A high and low temperature airflow impact tester for batch testing chips

Abstract

The present application relates to chip testing technical field, specifically batch test chip's high and low temperature airflow impact testing instrument, including equipment main body and roll type placement structure, wherein: equipment main body includes cold and hot gas supply device and top plate, roll type placement structure includes two parallelly arranged spools and the flexible belt-shaped component connected between the two spools, cold and hot gas supply device is used to selectively provide cold gas or hot gas to any one spool, two spools are rotatably arranged on the top plate, the position between the two spools is a chip feeding and discharging station, two spools are hollow structure and are each provided with a vent hole, the belt-shaped component has a groove corresponding to the position of the vent hole extending along the length direction of itself, and at least two test sockets are mounted in the groove along the length direction. The present application can improve the number of single test chips, realize batch testing, and improve the chip testing efficiency.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, specifically to a high and low temperature airflow impact tester for batch testing of chips. Background Technology

[0002] In existing technologies, the primary equipment used for high and low temperature reliability testing of chips is a heat flow meter, which uses a heat flow hood to cover the chip to be tested. However, due to the limited size of the heat flow hood, heat flow meters are usually only suitable for testing single chips, limiting the number of chips that can be measured at one time. If batch testing of chips is required, it is time-consuming and inefficient. To address the above problems, this invention proposes a high and low temperature airflow impact tester for batch testing of chips. Summary of the Invention

[0003] The purpose of this invention is to overcome the shortcomings of the prior art and provide a high and low temperature airflow impact tester for batch testing of chips, which can batch test chips, has good temperature consistency in the test environment, good continuity of testing, and high testing efficiency.

[0004] This invention is achieved through the following technical solution:

[0005] A high and low temperature airflow impact tester for batch testing chips includes a main body and a roll-up placement structure. The main body includes a hot and cold air supply device and a top plate. The roll-up placement structure includes two parallel rolls and a flexible strip-shaped component connected between the two rolls. The hot and cold air supply device is used to selectively supply cold or hot air to either roll. The two rolls are rotatably mounted on the top plate. The position between the two rolls is a chip loading / unloading station. The two rolls are hollow and each has a vent hole. The strip-shaped component has a groove extending along its length corresponding to the position of the vent hole. At least two test sockets are installed in the groove along its length.

[0006] Optionally, the roll-type placement structure further includes a mounting bracket equipped with a pressure roller, the mounting bracket equipped with the pressure roller being elastically connected to the top plate radially along the roll shaft via an elastic element.

[0007] Optionally, there are two mounting brackets equipped with pressure rollers, and the two mounting brackets equipped with pressure rollers are symmetrically arranged on both sides of the roll. The roll-type placement structure also includes two pressure plates that are movably sleeved on the outside of the roll. The pressure plates are movably connected to the mounting brackets through connecting rods.

[0008] Optionally, a connecting plate is fixed on the top plate, a connecting shaft is fixed on the mounting bracket, the free end of the connecting shaft moves radially through the connecting plate along the reel, a limiting platform is fixed to the free end of the connecting shaft, and the elastic element is a compression spring, which is located between the connecting plate and the limiting platform and sleeved on the outside of the connecting shaft.

[0009] Optionally, the strip-shaped component is made of rubber.

[0010] Optionally, the roll-type placement structure further includes a three-way valve, branch pipes, and a main body. The inlet of the three-way valve is connected to the hot and cold air supply device through the main body, and the two outlets of the three-way valve are respectively connected to the two rolls through the two branch pipes.

[0011] Optionally, the hot and cold air supply device is a dual-purpose cascade refrigeration system.

[0012] Optionally, the chip loading / unloading station is provided with two pairs of rollers, and the strip component passes between the two pairs of rollers.

[0013] Optionally, an automatic loading and unloading robot is provided at the chip loading and unloading station.

[0014] Optionally, both spools are driven to rotate by a motor, which is mounted on the top plate.

[0015] Compared with the prior art, the present invention provides a high and low temperature airflow impact tester for batch testing chips, which has the following beneficial effects:

[0016] This invention employs a roll-type placement structure, forming a spiral test channel as the strip component winds. Multiple test sockets for chip mounting are arranged within the grooves, enabling single-batch chip testing. By rotating the roll in both directions, the strip component is cyclically transferred between two rolls, allowing for continuous multi-round chip loading, unloading, and testing, thus shortening the time required for batch chip testing. Compared to existing technologies, this invention effectively solves the problem of low batch testing efficiency in heat flow meters.

