Charging tray conveying mechanism of chip testing device

By designing an automated material tray conveying mechanism, the automated detection of the chip test device is realized, and the problems of high labor intensity and low efficiency caused by manual operation in the prior art are solved, ensuring the detection efficiency and quality of the CMOS chip.

CN222137985UActive Publication Date: 2024-12-10广东涌固科技有限公司
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Patent Information

Application Number
CN202421340131.X
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-06-13
Publication Date
2024-12-10
Estimated Expiration
2034-06-13

AI Technical Summary

Technical Problem

During the existing chip inspection process, it is necessary to manually put the entire material tray full of the chip to be tested into and out of the test device, resulting in high labor intensity and low efficiency, and the inability to conduct full inspection before the CMOS chip is assembled, which increases the risk of poor appearance. .

Method used

A material tray conveying mechanism of a chip test device is designed, including a frame, a top fixture press plate and a material tray conveying line. The automatic loading and unloading of the material tray is realized through the fixture lifting assembly, the chip electrode and the test fixture in the material tray are realized. Automatically switch on to realize automatic detection.

Benefits of technology

The automatic loading and automatic discharge of the material tray is realized, and the measurement of the chip is synchronized, which significantly improves the detection efficiency and reduces labor intensity, ensuring the detection efficiency and quality of the CMOS chip.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model relates to the technical field of chip testing, in particular to a charging tray conveying mechanism of a chip testing device, which comprises a rack and a top jig pressing plate fixed on the rack, a tray conveying line is arranged on the rack; a product testing jig is arranged under the top jig pressing plate. The tray conveying line comprises two conveying lines which are parallel to each other; a jig lifting assembly used for driving the top jig pressing plate to do lifting motion is arranged between the two conveying lines. When the chip testing device is used, chips of the whole charging tray can be measured synchronously in the whole testing process, and the charging tray is automatically fed, positioned and discharged, so that the chip detection efficiency and the chip detection labor intensity are improved to a great extent.
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Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a material tray conveying mechanism of a chip testing device. Background Art

[0002] During the entire production process, it is necessary to ensure that the CMOS chip has no electrical or functional defects and no appearance defects such as partial or scratches.

[0003] In the prior art, there is no process to fully inspect the yield rate of the chip after it is received and before the CCM is assembled. The performance of the CMOS chip can only be tested after the chip + LENS + VCM are assembled to see if it is intact. If each PCS CMOS chip is taken out of the tray for a single chip test, the time and manpower consumption will be huge, and the risk of poor appearance of the CMOS chip will be greatly increased.

[0004] Therefore, automatic chip detection is the general trend. Generating product images through LENS lenses during testing and judging whether there is dirt on the product by generating product images is an important means of existing automatic chip detection. In the existing chip detection process, it is necessary to manually align the entire tray filled with chips to be tested and put it into the test fixture. Then the tray is locked on the fixture through the locking structure. Since the bottom of the tray is hollow, after the locking structure locks the tray on the fixture, the electrodes of the chips in the tray will be connected to the detection electrodes on the fixture to connect the circuit to the chip, and the chip obtains external image information (generally, a light source is set above the chip, and the chip circuit captures the image after imaging through the lens. Finally, the chip circuit feeds the image back to the system for comparison with the set image to determine whether the chip is a good product). After the inspection is completed, the locking structure is manually released to remove the tray. During the whole process, the loading and unloading of chip testing are completed manually, which is labor-intensive and has low loading and unloading efficiency. Utility Model Content

[0005] The utility model aims to provide a material tray conveying mechanism for a chip testing device in view of the defects and shortcomings of the prior art.

[0006] In order to achieve the above purpose, the technical solution adopted by the utility model is:

[0007] The utility model discloses a material tray conveying mechanism for a chip testing device, which comprises a frame and a top fixture pressing plate fixed to the frame; a material tray conveying line is arranged on the frame; a product testing fixture is arranged directly below the top fixture pressing plate;

[0008] The tray conveyor line includes two conveyor lines parallel to each other; a fixture lifting component for driving the top fixture pressure plate to perform lifting movement is arranged between the two conveyor lines.

