This invention belongs to the field of
spectral data processing technology, specifically a
spectral data processing system and method based on in-situ data sensing and intelligent analysis. This invention employs in-situ
optical imaging,
absorption spectroscopy,
fluorescence spectroscopy, and PL mapping to acquire real-time three-dimensional
spectral data of time,
wavelength, and intensity for real-time monitoring of material
crystallization, defects, and
luminescence properties. It uses an automatic invalid value detection and cleaning
algorithm to address
data quality issues; it extracts peak position and half-peak width (WHM) characteristic parameters from the spectral data using peak position extraction and WHM
calculation methods; it uses a nonlinear optimization
algorithm to perform multi-peak
Gaussian fitting on the spectral data; and it employs a
signal-slot mechanism to achieve real-
time synchronization of data presentation and fitting analysis, forming a complete
closed loop of in-situ testing, data sensing,
processing, analysis, synchronization, and export. This invention achieves real-time acquisition, efficient processing, accurate analysis, and automatic synchronization of spectral data, providing
technical support for standardized processing and traceable analysis of spectral data.