High frequency and collector assembly performance detection apparatus and method

Abstract

This invention relates to the field of traveling wave tube (TWT) testing technology, specifically a device and method for testing the performance of high-frequency and collector components. The testing device includes a sealed box with a vacuum baffle valve inside, dividing the box into a rear half and a front half. Both the rear and front half have evacuation ports connected to a vacuum pump. The front half has an interface. It also includes a testing connector, with an input end cap connector at its front end and a rear end weldable to the interface. The connector has a through-hole extending from front to back. The front end of the input end cap connector can connect to an input high-frequency component. After being cut from the testing connector, the rear end of the input end cap connector can connect to an electron gun. This invention allows for performance testing of the high-frequency and collector components before the TWT is assembled into a complete tube. If the test fails, only the defective high-frequency and collector components need to be scrapped, and the electron gun can be reused, saving costs.

Description

Technical Field

[0001] This invention relates to the field of traveling wave tube testing technology, specifically a high-frequency and collector electrode component performance testing device and method. Background Technology

[0002] A traveling wave tube (TWT) is a microwave vacuum electronic device that amplifies microwave, millimeter-wave, and terahertz signals, and is widely used in national defense and the national economy. A TWT mainly consists of an electron gun, an input high-frequency generator, an output high-frequency generator, a collector, a power transmission device, and a magnetic focusing system. During the manufacturing process of a TWT, the assembly precision between the various components needs to be strictly controlled. However, due to the large number of parts and the difficulty in precisely controlling the machining accuracy of the components, the accumulation of errors after multiple assembly processes often makes it impossible to guarantee that the components are in a relatively ideal position. This results in the inability to guarantee the assembly precision of the components, affecting its quality and performance.

[0003] The high-frequency and collector components operate in a high-vacuum environment. In an atmospheric environment, only dimensional and visual inspections are possible, making it impossible to determine their final performance under operating conditions. Therefore, performance testing of the high-frequency and collector components is necessary after the entire tube assembly and welding are completed. The specific testing process involves evacuating the entire tube to remove gas, then powering on and adjusting the electron gun component to confirm the final performance of each component. If the overall tube performance does not meet requirements, it indicates a performance defect in the component, necessitating replacement or design changes. However, since the components are welded together and the interior is under vacuum, conventional methods cannot separate them without damage. Furthermore, the electron gun component cannot come into contact with air after being powered on, otherwise, it would cause cathode damage. Therefore, existing testing methods, performed after the entire tube welding and evacuation, do not allow for component replacement even if the high-frequency and collector components are found to be substandard, necessitating the scrapping of the entire tube. Summary of the Invention

[0004] The main objective of this invention is to provide a device and method for testing the performance of high-frequency and collector components, in order to solve the problem that in the existing testing methods described above, the testing is carried out after the entire tube is welded and vacuumed. Even if the performance of the high-frequency and collector components is found to be unsatisfactory, the components cannot be replaced and the entire tube must be scrapped.

[0005] To achieve the above objectives, the present invention provides a high-frequency and collector electrode component performance testing device, including a sealed box, a vacuum baffle valve disposed inside the sealed box, the vacuum baffle valve dividing the sealed box into a rear half and a front half, the rear half and the front half being provided with evacuation holes connected to a vacuum pumping device; the front half being provided with an interface; and a testing connector, the front end of which is provided with an input end cap connector, the rear end of which can be welded to the interface, and an internal through-hole; the front end of the input end cap connector can be connected to an input high frequency; after the input end cap connector is cut off from the testing connector, its rear end can be connected to an electron gun.

[0006] Furthermore, the outer end of the testing connector is provided with a welding protrusion for welding.

[0007] Furthermore, a lead screw and slider mechanism is installed in the rear half of the box. The lead screw and slider mechanism includes a motor, a lead screw connected to the motor, and a slider driven by the lead screw; the slider is connected to an electron gun fixing bracket extending forward therefrom.

[0008] Furthermore, the front half of the box is equipped with a first knife-edge flange, and a second knife-edge flange is bolted to the first knife-edge flange. A sealing gasket is provided between the first knife-edge flange and the second knife-edge flange; the second knife-edge flange has an interface inside.

