A screen aging test method, system, electronic device and storage medium

Abstract

The application provides a screen aging test method, a system, an electronic device and a storage medium, relates to the technical field of aging test, and the method comprises the following steps: in response to a user input or a preset program, a test strategy containing signal timing, power supply parameters and monitoring threshold is configured for a target screen to be tested, and control instructions independent of each other and having a time sequence relationship are allowed to be set for a power supply control channel and a signal control channel; an independent control signal corresponding to the target screen to be tested is generated by a control unit to respectively drive a corresponding target power supply control channel and a target signal control channel; working parameters of the target screen to be tested in a test process are collected in real time by a monitoring unit; and when it is determined that the target power supply control channel or the target signal control channel is abnormal based on the comparison result of the working parameters collected in real time and the monitoring threshold, a predetermined processing operation is performed. The technical scheme of the application improves the reliability of screen aging test.

Description

Technical Field

[0001] This application relates to the field of aging test technology, specifically to a screen aging test method, system, electronic device, and storage medium. Background Technology

[0002] In the display panel manufacturing industry, screen aging testing is a core step in ensuring product reliability and a crucial step in eliminating early-stage failures. As screen technology advances towards higher resolution, higher refresh rates, and higher dynamic ranges, more stringent requirements are placed on the stability of their driving circuits, power management systems, and signal interfaces. Current aging test systems rely on fixed control logic for the overall screen's on / off state. Their test stimuli are singular and coarse, and the strong control correlation between signal transmission and power supply makes it difficult to differentiate the signal and power supply of individual screens according to test requirements. This hinders the flexibility to adapt to the personalized testing needs of different screens and makes it difficult to verify the stability of screens under complex power supply and signal combinations. Furthermore, the test data lacks specificity, making it difficult to accurately trace the causes of performance fluctuations in individual screens, thus limiting testing depth and quality control efficiency, and failing to meet the current demands of display panel manufacturing for refined aging testing. Therefore, current screen aging test methods suffer from low reliability. Summary of the Invention

[0003] To address the aforementioned technical problems, this application provides a screen aging test method, system, electronic device, and storage medium.

[0004] Firstly, this application provides a screen aging test method, applied to an aging test system with multiple independent power control channels and multiple independent signal control channels, comprising: a test strategy configuration step: responding to user input or a preset program, configuring a test strategy for the target screen under test, including signal timing, power parameters, and monitoring thresholds; wherein, the test strategy allows setting independent and timing-dependent control commands for the power control channels and signal control channels, and the target screen under test is any one of multiple screens under test; a channel decoupling control step: according to the test strategy, generating independent control signals corresponding to the target screen under test through a control unit, driving the corresponding target power control channel and target signal control channel respectively, so that during the test... During the test, the video signal applied to the target screen under test and at least one power supply can be independently turned on, off, or adjusted; Real-time parameter monitoring step: Through the monitoring unit corresponding to the target power control channel and / or the target signal control channel, the operating parameters of the target screen under test during the test are collected in real time. The operating parameters include the power supply parameters of the target power control channel and / or the signal transmission status parameters corresponding to the target signal control channel; Anomaly handling step: Based on the comparison results of the real-time collected operating parameters and the monitoring threshold, when it is determined that there is an anomaly in the target power control channel or the target signal control channel, a predetermined processing operation is performed. The processing operation includes at least one of the following: isolating the abnormal channel; recording the abnormal data; adjusting the control parameters of the abnormal channel.

[0005] By adopting the above technical solution, the signal and power of a single screen under test can be differentiated according to the test requirements, flexibly adapting to the personalized test requirements of different screens, and verifying the stability of the screen under complex power supply and signal combination conditions; real-time acquisition of the working parameters of a single screen under test is highly targeted, and the cause of performance fluctuations can be accurately traced, improving the depth of testing and the efficiency of quality control, meeting the needs of display panel manufacturing for refined aging tests, and achieving the effect of improving the reliability of screen aging tests.

[0006] Optionally, in the test strategy configuration step, the control commands that are independent of each other and have a timing relationship include at least one of the following modes: Power-on then signal mode: the control command is configured to first turn on the target power control channel that supplies power to the target screen under test, and then turn on the target signal control channel that provides video signals to the target screen under test after a first time threshold delay; Signal-on then power-on mode: the control command is configured to first turn on the target signal control channel, and then turn on the target power control channel after a second time threshold delay; Alternating on / off mode: the control command is configured to periodically alternately turn on and off the target signal control channel and the target power control channel with a preset period and duty cycle.

[0007] By adopting the above technical solution, the target power control channel and target signal control channel can be independently and sequentially controlled according to control commands of different modes. This enables independent connection, disconnection or adjustment of the video signal and working power of the target screen under test, meeting the personalized testing needs of different screens, verifying the stability of the screen under complex power supply and signal combination conditions, improving the flexibility and targeting of testing, accurately tracing the cause of performance fluctuations of a single screen, and improving the depth of testing and the efficiency of quality control.

[0008] Optionally, in the channel decoupling control step, the process by which the control unit generates independent control signals corresponding to the target screen under test includes: the control unit parses the power control requirements and signal control requirements for the target screen under test in the test strategy, and generates a power control instruction set and a signal control instruction set respectively; wherein, the power control instruction set includes power on / off timing, voltage adjustment value and adjustment trigger condition, and the signal control instruction set includes signal enable / disable timing, signal type selection and signal parameter configuration; the power control instruction set is sent to the driver chip of the target power control channel through an independent instruction transmission interface, and the signal control instruction set is sent to the FPGA and signal driver of the target signal control channel.

[0009] By adopting the above technical solution, the control unit can parse the test strategy and generate independent power control command sets and signal control command sets, which are then sent to the corresponding channels through an independent command transmission interface. This enables independent control of the power supply and signals of the target screen under test, allowing video signals and power supplies to be independently connected, disconnected, or adjusted. This meets the personalized test requirements of different screens, flexibly adapts to complex power supply and signal combination conditions, and improves test reliability.

[0010] Optionally, in the real-time parameter monitoring step, a PID voltage compensation algorithm is used to dynamically adjust the output voltage of the target power control channel. The output voltage is iteratively corrected based on the real-time collected power supply parameters so that the voltage fluctuation deviation does not exceed ±0.5%.

[0011] By adopting the above technical solution, the output voltage of the target power control channel can be dynamically adjusted during screen aging tests. The output voltage is iteratively corrected based on the real-time collected power supply parameters, so that the voltage fluctuation deviation does not exceed ±0.5%, ensuring the stability of the power supply to the target screen under test during the test and improving the reliability of the test.

[0012] Optionally, the above method also includes: a test data management step: associating the test strategy, real-time collected working parameters, and the results of the exception handling steps with the unique identifier of the target screen under test, and generating a structured test log file for storage or uploading.

[0013] By adopting the above technical solution, the test strategy, real-time collected working parameters, and anomaly handling results are associated with the unique identifier of the target screen under test, and a structured test log file is generated for storage or uploading. This allows for convenient and accurate tracing of the causes of performance fluctuations in a single screen and improves the relevance of test data.

[0014] Optionally, in the channel decoupling control step, independent adjustment includes: while maintaining the normal transmission of video signals in the target signal control channel, dynamically or stepwise adjusting the output voltage of the target power control channel within the range of ±5% to ±10% based on the power parameters set in the test strategy.

[0015] By adopting the above technical solution, while maintaining the normal transmission of video signals on the target screen under test, the output voltage of the target power control channel can be dynamically or stepwise adjusted by ±5% to ±10% based on the nominal voltage value according to the test strategy. This enables flexible control of the power supply, meets the personalized test requirements of different screens, and verifies the stability of the screen under complex power supply and signal combination conditions.

[0016] Optionally, in the channel decoupling control step, the video signal is adjusted, including but not limited to: enabling / disabling video signal output; switching video signal output between different interface types; or generating and switching different test mode signals, the test mode signals including at least one of solid color pattern, grayscale pattern, checkerboard pattern, high-frequency stripe pattern and dynamic video pattern.

