A hard disk parameter testing method, device, medium and product

Abstract

The present application discloses a method, device, medium and product for testing hard disk parameters, and relates to the field of data processing technology. The method can comprehensively test various possible parameter combinations by looping through continuous-time linear equalization parameters within a first preset parameter range and looping through decision feedback equalization parameters within a second preset parameter range, ensuring that no parameter combination is missed. Compared with the method of debugging through a bit error rate tester, the method is more efficient. The bit error rate obtained based on the first feedback signal of the hard disk can evaluate the signal processing capability and data transmission accuracy of the hard disk under different parameter combinations. When the first bit error rate is less than the preset threshold, it means that the current parameter combination can effectively suppress interference and achieve accurate data transmission. The current parameter combination is stored in the first parameter set, providing a basis for the hard disk to select appropriate parameters in actual applications.

Description

Technical Field

[0001] The present application relates to the field of data processing technology, and in particular to a method, device, medium and product for testing hard disk parameters. Background Art

[0002] As the signal transmission rates of high-speed hard drive interfaces continue to increase, poor signal integrity is also emerging at the hard drive's signal receiving end. This is manifested in high-frequency attenuation, severe intersymbol interference, and noise interference. To compensate for these signal interference issues, hard drive signal receiving ends typically rely on continuous-time linear equalization (CTL) and decision feedback equalization (DFEQ) for signal conditioning. However, finding the optimal combination of CTL and DFEQ parameters, or one that meets bit error rate requirements, is a complex and time-consuming process.

[0003] In the related art, a bit error rate tester is used to debug the parameters of continuous-time linear equalization and decision feedback equalization. However, this debugging method using a bit error rate tester is not only time-consuming but also prone to missing the combination of continuous-time linear equalization and decision feedback equalization parameters that meets the bit error rate requirements, resulting in hard drive performance failing to meet the requirements. Summary of the Invention

[0004] The present application provides a hard disk parameter testing method, device, medium and product to at least solve the problem in the related art that the hard disk parameter testing method is time-consuming and prone to missing parameter combinations.

[0005] In a first aspect, the present application provides a method for testing hard disk parameters, comprising:

[0006] cyclically executing the following first test operation until all continuous time linear equalization parameters within the first preset parameter range and decision feedback equalization parameters within the second preset parameter range are traversed;

[0007] The first test operation includes:

[0008] For the signal receiving end of the hard disk, the corresponding continuous time linear equalization parameters are configured within the first preset parameter range, and the corresponding decision feedback equalization parameters are configured within the second preset parameter range;

[0009] Send a test signal to the signal receiving end of the hard disk; the test signal is a signal formed by superimposing the original signal and the interference signal;

[0010] receiving a first feedback signal sent by a signal sending end of the hard disk;

[0011] determining a first bit error rate based on the first feedback signal and the test signal;

[0012] When the first bit error rate is less than a preset threshold, the corresponding combination of continuous-time linear equalization parameters and decision feedback equalization parameters is stored in a first parameter set; the first parameter set is a set of parameter combinations that meet the test requirements.

[0013] In a second aspect, the present application further provides a hard disk parameter testing device, comprising:

[0014] a loop module, configured to cyclically execute the following first test operation until all continuous-time linear equalization parameters within a first preset parameter range and decision feedback equalization parameters within a second preset parameter range are traversed;

[0015] The first test operation includes:

[0016] a configuration module configured to configure corresponding continuous-time linear equalization parameters within a first preset parameter range and corresponding decision feedback equalization parameters within a second preset parameter range for a signal receiving end of the hard disk;

[0017] The sending module is used to send a test signal to the signal receiving end of the hard disk; the test signal is a signal formed by superimposing the original signal and the interference signal;

[0018] A receiving module, configured to receive a first feedback signal sent by a signal sending end of the hard disk;

[0019] a determination module, configured to determine a first bit error rate based on the first feedback signal and the test signal;

[0020] The storage module is used to store the corresponding combination of continuous-time linear equalization parameters and decision feedback equalization parameters into a first parameter set when the first bit error rate is less than a preset threshold; the first parameter set is a set of parameter combinations that meet the test requirements.

[0021] In a third aspect, the present application further provides an electronic device, comprising:

[0022] memory for storing computer programs;

[0023] A processor is configured to implement the steps of the method according to the first aspect when executing a computer program.

[0024] In a fourth aspect, the present application further provides a computer-readable storage medium, in which a computer program is stored, wherein when the computer program is executed by a processor, the steps of the method of the first aspect are implemented.

[0025] In a fifth aspect, the present application also provides a computer program product, comprising a computer program, which implements the steps of the method of the first aspect when executed by a processor.

[0026] The present application provides a method, device, medium, and product for testing hard disk parameters. This method, by looping through continuous-time linear equalization parameters within a first preset parameter range and looping through decision feedback equalization parameters within a second preset parameter range, can comprehensively test various possible parameter combinations, ensuring that no parameter combinations are missed. This method is more efficient than debugging using a bit error rate tester. In addition, by superimposing the original signal and the interference signal to form a test signal, the signal transmission conditions faced by the hard disk in an actual working environment are realistically simulated. The bit error rate obtained based on the first feedback signal of the hard disk can be used to evaluate the signal processing capability and data transmission accuracy of the hard disk under different parameter combinations. When the first bit error rate is less than the preset threshold, it indicates that the current parameter combination can effectively suppress interference and achieve accurate data transmission. The current parameter combination is stored in the first parameter set, providing a basis for selecting appropriate parameters for the hard disk in actual applications. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] In order to more clearly illustrate the embodiments of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0028] Figure 1 A diagram of an application scenario corresponding to a hard disk parameter testing method provided in an embodiment of the present application;

