Equipment testing system and method and electronic equipment

Abstract

The invention provides an equipment testing system and method and electronic equipment, and the system is characterized in that a detection module is a closed space, and the inner wall of the closed space is provided with a wave-absorbing material; a detection unit is arranged in the detection module and comprises a high-voltage interface which is used for connecting to-be-detected equipment; the high-voltage switching module comprises a high-voltage filter and is used for filtering a high-voltage power supply; the loading module is used for automatically simulating the real working condition of the to-be-detected equipment in the actual operation process based on the historical operation data of the to-be-detected equipment; the power module is used for providing high-voltage power; and the power supply module, the loading module and the to-be-detected equipment form a closed loop. The equipment testing system can be used for detecting the high-voltage equipment, meanwhile, the real working condition of the to-be-detected equipment can be automatically simulated according to the historical operation data of the to-be-detected equipment, the testing result can be more accurate and fit the actual operation scene, and through the closed space provided with the wave absorbing material, the testing efficiency is improved. And the influence of an external electromagnetic field can be eliminated.

Description

Technical Field

[0001] The present disclosure relates to the technical field of device testing, and in particular to a device testing system, method and electronic equipment. Background Art

[0002] The rapid development of power electronics and control technology and the demand for energy conservation have led to the increasing application of high-power electrical speed control equipment in coal mines. High-power power electronic switches generate a large number of harmonics and high-frequency components, causing the underground electromagnetic environment to become increasingly harsh. From theoretical simulation and field measurements, it is found that the radiation interference of mining electrical equipment, especially high-voltage and high-power frequency conversion equipment, is relatively serious in mines, causing interference to sensitive equipment working within a certain range, which may cause them to restart or shut down, and may have catastrophic consequences for coal mine safety production.

[0003] In current technology, there is no mature test standard and test environment for the radiation interference of high-power electrical speed control equipment used in mines, especially frequency conversion equipment, and the radiation interference measurement method is generally field measurement or no-load measurement in the laboratory. It is difficult to avoid the influence of the surrounding environment in field measurement. The radiation interference evaluation test of many high-power, high-voltage and high-power electrical speed control equipment is often carried out under no-load, which is different from the radiation interference during normal operation. Summary of the invention

[0004] The present disclosure aims to solve one of the technical problems in the related art at least to some extent.

[0005] To this end, a first object of the present disclosure is to provide a device testing system.

[0006] A second objective of the present disclosure is to provide a device testing method.

[0007] A third objective of the present disclosure is to provide an electronic device.

[0008] A fourth object of the present disclosure is to provide a non-transitory computer-readable storage medium.

[0009] A fifth object of the present disclosure is to provide a computer program product.

[0010] To achieve the above-mentioned purpose, the first aspect of the present disclosure proposes a device testing system, including: a detection module, a high-voltage switching module, a power module and a loading module; wherein the detection module is a confined space, and an absorbing material is provided on the inner wall of the confined space; a detection unit is provided inside the detection module, and the detection unit includes a high-voltage interface, and the high-voltage interface is used to connect the device to be detected; the high-voltage switching module includes a high-voltage filter, which is used to filter the high-voltage power supply provided by the power module; the loading module is used to automatically simulate the real working conditions of the device to be detected during the actual operation process based on the historical operation data of the device to be detected; the power module is used to provide a high-voltage power supply; the power module, the loading module and the device to be detected form a closed loop.

[0011] According to one embodiment of the present disclosure, the automatic simulation of the real working conditions of the equipment to be detected during actual operation based on the historical operation data of the equipment to be detected includes: obtaining the load data in the historical operation data and the equipment parameters of the equipment to be detected; and configuring the circuit simulation unit and the loading unit of the loading module based on the load data and the equipment parameters.

[0012] According to one embodiment of the present disclosure, configuring the circuit simulation unit and the loading unit of the loading module based on the load data and the device parameters includes: configuring the circuit simulation unit based on the capacitive reactance data, inductive reactance data and impedance data in the load data, and configuring the loading unit based on the device parameters and the actual operating power of the load device in the load data.

[0013] According to an embodiment of the present disclosure, the detection module is further used to collect test data of the device to be detected and electromagnetic data of the device to be detected in the closed space of the detection module during the test process.

[0014] According to one embodiment of the present disclosure, the high voltage filter is a high voltage EMI filter.