[0017] By adopting the above technical solution, the video signal of the target screen under test can be enabled / disabled, output can be switched between different interface types, and signals for generating and switching different test modes can be adjusted. This allows the testing process to flexibly adapt to the personalized testing needs of different screens, verify the stability of the screen under complex signal conditions, and improve the reliability of screen aging tests.

[0018] Optionally, the test strategy configuration step also includes scenario-based interference signal injection configuration, and the channel decoupling control step simultaneously executes interference injection and independent control: the test strategy presets interference types and injection parameters, and the interference types include signal pattern interference, power supply ripple interference, and timing offset interference; during the process of the target power control channel supplying power normally and the target signal control channel transmitting video signals normally, the control unit injects interference signals independently into the target signal control channel or the target power control channel according to the preset injection parameters through a dedicated interference generation module, and the interference injection only acts on the current target screen under test; the monitoring unit collects the working parameters after interference injection, analyzes the anti-interference capability of the screen under test under interference conditions, and screens out potential signal fault tolerance defects or power supply ripple resistance defects.

[0019] By adopting the above technical solution, it is possible to configure scenario-based interference signal injection and execute interference injection and independent control simultaneously during testing. This allows for the independent injection of preset signal pattern interference, power ripple interference, and timing offset interference into the target power control channel or target signal control channel. Moreover, the interference only affects the current target screen under test. By collecting the working parameters after interference injection, the anti-interference capability of the screen under test can be analyzed, and potential signal fault tolerance defects or power ripple resistance defects can be screened out.

[0020] Optionally, the power supply parameters of the target power control channel include: output voltage, output current, and real-time power; the signal transmission status parameters of the target signal control channel include signal differential amplitude, timing setup time, signal jitter, and bit error rate; wherein, the monitoring threshold range for signal differential amplitude is 150mV~400mV, the monitoring threshold for signal jitter is no greater than 30ps, and the monitoring threshold for bit error rate is no greater than 10⁻ 9 .

[0021] By adopting the above technical solution, the power supply parameters of the target power control channel and the signal transmission status parameters of the target signal control channel are clarified, as well as the monitoring thresholds for signal differential amplitude, signal jitter value and bit error rate. This helps to accurately collect the working parameters of the target screen under test, providing a basis for subsequent judgment on whether the channel is abnormal, improving the pertinence of test data, and thus improving the reliability and quality control efficiency of screen aging test.

[0022] Optionally, in the anomaly handling steps, the judgment logic for determining that the target power control channel or target signal control channel is abnormal includes at least one of the following: if the output voltage value exceeds the voltage allowable range preset by the test strategy, the output current value exceeds the preset current threshold for more than 3 seconds, or the real-time power value changes by more than 30% in the real-time acquired power parameters, then the target power control channel is determined to be abnormal; if the signal differential amplitude is lower than 150mV or higher than 400mV, the signal jitter value exceeds 30ps for more than 30 seconds, or the bit error rate is higher than 10⁻ in the real-time acquired signal transmission status parameters, then the target power control channel is determined to be abnormal. 9 If the signal lock state remains unlocked for more than 5 seconds, the target signal control channel is deemed abnormal.

[0023] By adopting the above technical solution, it is possible to accurately determine whether the target power control channel and the target signal control channel are abnormal, and to promptly detect abnormal situations of the target screen under test during the test process. This facilitates subsequent abnormal handling operations, improves the relevance of test data, and meets the current demand for refined aging tests in display panel manufacturing.

[0024] Optionally, in the test strategy configuration step, the test strategies configured for multiple screens under test are different from each other; in the channel decoupling control step, independent test processes are executed in parallel for multiple screens under test according to the test strategies configured independently for each screen under test.

[0025] By adopting the above technical solution, different testing strategies can be configured according to the personalized needs of different screens under test, and multiple screens under test can be tested independently in parallel, which can flexibly adapt to the personalized testing needs of different screens.

[0026] Optionally, after the real-time parameter monitoring step, the above method further includes: a power consumption characteristic analysis step: based on the real-time collected power supply parameters, calculating the dynamic power consumption curve of the target screen under test in at least one complete test cycle; a feature comparison step: comparing the dynamic power consumption curve with the pre-stored standard power consumption curve of the same model of the target screen under test; wherein, in the anomaly handling step, based on the deviation result of the feature comparison step, determining whether there are hidden defects in the target screen under test.

[0027] By adopting the above technical solution, based on configuring test strategies for the target screen under test, decoupling control of power and signal control channels, real-time monitoring of working parameters and handling of anomalies, the dynamic power consumption curve of the target screen under test in at least one complete test cycle is calculated and compared with the standard power consumption curve. Based on the deviation results, it can be determined whether there are hidden defects in the target screen under test, which improves the test depth and quality control efficiency, meets the current display panel manufacturing requirements for refined aging tests, and enhances the reliability of screen aging tests.

[0028] Optionally, the test strategy configured in the test strategy configuration step includes a combination of instructions simulating at least one of the following fault scenarios: signal interruption scenario: controlling the target signal control channel to periodically switch on and off, while maintaining continuous power supply to the target power control channel; power fluctuation scenario: controlling the target power control channel to periodically or randomly change the output voltage, while maintaining continuous stable signal output from the target signal control channel; timing abnormal scenario: controlling the target signal control channel and the target power control channel to have abnormal connection or disconnection timing.

[0029] By adopting the above technical solutions, fault scenarios such as signal interruption, power fluctuation and timing abnormality can be simulated, so that the target screen under test can be aged under more realistic complex working conditions. This helps to discover potential problems of the screen under these abnormal conditions, improve the depth of testing and quality control efficiency, and better verify the stability of the screen under complex power supply and signal combination working conditions.

[0030] Optionally, the above method further includes: a test report generation step: after the test on the target screen is completed, a test report is automatically generated; wherein the test report includes at least: the identifier of the test strategy executed, historical data curves of the working parameters, records of abnormal events that occurred and corresponding handling operations, and a comprehensive quality judgment result of the target screen based on all monitoring data.

[0031] By adopting the above technical solution, after the test on the target screen is completed, a test report can be automatically generated, which includes the test strategy identifier, historical data curves of working parameters, abnormal event records and corresponding handling operations, and comprehensive quality judgment results based on monitoring data. This facilitates a comprehensive and intuitive presentation of the test situation, accurate traceability of the test process and results, and improves the depth of testing and the efficiency of quality control.

[0032] In a second aspect of this application, a screen aging test system is also provided for performing the screen aging test method of any of the preceding claims, comprising: a strategy configuration module, configured in response to user input or a preset program to configure a test strategy for the target screen under test, including signal timing, power parameters, and monitoring thresholds; wherein the test strategy allows setting independent and timing-dependent control commands for the power control channel and the signal control channel; a channel decoupling control module, including a control unit, multiple independent power control channels, and multiple independent signal control channels; the control unit is configured to generate independent control signals corresponding to the target screen under test according to the test strategy, and drive the corresponding target power control channel and target signal control channel respectively, so that during the test process... In this system, the video signal applied to the target screen under test and at least one power supply can be independently connected, disconnected, or adjusted; the parameter monitoring module includes monitoring units corresponding to the target power control channel and / or the target signal control channel, used to collect the operating parameters of the target screen under test in real time during the test process, including the power supply parameters of the target power control channel and / or the signal transmission status parameters corresponding to the target signal control channel; the anomaly handling module is used to perform predetermined processing operations when it is determined that there is an anomaly in the target power control channel or the target signal control channel based on the comparison results of the real-time collected operating parameters and the monitoring threshold, including at least one of the following: isolating the abnormal channel; recording the abnormal data; adjusting the control parameters of the abnormal channel.

[0033] In a third aspect of this application, an electronic device is also provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor executes the program to implement the method steps of any of the above claims.

[0034] In a fourth aspect of this application, a computer-readable storage medium is also provided, which stores instructions that, when executed, perform the method steps of any of the above claims.