[0009] The present invention also provides a method for testing the performance of high-frequency and collector components, using the above-mentioned high-frequency and collector component performance testing device, comprising the following steps:

[0010] S1. Weld the input high frequency, the output high frequency and the collector electrode to form a high frequency and collector electrode assembly;

[0011] S2. Fix the electron gun inside the rear half of the box. The cathode of the electron gun is in an inactive state. Connect the electron gun to the high-voltage wire.

[0012] S3. Close the vacuum baffle valve, evacuate the interior of the rear half of the chamber and maintain the vacuum.

[0013] S4. Connect the input high frequency of the high frequency and collector electrode assembly to the input end cap connector at the front end of the detection connector, and weld the rear end of the detection connector to the interface on the sealed box. After welding, the high frequency and collector electrode assembly are kept coaxial with the electron gun.

[0014] S5. Evacuate and maintain the vacuum in the front half of the box. When the vacuum levels of the front and rear half of the box meet the requirements, open the vacuum baffle valve to connect the front and rear half of the box.

[0015] S6. Power on and debug the electron gun. After powering on, the cathode of the electron gun is activated, and the performance of the high-frequency and collector components is tested.

[0016] S7. After the test is completed, close the vacuum baffle valve to keep the electron gun in the rear half of the box in a vacuum environment, connect the air extraction port of the front half of the box to the outside atmosphere, and desolder the test connector from the sealed box.

[0017] S8. If the test is qualified, the input end cover connector is cut off from the test connector and the input end cover connector is welded to another electron gun, so that the input end cover connector assembles the high frequency and collector components with the electron gun.

[0018] If the test fails, the high-frequency and collector components connected to the input end cap connector will be discarded.

[0019] Furthermore, a lead screw and slider mechanism is provided in the rear half of the box. The lead screw and slider mechanism includes a motor, a lead screw connected to the motor, and a slider driven by the lead screw; the slider is connected to an electron gun fixing bracket extending forward therefrom.

[0020] In step S2, the electron gun is fixed on the electron gun mounting bracket inside the rear half of the box, the cathode of the electron gun is in an inactive state, and the electron gun is connected to the high-voltage wire.

[0021] In step S6, the motor is started, which drives the slider to slide. The slider drives the electron gun to approach the input high frequency. The electron gun is powered on and debugged. After powering on, the cathode of the electron gun is activated, and the performance of the high frequency and collector components is tested.

[0022] Furthermore, the front half of the box is provided with a first knife-edge flange, and a second knife-edge flange is connected to the first knife-edge flange by bolts. A sealing gasket is provided between the first knife-edge flange and the second knife-edge flange; an interface is provided inside the second knife-edge flange.

[0023] In step S4, the input high frequency of the high frequency and the collector electrode assembly is connected to the input end cap connector at the front end of the detection connector; the second knife flange is separated from the first knife flange, the rear end of the detection connector is welded to the interface on the sealing box, and after welding, the second knife flange is connected to the first knife flange. After completion, the high frequency and the collector electrode assembly are kept coaxial with the electron gun.

[0024] In step S7, after the test is completed, close the vacuum baffle valve to keep the electron gun in a vacuum environment, connect the evacuation port of the first half of the box to the outside atmosphere, separate the second knife-edge flange from the first knife-edge flange, and desolder the test connector from the sealed box.

[0025] The beneficial effects of this invention are:

[0026] This invention enables performance testing of the high-frequency and collector components before the traveling wave tube is assembled into a complete tube. If the test fails, only the unqualified high-frequency and collector components need to be scrapped. The electron gun is always in a vacuum environment, and the cathode of the electron gun will not come into contact with the atmosphere and be damaged. It can be reused, thereby avoiding material waste and saving costs.

[0027] This invention, by setting a baffle valve, can separate or connect the sealed boxes; the baffle valve can be opened during testing to connect the electron gun with the high-frequency and collecting electrode components; after testing, the baffle valve can be closed to isolate one electron gun and disassemble the high-frequency and collecting electrode components, so that the electron gun is always in a vacuum sealed space.

[0028] This invention, by setting a lead screw and slider mechanism, can drive the electron gun as close as possible to the input high frequency, thereby making the detection results more accurate.

