Pin-like chip test probe cleaning piece structure

Abstract

The utility model discloses a pin-like chip test probe cleaning piece structure, which belongs to the technical field of probe cleaning pieces and comprises a supporting base, four cleaning pieces are arranged at the top of the supporting base, pressing assemblies are arranged at the tops of the cleaning pieces, connecting assemblies are arranged in the cleaning pieces, and connecting rods are pushed, so that sleeve blocks are driven to move in the moving process. When an extrusion block on the top makes contact with a notch, the extrusion block is clamped into the notch, so that a ball is synchronously clamped into a connecting hole, a supporting base and a cleaning piece are fixedly connected through a connecting block, and a telescopic spring is extruded in the moving process of a connecting rod; when a pressing rod is pressed to make a pressing block make contact with an extrusion block, the extrusion block is extruded to make the extrusion block disengage from a notch, a telescopic spring stretches out to make a connecting rod move out of a through hole, the two connecting layers can be conveniently cleaned through the specially-formed notch and the formed notch, the two connecting layers are conveniently connected and detached, and the loss cost is reduced.

Description

Technical Field

[0001] The utility model relates to the technical field of probe cleaning sheets, and more specifically to a pin-type chip testing probe cleaning sheet structure. Background Art

[0002] A chip test probe is a tool used for chip testing. It can contact the circuit pins on the chip surface and transmit the test signal to the chip. It then judges whether the performance and function of the chip circuit are normal based on the chip's response. A probe cleaning sheet is a special cleaning sheet used to clean the probe, usually composed of a release layer or composite material, an adhesive layer, a substrate and a cleaning layer.

[0003] The test probe cleaning sheet mainly cleans the dirt by touching the cleaning material layer to the test probe. If the test probe is not touched, the cleaning sheet will not work. Therefore, a special cleaning material layer needs to be designed for special structures for cleaning.

[0004] Although the special cleaning material layer is convenient for cleaning, in actual use, the connection between the base layer and the cleaning material layer is inconvenient for installation and disassembly. When one layer is damaged, both layers need to be replaced at the same time, which increases the loss cost. Utility Model Content

[0005] In view of the deficiencies in the prior art, the utility model provides a pin-type chip test probe cleaning sheet structure to solve the above-mentioned problems.

[0006] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a pin-type chip test probe cleaning sheet structure, including a supporting base, four cleaning sheets are provided on the top of the supporting base, and the four cleaning sheets are symmetrically distributed. Four notches are opened on the top of the supporting base, and the four notches are symmetrically distributed. Grooves are opened at the four corners of the supporting base and the cleaning sheet, and the grooves are arranged in a C-shaped structure. A pressing component is provided on the top of the cleaning sheet, and a connecting component is provided inside the cleaning sheet.

[0007] Preferably, the pressing assembly includes a first pressing rod and a pressing block, the top of the cleaning sheet is rotatably connected to the first pressing rod, the bottom of the first pressing rod is fixedly connected to the pressing block, the pressing block is arranged in a triangular structure, and a rectangular groove is opened on the top of the cleaning sheet.

[0008] Preferably, a through hole is formed on the outer surface of the cleaning sheet, a connecting rod is movably connected inside the through hole, a sleeve block is sleeved on the outer surface of the connecting rod, and the sleeve block is slidably connected to the inside of the cleaning sheet.

[0009] Preferably, the connecting assembly comprises an extrusion block and a second pressure rod, the top of the sleeve block is rotatably connected to the second pressure rod, the top of the second pressure rod is fixedly connected to the extrusion block, and the extrusion block is movably engaged with the rectangular groove.

[0010] Preferably, one end of the connecting rod is fixedly connected to a sphere, the outer surface of the connecting rod is sleeved with a telescopic spring, and the telescopic spring is snap-connected to the sphere.

[0011] Preferably, a connecting block is fixedly connected to the outer surface of the supporting base and the cleaning sheet, a connecting hole is provided inside the connecting block, and the connecting hole is movably engaged with the sphere.

