Automatic test case zero code rapid generation method for microwave products

Abstract

The invention discloses a microwave product-oriented automatic test case zero code rapid generation method. The method comprises the following steps: designing a microwave product-oriented automatic test case zero code rapid generation program; instruments of different manufacturers and models are subjected to abstraction, inheritance and polymorphic processing, and one kind of instruments corresponds to one abstract instrument control class; test methods are atomized, different test methods are packaged, and one test method corresponds to one function; an abstract criterion class is established, and judgment of different test results is achieved; establishing a packaging control protocol class to realize state control of different microwave products; establishing a test case main program, and converting a series of test methods, instrument control, criteria and control protocols into test cases; and constructing a test sequence database to realize test parameter management of different products. According to the method, the zero codes of the automatic test cases of different microwave products can be quickly generated.

Description

Technical Field

[0001] The present application relates to the field of microwave product testing technology, and in particular to a method for rapid zero-code generation of automatic test cases for microwave products. Background Art

[0002] With the rapid development of radar technology, 5G communications, and satellite navigation, the types of microwave products are increasing. The test items, test equipment, and test criteria of different products are all different, and the corresponding automatic test cases are also different, which makes the automatic software development of products difficult. The software development threshold is high, the development process is cumbersome, the development efficiency is extremely low, and the version management is disordered.

[0003] Radio frequency microwave components refer to high-density integrated microelectronic products with certain functions that are formed by assembling bare chips, discrete devices, circuit chips and other components onto substrates, carriers or boxes through micro-assembly processes. In the field of microwave product manufacturing, performance index testing is a key link to ensure that product quality and performance meet standards. Since microwave products with different functions and models have different testing requirements, the different testing requirements are reflected in differences in their test conditions, test items, required test equipment, and test criteria. For example, a bandpass filter uses a vector network analyzer to test passband insertion loss and out-of-band suppression indicators; a point frequency source uses a spectrum analyzer to test output frequency, harmonic suppression and other indicators. This diverse testing requirement requires the development of dedicated automatic testing software for each microwave product, which brings many challenges to the development of traditional software use cases: 1) Developers need to have an in-depth understanding of the test characteristics of various microwave products and the interface specifications of related test equipment, which increases the difficulty of development and has a high technical threshold; 2) The development process is cumbersome. From requirements analysis, design, coding, to testing, each step requires a significant investment of time and effort. This results in long development cycles and low efficiency, making it difficult to meet the market demand for rapid iteration of microwave products. 3) Different developers have different coding habits, resulting in poor code reusability and often redundant development work; 4) There are many product-oriented test cases and versions, which makes management difficult.

[0004] Patent application publication number CN112540359A, a universal test system for microwave radars, discloses test equipment for receiving operator input and encapsulating it into a standard file. A hardware subsystem receives test information output by the test equipment and adjusts the interface adapter based on the test information. This patent standardizes only some of the test equipment's interfaces and fails to address the various instruments and combinations involved in the entire testing process, control methods for different DUTs, test algorithms, indicator criteria, data storage, or test case management. Furthermore, this patent applies only to microwave radar products and fails to implement zero-code development or universal testing for products with diverse testing requirements. Patent application publication number CN118972000A, an automated test system and method for microwave receiving components, discloses an automated test structure and system. The automated test structure includes photoelectric switches, solenoid valves, relays, and a slide. The automated test structure includes configuring vector network parameters, acquiring vector network data, and distributing calibration data. This patent focuses on hardware-level implementation of multi-channel automatic switching testing for a single product and fails to address the rapid zero-code development of test software cases for different products. Summary of the Invention

[0005] In response to the problems existing in the development of automatic test software for microwave products, such as poor adaptability to multiple varieties, low development efficiency, high technical barriers, and difficult version management, this application provides a method for rapid zero-code generation of automatic test cases for microwave products, which can realize rapid zero-code generation of automatic test cases for different microwave products.

