Probe detection device and electric test bench

Abstract

The utility model discloses a probe detection device and an electric testing table, and belongs to the technical field of wire harness equipment, the probe detection device is used for detecting a probe of the electric testing table, and the electric testing table comprises an industrial personal computer, an electric testing instrument, an adapter plate and a wire harness connector; the electric measuring instrument is connected with the industrial personal computer; the adapter plate is connected with the electrical measuring instrument; the wire harness connector is connected with the adapter plate, and the wire harness connector comprises a probe; the probe detection device comprises a test pen and an instrument, the test pen is connected with the electric measuring instrument, and the test pen is used for being in contact with the probe to detect the probe; the instrument comprises a first interface which is connected with the test pen. The elastic force sensor is arranged on the test pen to detect the elastic force of the probe in contact with the pen point, so that the value of the elastic force of the probe is obtained, whether the state of the probe meets the requirement or not is judged conveniently, meanwhile, the point location address information of the tested probe can be obtained through the electric measuring instrument, and the accuracy of the test is improved. Therefore, the elasticity value of the tested probe is in one-to-one correspondence with the point address.

Description

Technical Field

[0001] The present application belongs to the technical field of wiring harness equipment, and specifically relates to a probe detection device and an electrical testing station. Background Art

[0002] The wire harness electrical test bench is a device used to perform electrical connection, signal transmission, and functional performance tests on the wire harness. Through the test of the wire harness electrical test bench, the quality, function, and reliability of the wire harness can be verified to ensure that it can work normally and meet specific requirements.

[0003] In current technology, when maintaining the harness connector in the harness electrical test bench, an inspection rod is used to check the probe in the harness connector. However, the inspection rod can only confirm whether the probe in the harness connector has obvious defects such as missing, damaged, bent, etc., but cannot confirm whether the elasticity of the probe still meets the requirements. Utility Model Content

[0004] Purpose of the utility model: The embodiment of the present application provides a probe detection device, which aims to overcome the current technical problem of being unable to confirm whether the elasticity of the probe in the wiring harness connector meets the requirements; the present application also provides an electrical testing station.

[0005] Technical solution: A probe detection device according to an embodiment of the present application is used to detect a probe of an electrical test bench, wherein the electrical test bench comprises:

[0006] Industrial computer;

[0007] An electrical tester connected to the industrial computer;

[0008] An adapter plate connected to the electrical measuring instrument;

[0009] A wiring harness connector, the wiring harness connector is connected to the adapter plate, and the wiring harness connector includes the probe;

[0010] The probe detection device comprises:

[0011] A test pen, the test pen is connected to the electrical tester and is used to contact the probe to detect the probe;

[0012] The instrument comprises a first interface, and the first interface is connected to the test pen.

[0013] The present application also provides an electrical test station, comprising:

[0014] Industrial computer;

[0015] An electrical tester connected to the industrial computer;

[0016] An adapter plate connected to the electrical measuring instrument;

[0017] A wiring harness connector, the wiring harness connector is connected to the adapter plate, and the wiring harness connector includes the probe;

[0018] The above-mentioned probe detection device is connected to the electrical tester.

[0019] Beneficial effect: A probe detection device provided in an embodiment of the present application is used to detect the probe of an electrical test bench, wherein the electrical test bench includes an industrial computer, an electrical tester, an adapter board and a harness connector; the electrical tester is connected to the industrial computer; the adapter board is connected to the electrical tester; the harness connector is connected to the adapter board, and the harness connector includes a probe; the probe detection device includes a test pen and an instrument, wherein the test pen is connected to the electrical tester, and the test pen is used to contact the probe to detect the probe; the instrument includes a first interface, and the first interface is connected to the test pen. The present application sets an elastic force sensor on the test pen to detect the elastic force of the probe in contact with the pen head, so as to obtain the value of the elastic force of the probe, thereby facilitating the judgment of whether the state of the probe meets the requirements. At the same time, the point address information of the probe under test can also be obtained through the electrical tester, so as to correspond the elastic force value of the probe under test to the point address one by one.