[0029] By setting a first blade flange and a second blade flange, this invention enables the second blade flange to be separated from the first blade flange before welding or detaching the testing connector from the sealing box, thus making operation easier and avoiding damage to the sealing box during welding or detachment. Attached Figure Description

[0030] The accompanying drawings, which form part of this application, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an improper limitation of the invention.

[0031] Figure 1 This is a schematic diagram of the traveling wave tube in the embodiment;

[0032] Figure 2 This is a schematic diagram of the high-frequency and collector electrode component performance testing device in the embodiment;

[0033] Figure 3 This is a schematic diagram of the structure at the detection connector in the embodiment;

[0034] Figure 4 This is a schematic diagram of the lead screw and slider mechanism in the embodiment;

[0035] In the diagram: 1. Sealed box; 101. Rear half box; 102. Front half box; 102a. First knife-edge flange; 102b. Second knife-edge flange; 102c. Sealing gasket; 102d. Interface; 103. Evacuation port; 2. Vacuum baffle valve; 3. Detection connector; 301. Input end cover connector; 302. Connecting hole; 303. Welding ring; 4. Electron gun; 5. Lead screw and slider mechanism; 501. Motor; 502. Lead screw; 503. Slider; 504. Sliding rod; 6. Electron gun mounting bracket; 7. Collector electrode; 8. Input high frequency; 9. Output high frequency. Detailed Implementation

[0036] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. The present invention will now be described in detail with reference to the accompanying drawings and embodiments.

[0037] Example 1

[0038] Example 1 provides a high-frequency and collector component performance testing device for testing traveling wave tubes, such as... Figure 1 As shown, the traveling wave tube includes a collector 7, an output high frequency 9, an input high frequency 8, and an electron gun 4 connected sequentially from front to back. The input high frequency 8 is connected to the electron gun 4 through an input end cap connector 301. The input high frequency 8, the output high frequency 9, and the collector 7 are connected to form a high frequency and collector assembly.

[0039] like Figures 1 to 3 As shown, the high-frequency and collector electrode component performance testing device includes a sealed box 1, which is cylindrical with an inner diameter of 220 mm and a length of 560 mm. A vacuum baffle valve 2 is installed inside the sealed box 1. The vacuum baffle valve 2 is a DN100 all-metal ultra-high vacuum pneumatic baffle valve (Swiss VAT). The vacuum baffle valve 2 divides the sealed box 1 into a rear half-box 101 and a front half-box 102. Both the rear half-box 101 and the front half-box 102 are equipped with evacuation ports 103 connected to a vacuum pumping device. The vacuum pumping device consists of a mechanical pump (Leybold ECODY 40 PULS). The system includes a combination of an 8L / S dry pump, an ion pump (Agilent 500L / s), and a molecular pump (Pfizer 600L / s); a circular interface 102d is provided on the front half of the chamber 102, which connects the inside and outside of the front half of the chamber 102; it also includes a detection connector 3, the front end of which is provided with an input end cap connector 301, and the rear end can be sealed and welded to the interface 102d, and the interior is provided with a through hole 302; the front end of the input end cap connector 301 can be connected to the input high frequency 8; a cutting line is drawn along the circumference of the detection connector 3; after the input end cap connector 301 is cut off from the detection connector 3 along the cutting line, its rear end can be connected to the electron gun 4.

[0040] The rear end of the detection connector 3 can be plugged into the interface 102d. The outer end of the detection connector 3 is provided with a welding protrusion 303 for welding, which can also play an auxiliary positioning role.

[0041] Example 2

[0042] like Figures 1 to 4 As shown, Embodiment 2 provides a high-frequency and collector electrode component performance testing device, which differs from the high-frequency and collector electrode component performance testing device in Embodiment 1 only in that:

[0043] The rear half-box 101 is equipped with a lead screw and slider mechanism 5, which includes a motor 501, a lead screw 502 connected to the motor 501, and a slider 503 driven by the lead screw 502. Sliding rods 504 are slidably connected to both ends of the slider 503. The motor 501 drives the lead screw 502 to rotate, and the lead screw 502 can drive the slider 503 to slide back and forth. The slider 503 is connected to an electron gun fixing bracket 6 that extends forward, and the slider 503 can drive the electron gun fixing bracket 6 to move back and forth.