[0009] Furthermore, the product testing jig includes a tray positioning frame, a jig base plate fixed on the jig lifting assembly, and a jig body fixed on the jig base plate; a plurality of guide pins are fixed on the jig body; the tray positioning frame is slidably connected to the guide pins; and a spring is connected between the tray positioning frame and the jig body.

[0010] Furthermore, the jig lifting assembly includes a jig lifting motor, a jig lifting bracket fixed on a frame, a jig lifting guide rail fixed on the jig lifting bracket, a lifting platform slidably connected to the jig lifting guide rail, and a lifting screw rotatably connected to the jig lifting bracket; a lifting screw nut threadedly connected to the lifting screw is fixed on the lifting platform; both ends of the jig lifting motor are respectively fixed on the jig lifting bracket and the lifting screw; the product testing jig is fixed to the jig lifting bracket through a jig fixing plate.

[0011] Furthermore, the tray conveyor line also includes two adjustment fixing frames; a conveyor line guide shaft is fixed between the two adjustment fixing frames; a conveyor line fixing frame is fixed on each of the conveyor lines; an adjustment guide sleeve slidably connected to the conveyor line guide shaft is fixed on the conveyor line fixing frame; an adjustment screw nut is fixed on each of the conveyor line fixing frames; a bidirectional screw is rotatably connected to the adjustment fixing frame; the two adjustment screw nuts are respectively threadedly connected to the two sections of the thread of the bidirectional screw; an adjustment guide sleeve slidably connected to the conveyor line guide shaft is fixed on the conveyor line fixing frame.

[0012] Furthermore, an adjusting hand wheel is fixed on the bidirectional screw rod.

[0013] After adopting the above structure, the beneficial effects of the utility model are as follows: the tray conveying mechanism of the chip testing device described in the utility model, when using the utility model, two trays are placed between two conveyor lines, and the tray is conveyed to the bottom of the top jig pressure plate through the two conveyor lines; the jig lifting assembly lifts the product testing jig upward, and the product testing jig of the jig lifting assembly lifts the tray from the conveyor line upward until the tray is pressed against the top jig pressure plate, and after the tray is pressed by the product testing jig and the top jig pressure plate, the electrodes of the chip in the tray are connected to the pins on the product testing jig for testing; after the test is completed, the jig lifting assembly drives the product testing jig to descend, and prevents the tray from being placed between the conveyor lines again, and the tray is loosened to the outside through the conveyor line, completing the entire chip testing process; during the entire testing process, the chips of the entire tray can be measured synchronously, and the tray can be automatically loaded, automatically positioned and automatically unloaded, which greatly improves the efficiency of chip detection and the labor intensity of chip detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a first-view stereogram of the utility model;

[0015] Figure 2 It is a second perspective stereogram of the utility model;

[0016] Figure 3 It is the structural diagram of the tray conveyor line;

[0017] Figure 4 It is a structural diagram of the jig lifting assembly;

[0018] Figure 5 It is the structural diagram of the product test fixture;

[0019] Figure 6 It is the structural diagram of the frame and the top fixture plate;

[0020] Description of reference numerals:

[0021] I. Product testing fixture; I1. Fixture base; I2. Material tray positioning frame; I3. Fixture body;

[0022] I301, pin; I4, guide pin; I5, spring; J, tray conveyor line; J1, adjustment bracket;

[0023] J2, conveyor line fixing frame; J3, conveyor line guide shaft; J4, conveyor line; J5, bidirectional screw rod;

[0024] J6, adjusting hand wheel; J7, adjusting screw nut; J8, adjusting guide sleeve; K, frame; L, light source;

[0025] M, fixture lifting assembly; M1, fixture fixing plate; M2, lifting platform; M3, lifting screw nut;

[0026] M4, fixture lifting guide rail; M5, fixture lifting bracket; M6, fixture lifting motor;

[0027] M7, lifting screw; N, top fixture pressure plate. DETAILED DESCRIPTION

[0028] The utility model is further described below in conjunction with the accompanying drawings.