[0020] Another embodiment of the present application provides an electrical test bench, including an industrial computer, an electrical tester, an adapter board, a wiring harness connector, and the above-mentioned probe detection device; the electrical tester is connected to the industrial computer; the adapter board is connected to the electrical tester; the wiring harness connector is connected to the adapter board, and the wiring harness connector includes a probe; and the probe detection device is connected to the electrical tester. The present application detects the probe of the wiring harness connector in the electrical test bench by setting a probe detection device in the electrical test bench, so as to judge whether the probe meets the requirements through the elastic force value, thereby improving the accuracy of the detection data of the electrical test bench. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in the description of the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0022] Figure 1 A connection diagram of an electrical test bench provided in an embodiment of the present application;

[0023] Figure 2 A schematic diagram of the structure of a test pen in a probe detection device provided in an embodiment of the present application;

[0024] Figure 3 A schematic diagram of the structure of an instrument in a probe detection device provided in an embodiment of the present application;

[0025] Figure 4A structural schematic diagram of an industrial computer of an electrical test bench provided in an embodiment of the present application;

[0026] Figure 5 A schematic diagram of the structure of an electric tester of an electric test station provided in an embodiment of the present application;

[0027] Figure 6 A schematic diagram of the structure of a wiring harness connector for an electrical test bench provided in an embodiment of the present application;

[0028] Figure 7 A schematic diagram of the structure of an adapter plate of an electrical test bench provided in an embodiment of the present application;

[0029] Figure 8 A schematic diagram of the structure of an electrical testing station provided in an embodiment of the present application.

[0030] Figure numerals: 10-test pen, 11-pen body, 12-pen tip, 13-data line, 131-first data line, 132-second data line, 14-elastic force sensor, 20-instrument, 21-first interface, 22-second interface, 23-first panel, 30-adapter board, 31-seventh interface, 32-eighth interface, 40-industrial computer, 41-sixth interface, 42-second panel, 50-electric tester, 51-third interface, 52-fourth interface, 53-fifth interface, 60-wiring harness connector, 61-connector body, 611-limiting groove, 62-probe, 63-wiring; 70-bracket, 71-first plate, 72-second plate, 73-frame, 74-roller, 80-memory. DETAILED DESCRIPTION

[0031] The technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of the present application.

[0032] In the description of the present application, it should be understood that the terms "length", "width", "thickness", "upper", "lower", "top", "bottom", "inside", "outside", etc., indicating the orientation or positional relationship, are based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application. In the description of the present application, "multiple" means two or more, and at least one means one, two or more, unless otherwise clearly and specifically defined.

[0033] The wire harness electrical test bench is a device used to perform electrical connection, signal transmission, and functional performance tests on the wire harness. Through the test of the wire harness electrical test bench, the quality, function, and reliability of the wire harness can be verified to ensure that it can work normally and meet specific requirements.

[0034] In the current technology, when the harness connector 60 in the harness electrical test bench is maintained, a check rod is used to check the probe 62 in the harness connector 60. However, the check rod can only confirm whether the probe 62 in the harness connector 60 has obvious defects such as missing, damaged, bent, etc., but cannot confirm whether the elasticity of the probe 62 still meets the requirements. The harness connector 60 is also called a "holder".

[0035] In order to solve the technical problem that it is impossible to confirm whether the elasticity of the probe 62 in the wiring harness connector 60 meets the requirements, the first embodiment of the present application provides a probe detection device, see Figure 1 , Figure 1 A connection diagram of an electric test bench provided in an embodiment of the present application. The probe detection device in the first embodiment of the present application is used to detect a probe 62 of the electric test bench. The electric test bench includes an industrial computer 40, an electric tester 50, an adapter board 30 and a harness connector 60. The electric tester 50 is connected to the industrial computer 40, the adapter board 30 is connected to the electric tester 50, the harness connector 60 is connected to the adapter board 30, and the harness connector 60 includes a probe 62; the probe detection device includes a test pen 10 and a meter 20. The test pen 10 is connected to the electric tester 50, and the test pen 10 is used to contact the probe 62 to detect the probe 62. The meter 20 includes a first interface 21, and the first interface 21 is connected to the test pen 10.

[0036] In the first embodiment of the present application, by connecting the test pen 10 with the meter 20, the real-time detection value can be displayed when the test pen 10 detects the elastic value of the probe 62, so that the detection personnel can refer to it and judge whether the elasticity of the probe 62 being detected meets the requirements. The electric tester 50 in the electric test station is used to identify and distinguish the point address of each probe 62, and display the point address of the probe 62 in the industrial computer 40. In the first embodiment of the present application, the function of the electric test station that can identify and distinguish the address of each probe 62 is used and connected to the test pen 10, so that when the test pen 10 detects the elastic value of the probe 62, the point address of the probe 62 is displayed on the industrial computer 40, so that the detection personnel can correspond the elastic value of the probe 62 to the point address of the probe 62 one by one, which is convenient for recording.