[0044] Example 2, by setting a lead screw and slider mechanism, can drive the electron gun as close as possible to the input high frequency, thereby making the detection results more accurate.

[0045] Example 3

[0046] like Figures 1 to 4 As shown, Embodiment 3 provides a high-frequency and collector electrode component performance testing device, which differs from the high-frequency and collector electrode component performance testing device in Embodiment 2 only in that:

[0047] The front half of the box 102 is provided with a first knife-edge flange 102a, and a second knife-edge flange 102b is connected to the first knife-edge flange 102a by bolts. A sealing gasket 102c is provided between the first knife-edge flange 102a and the second knife-edge flange 102b. An interface 102d is provided inside the second knife-edge flange 102b.

[0048] Example 3, by setting a first knife-edge flange and a second knife-edge flange, allows the second knife-edge flange to be separated from the first knife-edge flange before welding or detaching the testing connector from the sealing box, thus making operation easier and avoiding damage to the sealing box during welding or detachment.

[0049] Example 4

[0050] A method for testing the performance of high-frequency and collector components, using the high-frequency and collector component performance testing device described in Example 1, includes the following steps:

[0051] S1. Weld the input high frequency 8, the output high frequency 9 and the collector electrode 7 to form a high frequency and collector electrode assembly;

[0052] S2. Fix the electron gun 4 inside the rear half box 101. The cathode of the electron gun 4 is in an inactive state. Connect the electron gun 4 to the high-voltage wire.

[0053] S3. Close the vacuum baffle valve 2, evacuate and maintain a vacuum inside the rear half of the box 101;

[0054] S4. Connect the input high frequency 8 of the high frequency and collector electrode assembly to the input end cap connector 301 at the front end of the detection connector 3. Seal the rear end of the detection connector 3 to the interface 102d on the sealed box 1 by brazing. After the welding is completed, the high frequency and collector electrode assembly and the electron gun 4 remain coaxial.

[0055] S5. Vacuum the first half of chamber 102 and maintain it. The first half of chamber 102 is connected to the inside of the high-frequency and collector electrode assembly. Vacuuming the first half of chamber 102 also achieves vacuuming inside the high-frequency and collector electrode assembly. When the vacuum level of both the second half of chamber 101 and the first half of chamber 102 reaches 5×10 -8 When Pa, open vacuum baffle valve 2 to connect the rear half box 101 and the front half box 102.

[0056] S6. Power on and debug the electron gun 4. After powering on, the cathode of the electron gun 4 is activated, and the performance of the high-frequency and collector components is tested. The high-frequency component, which is composed of the input high-frequency 8 and the output high-frequency 9, has a spiral inside. The electromagnetic wave signal will be transmitted along the surface of the spiral. After the electron gun 4 is powered on, the cathode will emit an electron beam. When an electron beam passes through the center of the spiral at a certain speed, it will interact with the electromagnetic wave signal and amplify the signal. After passing through the high-frequency component, the electron beam will enter the collector 7 and then be recovered by the collector 7. The signal amplification power of the high-frequency component and the electron recovery efficiency of the collector 7 can only be obtained after the electron beam has passed through.

[0057] S7. After the test is completed, close the vacuum baffle valve 2 so that the electron gun 4 in the rear half box 101 is always in a vacuum environment, connect the air extraction port 103 of the front half box 102 to the outside atmosphere, and desolder the test connector 3 from the sealed box 1.

[0058] S8. If the test is qualified, the input end cover connector 301 is cut off from the test connector 3 along the cutting line, and the input end cover connector 301 is welded to another electron gun 4, so that the input end cover connector 301 assembles the high frequency and collector components with the electron gun 4.

[0059] If the test fails, the high-frequency and collector components connected to the input end cover connector 301 will be discarded.

[0060] Example 5

[0061] A method for testing the performance of high-frequency and collector components, using the high-frequency and collector component performance testing device described in Example 2, includes the following steps:

[0062] S1. Weld the input high frequency 8, the output high frequency 9 and the collector electrode 7 to form a high frequency and collector electrode assembly;

[0063] S2. Fix the electron gun 4 on the electron gun mounting bracket 6 inside the rear half box 101. The cathode of the electron gun 4 is in an inactive state. Connect the electron gun 4 to the high voltage wire.

