Chip test socket with limiting function

Abstract

The utility model relates to the technical field of chip test sockets, and discloses a chip test socket with a limiting function, which comprises a base, the top end of the base is fixedly connected with a detection box, the top end of the detection box is fixedly connected with a fixed plate, and the inside of the fixed plate is rotatably connected with a cover plate. Pressing mechanisms are fixedly connected to the left side and the right side of the top end of the detection box, a chip body is slidably connected to the interior of the detection box, mounting grooves are formed in the front side and the rear side of the interior of the detection box, first springs are fixedly connected to the inner walls of the mounting grooves, and limiting blocks are fixedly connected to the ends, close to each other, of the two first springs. According to the utility model, the first spring, the rotating rod and other structures are matched for use, so that the clamping piece can clamp and limit the chip, thereby ensuring that the chip is kept at a stable position in the testing process, preventing the pins from being accidentally mechanically damaged, and improving the accuracy of the chip in the testing process.

Description

Technical Field

[0001] The utility model relates to the technical field of chip test sockets, in particular to a chip test socket with a limit position function. Background Art

[0002] Chip testing is to ensure that the functions and performance of the chip meet the design specifications, as well as to detect possible defects and faults in the chip. Usually, a test socket is used to test the chip, which provides electrical connection and mechanical support by connecting the interface between the chip and the test equipment, so that the chip can communicate and be tested with the test instrument.

[0003] After searching, the existing Chinese patent announcement number is: CN218824405U, which provides a chip test socket suitable for high-frequency testing. This patent places the chip inside the chip slot so that the chip pins are in contact with the pins one by one, then pulls the cover plate upward, and then deflects the cover plate toward the front along the fixed columns on the rear side, so that the two fixed columns on the front side are inserted between the baffle and the bending plate, and then presses downward to squeeze and fix the chip, so that the pressure block is vertically pressed on the top of the chip to prevent the chip from warping due to uneven force and causing damage to the chip pins.

[0004] Although the above patent allows the pressing block to press vertically on the top of the chip to prevent the chip from tilting due to uneven force and causing damage to the chip pins, the above chip test socket suitable for high-frequency testing still has the following problems: it limits the chip through a slot, and because the slot and the chip size are just right, it makes it difficult to remove the chip. In response to the above problems, technicians in this field have proposed a chip test socket with a limit function to solve the above problems. Utility Model Content

[0005] In order to make up for the above shortcomings, the utility model provides a chip test socket with a limiting function, aiming to improve the problem in the prior art that the chip is limited by only one slot, which makes it difficult to remove the chip because the slot and the chip are just the right size.

[0006] In order to achieve the above purpose, the utility model provides the following technical solutions:

[0007] A chip test socket with a limiting function comprises a base, a detection box is fixedly connected to the top of the base, a fixing plate is fixedly connected to the top of the detection box, a cover plate is rotatably connected to the inside of the fixing plate, a clamping mechanism is fixedly connected to the left and right sides of the top of the detection box, a chip body is slidably connected to the inside of the detection box, mounting grooves are provided on the front and back sides of the inside of the detection box, a spring 1 is fixedly connected to the inner wall of the mounting groove, the adjacent ends of the two springs 1 are fixedly connected to the limiting blocks, the adjacent ends of the two limiting blocks are fixedly connected to the clamping pieces, the separated ends of the two limiting blocks are fixedly connected to the pull ropes, the adjacent ends of the two pull ropes are fixedly connected to the rotating rods, a pushing assembly is provided inside the detection box, a reset assembly is provided inside the detection box, and a pin groove is provided outside the detection box.

[0008] Through the above technical solution, the clamping member can clamp and limit the chip body, and through the cooperation of the pushing component and the resetting component, the chip body after detection can be ejected.

[0009] Furthermore, the pushing assembly includes a slider, which is slidably connected to the inside of the detection box, the bottom end of the limit block is fixedly connected to a connecting rod, the bottom end of the connecting rod is fixedly connected to a stop block, and the slider is provided with sliding grooves on both the front and rear sides, and the inner bottom wall of the sliding groove is an inclined guide surface.

[0010] Through the above technical solution, the detection box can limit the slider, and the limiting block can drive the connecting rod, and the connecting rod can drive the stop block to move.

[0011] Furthermore, the reset assembly includes a second spring, the second spring is fixedly connected to the bottom end of the slider, and telescopic rods are fixedly connected to the four corners of the bottom end of the slider.

[0012] Through the above technical solution, the position of the telescopic rod of the spring box can be determined.

[0013] Furthermore, the bottom end of the cover plate fits with the top end of the detection box, and the inside of the mounting groove is slidably connected with the outside of the limit block.

