Stretching device and auxiliary device suitable for single-inclination strain rod of transmission electron microscope

Abstract

The invention belongs to the field of in-situ tensile sample preparation of a transmission electron microscope, and particularly relates to a tensile device and an auxiliary device suitable for a single-inclination strain rod of the transmission electron microscope. The sample stretching device is used for supporting and deforming a stretching electron microscope sample; and the sample transfer device is used for supporting and transferring the stretching device. And the sample auxiliary device is used for assisting the tensile sample to be bonded on the tensile device. And the sample separating device is used for assisting in supporting and separating the tensile sample transferred to the single-inclination sample rod. The method is suitable for various metal materials and sample sizes, including metal block materials, nanowires, nanoparticles and the like, the application range of in-situ samples is enlarged, and the loss of raw materials is reduced; a conventional sample preparation method can be adopted for sample preparation, and the sample preparation process is simple; the device is simple in structure, easy to manufacture and low in cost; the device is good in structural stability and can be repeatedly used.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of in-situ tensile sample preparation for transmission electron microscopy, and particularly relates to a tensile device suitable for a single-tilt strain rod of a transmission electron microscope and an auxiliary device. BACKGROUND

[0002] In the study of material deformation mechanism by using a transmission electron microscope, it is usually necessary to respectively observe and study the microstructure of a sample before and after deformation, and to indirectly obtain the understanding of the deformation process by comparing the changes of the microstructure such as phase structure, twin crystal and dislocation configuration in the material before and after deformation, so as to deduce the deformation mechanism. However, this process cannot obtain the evolution process of the microstructure in the deformation process, which leads to the fact that people cannot deeply understand the deformation process of the material, and the understanding of the deformation mechanism of the material is not comprehensive enough. The in-situ loading experiment in the transmission electron microscope is a direct and effective method for studying the deformation mechanism of the material, which can directly observe and capture the evolution of the crystal structure, the generation and movement of dislocations and other processes under the action of stress and strain, thereby directly revealing the deformation mechanism of the material in the elastic and plastic stages, and being beneficial to deepening the understanding of the intrinsic characteristics of the material.

[0003] The single tilt sample holder of model 654 for transmission electron microscope observation, which is developed by Gatan Company of the United States, can accurately control the deformation of the sample to obtain real-time observation of the deformation process of the sample under the transmission electron microscope. The standard sample size provided by the technology is 11.5mm*2.5mm, which cannot meet the sample size requirement for small-sized samples. Through literature retrieval of the prior art, it is found that in the article "In situ TEM / HRTEM investigations on deformation mechanisms in metals" published by Suimanling et al. in Journal of Chinese Electron Microscopy Society, the sample preparation process of in-situ tensile experiment by Gatan 654 single tilt tensile holder is introduced, and the deformation process of the sample to be observed can be realized through the preparation of the substrate and the in-situ tensile transmission electron microscope sample. The sample size is redesigned by the technology, which is split into substrate preparation and transmission electron microscope tensile sample preparation. The technology greatly reduces the sample size required for observation and saves experimental raw materials. However, the technology still has the following shortcomings: (1) the preparation of the sample substrate is through various processing technologies such as wire electrical discharge machining, mechanical grinding and manual drilling, and the preparation process is complex; (2) the sample substrate is selected to be a material with similar strength and plasticity to the material to be studied, which leads to the deformation of the substrate during the tensile deformation process, and the substrate cannot be reused twice; (3) the sample size of the technology is 4mm*2.5mm, which is still relatively large, and for some ultra-fine structure materials, the size still cannot meet the size requirement of the sample for shooting; (4) the sample size is a long strip sample, which exceeds the size of the transmission sample punch, and batch sample preparation cannot be obtained through conventional punching technology. SUMMARY

[0004] In view of the above shortcomings, the present application provides a tensile device and auxiliary device suitable for a single tilt strain holder of a transmission electron microscope.