[0029] Figure 2 A flowchart of a method for testing hard disk parameters provided in one embodiment of the present application;

[0030] Figure 3 A flowchart of a method for testing hard disk parameters provided in yet another embodiment of the present application;

[0031] Figure 4 A schematic structural diagram of a hard disk parameter testing device provided in one embodiment of the present application;

[0032] Figure 5 A schematic diagram of the structure of an electronic device provided in one embodiment of the present application. DETAILED DESCRIPTION

[0033] The following will be combined with the accompanying drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0034] In order to enable those skilled in the art to better understand the present application, the present application is further described in detail below with reference to the accompanying drawings and specific implementation methods.

[0035] As the signal transmission rates of high-speed hard drive interfaces continue to increase, poor signal integrity is also emerging at the hard drive's signal receiving end. This is manifested in high-frequency attenuation, severe intersymbol interference, and noise interference. To compensate for these signal interference issues, hard drive signal receiving ends typically rely on continuous-time linear equalization (CTL) and decision feedback equalization (DFEQ) for signal conditioning. However, finding the optimal combination of CTL and DFEQ parameters, or one that meets bit error rate requirements, is a complex and time-consuming process.

[0036] In the related art, a bit error rate tester is used to debug the parameters of continuous-time linear equalization and decision feedback equalization. However, this debugging method using a bit error rate tester is not only extremely time-consuming, but also fails to fully explore the performance of the hard drive under different parameter combinations. It is easy to miss the combination of continuous-time linear equalization parameters and decision feedback equalization parameters that meet the bit error rate requirements, resulting in the hard drive performance failing to meet the requirements.

[0037] Therefore, in the face of the technical problems of the above-mentioned related technologies, in order to solve the problem of low testing efficiency and easy omission of continuous-time linear equalization parameters and decision feedback equalization parameter combinations. First, a double-layer nested loop is used to achieve complete traversal of continuous-time linear equalization and decision feedback equalization parameters. At the same time, a test signal with interference superimposed on the original signal is used to simulate the real channel environment. Combined with the closed-loop test process, signal injection, error detection, threshold judgment and parameter storage operations are performed after each parameter configuration. Qualified parameter combinations are screened by pre-setting the error rate threshold, solving the problems of low efficiency of manual debugging and easy omission of continuous-time linear equalization parameters and decision feedback equalization parameter combinations.

[0038] Figure 1 This is an application scenario diagram corresponding to a hard disk parameter testing method provided in an embodiment of the present application, such as Figure 1As shown, the application scenario provided by this embodiment includes a hard disk drive 10 to be tested and a test device 11, which is in communication with the test device 11. When the hard disk drive 10 to be tested needs to be tested, first, continuous time linear equalization parameters and decision feedback equalization parameters are configured for the signal receiving end of the hard disk 10 to be tested, where the continuous time linear equalization parameters take values ​​within a first preset parameter range, and the decision feedback equalization parameters take values ​​within a second preset parameter range. Second, the test device 11 sends a test signal to the signal receiving end of the hard disk 10 to be tested, where the test signal is a signal formed by superimposing the original signal and the interference signal. Thereafter, the test device 11 obtains a feedback signal sent by the signal generating end of the hard disk 10 to be tested. The test device 11 determines a bit error rate based on the feedback signal and the test signal, and compares the bit error rate with a preset threshold. If the bit error rate is less than the preset threshold, the test device 11 stores the corresponding combination of the continuous time linear equalization parameter and the decision feedback equalization parameter in a parameter set. The parameter set is a set of parameter combinations that meet the test requirements.

[0039] The following specific embodiments describe in detail the technical solution of the present application and how the technical solution of the present application solves the above-mentioned technical problems. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below in conjunction with the accompanying drawings.

[0040] Figure 2 A flow chart of a method for testing hard disk parameters provided in one embodiment of the present application is shown as follows: Figure 2 As shown, the execution subject of this embodiment is a hard disk parameter testing device. The hard disk parameter testing device can be implemented by a computer program or a medium storing the relevant computer program, such as a USB flash drive and / or an optical disk; or it can be implemented by a physical device integrated or installed with the relevant computer program, such as a chip or electronic device. The electronic device can be a computer or a server. The hard disk parameter testing method provided in this embodiment includes the following steps:

[0041] The following first test operation is executed cyclically until all the continuous time linear equalization parameters within the first preset parameter range and all the decision feedback equalization parameters within the second preset parameter range are traversed.

[0042] It should be noted that the hard drive signal receiving end includes a continuous-time linear equalizer (CTLE) and a decision feedback equalizer (DFE). The setting parameters of the CTLE are continuous-time linear equalizer parameters, and the setting parameters of the decision feedback equalizer are decision feedback equalizer parameters.

[0043] Specifically, when a hard drive's signal receiving end receives a signal, the signal quality will be affected to a certain extent due to the characteristics of the transmission channel and interference from external noise. A continuous-time linear equalizer (CTE) is a linear analog high-pass filter applied to the hard drive receiver. It adjusts the signal's frequency response to compensate for distortion caused by channel characteristics during transmission, thereby improving signal reception quality. A decision feedback equalizer (DFEQ) is a nonlinear digital equalization technology that uses information from previously determined symbols to cancel interference with subsequent symbols, further improving the signal's bit error rate performance.