[0014] Through the above technical solution, the effect of the installation groove limiting the limit block is achieved.

[0015] Furthermore, the interior of the mounting groove is slidably connected to the exterior of the clamping member, and the exterior of the clamping member abuts against the exterior of the chip body.

[0016] Through the above technical solution, the installation groove can limit the clamping member, and the clamping block can clamp the chip body.

[0017] Furthermore, the interior of the detection box is slidably connected to the exterior of the pull rope, and the interior of the detection box is rotationally connected to the exterior of the rotating rod.

[0018] Through the above technical solution, the detection box can limit the pull rope and the rotating rod.

[0019] Furthermore, the interior of the detection box is slidably connected to the exterior of the connecting rod, and the exterior of the abutment block abuts against the interior of the sliding groove.

[0020] Through the above technical solution, the detection box can limit the connection rod, and the abutment block can abut the slide groove to move the slider.

[0021] Furthermore, the bottom end of the second spring is fixedly connected to the top end of the base, and the bottom end of the telescopic rod is fixedly connected to the top end of the base.

[0022] Through the above technical solution, the second spring and the telescopic rod can support the sliding block.

[0023] The utility model has the following beneficial effects:

[0024] 1. In the utility model, the spring, the limit block, the clamping member, the pull rope, the rotating rod and other structures are used in coordination with each other, so that the clamping member can clamp and limit the chip, thereby ensuring that the chip maintains a stable position during the test process, avoiding accidental mechanical damage to the pins, and improving the accuracy of the chip in the test.

[0025] 2. In the utility model, by using the slider, connecting rod, stop block, slide groove, spring 2, telescopic rod and other structures in coordination with each other, the slider can squeeze the tested chip out of the test box through the resetting activity of spring 2, thereby reducing the residence time of the chip in the test box and facilitating the removal of the chip. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 A three-dimensional diagram of a chip test socket with a limit position function proposed by the utility model;

[0027] Figure 2 A schematic diagram of the structure of a spring of a chip test socket with a limit position function proposed by the utility model;

[0028] Figure 3 for Figure 2 The enlarged view of point A in the middle;

[0029] Figure 4 This is a schematic diagram of the second structure of the spring of the chip test socket with a limit position function proposed by the utility model;

[0030] Figure 5 for Figure 4 The enlarged view of point B in the middle;

[0031] Figure 6 for Figure 1 Enlarged view of point C in the middle.

[0032] Legend:

[0033] 1. Base; 2. Detection box; 3. Cover plate; 4. Fixing plate; 5. Clamping mechanism; 6. Chip body; 7. Mounting slot; 8. Spring 1; 9. Limit block; 10. Clamping piece; 11. Pull rope; 12. Rotating rod; 13. Pushing assembly; 1301. Slider; 1302. Connecting rod; 1303. Stop block; 1304. Slide slot; 14. Reset assembly; 1401. Spring 2; 1402. Telescopic rod; 15. Pin slot. DETAILED DESCRIPTION

[0034] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0035] Reference Figure 1 and Figure 6 The utility model provides an embodiment: a chip test socket with a limiting function, including a base 1, a detection box 2 is fixedly connected to the top of the base 1, a fixing plate 4 is fixedly connected to the top of the detection box 2, a cover plate 3 is rotatably connected inside the fixing plate 4, the bottom end of the cover plate 3 is fitted with the top of the detection box 2, a clamping mechanism 5 is fixedly connected to the left and right sides of the top of the detection box 2, a chip body 6 is slidably connected inside the detection box 2, and a pin groove 15 is arranged on the outside of the detection box.

[0036] Specifically, the base 1 fixes the detection box 2 so that the position of the detection box 2 can be fixed. The base 1 can be fixed by bolts. The small depressions on the groove of the detection box 2 facilitate the guidance of the chip body 6 to prevent the chip body 6 from being placed upside down. The fixing plate 4 cooperates with the cover plate 3 so that the pressure block on the cover plate 3 can be vertically pressed on the top of the chip body 6 to prevent the chip body 6 from tilting due to uneven force, causing damage to the chip pins. The clamping mechanism 5 is composed of a spring, a card and a fixing rod. By lifting the card upward, the spring will be elastically deformed and the protruding block of the card will be aligned with the laid down cover plate 3, so that the card will squeeze the cover plate 3 through the spring reset activity, and then the placed cover plate 3 can be fixed. The chip can be conveniently aligned and placed in the detection box 2 through the pin groove 15.