[0037] In some embodiments, see Figure 2 , Figure 2A structural schematic diagram of a test pen 10 in a probe detection device provided in an embodiment of the present application, the test pen 10 includes a pen body 11, an elastic force sensor 14, a pen tip 12 and a data line 13, the pen body 11 includes two oppositely arranged ends, the elastic force sensor 14 is connected to one end of the pen body 11, the pen tip 12 is connected to the elastic force sensor 14, and the data line 13 is connected to the other end of the pen body 11, wherein the test pen 10 and the instrument 20 are connected via the data line 13.

[0038] Furthermore, a detection hole is formed on the pen tip 12, and the detection hole is located at one end of the pen tip 12 away from the pen body 11. When in use, the probe 62 is inserted into the detection hole so that the pen tip 12 can be stably connected to the probe 62 to avoid the pen tip 12 and the probe 62 from deviating during the detection process.

[0039] During detection, the probe 62 is placed in the detection hole, and the pen body 11 is pressed toward the probe 62 along the extension direction of the probe 62 to make the probe 62 elastically deform. After the probe 62 is elastically deformed, a reaction force is applied to the bottom of the detection hole of the pen tip 12. The elastic force sensor 14 connected to the pen tip 12 obtains the value of the elastic force applied by the probe 62 to the pen tip 12.

[0040] In the above embodiment, the elastic force sensor 14 connected to the pen tip 12 can obtain the force of the probe 62 reacting on the pen tip 12, and send the signal emitted by the sensor to the meter 20 through the data line 13. After receiving the signal emitted by the elastic force sensor 14, the meter 20 displays the elastic force value for the convenience of the inspector to read.

[0041] The pen body 11 is provided for the convenience of the inspector to hold. At the same time, the test pen 10 with the elastic force sensor 14 is compact and convenient for the inspector to use with one hand. The pen head 12 is provided for the convenience of inserting into the limit groove 611 of the wiring harness connector 60 to measure the probe 62 in the limit groove 611.

[0042] In some embodiments, please refer again to Figure 2 The data cable 13 includes a first data cable 131 and a second data cable 132, one end of the first data cable 131 is connected to the elastic sensor 14, the other end of the first data cable 131 is connected to the meter 20, one end of the second data cable 132 is connected to the pen tip 12, and the other end of the first data cable 131 is connected to the electric measuring instrument 50; wherein the first data cable 131 and the second data cable 132 are both arranged through the pen body 11.

[0043] Furthermore, the elastic force sensor 14 has a signal output terminal, and the first data line 131 is connected to the signal output terminal of the elastic force sensor 14 to transmit the signal output by the elastic force sensor 14 to the meter 20, so that the meter 20 can display the elastic force value. The pen head 12 and the second data line 132 can connect the probe 62 to the electric measuring instrument 50, so that the electric measuring instrument 50 can determine the point address of the probe 62.

[0044] In the above embodiment, when the test pen 10 detects the probe 62, the meter 20 can display the elastic force value, and the electrical tester 50 can obtain the point address information of the probe 62 and display the point address information on the industrial computer 40, so that the testing personnel can match the elastic force value of the probe 62 with the point address information one by one.

[0045] In some embodiments, see Figure 3 , which is a structural schematic diagram of an instrument 20 in a probe detection device provided in an embodiment of the present application, wherein the instrument 20 also includes a second interface 22 and a first panel 23, wherein the second interface 22 is configured as an external memory 80; and a first panel 23, wherein the first panel 23 is configured to display data; wherein the first interface 21 and the second interface 22 are connected to the panels respectively.

[0046] Furthermore, the first interface 21 is used to connect to the first data line 131, and the first interface 21 includes a first input end and a first output end. The first input end is connected to the first data line 131 to obtain the signal emitted by the elastic force sensor 14, and the first output end is connected to the first panel 23 to output the signal obtained from the elastic force sensor 14 to the first panel 23, so that the first panel 23 can display the elastic force value; the second interface 22 includes a second input end and a second output end, the second input end is connected to the first output end to obtain the signal of the elastic force sensor 14, and the second output end is externally connected to the memory 80, so that the memory 80 can obtain the signal of the elastic force sensor 14 and record the elastic force value.

[0047] In the above embodiment, the meter 20 can be provided to facilitate the inspector to observe the elastic force value of the probe 62 being inspected, so as to determine whether the elastic force of the probe 62 being inspected meets the requirements, making the inspection result more intuitive.