[0006] This application discloses a method for rapid generation of automatic test cases with zero code for microwave products, which includes: Step 1: Design a zero-code rapid generation program for automatic test cases for microwave products based on the zero-code test case architecture consisting of the test interface layer, test control layer, test service layer, and data storage layer. Step 2: Abstract, inherit, and polymorphically process instruments of different manufacturers and models. Each type of instrument corresponds to an abstract instrument control class. Step 3: Atomize the test methods and encapsulate different test methods, with one test method corresponding to one function; Step 4: Create an abstract criterion class to determine different test results; Step 5: Establish a package control protocol class to implement status control of different microwave products; Step 6: Establish the test case main program to convert a series of test methods, instrument control, criteria and control protocols into test cases; Step 7: Build a test sequence database to manage test parameters for different products.

[0007] Furthermore, it also includes: generating test cases through a test case zero-code architecture; Generating test cases through the test case zero-code architecture includes: Step 11: If the product to be tested is a new product, the visual parameter recipe configuration interface reads the test parameters involved in the microwave product test specification and fills them in one by one. The on-site tester reviews and modifies the parameter recipe through the visual parameter recipe configuration interface, and automatically generates the parameter recipe with one click. The parameter recipe is an .xml file and is stored in the database. If the product to be tested is not a new product, the latest test case file is directly called from the database and the process proceeds to Step 12. Step 12: Fill in the parameter recipe file name into the test interface to load the parameter recipe into the main program. The loaded content includes the test process, test method, test criteria, instrument parameter settings, test protocol parameters, and production test cases. Step 13: Based on the test interface, one-click program download is used to achieve automatic testing of microwave products. Step 14: Based on the test interface, collect test data and upload it to the database.

[0008] Furthermore, the test case zero-code architecture includes: The test interface layer implements the user configuration test case parameter interface and test interface, the test control layer implements the management of test plans and scheduling, the test service layer provides the test control layer with test methods, test protocols, and test criteria service support, and the data storage layer implements test case storage and acquisition and test data storage and acquisition; In the test interface layer, the parameter configuration interface is used to provide a visual parameter configuration entry, and test cases are automatically generated through the configuration interface. The visual parameters include instrument parameters, test method parameters, and test criterion parameters used in the test; the test interface is used to provide test product information input, test case download, test case loading test result display, and test process information display; the test product information includes the product unique number, product name, and test time; in the parameter formula in the test interface layer, the microwave product test method library is configured in combination with relevant parameters; the microwave product test criterion library is configured by combining the criterion type and criterion conditions; the interface communication protocol library of the device under test is matched through the control protocol class; the criterion types include comparative fixed value type, simple calculation type, algorithm determination type, and custom type; the criterion conditions include greater than, less than, and mean not greater than; the relevant parameters include the test item name, frequency range, and control code; The test control layer is responsible for the control and management of test cases, test processes, and test results, providing process-level support for the test interface layer. By organizing the test methods, control protocols, criteria, and instrument control of the test service layer, it realizes the generation of test processes, the establishment of test cases, and the management of test results. It also realizes the storage management of specific test data and test cases for the data storage layer. The test service layer is implemented as a dynamic link library. The input of the dynamic link library is the parameters set in the test case. The dynamic library execution process is the implementation process of part of the test case. The dynamic link library contains a microwave product test item library, a microwave product test criterion library, a test device communication protocol library, an instrument control library, and a test method library. The instrument control library is called by the test method library. The data storage layer is specifically implemented as a database, which contains parameter test case files, historical data and test result data, realizes the network call of test case files and the dynamic update and file version tracing of the test case files of the same product, and realizes online verification of test results.

[0009] Furthermore, it also includes: Instruments of different manufacturers and models are abstracted, inherited and polymorphically processed. One type of instrument corresponds to an abstract instrument control class, typically including signal source control class, spectrum analyzer control class, vector network control class, DC power supply control class, power meter control class, noise meter control class, oscilloscope control class, and voltmeter control class. Instrument control is implemented in the test service layer of the zero-code architecture of the test case as a class library. Its external form is a dynamic library, which can be compiled separately and copied to the main program directory for running.

