Alignment aid, alignment aid system and x-ray imaging system

Abstract

The invention relates to a laser-based alignment aid (1) for assisting the alignment of an instrument (2) for puncturing an object (3), which can be used in an X-ray imaging system (4) and has - a first line laser (5) for generating a first laser ray in a first laser plane (7), which is arranged to generate a first laser line (14) on a first surface line (9) in a first cut plane (11) when the first cut plane (11) coincides with the first laser plane (7), and - a second line laser (6) for generating a second laser ray in a second laser plane (8), - a point-like screening element (16) for generating a shadow line (17) in the second laser plane (8), wherein the second line laser (6) is arranged to map a shadow point (18) on a second surface line (10) in a second cut plane (12) when the first cut plane (11) and the second cut plane (12) are aligned.

Description

TECHNICAL FIELD

[0001] The invention relates to a laser-based alignment aid for the alignment of an instrument for puncturing an object, in particular for an X-ray imaging system. The laser-based alignment aid, in short device, has a first line laser for generating a first laser ray in a first laser plane, which first line laser is configured to generate a first laser line on a first surface line of the instrument in a first cut plane of the instrument when the first cut plane of the instrument coincides with the first laser plane. Furthermore, the device has a second line laser for generating a second laser ray in a second laser plane, which second laser plane intersects the first laser plane. The invention also relates to a laser-based alignment aid system, which additionally has an instrument for puncturing. Furthermore, the invention relates to an X-ray imaging system having an X-ray source, an X-ray detector and the alignment aid. BACKGROUND

[0002] In addition to other application fields, for example technical application fields for processing materials, the laser-based alignment aid can be used in the medical application field.

[0003] It is necessary, for example for medical interventions, to introduce a medical instrument, for example a medical needle or a cannula, into an object, in particular into a patient, through the surface of the object, in particular percutaneously, in a targeted manner, i.e. along a planned or accurately determined puncture trajectory. In particular in the treatment of the patient's body, for example at the spinal column or internal organs, the precise guidance and alignment of the instrument along the planned trajectory is of particular importance in order to ensure, on the one hand, the correct trajectory through the tissue and the bone and, on the other hand, the targeted treatment of the respective organ, vessel or bone.

[0004] The precise guidance and alignment of the instrument can be assisted and monitored, in particular, by means of an X-ray imaging system, but only limitedly, since the X-ray imaging system can only provide a two-dimensional X-ray image of the X-ray detector plane of the X-ray detector. In particular in the progress display position of the X-ray detector or the X-ray source, in which the progress of the instrument inside the object can be displayed, a roll movement of the instrument into the detector plane or a roll movement away from the detector plane cannot be displayed, so this can form a hidden deviation of the instrument.

[0005] The line lasers of the laser-based alignment aid device can be used assistively for the alignment of the instrument, the line lasers can produce laser rays in laser planes that intersect one another. Before the puncture, for example, two laser lines that intersect one another can be displayed on the object surface of the object, i.e. for example on the skin of the patient, in a first position of the laser-based alignment aid device, which can indicate a puncture entry point for the puncture. The instrument can additionally be aligned in the first position in such a way that the instrument is tilted about a first and a second tilting axis such that the intersecting laser beams are mapped on the instrument. The instrument has in particular a first and a second cut plane, wherein the instrument is aligned according to the trajectory, i.e. correctly positioned and correctly aligned, on the puncture entry point when the first laser plane coincides with the first cut plane and the second laser plane coincides with the second cut plane. To this end, the line lasers can in particular be calibrated in such a way that in the correctly aligned instrument the first cut plane coincides with the first laser plane and the second cut plane coincides with the second laser plane.

[0006] It is accordingly possible to provide a calibration device for the first and the second line laser, which can in particular be calibrated automatically according to a preset puncture trajectory.

[0007] However, in order to puncture the object or during the puncture of the object it can be necessary due to the design that the device has to be rotated from the first position into the second position in order to be able to place the X-ray detector in particular into a process display position for the intervention.

[0008] Disadvantageously, the device can only be used in the second position for the alignment of the instrument to a limited extent, since the two laser planes can no longer overlap with the two cut planes of the instrument due to the design. The instrument can in particular be aligned in the second position of the device with the aid of the laser lines only with respect to the first cut plane. In contrast, the second laser plane, which is rotated for example to the second cut plane, cannot provide in the prior art any auxiliary information for the alignment with respect to the second cut plane. The second cut plane of the instrument likewise cannot be aligned with the aid of the X-ray image, so that there is a risk of a hidden tilt of the instrument during the intervention perpendicular to the detector plane.

[0009] The solution to this today is that the device is temporarily rotated back from the first position into the second position during the intervention, so that the two cut planes of the instrument can be correctly aligned again. However, the intervention is thereby disadvantageously interrupted, so that it is delayed and the radiation load is increased. Alternatively, a mechanical alignment aid device can be provided, but the handling thereof needs to be improved.

[0010] DE 195 01 069 A1 discloses a device for marking a prescribed guide path of an instrument, in particular a puncture needle or a catheter.

[0011] CN 1 09 793 559 A discloses a CT-assisted percutaneous laser positioning device.