[0044] The first preset parameter range is a value range of a continuous time linear equalization parameter preset according to actual application scenarios and performance requirements. Optionally, the first preset parameter range may be 6 dB to 12 dB.

[0045] The second preset parameter range is a value range of the decision feedback equalization parameter preset according to actual application scenarios and performance requirements. Optionally, the second preset parameter range may be Tap1 to Tap6.

[0046] By traversing different continuous-time linear equalization parameters within a first preset parameter range and traversing decision feedback equalization parameters within a second preset parameter range, and testing and evaluating the signal processing performance of the hard drive under each parameter combination, a parameter combination that meets the hard drive performance requirements can be found, enabling the hard drive to achieve a lower bit error rate in a specific noise environment, thereby ensuring the hard drive's signal processing performance.

[0047] Specifically, the first test operation includes:

[0048] S201 : For a signal receiving end of a hard disk, configure corresponding continuous-time linear equalization parameters within a first preset parameter range, and configure corresponding decision feedback equalization parameters within a second preset parameter range.

[0049] Optionally, starting from the minimum value of the first preset parameter range, continuous time linear equalization parameters are configured for the signal receiving end of the hard disk; and at the same time, starting from the minimum value of the second preset parameter range, decision feedback equalization parameters are configured.

[0050] S202 , sending a test signal to a signal receiving end of the hard disk; the test signal is a signal formed by superimposing the original signal and the interference signal.

[0051] The original signal may be an analog data signal generated according to a certain data format and rate. Optionally, in this embodiment, the original signal specifically adopts a PRBS31 code pattern of a high-rate signal.

[0052] Optionally, the original signal may be generated by a signal generator; further, the signal transmitter may be a high-speed digital pattern signal generator, or a programmable pattern generator.

[0053] The interference signal is simulated based on the type of interference the hard drive may encounter, such as Gaussian white noise, pulse interference, etc. Optionally, the intensity of the interference signal can be adjusted based on actual testing requirements to simulate the noise environment that the hard drive may encounter during actual use.

[0054] Optionally, in this embodiment, the interference signal includes but is not limited to noise, jitter, and channel fading inter-symbol interference.

[0055] Specifically, after sending the test signal to the signal receiving end of the hard disk, the signal receiving end of the hard disk processes the test signal according to the currently configured continuous time linear equalization parameters and the decision feedback equalization parameters within the second preset parameter range.

[0056] S203: Receive a first feedback signal sent by a signal sending end of the hard disk.

[0057] The first feedback signal is a signal processed by the receiving end of the hard disk through the decision feedback equalizer and the decision feedback equalizer according to the test signal.

[0058] Optionally, the first feedback signal may be received by a signal receiver. Optionally, the signal receiver may be a digital signal processor (DSP) or an application-specific integrated circuit (ASIC).

[0059] S204: Determine a first bit error rate based on the first feedback signal and the test signal.

[0060] Specifically, after obtaining the first feedback signal, a first bit error rate is determined based on the first feedback signal and the test signal.

[0061] The bit error rate (BER) is the ratio of the number of bits received incorrectly to the total number of bits transmitted during signal transmission. It is an important indicator of signal transmission reliability. For example, if 10 bits are received incorrectly during a 1000-bit transmission, the BER is 10 / 1000 = 0.01, or 1%.

[0062] Optionally, when determining the first bit error rate based on the first feedback signal and the test signal, it can be achieved through the following steps:

[0063] The first feedback signal is compared with the original signal to determine the number of inconsistent bits; and a first bit error rate is calculated based on the number of inconsistent bits and the total number of bits in the original signal.

[0064] The first feedback signal is the ideal signal the hard drive should output, while the original signal is the portion of the test signal without the interference signal superimposed on it. By comparing the first feedback signal and the original signal bit by bit, the number of inconsistent bits between the two can be counted. This number of inconsistent bits reflects the number of errors caused by factors such as noise interference during signal transmission and processing.

[0065] Specifically, the first bit error rate is calculated as follows: first bit error rate=number of inconsistent bits / total number of bits of the original signal.

[0066] The first bit error rate can intuitively reflect the performance of hard disk signal processing under the current parameter combination.

[0067] S205. When the first bit error rate is less than a preset threshold, store the corresponding combination of continuous-time linear equalization parameters and decision feedback equalization parameters into a first parameter set; the first parameter set is a set of parameter combinations that meet the test requirements.

[0068] Specifically, after obtaining the first bit error rate, the first bit error rate is compared with a preset threshold. If the first bit error rate is less than the preset threshold, it means that the current continuous-time linear equalization parameter and decision feedback equalization parameter combination can meet the test requirements, and the parameter combination is stored in the first parameter set.

[0069] The preset threshold is a value pre-set according to the performance indicators and reliability requirements of the hard disk to ensure that the selected parameter combination of the continuous-time linear equalization parameter and the decision feedback equalization parameter can guarantee the signal processing performance of the hard disk.

[0070] Optionally, in this embodiment, the preset threshold is 1×10 −12 Of course, the preset threshold value can also be set to other values ​​according to actual conditions.

[0071] Optionally, if the first bit error rate is greater than or equal to a preset threshold, the parameter configuration may be adjusted in a predetermined step size, and the aforementioned process of sending a test signal, receiving a first feedback signal, calculating the first bit error rate, and making a judgment may be repeated. Optionally, the parameter combination corresponding to the first bit error rate greater than or equal to the preset threshold may be stored in another set for subsequent analysis.

