Intelligent control method and system for MCU burning

Abstract

The invention is suitable for the technical field of MCU burning intelligent control, and provides an MCU burning intelligent control method and system.The method comprises the steps that when a firmware burning device burns a target MCU, if accidental output voltage abnormal early warning is detected, the target MCU is started; and recording the actually measured output voltage value, the current burning mode, the current burning duration and the current category of the target MCU. The output voltage of the firmware burning device is collected in real time, the first average output voltage value and the second average output voltage value extracted from historical successful and failed burning records are combined, two changing curves are generated through time sequence analysis, and then the arithmetic mean value of the absolute value of the average slope of the two curves is calculated to serve as a correction factor. And carrying out reverse correction on the actually measured output voltage. The corrected output voltage value can truly reflect the deviation generated by the performance degradation of the equipment, so that the corrected output voltage value can be accurately compared with the preset threshold value to judge whether the burning operation is continued or interrupted.

Description

Technical Field

[0001] The present invention belongs to the technical field of MCU burning intelligent control, and in particular relates to an MCU burning intelligent control method and system. Background Art

[0002] With the widespread adoption of MCUs in embedded systems, firmware programming has become a critical process for ensuring proper system operation. Existing firmware programming devices typically detect output voltage values in real time and compare them directly with preset thresholds to determine whether to interrupt the programming operation. However, this method relies solely on measured output voltage values without any optimization, failing to fully reflect voltage deviations caused by device performance degradation or environmental fluctuations, potentially leading to misjudgments or missed detections.

[0003] Currently, traditional programming methods primarily focus on simply comparing real-time voltage data with thresholds during monitoring, neglecting the dynamic optimization of the measured output voltage itself. Because firmware programming devices experience performance degradation over time, the output voltage exhibits a certain degree of natural decay or abnormal fluctuations. These deviations, when used without correction, can lead to the system incorrectly interrupting the programming operation when occasional abnormality warnings occur, impacting production efficiency and product consistency. These technical flaws not only affect the continuity of programming operations but can also increase rework rates and maintenance costs, hindering the stability and reliability of mass production. Summary of the Invention

[0004] The purpose of the present invention is to provide an MCU burning intelligent control method and system, aiming to solve the problems raised in the background technology.

[0005] The present invention is implemented as follows: a method for intelligent control of MCU burning, the method comprising: When the firmware burning device is burning the target MCU, if an occasional output voltage abnormality warning is detected, the measured output voltage value, the current burning mode, the current burning duration, and the current type of the target MCU are recorded, and the historical successful burning records and historical failed burning records of the firmware burning device are obtained; Filter out several secondary successful burning records and several secondary failed burning records from the historical successful burning records and the historical failed burning records, which are consistent with the current category and the current burning mode, meet the preset quantity requirements, and have the same time interval between adjacent burning records; Calculating a first average output voltage value and a second average output voltage value of the firmware burning device in each secondary successful burning record and secondary failed burning record during the burning process within a predetermined time window corresponding to the current burning duration; analyzing whether the dynamic trends of the plurality of first average output voltage values and the plurality of second average output voltage values are consistent with a predetermined rule, and if so, correcting the measured output voltage values according to the dynamic trends; The corrected output voltage value is compared with the preset output voltage threshold corresponding to the sporadic output voltage abnormality warning, and it is determined whether to interrupt the firmware burning device to burn the target MCU.

[0006] As a further limitation of the technical solution of the embodiment of the present invention, the step of calculating, in each secondary successful burning record and secondary failed burning record, the first average output voltage value and the second average output voltage value of the firmware burning device within a predetermined time window corresponding to the current burning duration during the burning process includes: Obtaining all output voltage values recorded by the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration in each secondary successful burning record and secondary failed burning record, and removing noise and extreme values from the values; An average operation is performed on the output voltage values in each secondary successful programming record or secondary failed programming record to obtain a first average output voltage value corresponding to each secondary successful programming record and a second average output voltage value corresponding to each secondary failed programming record.

[0007] As a further limitation of the technical solution of the embodiment of the present invention, the step of analyzing whether the dynamic trends of the plurality of first average output voltage values and the plurality of second average output voltage values are consistent with a predetermined rule, and if so, correcting the measured output voltage values according to the dynamic trends includes: plotting all first average output voltage values and second average output voltage values into curves along a timeline to form a first change curve and a second change curve, respectively; Observe the first change curve and the second change curve respectively. If the first change curve shows a continuous downward trend and the second change curve shows a continuous upward trend, and the difference in the absolute value of the average slope of the first change curve and the second change curve falls within a predetermined interval, then determine that the dynamic trends of the first average output voltage value and the second average output voltage value comply with the predetermined rule; The arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve is calculated, the mean is used as a correction factor for the measured output voltage value, and the measured output voltage value is corrected by the correction factor.

[0008] As a further limitation of the technical solution of the embodiment of the present invention, the steps of calculating the arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, using the average value as a correction factor for the measured output voltage value, and correcting the measured output voltage value using the correction factor include: Calculating an arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, and using the mean as a correction factor for the measured output voltage value; Retrieve the output voltage correction formula and correct the measured output voltage value in combination with the correction factor.