[0012] DE 10 2007 029 199 A1 discloses a method for aligning a target guide system which assists in targeting a patient when puncturing and an X-ray angiography system which can be used in the method. SUMMARY

[0013] The technical problem addressed by the present application is to suggest an improved solution for a laser-based alignment aid, for a laser-based alignment aid system and for an X-ray imaging system, whereby a user of an instrument can be assisted in aligning both a first cut plane of the instrument and a second cut plane of the instrument to a puncture trajectory, during a puncture, especially in a progress display position of an X-ray detector or in a second position of the alignment aid.

[0014] The technical problem is solved by the present application by a laser-based alignment aid, by a laser-based alignment aid system and by an X-ray imaging system. Advantageous extensions of the present application are described by the following description and the figures.

[0015] A first aspect of the present application relates to a laser-based alignment aid for aligning an instrument for puncturing an object, wherein the alignment aid can especially be provided for an X-ray imaging system.

[0016] The alignment aid especially has a first line laser for generating a first laser ray in a first laser plane. The first line laser is provided for generating a first laser line on a first surface line of the instrument in the first cut plane of the instrument when the first cut plane of the instrument coincides with the first laser plane.

[0017] Furthermore, the alignment aid especially has a second line laser for generating a second laser ray in a second laser plane, the second laser plane intersecting the first laser plane. The second line laser especially has a point-like shielding element, wherein a shadow line can be generated in the second laser plane by means of the shielding element. The second line laser is provided for displaying a shadow point of the shadow line on a second surface line of the instrument in the second cut plane of the instrument when the first cut plane and the second cut plane of the instrument are aligned.

[0018] Aligning (Ausrichten) can especially be understood as positioning the instrument in its preset position and rotating and tilting into its preset orientation, especially moving laterally along three spatial directions and rotating around three spatial directions. Aligning (or also orientation) is especially also a correct alignment, especially a correct alignment of the instrument with respect to a preset or planned puncture trajectory.

[0019] The assistance can be understood in particular such that the device does not perform the alignment itself, but rather assists the user or other technical means in order to correctly align the instrument.

[0020] By means of the application it can advantageously be ensured that the user of the instrument can be assisted in correctly aligning the first cut plane of the instrument and the second cut plane of the instrument according to the preset puncture trajectory during the puncture, in particular in the course display position of the X-ray detector or in the second position of the alignment assistance device. The user can in particular perceive this visually when the instrument is correctly aligned. In particular when the first laser line is generated on the first surface line and the shadow point is mapped on the second surface line, the instrument is correctly aligned. This can be monitored visually by the user in order to ensure that the instrument is aligned according to the planned puncture trajectory.

[0021] In particular when the first laser line is not on the first surface line and / or the shadow point is not on the second surface line, the user can in particular also not visually recognize a deviation from the correct alignment of the instrument. If the instrument is not correctly aligned, the user can in particular see the second laser line on the second surface line, which intersects the second surface line at a point. In this case, the user can assistively correctly align the instrument by means of the device.

[0022] For the correct alignment, the user can preferably operate as follows. First, the user positions the instrument on the preset puncture entry point, for example with the needle tip of the instrument. Then, the user tilts the instrument about a first tilting axis, which can extend through the puncture entry point, until the user visually perceives the first laser line on the instrument. Then, the user can tilt the instrument about the first tilting axis and rotate the instrument about a rotation axis through the puncture entry point such that the first laser line is generated on the first surface line. Then, the user can tilt the instrument about a second tilting axis, which extends substantially perpendicularly to the first tilting axis, until the shadow point is mapped, or rather imaged, on the second surface line.

[0023] For rotationally symmetrical instruments, for example medical needles, the step of rotating about the rotation axis can be omitted. In particular in such instruments, a first line along the needle can represent the first surface line and a second line along the needle, which is offset from the first line, can represent the second surface line.

[0024] It can be provided in particular when the instrument is introduced along the preset puncture trajectory that the first laser line continues to be generated on the first object line, while the shadow point moves on the second surface line.

[0025] A significant advantage of the device according to the application is, inter alia, that it can assist the user or the electromechanical device in aligning both the first cut plane of the instrument and the second cut plane of the instrument in accordance with a preset alignment posture or puncture trajectory. This assistance can advantageously be ensured even if the second line laser, for example, cannot emit a second laser ray in a laser plane that coincides with the second cut plane of the instrument being aligned due to its forced positioning during the puncture process. This can occur, for example, if the line lasers are arranged on the X-ray detector or the housing of the X-ray source of the X-ray imaging system. It can thus be provided that, in a first position of the device or in a top view position of the X-ray imaging system, the line lasers can be arranged such that they produce a laser cross on the surface of the object and on the instrument, but that the progress of the instrument cannot be monitored in the process of the intrusion into the human body in this position.

[0026] In order to monitor the progress of the instrument it can be provided that the X-ray imaging system needs to be rotated into a progress display position and thus the device is forced to be rotated jointly into a second position. In the second position it can accordingly occur that the instrument can only still be aligned with respect to the first cut plane by means of the first line laser, while the second line laser can no longer provide assistance information for aligning the instrument with respect to the second cut plane without producing a shadow line.

