A single board non-destructive testing device

Abstract

The present application relates to chip testing device technical field, especially in a kind of single board nondestructive testing device, solve the current chip and test board repeatedly plugging easily lead to the wear and tear of chip ontology's connection contact, lead to influence test accuracy, improve the replacement chip cost etc.Problems.The technical scheme includes rack, the bearing table of horizontal sliding installation in rack, the installation table of vertical sliding installation in rack, the chip of fixed vertical setting on the installation table, the test board of vertical plugging on the bearing table is placed with chip, the pressing mechanism of installation in rack, the connecting plate of installation on installation table, the connecting block of sliding installation on connecting plate, the connecting port of plugging with test board on connecting block is installed.The present application realizes the accurate, stable plugging of chip and test board in vertical and horizontal direction, ensures the reliability of test connection, simultaneously locks the test state by the cooperation of limiting rod and limiting slot, prevents accidental loosening.

Description

Technical Field

[0001] This invention relates to the field of chip testing equipment technology, and in particular to a single-board non-destructive testing device. Background Technology

[0002] Single-board testing is a critical step in ensuring chip performance and reliability. Existing single-board testing equipment typically includes a rack, a platform to support the test board, and a fixing structure for mounting the chip. During testing, the chip is directly inserted into the socket on the test board through manual or simple mechanical actuation.

[0003] This structure presents several problems in practical applications: First, repeated insertion and connection of the chip and test board can easily lead to wear on the connection contacts of the chip itself, which not only affects the accuracy of the test but also increases the cost of replacing the chip. Second, the lack of an effective positioning and limiting mechanism during the test process makes it easy for the chip and test board to misalign or make poor contact, resulting in unreliable test results or even damage to the test board or chip. In addition, existing devices mostly rely on manual operation, resulting in low testing efficiency, difficulty in simultaneously testing multiple chips, and a lack of safety protection functions, such as power on / off control and protection against misoperation, which can easily lead to equipment failure or safety accidents. Summary of the Invention

[0004] The purpose of this invention is to address the problems existing in the background technology by proposing a single-board non-destructive testing device that can achieve non-destructive, efficient, stable and safe testing.

[0005] The technical solution of this invention: A single-board non-destructive testing device, comprising a frame, a support platform horizontally slidably mounted on the frame, and a mounting platform vertically slidably mounted on the frame, wherein a vertically arranged chip is fixed on the mounting platform, and a test board perpendicularly inserted to the chip is placed on the support platform; further comprising:

[0006] A pressing mechanism is mounted on the frame, which drives the mounting platform to move vertically.

[0007] A connecting plate is mounted on the mounting platform, and a connecting block is slidably mounted on the connecting plate. A connection port for plugging into the test board is mounted on the connecting block.

[0008] The positioning module installed on the mounting platform limits the position of the mounting platform and simultaneously pushes the connection port to plug into the test board.

[0009] Optionally, the pressing mechanism includes crossbars slidably mounted on both ends of the frame and rotating rods rotatably mounted on both ends of the frame. A connecting rod is rotatably mounted between the rotating rods and the crossbars, and a pressure rod is fixedly mounted on the two rotating rods.

[0010] Optionally, the pressing mechanism further includes a pressing block fixedly installed on the crossbar, and a drive wheel is rotatably installed on the mounting platform.

[0011] Optionally, multiple springs are fixedly installed between the mounting platform and the frame, and the pressure block has a triangular structure with its hypotenuse in contact with the drive wheel.

[0012] Optionally, the positioning module includes a lever rotatably mounted on the mounting platform and a push rod slidably mounted on the mounting platform. A transmission rod is rotatably mounted between the push rod and the lever, and the transmission rod is fixedly connected to the connecting block.

[0013] Optionally, the positioning module further includes a support plate fixedly installed on the push rod and a limiting rod slidably installed on the mounting platform. A swing rod is rotatably installed at one end of the limiting rod and the support plate, and a limiting groove is provided on the pressure block to be inserted into the limiting rod.

[0014] Optionally, a limiting post is fixedly installed on the mounting platform, and the limiting post is located on one side of the connecting block.