[0035] In summary, one or more technical solutions provided in this application have at least the following technical effects or advantages: they can differentiate the signal and power supply of a single screen under test according to testing requirements, flexibly adapt to the personalized testing needs of different screens, and verify the stability of the screen under complex power supply and signal combination conditions; they can collect the working parameters of a single screen under test in real time, which is highly targeted, can accurately trace the cause of performance fluctuations, improve the depth of testing and the efficiency of quality control, meet the needs of display panel manufacturing for refined aging tests, and achieve the effect of improving the reliability of screen aging tests. Attached Figure Description

[0036] Figure 1 This is a flowchart of a screen aging test method provided in an embodiment of this application;

[0037] Figure 2 This is a structural block diagram of a screen aging test system provided in an embodiment of this application;

[0038] Figure 3 This is a hardware framework diagram of an aging test system provided in an embodiment of this application;

[0039] Figure 4 This is an example diagram of a power module provided in an embodiment of this application;

[0040] Figure 5 This is a schematic diagram of the structure of an electronic device disclosed in an embodiment of this application.

[0041] Explanation of reference numerals in the attached figures: 500 - Electronic device; 501 - Processor; 502 - Communication bus; 503 - User interface; 504 - Network interface; 505 - Memory. Detailed Implementation

[0042] To enable those skilled in the art to better understand the technical solutions in this specification, the technical solutions in the embodiments of this specification will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments.

[0043] In the description of the embodiments of this application, the words "for example" or "for instance" are used to indicate examples, illustrations, or explanations. Any embodiment or design that is described as "for example" or "for instance" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design options. Rather, the use of the words "for example" or "for instance" is intended to present the relevant concepts in a specific manner.

[0044] In the description of the embodiments of this application, the term "multiple" means two or more. Furthermore, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. The terms "comprising," "including," "having," and variations thereof all mean "including but not limited to," unless otherwise specifically emphasized.

[0045] This application provides a screen aging test method, applicable to an aging test system with multiple independent power control channels and multiple independent signal control channels. Figure 1 This is a flowchart of a screen aging test method provided in an embodiment of this application, including the following steps:

[0046] Step S101, Test strategy configuration step: In response to user input or preset program, configure a test strategy for the target screen under test, including signal timing, power parameters and monitoring thresholds; wherein, the test strategy allows setting independent and timing-related control commands for the power control channel and signal control channel, and the target screen under test is any one of multiple screens under test.

[0047] Step S102, Channel decoupling control step: According to the test strategy, the control unit generates independent control signals corresponding to the target screen under test, and drives the corresponding target power control channel and target signal control channel respectively, so that during the test, the video signal applied to the target screen under test and at least one working power supply can be independently turned on, off or adjusted.

[0048] Step S103, Real-time parameter monitoring step: The working parameters of the target screen under test are collected in real time during the test process through the monitoring unit corresponding to the target power control channel and / or the target signal control channel. The working parameters include the power supply parameters of the target power control channel and / or the signal transmission status parameters corresponding to the target signal control channel.

[0049] Step S104, Anomaly Handling Step: Based on the comparison results of the real-time acquired working parameters and monitoring thresholds, when it is determined that there is an anomaly in the target power control channel or the target signal control channel, a predetermined processing operation is performed. The processing operation includes at least one of the following: isolating the abnormal channel; recording the abnormal data; adjusting the control parameters of the abnormal channel.

[0050] Through the above steps, the signal and power supply of a single screen under test can be differentiated according to the test requirements, flexibly adapting to the personalized test requirements of different screens, verifying the stability of the screen under complex power supply and signal combination conditions; real-time acquisition of the working parameters of a single screen under test is highly targeted, can accurately trace the cause of performance fluctuations, improve the depth of testing and the efficiency of quality control, meet the needs of display panel manufacturing for refined aging tests, and achieve the effect of improving the reliability of screen aging tests.

[0051] This embodiment achieves personalized aging testing of a single screen by constructing a closed-loop test logic of "multi-independent channel hardware architecture + strategy-based decoupling control + real-time monitoring and feedback". It relies on a test system with multiple independent power control channels and independent signal control channels to provide hardware support for channel decoupling; it customizes a test strategy for each target screen under test, including signal timing, power parameters, and monitoring thresholds, supporting independent command settings for power and signals; the control unit generates independent control signals according to the test strategy, driving the corresponding power / signal channels respectively, enabling the video signal and operating power applied to the target screen under test to be independently switched on / off and adjusted, breaking their control correlation; the monitoring unit collects operating parameters such as power supply parameters and signal transmission status, and triggers processing operations such as anomaly isolation, data recording, and parameter adjustment after comparing them with monitoring thresholds. While related technologies employ fixed control logic for overall screen start-up and shutdown, this embodiment achieves differentiated and refined control of power and signals through a dedicated test strategy for each screen and independent channel control, adapting to the personalized testing needs of different screens. Related technologies lack dedicated monitoring and anomaly recording mechanisms for each screen; this embodiment achieves precise tracing of performance fluctuation causes by real-time acquisition of single-screen operating parameters and accurate recording of abnormal data. This embodiment allows for customized test strategies for individual screens, supports diverse combinations of power and signal control, verifies screen stability under complex operating conditions, and adapts to screens of different specifications and testing requirements, improving the flexibility and adaptability of aging tests. Through independent channel decoupling control, potential faults in the power and signal systems (such as unstable power supply or abnormal signal transmission) can be accurately located, avoiding the ambiguous fault location problems caused by "overall start-up and shutdown" in related technologies. Anomaly handling mechanisms (such as isolating abnormal channels and adjusting control parameters) reduce the risk of overall system shutdown due to local anomalies, ensuring the continuity of the testing process.

[0052] In an optional embodiment, during the test strategy configuration step, the control commands that are independent of each other and have a timing relationship include at least one of the following modes: Power-on then signal mode: the control command is configured to first turn on the target power control channel that supplies power to the target screen under test, and then turn on the target signal control channel that provides video signals to the target screen under test after a first time threshold delay; Signal-on then power-on mode: the control command is configured to first turn on the target signal control channel, and then turn on the target power control channel after a second time threshold delay; Alternating on / off mode: the control command is configured to periodically alternately turn on and off the target signal control channel and the target power control channel with a preset period and duty cycle.

[0053] In the above embodiments, the target power control channel and the target signal control channel can be independently and sequentially controlled according to control commands of different modes, so as to independently connect, disconnect or adjust the video signal and working power of the target screen under test, meet the personalized testing needs of different screens, verify the stability of the screen under complex power supply and signal combination conditions, improve the flexibility and pertinence of testing, accurately trace the cause of performance fluctuations of a single screen, and improve the depth of testing and quality control efficiency.

[0054] The timing relationship between power and signals is visualized into three configurable independent control command modes, enabling more refined timing coordination and stress application to support verification under complex operating conditions. **Power-on then signal mode:** This mode simulates the normal "cold start" or "reset" timing of the display device, ensuring the stable establishment of the screen's power system, driver chip, and other hardware circuits before inputting the video signal. This is used to test the screen's stability and initialization logic under standard power-on procedures. **Signal then power-on mode:** This mode simulates an abnormal but real-world "hot-plug" or "abnormal power-on" scenario. Signals are input before the screen power is ready, intentionally creating stress to test the tolerance and recovery capabilities of the screen's internal circuits (such as signal interfaces, ESD protection circuits, and the startup logic of the power management chip) under abnormal timing conditions. **Alternating on / off mode:** This mode simulates extreme operating conditions of the device under complex working states (such as rapid sleep wake-up, power fluctuations accompanied by signal interruptions). By periodically and programmably alternating on and off of power and signals, it conducts high-intensity fatigue testing and reliability verification of the screen's dynamic response capabilities, power retention performance, and signal phase-locked loop recovery speed. By implementing these three modes, the testing system can proactively trigger and capture specific types of defects (such as timing-related logic errors and power sequence defects) that cannot be exposed in a standard single mode. This transforms aging testing from "passively waiting for failure" to "actively searching for defects," significantly improving test coverage and effectiveness. These modes precisely correspond to various scenarios that users may encounter in actual use (normal power-on, accidental plugging and unplugging, and intermittent signal interference), making laboratory aging tests more realistically simulate the terminal usage environment and enhancing the predictive value of test results for the actual reliability of the product. In practical applications, these modes can be selectively chosen or combined for enhanced testing based on the screen's design characteristics or past failure modes. For example, for new power management chips, the focus can be on "alternating on / off modes," thereby achieving a more focused verification objective with shorter test time and improving the utilization efficiency of test resources.

