Test sorting machine for isolating chip module

Abstract

The utility model belongs to the technical field of isolation chip module testing devices, and particularly relates to an isolation chip module testing and sorting machine which comprises a testing bin, an upper cover is installed on the top of the testing bin, a feeding channel is fixedly connected to the top of the upper cover, a channel is fixedly connected to the bottom of the upper cover, and a feeding plate is fixedly connected to the inner wall of the testing bin. A sliding channel is fixedly connected to the top of the feeding plate, two springs are fixedly connected to the inner wall of the left side of the sliding channel, sliding blocks are fixedly connected to the other ends of the two springs, a limiting groove is formed in the bottom of the inner wall of the sliding channel, and limiting blocks are fixedly connected to the bottoms of the sliding blocks and located in the limiting groove; a rectangular groove is formed in the bottom of the inner wall of the sliding channel, a sorting plate is fixedly connected to the inner wall of the testing bin, a motor is fixedly connected to the bottom of the sorting plate, a rotating disc is fixedly connected to the output end of the motor, the rotating disc is located in the sorting plate, a plurality of guide grooves are formed in the edge of the rotating disc, and a push plate is fixedly connected to the top of the rotating disc; the number of the push plates is multiple. The chip module testing and sorting device can prevent the chip modules from being damaged, ensures the qualified rate of products, and can quickly and stably test and sort each chip module.

Description

Technical Field

[0001] The utility model belongs to the technical field of isolation chip module testing devices, in particular to a testing and sorting machine for isolation chip modules. Background Art

[0002] LED testing and sorting machines are commonly used LED production equipment, used for testing and sorting after product processing, such as testing the light emission and sorting according to the brightness of the light emission. Chip module testing and sorting machines are usually equipped with a multi-station rotary unit and a feeding unit. The rotation of the multi-station rotary unit realizes the alternating work of loading, testing and unloading, and the feeding unit realizes the transportation and output of materials.

[0003] The feeding structure is a relatively important part in the LED testing and sorting device. The feeding structure usually uses vacuum suction to transfer chip modules. Due to the small size of the chip module, it is easy for the suction port to not completely correspond to the chip module during suction, resulting in the chip module falling during the transmission process. The fallen chip module is very likely to be damaged, thereby reducing the product qualification rate. Summary of the invention

[0004] The purpose of the utility model is to provide a test sorting machine for isolating chip modules, which can safely and conveniently transport LEDs to a testing position for testing, prevent LED damage, ensure the qualified rate of products, and can quickly and stably test and sort each chip module.

[0005] To achieve the above-mentioned purpose, the technical solution adopted by the utility model is as follows: a test sorting machine for isolating chip modules is provided, including a test bin, an upper cover is installed on the top of the test bin, a feed channel is fixedly connected to the top of the upper cover, a connecting channel is fixedly connected to the bottom of the upper cover, a feed plate is fixedly connected to the inner wall of the test bin, a sliding channel is fixedly connected to the top of the feed plate, a spring is fixedly connected to the left inner wall of the sliding channel, and there are two springs, and the other ends of the two springs are fixedly connected to a slider, a limiting groove is provided at the bottom of the inner wall of the sliding channel, a limiting block is fixedly connected to the bottom of the slider, the limiting block is located inside the limiting groove, a rectangular groove is provided at the bottom of the inner wall of the sliding channel, a sorting plate is fixedly connected to the inner wall of the test bin, a motor is fixedly connected to the bottom of the sorting plate, a turntable is fixedly connected to the output end of the motor, the turntable is located inside the sorting plate, a guide groove is provided on the edge of the turntable, and there are multiple guide grooves, a push plate is fixedly connected to the top of the turntable, and there are multiple push plates.

[0006] Optionally, a second outlet is provided at the bottom of the sorting plate, a first outlet is provided at the bottom of the sorting plate, a fixed plate is fixedly connected to the bottom of the sorting plate, and there are two fixed plates, the inner walls of the two fixed plates are movably connected with electric push rods, the inner wall of the first outlet is movably connected with a flap, the bottom of the flap is fixedly connected with a linkage plate, and there are two linkage plates, and the other end of the electric push rod is movably connected to the inner walls of the two linkage plates.