[0015] Optionally, multiple fans are fixedly mounted on the frame, and a protection component for controlling the power supply of the fans, chips, and test board is mounted on the mounting platform. The protection component includes a solenoid valve fixedly mounted on the mounting platform, a pressure plate for controlling the opening and closing of the solenoid valve is mounted on the solenoid valve, a pressure block is provided on one side of the support plate, and two circuit switches connected in series are provided on the frame.

[0016] Optionally, the chip includes a body and an adapter plugged into the body, and a support is mounted on the mounting platform to control the height and verticality of the chip.

[0017] Optionally, the support includes a support frame fixedly installed on the mounting platform, a plurality of sliding rods are slidably installed on the support frame, the bottom of the sliding rods is provided with a snap-fit ​​groove, the body is snapped into the snap-fit ​​groove, and a plurality of locking nuts are threadedly connected to the support frame, the locking nuts corresponding one to one of the sliding rods.

[0018] In summary, this application includes at least one of the following beneficial technical effects:

[0019] This invention utilizes the linkage design of the pressing mechanism and the positioning module to achieve precise and stable insertion of the chip and the test board in the vertical and horizontal directions, ensuring the reliability of the test connection. At the same time, the test state is locked by the cooperation of the limiting rod and the limiting groove to prevent accidental loosening.

[0020] Furthermore, the anti-misoperation function of the positioning pin preventing downward movement when the support platform is not in place, and the double safety that requires pressing two circuit switches at the same time to turn on the power, greatly improve the operational safety.

[0021] In addition, the device supports the simultaneous installation and testing of multiple chips, and uses fan activation as a visual indication of placement, which greatly improves the overall testing efficiency and automation, and achieves efficient, non-destructive, and safe single-board testing. Attached Figure Description

[0022] Figure 1 Schematic diagram of a single-board non-destructive testing device Figure 1 ;

[0023] Figure 2 Schematic diagram of a single-board non-destructive testing device Figure 2 ;

[0024] Figure 3 Schematic diagram of a single-board non-destructive testing device Figure 3 ;

[0025] Figure 4 for Figure 2 A magnified view of a section at point A in the middle;

[0026] Figure 5 for Figure 2 A magnified view of a section at point B in the middle;

[0027] Figure 6 for Figure 2 A magnified view of a section at point C;

[0028] Figure 7 for Figure 3 A magnified view of a section at point D;

[0029] Figure 8 Schematic diagram of a single-board non-destructive testing device Figure 4 ;

[0030] Figure 9 This is a structural schematic diagram of the support component;

[0031] Figure 10 for Figure 9 A magnified view of a section at point E in the middle;

[0032] Figure 11 Schematic diagram of the connecting plate Figure 1 ;

[0033] Figure 12 Schematic diagram of the connecting plate Figure 2 .

[0034] Reference numerals: 1. Frame; 2. Support platform; 21. Positioning hole; 3. Mounting platform; 31. Pressing mechanism; 311. Crossbar; 312. Rotating rod; 313. Connecting rod; 314. Pressing block; 315. Drive wheel; 316. Pressing rod; 32. Positioning module; 321. Toggle lever; 322. Push rod; 323. Transmission rod; 324. Limiting rod; 325. Swinging rod; 326. Limiting groove; 327. Support 33. Plate; 331. Connecting plate; 332. Connecting port; 333. Limiting post; 34. Solenoid valve; 341. Pressure plate; 342. Pressure block; 35. Spring; 36. Positioning pin; 4. Chip; 41. Body; 411. Adapter; 42. Support; 421. Support frame; 422. Slide rod; 423. Snap-fit ​​groove; 424. Locking nut; 5. Fan; 6. Circuit switch. Detailed Implementation

[0035] The technical solution of the present invention will be further described below with reference to the accompanying drawings and specific embodiments.