[0010] Furthermore, the step 3 includes: The test method consists of a set of test control instructions, algorithms and test processes. The test method is encapsulated in a test method library, which encapsulates its specific implementation and exposes its parameters for configuration. The test method is a string of independent executable code that can be called and executed by the test case main program. The test method library includes microwave product test items, which include gain, insertion loss, standing wave ratio, phase consistency, 1dB compression point, and output channel isolation. The test method is implemented in the test service layer as a class library, and its external form is a dynamic library. It can be compiled separately and copied to the main program directory for execution.

[0011] Furthermore, the encapsulation control protocol class includes: Different control protocols are encapsulated and a unified input and output function interface is exposed to the outside. The encapsulated control protocols include RS422, RS485, TTL, RS232, CAN, and SPI. The control protocol is tested in the service layer of the four-layer structure and implemented in the form of a class library. The external form is a dynamic library, which can be compiled separately and copied to the main program directory for running.

[0012] Furthermore, the abstract criterion class includes: The criteria are summarized into comparative fixed value type, simple calculation type, algorithm determination type and custom type. Different parameter interfaces are exposed for different criteria to achieve zero-code test judgment. The criterion is a two-dimensional array [X, Y] of the same length as the test result. The judgment algorithm is determined by the input criterion type. The program compares each point in the data to be judged with the criterion point by point through a loop to draw a conclusion. If the criterion is a single value, the program extends the length of the criterion to the length of the array corresponding to the data to be judged to achieve corresponding point comparison. The criterion type is custom, which is a string of executable code containing the test result judgment, and is executed by the test case main program. The criterion types include mean, root mean square value, greater than, less than, and allowed deviation percentage. The criterion library tests the service layer in the four-layer structure and is implemented as a class library. Its external form is a dynamic library, which is compiled separately and copied to the main program directory for operation.

[0013] Furthermore, it also includes encapsulating the control protocol to instantiate the test specification into a test sequence; The encapsulation control protocol instantiates the test specification into a test sequence, including: The test sequence is automatically generated from the test specification. The product test specification is unstructured data. Relevant parameters are extracted based on semantics, syntax, and context to generate the test sequence to be reviewed. Manual review and modification are performed to form the final test case; relevant parameters include instruments and test methods.

[0014] Furthermore, the constructing of the test sequence database includes: A network database is used to store test recipes, a relationship between the "product information table" and the "product use case table" is established, and a relational table structure is used to manage test case versions. The test program realizes direct test case downloading through the stored procedures of the database.

[0015] Furthermore, it also includes establishing a test case main program to control the test logic; The establishment of the test case main program to control the test logic includes: Control the test process logic. Enter the unique code of the product type in the test interface. The main test program searches for the product case in the database by the product type number, selects the correct version and downloads it. It parses the downloaded test case. After receiving the user's test instructions, it starts the test process, sets the instrument parameters and the parameters of the device under test, obtains the test data, compares the test data with the test criteria, and saves the test data until all required test items are completed. The control logic of the test case main program is in the test control layer, which includes the control logic of test process management, test case analysis, and test result comparison; the product control, instrument control, and test method specific implementation of the test case main program are in the test service layer.

[0016] Due to the adoption of the above technical solution, this application has the following advantages: 1. Construction of a unified test case framework: Establish a universal test architecture applicable to multiple categories of microwave products, including TR components, front-end components, filters, amplifiers, mixers, power splitters, frequency conversion components, frequency source components, and frequency synthesizer components, eliminating the repetitive development model of "one product, one software" in traditional solutions.

[0017] 2. Modular decoupling design: Through a layered architecture (user interaction layer / logic control layer / service support layer), physical isolation of test logic, device drivers, and business rules is achieved to reduce system coupling.

[0018] 3. Zero-code rapid generation: Provides a visual parameter recipe configuration tool that enables non-programmers to generate test cases through configuration rather than coding, shortening the development cycle of new product category test solutions from "days" to "minutes."

[0019] 4. Dynamic expansion capability: supports plug-and-play expansion of test items, judgment rules, communication protocols and other functions, avoiding frequent modifications of the main program and improving system maintainability.