[0009] As a further limitation of the technical solution of the embodiment of the present invention, the calculation formula of the output voltage value correction formula is: , where V corr Refers to the output voltage value after correction, V meas Refers to the measured output voltage value, S1 refers to the average slope absolute value of the first change curve, S2 refers to the average slope absolute value of the second change curve, Refers to the correction factor, and K refers to the adjustment coefficient corresponding to the correction factor.

[0010] As a further limitation of the technical solution of the embodiment of the present invention, an MCU burning intelligent control system includes: a data acquisition module, a burning record screening module, an average value calculation module, a trend analysis module and a burning interrupt judgment module, wherein: A data acquisition module is used to record the measured output voltage value, the current programming mode, the current programming duration, and the current type of the target MCU when an occasional output voltage abnormality warning is detected when the firmware programming device is programming the target MCU, and to obtain the historical successful programming records and historical failed programming records of the firmware programming device; A burning record screening module is used to screen out, from historical successful burning records and historical failed burning records, several secondary successful burning records and several secondary failed burning records that are consistent with the current category and current burning mode and meet the preset quantity requirements and have the same time interval between adjacent burning records; an average value calculation module, configured to calculate, in each secondary successful burning record and secondary failed burning record, a first average output voltage value and a second average output voltage value of the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration; a trend analysis module for analyzing whether the dynamic trends of the first average output voltage values and the second average output voltage values are consistent with a predetermined rule, and if so, correcting the measured output voltage values according to the dynamic trends; The burning interrupt judgment module is used to compare the corrected output voltage value with the output voltage preset threshold corresponding to the occasional output voltage abnormality warning, and judge whether to interrupt the firmware burning device to burn the target MCU accordingly.

[0011] As a further limitation of the technical solution of the embodiment of the present invention, the average value calculation module specifically includes: an output voltage value acquisition unit, configured to acquire all output voltage values recorded by the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration in each secondary successful burning record and secondary failed burning record, and remove noise and extreme values from the values; The average output voltage value calculation unit is used to average the output voltage values in each secondary successful burning record or secondary failed burning record to obtain a first average output voltage value corresponding to each secondary successful burning record and a second average output voltage value corresponding to each secondary failed burning record.

[0012] As a further limitation of the technical solution of the embodiment of the present invention, the trend analysis module specifically includes: a curve drawing unit, configured to draw all the first average output voltage values and the second average output voltage values into curves according to a time line, to form a first change curve and a second change curve respectively; a dynamic trend analysis unit, configured to observe the first change curve and the second change curve respectively, and determine that the dynamic trends of the first average output voltage value and the second average output voltage value conform to a predetermined rule if the first change curve shows a continuous downward trend and the second change curve shows a continuous upward trend, and if the difference between the absolute values of the average slopes of the first change curve and the second change curve falls within a predetermined interval; The correction factor determination unit is used to calculate the arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, use the average as a correction factor for the measured output voltage value, and correct the measured output voltage value using the correction factor.

[0013] As a further limitation of the technical solution of the embodiment of the present invention, the correction factor determination unit specifically includes: a correction factor output subunit, configured to calculate an arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, and use the mean as a correction factor for the measured output voltage value; The measured voltage value correction subunit is used to call the output voltage value correction formula and correct the measured output voltage value in combination with the correction factor.

[0014] As a further limitation of the technical solution of the embodiment of the present invention, the calculation formula of the output voltage value correction formula is: , where V corr Refers to the output voltage value after correction, V meas Refers to the measured output voltage value, S1 refers to the average slope absolute value of the first change curve, S2 refers to the average slope absolute value of the second change curve, Refers to the correction factor, and K refers to the adjustment coefficient corresponding to the correction factor.

[0015] Compared with the prior art, the present invention has the following beneficial effects: The present invention collects the output voltage of a firmware burning device in real time, combines it with the first and second average output voltage values extracted from historical successful and failed burning records, and uses time series analysis to generate two variation curves. The arithmetic mean of the absolute values of the average slopes of the two curves is then calculated as a correction factor to perform a reverse correction on the measured output voltage. The corrected output voltage truly reflects the deviation caused by device performance degradation, allowing accurate comparison with a preset threshold to determine whether to continue or interrupt the burning operation.

[0016] For example, even if an initial sporadic abnormality warning occurs, if the corrected output voltage falls below the preset threshold, the abnormality is now within a safe range after dynamic correction, and the system will allow the programming process to continue. This technology breaks through the limitations of traditional fixed-threshold monitoring and implements intelligent control based on dynamic data feedback. This significantly improves the stability and reliability of the programming process, reduces the risk of misjudgment due to performance fluctuations, and brings significant economic benefits and broad application prospects to mass production. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 A flowchart of a method provided by an embodiment of the present invention; Figure 2 A flow chart of calculating the first average output voltage value and the second average output voltage value in the method provided in an embodiment of the present invention; Figure 3 A flowchart of comparing a first change curve and a second change curve in the method provided in an embodiment of the present invention; Figure 4 A flow chart of correcting the measured output voltage value in the method provided in an embodiment of the present invention; Figure 5 An application architecture diagram of the system provided by an embodiment of the present invention; Figure 6 This is a structural block diagram of an average value calculation module in a system provided by an embodiment of the present invention; Figure 7 A structural block diagram of a trend analysis module in a system provided by an embodiment of the present invention; Figure 8 This is a structural block diagram of a correction factor determination unit in a system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0018] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0019] Figure 1 A flow chart of a method provided by an embodiment of the present invention is shown.