[0027] The instrument itself can be aligned with respect to the second cut plane in the second position of the device, in particular with the aid of the point-like shielding element according to the application, so that the handling of the instrument is greatly simplified and the puncture can be performed in a more targeted manner.

[0028] A further advantage is that existing devices that do not have such a shielding element according to the application can be retrofitted with the shielding element with minimal changes and at low cost, in the process also generating a high additional benefit. Advantageously, the shielding element also does not limit other functions of the device, in particular not in the top view position, so that no negative side effects occur as a result of the shielding element.

[0029] It can be provided that the instrument must be aligned manually, in particular by hand, by the user or by means of an alignment or guide device for the instrument, in which case the user is assisted in aligning the instrument by the laser-based device.

[0030] In particular, the instrument needs to be aligned in accordance with a puncture trajectory that is planned before the puncture, along which the instrument should be introduced into the object through the surface of the object.

[0031] Puncturing can be understood in particular as introducing a pointed instrument or a pointed part of an instrument into an object through the surface of the object. In connection therewith, puncturing is not necessarily limited to medical puncturing, but can also be applied to the mechanical processing of an object.

[0032] In medical puncturing it can be provided that a medical needle, a cannula, a trocar or a similar instrument is inserted into a human or animal body, in particular percutaneously, in order to inject a liquid, for example, or to remove a body fluid in a targeted manner.

[0033] The instrument can accordingly be a medical instrument, such as a medical needle, a cannula, a trocar, a drill or a similar instrument, the object surface is the skin and the object is the body. In the broadest sense, the instrument can be a technical instrument such as a drill, a screwdriver, a chisel or the like which is suitable for puncturing.

[0034] The instrument can in particular have three virtual cut planes, similar to the main planes of the human body. The three cut planes can in particular each be orthogonal to one another and intersect at a common intersection point, in particular the center of the instrument. The first and second cut planes can in particular extend in the direction of the longitudinal axis of the instrument, for example of the needle. The first and second cut planes can in particular intersect on the longitudinal axis. The longitudinal axis can in particular extend through the center of the needle of the instrument needle.

[0035] The first and / or second surface line can in particular be visible on the instrument, for example in the form of an indentation line or as a line marked with color. Likewise, the first and / or second surface line can already be provisionally set by the instrument, for example if the instrument is a medical needle or a handle.

[0036] The device can in particular additionally be used in a medical intervention, for example in a percutaneous vertebroplasty, with the aid of an X-ray imaging system.

[0037] A line laser can be understood as a laser having special optics by means of which a laser line can be produced on a surface instead of a laser point as with a laser pointer. To this end, the line laser can emit laser rays in a fan-like manner into a laser plane, which produce the line when impinging on the surface. The laser plane can in particular be understood as the plane formed by the vectors of the laser beams of the laser rays.

[0038] The two laser planes intersect in particular in a laser intersection line. It can in particular be provided at least approximately that the laser intersection line intersects the intersection line of the first and second cut planes of the aligned instrument.

[0039] The line laser is in particular designed to emit the laser rays continuously in time. Thus, the laser rays are emitted in particular also when the instrument is not yet aligned or is only partially aligned. In particular, the first laser line can be displayed obliquely or away from the first surface line if the instrument is not correctly aligned with respect to the first cut plane, or the shadow point can be displayed away from the second surface line if the instrument is not correctly aligned with respect to the second cut plane.

[0040] The line laser can be adjusted and / or calibrated accordingly for the individual puncture, so that the line laser can be used for assistance when the instrument is correctly aligned along the puncture trajectory.

[0041] The device can in particular be set up in the first position for indicating the puncture point on the object surface by the intersection of the laser lines and can also be able to align the instrument relative to the first and second cut planes without a shielding element.

[0042] In the second position of the device, the second laser plane of the second line laser can no longer be adjusted into the second cut plane of the aligned instrument due to the position. Rather it can be provided that the second laser plane can be transverse to the aligned second cut plane, for example at right angles to one another, or at an angle of 30 to 150 degrees to one another.

[0043] The shielding element is preferably arranged directly at the exit point or in the exit area of the second line laser. "Point-like" can in particular be understood in that the shielding element can represent a point in the second laser plane, or the shielding element intersects the second laser plane at a point.

[0044] The shielding element is in particular set up for shielding the second laser radiation at a point. From this, the point creates a shadow line in the second laser plane, which extends linearly within the second laser plane. It can be preset due to technical or optical reasons that the shadow line opens slightly fan-shaped during the extension.

[0045] The shadow point can in particular be understood on the instrument as a hidden point or hidden area of the second laser line. Thus, the second laser line can be perceived visually on the instrument, in particular by turning the instrument around the second turning axis, while the shadow point can be perceived as a hidden area between two partial lines of the second laser line.

[0046] It can be provided in particular that the shadow line of the second laser plane intersects the first laser plane at an intersection point, wherein the intersection point can correspond at least approximately to a point on the intersection line of the first and second cut planes.