[0037] Reference Figure 1-Figure 3 , installation grooves 7 are provided on the front and back sides of the interior of the detection box 2, and a spring 8 is fixedly connected to the inner wall of the installation groove 7, and the adjacent ends of the two springs 8 are fixedly connected to the limiting blocks 9, the interior of the installation groove 7 is slidably connected to the outside of the limiting blocks 9, and the adjacent ends of the two limiting blocks 9 are fixedly connected to the clamping members 10, the interior of the installation groove 7 is slidably connected to the outside of the clamping members 10, and the outside of the clamping members 10 abuts against the outside of the chip body 6, and the separated ends of the two limiting blocks 9 are fixedly connected to the pull rope 11, the interior of the detection box 2 is slidably connected to the outside of the pull rope 11, and the adjacent ends of the two pull ropes 11 are fixedly connected to the rotating rod 12, and the interior of the detection box 2 is rotatably connected to the outside of the rotating rod 12.

[0038] Specifically, the mounting groove 7 and the limit block 9 fix the spring 8, so that the spring 8 can stably perform elastic deformation. The mounting groove 7 limits the limit block 9 and the clamp 10, so that the limit block 9 and the clamp 10 will not deviate when they move. The detection box 2 limits the pull rope 11 and the rotating rod 12, so that the pull rope 11 is stable when it moves and the rotating rod 12 is rotated. By rotating the rotating rod 12, the two pull ropes 11 are driven to move toward the end close to each other, and then the two limit blocks 9 are driven to move toward the end away from each other, thereby squeezing the spring 8 to perform elastic deformation. Elastic deformation, and then the limit block 9 moves to drive the two clamping members 10 to move with it, so that the chip body 6 is placed in the groove of the detection box 2, and then the spring 18 performs a reset activity, thereby driving the two limit blocks 9 to move toward one end, and then driving the clamping member 10 to move with it, so that the clamping member 10 abuts against the chip body 6, and then clamps and limits the chip body 6, so that the connection between the chip body 6 and the detection box 2 is stabilized, thereby avoiding damage to the chip pins due to stress, and ensuring the accuracy of the test structure.

[0039] Reference Figure 2 , Figure 4 and Figure 5, a pushing assembly 13 is provided inside the detection box 2, and the pushing assembly 13 includes a slider 1301, which is slidably connected to the inside of the detection box 2, and a connecting rod 1302 is fixedly connected to the bottom end of the limit block 9. The inside of the detection box 2 is slidably connected to the outside of the connecting rod 1302, and a stop block 1303 is fixedly connected to the bottom end of the connecting rod 1302. Slide grooves 1304 are provided on both the front and rear sides of the slider 1301, and the inner bottom wall of the slide groove 1304 is an inclined guide surface. The outside of the stop block 1303 abuts against the inside of the slide groove 1304. A reset assembly 14 is provided inside the detection box 2, and the reset assembly 14 includes a spring 1401. The spring 1401 is fixedly connected to the bottom end of the slider 1301, and the bottom end of the spring 1401 is fixedly connected to the top of the base 1. The four corners of the bottom end of the slider 1301 are fixedly connected to telescopic rods 1402, and the bottom end of the telescopic rod 1402 is fixedly connected to the top of the base 1.

[0040] Specifically, the detection box 2 has a limiting effect on the slider 1301, the connecting rod 1302 and the stopper 1303, so that the slider 1301, the connecting rod 1302 and the stopper 1303 will not deviate when moving. Through the contact between the stopper 1303 and the slide groove 1304 and the inclined guide surface of the inner bottom wall of the slide groove 1304, the stopper 1303 can drive the slider 1301 to move downward, so that the stopper 1303 can stably squeeze the slide groove 1304. The slider 1301 and the base 1 have a fixing effect on the spring 1401, so that the spring 1401 can stably perform elastic deformation, and the slider 1301 can be supported by the telescopic rod 1402. , so that the slider 1301 is stable when moving up and down, and by rotating the rotating rod 12, the pull rope 11 is driven to move toward the closer end, and then the two limit blocks 9 are driven to move toward the separated end, thereby driving the clamping member 10 and the connecting rod 1302 to move with it, so that the clamping member 10 is separated from the chip body 6, and then the block 1303 is driven to move with it, so that the block 1303 is separated from the slide groove 1304, and then the spring 2 1401 is reset, thereby driving the slider 1301 to move upward, and then the chip body 6 is squeezed out of the detection box 2, thereby reducing the retention time of the chip body 6 in the detection box 2, and facilitating the staff to take out the chip body 6, thereby ensuring the safety of the chip body 6 and reducing the tediousness of the staff to take out the chip body 6.