[0020] Specifically, an MCU burning intelligent control method includes the following steps: Step S100, when the firmware burning device is burning the target MCU, if an occasional output voltage abnormality warning is detected, the measured output voltage value, the current burning mode, the current burning duration and the current type of the target MCU are recorded, and the historical successful burning records and historical failed burning records of the firmware burning device are obtained.

[0021] In an embodiment of the present invention, a firmware burning device writes program data to a target MCU by applying a predetermined voltage signal. During the burning process, the device continuously monitors its output voltage. When an occasional output voltage anomaly warning is detected, it indicates that the output voltage has temporarily exceeded a preset safety threshold. This anomaly may be caused by factors such as power supply fluctuations, device aging, or environmental interference. At this point, the system immediately records several key parameters, including the measured output voltage value (the actual output voltage value of the firmware burning device at the current moment, used to determine voltage stability during the burning process), the current burning mode (describing the operating mode currently used for the burning operation, such as high speed, low power consumption, or other specific modes), the current burning duration (indicating the time elapsed from the start of the burning process to the current moment, reflecting the stage of the burning process), and the current category of the target MCU (referring to the model or classification of the burned MCU, ensuring comparability of data during subsequent analysis).

[0022] At the same time, the system retrieves the history of successful and failed programming from the firmware programming device's memory. These records are archived from each previous programming operation and record the operating parameters, output voltage data, time information, and programming results involved in each programming process.

[0023] Historical successful and failed programming records should at least include the programming timestamp, programming mode used, MCU type, output voltage measurements at each stage, and the final result of the programming operation (success or failure). These detailed records provide the necessary data foundation for subsequent screening of secondary records consistent with current operating conditions and for voltage dynamic trend analysis.

[0024] Furthermore, the MCU burning intelligent control method further includes the following steps: Step S200 , selecting from the historical successful programming records and historical failed programming records several secondary successful programming records and several secondary failed programming records that are consistent with the current category and current programming mode and meet a preset quantity requirement and have consistent time intervals between adjacent programming records.

[0025] In this embodiment of the present invention, historical successful and failed programming records are filtered to select those that match the target MCU type and current programming mode. This ensures that the collected data is comparable with current operating conditions, eliminating data discrepancies caused by different models or modes. Furthermore, a preset number of consistent time intervals between adjacent programming records is required. This ensures that the selected records reflect true dynamic trends under stable operating conditions and provides sufficient sample size and uniformity for subsequent statistical analysis and trend calculations.

[0026] The screening process can be implemented by using a database query or a programming algorithm to automatically extract the secondary success and secondary failure burning records that meet the conditions by matching and sorting the category, pattern and timestamp fields in the records.

[0027] The determination of the time interval and preset number is usually based on historical data analysis and experimental verification. The time interval should be selected as a relatively stable and representative time period in the burning process, and the preset number must be sufficient to ensure the reliability of the statistical results. It can usually be set based on empirical data or statistical significance analysis.

[0028] Furthermore, the MCU burning intelligent control method further includes the following steps: Step S300 , calculating a first average output voltage value and a second average output voltage value of the firmware burning device in each secondary successful burning record and secondary failed burning record during the burning process within a predetermined time window corresponding to the current burning duration.

[0029] Specifically, Figure 2 A flow chart for calculating the first average output voltage value and the second average output voltage value is shown.

[0030] The step of calculating the first average output voltage value and the second average output voltage value of the firmware burning device in each secondary successful burning record and secondary failed burning record during the burning process within a predetermined time window corresponding to the current burning duration specifically includes the following steps: Step S301, obtaining all output voltage values recorded by the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration in each secondary successful burning record and secondary failed burning record, and removing noise and extreme values from the values; Step S302 , performing an average operation on the output voltage values in each secondary successful programming record or secondary failed programming record to obtain a first average output voltage value corresponding to each secondary successful programming record and a second average output voltage value corresponding to each secondary failed programming record.

[0031] In this embodiment of the present invention, step S301 first obtains all output voltage values recorded by the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration (i.e., within a certain time period around the time when the burning time reaches the current burning duration) from each secondary successful burning record and secondary failed burning record. These output voltage values are then processed to remove noise and extreme values, thereby eliminating interference caused by transient fluctuations or abnormal data, ensuring that the data used in subsequent calculations is more reliable and representative.

[0032] Next, in step S302, the output voltage values after denoising and eliminating extreme values in each secondary successful burning record or secondary failed burning record are averaged to obtain a first average output voltage value corresponding to each secondary successful burning record and a second average output voltage value corresponding to each secondary failed burning record, respectively.

[0033] By calculating these average output voltage values, the typical output voltage levels of the firmware burning device in the case of successful burning operation and failed burning operation can be extracted respectively, thereby providing an accurate reference basis for subsequent dynamic trend analysis and voltage correction.