[0005] The technical solution for achieving the purpose of the present application is: The tensile device and auxiliary device of the single tilt strain holder of the transmission electron microscope comprises: The sample tensile device is used for tensile deformation and adhesive support of the sample, which is composed of two pieces of T-shaped thin plates with circular holes and semicircular notches with the same size and shape; wherein the length of the T-shaped thin plate is 5.75-6.25mm, and the thickness is 0.25-0.40mm; the width of the semicircular notch end is 2.8-3.0mm, the radius of the semicircular notch is 0.9-1.2mm, the width of the circular hole end is 2.2-2.5mm, and the diameter of the circular hole is 1.3-1.6mm.

[0006] The sample stretching device is formed by the relative contact of the semicircular notches of the T-shaped sheet, and is bonded with the transmission sample by using glue, and the material is high-strength non-magnetic stainless steel; The T-shaped sheet is fixed on the stretching rod by a nut through a round hole; The sample transfer device is used for supporting and transferring the stretching device, and the transfer device is composed of a stretching device support table with a U-shaped groove and a wide-head spring tweezers; The U-shaped groove of the stretching device support table provides support for the transfer of the stretching device, and is used for maintaining the stable connection of the stretching table and the stability of the transfer process; the material is aluminum alloy, titanium alloy, stainless steel, etc.; the length of the stretching device support table is 5.8-6.0 mm, the width is 3.4-3.6 mm, and the height is 1.25-1.40 mm; the width of the U-shaped groove is 2.8-3.0 mm, and the depth is 0.25-0.40 mm; The wide-head spring tweezers are composed of non-magnetic stainless steel, which is used to transfer the stretching device and the stretching device support table to the single-inclined strain rod at the same time, and ensures that the stretching device does not strain during the transfer process; the clamping end of the tweezers is rectangular, with a length of 4.0-5.2 mm, a width of 1.25-1.40 mm, and a thickness of 0.1 mm-0.3 mm; the hand-held end is V-shaped, with a thickness of 0.5-1.0 mm; the width of the V-shaped connecting section and the connecting clamping end is 0.7-1.0 mm, and the width of the middle spring connecting part is 1.0-1.5 mm.

[0007] The sample auxiliary device ensures the accuracy of the size and the convenience of the operation during the process of bonding the sample to the stretching device. The bonding auxiliary device is a cuboid metal block, which is internally provided with a stepped multi-stage limiting structure composed of a limiting groove of the stretching device, a limiting groove of the stretching device support table and a sample transfer groove, and is provided with two tablet pressing devices; the bonding auxiliary device is processed from high-strength aluminum alloy, titanium alloy, stainless steel and the like; The cuboid auxiliary table is made of high-strength aluminum alloy, titanium alloy, stainless steel and the like, with a length of 15.0-17.0 mm, a width of 6.0-8.0 mm, and a height of 3.0-5.0 mm; The limiting groove of the stretching device support table is used for placing the stretching device support table and limiting it; the length is 5.8-6.0 mm, the width is 3.4-3.6 mm, and the height is 1.25-1.40 mm; The limiting groove of the stretching device is used for placing the stretching device and limiting it, and is distributed at both ends of the limiting groove of the stretching device support table; the length is 2.75-3.35 mm, the width is 2.8-3.0 mm, and the depth is 0.25-0.40 mm; The sample transfer groove is located on both sides of the limiting groove, mainly reserving space for special-shaped wide-head tweezers, facilitating extraction and transfer of the stretching device support table; the size along the long axis of the auxiliary table is 2.9-3.3 mm, the size along the short axis is 4.5-5.5 mm, and the depth is 1.25-1.40 mm; The tablet is made of stainless spring steel and is fixed on the same side of the auxiliary table by a screw, mainly for fixing the stretching device, and has a zigzag shape, a length of 3.0-4.5 mm, and a thickness of 0.1-0.2 mm.