[0041] Working principle: When the chip body 6 needs to be tested, the rotating rod 12 is rotated to drive the two pull ropes 11 to move toward the end close to each other, and then drive the two limit blocks 9 to move toward the end away from each other, thereby squeezing the spring 18 to make elastic deformation, and then the limit block 9 moves to drive the two clamping members 10 to move with it, so that the chip body 6 is placed in the groove of the detection box 2, and then the spring 18 performs a reset activity, thereby driving the two limit blocks 9 to move toward the end close to each other, and then driving the clamping member 10 to move with it, so that the clamping member 10 abuts against the chip body 6, and then clamps and limits the chip body 6, so that the cover plate 3 is closed to provide electrical connection and mechanical support for the detection box 2, so that the chip body 6 can communicate and test with the detection box 2;

[0042] In addition, when the chip body 6 that has been tested needs to be taken out, the two limit blocks 9 are driven to move toward the adjacent end through the reset activity of the spring 1 8, thereby driving the two connecting rods 1302 to move therewith, and then driving the block 1303 to move therewith, so that the adjacent end of the two blocks 1303 squeezes the slide groove 1304, thereby driving the slider 1301 to move downward, thereby squeezing the spring 2 1401 to make elastic deformation, and then by rotating the rotating rod 12, the pull rope 11 is driven to move toward the adjacent end, and then the two limit blocks 9 are driven to move toward the separated end, thereby driving the clamping member 10 and the connecting rod 1302 to move therewith, so that the clamping member 10 is separated from the chip body 6, and then driving the block 1303 to move therewith, so that the block 1303 is separated from the slide groove 1304, and then the spring 2 1401 is reset, thereby driving the slider 1301 to move upward, and then the chip body 6 is squeezed out of the detection box 2, so that it is convenient for the staff to take the chip body 6 away.

[0043] Finally, it should be noted that the above is only a preferred embodiment of the present invention and is not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A chip test socket with a limit position function, comprising a base (1), characterized in that: The top of the base (1) is fixedly connected to a detection box (2), the top of the detection box (2) is fixedly connected to a fixing plate (4), the inside of the fixing plate (4) is rotatably connected to a cover plate (3), the left and right sides of the top of the detection box (2) are fixedly connected to a clamping mechanism (5), the inside of the detection box (2) is slidably connected to a chip body (6), the inside of the detection box (2) is provided with mounting grooves (7) on both the front and rear sides, the inner wall of the mounting groove (7) is fixedly connected to a spring (8), and the two springs are fixedly connected to each other. The proximal ends of the two limit blocks (8) are fixedly connected to the limit block (9), the proximal ends of the two limit blocks (9) are fixedly connected to the clamping member (10), the separated ends of the two limit blocks (9) are fixedly connected to the pull rope (11), the proximal ends of the two pull ropes (11) are fixedly connected to the rotating rod (12), the interior of the detection box (2) is provided with a pushing component (13), the interior of the detection box (2) is provided with a reset component (14), and the exterior of the detection box (2) is provided with a pin groove (15).

2. The chip test socket with a limit function according to claim 1, characterized in that: The pushing assembly (13) comprises a slider (1301), the slider (1301) being slidably connected inside the detection box (2), the bottom end of the limit block (9) being fixedly connected to a connecting rod (1302), the bottom end of the connecting rod (1302) being fixedly connected to a stop block (1303), and a slide groove (1304) being provided on both the front and rear sides of the slider (1301), the inner bottom wall of the slide groove (1304) being an inclined guide surface.

3. The chip test socket with a limit function according to claim 2, characterized in that: The reset assembly (14) comprises a second spring (1401), wherein the second spring (1401) is fixedly connected to the bottom end of the slider (1301), and telescopic rods (1402) are fixedly connected to the four corners of the bottom end of the slider (1301).

4. The chip test socket with a limit function according to claim 1, characterized in that: The bottom end of the cover plate (3) fits with the top end of the detection box (2), and the inside of the installation groove (7) is slidably connected with the outside of the limit block (9).

5. The chip test socket with position limiting function according to claim 1, characterized in that: The interior of the mounting groove (7) is slidably connected to the exterior of the clamping member (10), and the exterior of the clamping member (10) is in contact with the exterior of the chip body (6).

6. The chip test socket with a limit function according to claim 1, characterized in that: The interior of the detection box (2) is slidably connected to the exterior of the pull rope (11), and the interior of the detection box (2) is rotatably connected to the exterior of the rotating rod (12).

7. The chip test socket with a limit function according to claim 2, characterized in that: The interior of the detection box (2) is slidably connected to the exterior of the connecting rod (1302), and the exterior of the abutment block (1303) abuts against the interior of the sliding groove (1304).

8. The chip test socket with a limit function according to claim 3, characterized in that: The bottom end of the second spring (1401) is fixedly connected to the top end of the base (1), and the bottom end of the telescopic rod (1402) is fixedly connected to the top end of the base (1).

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