[0034] Furthermore, the MCU burning intelligent control method further includes the following steps: Step S400 , analyzing whether the dynamic trends of the first average output voltage values and the second average output voltage values are consistent with a predetermined rule. If so, correcting the measured output voltage values according to the dynamic trends.

[0035] Specifically, Figure 3 A flow chart comparing a first variation curve and a second variation curve is shown.

[0036] The step of analyzing whether the dynamic trends of the first average output voltage values and the second average output voltage values are consistent with a predetermined rule, and if so, correcting the measured output voltage values according to the dynamic trends specifically includes the following steps: Step S401, plotting all first average output voltage values and second average output voltage values into curves along a time line to form a first change curve and a second change curve respectively; Step S402: Observe the first change curve and the second change curve respectively. If the first change curve shows a continuous downward trend and the second change curve shows a continuous upward trend, and the difference in the absolute value of the average slope of the first change curve and the second change curve falls within a predetermined interval, then determine that the dynamic trends of the first average output voltage value and the second average output voltage value conform to a predetermined rule. Step S403 , calculating the arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, using the mean as a correction factor for the measured output voltage value, and correcting the measured output voltage value using the correction factor.

[0037] In an embodiment of the present invention, all first and second average output voltage values are first plotted in chronological order to form a first variation curve and a second variation curve, respectively. These curves are typically generated using sophisticated time series data analysis and curve fitting techniques (such as linear regression or polynomial fitting) to visually demonstrate the temporal variation trend of the output voltage.

[0038] Observing the dynamic changes of these two curves is of key significance: when the first change curve shows a continuous downward trend and the second change curve shows a continuous upward trend, this indirectly confirms that the performance of the firmware burning device has degraded during the burning process.

[0039] Specifically, this performance degradation will result in a natural decay of the output voltage during a successful programming operation (i.e., the amplified voltage drop during normal device aging), while a failed programming operation may cause an abnormal increase in the output voltage (i.e., an abnormal amplification of performance degradation). Furthermore, the requirement that the difference in the absolute values of the average slopes of the two curves fall within a predetermined range is a pre-set standard determined based on statistical analysis of historical data to ensure that the observed trend truly reflects the actual performance degradation of the device. Next, the arithmetic mean of the absolute values of the average slopes of the first and second variation curves is calculated and used as a correction factor for the measured output voltage.

[0040] This correction factor determination process enables the system to accurately quantify voltage deviations caused by performance degradation in firmware burning devices and adjust the measured output voltage accordingly based on the correction factor reflecting the degree of performance degradation. This approach enhances adaptability to device performance changes and provides more accurate and reliable data support for dynamic trend analysis and subsequent decision-making during the burning process.

[0041] Specifically, Figure 4 A flow chart for correcting the measured output voltage value is shown.

[0042] Calculating the arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, using the average value as a correction factor for the measured output voltage value, and correcting the measured output voltage value using the correction factor specifically includes the following steps: Step S4031, calculating the arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, and using the mean as a correction factor for the measured output voltage value; Step S4032: retrieve the output voltage correction formula and correct the measured output voltage value in combination with the correction factor.

[0043] The calculation formula of the output voltage value correction formula is: , where V corr Refers to the output voltage value after correction, V meas Refers to the measured output voltage value, S1 refers to the average slope absolute value of the first change curve, S2 refers to the average slope absolute value of the second change curve, Refers to the correction factor, and K refers to the adjustment coefficient corresponding to the correction factor.

[0044] In the embodiment of the present invention, a specific example is used to illustrate how to determine a correction factor according to the slope data of the first change curve and the second change curve, and use the correction factor to perform reverse correction on the measured output voltage value.

[0045] Suppose, during a programming process, while the firmware programming device is programming the target MCU, the system detects that the output voltage briefly exceeds a preset threshold, triggering an alert for an occasional output voltage anomaly. At this point, the system records the current measured output voltage, the current programming mode, the elapsed programming time, and the target MCU type, and retrieves all previous successful and failed programming records from the device's storage. Next, the system uses a filter to select from these historical records those that match the current MCU type and programming mode, ensuring that the number of selected records meets a preset standard and that the time intervals between these records are consistent to ensure data uniformity and comparability.

[0046] After obtaining these secondary success and failure programming records, the system collects all output voltage values recorded within a predetermined time window corresponding to the current programming duration (i.e., the time range before and after the programming time reaches the current moment) in each record and removes noise and outliers from these values. The system then averages these processed data to determine the first average output voltage value corresponding to each secondary success record and the second average output voltage value corresponding to each secondary failure record.

[0047] Next, the system plots all first and second average output voltage values in chronological order, forming a first variation curve and a second variation curve, respectively. Then, using existing time series analysis and curve fitting techniques (e.g., linear regression), the average slope of the two curves is calculated (taking their absolute values and performing the calculation). For example, if the absolute value of the average slope of the first variation curve is 0.5 and the absolute value of the average slope of the second variation curve is 0.7, the arithmetic mean of the two is (0.5 + 0.7) / 2 = 0.6, which serves as the correction factor for the measured output voltage.