[0055] In an optional embodiment, the process of the control unit generating an independent control signal corresponding to the target screen under test in the channel decoupling control step includes: the control unit parses the power control requirements and signal control requirements for the target screen under test in the test strategy, and generates a power control instruction set and a signal control instruction set respectively; wherein, the power control instruction set includes power on / off timing, voltage adjustment value and adjustment trigger condition, and the signal control instruction set includes signal enable / disable timing, signal type selection and signal parameter configuration; the power control instruction set is sent to the driver chip of the target power control channel through an independent instruction transmission interface, and the signal control instruction set is sent to the FPGA and signal driver of the target signal control channel.

[0056] In the above embodiments, the control unit can parse the test strategy and generate independent power control command sets and signal control command sets, which are then sent to the corresponding channels via independent command transmission interfaces. This enables independent control of the power supply and signals of the target screen under test, allowing video signals and power supplies to be independently connected, disconnected, or adjusted. This meets the personalized test requirements of different screens, flexibly adapts to complex power supply and signal combination conditions, and improves test reliability.

[0057] The control unit first analyzes the test strategy of the target screen, separates the independent power control requirements and signal control requirements, and generates structured instruction sets for each. The power control instruction set specifies the power start / stop timing, voltage regulation value, and triggering conditions, while the signal control instruction set specifies the signal enable / disable timing, signal type (such as video format), and parameters (such as resolution and refresh rate). Through the instruction transmission interface, the power control instruction set is sent separately to the driver chip of the target power control channel, and the signal control instruction set is sent separately to the FPGA (Field Programmable Gate Array) and signal driver of the target signal control channel, thus achieving physical transmission isolation and execution isolation between the two types of instructions. The dual design of hierarchical instruction set parsing and independent interface distribution ensures that the control logic of the power supply and signal channels is completely independent, avoiding mutual interference and providing reliable assurance for complex operating condition testing (such as dynamic power supply adjustment and synchronous signal type switching). The structured instruction set clearly defines key information such as timing, parameters, and trigger conditions. Combined with the high-speed processing capability of the FPGA and the precise driving of the driver chip, it can achieve millisecond-level or even microsecond-level control response, meeting the stringent requirements of high refresh rate and high-resolution screens for test control accuracy. The independent instruction set and transmission interface ensure electrical and logical isolation between the power control loop and the signal control loop, greatly reducing the possibility of mutual interference and making the entire control system more stable and reliable.

[0058] In an optional embodiment, in the real-time parameter monitoring step, a PID voltage compensation algorithm is used to dynamically adjust the output voltage of the target power control channel, and the output voltage is iteratively corrected based on the real-time collected power supply parameters so that the voltage fluctuation deviation does not exceed ±0.5%.

[0059] In the above embodiments, during screen aging tests, the output voltage of the target power control channel can be dynamically adjusted, and the output voltage can be iteratively corrected based on the real-time collected power supply parameters, so that the voltage fluctuation deviation does not exceed ±0.5%, ensuring the stability of the power supply to the target screen under test during the test and improving the reliability of the test.

[0060] Based on the closed-loop principle of active control and real-time monitoring, the classic closed-loop control theory (PID algorithm) is introduced to achieve high-precision dynamic stability control of the output voltage of the power supply channel. The goal of the PID algorithm is to counteract small, high-frequency voltage fluctuations under normal test conditions, maintaining the output voltage stable near the preset target voltage value (e.g., fluctuation deviation not exceeding ±0.5%), which is a type of active preventative control. It addresses small, controllable voltage drifts caused by load changes (e.g., switching operating states of the screen driver circuit) and power supply ripple during testing (e.g., drifting from 3.3V to 3.32V, a deviation of 0.6%, not exceeding the safe range). The PID algorithm uses real-time acquired power supply parameters (voltage / current) to iteratively correct the output voltage through proportional-integral-derivative calculations, quickly pulling the drift back to the target value (e.g., correcting 3.32V back to 3.3V). It only operates within the "normal voltage range preset by the test strategy" (e.g., a fluctuation range of ±5% of the nominal voltage) and will not adjust beyond this range (e.g., if the preset voltage range is 3.135V~3.465V, the PID will not adjust the voltage below 3.1V or above 3.5V). The aforementioned anomaly detection aims to identify large, sudden voltage anomalies that the PID algorithm cannot handle. The target is large, uncontrollable voltage anomalies that exceed the PID adjustment capability or normal test range (e.g., a power module failure causing a sudden voltage drop to 2.5V or a sudden rise to 4.0V). This embodiment uses a PID algorithm to control power fluctuations within ±0.5%, providing a power environment comparable to that of precision instruments for aging tests. This results in highly repeatable and comparable test data, allowing for rigorous comparison of results from different times, batches, and test sites, laying the foundation for refined quality analysis and process control.

[0061] In an optional embodiment, the above method further includes: a test data management step: associating the test strategy, real-time collected working parameters, and the results of the exception handling steps with the unique identifier of the target screen under test, and generating a structured test log file for storage or uploading.

[0062] In the above embodiments, the test strategy, real-time collected working parameters, and anomaly handling results are associated with the unique identifier of the target screen under test to generate a structured test log file for storage or uploading. This allows for convenient and accurate tracing of the causes of performance fluctuations in a single screen and improves the relevance of the test data.

[0063] Through a process of "data identification and association - structured integration - persistent storage," a traceable data recording and management system is constructed throughout the entire testing lifecycle. Three core data types generated during the testing process—preset test strategies (input conditions), real-time collected working parameters (process data), and anomaly handling results (output conclusions)—are bound to a unique identifier representing a specific product (such as a screen serial number, QR code, or internal ID). This ensures that all data belongs to a specific test object. The associated data is then integrated to generate structured test log files. Structured means that the data is not just random text, but organized according to predefined formats, fields, and timestamps, facilitating automatic computer parsing, retrieval, and analysis. The generated log files are stored (e.g., in a local database or on a server) or uploaded (e.g., to a cloud database or MES manufacturing execution system) to achieve long-term data preservation and accessibility.

[0064] In an optional embodiment, the independent adjustment in the channel decoupling control step includes: while maintaining the normal transmission of video signals by the target signal control channel, dynamically adjusting or step-wise adjusting the output voltage of the target power control channel within the range of ±5% to ±10% based on the power parameters set in the test strategy, according to the power parameters set in the test strategy.

[0065] In the above embodiments, while maintaining the normal transmission of the video signal of the target screen under test, the output voltage of the target power control channel can be dynamically or stepwise adjusted by ±5% to ±10% based on the nominal voltage value according to the test strategy, so as to realize flexible control of the power supply, meet the personalized test requirements of different screens, and verify the stability of the screen under complex power supply and signal combination conditions.

