Integrated circuit aging test device

Abstract

The utility model discloses an integrated circuit aging test device, which comprises a high-temperature aging box body and a plurality of placing racks which are sequentially arranged in the high-temperature aging box body from top to bottom, each placing rack is provided with a detection plate, the high-temperature aging box body is provided with a sealing door, the sealing door is detachably provided with a [-shaped handle rod, and the handle rod is provided with an opening. The placing frame comprises a pair of opposite sliding rods and a plurality of supporting rods arranged between the pair of sliding rods at intervals, the supporting rods are vertically connected with the sliding rods, the pair of sliding rods are respectively connected with two opposite inner walls of the high-temperature aging box body in a sliding manner, and one of two rod bodies in the same direction of the handle rod is provided with a slotted hole with two open ends. Compared with the prior art, the utility model has the beneficial effects that the hand of an operator can be prevented from directly extending into the high-temperature aging box body and sliding out of the detection plate without electricity, the problem of failure of the existing electric sliding rail is avoided, the structure is relatively simple, and the equipment manufacturing cost is relatively low.

Description

Technical Field

[0001] The utility model relates to the field of high temperature aging test equipment, and more specifically, to an integrated circuit aging test device. Background Art

[0002] With the rapid development of the domestic integrated circuit industry, the quality of integrated circuits has received more and more attention. When integrated circuits are actually used, they are often in a high-temperature working state. The chip performance of integrated circuits that are in a high-temperature working state for a long time will decline, which in turn affects the performance of the product. Aging test is a test method for evaluating the high-temperature working life of integrated circuits. In the prior art, during the aging test of integrated circuits, the integrated circuit chip is placed under high temperature (≥125°C) and high voltage (maximum working voltage) conditions, and continues to work for a specified time (usually ≥1000 hours) to observe whether the integrated circuit chip has failures, so as to evaluate the chip's life and the reliability and stability of long-term power-on operation. In the prior art, there are many devices for integrated circuit aging testing, and in order to avoid human hands from reaching into the high-temperature aging box and causing possible burns or to reasonably utilize the space to place more test boards, the prior art has designed a bracket for placing the test board to be slidably connected to the high-temperature aging box. For example, the patent with application number 202122919630.7 discloses an aging assessment device for integrated circuit testing, which facilitates personnel to take out the test object within a suitable temperature range by providing a temperature-resistant aging box main body, an electric slide rail mechanism, and a test board provided on the electric slide rail mechanism, thereby preventing human hands from reaching into the temperature-resistant aging box main body after the aging test and causing burns. However, in the above structure, since an electric slide rail mechanism is adopted, in actual use, each layer of the test board needs to be equipped with an electric slide rail mechanism, which makes the overall structure complicated and increases the production cost. At the same time, the electric slide rail mechanism may malfunction due to lack of power. In addition, if the bracket is set to a structure that is slidably connected to the high-temperature aging box (not driven by electricity), when the bracket needs to be taken, in order to prevent possible burns, it is necessary to wear gloves or use other auxiliary materials to slide and pull the bracket out of the high-temperature aging box. However, in actual use, gloves or other auxiliary materials are additional items and may not be found in time. Utility Model Content

[0003] An object of the present utility model is to solve at least the above problems and provide an integrated circuit aging test device, which uses the handle rod of the high-temperature aging box body as an auxiliary for pulling the placement rack. When in use, after opening the sealing door of the high-temperature aging box body by using the handle rod, the handle rod is removed and then the placement rack is slid out from the high-temperature aging box body by using the handle rod. Before the aging test, the integrated circuit chip can be conveniently installed on the detection board of the placement rack or after the aging test, the integrated circuit chip can be taken out from the detection board, avoiding the inconvenience of operation caused by putting hands into the high-temperature aging box body and at the same time avoiding the scalding that the high-temperature aging box body may cause to hands. Moreover, since the handle rod is provided on the high-temperature aging box body, it can be taken and used at any time and can be used in time. In addition, compared with the existing electric slide rail structure, the structure in which the detection board slides out of the high-temperature aging box body does not require electricity and has a simple structure and low manufacturing cost.