[0048] The system then uses a pre-set output voltage correction formula and, combined with the obtained correction factor, performs a reverse adjustment on the measured output voltage. Specifically, the correction formula states that the corrected output voltage equals the measured output voltage multiplied by (1 minus the product of the adjustment factor K and the correction factor). For example, if the measured output voltage is 5.0 volts and the adjustment factor K is set to 0.1, then when the correction factor is 0.6, 1 minus 0.1 × 0.6 equals 0.94, so the corrected output voltage is 5.0 volts × 0.94, or 4.7 volts.

[0049] Furthermore, the MCU burning intelligent control method further includes the following steps: Step S500 : comparing the corrected output voltage value with a preset output voltage threshold corresponding to an occasional output voltage abnormality warning, and determining whether to interrupt the firmware burning device from burning the target MCU.

[0050] In an embodiment of the present invention, the firmware burning device compares the output voltage value obtained through data processing and correction with a preset output voltage threshold corresponding to an incidental output voltage anomaly warning. This preset threshold represents the upper voltage limit that could cause serious burning failure or device damage during the burning process. If the corrected output voltage value exceeds this threshold, the system will determine that a significant voltage anomaly exists and automatically interrupt the firmware burning device's burning operation on the target MCU to prevent further potential risks. Conversely, if the corrected output voltage value is within a safe range, the burning process will continue.

[0051] Further, Figure 5 The application architecture diagram of the system provided by the embodiment of the present invention is shown.

[0052] Among them, in another preferred embodiment provided by the present invention, an MCU burning intelligent control system includes: The data acquisition module 100 is used to record the measured output voltage value, the current burning mode, the current burning duration and the current type of the target MCU if an occasional output voltage abnormality warning is detected when the firmware burning device is burning the target MCU, and at the same time obtain the historical successful burning records and historical failed burning records of the firmware burning device.

[0053] In an embodiment of the present invention, a firmware burning device writes program data to a target MCU by applying a predetermined voltage signal. During the burning process, the device continuously monitors its output voltage. When an occasional output voltage anomaly warning is detected, it indicates that the output voltage has temporarily exceeded a preset safety threshold. This anomaly may be caused by factors such as power supply fluctuations, device aging, or environmental interference. At this point, the system immediately records several key parameters, including the measured output voltage value (the actual output voltage value of the firmware burning device at the current moment, used to determine voltage stability during the burning process), the current burning mode (describing the operating mode currently used for the burning operation, such as high speed, low power consumption, or other specific modes), the current burning duration (indicating the time elapsed from the start of the burning process to the current moment, reflecting the stage of the burning process), and the current category of the target MCU (referring to the model or classification of the burned MCU, ensuring comparability of data during subsequent analysis).

[0054] At the same time, the system retrieves the history of successful and failed programming from the firmware programming device's memory. These records are archived from each previous programming operation and record the operating parameters, output voltage data, time information, and programming results involved in each programming process.

[0055] Historical successful and failed programming records should at least include the programming timestamp, programming mode used, MCU type, output voltage measurements at each stage, and the final result of the programming operation (success or failure). These detailed records provide the necessary data foundation for subsequent screening of secondary records consistent with current operating conditions and for voltage dynamic trend analysis.

[0056] Furthermore, the MCU burning intelligent control system also includes: The burning record screening module 200 is used to screen out several secondary successful burning records and several secondary failed burning records from the historical successful burning records and historical failed burning records, which are consistent with the current category and current burning mode and meet the preset quantity requirements and have the same time interval between adjacent burning records.

[0057] In this embodiment of the present invention, historical successful and failed programming records are filtered to select those that match the target MCU type and current programming mode. This ensures that the collected data is comparable with current operating conditions, eliminating data discrepancies caused by different models or modes. Furthermore, a preset number of consistent time intervals between adjacent programming records is required. This ensures that the selected records reflect true dynamic trends under stable operating conditions and provides sufficient sample size and uniformity for subsequent statistical analysis and trend calculations.

[0058] The screening process can be implemented by using a database query or a programming algorithm to automatically extract the secondary success and secondary failure burning records that meet the conditions by matching and sorting the category, pattern and timestamp fields in the records.

[0059] The determination of the time interval and preset number is usually based on historical data analysis and experimental verification. The time interval should be selected as a relatively stable and representative time period in the burning process, and the preset number must be sufficient to ensure the reliability of the statistical results. It can usually be set based on empirical data or statistical significance analysis.

[0060] Furthermore, the MCU burning intelligent control system also includes: The average value calculation module 300 is used to calculate the first average output voltage value and the second average output voltage value of the firmware burning device in each secondary successful burning record and secondary failed burning record during the burning process within a predetermined time window corresponding to the current burning duration.

[0061] Specifically, Figure 6 FIG. 3 is a structural block diagram of the average value calculation module 300 in the system provided by an embodiment of the present invention.

[0062] In a preferred embodiment of the present invention, the average value calculation module 300 specifically includes: The output voltage value acquisition unit 301 is used to obtain all output voltage values recorded by the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration in each secondary successful burning record and secondary failed burning record, and remove noise and extreme values from the values; The average output voltage value calculation unit 302 is used to average the output voltage values in each secondary successful programming record or secondary failed programming record to obtain a first average output voltage value corresponding to each secondary successful programming record and a second average output voltage value corresponding to each secondary failed programming record.