[0029] like Figures 1 to 6 As shown, a tray conveying mechanism of a chip testing device described in the utility model comprises a frame K and a top fixture pressing plate N fixed to the frame K; a tray conveying line J is arranged on the frame K; a product testing fixture I is arranged directly below the top fixture pressing plate N;

[0030] The tray conveyor line J includes two conveyor lines J4 parallel to each other; a jig lifting assembly M is provided between the two conveyor lines J4 for driving the top jig pressing plate N to perform lifting motion;

[0031] The conveyor line J4 has no essential difference from the prior art, so it is not described in detail; a light source L is provided on the frame K, and the light source L is used with a LENS lens to make the image of the product clearer;

[0032] The two trays are placed between the two conveyor lines J4, and the trays are conveyed to the bottom of the top jig platen N through the two conveyor lines J4; the jig lifting assembly M lifts the product test jig I upward, and the product test jig I of the jig lifting assembly M lifts the tray from the conveyor line J4 upward until the tray is pressed on the top jig platen N, and after the tray is pressed by the product test jig I and the top jig platen N, the electrodes of the chip in the tray are connected to the pins on the product test jig I for testing; after the test is completed, the jig lifting assembly M drives the product test jig I to descend, and the tray is prevented from moving between the conveyor lines J4 again, and the tray is released to the outside through the conveyor line J4, completing the entire chip testing process; during the entire testing process, the chips of the entire tray can be measured synchronously, and the tray is automatically loaded, automatically positioned and automatically unloaded, which greatly improves the efficiency of chip detection and the labor intensity of chip detection.

[0033] As a preferred embodiment of the present invention, the product testing jig I includes a tray positioning frame I2, a jig base plate I1 fixed on the jig lifting assembly M, and a jig body I3 fixed on the jig base plate I1; a plurality of guide pins I4 are fixed on the jig body I3; the tray positioning frame I2 is slidably connected to the guide pins I4; a spring I5 is connected between the tray positioning frame I2 and the jig body I3;

[0034] The inner hole of the tray positioning frame I2 matches the tray, and a flange is provided on the edge of the tray, which is supported on the surface of the tray positioning frame I2. After the tray is placed in the tray positioning frame I2, it is positioned by the edge of the tray positioning frame I2; so that the electrode of the chip in the tray is aligned with the pin I301 on the fixture body I3; the force of the spring I5 lifts the tray and the tray positioning frame I2, so that the electrode of the chip in the tray is separated from the pin I301 on the fixture body I3; the fixture lifting component M will produce After the product testing jig I is lifted, the flange of the tray is gradually pressed by the top jig pressure plate N, the spring I5 is compressed, and the tray and the tray positioning frame I2 slide down along the guide pin I4 until the electrode of the chip in the tray contacts the pin I301 on the jig body I3, and the circuit is connected; when the product testing jig I and the tray are lowered and separated from the top jig pressure plate N, the spring I5 pushes the tray and the tray positioning frame I2 upward, so that the electrode of the chip in the tray is separated from the pin I301 on the jig body I3.

[0035] As a preferred embodiment of the present utility model, the jig lifting assembly M includes a jig lifting motor M6, a jig lifting bracket M5 fixed on the frame K, a jig lifting guide rail M4 fixed on the jig lifting bracket M5, a lifting platform M2 slidably connected to the jig lifting guide rail M4, and a lifting screw M7 rotatably connected to the jig lifting bracket M5; a lifting screw nut M3 threadedly connected to the lifting screw M7 is fixed on the lifting platform M2; both ends of the jig lifting motor M6 are respectively fixed on the jig lifting bracket M5 and the lifting screw M7; the product testing jig I is fixed on the jig lifting bracket M5 through the jig fixing plate M1; after the jig lifting motor M6 is started, it drives the lifting screw M7 to rotate, so that the lifting platform M2, the lifting screw nut M3, the jig fixing plate M1 and the product testing jig I perform lifting movements.

