Power device testing device
By introducing control units and control circuits into the power device test device, the power devices to be tested are automatically connected, which solves the temperature imbalance of the thermostat and wear of the test machine caused by manual operation, and improves the consistency and efficiency of the test results.
Patent Information
- Application Number
- CN202420598846.9
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-03-26
- Publication Date
- 2024-12-31
- Estimated Expiration
- 2034-03-26
AI Technical Summary
The existing power semiconductor device testing methods require manual operation, resulting in unbalanced temperature of the thermostat, wear of the test machine plug-in, reducing the consistency of static parameters of the test sample and prolonging the experimental time.
Design a power device testing device, including a thermostat, a static test machine, a control circuit and a control unit, control the switch unit to realize the on-off of the transmission line, and automatically connect different power devices to the test seat to avoid manual operation.
It realizes automation of power device testing, improves the consistency and efficiency of test results, reduces thermostat temperature imbalance and wear of test machine plug-ins, and shortens experimental time.
Smart Images
Figure CN222280770U_ABST
Abstract
Description
Technical Field
[0001] The embodiments of the present application relate to the field of device testing technology, and in particular to a power device testing device. Background Art
[0002] Power semiconductor devices are specialized transistors for a variety of low-voltage to high-voltage applications, and are now widely used in industries such as automotive electronics, power supplies, and solar energy. In order to determine the stability of power semiconductor devices, power semiconductor devices need to undergo high-temperature static testing after they are manufactured.
[0003] In high-temperature static testing, the high-temperature static parameters of semiconductor components are usually tested by placing power semiconductor components in an incubator and then connecting them to the test socket outside the incubator with wires. This test method requires manual opening of the incubator, replacing the components in the incubator, and pulling out the test socket of the original sample on the test machine to replace the test socket corresponding to the sample to be tested when replacing the component to be tested. This will lead to problems such as unbalanced temperature in the incubator and increased wear on the plug-in part of the test machine. To a certain extent, there is a risk of reducing the consistency of the static parameters of the test samples and prolonging the experimental time.
[0004] Therefore, how to design a power device testing device that can automate the testing process and avoid problems caused by manual operation has become a technical problem that urgently needs to be solved when testing power semiconductor devices. Utility Model Content
[0005] The purpose of the embodiments of the present application is to provide a power device testing device that can automate the testing process and avoid problems caused by manual operation.
[0006] In order to solve the above technical problems, the embodiment of the present application provides a power device testing device. The power device testing device includes a temperature chamber, a static tester, a control circuit and a control unit. The temperature chamber is provided with a plurality of power device sockets, each of which is used to install a power device to be tested; the static tester is arranged adjacent to the temperature chamber, and the static tester is provided with a test socket; the control circuit includes a transmission line connected between each power device socket and the test socket, and a switch unit connected in series to each transmission line; the control unit is electrically connected to each switch unit, and the control unit controls the on and off of the switch unit to connect the corresponding power device socket and the test socket.
[0007] The power device test device provided in the embodiment of the present application uses a control unit and a control loop to control the access of different power devices to be tested, that is, different power devices to be tested can be connected to the test socket by controlling the on and off of the transmission line in the control loop. In this way, different power devices to be tested can be automatically put into the test by controlling the on and off of the test line of a single power device sample. Thus, automated testing is achieved to avoid problems caused by manual operation.
[0008] In some implementations, each power device socket is provided with a plurality of lead pins corresponding to each pin of the power device, and each lead pin is connected to a test socket via a transmission line.
[0009] In some embodiments, each switch unit includes a relay driving circuit arranged one-to-one with a power device socket, and a relay connection circuit connected in series one-to-one to each transmission line corresponding to the power device socket, and each relay connection circuit is controlled by the relay driving circuit to realize the switching of each transmission line.
[0010] In some embodiments, the temperature box is further provided with a plug-in board, and a plurality of power device sockets are provided on the plug-in board.
[0011] In some embodiments, the plug-in board is provided with routing and wire connection ports, multiple lead pins of each power device socket are connected one-to-one with the wire connection ports via routing, and one end of each transmission line is connected to the wire connection port.
[0012] In some embodiments, each transmission line is a high temperature resistant wire.