[0047] At least one embodiment provides that the shielding element is an adjustable shielding element. The shielding element can accordingly be provided with adjustment means, which can be adjusted automatically, in particular according to a preset or planned puncture trajectory. The shielding element can advantageously be adjusted, in particular adjusted and calibrated, for each individual puncture intervention. The geometry of the physical shielding element can be changed, for example, by the adjustment means.

[0048] The shielding element can also correspond to the color shade of a photochromic glass or the darkness of an electrochromic glass, which is penetrated by the second laser ray. The shielding element can be adjusted, in particular, by applying a voltage to the electrochromic glass. Furthermore, the shielding element can also be technically implemented by means of a liquid crystal element.

[0049] At least one embodiment provides that the second line laser has imaging optics, which are designed to sharpen the profile of the shadow point. By means of the sharpened shadow point, the instrument can advantageously be aligned more precisely around the second flipping axis. In particular, the end of the partial line of the second laser line, which defines the shadow point, can be sharpened by means of the imaging optics. The imaging optics are preferably designed to guide the ends of the partial lines as close to one another as possible, but to be visually perceptible at a distance from one another, thus making the shadow point as small as possible.

[0050] The imaging optics can in particular have various lenses and diaphragms, which can preferably be adjustable and in particular focusable.

[0051] At least one embodiment provides that the shielding element is a filament, which intersects the second laser plane at one point. By means of the filament, the shielding element can be particularly easily and cost-effectively implemented or retrofitted to an existing device that does not have a shielding element.

[0052] The filament can in particular be understood as a line, a fiber, a cord, a filament, etc. The filament is preferably linear. The filament can in particular extend substantially orthogonally to the second laser plane or at least at an intersection angle of 60 to 120 degrees.

[0053] At least one embodiment provides that the laser-based alignment aid has a housing, in which the first line laser and the second line laser are arranged spaced apart from one another. By means of the common housing, the positions of the two line lasers relative to one another can advantageously be precisely preset. By means of the fixed positions of the two line lasers relative to one another, a common laser coordinate system can advantageously be used to adjust the line lasers. Furthermore, the housing can be aligned in space by definition, so that the two line lasers can also be aligned by definition, whereby their adjustment or calibration can be simplified.

[0054] At least one embodiment provides that the housing has a main extension plane, wherein the first line laser is designed on a longitudinal side of the main extension plane and the second line laser is designed on a transverse side of the main extension plane. The line lasers are in particular arranged on the edges of the main extension plane. The housing can thereby preferably also be used for other purposes, in particular for arranging an X-ray detector or an X-ray source, wherein the main extension plane can correspond to a detector face.

[0055] At least one embodiment provides that the first line laser is designed to generate a first laser ray in a first laser plane which extends substantially perpendicular to the main extension plane, and the second line laser is designed to generate a second laser ray in a second laser plane which extends substantially perpendicular to the main extension plane and perpendicular to the first laser plane. The laser planes can in particular each be parallel to an orthogonal line of the main extension plane, and for example parallel to a central projection beam of the X-ray detector. In this way, laser planes arranged in this way can advantageously be used to assist the alignment of the instrument.

[0056] At least one embodiment provides that the laser-based alignment assistance device has a positioning apparatus on which the housing is arranged. The housing can in particular be connected to the rotating apparatus in a fixed or itself rotatable manner. The housing can in particular be positioned by the positioning apparatus. The positioning apparatus can be supported in such a way that the housing is positioned along a path, for example along a circular path.

[0057] The rotating apparatus is preferably provided for positioning the housing in at least one first position and a second position relative to the object, for example along a circular path around the object. For example, the first position and the second position can be substantially 90 degrees apart in a circular angle on the circular path, or in the range of 60 degrees to 120 degrees apart from one another.

[0058] In the first position, the first line laser and the second line laser are preferably provided in such a way that the first laser line and the second laser line intersect at a puncture entry point on the surface of the object. Thereby, the user can be assisted by the device to position the instrument on the puncture entry point. Additionally, the instrument can also be correctly aligned by means of the intersecting lines.

[0059] However, the first position can not be suitable for the puncture intervention, in particular because in this position the X-ray imaging system cannot be positioned in the progress display position to track the progress of the instrument within the object.

[0060] In the second position in which the X-ray imaging system can be in the progress display position, the first line laser is provided for generating the first laser line on the first surface line on the instrument positioned at the puncture entry point when the first cut plane coincides with the first laser plane. Likewise, the second line laser is provided in the second position for mapping the shadow point on the second surface line of the instrument positioned at the puncture entry point when the first cut plane and the second cut plane are aligned.

[0061] In this way, the device can assist the user in correctly aligning the instrument according to the preset puncture trajectory in at least two positions.

[0062] Another aspect of the application relates to a laser-based alignment assistance system for assisting the alignment of an instrument for puncturing an object.

[0063] The laser-based alignment aid system comprises a laser-based alignment aid device according to the application and a device having a marking along a second surface line, wherein the second cut plane is aligned in the case that the shadow point is mapped on the marked second line.