[0008] The sample separation device is used for supporting the stretching device during the fixing process of the sample stretching rod and separating the sample stretching device support table, and is composed of a plane table, an extendable screw rod, a lifting slide rail, an extendable screw rod knob, and a support base; The plane table is made of aluminum alloy, titanium alloy, stainless steel, etc., and is used for supporting the stretching device during the transfer and fixing process to the strain rod; the length is 40-60 mm, the width is 40-60 mm, and the height is 10-20 mm; The extendable screw rod is made of spring steel and has a square cross section, which is used for adjusting the height of the plane table; the side length is 10-20 mm, and the height is 45-70 mm; The lifting slide rail is made of bearing steel and has a hollow square cross section, which is used for supporting and fixing the extendable screw rod; the outer side length is 15-25 mm, the inner side length is 10.1-20.1 mm, and the height is 30-35 mm; The extendable screw rod knob is made of bearing steel and connects the lifting slide rail to lift and fix the extendable screw rod; the thread end has a diameter of 3-5 mm, and the knob end has a diameter of 10-12 mm.

[0009] The support base bears the support function of the sample separation device and is made of aluminum alloy, titanium alloy, stainless steel, etc.; the length is 40-60 mm, the width is 40-60 mm, and the height is 10-20 mm; The stretching sample and the stretching device are connected by instant adhesive, which can be AB glue, 502 glue, 460 glue, etc.

[0010] The stretching sample can be a standard diameter of 3 mm transmission electron microscope sample or a long strip sample with a size less than 3 mm.

[0011] The stretching sample can be directly bonded to the stretching device or bonded to a single-hole copper ring or dispersed on an electron microscope support net according to the size requirement.

[0012] The stretching sample can be a metal block material, a nanowire, or a nanoparticle.

[0013] The technical scheme for realizing in-situ deformation of a transmission electron microscope sample by using the stretching device and the device comprises the following steps: The preparation of the transmission electron microscope sample adopts conventional transmission electron microscope sample preparation technology and process, and is prepared from a bulk sample, including sample polishing, punching (selected according to size), fine grinding, ion thinning or electron microscope double spraying, etc.; the nanometer particles or nanometer wires are dispersed by supercritical fluid dispersion, and then are sampled and dropped into a carrier net in a manner.

[0014] The stretching device support table with a U-shaped groove and the sample stretching device are sequentially placed in the corresponding limiting grooves of the sample auxiliary device, and are fixed by a pressing tablet.

[0015] According to the use method of the instant adhesive, a small amount of instant adhesive is taken by a needle or a toothpick, is evenly applied to the semicircular notch of the stretching device, and after the preparation of the transmission electron microscope sample, the sample is placed in the semicircular notch and is gently pressed to wait for the instant adhesive to solidify.

[0016] The stretching strain rod is prepared, the sample separation device is set to a suitable height, and it is ensured that the bottom of the sample rod and the plane platform of the separation device are in contact and are kept horizontal.

[0017] The pressing tablet on the stretching device support table is loosened and moved, the sample bonded together with the stretching device support table is transferred to the single-inclined sample rod by a wide-head spring tweezers, and is gently placed in the sample loading position to ensure that the circular hole of the stretching device is aligned with the sample fixing hole position on the sample rod; The two nuts of the single-inclined strain rod are gently placed in the two circular holes of the stretching device to preliminarily fix the stretching device; The nuts are loosened or tightened by the screw rod of the single-inclined strain rod, and the stretching device is further fixed by gently twisting. After the stretching device is fixed, the telescopic screw rod knob is twisted, the height of the telescopic screw rod is lowered by using the lifting slide rail, at this time, the plane platform is gradually lowered, the stretching device support table is gradually separated from the gap of the sample loading position, the stretching device support table and the stretching device and the sample rod are separated, and at this time, only the stretching device and the bonded sample remain on the strain rod.

[0018] The strain rod on which the stretching device and the stretching sample are loaded is placed in the transmission electron microscope as required, and the control device of the strain rod can realize deformation observation and testing of the stretching sample.

[0019] Compared with the prior art, the present application has the following advantages: (1) The present application provides a sample loading device suitable for a single-inclined strain rod of a transmission electron microscope, which greatly reduces the size of the stretching deformation sample that can be used, and significantly saves experimental materials.

[0020] (2) The device has simple structure, is easy to mass produce and manufacture, and has low cost.

[0021] (3) The device has stable structure and can be repeatedly used.