[0007] Optionally, a bracket is fixedly connected to the inner wall of the test chamber, and a detector is fixedly connected to the bottom of the bracket.

[0008] Optionally, a second slide plate is fixedly connected to an inner wall of the test chamber, and the second slide plate is located directly below the second outlet, and a second storage plate is fixedly connected to an outer wall of the test chamber.

[0009] Optionally, a first slide plate is fixedly connected to an inner wall of the test chamber, and the first slide plate is located directly below the first outlet, and a first storage plate is fixedly connected to an outer wall of the test chamber.

[0010] Optionally, the feed plate is located on the left side of the test bin, the feed plate is located above the sorting plate, and the upper cover is connected to the test bin by bolts.

[0011] Compared with the prior art, the utility model has the following beneficial effects:

[0012] 1. In the initial state of the utility model, the slider is located directly below the connecting channel. The chip modules are put in from the feed channel in sequence. The chip modules will be stacked above the slider. The motor works, and the output end of the motor drives the turntable to rotate counterclockwise. The multiple push plates connected to the top of the turntable rotate accordingly. The push plates contact the limit blocks during the counterclockwise rotation of the turntable and squeeze the limit blocks. In this process, the two springs are in a compressed state, and the slider moves backward. The bottom chip module falls into the sliding channel. When the push plate is separated from the limit block, the two springs rebound to return the slider to its original position, and push the chip module in the sliding channel into the rectangular groove, and then fall into the guide groove opened on the edge of the turntable. The turntable repeats the above rotation with the motor, and the chip module in the guide groove can be brought to the bottom of the detector. The utility model can safely and conveniently transport the chip module to the detection position for detection, prevent the chip module from being damaged, ensure the qualified rate of the product, and can quickly and stably test and sort each chip module.

[0013] 2. The bottom of the sorting plate of the utility model is connected to two fixed plates, and the inner wall of the fixed plate is movably connected to an electric push rod. When the detector detects that the chip module below is unqualified, the electric push rod contracts, driving the two linkage plates to flip downward, so that the flip plate is opened, and the unqualified chip module passes through the outer wall of the test bin along the first slide plate and enters the first storage plate, while the qualified chip module will rotate to the second exit with the turntable, and then pass through the outer wall of the test bin along the second slide plate to enter the second storage plate, so that the sorting operation can be carried out conveniently and quickly. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.

[0015] Figure 1 This is a schematic diagram of the main three-dimensional structure of the utility model;

[0016] Figure 2 This is a schematic diagram of the internal three-dimensional structure of the test chamber of the utility model;

[0017] Figure 3 This is a schematic diagram of the internal three-dimensional structure of the sliding channel of the utility model;

[0018] Figure 4 It is a three-dimensional structural schematic diagram of the sorting plate of the utility model;

[0019] Figure 5 For this utility model Figure 4 A schematic diagram of the enlarged structure at A in the middle;

[0020] Figure 6 It is a three-dimensional structural schematic diagram of the upper cover of the utility model;

[0021] Figure 7 It is a partial cross-sectional three-dimensional structural schematic diagram of the utility model;

[0022] Figure 8 For this utility model Figure 7 Schematic diagram of the enlarged structure at point B in the middle.

[0023] In the figure: 1. test chamber; 2. upper cover; 3. feed channel; 4. connecting channel; 5. feed plate; 6. sliding channel; 7. spring; 8. slider; 9. limit groove; 10. limit block; 11. rectangular groove; 12. sorting plate; 13. motor; 14. turntable; 15. guide groove; 16. push plate; 17. second outlet; 18. first outlet; 19. fixed plate; 20. electric push rod; 21. flap; 22. linkage plate; 23. bracket; 24. detector; 25. second slide plate; 26. second storage plate; 27. first slide plate; 28. first storage plate; 29. ​​bolt. DETAILED DESCRIPTION

[0024] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention.

