A multi-sensor automated capacitance condition detection device

Abstract

The application relates to the technical field of capacitance detection, in particular to a multi-sensor automatic capacitance state detection device. The device detects the to-be-detected capacitance through a capacity detection assembly and an optical detection assembly, controls the input of the fault capacitance, and the feeding mechanism grabs the to-be-detected capacitance from the conveying mechanism to the index plate assembly. The clamping assembly for fixing the to-be-detected capacitance is provided with a linkage mechanism and a guide block. The periphery of the index plate assembly is sequentially provided with the capacity detection assembly, the optical detection assembly and a resistance test assembly. The capacitance is detected through multiple detection devices to prevent the fault capacitance from entering the next process.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of capacitance detection, in particular to a multi-sensor automatic capacitance state detection device. BACKGROUND

[0002] Capacitance detection is a key link in evaluating the performance of capacitors, mainly by measuring whether the actual capacitance value meets the nominal value and the allowable deviation range. Common detection equipment includes LCR meter, digital bridge or multimeter with capacitance file, among which LCR meter is the first choice due to its support for multiple frequencies and high precision (such as 0.1% error). During detection, it is necessary to ensure that the capacitor is completely discharged and avoid parallel circuit interference, and if necessary, it needs to be disassembled and tested separately. For electrolytic capacitors, a rated DC voltage needs to be applied for polarization before measurement, while ceramic or film capacitors can be directly tested. Abnormal capacitance value (such as significant decrease or increase) may indicate that the medium is aging (electrolytic capacitor drying), internal electrode corrosion or temperature characteristic deterioration. In the switching power supply or filter circuit, capacitance attenuation will cause ripple increase or timing anomaly, so capacitance detection is an important step for fault prevention and quality control, which needs to be combined with ESR, leakage current and other parameters for comprehensive evaluation. The existing technology is relatively single in the way of capacitance detection, and multiple processes need to be set up for different types of detection in the production process, and the deformation of the capacitor pin is easy to occur during the detection process, affecting the next process. SUMMARY

[0003] To achieve the above purpose, the present application provides the following technical scheme:

[0004] A multi-sensor automatic capacitance state detection device detects the to-be-tested capacitor through a capacitance detection assembly and an optical detection assembly, controls the input of faulty capacitors, and a feeding mechanism grabs the to-be-tested capacitor from a conveying mechanism to a dividing disc assembly; the dividing disc assembly is sequentially provided with a capacitance detection assembly, an optical detection assembly and a resistance test assembly in the circumferential direction; a clamping assembly on the dividing disc assembly clamps and fixes the to-be-tested capacitor, and makes the to-be-tested capacitor in a to-be-tested state; the rotating disc of the dividing disc assembly rotates, and the to-be-tested capacitor in the to-be-tested state is sequentially moved to below the capacitance detection assembly, the optical detection assembly and the resistance test assembly; a linkage mechanism is arranged in the clamping assembly, and the linkage mechanism and an actuator cooperate to clamp the pin of the to-be-tested capacitor, so that the to-be-tested capacitor is in the to-be-tested state; a guide block and a pressing block are further arranged in the clamping assembly to prevent deformation of the pin during testing.

[0005] Further, the feeding mechanism includes a first feeding translation mechanism and a second feeding translation mechanism to change the horizontal position of the feeding grabbing mechanism of the feeding mechanism; and a feeding lifting mechanism of the feeding mechanism changes the vertical height of the feeding grabbing mechanism.

[0006] Further, the discharging mechanism comprises a discharging moving mechanism and a discharging grabbing mechanism arranged at the movable end of the discharging moving mechanism; the discharging grabbing mechanism moves the tested capacitor from the clamping assembly of the indexing disc assembly to the buffer assembly; the buffer assembly comprises a first storage groove and a second storage groove.

[0007] Further, one side of the resistance testing assembly is further provided with a discharging disc; after the resistance testing assembly completes the detection of the tested capacitor, the tested capacitor that fails to pass the detection is moved to the discharging disc.