[0004] To achieve these objects and other advantages according to the present utility model, there is provided an integrated circuit aging test device, including a high-temperature aging box body, and a plurality of placement racks sequentially arranged in the high-temperature aging box body from top to bottom. Each placement rack is provided with a detection board. The high-temperature aging box body is provided with a sealing door, and a U-shaped handle rod is detachably provided on the sealing door. The placement rack includes a pair of opposite sliding rods and a plurality of support rods spaced between the pair of sliding rods. The support rods are perpendicularly connected to the sliding rods, and the pair of sliding rods are respectively slidably connected to two opposite inner walls of the high-temperature aging box body. Among the two rod bodies of the handle rod in the same direction, one of the rod bodies is provided with a slot with open ends at both ends, and the size of the slot is adapted to the size of the support rod so that when the support rod passes through the slot, the handle rod can pull the placement rack.

[0005] Preferably, a friction pad is laid on the inner wall of the slot.

[0006] Preferably, an observation window is provided on the sealing door.

[0007] Preferably, a plurality of pairs of elastic pads are sequentially arranged on the sealing door from top to bottom. The plurality of pairs of elastic pads correspond to the plurality of placement racks. Each pair of elastic pads is arranged on both sides of the observation window so that when the sealing door is closed, the elastic pads press the corresponding placement racks.

[0008] Preferably, a slot is provided on the sealing door, and a clamping hole is provided in the slot. An installation cavity is opened inside the rod body of the handle rod close to the sealing door. An installation plate is provided in the installation cavity. A plurality of springs are provided between the installation plate and the inner wall of the installation cavity. A clamping block and a pressing block adapted to the clamping hole are respectively provided on the side wall of the installation plate away from the spring. The clamping block and the pressing block both extend out of the installation cavity through the spring; wherein, when the clamping block extends into the clamping hole, the pressing block is located outside the sealing door.

[0009] Preferably, the pressing surface of the pressing block is an arc surface.

[0010] Preferably, the high-temperature aging box is provided with an air inlet and an air outlet, an air inlet fan is provided at the air inlet, the air inlet is connected to a square air inlet duct, the air inlet duct is located outside the high-temperature aging box, and the top and bottom of the air inlet duct are provided with perforations; it also includes a filter assembly, the filter assembly includes a first roller, a second roller, a first tensioning roller, a second tensioning roller, and a filter, the first roller and the second roller are respectively arranged on the side walls of the high-temperature aging box located above and below the air inlet duct, the first tensioning roller and the second tensioning roller are respectively arranged at the top and bottom of the air inlet duct, one end of the filter is rolled on the first roller, and the other end of the filter rolls over the first tensioning roller, passes through a pair of perforations, rolls over the second tensioning roller, and then is wound around the second roller; one end of the second roller is provided with a rotating handle.

[0011] The utility model at least has the following beneficial effects:

[0012] By arranging a high-temperature aging box, a test board, a sealed door, a handle bar, a sliding bar, a support bar, and a slot, when the aging test of the integrated circuit chip on the test board is completed, the sealed door is opened by the handle bar, and then the handle bar is removed from the sealed door, and the slot of the handle bar is set on the outermost support bar of the placement rack, and the placement rack can be taken out of the high-temperature aging box by pulling the other end of the handle bar; as a whole, the handle bar of the high-temperature aging box is used as an auxiliary object for pulling the placement rack, and after the sealed door of the high-temperature aging box is opened by the handle bar, the handle bar is removed and then The placement rack is slid and pulled out of the high-temperature aging box by using the handle rod, so that the test board can be conveniently placed on the placement rack before the aging test, or the test board can be taken out of the placement rack after the aging test, thereby avoiding the inconvenience of operation caused by putting hands into the high-temperature aging box and avoiding possible burns to hands caused by the high-temperature aging box. Moreover, since the handle rod is arranged on the high-temperature aging box, it can be taken out and used in time. In addition, compared with the existing electric slide rail structure, the structure in which the test board slides out of the high-temperature aging box does not require electricity and has a simple structure and a low manufacturing cost.