[0025] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.

[0026] It should be understood that the terms "length", "width", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", etc., indicating the orientation or position relationship, are based on the orientation or position relationship shown in the drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0027] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present utility model, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0028] Reference Figure 1-8, a test sorting machine for isolating chip modules provided by an embodiment of the utility model is now described. A test sorting machine for isolating chip modules comprises a test chamber 1, a top cover 2 is installed on the top of the test chamber 1, a feed channel 3 is fixedly connected to the top of the top cover 2, a connecting channel 4 is fixedly connected to the bottom of the top cover 2, a feed plate 5 is fixedly connected to the inner wall of the test chamber 1, a sliding channel 6 is fixedly connected to the top of the feed plate 5, a spring 7 is fixedly connected to the left inner wall of the sliding channel 6, and there are two springs 7, the other ends of the two springs 7 are fixedly connected to a slider 8, a limiting groove 9 is provided at the bottom of the inner wall of the sliding channel 6, a limiting block 10 is fixedly connected to the bottom of the slider 8, the limiting block 10 is located inside the limiting groove 9, and the sliding channel 6 is fixedly connected to the bottom of the inner wall of the sliding channel 6. A rectangular groove 11 is provided at the bottom of the inner wall, a sorting plate 12 is fixedly connected to the inner wall of the test chamber 1, a motor 13 is fixedly connected to the bottom of the sorting plate 12, a turntable 14 is fixedly connected to the output end of the motor 13, the turntable 14 is located inside the sorting plate 12, a guide groove 15 is provided on the edge of the turntable 14, and there are multiple guide grooves 15, a push plate 16 is fixedly connected to the top of the turntable 14, and there are multiple push plates 16. In the initial state, the slider 8 is located directly below the connecting channel 4, and the chip modules are put in one by one from the feed channel 3. The chip modules will be stacked above the slider 8, and the motor 13 is connected to the bottom of the sorting plate 12. The motor 13 works, and the output end of the motor 13 drives the turntable 14 to rotate counterclockwise, and the multiple push plates 16 connected to the top of the turntable 14 rotate accordingly. During the process of the push plate 16 rotating counterclockwise with the turntable 14, the push plate 16 contacts the limit block 10 and squeezes the limit block 10. In this process, the two springs 7 are in a compressed state, and the slider 8 moves backward, and the lowermost chip module falls into the sliding channel 6. When the push plate 16 is separated from the limit block 10, the two springs 7 rebound, so that the slider 8 returns to its position, and pushes the chip module in the sliding channel 6 into the rectangular groove 11, and then falls into the guide groove 15 opened on the edge of the turntable 14. The turntable 14 repeats the above rotation with the motor 13, and the chip module in the guide groove 15 can be brought to the bottom of the detector 24.

[0029] In another embodiment of the present invention, please refer to Figure 4 and Figure 5, a second outlet 17 is provided at the bottom of the sorting plate 12, a first outlet 18 is provided at the bottom of the sorting plate 12, a fixed plate 19 is fixedly connected to the bottom of the sorting plate 12, and there are two fixed plates 19, the inner walls of the two fixed plates 19 are movably connected with electric push rods 20, the inner wall of the first outlet 18 is movably connected with a flap 21, the bottom of the flap 21 is fixedly connected with a linkage plate 22, and there are two linkage plates 22, and the other end of the electric push rod 20 is movably connected to the inner walls of the two linkage plates 22. When the detector 24 detects that the chip module below is unqualified, the electric push rod 20 contracts, driving the two linkage plates 22 to reverse downward, so that the flap 21 opens, and the unqualified chip module passes through the outer wall of the test chamber 1 along the first slide 27 and enters the first storage plate 28, while the qualified chip module will rotate with the turntable 14 to the second outlet 17, and then pass through the outer wall of the test chamber 1 along the second slide 25 and enter the second storage plate 26.