[0064] S3. Close the vacuum baffle valve 2, evacuate and maintain a vacuum inside the rear half of the box 101;

[0065] S4. Connect the input high frequency 8 of the high frequency and collector electrode assembly to the input end cap connector 301 at the front end of the detection connector 3. Seal the rear end of the detection connector 3 to the interface 102d on the sealed box 1 by brazing. After the welding is completed, the high frequency and collector electrode assembly and the electron gun 4 remain coaxial.

[0066] S5. Vacuum the first half of chamber 102 and maintain it. The first half of chamber 102 is connected to the inside of the high-frequency and collector electrode assembly. Vacuuming the first half of chamber 102 also achieves vacuuming inside the high-frequency and collector electrode assembly. When the vacuum level of both the second half of chamber 101 and the first half of chamber 102 reaches 5×10 -8 When Pa, open vacuum baffle valve 2 to connect the rear half box 101 and the front half box 102.

[0067] S6. Start motor 501, which drives slider 503 to slide. Slider 503 moves electron gun 4 closer to input high frequency 8, making the distance between electron gun 4 and input high frequency 8 1-2mm. Power on electron gun 4 for debugging. After powering on, the cathode of electron gun 4 is activated, and the performance of high frequency and collector components is tested. The high frequency component composed of input high frequency 8 and output high frequency 9 has a spiral inside, and electromagnetic wave signals will be transmitted along the surface of the spiral. After electron gun 4 is powered on, the cathode will emit an electron beam. When an electron beam passes through the center of the spiral at a certain speed, it will interact with the electromagnetic wave signal to amplify the signal. After passing through the high frequency component, the electron beam will enter the collector 7 and be recovered by the collector 7. The signal amplification power of the high frequency component and the electron recovery efficiency of the collector 7 can only be obtained after the electron beam passes through.

[0068] S7. After the test is completed, close the vacuum baffle valve 2 so that the electron gun 4 in the rear half box 101 is always in a vacuum environment, connect the air extraction port 103 of the front half box 102 to the outside atmosphere, and desolder the test connector 3 from the sealed box 1.

[0069] S8. If the test is qualified, the input end cover connector 301 is cut off from the test connector 3 along the cutting line, and the input end cover connector 301 is welded to another electron gun 4, so that the input end cover connector 301 assembles the high frequency and collector components with the electron gun 4.

[0070] If the test fails, the high-frequency and collector components connected to the input end cover connector 301 will be discarded.

[0071] Example 6

[0072] A method for testing the performance of high-frequency and collector components, using the high-frequency and collector component performance testing device described in Example 3, includes the following steps:

[0073] S1. Weld the input high frequency 8, the output high frequency 9 and the collector electrode 7 to form a high frequency and collector electrode assembly;

[0074] S2. Fix the electron gun 4 on the electron gun mounting bracket 6 inside the rear half box 101. The cathode of the electron gun 4 is in an inactive state. Connect the electron gun 4 to the high voltage wire.

[0075] S3. Close the vacuum baffle valve 2, evacuate and maintain a vacuum inside the rear half of the box 101;

[0076] S4. Connect the input high frequency 8 of the high frequency and collector electrode assembly to the input end cap connector 301 at the front end of the detection connector 3; separate the second knife flange 102b from the first knife flange 102a; weld the rear end of the detection connector 3 to the interface 102d on the sealing box 1; after welding, connect the second knife flange 102b to the first knife flange 102a; after completion, the high frequency and collector electrode assembly and the electron gun 4 are kept coaxial.

[0077] S5. Vacuum the first half of chamber 102 and maintain it. The first half of chamber 102 is connected to the inside of the high-frequency and collector electrode assembly. Vacuuming the first half of chamber 102 also achieves vacuuming inside the high-frequency and collector electrode assembly. When the vacuum level of both the second half of chamber 101 and the first half of chamber 102 reaches 5×10 -8 When Pa, open vacuum baffle valve 2 to connect the rear half box 101 and the front half box 102.