[0020] 5. Online management of test case versions: Establish a database to realize online calling of test cases and dynamic version updates. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments recorded in the embodiments of the present application. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0022] Figure 1 This is a schematic diagram of a zero-code rapid generation architecture for automatic test cases for microwave products according to an embodiment of the present application; Figure 2This is a flow chart of a method for rapid zero-code generation of automatic test cases for microwave products according to an embodiment of the present application. DETAILED DESCRIPTION

[0023] The present application is further described with reference to the accompanying drawings and embodiments. The embodiments described are only a part of the embodiments of the present application, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field should fall within the scope of protection of the embodiments of the present application.

[0024] See also Figure 1 The present application provides an embodiment of a method for rapidly generating automatic test cases with zero code for microwave products, which includes: Step 1: Design a zero-code rapid generation program for automatic test cases for microwave products based on the zero-code test case architecture consisting of the test interface layer, test control layer, test service layer, and data storage layer. Step 2: Abstract, inherit, and polymorphically process instruments of different manufacturers and models. Each type of instrument corresponds to an abstract instrument control class. Step 3: Atomize the test methods and encapsulate different test methods, with one test method corresponding to one function; Step 4: Create an abstract criterion class to determine different test results; Step 5: Establish a package control protocol class to implement status control of different microwave products; Step 6: Establish the test case main program to convert a series of test methods, instrument control, criteria and control protocols into test cases; Step 7: Build a test sequence database to manage test parameters for different products.

[0025] Optionally, it further includes: generating test cases through a test case zero-code architecture; Generating test cases through the test case zero-code architecture includes: Step 11: If the product to be tested is a new product, the visual parameter recipe configuration interface reads the test parameters involved in the microwave product test specification and fills them in one by one. The on-site tester reviews and modifies the parameter recipe through the visual parameter recipe configuration interface, and automatically generates the parameter recipe with one click. The parameter recipe is an .xml file and is stored in the database. If the product to be tested is not a new product, the latest test case file is directly called from the database and the process proceeds to Step 12. Step 12: Fill in the parameter recipe file name into the test interface to load the parameter recipe into the main program. The loaded content includes the test process, test method, test criteria, instrument parameter settings, test protocol parameters, and production test cases. Step 13: Based on the test interface, one-click program download is used to achieve automatic testing of microwave products. Step 14: Based on the test interface, collect test data and upload it to the database.

[0026] Optionally, the test case zero-code architecture includes: The test interface layer implements the user configuration test case parameter interface and test interface, the test control layer implements the management of test plans and scheduling, the test service layer provides the test control layer with test methods, test protocols, and test criteria service support, and the data storage layer implements test case storage and acquisition and test data storage and acquisition; In the test interface layer, the parameter configuration interface is used to provide a visual parameter configuration entry, and test cases are automatically generated through the configuration interface. The visual parameters include instrument parameters, test method parameters, and test criterion parameters used in the test; the test interface is used to provide test product information input, test case download, test case loading test result display, and test process information display; the test product information includes the product unique number, product name, and test time; in the parameter formula in the test interface layer, the microwave product test method library is configured in combination with relevant parameters; the microwave product test criterion library is configured by combining the criterion type and criterion conditions; the interface communication protocol library of the device under test is matched through the control protocol class; the criterion types include comparative fixed value type, simple calculation type, algorithm determination type, and custom type; the criterion conditions include greater than, less than, and mean not greater than; the relevant parameters include the test item name, frequency range, and control code; The test control layer is responsible for the control and management of test cases, test processes, and test results, providing process-level support for the test interface layer. By organizing the test methods, control protocols, criteria, and instrument control of the test service layer, it realizes the generation of test processes, the establishment of test cases, and the management of test results. It also realizes the storage management of specific test data and test cases for the data storage layer. The test service layer is implemented as a dynamic link library. The input of the dynamic link library is the parameters set in the test case. The dynamic library execution process is the implementation process of part of the test case. The dynamic link library contains a microwave product test item library, a microwave product test criterion library, a test device communication protocol library, an instrument control library, and a test method library. The instrument control library is called by the test method library. The data storage layer is specifically implemented as a database, which contains parameter test case files, historical data and test result data, realizes the network call of test case files and the dynamic update and file version tracing of the test case files of the same product, and realizes online verification of test results.