[0030] In another embodiment of the present invention, please refer to Figure 2 A bracket 23 is fixedly connected to the inner wall of the test chamber 1 , and a detector 24 is fixedly connected to the bottom of the bracket 23 .

[0031] In another embodiment of the present invention, please refer to Figure 2 A second slide 25 is fixedly connected to the inner wall of the test chamber 1, and the second slide 25 is located directly below the second outlet 17. A second storage plate 26 is fixedly connected to the outer wall of the test chamber 1. A first slide 27 is fixedly connected to the inner wall of the test chamber 1, and the first slide 27 is located directly below the first outlet 18. A first storage plate 28 is fixedly connected to the outer wall of the test chamber 1.

[0032] In another embodiment of the present invention, please refer to Figure 3 The feed plate 5 is located on the left side of the test chamber 1 , the feed plate 5 is located above the sorting plate 12 , and the upper cover 2 is connected to the test chamber 1 by bolts 29 .

[0033] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A test sorting machine for isolating chip modules, comprising a test chamber (1), characterized in that: The top of the test chamber (1) is provided with an upper cover (2), the top of the upper cover (2) is fixedly connected to a feed channel (3), the bottom of the upper cover (2) is fixedly connected to a connection channel (4), the inner wall of the test chamber (1) is fixedly connected to a feed plate (5), the top of the feed plate (5) is fixedly connected to a sliding channel (6), the left inner wall of the sliding channel (6) is fixedly connected to a spring (7), and there are two springs (7), the other ends of the two springs (7) are fixedly connected to a slider (8), the bottom of the inner wall of the sliding channel (6) is provided with a limiting groove (9), and the bottom of the slider (8) is fixedly connected to a limiting block (10), the limit block (10) is located inside the limit groove (9), a rectangular groove (11) is provided at the bottom of the inner wall of the sliding channel (6), a sorting plate (12) is fixedly connected to the inner wall of the test chamber (1), a motor (13) is fixedly connected to the bottom of the sorting plate (12), a turntable (14) is fixedly connected to the output end of the motor (13), the turntable (14) is located inside the sorting plate (12), a guide groove (15) is provided on the edge of the turntable (14), and the number of the guide grooves (15) is multiple, and a push plate (16) is fixedly connected to the top of the turntable (14), and the number of the push plates (16) is multiple.

2. A test and sorting machine for isolating chip modules as claimed in claim 1, characterized in that: The bottom of the sorting plate (12) is provided with a second outlet (17), the bottom of the sorting plate (12) is provided with a first outlet (18), the bottom of the sorting plate (12) is fixedly connected to a fixing plate (19), and there are two fixing plates (19), the inner walls of the two fixing plates (19) are movably connected to electric push rods (20), the inner wall of the first outlet (18) is movably connected to a flap (21), the bottom of the flap (21) is fixedly connected to a linkage plate (22), and there are two linkage plates (22), and the other end of the electric push rod (20) is movably connected to the inner walls of the two linkage plates (22), respectively.

3. A test and sorting machine for isolating chip modules as claimed in claim 1, characterized in that: A bracket (23) is fixedly connected to the inner wall of the test chamber (1), and a detector (24) is fixedly connected to the bottom of the bracket (23).

4. A test sorting machine for isolating chip modules as claimed in claim 2, characterized in that: The inner wall of the test chamber (1) is fixedly connected to a second slide plate (25), the second slide plate (25) is located directly below the second outlet (17), and the outer wall of the test chamber (1) is fixedly connected to a second storage plate (26).

5. A test and sorting machine for isolating chip modules as claimed in claim 1, characterized in that: The inner wall of the test chamber (1) is fixedly connected to a first slide plate (27), the first slide plate (27) is located directly below the first outlet (18), and the outer wall of the test chamber (1) is fixedly connected to a first storage plate (28).

6. A test and sorting machine for isolating chip modules as claimed in claim 1, characterized in that: The feed plate (5) is located on the left side of the test chamber (1), the feed plate (5) is located above the sorting plate (12), and the upper cover (2) is connected to the test chamber (1) via bolts (29).

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