[0036] As a preferred embodiment of the present invention, the tray conveyor line J also includes two adjustment fixing frames J1; a conveyor line guide shaft J3 is fixed between the two adjustment fixing frames J1; a conveyor line fixing frame J2 is fixed on each of the conveyor lines J4; an adjustment guide sleeve J8 slidably connected to the conveyor line guide shaft J3 is fixed on the conveyor line fixing frame J2; an adjustment screw nut J7 is fixed on each of the conveyor line fixing frames J2; a bidirectional screw J5 is rotatably connected to the adjustment fixing frame J1; two adjustment screw nuts J7 are respectively threadedly connected to two sections of the thread of the bidirectional screw J5; an adjustment guide sleeve J8 slidably connected to the conveyor line guide shaft J3 is fixed on the conveyor line fixing frame J2; the number of conveyor line guide shafts J3 is at least two, and the conveyor line guide shafts J3 are arranged parallel to each other;

[0037] After rotating the bidirectional screw rod J5, the two conveyor lines J4 can move toward or away from each other along the conveyor line guide axis J3 to adjust the distance between the two conveyor lines J4 and match the conveyance of trays of different widths.

[0038] As a preferred embodiment of the present invention, an adjusting hand wheel J6 is fixed on the bidirectional screw rod J5.

[0039] The above description is only a preferred embodiment of the present utility model, so all equivalent changes or modifications made according to the structure, features and principles described in the scope of the present utility model patent application are included in the scope of the present utility model patent application.

Claims

1. A tray conveying mechanism for a chip testing device, characterized in that: It comprises a frame (K) and a top jig pressing plate (N) fixed on the frame (K); a material tray conveying line (J) is arranged on the frame (K); a product testing jig (I) is arranged directly below the top jig pressing plate (N); The tray conveyor line (J) comprises two conveyor lines (J4) parallel to each other; a jig lifting assembly (M) for driving a top jig pressing plate (N) to perform lifting motion is arranged between the two conveyor lines (J4).

2. The tray conveying mechanism of a chip testing device according to claim 1, characterized in that: The product testing jig (I) comprises a material tray positioning frame (I2), a jig base plate (I1) fixed on a jig lifting component (M), and a jig body (I3) fixed on the jig base plate (I1); a plurality of guide pins (I4) are fixed on the jig body (I3); the material tray positioning frame (I2) is slidably connected to the guide pins (I4); and a spring (I5) is connected between the material tray positioning frame (I2) and the jig body (I3).

3. The tray conveying mechanism of a chip testing device according to claim 1, characterized in that: The jig lifting assembly (M) comprises a jig lifting motor (M6), a jig lifting bracket (M5) fixed on a frame (K), a jig lifting guide rail (M4) fixed on the jig lifting bracket (M5), a lifting platform (M2) slidably connected to the jig lifting guide rail (M4), and a lifting screw (M7) rotatably connected to the jig lifting bracket (M5); a lifting screw nut (M3) threadedly connected to the lifting screw (M7) is fixed on the lifting platform (M2); two ends of the jig lifting motor (M6) are respectively fixed on the jig lifting bracket (M5) and the lifting screw (M7); and a product testing jig (I) is fixed on the jig lifting bracket (M5) through a jig fixing plate (M1).

4. The tray conveying mechanism of a chip testing device according to claim 1, characterized in that: The tray conveyor line (J) also includes two adjustment fixing frames (J1); a conveyor line guide shaft (J3) is fixed between the two adjustment fixing frames (J1); a conveyor line fixing frame (J2) is fixed on each of the conveyor lines (J4); an adjustment guide sleeve (J8) slidably connected to the conveyor line guide shaft (J3) is fixed on the conveyor line fixing frame (J2); an adjustment screw nut (J7) is fixed on each of the conveyor line fixing frames (J2); a bidirectional screw (J5) is rotatably connected to the adjustment fixing frame (J1); the two adjustment screw nuts (J7) are respectively threadedly connected to two sections of the thread of the bidirectional screw (J5); and an adjustment guide sleeve (J8) slidably connected to the conveyor line guide shaft (J3) is fixed on the conveyor line fixing frame (J2).

5. The tray conveying mechanism of a chip testing device according to claim 4, characterized in that: An adjusting hand wheel (J6) is fixed on the bidirectional screw rod (J5).