[0013] Other advantages, objectives and features of the present invention will be embodied in part through the following description, and in part will be understood by those skilled in the art through research and practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a structural schematic diagram of an integrated circuit aging test device according to one of the technical solutions of the utility model;

[0015] Figure 2 for Figure 1 Enlarged view of point A in the middle;

[0016] Figure 3 This is a structural side view of an integrated circuit aging test device according to one of the technical solutions of the utility model;

[0017] Figure 4 This is a structural schematic diagram of a placement rack according to one of the technical solutions of the utility model being placed in a high-temperature aging box;

[0018] Figure 5 This is a schematic diagram of the structure of the sealing door described in one of the technical solutions of the utility model;

[0019] Figure 6 This is a schematic diagram of the structure of a door handle according to one of the technical solutions of the utility model;

[0020] Figure 7 It is a top view of the structure of the placement rack described in one of the technical solutions of the utility model;

[0021] Figure 8 This is a top view of the structure of the upper rod body and the slot according to one of the technical solutions of the utility model.

[0022] Figure markings: 1-high temperature aging box; 2-sealed door; 3-handle rod; 301-upper rod body; 302-lower rod body; 303-connecting rod body; 304-auxiliary rod; 4-air outlet; 5-card hole; 6-installation cavity; 7-spring; 8-card block; 9-pressing block; 10-installation plate; 11-placing rack; 1101-sliding rod; 1102-support rod; 12-vertical partition; 13-detection plate; 1301-gold finger plug-in end; 14-air inlet duct; 15-first bracket; 16-first roller; 17-second roller; 18-first tensioning roller; 19-second tensioning roller; 20-filter screen; 21-second bracket; 22-locking bolt; 23-observation window; 24-elastic pad; 25-friction pad; 26-slot hole; 27-turn handle. DETAILED DESCRIPTION

[0023] The present invention will be further described in detail below in conjunction with the accompanying drawings so that those skilled in the art can implement the invention with reference to the description.

[0024] It should be understood that the terms such as “having”, “including” and “comprising” used herein do not exclude the existence or addition of one or more other elements or combinations thereof.

[0025] like Figure 1-8As shown in the figure, the present utility model provides an integrated circuit aging test device, which includes a high-temperature aging box body 1 and a plurality of placement racks 11 arranged in the high-temperature aging box body 1 from top to bottom. Each placement rack 11 is provided with a detection board 13. The high-temperature aging box body 1 is provided with a sealing door 2, and a U-shaped handle rod 3 is detachably arranged on the sealing door 2. The placement rack 11 includes a pair of opposite sliding rods 1101 and a plurality of support rods 1102 spaced between the pair of sliding rods 1101. The support rods 1102 are vertically connected to the sliding rods 1101. The pair of sliding rods 1101 are respectively slidably connected to two opposite inner walls of the high-temperature aging box body 1. Among the two rod bodies of the handle rod 3 in the same direction, one of the rod bodies is provided with a slot hole 26 with both ends open. The slot hole 26 is adapted to the size of the support rod 1102 so that when the support rod 1102 is inserted into the slot hole 26, the handle rod 3 can pull the placement rack 11;