[0072] S206 : After traversing the continuous-time linear equalization parameters within the first preset parameter range and the decision feedback equalization parameters within the second preset parameter range, output a first parameter set.

[0073] Specifically, the first test operation is repeated until all parameter combinations within the preset parameter range are traversed. Ultimately, the parameter combination stored in the first parameter set is the parameter combination that meets the test requirements.

[0074] It should be noted that by traversing and testing different parameter combinations, it is possible to find a combination of continuous-time linear equalization parameters and decision feedback equalization parameters that meets the test requirements, thereby effectively optimizing the signal processing performance of the hard disk and improving the reliability and data transmission efficiency of the hard disk in complex noise environments.

[0075] In addition, this hard drive parameter testing method can flexibly adjust the parameter range and test conditions according to different hard drive models, application scenarios, and noise levels. It has strong adaptability and can be widely used in performance optimization tests of various hard drive products.

[0076] Optionally, the hard disk parameter testing method can be applied to a solid-state hard disk with a PCIe interface, or a mechanical hard disk with a PCIe interface.

[0077] Among them, PCIe (Peripheral Component Interconnect Express) is a high-speed serial computer expansion bus standard used to connect computer hardware devices to computers.

[0078] The hard disk parameter testing method provided in the embodiment of the present application can comprehensively test various possible parameter combinations by looping through the continuous-time linear equalization parameters within a first preset parameter range and looping through the decision feedback equalization parameters within a second preset parameter range, ensuring that no parameter combination is missed. Compared with the method of debugging through a bit error rate tester, it is more efficient. In addition, the method of superimposing the original signal and the interference signal to form a test signal truly simulates the signal transmission situation faced by the hard disk in an actual working environment. The bit error rate obtained based on the first feedback signal of the hard disk can evaluate the signal processing capability and data transmission accuracy of the hard disk under different parameter combinations. When the first bit error rate is less than the preset threshold, it means that the current parameter combination can effectively suppress interference and achieve accurate data transmission. It is stored in the first parameter set, providing a basis for the hard disk to select appropriate parameters in actual applications.

[0079] As an optional implementation, based on any one of the above embodiments, traversing the continuous-time linear equalization parameters within the first preset parameter range includes: determining the continuous-time linear equalization parameters within the first preset parameter range with a first preset step size; traversing the decision feedback equalization parameters within the second preset parameter range includes: determining the decision feedback equalization parameters within the second preset parameter range with a second preset step size.

[0080] Specifically, when traversing the continuous-time linear equalization parameters within the first preset parameter range, the continuous-time linear equalization parameters are determined within the first preset parameter range with a first preset step size.

[0081] Among them, the first preset step size is a pre-set incremental value used to gradually adjust the continuous-time linear equalization parameters within the first preset parameter range. Optionally, the first preset step size can be set according to the size of the parameter range and the test accuracy requirement. For example, if the first preset parameter range is wide and the test accuracy requirement is not high, a larger first preset step size can be selected to speed up the test. If the first preset parameter range is narrow and higher test accuracy is required, a smaller first preset step size can be selected. By gradually determining the continuous-time linear equalization parameters with a fixed first preset step size, it can be ensured that all possible continuous-time linear equalization parameters are evenly covered within the first preset parameter range.

[0082] Optionally, take the first preset step size of 1 dB as an example.

[0083] The second preset step size is a pre-set incremental value used to gradually adjust the decision feedback equalization parameters within the second preset parameter range. Optionally, when traversing the decision feedback equalization parameters within the second preset parameter range, the decision feedback equalization parameters are determined within the second preset parameter range using the second preset step size. The second preset step size is adjusted based on the second preset parameter range and test accuracy requirements. By gradually determining the decision feedback equalization parameters using a fixed step size, different decision feedback equalization parameters can be comprehensively tested within the second preset parameter range.

[0084] The hard disk parameter testing method provided in the embodiment of the present application can flexibly adjust the test parameters by determining the continuous-time linear equalization parameters within the first preset parameter range with a first preset step size, and determining the decision feedback equalization parameters within the second preset parameter range with a second preset step size, thereby ensuring that a parameter combination of continuous-time linear equalization parameters and decision feedback equalization parameters that meets the requirements can be efficiently found in different test scenarios.

[0085] As an optional implementation manner, based on any of the above embodiments, it includes:

[0086] When the first bit error rate is greater than or equal to a preset threshold, the corresponding combination of continuous-time linear equalization parameters and decision feedback equalization parameters is stored in a second parameter set; based on the first bit error rate, the first parameter set and the second parameter set, a first multidimensional relationship representation is generated; wherein the first multidimensional relationship representation includes the relationship between the combination of the continuous-time linear equalization parameters and the decision feedback equalization parameters and the first bit error rate; and the parameter combination in the second parameter set is marked in the first multidimensional relationship representation.

[0087] Optionally, the first multidimensional relationship representation can be implemented using data visualization tools or mathematical modeling methods. For example, a two-dimensional or three-dimensional chart can be generated using the continuous-time linear equalization parameters and decision feedback equalization parameters as the horizontal and vertical axes, and the first bit error rate as the color or height mapping. This configuration can intuitively display the changes in the first bit error rate under different parameter combinations, helping technicians quickly understand the impact of the continuous-time linear equalization parameters and decision feedback equalization parameters on the hard drive's signal processing performance.

[0088] Optionally, parameter combinations in the second parameter set are marked in the first multidimensional relationship representation. Parameter combinations in the second parameter set fail to meet the test requirement because their corresponding second bit error rates are greater than or equal to a preset threshold, and therefore need to be specially marked for distinction.