[0015] According to one embodiment of the present disclosure, the high voltage switching module further includes a sine filter.

[0016] According to one embodiment of the present disclosure, the detection module further includes: a test turntable, and the test turntable is used to place and fix the device to be detected.

[0017] To achieve the above-mentioned purpose, a second aspect of the present disclosure provides a device testing method, including: testing a device to be tested based on the device testing system as described in the first aspect of the present disclosure.

[0018] To achieve the above-mentioned purpose, an embodiment of the third aspect of the present disclosure proposes an electronic device, comprising: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to implement the device testing method as described in the embodiment of the second aspect of the present disclosure.

[0019] To achieve the above-mentioned purpose, the fourth aspect embodiment of the present disclosure proposes a non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to implement the device testing method as described in the second aspect embodiment of the present disclosure.

[0020] To achieve the above-mentioned purpose, a fifth aspect of the present disclosure provides a computer program product, including a computer program, which, when executed by a processor, is used to implement the device testing method as described in the second aspect of the present disclosure.

[0021] The equipment testing system in the disclosed embodiment can be used for the detection of high-voltage equipment. At the same time, it can automatically simulate the actual working conditions of the equipment to be detected based on the historical operating data of the equipment to be detected. The test results can be more accurate and fit the actual operating scenarios. The influence of external electromagnetic fields can be eliminated by providing a closed space with absorbing materials. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 is a schematic diagram of a device testing system according to one embodiment of the present disclosure;

[0023] Figure 2 It is a schematic diagram of an embodiment of the present disclosure for automatically simulating the real working conditions of the device to be detected during the actual operation process based on the historical operation data of the device to be detected;

[0024] Figure 3 is a structural schematic diagram of another device testing system according to an embodiment of the present disclosure;

[0025] Figure 4 is a schematic diagram of a device testing method according to an embodiment of the present disclosure;

[0026] Figure 5 is a schematic diagram of a device testing apparatus according to one embodiment of the present disclosure;

[0027] Figure 6 is a schematic diagram of an electronic device according to an embodiment of the present disclosure. DETAILED DESCRIPTION

[0028] Embodiments of the present disclosure are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present disclosure, and should not be construed as limiting the present disclosure.

[0029] The acquisition, storage, use, and processing of data in the technical solution disclosed in this disclosure are in compliance with the relevant provisions of relevant laws and regulations.

[0030] It should be noted that in the embodiments of the present application, certain software, components, models and other existing solutions in the industry may be mentioned, and they should be considered as exemplary. Their purpose is only to illustrate the feasibility of implementing the technical solution of the present application, but it does not mean that the applicant has or will necessarily use the solution.

[0031] Figure 1 is a schematic diagram of a device testing system according to an embodiment of the present disclosure. Figure 1 As shown, the device testing system includes: a detection module 110 , a high voltage switching module 120 , a power supply module 130 and a loading module 140 .

[0032] Among them, the detection module 110 is a closed space, and the inner wall of the closed space is provided with absorbing material.

[0033] It should be noted that the absorbing material in the embodiment of the present disclosure may be of various types, and no limitation is made herein. For example, the absorbing material may be a ferrite material, a ceramic-based material, and the like.

[0034] A detection unit is provided inside the detection module 110 . The detection unit includes a high-voltage interface. The high-voltage interface is used to connect to a device to be detected.

[0035] It should be noted that the detection module 110 is used to implement electromagnetic compatibility performance loading testing of the device to be detected under different working conditions such as no-load, light-load, and full-load through different software settings and switch switching.

[0036] The high-voltage switching module 120 includes a high-voltage filter for filtering the high-voltage power provided by the power module 130 .

[0037] It should be noted that the high-voltage switching module 120 may also include a high-voltage switching switch, which is a switching device used in a high-voltage electrical system and is mainly used to connect, disconnect or convert circuits in a high-voltage power transmission and distribution system.

[0038] The loading module 140 is used to automatically simulate the real working conditions of the equipment to be detected during its actual operation based on the historical operation data of the equipment to be detected.

[0039] It should be noted that the loading module 140 may include a variable resistor, a variable capacitor and a variable inductor for simulating the actual resistance, capacitance and inductance of the load and line of the device to be tested during actual operation.

[0040] The power module 130 is used to provide high voltage power.

[0041] The power module 130 , the loading module 140 and the device to be detected form a closed loop.