[0012] Compared with the prior art, the utility model provides a pin-type chip test probe cleaning sheet structure, which has the following beneficial effects:

[0013] 1. This type of pin-type chip test probe cleaning sheet structure pushes the connecting rod through the cooperation of the pressing component and the connecting component, so that the sleeve block is driven to move during the movement. When the extrusion block on the top contacts the notch, it is snapped into the notch, so that the sphere is synchronously snapped into the connecting hole, and the support base and the cleaning sheet are fixedly connected through the connecting block. The telescopic spring is squeezed during the movement of the connecting rod. When it needs to be disassembled, the pressing rod is pressed so that the pressing block contacts the extrusion block and the extrusion block is squeezed out of the notch. The telescopic spring stretches to move the connecting rod out of the through hole. The specially designed notches and the opened notches are convenient for cleaning, and the two connecting layers are convenient for connection and disassembly, reducing loss costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 It is a schematic diagram of the structure of the utility model;

[0015] Figure 2 For this utility model Figure 1 A magnified view of the structure at center;

[0016] Figure 3 This is a schematic diagram of the internal structure of the connecting rod of the utility model;

[0017] Figure 4 For this utility model Figure 3 A magnified view of the structure at location B;

[0018] Figure 5 It is a schematic diagram of the local structure of the connecting rod of the utility model.

[0019] In the figure: 1, support base; 2, cleaning sheet; 3, notch; 4, first pressure rod; 5, connecting block; 6, pressure block; 7, rectangular groove; 8, extrusion block; 9, connecting rod; 10, telescopic spring; 11, sleeve block; 12, sphere; 13, connecting hole; 14, groove; 15, second pressure rod. DETAILED DESCRIPTION

[0020] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0021] See also Figure 1-5 , the utility model provides a technical solution:

[0022] A pin-type chip test probe cleaning sheet structure includes a supporting base 1, four cleaning sheets 2 are arranged on the top of the supporting base 1, and the four cleaning sheets 2 are symmetrically distributed. Four grooves 14 are opened on the top of the supporting base 1, and the four grooves 14 are symmetrically distributed. Slots 3 are opened at the four corners of the supporting base 1 and the cleaning sheet 2, and the slot 3 is arranged in a C-shaped structure. A pressing component is provided on the top of the cleaning sheet 2, and a connecting component is provided inside the cleaning sheet 2. Disassembly can be completed by the pressing component, and connection can be completed by the connecting component. The specially arranged notches 3 and the opened grooves 14 are convenient for cleaning.

[0023] Furthermore, the pressing assembly includes a first pressing rod 4 and a pressing block 6. The first pressing rod 4 is rotatably connected to the top of the cleaning sheet 2, and the pressing block 6 is fixedly connected to the bottom of the first pressing rod 4. The pressing block 6 is arranged in a triangular structure, and a rectangular groove 7 is opened on the top of the cleaning sheet 2. Pressing the first pressing rod 4 causes the pressing block 6 to squeeze the extrusion block 8 when it contacts the extrusion block 8.

[0024] Furthermore, a through hole is provided on the outer surface of the cleaning sheet 2, and a connecting rod 9 is movably connected inside the through hole. A sleeve block 11 is sleeved on the outer surface of the connecting rod 9. The sleeve block 11 is slidably connected to the inside of the cleaning sheet 2, pushing the connecting rod 9 so that the sleeve block 11 drives the second pressure rod 15 to move during the movement.

[0025] Furthermore, the connecting component includes an extrusion block 8 and a second pressure rod 15. The top of the sleeve block 11 is rotatably connected to the second pressure rod 15, and the top of the second pressure rod 15 is fixedly connected to the extrusion block 8. The extrusion block 8 is movably connected to the rectangular groove 7. When the first pressure rod 4 is pressed so that the pressure block 6 contacts the extrusion block 8, the extrusion block 8 is squeezed so that the extrusion block 8 is disengaged from the rectangular groove 7, and the telescopic spring 10 is stretched so that the connecting rod 9 is moved out of the through hole.

[0026] Furthermore, one end of the connecting rod 9 is fixedly connected to a sphere 12 , and a telescopic spring 10 is sleeved on the outer surface of the connecting rod 9 . The telescopic spring 10 is snap-fitted to the sphere 12 , so that the sphere 12 is snap-fitted into the connecting hole 13 synchronously.

