54 connects the pressing bracket 52 and the pressing plate 53. The torsion spring 54 drives the pressing end 531 to press towards the through groove 511.

[0049] It can be understood that when the chip is placed in the through groove 511, the pressing end 531 can press the chip tightly on the test board to avoid test errors caused by poor contact. Pressing the unlocking end 532 can make the pressing end 531 lift up to achieve unlocking.

[0050] Referring to Figure 4 , the fixture unlocking kit 445 includes a number of guide posts 445a, a number of return springs 445b, a movable plate 445c and an unlocking plug 445d. The number of guide posts 445a is arranged on the lifting seat 443. The movable plate 445c is slidably arranged on the guide posts 445a. The lower end of the guide post 445a is provided with a protrusion to prevent the movable plate 445c from detaching from the guide post 445a. The return spring 445b is sleeved on the guide post 445a. One end of the return spring 445b abuts against the lifting seat 443, and the other end abuts against the movable plate 445c. The unlocking plug 445d is arranged on the movable plate 445c. The downward movement of the unlocking plug 445d can press the unlocking end 532 to make the pressing end 531 lift up.

[0051] It should be noted that when the unlocking plug 445d is inserted into the test fixture 50 for unlocking, in order to avoid interference between the fixture unlocking kit 445 and the protective plate 55 and prevent the negative pressure suction head 444 from moving downward, when the unlocking plug 445d presses down the unlocking end 532, the movable plate 445c will rise along the guide post 445a under the reaction force. When the unlocking plug 445d separates from the unlocking end 532, the return spring 445b drives the movable plate 445c to reset.

[0052] Referring to Figures 12 to 15 , an unlocking avoidance groove 512 is arranged on the fixture bottom plate 51. The unlocking avoidance groove 512 is used to avoid the unlocking end 532.

[0053] It is understandable that the unlocking avoidance groove 512 can prevent the unlocking end 532 from being blocked when it rotates.

[0054] It should be noted that in the embodiment of the present invention, the working process of the test fixture 50 is as follows:

[0055] The chip grasping mechanism 40 moves above the chip storage tray 30. Subsequently, the lifting cylinder 442 drives the lifting seat 443 to descend until the negative pressure suction head 444 sucks the chip. Then the lifting cylinder 442 drives the lifting seat 443 to rise. Then, the driving mechanism drives the translation frame 42 and the sliding seat 43, so that the grasping component 44 is located directly above the test board 20. Subsequently, the lifting cylinder 442 drives the lifting seat 443 to descend, causing the unlocking plug 445d to press down the unlocking end 532. At this time, the pressing end 531 is lifted under the drive of the unlocking end 532. At this time, the chip on the negative pressure suction head 444 is no longer blocked by the pressing end 531. The lifting cylinder 442 continues to drive the lifting seat 443 to descend until when the maximum stroke of the lifting cylinder 442 is reached, the chip is exactly located in the through groove 511. Then the lifting cylinder 442 drives the lifting seat 443 to rise, the unlocking plug 445d is gradually lifted, and the torsion spring 54 drives the pressing end 531 to press the chip for testing.

[0056] Refer to Figures 4 to 8 , the chip grasping mechanism 40 further includes a stroke adjustment component 45. The stroke adjustment component 45 is connected to the grasping component 44. The stroke adjustment component 45 is used to adjust the limit distance of the negative pressure suction head 444.

[0057] Refer to Figures 4 to 8 , the stroke adjustment component 45 includes a mounting column 451, a sleeve 452, a sliding pin 453 and a locking column 454. The mounting column 451 is arranged on the lifting seat 443. The sleeve 452 is movably sleeved on the mounting column 451. A plurality of fixing holes 452a are formed on the sleeve 452. The plurality of fixing holes 452a are evenly distributed along the circumferential direction of the sleeve 452. A chute 452b is formed on the sleeve 452. The chute 452b is a spiral long groove. The sliding pin 453 is inserted into the mounting column 451. The sliding pin 453 freely slides in the chute 452b. The diameter of the sliding pin 453 is equal to the groove width of the chute 452b. A plurality of locking screw holes 451a are formed on the mounting column 451. The plurality of locking screw holes 451a are divided into two groups. The two groups of locking screw holes 451a are respectively evenly arranged along the circumferential direction of the mounting column 451. The number of each group of locking screw holes 451a is equal to the number of fixing holes 452a. The locking column 454 passes through the fixing hole 452a and is screwed into the locking screw hole 451a. The lengths of the two groups of locking screw holes 451a from the end of the mounting column 451 are different.