[0013] In some embodiments, the incubator is provided with a temperature sensor, and the temperature sensor is electrically connected to the control unit.
[0014] In some embodiments, the control unit includes a host computer and a slave computer, the host computer is communicatively connected with the slave computer, and the slave computer receives instructions from the host computer to control the on and off of each switch unit.
[0015] In some implementations, the power device testing apparatus further includes a control board, and the lower computer is disposed on the control board.
[0016] In some embodiments, a portion of the plurality of transmission lines and the plurality of switch units are disposed on a control board. BRIEF DESCRIPTION OF THE DRAWINGS
[0017] One or more embodiments are exemplarily described by pictures in the corresponding drawings, and these exemplified descriptions do not constitute limitations on the embodiments. Elements with the same reference numerals in the drawings represent similar elements, and unless otherwise stated, the figures in the drawings do not constitute proportional limitations.
[0018] Figure 1 It is a structural schematic diagram of a power device testing device in the prior art;
[0019] Figure 2 It is a schematic diagram of the structure of a power device testing device provided in some embodiments of the present application. DETAILED DESCRIPTION
[0020] To make the purpose, technical scheme and advantages of the embodiments of the present application clearer, each embodiment of the present application will be described in detail below in conjunction with the accompanying drawings. However, it will be appreciated by those skilled in the art that in each embodiment of the present application, many technical details are proposed in order to enable the reader to better understand the present application. However, even without these technical details and various changes and modifications based on the following embodiments, the technical scheme claimed in the present application can also be implemented. The division of the following embodiments is for the convenience of description, and the specific implementation of the present application should not constitute any limitation, and the various embodiments can be combined with each other and referenced to each other without contradiction.
[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by technicians in the technical field to which this application belongs; the terms used herein are only for the purpose of describing specific embodiments and are not intended to limit this application; the terms "including" and "having" in the specification and claims of this application and the above-mentioned figure descriptions and any variations thereof are intended to cover non-exclusive inclusions.
[0022] In the description of the embodiments of the present application, the technical terms "first", "second", etc. are only used to distinguish different objects, and cannot be understood as indicating or implying relative importance or implicitly indicating the number, specific order or primary and secondary relationship of the indicated technical features. In the description of the embodiments of the present application, the meaning of "multiple" is more than two, unless otherwise clearly and specifically defined.
[0023] In the description of the embodiments of the present application, the term "and / or" is only a description of the association relationship of the associated objects, indicating that there may be three relationships. For example, A and / or B can represent: A exists alone, A and B exist at the same time, and B exists alone. In addition, the character " / " in this article generally indicates that the associated objects before and after are in an "or" relationship.
[0024] In the description of the embodiments of the present application, unless otherwise clearly specified and limited, technical terms such as "installed", "connected", "connected" and the like should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, and it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the embodiments of the present application can be understood according to the specific circumstances.
[0025] like Figure 1 As shown, the technical solution of the power device test device in the prior art mainly includes three parts: a power device socket 100, a wire 200, and a test socket 310. During the test, the sample to be tested is installed on the power device socket 100 and then placed in the incubator 400. The test socket 310 of the test machine 300 outside the incubator 400 is connected by a wire, and the test socket 310 can be installed in the test socket jack 301 of the test machine 300. Then the temperature of the incubator 400 is set according to the conditions. After the conditions are met, a power device sample to be measured first is determined, and the test socket 310 connected to it is installed in the test socket jack 301 of the test machine 300, and then the test is carried out. After completing the test of a single sample, it is necessary to unplug the original test socket 310, and then install the test socket 310 corresponding to the next sample to be tested into the test machine 300, and repeat the operation by analogy to complete the test of all samples.
[0026] This test method requires opening the temperature chamber, replacing the components in the temperature chamber, and pulling out the test socket of the original sample on the test machine to replace the test socket corresponding to the sample to be tested when replacing the components to be tested. This will lead to problems such as temperature imbalance in the temperature chamber and increased wear of the plug-in part of the test machine. To a certain extent, there is a risk of reducing the consistency of the static parameters of the test samples and prolonging the experimental time.