[0027] Furthermore, the outer surfaces of the support base 1 and the cleaning sheet 2 are fixedly connected with a connecting block 5, and a connecting hole 13 is opened inside the connecting block 5. The connecting hole 13 is movably connected to the sphere 12, and the support base 1 and the cleaning sheet 2 are fixedly connected through the connecting block 5.

[0028] Working principle: When the staff needs to use this type of pin-type chip test probe cleaning sheet structure, the connecting rod 9 is inserted into the through hole to push the connecting rod 9, so that the sleeve block 11 drives the second pressure rod 15 to move during the movement, and when the extrusion block 8 on the top of the second pressure rod 15 contacts the rectangular groove 7, it is snapped into the rectangular groove 7, so that the ball 12 is synchronously snapped into the connecting hole 13, and the support base 1 and the cleaning sheet 2 are fixedly connected through the connecting block 5. The telescopic spring 10 is squeezed during the movement of the connecting rod 9. When it needs to be disassembled, the first pressure rod 4 is pressed so that the pressure block 6 contacts the extrusion block 8 and squeezes the extrusion block 8 so that the extrusion block 8 is detached from the rectangular groove 7. The telescopic spring 10 stretches to move the connecting rod 9 out of the through hole. The specially designed notch 3 and the opened groove 14 facilitate its cleaning.

[0029] The above shows and describes the basic principle, main features and advantages of the utility model. Those skilled in the art should understand that the utility model is not limited by the above embodiments. The above embodiments and descriptions are only preferred examples of the utility model and are not used to limit the utility model. Without departing from the spirit and scope of the utility model, the utility model may have various changes and improvements, which fall within the scope of the utility model to be protected. The scope of protection of the utility model is defined by the attached claims and their equivalents.

Claims

1. A pin-type chip test probe cleaning sheet structure, comprising a support base (1), characterized in that: Four cleaning sheets (2) are arranged on the top of the support base (1), and the four cleaning sheets (2) are arranged symmetrically with each other. Four grooves (14) are opened on the top of the support base (1), and the four grooves (14) are arranged symmetrically with each other. Notches (3) are opened at the four corners of the support base (1) and the cleaning sheets (2), and the notches (3) are arranged in a C-shaped structure. A pressing component is arranged on the top of the cleaning sheet (2), and a connecting component is arranged inside the cleaning sheet (2).

2. The pin-type chip test probe cleaning sheet structure according to claim 1, characterized in that: The pressing assembly comprises a first pressing rod (4) and a pressing block (6); the top of the cleaning sheet (2) is rotatably connected to the first pressing rod (4); the bottom of the first pressing rod (4) is fixedly connected to the pressing block (6); the pressing block (6) is arranged in a triangular structure; and a rectangular groove (7) is provided on the top of the cleaning sheet (2).

3. The pin-type chip test probe cleaning sheet structure according to claim 2, characterized in that: The outer surface of the cleaning sheet (2) is provided with a through hole, the interior of the through hole is movably connected to a connecting rod (9), the outer surface of the connecting rod (9) is sleeved with a sleeve block (11), and the sleeve block (11) is slidably connected to the interior of the cleaning sheet (2).

4. The pin-type chip test probe cleaning sheet structure according to claim 3, characterized in that: The connecting assembly comprises an extrusion block (8) and a second pressure rod (15); the top of the sleeve block (11) is rotatably connected to the second pressure rod (15); the top of the second pressure rod (15) is fixedly connected to the extrusion block (8); and the extrusion block (8) is movably engaged with the rectangular groove (7).

5. The pin-type chip test probe cleaning sheet structure according to claim 3, characterized in that: One end of the connecting rod (9) is fixedly connected to a spherical body (12), an outer surface of the connecting rod (9) is sleeved with a telescopic spring (10), and the telescopic spring (10) is clamped to the spherical body (12).

6. The pin-type chip test probe cleaning sheet structure according to claim 5, characterized in that: A connecting block (5) is fixedly connected to the outer surfaces of the support base (1) and the cleaning sheet (2); a connecting hole (13) is provided inside the connecting block (5); and the connecting hole (13) is movably engaged with the sphere (12).

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