[0058] It can be understood that when testing chips with different thickness specifications, the locking column 454 can be screwed out, the sleeve 452 is rotated, and the sliding pin 453 slides in the chute 452b for guiding, so that the relative positions of the sleeve 452 and the mounting column 451 change, thereby being applicable to the testing of chips with other specifications.

[0059] In some embodiments of the present invention, when the sleeve 452 rotates 67.5 degrees, the limit position of the negative pressure suction head 444 can be changed by 1 mm, thereby realizing the testing of chips with different thickness specifications.

[0060] Refer to Figures 4 to 8 , the locking column 454 includes a threaded end 454a and a knob end 454b. The surface of the knob end 454b is provided with knurling.

[0061] It can be understood that by setting the knob end 454b, it is convenient to screw out the locking column 454 when the chip specification needs to be changed.

[0062] Refer to Figure 11 , a plurality of chip placement grooves 31 are provided on the chip storage tray 30. Material taking avoidance grooves 32 are provided on both sides of the chip placement grooves 31. The chip placement grooves 31 are used to accommodate chips. The material taking avoidance grooves 32 are used to avoid the unlocking plug board 445d.

[0063] Refer to Figure 4 , the lower end of the unlocking plug board 445d is provided with an arc surface.

[0064] The technical features of the above-described embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope recorded in this specification.

[0065] Certainly, the present invention is not limited to the above embodiments. Those skilled in the art can also make equivalent deformations or substitutions without departing from the spirit of the present invention, and these equivalent deformations or substitutions are all included in the scope defined by the claims of this application.

Claims

1. A chip testing device, characterized in that: include: Rack (10); a plurality of test boards (20), wherein the plurality of test boards (20) are arranged on the rack (10), and the test boards (20) are used to test chip performance; A chip storage tray (30), the chip storage tray (30) being arranged on the rack (10), and the chip storage tray (30) being used to store chips to be tested and chips after testing; A chip grabbing mechanism (40), wherein the chip grabbing mechanism (40) is arranged on the frame (10), and the chip grabbing mechanism (40) includes a support frame (41), a translation frame (42), a sliding seat (43) and a grabbing assembly (44), wherein the support frame (41) is arranged on the frame (10) and is located on both sides of the plurality of test boards (20), the translation frame (42) is slidably arranged on the support frame (41) along the X-axis, the translation frame (42) is located above the plurality of test boards (20), the sliding seat (43) is slidably arranged on the translation frame (42) along the Y-axis, and the grabbing assembly (44) is movably arranged on the sliding seat (43), and the grabbing assembly (44) is driven by a cylinder, and when the grabbing assembly (44) grabs the chip and contacts the test station on the test board (20), the cylinder is at its maximum output stroke; A test fixture (50), the test fixture (50) being arranged on the test board (20), and the test fixture (50) being used to clamp a chip to complete a test; The grabbing assembly (44) includes a mounting plate (441), a lifting cylinder (442), a lifting seat (443), a negative pressure suction head (444) and a fixture unlocking kit (445), wherein the mounting plate (441) is arranged on the sliding seat (43), the lifting cylinder (442) is arranged on the mounting plate (441), the lifting seat (443) is connected to the output end of the lifting cylinder (442), the lifting cylinder (442) is used to drive the lifting seat (443) to move up and down, the negative pressure suction head (444) is arranged on the lifting seat (443), the negative pressure suction head (444) is used to suck the chip, the fixture unlocking kit (445) is arranged on the lifting seat (443), the fixture unlocking kit (445) moves up and down with the lifting seat (443), and the fixture unlocking kit (445) can be inserted into and unlock the test fixture (50); The chip grabbing mechanism (40) further includes a stroke adjustment component (45), the stroke adjustment component (45) being connected to the grabbing component (44), and the stroke adjustment component (45) being used to adjust the limit distance of the negative pressure suction head (444); The stroke adjustment component (45) includes a mounting column (451), a sleeve (452), a sliding pin (453) and a locking column (454), wherein the mounting column (451) is arranged on the lifting seat (443), the sleeve (452) is movably sleeved on the mounting column (451), a plurality of fixing holes (452a) are provided on the sleeve (452), and the plurality of fixing holes (452a) are evenly distributed along the circumference of the sleeve (452), a sliding groove (452b) is provided on the sleeve (452), and the sliding groove (452b) is a spiral long groove, the sliding pin (453) is inserted into the mounting column (451), and the sliding pin (453) is inserted into the mounting column (451). The slide groove (452b) slides freely, the diameter of the sliding pin (453) is equal to the groove width of the slide groove (452b), and a plurality of locking screw holes (451a) are opened on the mounting column (451), and the plurality of locking screw holes (451a) are divided into two groups. The two groups of locking screw holes (451a) are evenly arranged along the circumference of the mounting column (451), and the number of locking screw holes (451a) in each group is equal to the number of the fixing holes (452a). The locking column (454) passes through the fixing hole (452a) and is screwed into the locking screw hole (451a). The lengths of the two groups of locking screw holes (451a) from the end of the mounting column (451) are different.