[0066] Maintain normal video signal transmission through the target signal control channel to ensure a stable signal environment. Only power parameters are independently adjusted (completely separating power regulation from signal transmission). Strictly adhere to the preset power parameters in the test strategy to ensure targeted and controllable adjustments. Based on the screen's nominal voltage value, limit fluctuations to a reasonable range of ±5% to ±10% (balancing test rigor and screen safety, avoiding hardware damage from over-adjustment). Supports dynamic adjustment (continuous smooth change) or step adjustment (discrete jump change) to adapt to power stress testing requirements in different scenarios. Simulate voltage fluctuations caused by grid fluctuations and power adapter aging to verify the screen's reliability under non-ideal power supply conditions, improving the realism and effectiveness of the test, making the test conditions closer to actual usage scenarios. By dynamically / stepping the power parameters, potential faults such as abnormal drive circuits, screen flickering, and lifespan degradation caused by power supply voltage compatibility issues can be efficiently exposed, preventing unqualified products from entering the market. The adjustment range and method can be customized within ±5% to ±10% according to the power tolerance characteristics of different screens (such as high-resolution screens and high refresh rate screens) to meet personalized testing needs.

[0067] As an optional implementation, in the channel decoupling control step, the voltage of the target power control channel is adjusted. Specifically, this may include: during the test, controlling the output voltage of the target power control channel to fluctuate around the nominal voltage according to a preset voltage stress curve, so as to perform a voltage stress test on the target screen under test. In this embodiment, during the screen aging test, the output voltage of the target power control channel is controlled to fluctuate around the nominal voltage according to the preset voltage stress curve to achieve voltage stress testing on the target screen under test. This allows the test to more accurately simulate complex power supply conditions, verify the stability of the screen under voltage fluctuations, and improve test reliability.

[0068] The testing strategy can include one or more predefined voltage stress curves, which define how the voltage changes over time. For example, it can be a square wave (periodic step), a triangular wave (linear rise and fall), or a more complex combination of waveforms. The core is the planned application of positive and negative offsets above and below the nominal voltage. This dynamic voltage fluctuation applies a repetitive, cyclical stress shock to the screen's power management circuitry, driver chip, and even the pixel units themselves. Weak points with poor soldering, material defects, or insufficient design margins are more prone to performance degradation or sudden failure under this alternating electrical stress, thus being exposed during the testing phase. By actively applying cyclic voltage stress, screens with potential defects such as solder voids, early material aging, and component parameter drift can be effectively screened out in a relatively short time. This is equivalent to adding a voltage fatigue test to the aging test, significantly improving the severity of the test and the effectiveness of the screening.

[0069] In an optional embodiment, the channel decoupling control step involves adjusting the video signal, specifically including but not limited to: enabling / disabling video signal output; switching video signal output between different interface types; or generating and switching different test mode signals, the test mode signals including at least one of solid color patterns, grayscale patterns, checkerboard patterns, high-frequency stripe patterns, and dynamic video patterns.

[0070] In the above embodiments, the video signal of the target screen under test can be enabled / disabled, output can be switched between different interface types, and signals for generating and switching different test modes can be adjusted. This allows the testing process to flexibly adapt to the personalized testing needs of different screens, verify the stability of the screen under complex signal conditions, and improve the reliability of screen aging tests.

[0071] The system independently controls the output of video signals by enabling / disabling signals, adapting to timing strategies such as power-on before signal delivery and signal delivery before power-on. It supports dynamic switching between different interfaces such as HDMI, DP, MIPI, and LVDS, adapting to the testing needs of various screen sizes. It outputs standard test patterns on demand, including solid colors, grayscale, checkerboard patterns, high-frequency stripes, and dynamic video, specifically stimulating the aging effects of different screen modules (backlight, driver IC, pixel circuits). All these adjustments are implemented through an independent signal control channel (FPGA + signal driver), decoupled from the power control channel, ensuring that signal adjustment does not affect power supply stability. Through dynamic interface switching and multi-pattern support, it can cover various screen sizes, including mobile phones, tablets, TVs, and automotive screens, without replacing hardware, reducing testing equipment costs and improving testing efficiency.

[0072] In an optional embodiment, the test strategy configuration step further includes scenario-based interference signal injection configuration, and the channel decoupling control step simultaneously executes interference injection and independent control: the test strategy presets interference types and injection parameters, and the interference types include signal pattern interference, power supply ripple interference, and timing offset interference; during the process of the target power control channel supplying power normally and the target signal control channel transmitting video signals normally, the control unit independently injects interference signals into the target signal control channel or the target power control channel according to the preset injection parameters through a dedicated interference generation module, and the interference injection only acts on the current target screen under test; the monitoring unit collects the working parameters after interference injection, analyzes the anti-interference capability of the screen under test under interference conditions, and screens out potential signal fault tolerance defects or power supply ripple resistance defects.

[0073] In the above embodiments, by configuring scenario-based interference signal injection and simultaneously executing interference injection and independent control during testing, preset signal pattern interference, power ripple interference, and timing offset interference can be injected independently into the target power control channel or target signal control channel, and only act on the current target screen under test. By collecting the working parameters after interference injection, the anti-interference capability of the screen under test can be analyzed, and potential signal fault tolerance defects or power ripple resistance defects can be screened out.

[0074] The test strategy presets interference types (signal pattern interference, power ripple interference, timing offset interference) and injection parameters (amplitude, frequency, duty cycle, injection timing). Using a dedicated interference generation module, interference is independently injected into the target power control channel and the target signal control channel when they are normally powered and transmitting video signals. The interference only affects the current target screen under test and does not affect other screens. Operating parameters after interference injection (such as voltage ripple, signal error rate, and timing offset) are collected in real time to analyze the screen's anti-interference capability under interference conditions, and to screen for signal fault tolerance defects (such as pattern errors and excessive jitter) and power ripple resistance defects (such as voltage drops and flicker). Through this embodiment, controllable interference can be superimposed under normal operating conditions to reproduce interference conditions in real-world usage scenarios, effectively capturing potential defects such as signal pattern errors, flicker caused by power ripple, and screen tearing caused by timing offset, thus improving test effectiveness.

[0075] In an optional embodiment, the power supply parameters of the target power control channel include: output voltage value, output current value, and real-time power value; the signal transmission status parameters corresponding to the target signal control channel include signal differential amplitude value, timing setup time, signal jitter value, and bit error rate; wherein, the monitoring threshold range for the signal differential amplitude value is 150mV~400mV, the monitoring threshold for the signal jitter value is no greater than 30ps, and the monitoring threshold for the bit error rate is no greater than 10⁻ 9 .

[0076] In the above embodiments, the power supply parameters of the target power control channel and the signal transmission status parameters of the target signal control channel are clearly defined, as well as the monitoring thresholds for signal differential amplitude, signal jitter value and bit error rate. This helps to accurately collect the working parameters of the target screen under test, providing a basis for subsequent judgment on whether the channel is abnormal, improving the pertinence of the test data, and thus improving the reliability and quality control efficiency of the screen aging test.

[0077] Clear and high-standard numerical ranges or upper limits are set for key signal parameters. For example, the differential amplitude range of 150mV to 400mV covers the specifications of common high-speed interfaces (such as LVDS); the jitter threshold is no greater than 30ps and no greater than 10⁻ 9The bit error rate thresholds are all stringent requirements for high-resolution, high-refresh-rate screens, reflecting the advanced nature and precision of the testing. Clear parameter definitions and quantified thresholds enable the control unit to quickly compare and determine the type of anomaly (e.g., excessive jitter corresponds to signal timing defects, excessive bit error rate corresponds to transmission link defects), providing precise evidence for isolating abnormal channels and adjusting control parameters, thus improving anomaly handling efficiency.

[0078] As an optional implementation, the judgment logic for determining that the target power control channel or target signal control channel is abnormal in the anomaly handling step includes at least one of the following: if the output voltage value exceeds the voltage allowable range preset by the test strategy, the output current value exceeds the preset current threshold for more than 3 seconds, or the real-time power value changes by more than 30% in the real-time acquired power parameters, then the target power control channel is determined to be abnormal; if the signal differential amplitude is lower than 150mV or higher than 400mV, the signal jitter value exceeds 30ps for more than 30 seconds, or the bit error rate is higher than 10⁻ in the real-time acquired signal transmission status parameters, then the target power control channel is determined to be abnormal. 9 If the signal lock state remains unlocked for more than 5 seconds, the target signal control channel is determined to be abnormal. This embodiment can accurately determine whether the target power control channel and the target signal control channel are abnormal, and can promptly detect abnormal situations of the target screen under test during the test process, facilitating subsequent abnormal handling operations, improving the relevance of test data, and meeting the current needs of display panel manufacturing for refined aging tests.