[0022] (4) The device can be used for preparing transmission electron microscope samples of various bulk metal materials prepared by conventional sample preparation, such as standard wafer or strip transmission samples prepared by electrolytic double spraying and ion thinning.

[0023] Other features and advantages of the present application will be set forth in the following description, and in part will become apparent to those skilled in the art from the description, or can be learned by practice of the present application. The objects and other advantages of the present application can be achieved and obtained by means of the structure particularly pointed out in the written description and the accompanying drawings.

[0024] The technical solutions of the present application will be further described in detail below with the help of the accompanying drawings and examples. BRIEF DESCRIPTION OF DRAWINGS

[0025] The accompanying drawings are used to provide further understanding of the present application, and constitute a part of the specification, and are used to explain the present application together with embodiments of the present application, and do not constitute a limitation to the present application. In the drawings: Figure 1 is a whole schematic diagram of a sample stretching platform and a Gatan 654 type single-inclination stretching rod provided by the embodiment of the present application; Figure 2 is a whole schematic diagram of a stretching device and auxiliary device provided by the embodiment of the present application; Figure 3 is a schematic diagram of a sample stretching device provided by the embodiment of the present application; Figure 4 is a schematic diagram of a sample stretching device support platform provided by the embodiment of the present application; Figure 5 is a schematic diagram and side view of a sample auxiliary device provided by the embodiment of the present application; Figure 6 is a schematic diagram and partial detail diagram of a sample separation device provided by the embodiment of the present application; Figure 7 is a schematic diagram of different transmission samples provided by the embodiment of the present application; Figure 8 is a schematic diagram of a stretching device provided by the embodiment of the present application, which is placed in a sample auxiliary device and waits for sample bonding; Figure 9 is a schematic diagram of sample stretching platform transfer, installation and separation provided by the embodiment of the present application.

[0026] Explanation of reference signs: 1-sample stretching device, 2-sample transfer device, 3-sample auxiliary device, 4-wide head spring tweezers, 5-sample separation device, 6-semicircular notch, 7-round hole, 8-stretching device support table, 9-stretching device limiting groove, 10-stretching device support table limiting groove, 11-sample transfer groove, 12-flat stage, 13-telescopic screw, 14-lifting slide rail, 15-telescopic screw knob, 16-support base, 17-tablet pressing. DETAILED DESCRIPTION The preferred embodiments of the present application will be described below with reference to the accompanying drawings. It should be understood that the preferred embodiments described herein are merely intended to illustrate and explain the present application, and are not intended to limit the present application.

[0027] The present application discloses a stretching device and auxiliary device suitable for a transmission single-inclination strain rod, comprising: a sample stretching device 1, a sample transfer device 2, a sample auxiliary device 3, a sample separation device 5, a sample stretching device support table 2 for transferring the sample stretching device 1 to the sample rod; wide head spring tweezers 4 for clamping the sample stretching device support table 2 during the transfer process; a sample auxiliary device 3 for stabilizing and supporting the sample bonding process; and a sample separation device 5 for supporting during the fixing and separation process of the stretching device. By using the stretching device and auxiliary device, in-situ stretching experiment observation and testing of the sample can be achieved by using the conventional sample preparation method.

[0028] The sample stretching device 1 is used for stretching sample bonding support and stretching deformation, and is composed of two T-shaped thin plates with the same size and shape, which have a round hole 7 and a semicircular notch 6. It should be noted that the semicircular notch 6 of the two T-shaped thin plates 1 is made of high-strength non-magnetic stainless steel, and the semicircular notches of the two T-shaped thin plates are in contact with each other; the length of the T-shaped thin plate 1 is 5.75-6.25 mm, and the thickness is 0.25-0.40 mm; the width of the semicircular notch 6 end is 2.8-3.0 mm, the radius of the semicircular notch 6 is 0.9-1.2 mm, the width of the round hole end is 2.2-2.5 mm, and the diameter of the round hole 7 is 1.3-1.6 mm.