[0027] Optionally, it also includes: Instruments of different manufacturers and models are abstracted, inherited and polymorphically processed. One type of instrument corresponds to an abstract instrument control class, typically including signal source control class, spectrum analyzer control class, vector network control class, DC power supply control class, power meter control class, noise meter control class, oscilloscope control class, and voltmeter control class. Instrument control is implemented in the test service layer of the zero-code architecture of the test case as a class library. Its external form is a dynamic library, which can be compiled separately and copied to the main program directory for running.

[0028] Optionally, step 3 includes: The test method consists of a set of test control instructions, algorithms and test processes. The test method is encapsulated in a test method library, which encapsulates its specific implementation and exposes its parameters for configuration. The test method is a string of independent executable code that can be called and executed by the test case main program. The test method library includes microwave product test items, which include gain, insertion loss, standing wave ratio, phase consistency, 1dB compression point, and output channel isolation. The test method is implemented in the test service layer as a class library, and its external form is a dynamic library. It can be compiled separately and copied to the main program directory for execution.

[0029] Optionally, the encapsulation control protocol class includes: Different control protocols are encapsulated and a unified input and output function interface is exposed to the outside. The encapsulated control protocols include RS422, RS485, TTL, RS232, CAN, and SPI. The control protocol is tested in the service layer of the four-layer structure and implemented in the form of a class library. The external form is a dynamic library, which can be compiled separately and copied to the main program directory for running.

[0030] Optionally, the abstract criterion class includes: The criteria are summarized into comparative fixed value type, simple calculation type, algorithm determination type and custom type. Different parameter interfaces are exposed for different criteria to achieve zero-code test judgment. The criterion is a two-dimensional array [X, Y] of the same length as the test result. The judgment algorithm is determined by the input criterion type. The program compares each point in the data to be judged with the criterion point by point through a loop to draw a conclusion. If the criterion is a single value, the program extends the length of the criterion to the length of the array corresponding to the data to be judged to achieve corresponding point comparison. The criterion type is custom, which is a string of executable code containing the test result judgment, and is executed by the test case main program. The criterion types include mean, root mean square value, greater than, less than, and allowed deviation percentage. The criterion library tests the service layer in the four-layer structure and is implemented as a class library. Its external form is a dynamic library, which is compiled separately and copied to the main program directory for operation.

[0031] Optionally, it further includes an encapsulation control protocol to instantiate the test specification into a test sequence; The encapsulation control protocol instantiates the test specification into a test sequence, including: The test sequence is automatically generated from the test specification. The product test specification is unstructured data. Relevant parameters are extracted based on semantics, syntax, and context to generate the test sequence to be reviewed. Manual review and modification are performed to form the final test case; relevant parameters include instruments and test methods.

[0032] Optionally, the constructing a test sequence database includes: A network database is used to store test recipes, a relationship between the "product information table" and the "product use case table" is established, and a relational table structure is used to manage test case versions. The test program realizes direct test case downloading through the stored procedures of the database.

[0033] Optionally, it also includes establishing a test case main program to control the test logic; The establishment of the test case main program to control the test logic includes: Control the test process logic. Enter the unique code of the product type in the test interface. The main test program searches for the product case in the database by the product type number, selects the correct version and downloads it. It parses the downloaded test case. After receiving the user's test instructions, it starts the test process, sets the instrument parameters and the parameters of the device under test, obtains the test data, compares the test data with the test criteria, and saves the test data until all required test items are completed. The control logic of the test case main program is in the test control layer, which includes the control logic of test process management, test case analysis, and test result comparison; the product control, instrument control, and test method specific implementation of the test case main program are in the test service layer.

[0034] In order to facilitate the understanding of this application, the following Figure 1 The architecture shown, combined with Figure 2 The process shown is used to illustrate the embodiment of the present application. The present application is not limited to the specific embodiment, and general replacements known to those skilled in the art are also included in the scope of protection of the present application.