[0026] In the above technical solution, the high-temperature aging box body 1 is a common high-temperature box body in the art for integrated circuit chip aging tests. The sealing door 2 is hinged to the high-temperature aging box body 1, and the sealing door is fastened by a lock assembly (not shown in the figure) to seal the high-temperature aging box body; a plurality of placement racks 11 are arranged in the high-temperature aging box body 1 from top to bottom in sequence. Each placement rack 11 includes a pair of sliding rods 1101 and a plurality of support rods 1102 spaced between the pair of sliding rods 1101 to form a hollow placement rack 11. The pair of sliding rods 1101 are respectively slidably connected to two opposite inner walls of the high-temperature aging box body 1. The form of the sliding connection is preferably the form of a limit chute and a pulley. A detection board 13 is fixedly arranged on each placement rack 11. After the detection board 13 is placed on the placement rack 11, it does not cover the outermost support rod 1102; the manner in which the handle rod 3 is detachably connected to the sealing door 2 can be snap connection or screw connection, and it can be detached during use as an auxiliary object for pulling the placement rack 11; the handle rod 3 is U-shaped. The two rod bodies of the handle rod 3 in the same direction are arranged up and down. The rod body located in the upper part is the upper rod body 301, the rod body located in the lower part is the lower rod body 302, and the rod body connecting the upper rod body 301 and the lower rod body 302 is the connecting rod body 303. The bottom of the upper rod body 301 is provided with a slot hole 26 with both ends open so that the support rod 1102 can be inserted into the slot hole 26; during actual use, another auxiliary rod 304 can be arranged on the connecting rod body 303 so that the lower rod body 302, the auxiliary rod 304, and the connecting rod body 303 form a T-shaped rod, which is convenient for a person to hold and apply force to pull the placement rack 11;

[0027] When the aging test of the integrated circuit chip on the detection board 13 is completed, the buckling relationship of the lock assembly is released, the sealed door 2 is opened by the handle rod 3, and then the handle rod 3 is removed from the sealed door 2, and the slot 26 of the handle rod 3 is set on the outermost branch rod 1102, and the placement rack 11 can be taken out from the high-temperature aging box 1 by pulling the other end of the handle rod 3, which can avoid the operator's hand directly reaching into the high-temperature aging box 1, which may cause burns. At the same time, compared with the existing structure of the electric slide-out detection board 13, the slide-out detection board 13 of the utility model does not need electricity, avoids the problem of failure of the existing electric slide rail, and has a relatively simple structure and a low equipment manufacturing cost; in actual use, due to the design of the structure of the pullable placement rack 11, the human hand does not need to be placed in the box for operation, so a multi-layer placement rack 11 can be designed in the box as needed, and since the handle rod 3 is arranged on the high-temperature aging box 1, it can be taken out as needed and can be used in time.

[0028] In another technical solution, a friction pad 25 is provided on the inner wall of the slot 26; specifically, the friction pad 25 is made of rubber, latex or silicone. When in use, the friction pad 25 can increase the friction between the support rod 1102 and the slot 26, so that the door handle is more stable when the placement rack 11 is pulled.

[0029] In another technical solution, an observation window 23 is provided on the sealed door 2 . The beneficial effect obtained by adopting this technical solution is that the test conditions inside the high-temperature aging box 1 can be observed by designing the observation window 23 .

[0030] In another technical solution, the sealing door 2 is provided with multiple pairs of elastic pads 24 from top to bottom, and the multiple pairs of elastic pads 24 correspond to multiple placement racks 11. Each pair of elastic pads 24 is arranged on both sides of the observation window 23. When the sealing door 2 is closed, the elastic pads 24 press the corresponding placement racks 11.

[0031] In this technical scheme, the high-temperature aging box 1 refers to the existing aging box structure, such as the high-temperature box in the patent with application number 201810234826.2, or the structure for the high-temperature aging test box in the patent with application number 202121792238.4, or the high-temperature aging box 1 includes a box, the interior of the box is divided into a first zone and a second zone by a vertical partition 12, wherein the placement rack 11 is arranged in the second zone, and a heating plate (not shown in the figure) or other existing heating elements are provided in the second zone to provide a heating function in the second zone, the detection board 13 includes an aging substrate and a gold finger plug-in terminal 1301 provided on one side of the aging substrate, a power supply electrical component (not shown in the figure) compatible with the detection board is provided in the first zone, and a through hole is provided on the vertical partition 12 to facilitate the gold finger plug-in terminal 1301 to pass through the through hole to connect with the power supply electrical component in the first zone, and the power supply electrical component is a very mature structure in this field, such as multiple A power supply substrate (not shown in the figure) at the gold finger slot end that matches the gold finger plug end 1301, multiple power supply substrates correspond one to one with multiple detection boards 13, and other auxiliary control components can be set as needed in actual use. Since it is a very mature existing technology, it will not be described in detail here; in actual use, the gold finger plug end 1301 on the detection board 13 and the gold finger slot end on the power supply electrical component can be connected through a wire, or can be directly connected through a wire without being connected, and the gold finger plug end 1301 and the gold finger slot end can be directly plugged and connected. This technical solution is suitable for the situation where the gold finger plug end 1301 and the gold finger slot end are directly plugged and connected. In this technical solution, multiple pairs of elastic pads 24 are provided on the sealing door 2 on both sides of the observation window 23. When in use, after the sealing door 2 is closed, the elastic pad 24 abuts against the corresponding placement rack 11, so that the gold finger plug end 1301 on the detection board 13 can be firmly connected with the corresponding power supply electrical component to avoid poor contact.