[0079] In an optional embodiment, the test strategy configuration step configures different test strategies for multiple screens under test; the channel decoupling control step executes independent test processes on multiple screens under test in parallel according to the test strategy configured independently for each screen under test.

[0080] In the above embodiments, different testing strategies can be configured according to the personalized needs of different screens under test, and multiple screens under test can be tested independently in parallel, which can flexibly adapt to the personalized testing needs of different screens.

[0081] In the test strategy configuration step, the system allows for completely different test strategies to be configured for each screen on the aging test rack. This means that different screens can receive different signal stimuli, different power parameters, different monitoring thresholds, and even different test timing modes at the same time. The test strategy changes from a "globally unified template" to a "one-screen-one-strategy" approach. In the channel decoupling control step, the control unit can simultaneously (in parallel) drive multiple completely independent power and signal control channels. Each channel runs a complete test process independently, including control, monitoring, judgment, and processing, according to its corresponding test strategy specifically configured for that screen. The processes are logically and electrically independent of each other, as if multiple independent test units are working synchronously. Through this embodiment, there is no need to configure dedicated aging equipment for different product lines; a single system can handle diverse product testing needs. The test processes for multiple screens are completely independent and do not wait for each other. Once a screen is tested, it can be taken offline without occupying workstations due to other screens not being completed, significantly shortening the average test time and improving test productivity.

[0082] In an optional embodiment, after the real-time parameter monitoring step, the method further includes: a power consumption feature analysis step: calculating the dynamic power consumption curve of the target screen under test within at least one complete test cycle based on the real-time collected power supply parameters; a feature comparison step: comparing the dynamic power consumption curve with a pre-stored standard power consumption curve of the same model as the target screen under test; wherein, in the anomaly handling step, based on the deviation result of the feature comparison step, it is determined whether the target screen under test has any hidden defects.

[0083] In the above embodiments, based on configuring test strategies for the target screen under test, decoupling control of power and signal control channels, real-time monitoring of operating parameters and handling of anomalies, the dynamic power consumption curve of the target screen under test in at least one complete test cycle is calculated and compared with the standard power consumption curve. Based on the deviation results, it can be determined whether there are hidden defects in the target screen under test, which improves the test depth and quality control efficiency, meets the current display panel manufacturing requirements for refined aging tests, and improves the reliability of screen aging tests.

[0084] Based on real-time collected power supply parameters (voltage, current, power), the dynamic power consumption trend of the target screen under test is calculated over at least one complete test cycle (e.g., power consumption fluctuations under different test stages and signal loads), forming a visualized / data-driven dynamic power consumption curve. A standard power consumption curve for the same model of screen is pre-stored (obtained through statistical analysis of numerous qualified product tests, reflecting power consumption characteristics under normal operating conditions) as a benchmark for defect judgment. Deviation analysis is performed between the target screen's dynamic power consumption curve and the standard curve (e.g., peak power consumption deviation, average power consumption deviation, power consumption fluctuation amplitude deviation). If the deviation exceeds a preset allowable range, a latent defect is identified (e.g., inefficient power management IC, pixel circuit leakage, abnormal drive circuit, etc.), triggering anomaly handling steps. By comparing the power consumption curve of each screen with the standard curve (usually obtained from statistical analysis of numerous good product data), the consistency of the screen with the group standard can be quantitatively assessed. This provides a more refined dimension for quality control, allowing the screening of marginal products that, while usable, exhibit unusual performance, thereby improving the uniformity and reliability of the entire batch of products.

[0085] In an optional embodiment, the test strategy configured in the test strategy configuration step includes a combination of instructions simulating at least one of the following fault scenarios: signal interruption scenario: controlling the target signal control channel to periodically switch on and off, while maintaining continuous power supply to the target power control channel; power fluctuation scenario: controlling the target power control channel to periodically or randomly change its output voltage, while maintaining continuous stable signal output from the target signal control channel; timing anomaly scenario: controlling the target signal control channel and the target power control channel to have abnormal on or off timing.

[0086] In the above embodiments, fault scenarios such as signal interruption, power fluctuation and timing abnormality can be simulated, so that the target screen under test can be aged under more realistic complex working conditions. This helps to discover potential problems of the screen under these abnormal conditions, improve the depth of testing and quality control efficiency, and better verify the stability of the screen under complex power supply and signal combination working conditions.

[0087] In an optional embodiment, the above method further includes a test report generation step: after the test on the target screen under test is completed, a test report is automatically generated; wherein the test report includes at least: the identifier of the executed test strategy, historical data curves of the working parameters, records of abnormal events that occurred and corresponding processing operations, and a comprehensive quality judgment result of the target screen under test based on all monitoring data.

[0088] In the above embodiments, after the test on the target screen is completed, a test report can be automatically generated, which includes the test strategy identifier, historical data curves of working parameters, abnormal event records and corresponding handling operations, and comprehensive quality judgment results based on monitoring data. This facilitates a comprehensive and intuitive presentation of the test situation, accurate traceability of the test process and results, and improves the depth of testing and the efficiency of quality control.

[0089] After testing the target screen, the system automatically generates a test report containing the executed test strategy identifier, historical data curves of working parameters, abnormal event records and corresponding handling operations, and a comprehensive quality judgment result based on monitoring data. This facilitates a comprehensive and intuitive presentation of the test situation, accurate traceability of the test process and results, and improves test depth and quality control efficiency. Based on the collected monitoring data and abnormal handling results, combined with preset judgment rules (such as parameter compliance rate, abnormal number threshold, and defect severity classification), the system automatically generates a comprehensive quality judgment for the target screen, such as qualified, pending re-inspection, or unqualified. The system integrates the above information in a fixed format to generate a structured test report, intuitively presenting the entire test process and results, and supporting subsequent traceability, review, and decision-making. Automated report generation saves time on manual sorting, statistics, and compilation, and is especially suitable for multi-screen parallel testing scenarios, significantly improving the overall efficiency of mass production testing and reducing labor costs. As the final output of the testing process, the test report is not only a presentation of test results but also a repository of quality data. Through batch report analysis (such as abnormality rate statistics for a certain batch), the system can reverse-optimize testing strategies and production processes, driving continuous improvement in quality control.

[0090] This application also provides a screen aging test system for performing the screen aging test method in any of the foregoing embodiments, such as... Figure 2 As shown, Figure 2 This is a structural block diagram of a screen aging test system provided in an embodiment of this application. The system includes:

[0091] The strategy configuration module is used to configure a test strategy for the target screen under test, including signal timing, power parameters and monitoring thresholds, in response to user input or preset programs. The test strategy allows setting independent and timing-dependent control commands for the power control channel and the signal control channel.

[0092] The channel decoupling control module includes a control unit, multiple independent power control channels, and multiple independent signal control channels. The control unit is used to generate independent control signals corresponding to the target screen under test according to the test strategy, and drive the corresponding target power control channel and target signal control channel respectively, so that during the test, the video signal applied to the target screen under test and at least one working power supply can be independently turned on, off, or adjusted.

[0093] The parameter monitoring module includes a monitoring unit corresponding to the target power control channel and / or the target signal control channel, which is used to collect the working parameters of the target screen under test in real time during the test process. The working parameters include the power supply parameters of the target power control channel and / or the signal transmission status parameters corresponding to the target signal control channel.

[0094] The anomaly handling module is used to perform predetermined processing operations when an anomaly is determined to exist in the target power control channel or the target signal control channel based on the comparison results of the real-time acquired operating parameters and monitoring thresholds. The processing operations include at least one of the following: isolating the abnormal channel; recording the abnormal data; and adjusting the control parameters of the abnormal channel.