[0064] In other words, a marking is provided on the device, which allows the user to visually identify the second surface line. Especially in the case of complex devices, which do not produce the surface line according to the geometry of the device itself, such a marking or marked second surface line can advantageously assist the user in turning the device so that the shadow point is mapped on the second surface line and thus the device is correctly aligned.

[0065] Especially in the case of narrow devices, the marking is preferably located on the second surface line.

[0066] For example, the marking can be a colored marking and / or an indentation or protruding strip on the surface of the device.

[0067] The first surface line can also be marked, especially if it has not yet been produced according to the geometry of the device.

[0068] The system according to the application can advantageously ensure that the user of the device can be assisted in correctly aligning the first cut plane of the device and the second cut plane of the device according to the preset puncture trajectory during the puncture, especially in the course display position of the X-ray detector or the second position of the alignment aid device. The user can especially visually perceive when the device is correctly aligned, which is additionally ensured by the marking. In particular, the device is correctly aligned if the first laser line is produced on the first surface line and the shadow point is mapped on the marked second surface line. This can be visually monitored by the user in order to ensure that the device is aligned according to the planned puncture trajectory.

[0069] At least one embodiment of the alignment aid system provides that the device comprises a handle having a marking for the second surface line. The handle can be particularly suitable for applying the marking, since the handle can have a certain size. Especially a needle for the puncture can be arranged on the handle, wherein, for example, the user can hold the handle in order to introduce the needle into the object.

[0070] At least one embodiment of the alignment aid system provides that the marking is arranged offset with respect to the second surface line depending on the thickness of the device. The marking can especially extend parallel along the second surface line. Thereby, the angle of incidence of the second laser ray on the device can advantageously be taken into account.

[0071] A further aspect of the application relates to an X-ray imaging system having at least an X-ray source and an X-ray detector, and a laser-based alignment aid according to the application or a laser-based alignment aid system according to the application.

[0072] At least one embodiment of the X-ray imaging system provides that the first line laser and the second line laser are arranged on a housing of the X-ray detector or on a housing of the X-ray source. Thus, the positioning of the line lasers relative to the X-ray detector or relative to the X-ray source can be preset in particular fixedly. Thus, in particular by means of the common housing of the line lasers with the detector or with the X-ray source, the X-ray coordinate system of the X-ray detector can be coupled with the laser coordinate system of the line lasers in a particularly simple manner. The line lasers can thereby be adjusted in a simplified manner in accordance with a planned trajectory within the X-ray image of the X-ray detector.

[0073] The first position of the alignment aid is coupled directly with the overhead position of the X-ray imaging system and the second position of the alignment aid is coupled directly with the progress display position of the X-ray imaging system in particular by means of the common housing.

[0074] At least one embodiment of the X-ray imaging system provides that the first line laser is designed to generate a first laser ray in a first laser plane which extends substantially parallel to a projection direction of the X-ray imaging system, and the second line laser is designed to generate a second laser ray in a second laser plane which extends substantially parallel to the projection direction and perpendicular to the first laser plane.

[0075] At least one embodiment of the X-ray imaging system provides that the X-ray imaging system has a rotatable C-arm as a positioning device. The C-arm is provided for rotating the X-ray source and the X-ray detector relative to the object into at least one overhead position and a progress display position.

[0076] In the overhead position, the first line laser and the second line laser are arranged such that the first laser line and the second laser line intersect at a puncture entry point on the surface of the object, and

[0077] In the progress display position, the first line laser is arranged to generate the first laser line on a first surface line on the instrument positioned at the puncture entry point when the first cut plane coincides with the first laser plane, and the second line laser is arranged to map a shadow point on a second surface line of the instrument positioned at the puncture entry point when the first cut plane and the second cut plane are aligned.

[0078] Regardless of the grammatical gender of specific terms, all people with a gender identity of male or female are included. BRIEF DESCRIPTION OF DRAWINGS

[0079] Embodiments of the application are described below. In the drawings:

[0080] Figure 1 A schematic view showing an embodiment of an X-ray imaging system according to the application in a top view position;

[0081] Figure 2 A schematic view showing a detector image as seen from a top view position;

[0082] Figure 3 A schematic view showing an embodiment of an X-ray detector with a laser-based alignment aid according to the application in a first position;

[0083] Figure 4 A schematic view showing an embodiment of an X-ray imaging system according to the application in a progress display position;

[0084] Figure 5 A schematic view showing a detector image as seen from a progress display position;

[0085] Figure 6 A schematic view showing a laser-based alignment aid according to the application in a second position;

[0086] Figure 7 A schematic view showing a laser-based alignment aid according to the application in a second position with a medical needle;

[0087] Figure 8 A magnified schematic view showing a medical needle;

[0088] Figure 9 A schematic view showing a laser-based alignment aid according to the application in a second position;

[0089] Figure 10 A first schematic view showing an instrument with a marker;

[0090] Figure 11 A second schematic view showing an instrument with a marker;

[0091] Figure 12 A schematic view showing a second line laser with a shielding element. DETAILED DESCRIPTION

[0092] In Figure 1A schematic view of an embodiment of an X-ray imaging system 4 according to the application in a top view position P11 is shown. In the example shown, the X-ray imaging system 4 has an X-ray source 31 and an X-ray detector 32, with which the X-ray imaging system can generate a detector image 36 of an object 3, here a patient 34. For this purpose, the patient 34 can lie on a patient bed 35 of the system 4. The X-ray imaging system 4 can, for example, provide imaging assistance during a puncture of the patient 34, for example during a percutaneous vertebroplasty. In this case, the instrument 2 can be designed as a medical instrument 2, for example a medical needle. However, the progress of the instrument 2 in the patient's body cannot be displayed in the top view position P11, in particular the penetration depth of the instrument 2 in the patient 34 cannot be displayed, see Figure 2 At this point, the X-ray imaging system 4 cannot advantageously be used during a medical intervention in the top view position P11.