[0063] In this embodiment of the present invention, the output voltage value acquisition unit 301 first obtains all output voltage values recorded by the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration (i.e., within a certain time period around the time when the burning time reaches the current burning duration) from each secondary successful burning record and secondary failed burning record, and performs noise and extreme value removal processing on these output voltage values to eliminate interference caused by transient fluctuations or abnormal data, thereby ensuring that the data used in subsequent calculations has higher reliability and representativeness.

[0064] Next, the average output voltage value calculation unit 302 performs an average operation on the output voltage values after denoising and eliminating extreme values in each secondary successful burning record or secondary failed burning record, thereby obtaining a first average output voltage value corresponding to each secondary successful burning record and a second average output voltage value corresponding to each secondary failed burning record, respectively.

[0065] By calculating these average output voltage values, the typical output voltage levels of the firmware burning device in the case of successful burning operation and failed burning operation can be extracted respectively, thereby providing an accurate reference basis for subsequent dynamic trend analysis and voltage correction.

[0066] Furthermore, the MCU burning intelligent control system also includes: The trend analysis module 400 is used to analyze whether the dynamic trends of the first average output voltage values and the second average output voltage values are consistent with a predetermined rule, and if so, to correct the measured output voltage values according to the dynamic trends.

[0067] Specifically, Figure 7 FIG. 4 is a block diagram showing a structure of a trend analysis module 400 in a system provided by an embodiment of the present invention.

[0068] In a preferred embodiment of the present invention, the trend analysis module 400 specifically includes: A curve drawing unit 401 is configured to draw all first average output voltage values and second average output voltage values into curves according to a time line, forming a first change curve and a second change curve respectively; a dynamic trend analysis unit 402 for observing the first change curve and the second change curve respectively, and determining that the dynamic trends of the first average output voltage value and the second average output voltage value conform to a predetermined rule if the first change curve shows a continuous downward trend and the second change curve shows a continuous upward trend, and if the difference in the absolute value of the average slope of the first change curve and the second change curve falls within a predetermined interval; The correction factor determination unit 403 is configured to calculate the arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, use the mean as a correction factor for the measured output voltage value, and correct the measured output voltage value using the correction factor.

[0069] In an embodiment of the present invention, all first and second average output voltage values are first plotted in chronological order to form a first variation curve and a second variation curve, respectively. These curves are typically generated using sophisticated time series data analysis and curve fitting techniques (such as linear regression or polynomial fitting) to visually demonstrate the temporal variation trend of the output voltage.

[0070] Observing the dynamic changes of these two curves is of key significance: when the first change curve shows a continuous downward trend and the second change curve shows a continuous upward trend, this indirectly confirms that the performance of the firmware burning device has degraded during the burning process.

[0071] Specifically, this performance degradation will result in a natural decay of the output voltage during a successful programming operation (i.e., the amplified voltage drop during normal device aging), while a failed programming operation may cause an abnormal increase in the output voltage (i.e., an abnormal amplification of performance degradation). Furthermore, the requirement that the difference in the absolute values of the average slopes of the two curves fall within a predetermined range is a pre-set standard determined based on statistical analysis of historical data to ensure that the observed trend truly reflects the actual performance degradation of the device. Next, the arithmetic mean of the absolute values of the average slopes of the first and second variation curves is calculated and used as a correction factor for the measured output voltage.

[0072] This correction factor determination process enables the system to accurately quantify voltage deviations caused by performance degradation in firmware burning devices and adjust the measured output voltage accordingly based on the correction factor reflecting the degree of performance degradation. This approach enhances adaptability to device performance changes and provides more accurate and reliable data support for dynamic trend analysis and subsequent decision-making during the burning process.

[0073] Specifically, Figure 8 FIG. 4 is a structural block diagram of the correction factor determination unit 403 in the system provided by an embodiment of the present invention.

[0074] In a preferred embodiment of the present invention, the correction factor determination unit 403 specifically includes: The correction factor output subunit 4031 is used to calculate the arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, and use the mean as a correction factor for the measured output voltage value; The measured voltage value correction subunit 4032 is used to retrieve the output voltage value correction formula and correct the measured output voltage value in combination with the correction factor.

[0075] The calculation formula of the output voltage value correction formula is: , where V corr Refers to the output voltage value after correction, V meas Refers to the measured output voltage value, S1 refers to the average slope absolute value of the first change curve, S2 refers to the average slope absolute value of the second change curve, Refers to the correction factor, and K refers to the adjustment coefficient corresponding to the correction factor.

[0076] In the embodiment of the present invention, a specific example is used to illustrate how to determine a correction factor according to the slope data of the first change curve and the second change curve, and use the correction factor to perform reverse correction on the measured output voltage value.

[0077] Suppose, during a programming process, while the firmware programming device is programming the target MCU, the system detects that the output voltage briefly exceeds a preset threshold, triggering an alert for an occasional output voltage anomaly. At this point, the system records the current measured output voltage, the current programming mode, the elapsed programming time, and the target MCU type, and retrieves all previous successful and failed programming records from the device's storage. Next, the system uses a filter to select from these historical records those that match the current MCU type and programming mode, ensuring that the number of selected records meets a preset standard and that the time intervals between these records are consistent to ensure data uniformity and comparability.