[0089] Optionally, the marking may be implemented by different colors, symbols, or annotations, so that the parameter combinations in the second parameter set can be clearly identified in the first multi-dimensional relationship representation.

[0090] The hard disk parameter testing method provided in the embodiment of the present application can more intuitively analyze the impact of continuous-time linear equalization parameters and decision feedback equalization parameters on the hard disk signal processing performance by generating a first multidimensional relationship representation and marking the parameter combinations in the second parameter set, thereby providing a more comprehensive data reference for further improving the performance of the hard disk.

[0091] As an optional implementation manner, based on any of the above embodiments, the method further includes:

[0092] The following second test operation is executed cyclically until all combinations of the continuous-time linear equalization parameters and the decision feedback equalization parameters in the first parameter set and the ambient temperature values ​​within the preset temperature range are traversed.

[0093] It should be noted that the performance of a hard drive's electronic components and storage media is affected by ambient temperature. For example, temperature fluctuations can cause changes in the electrical parameters of electronic components, affecting signal processing accuracy and potentially impacting the data read and write performance of the storage media. Therefore, after obtaining the first parameter set, the effects of ambient temperature are factored in for the second test.

[0094] The preset temperature range is a pre-set temperature range based on the actual usage environment and operating temperature requirements of the hard drive. For example, a common hard drive operating temperature range may be 26°C-90°C, and the preset temperature range can be set within this range.

[0095] Optionally, the temperature change step can be set to any value between 1°C and 15°C.

[0096] The second test operation specifically includes the following steps:

[0097] First, the environment where the hard disk is located is heated so that the ambient temperature of the hard disk is within a preset temperature range.

[0098] Specifically, the environment in which the hard disk is located is heated, and the working performance of the hard disk under different ambient temperatures is simulated by controlling the ambient temperature.

[0099] Optionally, the environment in which the hard disk is located can be heated by a heater. Optionally, the heater can be a hot air circulation oven or an infrared heater, etc. In this embodiment, the type of the heater is not specifically limited.

[0100] Secondly, send a test signal to the signal receiving end of the hard disk.

[0101] It should be noted that the test signal is also a signal formed by the superposition of the original signal and the interference signal, ensuring the consistency of the test conditions so as to accurately evaluate the performance of the hard drive under the same parameter combination at different temperatures.

[0102] Afterwards, a second feedback signal sent by the signal sending end of the hard disk is received.

[0103] Specifically, after the hard disk processes the test signal under the current ambient temperature and the combined parameter configuration of continuous-time linear equalization parameters and decision feedback equalization parameters, the processing result is fed back through the signal sending end. The second feedback signal includes the hard disk's signal processing status under the influence of temperature factors.

[0104] Next, a second bit error rate is determined based on the second feedback signal and the test signal.

[0105] Specifically, by comparing the second feedback signal with the original signal, counting the number of erroneously transmitted bits, and combining this with the total number of bits in the original signal, a second bit error rate (BER) is calculated for the current temperature and parameter combination. It should be noted that the method for determining the second BER is the same as the method for determining the first BER, and therefore is not further described.

[0106] Finally, when the second bit error rate is less than the preset threshold, the corresponding combination of the continuous-time linear equalization parameter, the decision feedback equalization parameter, and the ambient temperature value is stored in the third parameter set.

[0107] Specifically, after obtaining the second bit error rate, the second bit error rate is compared with a preset threshold value. If the second bit error rate is less than the preset threshold value, the corresponding combination of the continuous-time linear equalization parameter, the decision feedback equalization parameter, and the ambient temperature value is stored in a third parameter set.

[0108] The third parameter set stores parameter and temperature combinations that enable the hard disk to meet the test requirements under different ambient temperatures, providing a reference for parameter configuration of the hard disk according to different ambient temperatures in actual applications.

[0109] It should be noted that the preset threshold in this embodiment is the same as the preset threshold used to determine the first bit error rate.

[0110] Optionally, if the second bit error rate is greater than or equal to a preset threshold, the parameter combination of the current continuous-time linear equalization parameter and the decision feedback equalization parameter can be kept unchanged, the ambient temperature can be increased according to the temperature change step, and the test steps can be repeated until all temperature values ​​within the preset temperature range are traversed.

[0111] The hard drive parameter testing method provided in the embodiments of the present application, based on screening out a first parameter set that meets basic test requirements, further tests parameter combinations within the first parameter set within a preset temperature range, evaluating the performance of the parameter combinations within the first parameter set at different ambient temperatures. This method can more accurately reflect the hard drive's actual usage scenarios, especially the data transmission accuracy under temperature fluctuations, making the test results more relevant to practical applications and helping to improve the hard drive's data transmission stability in various practical environments. By calculating the second bit error rate, parameter and temperature combinations that meet the test requirements at different ambient temperatures are screened and stored in a third parameter set, thereby providing a basis for selecting appropriate parameter configurations for the hard drive according to different ambient temperatures in actual applications.

[0112] As an optional implementation manner, based on any of the above embodiments, the method further includes:

[0113] When the second bit error rate is greater than or equal to the preset threshold, a corresponding combination of the continuous-time linear equalization parameter, the decision feedback equalization parameter, and the ambient temperature value is stored in a fourth parameter set.

[0114] Specifically, when the second bit error rate is greater than or equal to a preset threshold, a corresponding combination of continuous-time linear equalization parameters, decision feedback equalization parameters, and ambient temperature value is stored in a fourth parameter set.