[0035] Example 1 (a down-conversion IP core) The performance requirements are as follows: RF input: 2GHz~18GHz IF output: 1.3GHz~2.3GHz Intermediate frequency gain range: less than or equal to 28dB Intermediate frequency gain fluctuation: less than or equal to ±3.75dB (frequency range 5.5~8GHz) The steps for quickly generating automatic test cases for the downconversion IP core with zero code are as follows: 1) Generate parameter recipes with one click based on the visual parameter recipe configuration interface.

[0036] Configure the microwave product test item library parameters as follows: test type (vector network), test item name (gain), frequency bandwidth (start frequency: 2 GHz; end frequency: 18 GHz; first local oscillator input: 24.5 GHz to 39.5 GHz, power: 5 dBm; second local oscillator input: 20.2 GHz, power: 5 dBm), and control code (0x00, 0x20, 0x00, 0x10).

[0037] Configure the microwave product criteria library parameters as follows: IF gain: criterion type (not greater than), criterion condition (x-coordinate 2~18GHz, y-coordinate 28dB).

[0038] Intermediate frequency gain fluctuation: criterion type (fluctuation), criterion condition (y-coordinate -3.75dB~+3.75dB).

[0039] Configure the microwave product communication protocol library parameters to: TTL control (digital IO card).

[0040] Generate the downconverter IP core parameter recipe (.xml file).

[0041] 2) Recipe loading and test case generation: Fill in the parameter recipe file name into the test interface to load the parameter recipe into the main program and quickly generate test cases.

[0042] 3) One-click download and automatic testing: Based on the test interface, one-click download of the program enables automatic testing of microwave products.

[0043] 4) Data collection and upload: Based on the test interface, collect test data and upload it to the database.

[0044] Example 2 (a certain transmitting component) The performance requirements are as follows: RF input: 17.7GHz~20.2GHz Output power: greater than or equal to 13dBm Output standing wave: less than or equal to 2:1 The steps for quickly generating the emission component's automatic test case with zero code are as follows: 1) Generate parameter recipes with one click based on the visual parameter recipe configuration interface.

[0045] Configure the microwave product test item library parameters as follows: Test type (vector network), test item name (power, standing wave), frequency bandwidth (start frequency: 17.7GHz; end frequency: 20.2Ghz; power: -20dBm), control code (0x00, 0x55).

[0046] Configure the microwave product criteria library parameters as follows: Output power: Criterion type (not less than), criterion conditions (x-coordinate 17.7 GHz to 20.2 GHz, y-coordinate 13 dBm).

[0047] Output standing wave: criterion type (not greater than), criterion condition (x-coordinate 17.7GHz~20.2GHz, y-coordinate 2).

[0048] Configure the microwave product communication protocol library parameters to: TTL control (digital IO card).

[0049] Generate the parameter recipe (.xml file) for the emission component.

[0050] 2) Recipe loading and test case generation: Fill in the parameter recipe file name into the test interface to load the parameter recipe into the main program and quickly generate test cases.

[0051] 3) One-click download and automatic testing: Based on the test interface, one-click download of the program enables automatic testing of microwave products.

[0052] 4) Data collection and upload: Based on the test interface, collect test data and upload it to the database.

[0053] Example 3 (a frequency synthesizer component) The performance requirements are as follows: Control interface: SPI three-wire control Output frequency: 17GHz Output power: not less than 6dBm Phase noise: less than or equal to -75dBc / Hz@1kHz The steps for quickly generating the emission component's automatic test case with zero code are as follows: 1) Generate parameter recipes with one click based on the visual parameter recipe configuration interface.

[0054] Configure the microwave product test item library parameters as follows: Test type (spectrum analyzer), test item name (phase noise 1kHz), center frequency (17GHz), frequency bandwidth (100MHz), control code (customized in the dynamic library).

[0055] Configure the microwave product criterion library parameters as follows: criterion type (not greater than), criterion condition (x-coordinate 17GH-50MHz~17GHz+50MHz, y-coordinate -75dBc).

[0056] Configure the microwave product communication protocol library parameters to SPI.

[0057] Generate the parameter recipe (.xml file) of the frequency synthesizer component.

[0058] 2) Recipe loading and test case generation: Fill in the parameter recipe file name into the test interface to load the parameter recipe into the main program and quickly generate test cases.