[0036] Example: Figures 1 to 3 , Figures 9 to 12 As shown, the present invention proposes a single-board non-destructive testing device, including a frame 1, a support platform 2 that is horizontally slidably mounted on the frame 1, and a mounting platform 3 that is vertically slidably mounted on the frame 1. Multiple sets of vertically arranged chips 4 are fixed above the mounting platform 3 by a bracket structure. A test board that is inserted into the chip 4 is placed on the top surface of the support platform 2. The chip 4 and the test board are vertically inserted through an adapter 411 to prevent wear on the interface of the chip 4. When installing the test board, pull out the support platform 2 and place the test board on it. Then, push the support platform 2 into the frame 1. The support platform 2 has a groove structure corresponding to the test board for positioning. When the mounting platform 3 moves downward, it will drive multiple chips 4 on the mounting platform 3 to move downward simultaneously. The moving chips will be inserted into the sockets on the test board on the top surface of the support platform 2. According to the test requirements, multiple chips 4 can be installed on the mounting platform 3, so that multiple chips 4 can be inserted into the same or multiple test boards in a single test. It can effectively keep the chips 4 in a 90° vertical position with the test board, improving installation efficiency and insertion accuracy, and reducing wear.

[0037] It should be noted that chip 4 includes a body 41 and an adapter 411 plugged into the body 41. The adapter 411 is plugged into the test board. This ensures that during multiple tests, the contact points on the body 41 will not be worn, only the adapter 411 will be worn. After multiple tests, only the adapter 411 needs to be replaced, which effectively prevents damage to the body 41 and effectively reduces testing costs. The mounting platform 3 is equipped with a support 42 (i.e., the bracket structure mentioned above) to control the height and verticality of chip 4. The height of chip 4 is appropriately adjusted by the support 42 to facilitate the connection between chip 4 and the test board. The connector and support member 42 includes a support frame 421 fixedly installed on the mounting platform 3. Multiple sets of slide rods 422 are slidably installed on the support frame 421. The bottom of the slide rod 422 is provided with a snap-fit ​​groove 423. The body 41 snaps into the snap-fit ​​groove 423. By moving the slide rod 422, the chip 4 can be moved up and down. Multiple locking nuts 424 are threadedly connected to the support frame 421. The locking nuts 424 correspond one-to-one with the slide rods 422. When the chip 4 is moved to a suitable height, the sliding rods 422 can be pressed by rotating the locking nuts 424, thereby fixing the height of the slide rods 422 and thus fixing the height of the chip 4.

[0038] As one implementation method, such as Figures 3 to 5 and Figure 8 As shown, the single-board non-destructive testing device of this embodiment also includes a pressing mechanism 31 mounted on the frame 1. The pressing mechanism 31 drives the mounting platform 3 to move vertically. The pressing mechanism 31 includes a crossbar 311 slidably mounted on both ends of the frame 1 and a rotating rod 312 rotatably mounted on both ends of the frame 1. A connecting rod 313 is rotatably mounted between the rotating rod 312 and the crossbar 311. A pressure rod 316 is fixedly mounted on the two rotating rods 312. Rotating the pressure rod 316 can drive the rotating rod 312 to rotate. Under the transmission action of the connecting rod 313, the rotating rod 312 will push the crossbar 311 to rotate. The rod 311 moves along its axis. The pressing mechanism 31 also includes a pressing block 314 fixedly installed on the crossbar 311. A drive wheel 315 is rotatably installed on the mounting platform 3. The pressing block 314 has a triangular structure, and the hypotenuse of the pressing block 314 is in contact with the drive wheel 315. When the crossbar 311 moves, it can drive the pressing block 314 to move. Then, under the action of the hypotenuse of the pressing block 314, the drive wheel 315 is squeezed, causing the drive wheel 315 to drive the mounting platform 3 to move up and down, which can drive multiple chips 4 to move down and combine with the test board.

[0039] Multiple springs 35 are fixedly installed between the mounting platform 3 and the frame 1. Under the action of the springs 35, the drive wheel 315 can always abut against the pressure block 314. When the pressure block 314 moves in the opposite direction, it can drive the mounting platform 3 to move upward. The support platform 2 is provided with a positioning hole 21, and a positioning pin 36 is fixedly installed on the mounting platform 3. When the support platform 2 moves into place, the downward movement of the mounting platform 3 can drive the positioning pin 36 into the positioning hole 21. If the support platform 2 does not move into place, the positioning pin 36 cannot enter the positioning hole 21, and the chip 4 cannot move down to contact the test board, thereby preventing damage to the interface between the test board and the chip 4.