[0032] In another technical solution, a slot is provided on the sealed door 2, a card hole 5 is provided in the slot, a mounting cavity 6 is opened inside the rod body of the handle rod 3 close to the sealed door 2, a mounting plate 10 is provided in the mounting cavity 6, a plurality of springs 7 are provided between the mounting plate 10 and the inner wall of the mounting cavity 6, a card block 8 and a pressing block 9 adapted to the card hole 5 are respectively provided on the side wall of the mounting plate 10 away from the spring 7, the card block 8 and the pressing block 9 are both movably extended out of the mounting cavity 6 through the spring 7; wherein, when the card block 8 is extended into the card hole 5, the pressing block 9 is located outside the sealed door 2;

[0033] In the above technical solution, the sealed door 2 is provided with a horizontal slot, the inner wall of the slot is provided with a horizontal card hole 5, the upper rod body 301 of the handle rod 3 is provided with a horizontal installation cavity 6, a vertical installation plate 10 is provided in the installation cavity 6, and a plurality of springs 7 are provided between the installation plate 10 and the inner wall of the installation cavity 6, preferably two springs 7, and the two springs 7 are respectively provided at both ends of the installation plate 10, one end of the spring 7 is connected to the inner wall before installation, and the other end is connected to the board surface of the installation plate 10, the A clamping block 8 and a pressing block 9 are provided on the surface of the mounting plate 10 away from the spring 7. A first hole and a second hole are provided on the cavity wall of the mounting cavity 6 away from the spring 7. The end of the clamping block 8 away from the mounting plate 10 slides in and out along the first hole, and the end of the pressing block 9 away from the mounting plate 10 slides in and out along the second hole. The clamping block 8 is adapted to the clamping hole 5 (the inner diameter of the clamping hole 5 is about 1 to 2 mm larger than the diameter of the clamping block 8). In actual use, the clamping block 8 and the pressing block 9 are designed according to the situation. The spacing distance and the elastic force of the spring 7 are used to drive the card block 8 to retract synchronously when the pressing block 9 is pressed. At the same time, when the end of the upper rod body 301 contacts the bottom of the slot, the card block 8 is coaxial with the card hole 5. When in use, the pressing block 9 is pressed to retract the card block 8 into the installation cavity 6, and then the upper rod body 301 is inserted into the slot. When the upper rod body 301 is inserted into the slot and the end of the upper rod body 301 contacts the bottom of the slot, the card block 8 is coaxial with the card hole 5. At this time, the pressing block 9 is released, and the card block 8 is inserted into the card hole 5. At this time, the handle bar 3 is relatively fixed to the sealed door 2, and the handle bar 3 serves as a door handle; when the detection board 13 needs to be taken out, the pressing block 9 is pressed to retract the clamping block 8 into the installation cavity 6, and then the handle bar 3 is removed from the sealed door 2, and the slot 26 on the handle bar 3 is sleeved on the support rod 1102, and the placement rack 11 can be pulled out of the box; in actual use, since the upper rod body 301 will be inserted into the slot, the lower rod body 302 is adaptively designed, and the length of the lower rod body 302 is smaller than the upper rod body 301;

[0034] The beneficial effect of adopting this technical solution is that, by designing the slot, the card hole 5, the installation cavity 6, the spring 7, the card block 8, and the pressing block 9, a detachable connection method between the door handle and the sealed door 2 is provided. Compared with the traditional card connection or screw connection, it is more labor-saving, simple to operate, and quick to install and remove.