[0048] Furthermore, the external memory 80 is connected to the industrial computer 40, and the external memory 80 may be a laptop computer, and the connection method may be a wired connection or a wireless connection. During the detection process, the external memory 80 can not only receive the signal of the elastic force sensor 14 and record the elastic force value, but also receive the point address information of the probe 62 being detected obtained by the electrical tester 50 through the industrial computer 40, so as to record the elastic force value and the point address information at the same time and correspond them one by one, and read the detection results of multiple probes 62 after the detection is completed.

[0049] Correspondingly, the present application embodiment also provides an electrical test station, please refer to Figure 1 , including an industrial computer 40, an electric tester 50, an adapter board 30, a wiring harness connector 60 and a probe detection device in any of the aforementioned embodiments, the electric tester 50 is connected to the industrial computer 40, the adapter board 30 is connected to the electric tester 50, the wiring harness connector 60 is connected to the adapter board 30, the wiring harness connector 60 includes a probe 62, and the probe detection device is connected to the electric tester 50.

[0050] When the electrical test bench of the above embodiment detects the wiring harness, the wiring harness is connected to the wiring harness connector 60, and the wiring harness connector 60 is connected to the adapter plate 30, so that the electrical tester 50 can be connected to the wiring harness connector 60, and then the electrical tester 50 can judge the hole positions in the wiring harness corresponding to the probes 62 one by one and distinguish each hole position according to the detection address of the probes 62, and the industrial computer 40 connected to the electrical tester 50 is used to run the test program to detect the wiring harness and display the detection results; and after the electrical tester 50 is connected to the probe detection device and detects the probes 62, the wiring harness connector 60 is connected to the adapter plate 30, so that the electrical tester 50 can be connected to the wiring harness connector 60, the electrical tester 50 is used to identify the point address of the probe 62 being detected by the test pen 10, and the industrial computer 40 connected to the electrical tester 50 is used to display and record the point address of the probe 62 identified by the electrical tester 50. In this embodiment, the elasticity of the probe 62 of the electric test station can be detected, thereby ensuring the accuracy of the test result of the electric test station. At the same time, the probe detection device has fewer devices, and some of the devices required in the detection process are devices that the electric test station itself has. The structure of the probe detection device is simplified as much as possible while ensuring that the probe detection device can obtain an accurate value of the elastic force of the probe 62.

[0051] In some embodiments, see Figure 5 , Figure 5 A structural schematic diagram of an electrical tester 50 of an electrical test bench provided in an embodiment of the present application, the electrical tester 50 includes a third interface 51, a fourth interface 52 and a fifth interface 53, the third interface 51 is connected to the industrial computer 40, the fourth interface 52 is connected to the test pen 10, and the fifth interface 53 is connected to the adapter board 30.

[0052] Furthermore, the third interface 51 includes a third input terminal and a third output terminal, wherein the third input terminal is used to receive the point address information of the probe 62 being detected by the test pen 10 from the processor of the electrical tester 50, and the third output terminal is used to output the point address information of the probe 62 being detected by the test pen 10 to the industrial computer 40, so that the industrial computer 40 can display and record the point address information of the probe 62 being detected by the test pen 10, wherein the third interface 51 can be an Ethernet port; the fourth interface 52 includes a fourth receiving terminal and a fourth output terminal, the fourth input terminal is used to receive the signal from the test pen 10, and the fourth output terminal outputs the signal from the test pen 10 to the processor of the electrical tester 50, so as to identify the point address information of the probe 62 being detected by the test pen 10; the fifth interface 53 includes a fifth input terminal and a fifth output terminal, the fifth input terminal is used to receive the signal from the detected probe 62, and the fifth output terminal is used to output the signal from the detected probe 62 to the processor, so that the processor can identify the point address of the probe 62 being detected.

[0053] In the above embodiment, when testing the probe 62, the electric tester 50 is connected to the test pen 10 and the adapter board 30 at the same time to identify the point address of the probe 62 being tested. At the same time, the electric tester 50 is connected to the industrial computer 40 to display and record the identified point address information for the convenience of the tester to read, or send the point address information to the memory 80 so that the memory 80 can correspond the point address information with the elastic force value and record it.

[0054] In some embodiments, see Figure 4 , Figure 4 This is a structural schematic diagram of an industrial computer 40 of an electrical test station provided in an embodiment of the present application. The industrial computer 40 includes a sixth interface 41 and a second panel 42. The sixth interface 41 is connected to the electrical tester 50, and the second panel 42 is configured to display data.