[0042] The equipment testing system in the disclosed embodiment can be used for the detection of high-voltage equipment. At the same time, it can automatically simulate the actual working conditions of the equipment to be detected based on the historical operating data of the equipment to be detected. The test results can be more accurate and fit the actual operating scenarios. The influence of external electromagnetic fields can be eliminated by providing a closed space with absorbing materials.

[0043] In the embodiment of the present disclosure, based on the historical operation data of the device to be detected, the real working conditions of the device to be detected during actual operation are automatically simulated. Figure 2 As shown:

[0044] S201, obtaining load data in historical operation data and equipment parameters of the equipment to be detected.

[0045] In the embodiment of the present disclosure, the load data may include various types, which are not limited herein, for example, the load type, operating power, impedance, etc.

[0046] S202, configuring a circuit simulation unit and a loading unit of a loading module based on load data and device parameters.

[0047] In the disclosed embodiment, the circuit simulation unit may be configured based on the capacitive reactance data, inductive reactance data and impedance data in the load data, and the loading unit may be configured based on the device parameters and the actual operating power of the load device in the load data.

[0048] In the disclosed embodiment, the load data in the historical operation data and the device parameters of the device to be tested are first obtained, and then the circuit simulation unit and the loading unit of the loading module are configured based on the load data and the device parameters. By testing the device in this way, not only the effectiveness and reliability of the test can be effectively improved, but also the cost can be saved for the enterprise and the economic benefits can be improved.

[0049] In one embodiment of the present disclosure, the detection module 110 is further used to collect test data of the device to be detected and electromagnetic data of the device to be detected in the closed space of the detection module during the test process.

[0050] In one possible implementation, Figure 3 As shown, Figure 3FIG. 1 is a schematic diagram of a device testing system in an embodiment of the present disclosure. Figure 3 As shown, the system includes: power feedback device, detection module, power supply adjustable transformer, distribution switch cabinet group, loading motor, test motor, control software, etc. The detection module includes the detection module body and high-voltage switch switching room. Power supply and loading system 10kV AC adjustable transformer, test motor, loading motor and power feedback system. The input voltage of the detection module is equipped with a high-power input EMI power filter, and the output power adopts a filtering method combining a sine filter and an electromagnetic interference (EMI) filter. A power supply, a test loading system, and a radiation interference test system are set outside the detection module. During the test, the high-power frequency conversion equipment is placed on the turntable in the radio wave detection module. The power supply enters the detection module from the external power supply system through the high-power filter and then connects to the junction box on the turntable. The loading power line also passes through the junction box on the turntable to the sine filter and power EMI filter of the detection module to connect to the load system outside the detection module. The radiation interference is transmitted to the external EMI receiver through the antenna in the detection module for signal reception and processing.

[0051] The detection module may include an EMI receiver for collecting electromagnetic data of the device to be detected within the closed space of the detection module during the test process.

[0052] like Figure 3 As shown, the absorbing material may be a absorbing wedge. The high voltage filter may be a high voltage EMI filter.

[0053] It should be noted that in order to protect the EMI filter, Figure 3 As shown, the high-voltage switching module also includes a sine filter. It should be noted that the sine filter can significantly reduce the harmonic content of voltage and current, thereby making the power supply more stable and smooth. This can significantly improve the quality of the power supply, reduce the heat and loss of the EMI filter, and extend the service life of the EMI filter.

[0054] In one embodiment of the present disclosure, Figure 3 As shown, the detection module also includes a test turntable, which is used to place and fix the device to be tested. It should be noted that the test turntable plays an important role in the test, especially in the radiation emission and sensitivity test. For example, it can play the following roles:

[0055] In full-scale testing, the test turntable enables the device under test (DUT) to be tested in multiple directions, ensuring that the electromagnetic emissions and sensitivity of the device in different orientations can be fully evaluated.

[0056] Improved test accuracy: Testing in a fixed position can lead to inconsistent results because the orientation of the device can affect its radiation pattern.

[0057] Figure 4 is a schematic diagram of a device testing method according to an embodiment of the present disclosure. Figure 4 As shown, the method includes:

[0058] S401, testing the device to be tested based on the device testing system.

[0059] It should be noted that the device testing system in the embodiment of the present disclosure is as follows Figure 1-Figure 3 A device testing system of an embodiment.