2. A chip testing device according to claim 1, characterized in that: The test fixture (50) includes a fixture base (51), a clamping bracket (52), a clamping plate (53), a torsion spring (54) and a protective plate (55). The fixture base (51) is arranged on the test board (20). The middle of the fixture base (51) has a through groove (511). The through groove (511) corresponds to the test position of the test board (20). The chip can be accommodated in the through groove (511). The clamping bracket (52) is arranged on the fixture base (51). The clamping bracket (52) is in two groups. The two groups of the clamping brackets (52) are respectively provided on the fixture base (51). The clamping brackets (52) are respectively located on both sides of the through slot (511), and there are two clamping plates (53). The two clamping plates (53) are respectively hinged to the two clamping brackets (52), and the clamping plate (53) includes a clamping end (531) and an unlocking end (532). The clamping end (531) can press the chip toward the through slot (511). The torsion spring (54) connects the clamping bracket (52) and the clamping plate (53), and the torsion spring (54) drives the clamping end (531) to press toward the through slot (511).

3. A chip testing device according to claim 2, characterized in that: The jig unlocking kit (445) includes a plurality of guide posts (445a), a plurality of return springs (445b), a movable plate (445c) and an unlocking plug plate (445d), wherein the plurality of guide posts (445a) are arranged on the lifting seat (443), the movable plate (445c) is slidably arranged on the guide posts (445a), a protrusion is provided at the lower end of the guide post (445a) to prevent the movable plate (445c) from detaching from the guide post (445a), the return spring (445b) is sleeved on the guide post (445a), one end of the return spring (445b) abuts against the lifting seat (443), and the other end abuts against the movable plate (445c), the unlocking plug plate (445d) is arranged on the movable plate (445c), and the unlocking plug plate (445d) moves downward to press the unlocking end (532) so that the pressing end (531) is lifted.

4. The chip testing device according to claim 2, characterized in that: An unlocking avoidance groove (512) is provided on the jig bottom plate (51), and the unlocking avoidance groove (512) is used to avoid the unlocking end (532).

5. The chip testing device according to claim 1, characterized in that: The locking column (454) comprises a threaded end (454a) and a knob end (454b), and a surface of the knob end (454b) is provided with knurling.

6. The chip testing device according to claim 3, characterized in that: The chip storage tray (30) is provided with a plurality of chip placement slots (31), and material removal avoidance slots (32) are provided on both sides of the chip placement slots (31). The chip placement slots (31) are used to accommodate chips, and the material removal avoidance slots (32) are used to avoid the unlocking plug plate (445d).

7. The chip testing device according to claim 3, characterized in that: The lower end of the unlocking plug plate (445d) is provided with a curved surface.

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