[0029] The sample transfer device 2 is used for supporting and transferring the stretching device, and is composed of a stretching device support table 8 with a U-shaped groove and wide head spring tweezers 4. It should be noted that the stretching device support table 8 with a U-shaped groove is made of aluminum alloy, titanium alloy, stainless steel, etc., and provides support for the transfer of the stretching device; the length of the stretching device support table is 5.8-6.0 mm, the width is 3.4-3.6 mm, and the height is 1.25-1.40 mm; the width of the U-shaped groove is 2.8-3.0 mm, and the depth is 0.25-0.40 mm. The wide head spring tweezers 4 is composed of non-magnetic stainless steel, used to transfer the stretching device and the stretching device support platform 8 with U-shaped groove to the single-inclined strain rod at the same time; the clamping end of the tweezers is rectangular, with a length of 4.0-5.2 mm, a width of 1.25-1.40 mm, and a thickness of 0.1-0.3 mm; the hand holding end is V-shaped, with a thickness of 0.5-1.0 mm; the width of the V-shaped connecting section and the connecting clamping end is 0.7-1.0 mm, and the width of the middle spring connecting part is 1.0-1.5 mm.

[0030] The sample auxiliary device 3 mainly assists the stretching sample to be bonded to the stretching device, and is a cuboid auxiliary platform with a stepped multi-level limiting structure composed of the limiting groove 9 distributed with the stretching device, the limiting groove 10 of the stretching device support platform 8, and the sample transfer groove 11, and is distributed with two pressing pieces 17.

[0031] It should be noted that the cuboid auxiliary platform is made of high-strength aluminum alloy, titanium alloy, stainless steel and the like, with a length of 15.0-17.0 mm, a width of 6.0-8.0 mm, and a height of 3.0-5.0 mm. The limiting groove 10 is used to place the stretching device support platform 8 and has a limiting effect thereon; the length is 5.8-6.0 mm, the width is 3.4-3.6 mm, and the height is 1.25-1.40 mm. The limiting groove 9 is used to place the stretching device and has a limiting effect thereon, and is distributed at both ends of the limiting groove 10; the length is 2.75-3.35 mm, the width is 2.8-3.0 mm, and the depth is 0.25-0.40 mm. The sample transfer groove 11 is located at both sides of the limiting groove 10, mainly reserving space for the special wide head tweezers 4, facilitating the extraction and transfer of the stretching device support platform 8; the size along the long axis direction of the auxiliary platform is 2.9-3.3 mm, the size along the short axis direction is 4.5-5.5 mm, and the depth is 1.25-1.40 mm. The pressing piece 17 is made of stainless spring steel and is fixed on the same side of the auxiliary platform by a screw, mainly used to fix the stretching device, and has a zigzag shape, with a length of 3.0-4.5 mm and a thickness of 0.1-0.2 mm.

[0032] The sample separation device 5 is used to separate the stretching device support platform 8 after the stretching sample is transferred to the support and fixed of the single-inclined sample rod, and is composed of a plane table 12, a telescopic screw rod 13, a lifting slide rail 14, a telescopic screw knob 15, and a support base 16.

[0033] It should be noted that the plane carrier 12 is made of aluminum alloy, titanium alloy, stainless steel and other materials, used for supporting the stretching device transfer and fixing to the strain rod during the process; the length is 40-60mm, the width is 40-60mm, and the height is 10-20mm; The telescopic screw 13 is made of spring steel, with a square cross section, used for adjusting the height of the plane carrier; the side length is 10-20mm, and the height is 45-70mm; The lifting slide rail 14 is made of bearing steel, with a hollow square cross section, used for supporting and fixing the telescopic screw; the outer side length is 15-25mm, the inner side length is 10.1-20.1mm, and the height is 30-35mm; The telescopic screw knob 15 is made of bearing steel, connected to the lifting slide rail 14, and used for lifting and fixing the telescopic screw 13; the thread end diameter is 3-5mm, and the knob end diameter is 10-12mm.

[0034] The support base 16 bears the support of the sample separation device 5, made of aluminum alloy, titanium alloy, stainless steel and other materials; the length is 40-60mm, the width is 40-60mm, and the height is 10-20mm.