[0017] The roll-type placement structure of the present invention includes a mounting bracket equipped with a pressure roller. The pressure roller can apply radially inward compressive force to the strip component during the winding process, thereby compressing the gap between adjacent layers of the roll-type component, improving the sealing of the test channel, and reducing the loss of cold or hot airflow.

[0018] The roll-type placement structure of the present invention includes pressure plates that cooperate with mounting brackets equipped with pressure rollers. When the strip component is wound around the outside of the roll, as the diameter of the strip component gradually increases, the mounting bracket is pushed away from the roll. The mounting bracket drives the two pressure plates to approach each other through a connecting rod until the two pressure plates are tightly attached to both ends of the rolled strip component, thereby sealing the gaps between adjacent layers of the rolled strip component, which can further improve the sealing performance of the test channel. Attached Figure Description

[0019] Figure 1 This is a schematic diagram of the high and low temperature airflow impact tester;

[0020] Figure 2 for Figure 1 A partial structural diagram;

[0021] Figure 3 This is a partial schematic diagram of the strip-shaped component;

[0022] Figure 4 A schematic diagram of a high and low temperature airflow impact tester containing a mounting bracket and a pressure plate;

[0023] Figure 5 for Figure 4 A partial schematic diagram of the right-side view.

[0024] In the diagram: 100, main body of the equipment; 110, top plate; 200, first reel; 201, second reel; 202, vent; 210, strip component; 211, groove; 212, gap; 220, test socket; 230, mounting bracket; 231, pressure roller; 232, connecting plate; 233, connecting shaft; 234, limiting platform; 235, compression spring; 236, pressure plate; 237, connecting rod; 240, three-way valve; 241, branch pipe; 242, main body; 243, rotary joint; 250, roller; 260, motor. Detailed Implementation

[0025] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0026] As described in the background section, in the prior art, the main equipment used for high and low temperature reliability testing of chips is a heat flow meter, which uses a heat flow hood to cover the chip to be tested. However, due to the limited size of the heat flow hood, the heat flow meter is usually only suitable for testing a single chip, which limits the number of chips that can be measured at one time. If batch testing of chips is required, it is time-consuming and inefficient.

[0027] To resolve the above issues, please refer to Figures 1 to 3 This invention provides a high and low temperature airflow impact tester for batch testing chips. It mainly includes a main body 100 and a roll-up placement structure. The main body 100 may include a hot and cold air supply device and a top plate 110. The main body 100 may adopt a cabinet structure. The hot and cold air supply device may be located inside the main body 100. The top plate 110 may be fixed to the top of the main body 100. The roll-up placement structure may include two parallel rolls and a flexible strip 210 connected between the two rolls. The strip 210 is flexible, allowing it to be wound around the outside of the rolls. The hot and cold air supply device is used to selectively supply cold or hot air to either roll. The two rolls are rotatably mounted on the top plate 110. Figure 1 As shown, two reels are respectively located on the left and right sides of the top plate 110, with the left reel being the first reel 200 and the right reel 201. The position between the two reels is the chip loading / unloading station. Both reels are hollow structures and each has a vent hole 202. The strip component 210 has a groove 211 extending along its length, corresponding to the position of the vent hole 202. The correspondence between the vent hole 202 and the groove 211 means that when the strip component 210 is wound around the outside of the reel, the vent hole 202 can communicate with the groove 211. At least two test sockets 220 are installed along the length of the groove 211. The appropriate test socket 220 can be selected according to the type of chip to be tested. The chip can be connected to the ATE automatic testing equipment through the test sockets 220 to realize the testing of the chip's electrical performance and functional parameters. The number of test sockets 220 in the groove 211 can be set according to actual needs; the number of test sockets 220 determines the number of chips that can be tested in each round, and the more test sockets, the more chips can be tested in a single round.