[0040] like Figures 6 to 8 As shown, in this embodiment, a connecting plate 33 is installed on the mounting platform 3, and a connecting block 331 is slidably installed on the connecting plate 33. A connecting port 332 that is inserted into the test board is installed on the connecting block 331. The connecting port 332 is horizontally connected to the test board, and the chip 4 is vertically connected to the test board. By connecting the connecting port 332 to the test board, test ports in different directions on the test board can be connected simultaneously for multi-functional testing. This embodiment also includes a positioning module 32 installed on the mounting platform 3. The positioning module 32 limits the mounting platform 3 and simultaneously pushes the connecting port 332 to be inserted into the test board. The positioning module 32 can ensure the accuracy of the position of the mounting platform 3 during testing and ensure a stable connection between the connecting port 332 and the test board.

[0041] Furthermore, the positioning module 32 includes a lever 321 rotatably mounted on the mounting platform 3 and a push rod 322 slidably mounted on the mounting platform 3. A transmission rod 323 is rotatably mounted between the push rod 322 and the lever 321. The transmission rod 323 is fixedly connected to the connecting block 331. When the lever 321 is rotated, the transmission rod 323 will be driven to rotate. The rotating transmission rod 323 can push the push rod 322 to move, thereby driving the connecting block 331 to move, which can push the connecting port 332 to move, so that the connecting port 332 can be combined with the test board. A limit post 333 is fixedly mounted on the mounting platform 3. The limit post 333 is located on one side of the connecting block 331. The limit post 333 limits the connecting block 331. When the connecting block 331 contacts the limit post 333, the push rod 322 will be unable to move, thus protecting the connecting port 332.

[0042] Furthermore, the positioning module 32 also includes a support plate 327 fixedly mounted on the push rod 322 and a limiting rod 324 slidably mounted on the mounting platform 3. A swing rod 325 is rotatably mounted on one end of the limiting rod 324 and the support plate 327. The pressure block 314 is provided with a limiting groove 326 that is inserted into the limiting rod 324. When the push rod 322 moves, it can drive the support plate 327 to move. The moving support plate 327 will push the swing rod 325 to rotate. The rotating swing rod 325 will push the limiting rod 324 to move, so that the limiting rod 324 can be pushed into the limiting groove 326. Since the power for the vertical movement of the mounting platform 3 is provided by the horizontally moving pressure block 314, the limiting rod 324 will limit the horizontal movement of the pressure block 314, thereby preventing the mounting platform 3 from moving up and down, which can ensure the stability of the connection between the chip 4 and the test board during testing.

[0043] like Figure 1 and Figure 7 As shown, in this embodiment, multiple fans 5 are fixedly installed on the frame 1, and a protection component for controlling the power supply of the fans 5, the chip 4, and the power supply of the test board is installed on the mounting platform 3. The protection component includes a solenoid valve 34 fixedly installed on the mounting platform 3, and a pressure plate 341 for controlling the opening and closing of the solenoid valve 34 is installed on the solenoid valve 34. A pressure block 342 is provided on one side of the pressure plate 341 on the support plate 327. Two circuit switches 6 connected in series are provided on the frame 1. When the mounting platform 3 is positioned, the support plate 327 will drive the pressure block 342 to move, and the pressure block 342 will apply pressure to the pressure plate 341 on the solenoid valve 34. At this time, the solenoid valve 34 will connect the circuit, and the fans 5 will start. By observing whether the fans 5 start, it can be determined whether the mounting platform 3 is fixed in place and whether the connection port 332 is plugged in. If the fans 5 are turned on normally, the test can be performed by pressing the two circuit switches 6 at the same time.

[0044] The working principle of this embodiment is as follows: First, the support platform 2 is pulled out and the test plate is placed on it. Then, the frame 1 is pushed back, and the pressure rod 316 is pressed down. Through the transmission of the rotating rod 312 and the connecting rod 313, the horizontal rod 311 and the triangular pressure block 314 on it are driven to move horizontally. The inclined surface of the pressure block 314 contacts the drive wheel 315 on the mounting platform 3, overcoming the elastic force of the spring 35, and pushing the mounting platform 3 to move vertically downward with the chip 4 and the connection port 332. At the same time, the lever 321 of the positioning module 32 is pushed by the transmission rod 323. Push rod 322 and connecting block 331 cause connecting port 332 to be inserted laterally into the test board; the movement of push rod 322 also pushes limit rod 324 into limit groove 326 of pressure block 314 through support plate 327 and swing rod 325, locking the position of mounting platform 3; pressure block 342 on support plate 327 then presses down pressure plate 341 of solenoid valve 34, turning on the power of fan 5 as a positioning indicator. At this time, the operator can press the two series circuit switches 6 at the same time to power on chip 4 and test board and start testing.