[0060] Thus, through Figure 1-Figure 3 The equipment testing system in the embodiment performs equipment testing and can be used for the detection of high-voltage equipment. At the same time, it can automatically simulate the actual working conditions of the equipment to be detected based on the historical operating data of the equipment to be detected. The test results can be more accurate and fit the actual operating scenarios. The influence of external electromagnetic fields can be eliminated by providing a closed space with absorbing materials.

[0061] Corresponding to the equipment testing methods provided in the above-mentioned embodiments, an embodiment of the present disclosure further provides an equipment testing device. Since the equipment testing device provided in the embodiment of the present disclosure corresponds to the equipment testing methods provided in the above-mentioned embodiments, the implementation methods of the above-mentioned equipment testing methods are also applicable to the equipment testing device provided in the embodiment of the present disclosure and will not be described in detail in the following embodiments.

[0062] Figure 5 is a schematic diagram of a device testing apparatus according to an embodiment of the present disclosure, such as Figure 5 As shown, the equipment testing device 500 includes: a testing module 510.

[0063] The testing module 510 is used to test the device to be tested based on the device testing system.

[0064] Thus, through Figure 1-Figure 3 The equipment testing system in the embodiment performs equipment testing and can be used for the detection of high-voltage equipment. At the same time, it can automatically simulate the actual working conditions of the equipment to be detected based on the historical operating data of the equipment to be detected. The test results can be more accurate and fit the actual operating scenarios. The influence of external electromagnetic fields can be eliminated by providing a closed space with absorbing materials.

[0065] In order to implement the above embodiment, the present disclosure further provides an electronic device 600, Figure 6 is a schematic diagram of an electronic device according to an embodiment of the present disclosure, such as Figure 6As shown, the electronic device 600 includes: a processor 601 and a memory 602 that is communicatively connected to the processor, the memory 602 stores instructions that can be executed by at least one processor, and the instructions are executed by at least one processor 601 to implement the present disclosure. Figure 4 A device testing method according to an embodiment.

[0066] In order to implement the above embodiments, the present disclosure also provides a non-transitory computer-readable storage medium storing computer instructions, wherein the computer instructions are used to enable the computer to implement the above embodiments. Figure 4 A device testing method according to an embodiment.

[0067] In order to implement the above embodiments, the present disclosure also provides a computer program product, including a computer program. When the computer program is executed by a processor, the computer program implements the above embodiments. Figure 4 A device testing method according to an embodiment.

[0068] It should be noted that personal information from users should be collected for legitimate and reasonable purposes and should not be shared or sold outside of these legitimate uses. In addition, such collection / sharing should be carried out after receiving the user's informed consent, including but not limited to notifying the user to read the user agreement / user notice and sign the agreement / authorization including authorization of relevant user information before the user uses the function. In addition, any necessary steps should be taken to protect and safeguard access to such personal information data and ensure that others who have access to personal information data comply with its privacy policy and procedures.

[0069] The present application is expected to provide an implementation scheme for users to selectively block the use or access of personal information data. That is, the present disclosure is expected to provide hardware and / or software to prevent or block access to such personal information data. Once the personal information data is no longer needed, the risk can be minimized by limiting data collection and deleting the data. In addition, when applicable, such personal information is de-identified to protect the privacy of the user.

[0070] In the description of the aforementioned embodiments, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner. In addition, those skilled in the art may combine and combine the different embodiments or examples described in this specification and the features of the different embodiments or examples, without contradiction.

[0071] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of this application, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0072] Any process or method description in a flowchart or otherwise described herein may be understood to represent a module, fragment or portion of code comprising one or more executable instructions for implementing the steps of a custom logical function or process, and the scope of the preferred embodiments of the present application includes alternative implementations in which functions may not be performed in the order shown or discussed, including performing functions in a substantially simultaneous manner or in the reverse order depending on the functions involved, which should be understood by technicians in the technical field to which the embodiments of the present application belong.