[0008] Further, the rotating disc of the indexing disc assembly is provided with a plurality of clamping assemblies in the circumferential direction; the clamping assembly comprises a fixed seat, and the fixed seat is provided with a movable seat; the fixed seat and the movable seat are oppositely arranged, and a guide block is arranged between the fixed seat and the movable seat; a linkage mechanism is connected between the fixed seat and the movable seat; the actuator on the fixed seat drives the movable seat to slide, and the movable seat drives the linkage mechanism to make the pin of the tested capacitor abut against the test pin on the movable seat, so that the tested capacitor is in the tested state.

[0009] Further, the movable seat is further provided with a pressing block; the pressing block and the guide block are arranged below the sliding block of the linkage mechanism; while the actuator drives the movable seat and the linkage mechanism to clamp the pin of the tested capacitor, the pressing block on the movable seat and the guide block clamp the lower part of the pin of the tested capacitor.

[0010] Further, the lower end of the accommodating part of the fixed seat accommodating the tested capacitor is slidably provided with the sliding block; the movable seat is provided with a mounting seat, and the mounting seat is arranged in correspondence with the sliding block; the mounting seat is provided with two test pins corresponding to the pins of the tested capacitor; the linkage mechanism has a connecting rod mechanism; one end of the connecting rod mechanism is connected with the sliding block, and the other end of the connecting rod mechanism is connected with the movable seat.

[0011] Further, the connecting rod mechanism comprises a lever and a driving rod; the middle part of the lever is hinged to the supporting plate of the fixed seat; one end of the lever is provided with a waist-shaped hole, and the pin shaft of the sliding block is arranged in the waist-shaped hole; the other end of the lever is hinged with the driving rod, and the driving rod is rotatably arranged on the movable seat.

[0012] Further, the guide block comprises a base, and a wedge block is arranged on the base; inclined guide surfaces are arranged on both sides of the wedge block; a first mounting groove is arranged at the upper end of the guide surface; a fixed pressing block is arranged in the first mounting groove; the side surface of the fixed pressing block is a first inclined surface; the first inclined surface intersects with the guide surface and has a certain included angle.

[0013] Further, the pressing block is located in the position adjacent to the lower side of the test needle mounting seat; the pressing block has two abutting blocks, and the two abutting blocks are located on the two sides of the guide block; the opposite side surface of the abutting block is an inclined surface corresponding to the guide surface of the guide block; the upper end of the abutting block is provided with a second mounting groove; the second mounting groove is provided with a movable pressing block; the movable pressing block has a second inclined surface matched with the first inclined surface of the guide block.

[0014] Compared with the prior art, the present application has the following advantages: the capacitor is detected by multiple detection devices to prevent the faulty capacitor from entering the next process; the clamping assembly for fixing the capacitor to be detected has a linkage mechanism and a guide block, so that the capacitor can be easily put into the clamping assembly when the clamping assembly is opened, and the linkage mechanism clamps the capacitor pin and connects the test needle with the pin when the clamping assembly is closed, facilitating the detection of the external detection device; meanwhile, the guide block and the pressing block clamp the capacitor pin from multiple directions, which can reshape the pin and avoid pin deformation during detection. BRIEF DESCRIPTION OF DRAWINGS

[0015] Figure 1 It is a schematic diagram of the overall structure of the multi-sensor automatic capacitor state detection device of the present application;

[0016] Figure 2 It is a schematic diagram of the overall structure of the multi-sensor automatic capacitor state detection device of the present application;

[0017] Figure 3 It is a schematic diagram of the structure of the feeding mechanism of the present application;

[0018] Figure 4 It is a schematic diagram of the structure of the discharging mechanism of the present application;

[0019] Figure 5 It is a schematic diagram of the structure of the index plate assembly of the present application;

[0020] Figure 6 It is a schematic diagram of the structure of the clamping assembly of the present application;

[0021] Figure 7 It is a schematic diagram of the structure of the clamping assembly of the present application;

[0022] Figure 8 It is a schematic diagram of the internal structure of the clamping assembly of the present application;

[0023] Figure 9 It is a schematic diagram of the structure at the guide block of the present application;

[0024] Figure 10 It is a schematic diagram of the structure of the guide block of the present application;

[0025] Figure 11A schematic view of the structure of the briquetting of the present application;

[0026] In the figure:

[0027] Conveying mechanism 1;