[0078] S6. Start motor 501, which drives slider 503 to slide. Slider 503 moves electron gun 4 closer to input high frequency 8, making the distance between electron gun 4 and input high frequency 8 1-2mm. Power on electron gun 4 for debugging. After powering on, the cathode of electron gun 4 is activated, and the performance of high frequency and collector components is tested. The high frequency component composed of input high frequency 8 and output high frequency 9 has a spiral inside, and electromagnetic wave signals will be transmitted along the surface of the spiral. After electron gun 4 is powered on, the cathode will emit an electron beam. When an electron beam passes through the center of the spiral at a certain speed, it will interact with the electromagnetic wave signal to amplify the signal. After passing through the high frequency component, the electron beam will enter the collector 7 and be recovered by the collector 7. The signal amplification power of the high frequency component and the electron recovery efficiency of the collector 7 can only be obtained after the electron beam passes through.

[0079] S7. After the test is completed, close the vacuum baffle valve 2 to keep the electron gun 4 in a vacuum environment, and connect the evacuation port 103 of the front half box 102) to the outside atmosphere; separate the second knife flange 102b from the first knife flange 102a, and desolder the test connector 3 from the sealing box 1.

[0080] S8. If the test is qualified, the input end cover connector 301 is cut off from the test connector 3 along the cutting line, and the input end cover connector 301 is welded to another electron gun 4, so that the input end cover connector 301 assembles the high frequency and collector components with the electron gun 4.

[0081] If the test fails, the high-frequency and collector components connected to the input end cover connector 301 will be discarded.

[0082] Examples 1-6 enable performance testing of the high-frequency and collector components before the traveling wave tube is assembled into a complete tube. If the test fails, only the unqualified high-frequency and collector components need to be scrapped. The electron gun is always in a vacuum environment, and the cathode of the electron gun will not come into contact with the atmosphere and be damaged. It can be reused, thereby avoiding material waste and saving costs.

[0083] Examples 1-6, by setting baffle valves, can separate or connect sealed boxes; the baffle valves can be opened during testing to connect the electron gun with the high-frequency and collecting electrode components; after testing, the baffle valves can be closed to isolate one electron gun and disassemble the high-frequency and collecting electrode components, so that the electron gun is always in a vacuum sealed space.

[0084] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A high-frequency and collector electrode component performance testing device, characterized in that, The input high frequency (8), the output high frequency (9) and the collecting electrode (7) are welded to form a high frequency and collecting electrode assembly; the detection device includes a sealed box (1), and a vacuum baffle valve (2) is provided inside the sealed box (1). The vacuum baffle valve (2) divides the sealed box (1) into a rear half box (101) and a front half box (102). When the vacuum baffle valve (2) is opened, the rear half box (101) and the front half box (102) can be connected; The rear half-box (101) and the front half-box (102) are provided with air extraction holes (103) connected to the vacuum pumping device; the rear half-box (101) is provided with an electron gun fixing bracket (6) for fixing the electron gun (4), the electron gun fixing bracket (6) is used to keep the high frequency and collecting electrode components coaxial with the electron gun (4), and the high frequency and collecting electrode components performance can be detected by powering on and debugging the electron gun (4); the front half-box (102) is provided with an interface (102d). It also includes a detection connector (3), the front end of which is provided with an input end cap connector (301), the rear end of which can be welded to the interface (102d), and the interior is provided with a through hole (302) that runs through the front and rear. The front end of the input end cap connector (301) can be connected to the input high frequency (8). After the input end cap connector (301) is cut off from the detection connector (3), its rear end can be connected to another electron gun (4), so that the input end cap connector (301) assembles the high frequency and collector components with another electron gun (4).

2. The high-frequency and collector electrode component performance testing device as described in claim 1, characterized in that, The outer end of the detection connector (3) is provided with a welding ring (303) for welding.

3. The high-frequency and collector electrode component performance testing device as described in claim 1, characterized in that, The rear half box (101) is provided with a lead screw and slider mechanism (5), which includes a motor (501), a lead screw (502) connected to the motor (501), and a slider (503) driven by the lead screw (502); the slider (503) is connected to an electron gun fixing bracket (6) extending forward therefrom.