[0115] The fourth parameter set is a data set that records parameter combinations that fail to meet the test requirements at a specific temperature. This fourth parameter set can provide data reference for subsequent analysis of hard drive performance bottlenecks and optimization of parameter configurations.

[0116] For example, if a large number of parameter combinations within a certain temperature range are found to be stored in the fourth parameter set, the heat dissipation design or signal processing circuit of the hard disk in this temperature range can be improved to enhance the practicality and stability of the hard disk in different environments.

[0117] As an optional implementation manner, based on any of the above embodiments, the method further includes:

[0118] Based on the second bit error rate, the third parameter set and the fourth parameter set, a second multidimensional relationship representation is generated; wherein the second multidimensional relationship representation includes the relationship between the combination of continuous-time linear equalization parameters, decision feedback equalization parameters and ambient temperature values ​​and the second bit error rate; and the parameter combination in the fourth parameter set is marked in the second multidimensional relationship representation.

[0119] Optionally, a data visualization tool is used to construct the second multidimensional relationship representation using a three-dimensional coordinate system or a data model, with the continuous-time linear equalization parameters, decision feedback equalization parameters and ambient temperature values ​​used as variables of different dimensions, and the second bit error rate used as the attribute value of the corresponding coordinate point to intuitively display the relationship between each parameter combination and the second bit error rate.

[0120] Optionally, parameter combinations in the fourth parameter set are marked in the second multidimensional relational representation. For example, coordinate points corresponding to parameter combinations in the fourth parameter set may be marked with different colors, shapes, or icons to clearly distinguish them from other parameter combinations in the second multidimensional relational representation, thereby facilitating rapid identification of parameter combinations that fail to meet test requirements at a specific temperature.

[0121] It should be noted that the generated second multidimensional relationship representation and the marking of the parameter combinations in the fourth parameter set can help R&D personnel quickly and intuitively understand the relationship between the parameter combination of continuous-time linear equalization parameters and decision feedback equalization parameters, the ambient temperature and the second bit error rate, so as to analyze the problem more efficiently.

[0122] The hard disk parameter testing method provided in the embodiment of the present application presents the parameter combination of the continuous-time linear equalization parameter and the decision feedback equalization parameter, the relationship between the ambient temperature and the second bit error rate in an intuitive manner based on the second bit error rate and the data of the third parameter set and the fourth parameter set, and marks the parameter combinations that do not meet the test requirements, providing a more comprehensive parameter selection range and problem analysis data for optimizing the hard disk performance.

[0123] Figure 3 A flowchart of a method for testing hard disk parameters provided in another embodiment of the present application is shown as follows: Figure 3 As shown in , the execution subject of the hard disk parameter testing method is a hard disk parameter testing device. Specifically, the hard disk parameter testing method specifically includes the following steps:

[0124] S301 : For a signal receiving end of a hard disk, configure corresponding continuous-time linear equalization parameters within a first preset parameter range, and configure corresponding decision feedback equalization parameters within a second preset parameter range.

[0125] S302: Send a test signal to a signal receiving end of the hard disk.

[0126] S303: Receive a first feedback signal sent by a signal sending end of the hard disk.

[0127] S304: Determine a first bit error rate based on the first feedback signal and the test signal.

[0128] Specifically, the first feedback signal is compared with the original signal to determine the number of inconsistent bits; and a first bit error rate is calculated based on the number of inconsistent bits and the total number of bits of the original signal.

[0129] S305: Determine whether the first bit error rate is less than a preset threshold.

[0130] S306 : When the first bit error rate is less than a preset threshold, store a corresponding combination of continuous-time linear equalization parameters and decision feedback equalization parameters into a first parameter set.

[0131] Specifically, when the first bit error rate is greater than or equal to a preset threshold, the corresponding combination of continuous-time linear equalization parameters and decision feedback equalization parameters is stored in the second parameter set.

[0132] S307: Determine whether the continuous-time linear equalization parameters within the first preset parameter range and the decision feedback equalization parameters within the second preset parameter range have been traversed.

[0133] Specifically, when the traversal is not completed, the continuous-time linear equalization parameters are determined within a first preset parameter range with a first preset step size, and the decision feedback equalization parameters are determined within a second preset parameter range with a second preset step size.

[0134] Specifically, after determining the continuous-time linear equalization parameter by the first preset step size and determining the decision feedback equalization parameter by the second preset step size, S301 is executed.

[0135] S308. When the traversal is completed, output the first parameter set.

[0136] S309: Heating the environment where the hard disk is located so that the temperature of the environment where the hard disk is located is within a preset temperature range.

[0137] S310: Send a test signal to a signal receiving end of the hard disk.

[0138] S311 , receiving a second feedback signal sent by a signal sending end of the hard disk.

[0139] S312: Determine a second bit error rate based on the second feedback signal and the test signal.

[0140] S313: Determine whether the second bit error rate is less than a preset threshold.

[0141] S314: When the second bit error rate is less than a preset threshold, store the corresponding combination of continuous-time linear equalization parameters, decision feedback equalization parameters, and ambient temperature value into a third parameter set.

[0142] Specifically, when the second bit error rate is greater than or equal to a preset threshold, a corresponding combination of continuous-time linear equalization parameters, decision feedback equalization parameters, and ambient temperature value is stored in a fourth parameter set.

[0143] S315 : Determine whether all parameter combinations of the continuous-time linear equalization parameter and the decision feedback equalization parameter in the first parameter combination, as well as the ambient temperature value within the preset temperature range, have been traversed.