[0078] After obtaining these secondary success and failure programming records, the system collects all output voltage values recorded within a predetermined time window corresponding to the current programming duration (i.e., the time range before and after the programming time reaches the current moment) in each record and removes noise and outliers from these values. The system then averages these processed data to determine the first average output voltage value corresponding to each secondary success record and the second average output voltage value corresponding to each secondary failure record.

[0079] Next, the system plots all first and second average output voltage values in chronological order, forming a first variation curve and a second variation curve, respectively. Then, using existing time series analysis and curve fitting techniques (e.g., linear regression), the average slope of the two curves is calculated (taking their absolute values and performing the calculation). For example, if the absolute value of the average slope of the first variation curve is 0.5 and the absolute value of the average slope of the second variation curve is 0.7, the arithmetic mean of the two is (0.5 + 0.7) / 2 = 0.6, which serves as the correction factor for the measured output voltage.

[0080] The system then uses a pre-set output voltage correction formula and, combined with the obtained correction factor, performs a reverse adjustment on the measured output voltage. Specifically, the correction formula states that the corrected output voltage equals the measured output voltage multiplied by (1 minus the product of the adjustment factor K and the correction factor). For example, if the measured output voltage is 5.0 volts and the adjustment factor K is set to 0.1, then when the correction factor is 0.6, 1 minus 0.1 × 0.6 equals 0.94, so the corrected output voltage is 5.0 volts × 0.94, or 4.7 volts.

[0081] Furthermore, the MCU burning intelligent control system also includes: The burning interruption judgment module 500 is used to compare the corrected output voltage value with the output voltage preset threshold corresponding to the sporadic output voltage abnormality warning, and judge whether to interrupt the firmware burning device from burning the target MCU accordingly.

[0082] In an embodiment of the present invention, the firmware burning device compares the output voltage value obtained through data processing and correction with a preset output voltage threshold corresponding to an incidental output voltage anomaly warning. This preset threshold represents the upper voltage limit that could cause serious burning failure or device damage during the burning process. If the corrected output voltage value exceeds this threshold, the system will determine that a significant voltage anomaly exists and automatically interrupt the firmware burning device's burning operation on the target MCU to prevent further potential risks. Conversely, if the corrected output voltage value is within a safe range, the burning process will continue.

[0083] It should be understood that, although the various steps in the flow chart of each embodiment of the present invention are shown in sequence according to the indication of the arrows, these steps are not necessarily performed in sequence according to the order indicated by the arrows. Unless otherwise specified herein, the execution of these steps is not strictly limited in order, and these steps can be performed in other orders. Moreover, at least a portion of the steps in each embodiment may include a plurality of sub-steps or a plurality of stages, and these sub-steps or stages are not necessarily performed at the same time, but can be performed at different times, and the execution order of these sub-steps or stages is not necessarily performed in sequence, but can be performed in turn or alternately with at least a portion of other steps or sub-steps or stages of other steps.

[0084] Those skilled in the art will appreciate that all or part of the processes in the above-described method embodiments can be implemented by instructing the relevant hardware through a computer program. The program can be stored in a non-volatile computer-readable storage medium. When executed, the program can include the processes of the above-described method embodiments. Any reference to memory, storage, database, or other media used in the various embodiments provided herein may include non-volatile and / or volatile memory. Non-volatile memory may include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory may include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct RAMbus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM).

[0085] The technical features of the above-mentioned embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in each embodiment in each secondary successful burning record or secondary failed burning record are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0086] The above-described embodiments merely illustrate several implementations of the present invention, and while their descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art would be able to make numerous variations and improvements without departing from the spirit of the present invention, all of which fall within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

[0087] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. An intelligent control method for MCU burning, characterized in that: The method comprises: When the firmware burning device is burning the target MCU, if an occasional output voltage abnormality warning is detected, the measured output voltage value, the current burning mode, the current burning duration, and the current type of the target MCU are recorded, and the historical successful burning records and historical failed burning records of the firmware burning device are obtained; Filter out several secondary successful burning records and several secondary failed burning records from the historical successful burning records and the historical failed burning records, which are consistent with the current category and the current burning mode, meet the preset quantity requirements, and have the same time interval between adjacent burning records; Calculating a first average output voltage value and a second average output voltage value of the firmware burning device in each secondary successful burning record and secondary failed burning record during the burning process within a predetermined time window corresponding to the current burning duration; analyzing whether the dynamic trends of the plurality of first average output voltage values and the plurality of second average output voltage values are consistent with a predetermined rule, and if so, correcting the measured output voltage values according to the dynamic trends; The corrected output voltage value is compared with the preset output voltage threshold corresponding to the sporadic output voltage abnormality warning, and it is determined whether to interrupt the firmware burning device to burn the target MCU.

2. The MCU burning intelligent control method according to claim 1, wherein The step of calculating the first average output voltage value and the second average output voltage value of the firmware burning device in each secondary successful burning record and secondary failed burning record during the burning process within a predetermined time window corresponding to the current burning duration includes: Obtaining all output voltage values recorded by the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration in each secondary successful burning record and secondary failed burning record, and removing noise and extreme values from the values; An average operation is performed on the output voltage values in each secondary successful programming record or secondary failed programming record to obtain a first average output voltage value corresponding to each secondary successful programming record and a second average output voltage value corresponding to each secondary failed programming record.