[0028] Feeding mechanism 2, first feeding translation mechanism 21, second feeding translation mechanism 22, feeding lifting mechanism 23, feeding grabbing mechanism 24;

[0029] Capacity detection assembly 3; optical detection assembly 4; resistance test assembly 5; blanking disc 6;

[0030] Discharging mechanism 7, discharging grabbing mechanism 71, discharging moving mechanism 72;

[0031] Buffer assembly 8, first storage groove 81, second storage groove 82;

[0032] Index plate assembly 9, rotating disc 90, clamping assembly 91, fixed seat 92, support plate 921, movable seat 93, actuator 94, linkage mechanism 95, driving rod 951, lever 952, sliding block 953, pin shaft 9531, guide block 96, base 961, wedge block 962, guide surface 963, first mounting groove 964, fixed pressing block 965, first inclined surface 966, test needle 97, mounting seat 971, pressing block 98, abutting block 981, second mounting groove 982, movable pressing block 983, second inclined surface 984;

[0033] Capacitor to be tested 10, pin 101. DETAILED DESCRIPTION

[0034] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of protection of the present application.

[0035] The following will be described according to the drawings in the embodiments of the present application Figures 1-11The application is described in detail, the multi-sensor automatic capacitor state detection device of the application detects the to-be-detected capacitor 10 through the capacity detection assembly 3 and the optical detection assembly 4, controls the input of the fault capacitor, the feeding mechanism 2 grabs the to-be-detected capacitor 10 from the conveying mechanism 1 to the index plate assembly 9; the capacity detection assembly 3, the optical detection assembly 4 and the resistance test assembly 5 are sequentially arranged in the circumferential direction of the index plate assembly 9; the clamping assembly 91 on the index plate assembly 9 clamps and fixes the to-be-detected capacitor 10, and makes the to-be-detected capacitor 10 in a to-be-detected state; the rotating disc 90 of the index plate assembly 9 rotates, and the to-be-detected capacitor 10 in the to-be-detected state is sequentially moved to below the capacity detection assembly 3, the optical detection assembly 4 and the resistance test assembly 5; the linkage mechanism 95 is arranged in the clamping assembly 91, the pin 101 of the to-be-detected capacitor 10 is clamped by the linkage mechanism 95 and the actuator 94, and the to-be-detected capacitor 10 is in the to-be-detected state; the guide block 96 and the pressing block 98 are further arranged in the clamping assembly 91, and the deformation of the pin 101 caused in the test process is prevented.

[0036] Specifically, the linkage mechanism 95 in the clamping assembly 91 of the application makes the clamping assembly 91 have a larger space for accommodating the pin 101 when the clamping assembly 91 is in an open state, facilitates the feeding mechanism 2 to put the to-be-detected capacitor 10 into the clamping assembly 91, and prevents the deformation of the pin 101 in the process of putting the to-be-detected capacitor 10.

[0037] The guide block 96 and the pressing block 98 in the clamping assembly 91 can clamp and fix the pin 101 of the to-be-detected capacitor 10 from multiple directions, and realize the shaping of the pin 101.

[0038] The multi-sensor automatic capacitor state detection device of the application can perform multiple detections on the to-be-detected capacitor 10, push the detection data to a server and automatically push the data in a mobile APP, and control the input of the fault capacitor into the next production process in real time.

[0039] The feeding mechanism 2 comprises a first feeding translation mechanism 21 and a second feeding translation mechanism 22 to change the horizontal position of the feeding grabbing mechanism 24 of the feeding mechanism 2; the feeding lifting mechanism 23 of the feeding mechanism 2 changes the vertical height of the feeding grabbing mechanism 24.

[0040] Referring to the accompanying drawings Figure 3The first feeding translation mechanism 21 of the feeding mechanism 2 realizes the longitudinal movement of the upper gripping mechanism. The second feeding translation mechanism 22 is set at the movable end of the first feeding translation mechanism 21 and realizes the lateral movement of the upper gripping mechanism. The feeding lifting mechanism 23 is set at the movable end of the second feeding translation mechanism 22 and realizes the vertical movement of the feeding gripping mechanism 24. The feeding gripping mechanism 24 grabs the capacitor 10 to be tested on the conveying mechanism 1. The feeding gripping mechanism 24 is moved by the first feeding translation mechanism 21, the second feeding translation mechanism 22, and the feeding lifting mechanism 23, and the capacitor 10 to be tested on the feeding gripping mechanism 24 is placed into the clamping component 91 of the indexing plate assembly 9.