[0059] 3) One-click download and automatic testing: Based on the test interface, one-click download of the program enables automatic testing of microwave products.

[0060] 4) Data collection and upload: Based on the test interface, collect test data and upload it to the database.

[0061] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present application and not to limit them. Although the present application has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present application can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present application should be included in the scope of protection of the claims of the present application.

Claims

1. A zero-code rapid generation method for automatic test cases for microwave products, characterized by: include: Step 1: Design a zero-code rapid generation program for automatic test cases for microwave products based on the zero-code test case architecture consisting of the test interface layer, test control layer, test service layer, and data storage layer. Step 2: Abstract, inherit, and polymorphically process instruments of different manufacturers and models. Each type of instrument corresponds to an abstract instrument control class. Step 3: Atomize the test methods and encapsulate different test methods, with one test method corresponding to one function; Step 4: Create an abstract criterion class to determine different test results; Step 5: Establish a package control protocol class to implement status control of different microwave products; Step 6: Establish the test case main program to convert a series of test methods, instrument control, criteria and control protocols into test cases; Step 7: Build a test sequence database to manage test parameters for different products.

2. The method for quickly generating automatic test cases with zero code for microwave products according to claim 1, characterized in that: Also includes: Generate test cases through zero-code test case architecture; Generating test cases through the test case zero-code architecture includes: Step 11: If the product to be tested is a new product, the visual parameter recipe configuration interface reads the test parameters involved in the microwave product test specification and fills them in one by one. The on-site tester reviews and modifies the parameter recipe through the visual parameter recipe configuration interface, and automatically generates the parameter recipe with one click. The parameter recipe is an .xml file and is stored in the database. If the product to be tested is not a new product, the latest test case file is directly called from the database and the process proceeds to Step 12. Step 12: Fill in the parameter recipe file name into the test interface to load the parameter recipe into the main program. The loaded content includes the test process, test method, test criteria, instrument parameter settings, test protocol parameters, and production test cases. Step 13: Based on the test interface, one-click program download is used to achieve automatic testing of microwave products. Step 14: Based on the test interface, collect test data and upload it to the database.

3. The zero-code rapid generation method for automatic test cases for microwave products according to claim 1 is characterized in that: The test case zero-code architecture includes: The test interface layer implements the user configuration test case parameter interface and test interface, the test control layer implements the management of test plans and scheduling, the test service layer provides the test control layer with test methods, test protocols, and test criteria service support, and the data storage layer implements test case storage and acquisition and test data storage and acquisition; In the test interface layer, the parameter configuration interface is used to provide a visual parameter configuration entry, and test cases are automatically generated through the configuration interface. The visual parameters include instrument parameters, test method parameters, and test criterion parameters used in the test; the test interface is used to provide test product information input, test case download, test case loading test result display, and test process information display; the test product information includes the product unique number, product name, and test time; in the parameter formula in the test interface layer, the microwave product test method library is configured in combination with relevant parameters; the microwave product test criterion library is configured by combining the criterion type and criterion conditions; the interface communication protocol library of the device under test is matched through the control protocol class; the criterion types include comparative fixed value type, simple calculation type, algorithm determination type, and custom type; the criterion conditions include greater than, less than, and mean not greater than; the relevant parameters include the test item name, frequency range, and control code; The test control layer is responsible for the control and management of test cases, test processes, and test results, providing process-level support for the test interface layer. By organizing the test methods, control protocols, criteria, and instrument control of the test service layer, it realizes the generation of test processes, the establishment of test cases, and the management of test results. It also realizes the storage management of specific test data and test cases for the data storage layer. The test service layer is implemented as a dynamic link library. The input of the dynamic link library is the parameters set in the test case. The dynamic library execution process is the implementation process of part of the test case. The dynamic link library contains a microwave product test item library, a microwave product test criterion library, a test device communication protocol library, an instrument control library, and a test method library. The instrument control library is called by the test method library. The data storage layer is specifically implemented as a database, which contains parameter test case files, historical data and test result data, realizes the network call of test case files and the dynamic update and file version tracing of the test case files of the same product, and realizes online verification of test results.