4. The high-frequency and collector electrode component performance testing device as described in claim 1, characterized in that, The front half box (102) is provided with a first knife-edge flange (102a), and the first knife-edge flange (102a) is connected to a second knife-edge flange (102b) by bolts. A sealing gasket (102c) is provided between the first knife-edge flange (102a) and the second knife-edge flange (102b); the second knife-edge flange (102b) is provided with an interface (102d).

5. A method for testing the performance of high-frequency and collector components, characterized in that, The high-frequency and collector electrode component performance testing device of claim 1 includes the following steps: S1. Weld the input high frequency (8), the output high frequency (9) and the collector (7) to form a high frequency and collector assembly; S2. Fix the electron gun (4) inside the rear half box (101). The cathode of the electron gun (4) is in an inactive state. Connect the electron gun (4) to the high voltage wire. S3. Close the vacuum baffle valve (2), evacuate the interior of the rear half box (101) and maintain the vacuum. S4. Connect the input high frequency (8) of the high frequency and collector electrode assembly to the input end cap connector (301) at the front end of the detection connector (3), and weld the rear end of the detection connector (3) to the interface (102d) on the sealed box (1). After welding, the high frequency and collector electrode assembly and the electron gun (4) remain coaxial. S5. Evacuate and maintain the vacuum in the front half box (102). When the vacuum levels of the rear half box (101) and the front half box (102) meet the requirements, open the vacuum baffle valve (2) to connect the rear half box (101) and the front half box (102). S6. Power on and debug the electron gun (4). After powering on, the cathode of the electron gun (4) is activated, and the performance of the high frequency and collector components is tested. S7. After the test is completed, close the vacuum baffle valve (2) so that the electron gun (4) in the rear half box (101) is always in a vacuum environment, connect the air extraction port (103) of the front half box (102) to the outside atmosphere, and desolder the test connector (3) from the sealed box (1). S8. If the test is qualified, the input end cover connector (301) is cut off from the test connector (3), and the input end cover connector (301) is welded to another electron gun (4), so that the input end cover connector (301) assembles the high frequency and collector components with another electron gun (4). If the test fails, the high-frequency and collector components connected to the input end cap connector (301) will be discarded.

6. The method for testing the performance of high-frequency and collector components as described in claim 5, characterized in that, The rear half-box (101) is provided with a lead screw and slider mechanism (5), which includes a motor (501), a lead screw (502) connected to the motor (501), and a slider (503) driven by the lead screw; the slider (503) is connected to an electron gun fixing bracket (6) extending forward therefrom. In step S2, the electron gun (4) is fixed on the electron gun fixing bracket (6) inside the rear half box (101), the cathode of the electron gun (4) is in an inactive state, and the electron gun (4) is connected to the high voltage wire. In step S6, the motor (501) is started, which drives the slider (503) to slide. The slider (503) drives the electron gun (4) to approach the input high frequency (8). The electron gun (4) is powered on and debugged. After powering on, the cathode of the electron gun (4) is activated, and the performance of the high frequency and collector components is tested.

7. The method for testing the performance of high-frequency and collector components as described in claim 6, characterized in that, The front half box (102) is provided with a first knife-edge flange (102a), and a second knife-edge flange (102b) is connected to the first knife-edge flange (102a) by bolts. A sealing gasket (102c) is provided between the first knife-edge flange (102a) and the second knife-edge flange (102b); an interface (102d) is provided inside the second knife-edge flange (102b). In step S4, the input high frequency (8) of the high frequency and collector electrode assembly is connected to the input end cap connector (301) at the front end of the detection connector (3); the second knife flange (102b) is separated from the first knife flange (102a), and the rear end of the detection connector (3) is welded to the interface (102d) on the sealing box (1). After welding, the second knife flange (102b) is connected to the first knife flange (102a). After completion, the high frequency and collector electrode assembly and the electron gun (4) are kept coaxial. In step S7, after the detection is completed, the vacuum baffle valve (2) is closed so that the electron gun (4) is always in a vacuum environment, and the air extraction hole (103) of the front half box (102) is connected to the outside atmosphere; the second knife flange (102b) is separated from the first knife flange (102a), and the detection connector (3) is dewelded to the sealing box (1).

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