[0041] The feeding mechanism 7 includes a feeding moving mechanism 72 and a feeding gripping mechanism 71 disposed at the movable end of the feeding moving mechanism 72; the feeding gripping mechanism 71 moves the tested capacitor 10 from the clamping component 91 of the indexing plate assembly 9 to the buffer assembly 8; the buffer assembly 8 includes a first storage slot 81 and a second storage slot 82.

[0042] See appendix Figure 4 The feeding and moving mechanism 72 includes a horizontal moving mechanism, a vertical moving mechanism and a lifting mechanism. The feeding and gripping mechanism 71 at the movable end of the feeding and moving mechanism 72 puts the capacitor to be tested 10 into the first storage slot 81 or the second storage slot 82.

[0043] A material drop tray 6 is also provided on one side of the resistance testing component 5; after the resistance testing component 5 completes the testing of the capacitor under test 10, it moves the capacitor under test 10 that fails the test to the material drop tray 6.

[0044] The multi-sensor automated capacitor status detection device of the present invention detects the capacity of the capacitor under test 10 after the capacitor is discharged by the capacity detection component 3, detects whether there are defects such as cracks or bulges on the surface of the capacitor under test 10 by the optical detection component 4, and measures the leakage current by applying DC voltage to the capacitor under test 10 by the resistance testing component 5. After completing the above detection, the capacitor under test 10 that fails the detection is moved to the material drop tray 6 to prevent the faulty capacitor from being put into the next production process.

[0045] The indexing disk assembly 9 has multiple clamping components 91 arranged circumferentially on the turntable 90. Each clamping component 91 includes a fixed base 92, on which a movable base 93 is provided. The fixed base 92 and the movable base 93 are arranged facing each other, and a guide block 96 is provided between the fixed base 92 and the movable base 93. A linkage mechanism 95 is connected between the fixed base 92 and the movable base 93. An actuator 94 on the fixed base 92 drives the movable base 93 to slide, and the movable base 93 drives the linkage mechanism 95 to make the pin 101 of the capacitor under test 10 press against the test pin 97 on the movable base 93, so that the capacitor under test 10 is in the test state.

[0046] See appendix Figure 5 The clamping components 91 are circumferentially arranged at equal intervals on the upper surface of the turntable 90. By rotating the turntable 90, the capacitor 10 to be tested on the clamping components 91 is moved sequentially to the bottom of the capacitance detection component 3, the optical detection component 4, and the resistance testing component 5 and positioned.

[0047] The movable seat 93 is also provided with a pressure block 98; the pressure block 98 and the guide block 96 are located below the sliding block 953 of the linkage mechanism 95; while the actuator 94 drives the movable seat 93 and the linkage mechanism 95 to clamp the pin 101 of the capacitor under test 10, the pressure block 98 and the guide block 96 on the movable seat 93 clamp the lower part of the pin 101 of the capacitor under test 10.

[0048] The lower end of the receiving portion of the fixed base 92 that accommodates the capacitor 10 under test is slidably disposed with the sliding block 953; the movable base 93 is provided with a mounting base 971, which is disposed at the same height as the sliding block 953; the mounting base 971 is provided with two test pins 97 corresponding to the pins 101 of the capacitor 10 under test; the linkage mechanism 95 has a linkage mechanism; one end of the linkage mechanism is connected to the sliding block 953, and the other end of the linkage mechanism is connected to the movable base 93.