[0027] Therefore, some embodiments of the present application provide a power device test device that is easy to operate and has good consistency in test results. The power device test device uses a control unit and a control loop to control the access of different power devices to be tested, that is, different power devices to be tested can be connected to the test socket by controlling the on and off of the transmission line in the control loop. In this way, different power devices to be tested can be automatically put into the test by controlling the on and off of the test line of a single power device sample. Thereby, automated testing is achieved.
[0028] Combine the following Figure 2 , describing a power device testing apparatus provided in some embodiments of the present application.
[0029] like Figure 2As shown, a power device testing device provided by some embodiments of the present application includes an incubator 11, a static tester 12, a control circuit and a control unit. The incubator 11 is provided with a plurality of power device sockets 111, each of which is used to install a power device 20 to be tested; the static tester 12 is arranged adjacent to the incubator 11, and the static tester 12 is provided with a test socket 121; the control circuit includes a transmission line 13 connected between each power device socket 111 and the test socket 121, and a switch unit 14 connected in series to each transmission line 13; the control unit is electrically connected to each switch unit 14, and the control unit controls the on and off of the switch unit 14 to connect the corresponding power device socket 111 and the test socket 121.
[0030] The incubator 11 and the static tester 12 are tools for static testing of power devices. The incubator 11 can heat the power devices inside and control the heating temperature and heating time. The static tester 12 can detect the static parameters of the power devices, so as to obtain the state parameters of the power devices at different temperatures. The power device socket 111 set in the incubator 11 can provide an installation basis for the power device to be tested. The power device to be tested can be plugged into the power device socket 111, and access to the test socket 121 on the static test can be achieved through the power device socket 111.
[0031] The transmission line 13 of the control loop is used to establish a connection between the power device socket 111 and the test socket 121, so that the test signal of the power device to be tested can be connected to the static tester 12. At the same time, the on and off of the switch unit 14 of the control loop causes the on and off of the transmission line 13, thereby controlling the connection and disconnection of the test signal of the power device to be tested to the test socket 121. The on and off of the switch unit 14 can be controlled by the control unit.
[0032] The power device test device provided in some embodiments of the present application uses a control unit and a control loop to control the access of different power devices to be tested, that is, different power devices to be tested can be connected to the test socket 121 by controlling the on and off of the transmission line 13 in the control loop. In this way, different power devices to be tested can be automatically put into the test by controlling the on and off of the test line of a single power device sample. Thus, automated testing is achieved to avoid problems caused by manual operation.
[0033] In some embodiments, each power device socket 111 is provided with a plurality of lead pins corresponding to each pin of the power device, and each lead pin is connected to the test socket 121 via a transmission line 13 .
[0034] That is to say, each pin of the power device has multiple lead-out signals. In this way, the power device can lead out multiple test transmission lines to form a Kelvin structure. By adopting the wiring method of the Kelvin structure, the power circuit and the signal circuit in the test circuit can be separated, and the test machine will avoid the interference of high-power current and voltage on low-power current and voltage. For example, when the power device sample has three pins G, D, and S, after the sample is installed in the power device socket 111, through the power device socket 111, two test transmission lines Gs and Gd can be led out at pin G, two test transmission lines Ds and Dd can be led out at pin D, and two test transmission lines Ss and Sd can be led out at pin S. In other words, one power device socket 111 will lead out six test transmission lines.
[0035] like Figure 2 As shown, each switch unit 14 may include a relay drive circuit 141 that is set one-to-one with the power device socket 111, and a relay connection circuit 142 that is one-to-one connected in series to each transmission line 13 corresponding to the power device socket 111, and each relay connection circuit 142 is controlled by the relay drive circuit 141 to realize the on and off of each transmission line 13.
[0036] That is to say, the switch unit 14 can use a relay, and the on and off of the power device test transmission line can be realized by the on and off of the relay. Each relay controls a corresponding line, and each switch unit 14 is composed of six relays. The coils of the six relays are connected in parallel to the same relay drive circuit 141. The normally open contact of the relay is connected to the test transmission circuit formed by the transmission line 13, and each switch unit 14 is connected to the six output lines in sequence one by one. The six relays control the six lines Gs, Gd, Ds, Dd, Ss, and Sd corresponding to a test socket 121 respectively, and finally output 6 lines, which are connected to the corresponding interface of the test socket 121 through high temperature resistant wires.