[0035] The loading method of the in-situ stretching sample through the above stretching device and auxiliary device is as follows: Step 1: Sample bonding: place the stretching device support table with U-shaped groove and the sample stretching device into the corresponding limiting groove of the sample auxiliary device in sequence, and fix them with the pressing plate; apply a small amount of instant adhesive evenly to the semicircular notch of the stretching device, and place the prepared transmission electron microscope sample in the semicircular notch; Step 2: Sample transfer and fixation: prepare a single-inclined strain rod, set the sample separation device to the appropriate height, and ensure that the bottom of the sample rod and the plane carrier of the separation device are in horizontal contact; gently place the bonded sample, together with the stretching device support table, into the sample loading position with a wide-head spring tweezers, and ensure that the round hole of the stretching device is aligned with the sample fixing hole on the sample rod; use the nut provided with the single-inclined strain rod to fix the stretching device; Step 3: After the stretching device is fixed, lower the height of the plane carrier, and the stretching device support table automatically separates from the stretching device and the sample rod; Step 4: Place the strain rod loaded with the stretching device and the stretched sample into the transmission electron microscope as required, and operate the transmission electron microscope and the strain rod to realize the deformation observation and testing of the stretched sample.

[0036] In other words, the preparation of the transmission electron microscope sample, using conventional transmission electron microscope sample preparation techniques and processes, the bulk sample is prepared, including sample grinding, punching (according to the size selection), fine grinding, ion thinning or electron microscope double spray, etc.; the nanoparticles or nanowires are dispersed by supercritical ethanol, and then sampled and dropped into the carrier net.

[0037] Put the U-shaped groove stretcher device support table and the sample stretcher device into the corresponding limiting groove of the sample auxiliary device in turn, and fix them with the pressing plate.

[0038] According to the use method of the instant adhesive, take a small amount of instant adhesive with a needle or toothpick, apply it to the semicircular notch of the stretcher device, and after uniform application, place the prepared transmission electron microscope sample in the semicircular notch and gently press and wait for the instant adhesive to solidify.

[0039] Prepare the stretching strain rod, set the sample separation device to the appropriate height, and ensure that the bottom of the sample rod and the flat platform of the separation device are in contact and remain horizontal.

[0040] Loosen the pressing plate on the stretcher device support table, transfer the bonded sample together with the stretcher device support table to the single-inclined sample rod with the wide-head spring tweezers, and gently place it into the sample loading position to ensure that the round hole of the stretcher device is aligned with the sample fixing hole position on the sample rod; Gently place the two nuts of the single-inclined strain rod into the two round holes of the stretcher device to preliminarily fix the stretcher device; Loosen the nuts with the screw rod of the single-inclined strain rod, and gently twist to further fix the stretcher device; After the stretcher device is fixed, twist the telescopic screw knob to lower the height of the telescopic screw rod using the lifting slide rail. At this time, the flat platform gradually descends, bringing the stretcher device support table out of the gap at the sample loading position, achieving the separation of the stretcher device support table and the stretcher device, and the sample rod. At this time, only the stretcher device and the bonded sample remain on the strain rod.

[0041] Place the strain rod with the stretched device and sample into the transmission electron microscope as required. The control device of the strain rod can realize the deformation observation and testing of the stretched sample.

[0042] It should be noted that the sample and the stretcher device are connected by instant adhesive, which can be AB glue, 502 glue, 460 glue, etc.

[0043] It should be noted that the sample can be directly bonded to the stretcher device, or bonded to a single-hole copper ring or dispersed on an electron microscope carrier net.

[0044] It should be noted that the transmission sample can be a metal bulk material, a nanowire, or a nanoparticle.

[0045] It should be pointed out finally that the above embodiments are only used to illustrate the technical solutions of the present application, but not to limit the same; although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that the technical solutions recorded in the foregoing embodiments can still be modified, or some technical features therein can be replaced equivalently; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present application.