[0095] It should be noted that the devices or systems provided in the above embodiments are only illustrated by the division of the above functional modules. In practical applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above. In addition, the system and method embodiments provided in the above embodiments belong to the same concept. Other device or system embodiments correspond to the aforementioned method embodiments. Other technical features are described in the previous embodiments and will not be repeated here.

[0096] The present application will be described below with reference to specific embodiments. This application provides an aging test system supporting independent control of 8 channels of signals and power, aiming to solve the problems of limited test scenarios, low efficiency, and difficulty in fault location caused by coupled signal and power control in traditional aging tests. The core lies in constructing completely independent signal control channels and power control channels for each screen under test, and achieving refined, decoupled management and coordinated scheduling of both through a central controller.

[0097] The system mainly includes the following components:

[0098] 1. Central controller:

[0099] like Figure 3 As shown, the STM32F407ZETx is used as the core control unit of the system. This control unit is responsible for the control and scheduling of the entire system, including receiving and executing instructions from the host computer, executing preset or custom aging test procedures, coordinating the work of each module, reading back monitoring data and generating test logs for storage and uploading, etc. In addition, this part can independently manage the signal enable / disable commands for each screen under test.

[0100] The system uses the STM32F407ZETx main control chip as its core, responsible for overall scheduling and process control. The main control chip connects to a TF card file system for storing LUA scripts and LOG data, and interacts with the host computer via an RJ45 interface to receive interactive button commands. The main control chip connects to the STM32F103VETx power control chip and the STM32F103VETx backlight control chip via the SWD control interface, enabling precise management of multiple independent power supplies and backlights. The signal path consists of an FPGA and an SSD2832 / SSD2828 bridge chip, responsible for generating and converting video signals, ultimately outputting them to the screen interface (shown as 8 channels). The system also includes an ESP8266 communication interface for wireless connectivity, and multiple debug interfaces for easy debugging. Error handling and action processing logic runs within the main control chip, coordinating with various modules to complete testing tasks.

[0101] 2. Key Functions:

[0102] (1) such as Figure 4 The diagram shown is an example of the system's power module.

[0103] The system core is the STM32H407ZETX main control chip, which connects to the STM32F103VETX power control chip and the STM32F103VETX backlight control chip via the SWD control interface to enable command issuance and status feedback. The power control section provides multiple independent power supplies for the eight screen interfaces (LCD1 to LCD8). Specifically, this includes five types of positive power supplies (VDDIO, DVDD, VCI, AVDD, and ELVDD, totaling 5×8=40 positive power supplies) and one type of negative power supply (1×8=8 ELVSS). Each power output is monitored in real-time via an ADC sampling circuit, and the feedback is sent to the control chip for closed-loop regulation. The backlight control chip independently manages the screen backlight drive. The main control, power control, and backlight control chips all have independent DEBUG interfaces for easy system debugging and fault diagnosis. 1×8 LEDA represents "positive channels of 8 backlight driver power supplies", corresponding to 8 screens under test (1 channel per screen). "LEDA" is the positive (Anode) power supply channel identifier for the backlight LED string, used to provide positive power to the backlight module of each screen; 4×8=32 LEDK represents "negative channels of 32 constant current sources". "4×8" corresponds to each screen's backlight module containing 4 independent LED strings (8 screens × 4 strings = 32 channels). "LEDK" is the negative (Cathode) power supply channel identifier for the backlight LED string. The current of each LED string is controlled by a constant current source (i.e., "32 constant current sources" in the disclosure document) to achieve independent and stable driving of backlight brightness.

[0104] This section can independently generate or manage power-on / off / voltage regulation commands for each screen under test, and there is no forced correlation logic between the 8 channels. This system includes:

[0105] ① Multi-channel independent programmable power supply module: The entire system includes a total of 48 programmable high-precision DC power supplies, 8 independently switched backlight driver power supplies, and 32 constant current sources. The power module output is expanded through multi-channel independent output circuits to ensure that each screen under test corresponds to an independent power output channel. Each independent power channel includes:

[0106] High-speed power switching devices, such as high-current MOSFETs or relay arrays, receive instructions from the central controller to achieve fast and precise on / off control of the power output of the channel.

[0107] Voltage regulation circuit: Receives instructions from the central controller to independently set and PID regulate the output voltage of each channel (e.g., within ±5%~10% of the nominal voltage).

[0108] ② High-precision current / voltage monitoring circuit: Real-time acquisition of output voltage, current, power and other parameters of each channel, and feedback of data to the central controller for power consumption analysis, anomaly detection and fault location.

[0109] ③ A sophisticated PID voltage compensation algorithm: Relying on a high-precision current / voltage monitoring circuit and an iterative PID voltage compensation algorithm, precise control of the output voltage and a high-speed load response mechanism are achieved.

[0110] (2) Signal control section of the system.

[0111] This section can independently manage signal enable / disable commands for each screen under test. Furthermore, there is no forced correlation logic between the 8 channels. This system includes:

[0112] ① Multi-channel independent signal generation module: The entire system contains 8 MIPI signal drivers. The input terminals of the signal drivers are connected to a high-speed signal matrix, and the input terminals of the matrix are connected to the FPGA, providing it with high-quality and stable RGB signals. This matrix and signal drivers simultaneously provide multiple independent signal output channels, ensuring that each screen under test corresponds to an independent signal input channel. Each independent signal channel includes:

[0113] Signal path switch: Receives instructions from the central controller to achieve high-speed switching (on / off) or signal source selection of the signal input of this channel.

[0114] Signal integrity protection circuits (such as impedance matching and buffer drive) ensure signal quality during switching and transmission, and avoid distortion.

[0115] ② Screen under test interface array: Composed of multiple physical interface units, each unit corresponds to one screen under test station. Each interface unit includes:

[0116] Dedicated power interface: Connects to the output of the corresponding independent power channel to power the screen under test.

[0117] Dedicated signal interface: Connects to the output of the corresponding independent signal channel to provide video signals to the screen under test.

[0118] 3. Human-computer interaction interface:

[0119] With a sophisticated host computer system, users can easily and quickly configure test parameters (such as aging time, signal mode, and power supply voltage), independently set the signal and power status of each screen, start / stop the test, monitor the status of each channel in real time (signal on / off, power switch, voltage and current values, power consumption, and screen status), and view alarms and reports.

[0120] This application also provides a computer-readable storage medium storing instructions that, when executed, perform the steps of any of the methods described above.

[0121] In one exemplary embodiment, the aforementioned computer-readable storage medium may include, but is not limited to, various media capable of storing computer programs, such as a USB flash drive, read-only memory (ROM), random access memory (RAM), portable hard disk, magnetic disk, or optical disk.

[0122] This application also discloses an electronic device. For example... Figure 5 As shown, Figure 5 This is a schematic diagram of the structure of an electronic device disclosed in an embodiment of this application. The electronic device 500 may include: at least one processor 501, at least one network interface 504, a user interface 503, a memory 505, and at least one communication bus 502.

[0123] The communication bus 502 is used to enable communication between these components.

[0124] The user interface 503 may include a display screen, and optionally, the user interface 503 may also include a standard wired interface or a wireless interface.

[0125] The network interface 504 may optionally include a standard wired interface or a wireless interface (such as a Wi-Fi interface).

[0126] The processor 501 may include one or more processing cores. The processor 501 connects to various parts of the electronic device (such as a server) using various interfaces and lines, and performs various server functions and processes data by running or executing instructions, programs, code sets, or instruction sets stored in memory 505, and by calling data stored in memory 505. Optionally, the processor 501 may be implemented using at least one hardware form of Digital Signal Processing (DSP), Field-Programmable Gate Array (FPGA), or Programmable Logic Array (PLA). The processor 501 may integrate one or a combination of several of the following: Central Processing Unit (CPU), Graphics Processing Unit (GPU), and modem. The CPU primarily handles the operating system, user interface, and applications; the GPU is responsible for rendering and drawing the content required for display; and the modem handles wireless communication. It is understood that the modem may also not be integrated into the processor 501 and may be implemented as a separate chip.