[0093] The detector can in particular be supported on a positioning device 25 designed as a rotatable C-arm 33, which is designed to rotate the X-ray source 31 and the X-ray detector 32 relative to the object 3, for example from the top view position P11 to the progress display position P22 (see Figure 4 ). For this purpose, the C-arm 33 can be supported by a rotary bearing 40.

[0094] The housing 21 of the X-ray detector 32 can in particular serve as a common housing 21 for the X-ray detector 32 and the laser-based alignment aid device 1. The device 1 can in particular have a first line laser 5 and a second line laser 6, which can be arranged on the housing 21 separately from one another.

[0095] In the top view position P11, the device 1 can in particular be aligned in a first position P1, since the first position can be coupled to the position of the X-ray imaging system 4 by the common housing 21.

[0096] Figure 2 A schematic view of a detector image 36 of the object 3, for example the patient 34, is shown as viewed from the top view position P11. Here, in particular the vertebra 37 and the instrument 2, which can have a handle 30, can be seen. Although the positioning of the instrument 2 in the detector plane can be achieved from the top view position P11, the penetration depth of the instrument 2 cannot be identified, which is meaningful for the intervention of a user, for example a treating physician.

[0097] In Figure 3A schematic diagram of one embodiment of an X-ray detector 32 with a laser-based alignment aid 1 according to the application for assisting the alignment of an instrument 2 for puncturing in a first position Pl is shown in Fig. 1. In the present example, a first line laser 5 is arranged on a longitudinal side 23 of a main extension plane 22 and a second line laser 6 is arranged on a transverse side 24 of the main extension plane 22, thus they are supported outside the detector plane and do not interfere with the detector image.

[0098] The first line laser 5 can be designed to generate a first laser ray in a first laser plane 7, which can extend substantially perpendicular to the main extension plane 22 of the housing 21, which can correspond, inter alia, to the detector plane of the X-ray detector 32. The second line laser 6 can be designed to generate a second laser ray in a second laser plane 8, which can extend substantially perpendicular to the main extension plane 22 and perpendicular to the first laser plane 7. Upon impingement of the laser rays on a surface of the object 3, for example an object surface 27, the first line laser 5 can generate a first laser line 14 and the second line laser 6 can generate a second laser line 15.

[0099] The first line laser 5 and the second line laser 6 can be correspondingly adjusted and configured in the first position Pl such that the first laser line 14 and the second laser line 15 intersect in the puncture entry point 26 on the object surface 27.

[0100] Figure 4 A schematic diagram of one embodiment of an X-ray imaging system 4 according to the application in a progress display position P22 is shown in Fig. 2. In particular, the X-ray source 31 and the X-ray detector 32 can be jointly rotated with the device 1 by a C-arm 33 (not shown) from the overhead position Pl l by about 90 degrees and into the progress display position P22.

[0101] Such a progress display position P22 can be particularly advantageous for the user, since he can recognize the penetration depth of the instrument 2 into the patient 34 on the detector image 36 (see Fig. 2) and thus the system 4 is mainly used in the progress display position P22 during an intervention. Figure 5

[0102] In the progress display position P22, the laser-based alignment aid 1 coupled to the position of the system 4 is in a second position P2, which can be offset by about 90 degrees from the first position Pl.

[0103] In the progress display position P22, the laser-based alignment aid 1 coupled to the position of the system 4 is in a second position P2, which can be offset by about 90 degrees from the first position Pl. Figure 5 ​A schematic representation of the probe image 36 as seen from the process display position P22 is shown. Here, the depth of the instrument 2, for example a medical needle, into the object 3, for example a vertebra of a patient, can advantageously be displayed to the treating physician. Disadvantageously, however, the inclination of the instrument 2 to or from the plane of the probe can not be recognized in this probe image 36. In the second position P2, this is also not very well recognized by the alignment aid according to the prior art.

[0104] Figure 6 A schematic representation of the laser-based alignment aid 1 according to the application in the second position P2 is shown. Here, it can be provided that the first line laser 5 is configured and adjusted in such a way that it generates a first laser ray in a first laser plane 7, which coincides with a virtual first cut plane 11 of the instrument 2 (not shown), which is correctly aligned according to the planned puncture trajectory.

[0105] According to the arrangement of the second line laser 6 as illustrated and described, the second line laser cannot be adjusted in such a way that the second laser plane 8 coincides with a virtual second cut plane 12 of the instrument 2, which is correctly aligned according to the planned puncture trajectory. The second laser plane 8 can in particular be approximately at right angles to the second cut plane 12, so that, without further aids, the instrument 2 cannot be aligned with respect to the second cut plane 12.