[0144] Specifically, when the traversal is not completed, the ambient temperature value and the parameter combination of the continuous-time linear equalization parameter and the decision feedback equalization parameter are adjusted, and S309 is executed again.

[0145] S316 . When the traversal is completed, generate a second multidimensional relationship representation based on the second bit error rate, the third parameter set, and the fourth parameter set; and mark the parameter combinations in the fourth parameter set in the second multidimensional relationship representation.

[0146] It should be noted that the technical effects of the hard disk parameter testing method provided in this embodiment have been explained in the hard disk parameter testing method in the above embodiment, and therefore, they will not be repeated in this embodiment.

[0147] Figure 4 A structural diagram of a hard disk parameter testing device provided in one embodiment of the present application; Figure 4 As shown in Figure 4 As shown, the hard disk parameter testing device provided in this embodiment is located in an electronic device. The hard disk parameter testing device 40 provided in this embodiment includes: a circulation module 41, a configuration module 42, a sending module 43, a receiving module 44, a determination module 45 and a storage module 46.

[0148] A loop module 41 is configured to loop through the following first test operation until the continuous-time linear equalization parameters within the first preset parameter range and the decision feedback equalization parameters within the second preset parameter range are traversed. The first test operation includes: a configuration module 42 configured to configure the corresponding continuous-time linear equalization parameters within the first preset parameter range and the corresponding decision feedback equalization parameters within the second preset parameter range for the signal receiving end of the hard disk; a sending module 43 configured to send a test signal to the signal receiving end of the hard disk; the test signal is a signal formed by superimposing the original signal and the interference signal; a receiving module 44 configured to receive a first feedback signal sent by the signal transmitting end of the hard disk; a determination module 45 configured to determine a first bit error rate based on the first feedback signal and the test signal; and a storage module 46 configured to store the corresponding combination of the continuous-time linear equalization parameters and the decision feedback equalization parameters into a first parameter set when the first bit error rate is less than a preset threshold; the first parameter set is a set of parameter combinations that meet the test requirements.

[0149] Optionally, when determining the first bit error rate based on the first feedback signal and the test signal, the determination module 45 is specifically used to: compare the first feedback signal with the original signal to determine the number of inconsistent bits; and calculate the first bit error rate based on the number of inconsistent bits and the total number of bits of the original signal.

[0150] Optionally, the loop module 41, when traversing the continuous-time linear equalization parameters within the first preset parameter range, is specifically used to: determine the continuous-time linear equalization parameters within the first preset parameter range with a first preset step size; the loop module, when traversing the decision feedback equalization parameters within the second preset parameter range, is specifically used to: determine the decision feedback equalization parameters within the second preset parameter range with a second preset step size.

[0151] Optionally, the hard disk parameter testing device 40 further includes a generating module and a marking module.

[0152] Optionally, the storage module 46 is further used to: when the first bit error rate is greater than or equal to a preset threshold, store the corresponding combination of continuous-time linear equalization parameters, decision feedback equalization parameters and ambient temperature values ​​into the second parameter set; a generation module is used to generate a first multidimensional relationship representation based on the first bit error rate, the first parameter set and the second parameter set; wherein the first multidimensional relationship representation includes the relationship between the combination of the continuous-time linear equalization parameters and the decision feedback equalization parameters and the first bit error rate; and a marking module is used to mark the parameter combination in the second parameter set in the first multidimensional relationship representation.

[0153] Optionally, the loop module 41 is further configured to loop through the following second test operation until all combinations of continuous-time linear equalization parameters and decision feedback equalization parameters in the first parameter set and ambient temperature values ​​within a preset temperature range are traversed.

[0154] Optionally, the hard disk parameter testing device 40 further includes a heating module.

[0155] Among them, the second test operation includes: a heating module, which is used to heat the environment in which the hard disk is located so that the ambient temperature of the hard disk is within a preset temperature range; a sending module 43, which is also used to send a test signal to the signal receiving end of the hard disk; a receiving module 44, which is also used to receive a second feedback signal sent by the signal sending end of the hard disk; a determination module 45, which is also used to determine a second bit error rate based on the second feedback signal and the test signal; a storage module 46, which is also used to store the corresponding combination of continuous-time linear equalization parameters, decision feedback equalization parameters and ambient temperature values ​​into a third parameter set when the second bit error rate is less than a preset threshold.

[0156] Optionally, the storage module 46 is further configured to: when the second bit error rate is greater than or equal to a preset threshold, store the corresponding combination of the continuous-time linear equalization parameter, the decision feedback equalization parameter, and the ambient temperature value into a fourth parameter set.

[0157] Optionally, the generation module is also used to: generate a second multidimensional relationship representation based on the second bit error rate, the third parameter set and the fourth parameter set; wherein the second multidimensional relationship representation includes the relationship between the combination of continuous-time linear equalization parameters, decision feedback equalization parameters and ambient temperature values ​​and the second bit error rate; the marking module is also used to mark the parameter combinations in the fourth parameter set in the second multidimensional relationship representation.

[0158] It should be noted that the technical effects of the hard disk parameter testing device provided in this embodiment have been explained in the embodiment of the hard disk parameter testing method described above, and therefore, they will not be repeated in this embodiment.

[0159] Figure 5 A schematic diagram of the structure of an electronic device provided in one embodiment of the present application is shown in FIG. Figure 5 As shown, the electronic device 50 provided in an embodiment of the present application includes: a memory 51 and a processor 52.