[0127] The memory 505 may include random access memory (RAM) or read-only memory. Optionally, the memory 505 may include a non-transitory computer-readable storage medium. The memory 505 may be used to store instructions, programs, code, code sets, or instruction sets. The memory 505 may include a program storage area and a data storage area, wherein the program storage area may store instructions for implementing an operating system, instructions for at least one function (such as touch function, sound playback function, image playback function, etc.), instructions for implementing the above-described method embodiments, etc.; the data storage area may store data involved in the above-described method embodiments, etc. Optionally, the memory 505 may also be at least one storage device located remotely from the aforementioned processor 501. (Refer to...) Figure 5 The memory 505, which serves as a computer storage medium, may include a network communication module, a user interface module, and an application program for a screen aging test method.

[0128] exist Figure 5In the illustrated electronic device 500, the user interface 503 is mainly used to provide an input interface for the user and to acquire user input data; while the processor 501 can be used to call an application program of a screen aging test method stored in the memory 505. When executed by one or more processors 501, the electronic device 500 performs one or more of the methods described in the above embodiments. It should be noted that, for the foregoing method embodiments, for the sake of simplicity, they are all described as a series of actions. However, those skilled in the art should understand that this application is not limited to the described order of actions, because according to this application, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also understand that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily essential to this application.

[0129] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0130] In the various embodiments provided in this application, it should be understood that the disclosed apparatus or system can be implemented in other ways. For example, the apparatus or system embodiments described above are merely illustrative; for instance, the division of units is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some service interface; the indirect coupling or communication connection between apparatuses or units may be electrical or other forms.

[0131] The above description is merely an exemplary embodiment of this disclosure and should not be construed as limiting the scope of this disclosure. Any equivalent changes and modifications made in accordance with the teachings of this disclosure shall still fall within the scope of this disclosure. Other embodiments of this disclosure will be readily apparent to those skilled in the art upon consideration of the disclosure herein.

[0132] This application is intended to cover any variations, uses, or adaptations of this disclosure that follow the general principles of this disclosure and include common knowledge or customary techniques in the art that are not described in this disclosure.

Claims

1. A method of screen burn-in testing, characterized by, The application is applied to an aging test system with multiple independent power supply control channels and multiple independent signal control channels, and comprises the following steps: a test strategy configuration step: in response to user input or a preset program, a test strategy containing signal timing, power supply parameters and monitoring thresholds is configured for a target screen under test; wherein, the test strategy allows the power supply control channel and the signal control channel to be set with control instructions independent of each other and having a timing relationship, and the target screen under test is any one of multiple screens under test; a channel decoupling control step: according to the test strategy, a control unit generates independent control signals corresponding to the target screen under test, respectively drives the corresponding target power supply control channel and target signal control channel, so that the video signal and at least one working power supply applied to the target screen under test can be independently turned on, turned off or adjusted during the test; a parameter real-time monitoring step: through a monitoring unit corresponding to the target power supply control channel and / or the target signal control channel, the working parameters of the target screen under test during the test are collected in real time, and the working parameters include the power supply parameters of the target power supply control channel and / or the signal transmission state parameters corresponding to the target signal control channel; an abnormality processing step: based on the comparison result of the working parameters collected in real time and the monitoring thresholds, when it is determined that the target power supply control channel or the target signal control channel has an abnormality, a predetermined processing operation is performed, and the processing operation includes at least one of the following: isolating the abnormal channel; recording abnormal data; adjusting the control parameters of the abnormal channel.

2. The screen burn-in test method of claim 1, wherein, In the test strategy configuration step, the control instructions independent of each other and having a timing relationship include at least one of the following modes: a power-on-first and signal-providing-later mode: the control instructions are configured to first turn on the target power supply control channel to supply power to the target screen under test, and then turn on the target signal control channel to provide a video signal to the target screen under test after a delay of a first time threshold; a signal-providing-first and power-on-later mode: the control instructions are configured to first turn on the target signal control channel, and then turn on the target power supply control channel after a delay of a second time threshold; an alternating on-off mode: the control instructions are configured to periodically and alternately turn on and off the target signal control channel and the target power supply control channel with a preset period and duty cycle.

3. The screen burn-in test method of claim 1, wherein, In the channel decoupling control step, the process of the control unit generating independent control signals corresponding to the target screen under test includes: the control unit analyzes the power supply control requirements and signal control requirements of the target screen under test in the test strategy, and generates a power supply control instruction set and a signal control instruction set respectively; wherein, the power supply control instruction set contains power-on / off timing, voltage adjustment value and adjustment trigger condition, and the signal control instruction set contains signal enable / disable timing, signal type selection and signal parameter configuration; the power supply control instruction set is delivered to the driving chip of the target power supply control channel through an independent instruction transmission interface, and the signal control instruction set is delivered to the FPGA and signal driver of the target signal control channel.

4. The screen burn-in test method of claim 1, wherein, In the parameter real-time monitoring step, a PID voltage compensation algorithm is used to dynamically adjust the output voltage of the target power supply control channel, and the output voltage is iteratively corrected based on the real-time collected power supply parameters, so that the voltage fluctuation deviation is not more than ±0.5%.

5. The screen burn-in test method of claim 1, wherein, The method further comprises: a test data management step: associating the test strategy, the real-time collected working parameters, and the results of the abnormality handling step with the unique identifier of the target screen under test, and generating a structured test log file for storage or uploading.

6. The screen burn-in test method of claim 1, wherein, The power supply parameters of the target power supply control channel include: output voltage value, output current value, and real-time power value; The signal transmission state parameters corresponding to the target signal control channel include signal differential amplitude, timing establishment time, signal jitter value and error code rate; wherein the monitoring threshold range of the signal differential amplitude is 150mV~400mV, the monitoring threshold of the signal jitter value is not greater than 30ps, and the monitoring threshold of the error code rate is not greater than 10⁻ 9 .

7. The screen burn-in test method of claim 1, wherein, After the parameter real-time monitoring step, the method further comprises: a power consumption characteristic analysis step: based on the real-time collected power supply parameters, calculating the dynamic power consumption curve of the target screen under test within at least one complete test cycle; a characteristic comparison step: comparing the dynamic power consumption curve with the pre-stored standard power consumption curve of the same model of the target screen under test; In the abnormality handling step, based on the deviation result of the characteristic comparison step, it is determined whether the target screen under test has an implicit defect.

8. A screen burn-in test system, characterized by, A device for performing the screen aging test method of any one of claims 1 to 7, comprising: a strategy configuration module configured to configure a test strategy for a target screen under test, the test strategy including signal timing, power supply parameters, and monitoring thresholds, in response to user input or a preset program; wherein the test strategy allows the power supply control channel and the signal control channel to be set with control instructions that are independent of each other and have a timing relationship; a channel decoupling control module including a control unit, a plurality of independent power supply control channels, and a plurality of independent signal control channels; the control unit is configured to generate independent control signals corresponding to the target screen under test according to the test strategy, and drive the corresponding target power supply control channel and target signal control channel, so that the video signal and at least one working power applied to the target screen under test can be independently turned on, turned off, or adjusted during the test; a parameter monitoring module including a monitoring unit corresponding to the target power supply control channel and / or the target signal control channel, configured to collect working parameters of the target screen under test in real time during the test, the working parameters including power supply parameters of the target power supply control channel and / or signal transmission state parameters corresponding to the target signal control channel; an abnormality handling module configured to compare the real-time collected working parameters with the monitoring thresholds, and when it is determined that the target power supply control channel or the target signal control channel has an abnormality, perform a predetermined handling operation, the handling operation including at least one of the following: isolating the abnormal channel; recording abnormal data; adjusting the control parameters of the abnormal channel.

9. An electronic device comprising a memory and a processor, said memory having stored thereon a computer program, characterized in that, The processor executes the program to implement the method of any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that, The computer readable storage medium stores instructions that, when executed, perform the method of any one of claims 1 to 7.

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