[0049] See appendix Figures 6-9When the feeding mechanism 2 places the capacitor under test into the clamping assembly 91, the movable seat 93 is in an open state away from the fixed seat 92. At the same time, the sliding block 953 of the linkage mechanism 95 retracts into the interior of the fixed seat 92, giving the leads 101 of the capacitor under test 10 more space to facilitate the placement of the capacitor under test 10 into the clamping assembly 91. This also facilitates the contact of the leads 101 with the guide block 96 and enables the guiding and positioning of the leads 101. After the capacitor under test 10 is placed into the clamping assembly 91, the actuator 94 drives the movable seat 93 to move towards the fixed seat 92. The movable seat 93 pushes the sliding block 953 to move laterally and extend from the interior of the fixed seat 92 through the linkage mechanism 95. When the movable seat 93 and the fixed seat 92 clamp and close, the sliding block 953 closes with the mounting seat 971 of the test probe 97, realizing the connection between the test probe 97 and the two leads 101 of the capacitor under test 10. The subsequent capacitor detection device realizes the detection of the capacitor under test 10 through the connection with the test probe 97.

[0050] The linkage mechanism includes a lever 952 and a drive rod 951; the middle part of the lever 952 is hinged to the support plate 921 of the fixed seat 92; one end of the lever 952 is provided with an oblong hole, and the pin 9531 of the sliding block 953 is provided in the oblong hole; the other end of the lever 952 is hinged to the drive rod 951, and the drive rod 951 is rotatably mounted on the movable seat 93.

[0051] The guide block 96 includes a base 961, on which a wedge 962 is provided; inclined guide surfaces 963 are provided on both sides of the wedge 962; a first mounting groove 964 is provided at the upper end of the guide surface 963; a fixing block 965 is provided in the first mounting groove 964; the side of the fixing block 965 is a first inclined surface 966; the first inclined surface 966 intersects the guide surface 963 and has a certain included angle.

[0052] The pressure block 98 is located near the test needle 97 mounting base 971 below it; the pressure block 98 has two abutment blocks 981, which are located on both sides of the guide block 96; the opposing sides of the abutment blocks 981 are inclined surfaces corresponding to the guide surface 963 of the guide block 96; a second mounting groove 982 is provided at the upper end of the abutment block 981; a movable pressure block 983 is provided in the second mounting groove 982; the movable pressure block 983 has a second inclined surface 984, which cooperates with the first inclined surface 966 of the guide block 96.

[0053] See Figures 10-11The wedge block 962 has two inclined guide surfaces 963 on both sides, and the opening of the two inclined guide surfaces 963 gradually increases from top to bottom, which can guide the pin 101 of the capacitor 10 to be tested. In one embodiment of the present invention, the angle between the first inclined surface 966 of the fixed pressure block 965 and the guide surface 963 is 40 degrees. When the movable seat 93 moves to the fixed seat 92 to close, the inner side of the pressure block 98 moves parallel to the guide surface 963. The first inclined surface 966 and the second inclined surface 984 have a 45-degree angle with the movement direction of the pressure block 98, so that when the movable seat 93 and the fixed seat 92 are closed, the pin 101 of the capacitor 10 to be tested can be squeezed in different directions, preventing the pin 101 from being deformed during the test and shaping the pin 101.

[0054] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A multi-sensor automated capacitor status detection device, which detects the capacitor (10) under test through a capacitance detection component (3) and an optical detection component (4) and controls the activation of faulty capacitors, characterized in that: The feeding mechanism (2) picks up the capacitor (10) to be tested from the conveying mechanism (1) and places it onto the indexing plate assembly (9); The indexing disk assembly (9) is provided with a capacity detection assembly (3), an optical detection assembly (4) and a resistance testing assembly (5) in sequence around its circumference. The clamping component (91) on the indexing plate assembly (9) clamps and fixes the capacitor to be tested (10), and puts the capacitor to be tested (10) in the test state. The turntable (90) of the indexing plate assembly (9) rotates, causing the capacitor (10) under test to move sequentially to below the capacitance detection assembly (3), the optical detection assembly (4), and the resistance testing assembly (5). The clamping assembly (91) is provided with a linkage mechanism (95). The linkage mechanism (95) and the actuator (94) cooperate to clamp the pin (101) of the capacitor under test (10), so that the capacitor under test (10) is in the test state. The clamping assembly (91) is also provided with a guide block (96) and a pressure block (98) to prevent deformation of the pin (101) during the test; A material drop plate (6) is also provided on one side of the resistance testing component (5). After the resistance testing component (5) completes the test on the capacitor (10) to be tested, it moves the capacitor (10) to be tested that fails the test to the dropping tray (6). The indexing disk assembly (9) has multiple clamping components (91) arranged in the circumferential direction of the turntable (90). The clamping assembly (91) includes a fixed base (92) and a movable base (93) is provided on the fixed base (92); The fixed seat (92) and the movable seat (93) are arranged facing each other, and a guide block (96) is provided between the fixed seat (92) and the movable seat (93). A linkage mechanism (95) is connected between the fixed seat (92) and the movable seat (93). The actuator (94) on the fixed seat (92) drives the movable seat (93) to slide, and the movable seat (93) drives the linkage mechanism (95) to make the pin (101) of the capacitor under test (10) press against the test pin (97) on the movable seat (93), so that the capacitor under test (10) is in the test state. The movable seat (93) is also provided with a pressure block (98); The pressure block (98) and the guide block (96) are located below the sliding block (953) of the linkage mechanism (95); While the actuator (94) drives the movable seat (93) and the linkage mechanism (95) to clamp the pin (101) of the capacitor under test (10), the pressure block (98) and the guide block (96) on the movable seat (93) clamp the lower part of the pin (101) of the capacitor under test (10).