[0106] In order to solve this problem, a point-like shielding element 16 of the second line laser 6 can be provided, which generates a shadow line 17 in the second laser plane 8. The second line laser 6 can now be configured and adjusted in such a way that the shadow line 17 at least approximately intersects a virtual intersection line 41 of the first cut plane 11 and the second cut plane 12. In connection therewith, "approximately" can be understood in such a way that, depending on the thickness of the instrument 2, the shadow line 17 can extend slightly alongside the intersection line 41, so that the instrument 2 can be correctly aligned.

[0107] The shielding element 16 is preferably an adjustable shielding element 16, which can be adjusted depending on the puncture trajectory and the thickness of the instrument 2, preferably automatically by means of adjustment devices and corresponding software.

[0108] In the present example, the shielding element 16 can be a filament 19, for example a thin metal wire, which "point-like" intersects the second laser plane 8 at a point 20.

[0109] In particular, the second line laser 6 can have imaging optics (not shown), which are provided for sharpening the profile of the shadow line 17.

[0110] For the sake of completeness, Figure 6 and Figure 7 andFigure 8 A third cut plane 13 of the instrument 2 is also shown.

[0111] In Figure 7 A schematic diagram of a laser-based alignment aid 1 according to the application in a second position P2 is shown in

[0112] The first line laser 5 can be configured to generate a first laser line 14 on a first surface line 9 of the instrument 2 in a first cut plane 11 of the instrument 2 when the first cut plane 11 coincides with the first laser plane 7.

[0113] The second line laser 6 can be configured to display a shadow point 18 of a shadow line 17 on a second surface line 10 of the instrument 2 in a second cut plane 12 of the instrument 2 when the first cut plane 11 and the second cut plane 12 are correctly aligned according to the puncture trajectory.

[0114] Figure 8 To this end, an enlarged schematic diagram of the instrument 2 designed as a medical needle, in particular a section of the needle, is shown. The user can visually perceive when the first laser line 9 is displayed on the virtual first surface line 9, wherein the first surface line 9 can correspond to a partial area of a sheath of the needle. The virtual second surface line 10 can also correspond to a partial area of the sheath of the needle, but is offset from the first surface line 9. The second laser line 15 can also be mapped on the needle transversely to the longitudinal axis of the needle, wherein the shadow point 18 is located between a first partial line 38 and a second partial line 39 of the second laser line 15. In particular, the instrument 2 is also aligned in the second cut plane 12 when the instrument 2 is turned in such a way that the shadow point 18 is mapped on the second surface line 10.

[0115] However, it can be the case for thin needles or large shadow points 18, in particular when the shadow diameter of the shadow point 18 is greater than the diameter of the needle, that the second laser line 15 cannot be recognized in the aligned instrument 2. In this case, the needle is aligned if, for example, the second laser line 15 cannot be seen on the needle.

[0116] In Figure 9 A schematic diagram of a laser-based alignment aid system 28 according to the application in a second position P2 is shown in. Here, the instrument 2 of the system 28 has a marking 29 along the second surface line 10, wherein the second cut plane 12 is aligned when the shadow point 18 is mapped on the marking 29.

[0117] The instrument 2 can comprise a needle and a handle 30, wherein the handle 30 can have the marking 29. Depending on the thickness of the instrument 2 or the handle 30, the marking 29 can be arranged slightly offset with respect to the second surface line 10 in order to compensate for a gentle angle of incidence.

[0118] Figure 10 A first schematic view of an embodiment of the instrument 2 is shown, which has a marking 29, in particular on the second surface line 10. The instrument 2 has a handle 30 and a needle for puncturing. The instrument 2 is aligned on the puncture entry point 26 and in the cut plane 12, 13, on the instrument 2 it can be seen that a first laser line extends along the first surface line 9 and also on the object surface 27 of the object 3. It can also be seen that a first partial line 38 and a second partial line 39 of the second laser line 15, wherein the shadow point 18 on the marking 29 is located between the partial lines 38 and 39.

[0119] In Figure 11 a second schematic view of an embodiment of the instrument 2 with the marking 29 is shown from another angle.

[0120] Figure 12 A schematic view of the second line laser 6 with a shielding element 16 designed as a wire 19 is shown. In the present example, the second line laser 6 is arranged on a common housing 21 of the X-ray detector 32. The line laser 6 can be retrofitted with the shielding element 16 on such a housing 21 relatively easily.

Claims

1. Laser-based alignment aid for assisting the alignment of an instrument for puncturing an object, in particular for an X-ray imaging system, comprising: a first line laser for generating a first laser ray in a first laser plane, the first line laser being arranged to generate a first laser line on a first surface line of the instrument in a first cut plane of the instrument when the first cut plane coincides with the first laser plane; and a second line laser for generating a second laser ray in a second laser plane intersecting the first laser plane; a point-like shielding element of the second line laser for generating a shadow line in the second laser plane, wherein the second line laser is arranged to display a shadow point of the shadow line on a second surface line of the instrument in a second cut plane of the instrument when the first cut plane and the second cut plane are aligned. The shielding element is an adjustable shielding element.