[0045] The above specific embodiments are merely several optional embodiments of the present invention. Based on the technical solutions of the present invention and the relevant teachings of the above embodiments, those skilled in the art can make various alternative improvements and combinations to the above specific embodiments.

Claims

1. A single-board non-destructive testing device, comprising a frame (1), a support platform (2) slidably mounted on the frame (1), and a mounting platform (3) slidably mounted on the frame (1), wherein a vertically arranged chip (4) is fixed on the mounting platform (3), and a test board perpendicularly inserted into the chip (4) is placed on the support platform (2), characterized in that, Also includes: The pressing mechanism (31) is installed on the frame (1). The pressing mechanism (31) drives the mounting platform (3) to move vertically. The pressing mechanism (31) includes a crossbar (311) slidably installed at both ends of the frame (1) and a rotating rod (312) rotatably installed at both ends of the frame (1). A connecting rod (313) is rotatably installed between the rotating rod (312) and the crossbar (311). A pressure rod (316) is fixedly installed on the two rotating rods (312). The pressing mechanism (31) also includes a pressure block (314) fixedly installed on the crossbar (311). A drive wheel (315) is rotatably installed on the mounting platform (3). Multiple springs (35) are fixedly installed between the mounting platform (3) and the frame (1). The pressure block (314) has a triangular structure. The hypotenuse of the pressure block (314) is in contact with the drive wheel (315). A connecting plate (33) is installed on the mounting platform (3), a connecting block (331) is slidably installed on the connecting plate (33), and a connecting port (332) for plugging into the test board is installed on the connecting block (331). The positioning module (32) is installed on the mounting platform (3). The positioning module (32) limits the mounting platform (3) and simultaneously pushes the connection port (332) to be inserted into the test board. The positioning module (32) includes a lever (321) rotatably installed on the mounting platform (3) and a push rod (322) slidably installed on the mounting platform (3). A transmission rod (323) is rotatably installed between the push rod (322) and the lever (321). The transmission rod (323) is fixedly connected to the connection block (331). The positioning module (32) also includes a support plate (327) fixedly installed on the push rod (322) and a limiting rod (324) slidably installed on the mounting platform (3). A swing rod (325) is rotatably installed at one end of the limiting rod (324) and the support plate (327). The pressure block (314) is provided with a limiting groove (326) that is inserted into the limiting rod (324).

2. The single-board non-destructive testing device according to claim 1, characterized in that, A limiting post (333) is fixedly installed on the mounting platform (3), and the limiting post (333) is located on one side of the connecting block (331).

3. The single-board non-destructive testing device according to claim 1, characterized in that, Multiple fans (5) are fixedly installed on the frame (1). A protection component for controlling the power supply of the fans (5) and the chip (4) and the power supply of the test board is installed on the mounting platform (3). The protection component includes a solenoid valve (34) fixedly installed on the mounting platform (3). A pressure plate (341) for controlling the opening and closing of the solenoid valve (34) is installed on the solenoid valve (34). A pressure block (342) is provided on one side of the pressure plate (341) on the support plate (327). Two circuit switches (6) connected in series are provided on the frame (1).

4. The single-board non-destructive testing device according to claim 1, characterized in that, The chip (4) includes a body (41) and an adapter (411) plugged into the body (41). The mounting platform (3) is equipped with a support (42) for controlling the height and verticality of the chip (4).

5. The single-board non-destructive testing device according to claim 4, characterized in that, The support member (42) includes a support frame (421) fixedly installed on the mounting platform (3). Multiple sets of slide rods (422) are slidably installed on the support frame (421). The bottom of the slide rod (422) is provided with a snap-fit ​​groove (423). The body (41) snaps into the snap-fit ​​groove (423). Multiple locking nuts (424) are threadedly connected to the support frame (421). The locking nuts (424) correspond one-to-one with the slide rods (422).

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