[0073] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered as an ordered list of executable instructions for implementing logical functions, and can be embodied in any computer-readable medium for use by an instruction execution system, device or apparatus (such as a computer-based system, a system including a processor, or other system that can fetch instructions from an instruction execution system, device or apparatus and execute instructions), or in combination with these instruction execution systems, devices or apparatuses. For the purpose of this specification, "computer-readable medium" can be any device that contains, stores, communicates, propagates or transmits a program for use by an instruction execution system, device or apparatus, or in combination with these instruction execution systems, devices or apparatuses. More specific examples (non-exhaustive list) of computer-readable media include the following: an electrical connection with one or more wires (electronic device), a portable computer disk box (magnetic device), a random access memory (RAM), a read-only memory (ROM), an erasable and programmable read-only memory (EPROM or flash memory), a fiber optic device, and a portable compact disk read-only memory (CDROM). In addition, the computer-readable medium may even be paper or other suitable medium on which the program is printed, since the program may be obtained electronically, for example, by optically scanning the paper or other medium and then editing, interpreting or processing in other suitable ways if necessary, and then stored in a computer memory.

[0074] It should be understood that the various parts of the present application can be implemented by hardware, software, firmware or a combination thereof. In the above-mentioned embodiments, multiple steps or methods can be implemented by software or firmware stored in a memory and executed by a suitable instruction execution system. For example, if implemented by hardware, as in another embodiment, it can be implemented by any one of the following technologies known in the art or their combination: a discrete logic circuit having a logic gate circuit for implementing a logic function for a data signal, a dedicated integrated circuit having a suitable combination of logic gate circuits, a programmable gate array (PGA), a field programmable gate array (FPGA), etc.

[0075] A person skilled in the art may understand that all or part of the steps in the method for implementing the above-mentioned embodiment may be completed by instructing related hardware through a program, and the program may be stored in a computer-readable storage medium, which, when executed, includes one or a combination of the steps of the method embodiment.

[0076] In addition, each functional unit in each embodiment of the present application may be integrated into a processing module, or each unit may exist physically separately, or two or more units may be integrated into one module. The above-mentioned integrated module may be implemented in the form of hardware or in the form of a software functional module. If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it may also be stored in a computer-readable storage medium.

[0077] The storage medium mentioned above may be a read-only memory, a magnetic disk or an optical disk, etc. Although the embodiments of the present application have been shown and described above, it can be understood that the above embodiments are exemplary and cannot be understood as limiting the present application. A person of ordinary skill in the art may change, modify, replace and modify the above embodiments within the scope of the present application.

Claims

1. A device testing system, characterized in that: include: Detection module, high voltage switching module, power supply module and loading module; Wherein, the detection module is a closed space, and an absorbing material is provided on the inner wall of the closed space; The detection module is provided with a detection unit inside, and the detection unit includes a high-voltage interface, and the high-voltage interface is used to connect to the device to be detected; The high-voltage switching module includes a high-voltage filter for filtering the high-voltage power provided by the power module; The loading module is used to automatically simulate the real working conditions of the device to be detected during actual operation based on the historical operation data of the device to be detected; The power supply module is used to provide high voltage power supply; The power supply module, the loading module and the device to be detected form a closed loop.

2. The device testing system according to claim 1, characterized in that: The automatic simulation of the real working condition of the equipment to be detected during the actual operation based on the historical operation data of the equipment to be detected includes: Acquire the load data in the historical operation data and the equipment parameters of the equipment to be detected; A circuit simulation unit and a loading unit of the loading module are configured based on the load data and the device parameters.

3. The device testing system according to claim 2, characterized in that: The circuit simulation unit and the loading unit of the loading module are configured based on the load data and the device parameters, including: The circuit simulation unit is configured based on the capacitive reactance data, the inductive reactance data and the impedance data in the load data, and the loading unit is configured based on the device parameters and the actual operating power of the load device in the load data.

4. The device testing system according to claim 1, characterized in that: The detection module is also used for: The test data of the device to be detected and the electromagnetic data of the device to be detected in the closed space of the detection module during the test process are collected.

5. The device testing system according to claim 1, characterized in that: The wave absorbing material is a wave absorbing wedge.

6. The device testing system according to claim 1, characterized in that: The high-voltage filter is a high-voltage EMI filter.

7. The device testing system according to claim 6, characterized in that: The high voltage switching module further includes a sine filter.

8. The device testing system according to claim 1, characterized in that: The detection module also includes: A test turntable is used to place and fix the device to be tested.

9. A device testing method, characterized in that: include: The device to be tested is tested based on the device testing system according to any one of claims 1 to 8.

10. An electronic device, characterized in that: Including memory. processor; The processor runs a program corresponding to the executable program code by reading the executable program code stored in the memory, so as to implement the method according to claim 9.

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