[0037] The use of relays makes it easy to control each circuit through a single-chip microcomputer. Because of the mechanical switch characteristics of relays, it can also prevent the control circuit from interfering with the test circuit.
[0038] In some embodiments, the temperature box 11 may also be provided with a plug-in board 112 , and a plurality of power device sockets 111 are all provided on the plug-in board 112 .
[0039] By integrating multiple power device sockets 111 onto the plug-in board 112, the space of the temperature box 11 can be used more scientifically and reasonably. Therefore, more samples can be measured under the same temperature condition, effectively reducing the time cost.
[0040] In addition, the plug-in board 112 may be provided with a wiring 1121 and a wire connection port 1122, and the multiple lead pins of each power device socket 111 are connected one-to-one with the wire connection port 1122 via the wiring 1121, and one end of each transmission line 13 is connected to the wire connection port 1122. Then, the wire passes through the reserved test hole 101 of the temperature box 11 to be connected to the test socket 121.
[0041] In actual situations, the six lead pins Gs, Gd, Ds, Dd, Ss, and Sd of each power device socket 111 on the plug-in board 112 in the temperature box 11 can be connected to the wire connection port 1122 on the plug-in board 112 in a one-to-one correspondence through the pcb (printed circuit board) wiring 1121. Then, the high-temperature resistant wire is connected to the six input ports of the control loop where the switch unit 14 is located through the reserved test hole of the temperature box 11. These six input ports will correspond to the six paths Gs, Gd, Ds, Dd, Ss, and Sd of the test socket 121 respectively.
[0042] In some embodiments, each transmission line 13 may be a high temperature resistant wire.
[0043] By using high temperature resistant wires, it can be effectively ensured that the transmission line 13 is not affected by the temperature of the temperature box 11, thereby ensuring the normal progress of the power device test process.
[0044] like Figure 2 As shown, the temperature box 11 may be provided with a temperature sensor 113, and the temperature sensor 113 is electrically connected to the control unit.
[0045] The temperature in the thermostat 11 can be detected by the temperature sensor 113 so as to send the detected temperature information to the control unit. This facilitates the control unit to control the on and off of the switch unit 14. The temperature sensor 113 is placed in the thermostat 11 and connected to the temperature acquisition unit 1131. The temperature acquisition unit 1131 is connected to the control unit.
[0046] In some embodiments, the control unit may include a host computer 15 and a slave computer 16 . The host computer 15 is in communication connection with the slave computer 16 . The slave computer 16 receives instructions from the host computer 15 to control the on and off of each switch unit 14 .
[0047] The host computer 15 can be used to facilitate control and viewing of test results, while the slave computer 16 can be integrated with the switch unit 14 to facilitate control of the switch unit 14. The host computer 15 is mainly a computer, and the slave computer 16 is mainly a single-chip microcomputer.
[0048] In addition, the power device testing device may further include a control board 17 , and the lower computer 16 is disposed on the control board 17 .
[0049] The control panel 17 can provide a basis for the installation of other components, thereby facilitating the arrangement of the test transmission circuit and the control circuit of the switch unit 14 .
[0050] like Figure 2 As shown, a portion of the plurality of transmission lines 13 and the plurality of switch units 14 may be disposed on the control board 17 .
[0051] Before testing the power device test device provided in some embodiments of the present application, all power device samples to be tested are installed on the plug-in board 112. The power device sample has three pins G, D, and S. After the sample is installed in the power device socket 111, two lines Gs and Gd are led out from the pin G of the sample, two lines Ds and Dd are led out from the pin D of the sample, and two lines Ss and Sd are led out from the pin S of the sample through the power device socket 111. One power device socket 111 will lead out six lines.
[0052] The temperature sensor 113 is placed in the temperature box 11 and connected to the temperature acquisition unit 1131 on the control board 17. The temperature acquisition unit 1131 on the control board 17 is connected to the host computer 15. Each relay on the control board 17 controls a corresponding line, and each relay control circuit is composed of six relays. The coils of the six relays are connected in parallel to the same relay drive circuit 141. The normally open contacts of the relays are connected to the main circuit. The six output ports of each group of relay control circuits are connected one by one in sequence. The six relays control the six lines of Gs, Gd, Ds, Dd, Ss, and Sd corresponding to a test socket 121, respectively, and finally output 6 lines, which are connected to the corresponding interface of the test socket 121 through high temperature resistant wires.