2. The multi-sensor automated capacitance state detection device according to claim 1, characterized in that: The feeding mechanism (2) includes a first feeding translation mechanism (21) and a second feeding translation mechanism (22) to change the horizontal position of the feeding gripping mechanism (24) of the feeding mechanism (2); The feeding lifting mechanism (23) of the feeding mechanism (2) changes the vertical height of the feeding gripping mechanism (24).

3. The multi-sensor automated capacitance state detection device according to claim 2, characterized in that: The unloading mechanism (7) includes an unloading moving mechanism (72) and an unloading gripping mechanism (71) disposed at the movable end of the unloading moving mechanism (72). The feeding gripping mechanism (71) moves the tested capacitor (10) from the clamping assembly (91) of the indexing assembly (9) to the buffer assembly (8). The buffer component (8) includes a first storage slot (81) and a second storage slot (82).

4. The multi-sensor automated capacitance state detection device according to claim 3, characterized in that: The sliding block (953) is slidably disposed at the lower end of the receiving part that accommodates the capacitor (10) to be tested on the fixed base (92). The movable seat (93) is provided with a mounting seat (971), and the mounting seat (971) is provided at the same height as the sliding block (953); The mounting base (971) is provided with two test pins (97) corresponding to the pins (101) of the capacitor under test (10). The linkage mechanism (95) has a linkage mechanism; One end of the linkage mechanism is connected to the sliding block (953), and the other end of the linkage mechanism is connected to the movable seat (93).

5. The multi-sensor automated capacitance state detection device according to claim 4, characterized in that: The linkage mechanism includes a lever (952) and a drive rod (951). The lever (952) is hinged at the middle to the support plate (921) of the fixed seat (92); One end of the lever (952) is provided with a waist-shaped hole, and the pin (9531) of the sliding block (953) is provided in the waist-shaped hole; The other end of the lever (952) is hinged to the drive rod (951), which is rotatably mounted on the movable seat (93).

6. The multi-sensor automated capacitance state detection device according to claim 5, characterized in that: The guide block (96) includes a base (961) on which a wedge (962) is provided. The wedge (962) is provided with inclined guide surfaces (963) on both sides. The upper end of the guide surface (963) is provided with a first mounting groove (964). A fixing block (965) is provided in the first mounting groove (964); The side of the fixed pressure block (965) is a first inclined surface (966). The first inclined surface (966) intersects the guide surface (963) and has a certain angle between them.

7. The multi-sensor automated capacitance state detection device according to claim 6, characterized in that: The pressure block (98) is located below the test needle (97) mounting base (971); The pressure block (98) has two abutment blocks (981), which are located on both sides of the guide block (96); The side facing the abutment block (981) is an inclined surface corresponding to the guide surface (963) of the guide block (96); The upper end of the abutment block (981) is provided with a second mounting groove (982). A dynamic pressure block (983) is provided in the second mounting slot (982); The dynamic pressure block (983) has a second inclined surface (984), which cooperates with the first inclined surface (966) of the guide block (96).

Images