Claims

1. A stretching device and auxiliary means suitable for a TEM single tilt strain holder, characterized in that, The application relates to a sample stretching device (1) which is composed of two T-shaped thin plates with the same shape and size, one end of each T-shaped thin plate is provided with a round hole (7), the other end is provided with a semicircular notch (6), and the semicircular notches (6) of the two T-shaped thin plates are oppositely arranged; a sample transfer device (2) which comprises a stretching device support table (8) and a wide-head spring tweezers (4), the upper surface of the stretching device support table (8) is provided with a U-shaped groove which extends along the length direction of the stretching device support table (8); a sample auxiliary device (3) which is a cuboid auxiliary table, the upper surface of the auxiliary table is provided with a first limiting groove (10), a second limiting groove (9) which is symmetrically arranged at two ends of the first limiting groove (10), and a sample transfer groove (11) which is located at two sides of the first limiting groove (10), and the auxiliary table is further provided with a pressing piece (17); and a sample separation device (5) which comprises a plane carrier (12), a telescopic screw rod (13), a lifting slide rail (14), a telescopic screw rod knob (15) and a supporting base (16), the lower part of the telescopic screw rod (13) is connected with the supporting base (16), the upper part penetrates through the lifting slide rail (14) and is connected with the plane carrier (12), and the telescopic screw rod knob (15) is connected with the lifting slide rail (14). The material of the sample stretching device (1) is high-strength non-magnetic stainless steel. The material of the stretching device support table (8) is aluminum alloy, titanium alloy or stainless steel; the material of the wide-head spring tweezers (4) is non-magnetic stainless steel, and the shape of the clamping end is rectangular. The material of the cuboid auxiliary table of the sample auxiliary device (3) is high-strength aluminum alloy, titanium alloy or stainless steel; the material of the pressing piece (17) is stainless spring steel, the shape is zigzag, and the pressing piece (17) is fixed on the auxiliary table through screws. The material of the plane carrier (12) and the supporting base (16) is aluminum alloy, titanium alloy or stainless steel; the cross-sectional shape of the telescopic screw rod (13) is square, and the cross-sectional shape of the lifting slide rail (14) is a hollow square which is matched with the telescopic screw rod (13).

2. The stretching device and auxiliary apparatus according to claim 1, characterized in that, The application further discloses a sample stretching method which comprises the following steps:

3. The stretching device and auxiliary apparatus according to claim 1, characterized in that, S1, placing the stretching device support table (8) into the first limiting groove (10), placing two T-shaped thin plates into corresponding second limiting grooves (9) respectively and fixing the T-shaped thin plates by the pressing piece (17); coating adhesive on the oppositely arranged semicircular notches (6) and placing a transmission electron microscope sample on the semicircular notches (6); 4. The stretching device and auxiliary apparatus according to claim 1, characterized in that, S2, adjusting the height of the telescopic screw rod (13) so that the plane carrier (12) is in contact with the bottom of a single-inclined strain rod; clamping the stretching device support table (8) by the wide-head spring tweezers (4), transferring the sample stretching device (1) with the sample and the stretching device support table (8) to a loading position of the single-inclined strain rod, aligning the round hole (7) with a fixing hole on the strain rod and preliminarily fixing the round hole (7); 5. The stretching device and auxiliary means according to claim 1, characterized in that, S3, operating the telescopic screw rod knob (15) to lower the height of the plane carrier (12) so that the stretching device support table (8) is separated.

6. A method for in-situ sample loading for transmission electron microscopy using the stretching device and auxiliary device according to any one of claims 1 to 5, characterized in that, ​ ​ ​ ​ Step S4: loading the single-tilt specimen holder with the sample and the sample stretching device (1) into a transmission electron microscope.

7. The loading method according to claim 6, characterized in that, The adhesive used in step S1 is instant glue.

8. The loading method according to claim 6 or 7, characterized in that, The transmission electron microscope sample in step S1 is a standard round sample with a diameter of 3 mm, a long strip sample with a size less than 3 mm, a sample adhered to a single-hole copper ring, or a sample dispersed on a grid.

9. The loading method according to claim 8, characterized in that, The material of the transmission electron microscope sample is a bulk metal material, a nanowire, or a nanoparticle.

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