4. The zero-code rapid generation method for automatic test cases for microwave products according to claim 1 is characterized in that: Also includes: Instruments of different manufacturers and models are abstracted, inherited and polymorphically processed. One type of instrument corresponds to an abstract instrument control class, typically including signal source control class, spectrum analyzer control class, vector network control class, DC power supply control class, power meter control class, noise meter control class, oscilloscope control class, and voltmeter control class. Instrument control is implemented in the test service layer of the zero-code architecture of the test case as a class library. Its external form is a dynamic library, which can be compiled separately and copied to the main program directory for running.

5. The zero-code rapid generation method for automatic test cases for microwave products according to claim 1 is characterized in that: The step 3 comprises: The test method consists of a set of test control instructions, algorithms and test processes. The test method is encapsulated in a test method library, which encapsulates its specific implementation and exposes its parameters for configuration. The test method is a string of independent executable code that can be called and executed by the test case main program. The test method library includes microwave product test items, which include gain, insertion loss, standing wave ratio, phase consistency, 1dB compression point, and output channel isolation. The test method is implemented in the test service layer as a class library, and its external form is a dynamic library. It can be compiled separately and copied to the main program directory for execution.

6. The zero-code rapid generation method for automatic test cases for microwave products according to claim 1 is characterized in that: The encapsulation control protocol class includes: Different control protocols are encapsulated and a unified input and output function interface is exposed to the outside. The encapsulated control protocols include RS422, RS485, TTL, RS232, CAN, and SPI. The control protocol is tested in the service layer of the four-layer structure and implemented in the form of a class library. The external form is a dynamic library, which can be compiled separately and copied to the main program directory for running.

7. The zero-code rapid generation method for automatic test cases for microwave products according to claim 1 is characterized in that: The abstract criterion class includes: The criteria are summarized into comparative fixed value type, simple calculation type, algorithm determination type and custom type. Different parameter interfaces are exposed for different criteria to achieve zero-code test judgment. The criterion is a two-dimensional array [X, Y] of the same length as the test result. The judgment algorithm is determined by the input criterion type. The program compares each point in the data to be judged with the criterion point by point through a loop to draw a conclusion. If the criterion is a single value, the program extends the length of the criterion to the length of the array corresponding to the data to be judged to achieve corresponding point comparison. The criterion type is custom, which is a string of executable code containing the test result judgment, and is executed by the test case main program. The criterion types include mean, root mean square value, greater than, less than, and allowed deviation percentage. The criterion library tests the service layer in the four-layer structure and is implemented as a class library. Its external form is a dynamic library, which is compiled separately and copied to the main program directory for operation.

8. The zero-code rapid generation method for automatic test cases for microwave products according to claim 2 is characterized in that: It also includes an encapsulation control protocol to instantiate the test specification into a test sequence; The encapsulation control protocol instantiates the test specification into a test sequence, including: Test sequences are automatically generated from test specifications. Product test specifications are unstructured data. Relevant parameters are extracted based on semantics, syntax, and context to generate test sequences to be reviewed. Manual review and modification are then performed to form the final test cases. Relevant parameters include instruments and test methods.

9. The zero-code rapid generation method for automatic test cases for microwave products according to claim 1, characterized in that: The constructing of the test sequence database comprises: A network database is used to store test recipes, a relationship between the "product information table" and the "product use case table" is established, and a relational table structure is used to manage test case versions. The test program can directly download test cases through the stored procedures of the database.

10. The zero-code rapid generation method for automatic test cases for microwave products according to claim 2, characterized in that: It also includes establishing the test case main program to control the test logic; The establishment of the test case main program to control the test logic includes: Control the test process logic. Enter the unique code of the product type in the test interface. The main test program searches for the product case in the database by the product type number, selects the correct version and downloads it. It parses the downloaded test case. After receiving the user's test instructions, it starts the test process, sets the instrument parameters and the parameters of the device under test, obtains the test data, compares the test data with the test criteria, and saves the test data until all required test items are completed. The control logic of the test case main program is in the test control layer, which includes the control logic of test process management, test case analysis, and test result comparison; the product control, instrument control, and test method specific implementation of the test case main program are in the test service layer.

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