[0028] Using the above scheme, when batch testing of chips is required, the strip component 210 can be completely wound around the outside of the first reel 200, and then the two reels can be driven to rotate synchronously, so that the strip component 210 on the first reel 200 is gradually transferred to the second reel 201. During the transfer process, at the chip loading and unloading station, the first batch of chips to be tested are sequentially installed into each test socket 220 in the groove 211 of the strip component 210. When the strip component 210 is basically wound around the outside of the second reel 201, the groove 211 forms a spiral test channel inside the rolled strip component 210. One end of the test channel is connected to the vent 202 of the second reel 201, and the other end is connected to the outside. Multiple test sockets 220 are distributed at intervals along the test channel. Subsequently, the hot or cold air supply device is activated, introducing either hot or cold air into the second reel 201. The airflow enters the test channel through the vent 202 of the second reel 201, flows along the test channel, and then exits. During this flow, all chips in the test channel can undergo high and low temperature shock tests. In the second round of testing, the two reels are driven to rotate in opposite directions, causing the strip component 210 to gradually transfer from the second reel 201 to the first reel 200. During this transfer, chips that have completed the first round of testing are removed at the chip loading / unloading station, and chips for the second round of testing are installed, continuing the testing process. This cycle repeats until the second round of testing is completed. After completing the second round, a third, fourth, and so on up to the nth round of testing can be conducted as needed, until all chips have been tested. Therefore, this high and low temperature airflow shock tester can increase the number of chips tested per cycle, enabling batch testing and improving chip testing efficiency.

[0029] like Figure 4 and Figure 5 As shown, in some embodiments, the roll-type placement structure further includes a mounting bracket 230 equipped with a pressure roller 231, which is elastically connected to the top plate 110 radially along the roll shaft via an elastic element. The pressure roller 231 can apply a radially inward compressive force to the strip component 210 during the winding process, thereby compressing the gap between adjacent layers of the roll component 210, improving the sealing of the test channel, and reducing the loss of cold or hot airflow.

[0030] like Figure 4 and Figure 5 As shown, in some embodiments, there are two mounting brackets 230 equipped with the pressure rollers 231. The two mounting brackets 230 equipped with the pressure rollers 231 are symmetrically arranged on both sides of the reel. For example, Figure 1As shown, two mounting brackets 230 equipped with clamping rollers 231 can be symmetrically arranged on the upper and lower sides of the roll. The roll-type placement structure also includes two pressure plates 236 movably sleeved on the outside of the roll. The pressure plates 236 are movably connected to the mounting brackets 230 via connecting rods 237. The connecting rods 237 and the mounting brackets 230, as well as the connecting rods 237 and the pressure plates 236, can be rotatably connected via shafts. By setting pressure plates 236 that cooperate with the mounting brackets 230 equipped with clamping rollers 231, when the strip component 210 is wound around the outside of the roll, as the diameter of the strip component 210 gradually increases, the mounting brackets 230 are pushed away from the roll. The mounting brackets 230 drive the two pressure plates 236 to move closer to each other via the connecting rods 237 until the two pressure plates 236 are tightly fitted at both ends of the rolled strip component 210, thereby sealing the gaps 212 between adjacent layers of the rolled strip component 210 and further improving the sealing performance of the test channel.

[0031] like Figure 4 and Figure 5 As shown, to achieve the radial elastic connection between the mounting bracket 230 equipped with the pressure roller 231 and the top plate 110 via an elastic element along the spool, in some embodiments, a connecting plate 232 is fixed on the top plate 110, and a connecting shaft 233 is fixed on the mounting bracket 230. The free end of the connecting shaft 233 moves radially through the connecting plate 232 along the spool, and a limiting platform 234 is fixed to the free end of the connecting shaft 233. The elastic element is a compression spring 235, which is located between the connecting plate 232 and the limiting platform 234 and sleeved outside the connecting shaft 233. Of course, any mounting bracket 230 equipped with the pressure roller 231 can be radially elastically connected to the top plate 110 via an elastic element along the spool. This application does not limit the specific connection method between the mounting bracket 230 and the top plate 110.

[0032] In some embodiments, the strip component 210 is made of rubber (such as silicone rubber). By using a rubber strip component 210, the thermal insulation and sealing performance of the test channel can be improved.

[0033] like Figure 2 As shown, in some embodiments, the roll-type placement structure further includes a three-way valve 240, branch pipes 241, and a main body 242. The inlet of the three-way valve 240 is connected to the hot or cold air supply device through the main body 242, and the two outlets of the three-way valve 240 are respectively connected to two rolls through two branch pipes 241. In order not to affect the rotation of the rolls, the branch pipes 241 can be connected to the rolls using a rotary joint 243. The three-way valve 240 can change the airflow path, thereby inputting the cold or hot air generated by the hot or cold air supply device into either roll.