[0160] The memory 51 stores a computer program, and the processor 52 is configured to run the computer program to execute the steps in any of the above-mentioned hard disk parameter testing method embodiments.

[0161] In this embodiment, the processor 52 and the memory 51 are connected via a bus. The bus may be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus. Buses can be categorized as address buses, data buses, control buses, etc. For ease of presentation, Figure 5 Only one thick line is used in the diagram, but this does not mean that there is only one bus or one type of bus.

[0162] An embodiment of the present application further provides a computer-readable storage medium, in which a computer program is stored, wherein the computer program is configured to execute the steps of any of the above-mentioned hard disk parameter testing method embodiments when run.

[0163] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.

[0164] An embodiment of the present application further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, the steps in any of the above-mentioned hard disk parameter testing method embodiments are implemented.

[0165] An embodiment of the present application also provides another computer program product, including a non-volatile computer-readable storage medium, which stores a computer program. When the computer program is executed by a processor, it implements the steps in any of the above-mentioned hard disk parameter testing method embodiments.

[0166] Professionals may further appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the components and steps of each example according to their functions. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professionals and technicians may use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0167] The above is a detailed introduction to the solution provided by this application. Specific examples are used herein to illustrate the principles and implementation methods of this application. The description of the above embodiments is only intended to help understand the method and core ideas of this application. It should be pointed out that, for those skilled in the art, without departing from the principles of this application, several improvements and modifications can be made to this application, and these improvements and modifications also fall within the scope of protection of the claims of this application.

Claims

1. A method for testing hard disk parameters, characterized in that: include: cyclically executing the following first test operation until all continuous time linear equalization parameters within the first preset parameter range and decision feedback equalization parameters within the second preset parameter range are traversed; The first test operation includes: For the signal receiving end of the hard disk, the corresponding continuous-time linear equalization parameters are configured within the first preset parameter range, and the corresponding decision feedback equalization parameters are configured within the second preset parameter range; Sending a test signal to the signal receiving end of the hard disk; the test signal is a signal formed by superimposing the original signal and the interference signal; receiving a first feedback signal sent by a signal sending end of the hard disk; determining a first bit error rate based on the first feedback signal and the test signal; When the first bit error rate is less than a preset threshold, the corresponding combination of continuous-time linear equalization parameters and decision feedback equalization parameters is stored in a first parameter set; the first parameter set is a set of parameter combinations that meet test requirements.

2. The method according to claim 1, characterized in that The determining a first bit error rate based on the first feedback signal and the test signal includes: comparing the first feedback signal with the original signal to determine the number of inconsistent bits; The first bit error rate is calculated based on the number of inconsistent bits and the total number of bits of the original signal.

3. The method according to claim 1, characterized in that Traversing continuous time linear equalization parameters within a first preset parameter range, including: determining a continuous-time linear equalization parameter within the first preset parameter range with a first preset step size; Traversing decision feedback equalization parameters within a second preset parameter range, including: Determine a decision feedback equalization parameter within the second preset parameter range with a second preset step size.

4. The method according to claim 1, wherein The method also includes: When the first bit error rate is greater than or equal to the preset threshold, storing the corresponding combination of the continuous-time linear equalization parameter and the decision feedback equalization parameter into a second parameter set; generating a first multidimensional relationship representation based on the first bit error rate, the first parameter set, and the second parameter set; wherein the first multidimensional relationship representation includes a relationship between a combination of the continuous-time linear equalization parameters and the decision feedback equalization parameters and the first bit error rate; Parameter combinations in the second parameter set are marked in the first multidimensional relational representation.

5. The method according to any one of claims 1 to 4, characterized in that The method also includes: Looping through the following second test operation until all combinations of the continuous-time linear equalization parameters and the decision feedback equalization parameters in the first parameter set and all ambient temperature values ​​within a preset temperature range are exhausted; The second test operation includes: Heating the environment where the hard disk is located so that the ambient temperature of the hard disk is within the preset temperature range; Sending the test signal to a signal receiving end of the hard disk; receiving a second feedback signal sent by a signal sending end of the hard disk; determining a second bit error rate based on the second feedback signal and the test signal; When the second bit error rate is less than the preset threshold, the corresponding combination of the continuous-time linear equalization parameter, the decision feedback equalization parameter, and the ambient temperature value is stored in a third parameter set.

6. The method according to claim 5, characterized in that The method also includes: When the second bit error rate is greater than or equal to the preset threshold, the corresponding combination of the continuous-time linear equalization parameter, the decision feedback equalization parameter, and the ambient temperature value is stored in a fourth parameter set.

7. The method according to claim 6, characterized in that The method also includes: generating a second multidimensional relationship representation based on the second bit error rate, the third parameter set, and the fourth parameter set; wherein the second multidimensional relationship representation includes a relationship between a combination of the continuous-time linear equalization parameter, the decision feedback equalization parameter, and the ambient temperature value and the second bit error rate; Parameter combinations in the fourth parameter set are marked in the second multidimensional relational representation.

8. An electronic device, characterized in that: include: memory for storing computer programs; A processor, configured to implement the steps of the hard disk parameter testing method according to any one of claims 1 to 7 when executing the computer program.

9. A computer-readable storage medium, characterized in that The computer-readable storage medium stores a computer program, wherein when the computer program is executed by a processor, the steps of the method for testing hard disk parameters according to any one of claims 1 to 7 are implemented.

10. A computer program product, characterized in that The invention comprises a computer program, which implements the steps of the hard disk parameter testing method according to any one of claims 1 to 7 when executed by a processor.

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