[0035] In another technical solution, the pressing surface of the pressing block 9 is an arc surface. The beneficial effect obtained by adopting this technical solution is that the comfort of human hand pressing is improved by designing the pressing surface of the pressing block 9 as an arc surface.

[0036] In another technical solution, the high-temperature aging box 1 is provided with an air inlet and an air outlet 4, an air inlet fan is provided at the air inlet, and the air inlet is connected to a square air inlet duct 14, the air inlet duct 14 is located outside the high-temperature aging box 1, and the top and bottom of the air inlet duct 14 are provided with perforations; it also includes a filter assembly, the filter assembly includes a first roller 16, a second roller 17, a first tensioning roller 18, a second tensioning roller 19, and a filter 20, the first roller 16 and the second roller 17 are respectively arranged on the side walls of the high-temperature aging box 1 located above and below the air inlet duct 14, the first tensioning roller 18 and the second tensioning roller 19 are respectively arranged at the top and bottom of the air inlet duct 14, one end of the filter is rolled on the first roller 16, and the other end of the filter rolls over the first tensioning roller 18, passes through a pair of perforations, rolls over the second tensioning roller 19 in sequence, and then is wound around the second roller 17; one end of the second roller 17 is provided with a rotating handle;

[0037] In the above technical solution, the side wall of the high-temperature aging box 1 is provided with an air inlet, and the top wall is provided with an air outlet 4, and an air inlet fan (not shown in the figure) is provided at the air inlet to suck the outside air into the box under the drive of the air inlet fan; an air inlet duct 14 is provided at the air inlet, and the air inlet duct 14 is located outside the high-temperature aging box 1, and the air inlet duct 14 is square (square in cross section), and the top and bottom of the air inlet duct 14 are both provided with perforations, and the perforations are long strips, and the air inlet duct 14 between a pair of perforations is a filtering space The filter assembly includes a first roller 16, a second roller 17, a first tensioning roller 18, a second tensioning roller 19 and a filter 20. The first roller 16 and the second roller 17 are respectively installed on the side wall of the high-temperature aging box 1 through a first bracket 15. The first roller 16 and the second roller 17 are rotatably connected to the corresponding brackets. The top of the air inlet duct 14 is provided with a first tensioning roller 18 near the corresponding perforation, and the bottom of the air inlet duct 14 is provided with a second tensioning roller 19 near the corresponding perforation. The first tensioning roller 18 and the second tensioning roller 19 are respectively installed on the side wall of the high-temperature aging box 1 through a second bracket 21. The first tensioning roller 18 and the second tensioning roller 19 are rotatably connected to the corresponding second bracket 21 so that the filter screen 20 described later can roll and move; the filter screen 20 is a flexible filter screen 20 commonly used in the art, one end of the filter screen 20 is rolled on the first roller 16, and the other end rolls through the first tensioning roller 18, a pair of perforations, and then rolls through the second tensioning roller 19, and finally rolls on the second roller 17. One end of the second roller 17 is rotated to extend out of the corresponding second bracket 21, and a rotating handle 27 is provided on the extended end. When the rotating handle 27 is rotated, the filter 20 flows between the first roller 16, the first tensioning roller 18, a pair of perforations, the second tensioning roller 19 and the second roller 17. In actual use, a support plate can be provided on the rotating handle 27, and a locking bolt 22 is screwed on the support plate. When the locking bolt 22 abuts against the first bracket 15, the rotating handle is fixed relative to the first bracket 15. In actual use, a filter can also be synchronously provided at the air outlet 4.