[0053] When testing the power device test device provided in some embodiments of the present application, the test program of the incubator 11 is first set. Configure the temperature points to be tested, such as 25°C (degrees Celsius), 50°C, 75°C, 100°C, 125°C, 150°C, and the time for which the incubator 11 needs to maintain the temperature at each experimental temperature point. The time is set according to the estimated time required for the test, such as 30 minutes. After the configuration of the heating program of the incubator 11 is completed, the resistance wire in the incubator 11 begins to heat and the temperature rises. When the temperature reaches the temperature point to be tested, the temperature acquisition unit 1131 on the control board 17 collects the temperature information through the temperature sensor 113 in the incubator 11 and feeds back to the upper computer 15. The upper computer 15 receives the temperature information, controls the lower computer 16, and closes the relay control loop of each group in turn. Each closure of a group of relay control loops will cause all 6 relays in the relay control loop to be closed, so that the corresponding six lines are turned on. At this point, the test machine can be connected to the test sample corresponding to the relay control loop. Whenever a relay control loop is closed, the host computer 15 controls the test machine to perform the test and record the experimental data, completing the test of the static parameters of the sample to be tested at the temperature point in the connected temperature box 11. The subsequent samples are tested in the same way, thereby completing the static test of all samples at the temperature point.
[0054] When the temperature box 11 reaches the set test temperature and holds the time, the temperature box 11 automatically heats up and enters the next test temperature point. The host computer 15 controls the control board 17 to repeat the above operation. The subsequent test temperature points are similarly completed to complete the test of all samples.
[0055] Those skilled in the art will appreciate that the above-mentioned embodiments are specific examples for implementing the present application, and in actual applications, various changes may be made thereto in form and detail without departing from the spirit and scope of the present application.
Claims
1. A power device testing device, characterized in that: include: A temperature box, provided with a plurality of power device sockets, each of which is used to install a power device to be tested; A static testing machine, arranged adjacent to the temperature box, the static testing machine being provided with a testing seat; A control circuit, comprising a transmission line connected between each of the power device sockets and the test socket, and a switch unit connected in series to each of the transmission lines; A control unit is electrically connected to each of the switch units, and the control unit controls the on and off of the switch units to connect the corresponding power device sockets and the test sockets.
2. The power device testing device according to claim 1, characterized in that: Each of the power device sockets is provided with a plurality of lead pins corresponding to each pin of the power device, and each of the lead pins is connected to the test socket via the transmission line.
3. The power device testing device according to claim 2, characterized in that: Each of the switch units includes a relay driving circuit that is arranged one-to-one with the power device socket, and a relay connecting circuit that is connected in series one-to-one to each of the transmission lines corresponding to the power device socket. Each of the relay connecting circuits is controlled by the relay driving circuit to realize the switching of each of the transmission lines.
4. The power device testing device according to claim 3, characterized in that: The temperature box is also provided with a plug-in board, and the plurality of power device sockets are all arranged on the plug-in board.
5. The power device testing device according to claim 4, characterized in that: The plug-in board is provided with wiring and a wire connection port, the plurality of lead pins of each power device socket are connected one-to-one with the wire connection port via the wiring, and one end of each transmission line is connected to the wire connection port.
6. The power device testing device according to claim 1, characterized in that: Each of the transmission lines is a high temperature resistant wire.
7. The power device testing device according to claim 1, characterized in that: The temperature box is provided with a temperature sensor, and the temperature sensor is electrically connected to the control unit.
8. The power device testing device according to claim 1, characterized in that: The control unit includes an upper computer and a lower computer. The upper computer is in communication connection with the lower computer. The lower computer receives instructions from the upper computer to control the on and off of each of the switch units.
9. The power device testing device according to claim 8, characterized in that: It also includes a control board, and the lower computer is arranged on the control board.
10. The power device testing device according to claim 9, characterized in that: Parts of the plurality of transmission lines and the plurality of switch units are both arranged on the control board.