[0055] Furthermore, the sixth interface 41 includes a sixth input terminal and a sixth output terminal. The sixth input terminal is used to input the point address information identified by the electrical measuring instrument 50, and the sixth output terminal is used to output the point address information identified by the electrical measuring instrument 50 to the processor of the industrial computer 40 for recording, and the processor sends the point address information to the second panel 42 for display.

[0056] In the above embodiment, when testing the probe 62, the industrial computer 40 records the elastic force value of the probe 62 tested by the test pen 10 for easy reference after the test is completed. At the same time, the industrial computer 40 can display the point address information of the probe 62 being tested by the test pen 10 on the second panel 42 for easy reading by the tester.

[0057] In some embodiments, see Figure 7 , Figure 7 The present invention provides a schematic structural diagram of an adapter plate 30 of an electrical test bench, wherein the adapter plate 30 includes a seventh interface 31 and an eighth interface 32 . The seventh interface 31 is connected to the electrical tester 50 , and the eighth interface 32 is connected to the wire 63 bundle connector 60 .

[0058] Furthermore, the seventh interface 31 includes a seventh input terminal and a seventh output terminal, the seventh input terminal is used to receive the signal from the eighth interface 32, and the seventh output terminal is used to output the signal from the eighth interface 32 to the electrical measuring instrument 50; the eighth interface 32 includes an eighth input terminal and an eighth output terminal, the eighth input terminal is used to receive the signal from the probe 62, and the eighth output terminal is used to output the signal from the probe 62 to the seventh input terminal.

[0059] In the above embodiment, the adapter plate 30 is provided so that the electric tester 50 can be connected to a plurality of harness connectors 60 at the same time, so as to aggregate the signals from the plurality of harness connectors 60 .

[0060] In some embodiments, see Figure 6 , Figure 6 A schematic diagram of the structure of a wiring harness connector 60 for an electrical test bench provided in an embodiment of the present application, wherein the wiring harness connector 60 includes a connector body 61, a probe 62 and a wiring 63, wherein the connector body 61 has a limiting groove 611, the probe 62 is connected to the connector body 61, the probe 62 is disposed in the limiting groove 611, one end of the wiring 63 is connected to the probe 62, and the other end of the wiring 63 is connected to the adapter plate 30.

[0061] Furthermore, the cable connected to the probe 62 has two ends, one end of the cable is used to receive the signal from the probe 62 , and the other end of the cable is used to output the signal from the probe 62 to the adapter board 30 .

[0062] In the above embodiment, the limiting groove 611 is used to limit the plug of the wiring harness, the wiring harness connector 60 and the plug can be snap-connected, plug-in, etc., and the probe 62 is used to insert into the terminal in the plug to contact and receive the signal from the terminal, and then detect the terminal.

[0063] In some embodiments, see Figure 7 , Figure 7 The schematic diagram of the structure of an electrical test bench provided in an embodiment of the present application, wherein the electrical test bench further comprises a bracket 70, the bracket 70 comprises a frame 73, a first plate 71 and a second plate 72, the first plate 71 and the second plate 72 are arranged along a first direction X, wherein the first direction X is Figure 7In the direction indicated by the X-axis arrow, the first plate 71 and the second plate 72 are connected to the frame 73 ; the industrial computer 40 , the electric tester 50 and the adapter plate 30 are connected to the first plate 71 , and the wiring harness connector 60 is connected to the second plate 72 .

[0064] Furthermore, the first direction X is a height direction, that is, the first plate member 71 is located below the second plate member 72 .

[0065] In the above embodiment, the industrial computer 40, the electric tester 50, the adapter board 30 and the harness connector 60 are placed on the first plate 71 and the second plate 72 to reduce the floor space of the electrical test bench. At the same time, whether it is to detect the harness or the probe 62, the harness connector 60 that needs to be frequently operated by the inspector is located on the second plate 72 with a higher height, while the equipment that does not need to be frequently operated by the inspector, such as the industrial computer 40, the electric tester 50 and the adapter board 30, is located on the second plate 72 with a lower height, so as to facilitate the inspection personnel to operate.

[0066] In some embodiments, please refer again to Figure 7 The bracket 70 further includes a plurality of rollers 74 , which are connected to the frame 73 , and are located on a side of the first plate 71 away from the second plate 72 along the first direction X.

[0067] In the above embodiment, the rollers 74 are provided to facilitate the movement of the electrical testing platform, so that the use of the electrical testing platform is more flexible.