[0038] In the present technical solution, when in use, when the filter 20 located in the air inlet duct 14 loses its filtering effect or the filtering effect is reduced, the rotating handle 27 is turned to wind the filter 20 full of dust on the first roller 16. At the same time, a new filter 20 enters the air inlet duct 14. The filter 20 can be replaced in time to ensure the filtering effect at the air inlet duct 14 and prevent dust from entering the high-temperature aging box 1 and affecting the components in the box. The number of equipment and processing scale described here are used to simplify the description of the utility model. The application, modification and variation of the integrated circuit aging test device of the utility model are obvious to those skilled in the art.

[0039] Although the implementation scheme of the utility model has been disclosed as above, it is not limited to the applications listed in the specification and implementation modes. It can be fully applied to various fields suitable for the utility model. For those familiar with the art, additional modifications can be easily implemented. Therefore, without departing from the general concept defined by the claims and the scope of equivalents, the utility model is not limited to the specific details and the illustrations shown and described herein.

Claims

1. An integrated circuit aging test device, comprising a high-temperature aging box, a plurality of racks arranged in the high-temperature aging box from top to bottom, each rack having a detection board, and the high-temperature aging box having a sealed door, characterized in that: A U-shaped handle rod is detachably provided on the sealing door. The placement rack includes a pair of opposite sliding rods and a plurality of support rods spaced between the pair of sliding rods. The support rods are perpendicularly connected to the sliding rods. The pair of sliding rods are respectively slidably connected to two opposite inner walls of the high-temperature aging box body. Among the two rod bodies of the handle rod in the same direction, a slot with open ends is provided on one of the rod bodies. The size of the slot is adapted to the size of the support rod so that when the support rod passes through the slot, the handle rod can pull the placement rack.

2. The integrated circuit aging test device according to claim 1, characterized in that: A friction pad is laid on the inner wall of the slot.

3. The integrated circuit aging test device according to claim 1, characterized in that: An observation window is provided on the sealing door.

4. The integrated circuit aging test device according to claim 3, characterized in that: A plurality of pairs of elastic pads are sequentially provided on the sealing door from top to bottom. The plurality of pairs of elastic pads correspond to a plurality of placement racks. Each pair of elastic pads are respectively arranged on both sides of the observation window so that when the sealing door is closed, the elastic pads press the corresponding placement racks.

5. The integrated circuit aging test device according to claim 1, characterized in that: A slot is provided on the sealing door, and a clamping hole is provided in the slot. An installation cavity is opened inside the rod body of the handle rod close to the sealing door. An installation plate is provided in the installation cavity. A plurality of springs are provided between the installation plate and the inner wall of the installation cavity. A clamping block and a pressing block adapted to the clamping hole are respectively provided on the side wall of the installation plate away from the spring. The clamping block and the pressing block both extend out of the installation cavity through the spring; wherein, when the clamping block extends into the clamping hole, the pressing block is located outside the sealing door.

6. The integrated circuit aging test device according to claim 5, characterized in that: The pressing surface of the pressing block is an arc surface.

7. The integrated circuit aging test device according to claim 2, characterized in that: An air inlet and an air outlet are opened on the high-temperature aging box body. An air inlet fan is provided at the air inlet. The air inlet is connected with a square air inlet pipe. The air inlet pipe is located outside the high-temperature aging box body. Through holes are opened at the top and bottom of the air inlet pipe; A filter screen assembly is further included. The filter screen assembly includes a first roller shaft, a second roller shaft, a first tensioning roller, a second tensioning roller, and a filter screen. The first roller shaft and the second roller shaft are respectively arranged on the side walls of the high-temperature aging box body above and below the air inlet pipe. The first tensioning roller and the second tensioning roller are respectively arranged at the top and bottom of the air inlet pipe. One end of the filter screen is wound on the first roller shaft. The other end of the filter screen sequentially rolls over the first tensioning roller, passes through a pair of through holes, rolls over the second tensioning roller, and then is wound on the second roller shaft; A rotating handle is provided at one end of the second roller shaft.

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