2. The laser-based alignment aid of claim 1, wherein, The second line laser has imaging optics arranged to sharpen the profile of the shadow point.

3. The laser-based alignment aid of claim 1, wherein, The shielding element is a filament which intersects the second laser plane at one point.

4. The laser-based alignment aid of claim 1, wherein, 5. Laser-based alignment aid according to claim 1, further comprising: a housing, the first line laser and the second line laser being arranged on the housing spaced apart from each other. The housing has a main extension plane, 6. The laser-based alignment aid of claim 5, wherein, wherein the first line laser is positioned on a longitudinal side of the main extension plane and the second line laser is positioned on a transverse side of the main extension plane. The first line laser is arranged to generate the first laser ray in a first laser plane which extends essentially perpendicular to the main extension plane, and the second line laser is arranged to generate the second laser ray in a second laser plane which extends essentially perpendicular to the main extension plane and perpendicular to the first laser plane.

7. The laser-based alignment aid of claim 6, wherein, 8. Laser-based alignment aid according to claim 5, further comprising: a positioning device, the housing being arranged on the positioning device, wherein the positioning device is arranged to rotate the housing relative to the object at least into a first position and a second position, - wherein in the first position the first line laser and the second line laser are arranged such that the first laser line and a second laser line generated by the second line laser intersect at a puncture entry point on an object surface of the object, and - wherein in the second position the first line laser is arranged to generate the first laser line on the first surface line on the instrument positioned at the puncture entry point when the first cut plane coincides with the first laser plane, and the second line laser is arranged to display the shadow point on the second surface line of the instrument positioned at the puncture entry point when the first cut plane and the second cut plane are aligned.

9. Laser-based alignment aid system for assisting the alignment of an instrument for puncturing an object, comprising: a laser-based alignment aid for assisting the alignment of an instrument for puncturing an object, in particular for an X-ray imaging system, comprising: ​ a first line laser for generating a first laser radiation in a first laser plane, the first line laser being configured to generate a first laser line on a first surface line of the instrument in a first cut plane of the instrument when the first cut plane of the instrument coincides with the first laser plane; and a second line laser for generating a second laser radiation in a second laser plane intersecting the first laser plane; a point-like shielding element of the second line laser for generating a shadow line in the second laser plane, wherein the second line laser is configured to display a shadow point of the shadow line on a second surface line of the instrument in a second cut plane of the instrument when the first cut plane and the second cut plane of the instrument are aligned; and the instrument having a marking along the second surface line, wherein the second cut plane is aligned in the case that the shadow point is displayed on the marking.

10. The laser-based alignment aid system of claim 9, wherein, The instrument comprises a handle having the marking.

11. The laser-based alignment aid system of claim 9, wherein, The marking is arranged offset with respect to the second surface line depending on a thickness of the instrument.

12. An X-ray imaging system comprising an X-ray source; an X-ray detector; and a laser-based alignment aid for assisting an alignment of an instrument for puncturing an object, in particular for an X-ray imaging system, the laser-based alignment aid comprising a first line laser for generating a first laser radiation in a first laser plane, the first line laser being configured to generate a first laser line on a first surface line of the instrument in a first cut plane of the instrument when the first cut plane of the instrument coincides with the first laser plane; and a second line laser for generating a second laser radiation in a second laser plane intersecting the first laser plane; a point-like shielding element of the second line laser for generating a shadow line in the second laser plane, wherein the second line laser is configured to display a shadow point of the shadow line on a second surface line of the instrument in a second cut plane of the instrument when the first cut plane and the second cut plane of the instrument are aligned. The first line laser and the second line laser are arranged on a housing of the X-ray detector or on a housing of the X-ray source.

13. The x-ray imaging system of claim 12, wherein, The first line laser is configured to generate the first laser radiation in the first laser plane extending substantially parallel to a projection direction of the X-ray imaging system, and 14. The x-ray imaging system of claim 13, wherein, wherein the second line laser is configured to generate the second laser radiation in the second laser plane extending substantially parallel to the projection direction and perpendicular to the first laser plane.

15. The X-ray imaging system of claim 14, further comprising a rotatable C-arm as a positioning device, the X-ray source and the X-ray detector being arranged on the C-arm, the C-arm being configured to rotate the X-ray source and the X-ray detector relative to the object at least into a top view position and a progress display position, wherein wherein in the top view position the first line laser and the second line laser are configured such that the first laser line and the second laser line generated by the second line laser intersect at a puncture entry point on an object surface of the object, and wherein in the progress display position the first line laser and the second line laser are configured such that the first laser line and the second laser line generated by the second line laser intersect at a puncture exit point on the object surface of the object. wherein, in the process display position, the first line laser is arranged to generate a first laser line on a first surface line on the instrument positioned at the puncture entry point when the first cut plane coincides with the first laser plane, and the second line laser is arranged to display a shadow point on a second surface line of the instrument positioned at the puncture entry point when the first cut plane and the second cut plane are aligned.

Images