3. The MCU burning intelligent control method according to claim 1, wherein The step of analyzing whether the dynamic trends of the plurality of first average output voltage values and the plurality of second average output voltage values are consistent with a predetermined rule, and if so, correcting the measured output voltage values according to the dynamic trends comprises: plotting all first average output voltage values and second average output voltage values into curves along a timeline to form a first change curve and a second change curve, respectively; Observe the first change curve and the second change curve respectively. If the first change curve shows a continuous downward trend and the second change curve shows a continuous upward trend, and the difference in the absolute value of the average slope of the first change curve and the second change curve falls within a predetermined interval, then determine that the dynamic trends of the first average output voltage value and the second average output voltage value comply with the predetermined rule; The arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve is calculated, the mean is used as a correction factor for the measured output voltage value, and the measured output voltage value is corrected by the correction factor.

4. The MCU burning intelligent control method according to claim 3, wherein: The steps of calculating the arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, using the mean as a correction factor for the measured output voltage value, and correcting the measured output voltage value using the correction factor include: Calculating an arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, and using the mean as a correction factor for the measured output voltage value; Retrieve the output voltage correction formula and correct the measured output voltage value in combination with the correction factor.

5. The MCU burning intelligent control method according to claim 4, wherein: The calculation formula of the output voltage value correction formula is: , where V corr Refers to the output voltage value after correction, V meas Refers to the measured output voltage value, S1 refers to the average slope absolute value of the first change curve, S2 refers to the average slope absolute value of the second change curve, Refers to the correction factor, and K refers to the adjustment coefficient corresponding to the correction factor.

6. An MCU burning intelligent control system, characterized in that: The system includes: a data acquisition module, a burning record screening module, an average value calculation module, a trend analysis module and a burning interruption judgment module, wherein: A data acquisition module is used to record the measured output voltage value, the current programming mode, the current programming duration, and the current type of the target MCU when an occasional output voltage abnormality warning is detected when the firmware programming device is programming the target MCU, and to obtain the historical successful programming records and historical failed programming records of the firmware programming device; A burning record screening module is used to screen out, from historical successful burning records and historical failed burning records, several secondary successful burning records and several secondary failed burning records that are consistent with the current category and current burning mode and meet the preset quantity requirements and have the same time interval between adjacent burning records; an average value calculation module, configured to calculate, in each secondary successful burning record and secondary failed burning record, a first average output voltage value and a second average output voltage value of the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration; a trend analysis module for analyzing whether the dynamic trends of the first average output voltage values and the second average output voltage values are consistent with a predetermined rule, and if so, correcting the measured output voltage values according to the dynamic trends; The burning interrupt judgment module is used to compare the corrected output voltage value with the output voltage preset threshold corresponding to the occasional output voltage abnormality warning, and judge whether to interrupt the firmware burning device to burn the target MCU accordingly.

7. The MCU burning intelligent control system according to claim 6, characterized in that: The average value calculation module specifically includes: an output voltage value acquisition unit, configured to acquire all output voltage values recorded by the firmware burning device during the burning process within a predetermined time window corresponding to the current burning duration in each secondary successful burning record and secondary failed burning record, and remove noise and extreme values from the values; The average output voltage value calculation unit is used to average the output voltage values in each secondary successful burning record or secondary failed burning record to obtain a first average output voltage value corresponding to each secondary successful burning record and a second average output voltage value corresponding to each secondary failed burning record.

8. The MCU burning intelligent control system according to claim 7, characterized in that: The trend analysis module specifically includes: a curve drawing unit, configured to draw all the first average output voltage values and the second average output voltage values into curves according to a time line, to form a first change curve and a second change curve respectively; a dynamic trend analysis unit, configured to observe the first change curve and the second change curve respectively, and determine that the dynamic trends of the first average output voltage value and the second average output voltage value conform to a predetermined rule if the first change curve shows a continuous downward trend and the second change curve shows a continuous upward trend, and if the difference between the absolute values of the average slopes of the first change curve and the second change curve falls within a predetermined interval; The correction factor determination unit is used to calculate the arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, use the average as a correction factor for the measured output voltage value, and correct the measured output voltage value using the correction factor.

9. The MCU burning intelligent control system according to claim 8, characterized in that: The correction factor determination unit specifically includes: a correction factor output subunit, configured to calculate an arithmetic mean of the absolute values of the average slopes of the first change curve and the second change curve, and use the mean as a correction factor for the measured output voltage value; The measured voltage value correction subunit is used to call the output voltage value correction formula and correct the measured output voltage value in combination with the correction factor.

10. The MCU burning intelligent control system according to claim 9, characterized in that: The calculation formula of the output voltage value correction formula is: , where V corr Refers to the output voltage value after correction, V meas Refers to the measured output voltage value, S1 refers to the average slope absolute value of the first change curve, S2 refers to the average slope absolute value of the second change curve, Refers to the correction factor, and K refers to the adjustment coefficient corresponding to the correction factor.

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