[0068] The probe detection device and the electrical testing station provided in the embodiments of the present application are introduced in detail above, and the principles and implementation methods of the present application are explained by using specific examples. The description of the above embodiments is only used to help understand the technical solution and its core idea of ​​the present application; ordinary technicians in this field should understand that: they can still modify the technical solutions recorded in the aforementioned embodiments, or replace some of the technical features therein with equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A probe detection device, characterized in that: A probe (62) for detecting an electrical test bench, the electrical test bench comprising: Industrial computer (40); An electrical tester (50), the electrical tester (50) being connected to the industrial computer (40); An adapter plate (30), the adapter plate (30) being connected to the electrical measuring instrument (50); A wiring harness connector (60), the wiring harness connector (60) being connected to the adapter plate (30), the wiring harness connector (60) comprising the probe (62); The probe detection device comprises: A test pen (10), the test pen (10) being connected to the electrical tester (50), and the test pen (10) being used to contact the probe (62) to detect the probe (62); A meter (20), the meter (20) comprising a first interface (21), the first interface (21) being connected to the test pen (10).

2. The probe detection device according to claim 1, characterized in that: The test pen (10) comprises: A pen body (11), the pen body (11) comprising two oppositely arranged ends; An elastic force sensor (14), the elastic force sensor (14) being connected to one end of the pen body (11); A pen tip (12), the pen tip (12) being connected to the elastic force sensor (14); A data line (13), the data line (13) being connected to the other end of the pen body (11); Wherein, the test pen (10) and the meter (20) are connected via the data line (13).

3. The probe detection device according to claim 2, characterized in that: The data line (13) comprises: a first data line (131), one end of the first data line (131) being connected to the elastic force sensor (14), and the other end of the first data line (131) being connected to the meter (20); A second data line (132), one end of the second data line (132) is connected to the pen tip (12), and the other end of the first data line (131) is connected to the electrical tester (50); Wherein, the first data line (131) and the second data line (132) are both passed through the pen body (11).

4. The probe detection device according to claim 1, characterized in that: The instrument (20) further comprises: A second interface (22), the second interface (22) being configured as an external memory (80); a first panel (23), the first panel (23) being configured to display data; Wherein, the first interface (21) and the second interface (22) are respectively connected to the panel (23).

5. An electrical test bench, characterized in that: include: Industrial computer (40); An electrical tester (50), the electrical tester (50) being connected to the industrial computer (40); An adapter plate (30), the adapter plate (30) being connected to the electrical measuring instrument (50); A wiring harness connector (60), the wiring harness connector (60) being connected to the adapter plate (30), the wiring harness connector (60) comprising the probe (62); The probe detection device according to any one of claims 1 to 4, wherein the probe detection device is connected to the electrical tester (50).

6. The electrical test bench according to claim 5, characterized in that: The electrical tester (50) comprises: A third interface (51), the third interface (51) being connected to the industrial computer (40); A fourth interface (52), the fourth interface (52) being connected to the test pen (10); A fifth interface (53), the fifth interface (53) being connected to the adapter board (30).

7. The electrical test bench according to claim 5, characterized in that: The industrial computer (40) comprises: A sixth interface (41), the sixth interface (41) being connected to the electrical measuring instrument (50); A second panel (42), the second panel (42) is configured to display data.

8. The electrical test bench according to claim 5, characterized in that: The adapter plate (30) comprises: A seventh interface (31), the seventh interface (31) being connected to the electrical measuring instrument (50); An eighth interface (32), the eighth interface (32) being connected to the wiring harness connector (60).

9. The electrical test bench according to claim 5, characterized in that: The wiring harness connector (60) comprises: A connector body (61), wherein the connector body (61) has a limiting groove (611); A probe (62), the probe (62) being connected to the connector body (61), and the probe (62) being arranged in the limiting groove (611); A wiring (63), one end of the wiring (63) is connected to the probe (62), and the other end of the wiring (63) is connected to the adapter board (30).

10. The electrical test bench according to claim 5, characterized in that: The electrical testing platform also includes a bracket (70), the bracket (70) includes a frame (73), a first plate (71) and a second plate (72), the first plate (71) and the second plate (72) are arranged along a first direction (X), the first plate (71) and the second plate (72) are connected to the frame (73); the industrial computer (40), the electrical testing instrument (50) and the adapter plate (30) are connected to the first plate (71), and the wiring harness connector (60) is connected to the second plate (72).

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