[0034] In some embodiments, the hot and cold air supply device is a dual-purpose cascade refrigeration system (specifically, the Jiangsu Kangshijie KD-10WHD-L model). The cascade refrigeration system can output cold air in cooling mode and hot air in heating mode. Alternatively, the hot and cold air supply device can also be a single-stage compression-auxiliary heating combination system.

[0035] like Figure 1 and Figure 2 As shown, in some embodiments, the chip loading / unloading station is provided with two pairs of rollers 250, and the strip component 210 passes between the two pairs of rollers 250. The two pairs of rollers 250 can ensure that the height of the strip component 210 remains constant as it passes through the chip loading / unloading station, which facilitates the chip loading / unloading operation.

[0036] In some embodiments, an automated loading / unloading robot (not shown) is installed at the chip loading / unloading station. This robot enables automated loading and unloading operations at the station, using a vision positioning system to pick up and place chips, effectively improving chip testing efficiency. In other embodiments, operators can manually load and unload chips at the station using an anti-static pick-up pen; this method is suitable for testing small batches of chips.

[0037] like Figure 5 As shown, in some embodiments, both spools are driven to rotate by a motor 260, which is mounted on the top plate 110.

[0038] Although embodiments of the invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A high and low temperature airflow impact tester for batch testing chips, characterized in that, The device includes a main body (100) and a roll-type placement structure, wherein: the main body (100) includes a hot and cold air supply device and a top plate (110), the roll-type placement structure includes two parallel rolls and a flexible strip component (210) connected between the two rolls, the hot and cold air supply device is used to selectively supply cold or hot air to either roll, the two rolls are rotatably mounted on the top plate (110), the position between the two rolls is a chip loading and unloading station, the two rolls are hollow structures and each is provided with a vent hole (202), the strip component (210) has a groove (211) extending along its own length direction corresponding to the position of the vent hole (202), and at least two test sockets (220) are installed in the groove (211) along the length direction.

2. The high and low temperature airflow impact tester for batch testing chips according to claim 1, characterized in that: The roll-type placement structure also includes a mounting bracket (230) equipped with a pressure roller (231), which is elastically connected to the top plate (110) radially along the roll shaft by an elastic element.

3. The high and low temperature airflow impact tester for batch testing chips according to claim 2, characterized in that: There are two mounting brackets (230) equipped with pressure rollers (231). The two mounting brackets (230) equipped with pressure rollers (231) are symmetrically arranged on both sides of the roll. The roll-type placement structure also includes two pressure plates (236) movably sleeved on the outside of the roll. The pressure plates (236) and the mounting brackets (230) are movably connected by a connecting rod (237).

4. The high and low temperature airflow impact tester for batch testing chips according to claim 2, characterized in that: A connecting plate (232) is fixed on the top plate (110), and a connecting shaft (233) is fixed on the mounting bracket (230). The free end of the connecting shaft (233) moves radially through the connecting plate (232) along the reel. A limiting platform (234) is fixed to the free end of the connecting shaft (233). The elastic element is a compression spring (235). The compression spring (235) is located between the connecting plate (232) and the limiting platform (234) and is sleeved on the outside of the connecting shaft (233).

5. The high and low temperature airflow impact tester for batch testing chips according to claim 1, characterized in that: The strip component (210) is made of rubber.

6. The high and low temperature airflow impact tester for batch testing chips according to claim 1, characterized in that: The roll-type placement structure also includes a three-way valve (240), a branch pipe (241), and a main body (242). The inlet of the three-way valve (240) is connected to the hot and cold air supply device through the main body (242), and the two outlets of the three-way valve (240) are respectively connected to the two rolls through the two branch pipes (241).

7. The high and low temperature airflow impact tester for batch testing chips according to claim 1, characterized in that: The hot and cold air supply device is a dual-purpose cascade refrigeration system.

8. The high and low temperature airflow impact tester for batch testing chips according to claim 1, characterized in that: The chip loading and unloading station is provided with two pairs of rollers (250), and the strip component (210) passes between the two pairs of rollers (250).

9. The high and low temperature airflow impact tester for batch testing chips according to claim 1, characterized in that: An automatic loading and unloading robot is installed at the chip loading and unloading station.

10. The high and low temperature airflow impact tester for batch testing chips according to claim 1, characterized in that: Both of the rollers are driven to rotate by a motor (260), which is mounted on the top plate (110).

Images