Chip circuit testing machine

Abstract

The utility model discloses a chip circuit testing machine which comprises a base plate and a testing clamp, the outer surface of a transverse sliding rail is slidably connected with a polishing driving motor, the output shaft end of the polishing driving motor is fixedly connected with a coupler, the lower end of the coupler is fixedly connected with a drill bit rod, the lower end of the drill bit rod is a polishing head, and the lower end of the polishing head is provided with a clamping groove. The negative pressure dust collection cover is arranged on the outer side of the drill bit rod, when the grinding head grinds the surface of a chip, negative pressure air in the negative pressure dust collection cover can absorb dust generated by grinding into a dust collection groove, the dust is prevented from diffusing to contact points on the surface of the chip, and the grinding efficiency of the chip is improved. Signal transmission and electrical connection are hindered, resulting in poor test contact or signal distortion.

Description

Technical Field

[0001] The utility model belongs to the technical field related to chip circuit testing, and specifically relates to a chip circuit testing machine. Background Art

[0002] A chip circuit tester is a device specially used to test the functions and performance of integrated circuit chips. It is mainly used in various links of chip design, manufacturing and quality control. It can detect whether the performance of the chip under different electrical conditions meets the design specifications and ensure the reliability and functionality of the product.

[0003] When conducting circuit testing, it is necessary to remove the surface layer to expose the key circuit area to facilitate probe contact and test circuit performance. Existing equipment cannot collect and clean the dust removed in time. The dust spreads to the contact points on the surface of the chip, which will hinder signal transmission and electrical connection, resulting in poor test contact or signal distortion. Utility Model Content

[0004] The purpose of the utility model is to provide a chip circuit tester to solve the problems raised in the above background technology.

[0005] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a chip circuit testing machine, comprising a base plate and a test fixture, a transverse slide rail is arranged above the base plate, the outer surface of the transverse slide rail is slidably connected to a grinding drive motor, the output shaft end of the grinding drive motor is fixedly connected to a coupling, the lower end of the coupling is fixedly connected to a drill rod, the lower end of the drill rod is a grinding head, the lower end of the drill rod is also fixedly connected to an auxiliary fan blade, a negative pressure dust hood is fixedly arranged on the outer side of the drill rod, a dust collecting groove is arranged at the upper end of the negative pressure dust hood, a negative pressure fan is fixedly connected to the upper end of the dust collecting groove, and an elastic expansion zone is arranged at the lower part of the negative pressure dust hood.

[0006] Preferably, a control panel is provided in front of the base plate, Z-axis drive motors are provided on both left and right sides of the base plate, a Z-axis support rod is provided at the upper end of the Z-axis drive motor, and a transverse slide rail is slidably connected to the outer surface of the Z-axis support rod.

[0007] Preferably, the negative pressure dust collecting hood and the elastic expansion zone are both made of elastic rubber material, and the auxiliary fan blades are located inside the negative pressure dust collecting hood.

[0008] Preferably, when the drill rod is being polished, the auxiliary fan blades will rotate synchronously to form a negative pressure airflow that will flow along the center line of the drill rod into the dust collecting trough; a filter is provided between the dust collecting trough and the negative pressure fan, and a dust exhaust port for regularly discharging dust is provided on the side of the dust collecting trough.

[0009] Preferably, a test fixture for fixing the chip to be tested is fixedly provided on the upper surface of the base plate, the polishing drive motor is slidably connected to the transverse slide rail via a sliding bracket, and a transverse drive motor is provided on one side of the sliding bracket.

[0010] Compared with the prior art, the beneficial effects of the utility model are:

[0011] The utility model arranges a negative pressure dust collecting hood on the outer side of the drill bit rod. When the grinding head grinds the chip surface, the negative pressure air in the negative pressure dust collecting hood absorbs the dust generated by grinding into the dust collecting groove, thereby preventing the dust from diffusing to the contact points on the chip surface and hindering signal transmission and electrical connection, resulting in poor test contact or signal distortion.

[0012] The utility model provides an elastic expansion zone at the lower part of the negative pressure dust collecting hood. When the grinding head grinds the chip surface, the auxiliary fan blades will rotate synchronously with the grinding head, further generating an upward negative pressure airflow to accelerate the collection of dust generated by the grinding of the grinding head, thereby improving the dust collection and cleaning effect. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a structural schematic diagram of the utility model;

[0014] Figure 2 It is the front view of the utility model;

[0015] Figure 3 It is a schematic diagram of the structure of the negative pressure dust collecting hood and dust collecting tank of the utility model;

[0016] Figure 4 It is a cross-sectional view of the negative pressure dust collecting hood of the utility model;

[0017] In the figure: 1. Base plate; 2. Test fixture; 3. Z-axis support rod; 4. Control panel; 5. Horizontal slide rail; 6. Horizontal drive motor; 7. Z-axis drive motor; 8. Grinding drive motor; 9. Coupling; 10. Drill rod; 11. Auxiliary fan blades; 12. Negative pressure dust hood; 13. Elastic expansion area; 14. Dust collection trough; 15. Dust exhaust port; 16. Negative pressure fan. DETAILED DESCRIPTION

[0018] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0019] See also Figure 1-Figure 4The utility model provides a technical solution for a chip circuit tester: a chip circuit tester, comprising a base plate 1 and a test fixture 2, the outer surface of a transverse slide rail 5 is slidably connected with a grinding drive motor 8, the output shaft end of the grinding drive motor 8 is fixedly connected with a coupling 9, the lower end of the coupling 9 is fixedly connected with a drill rod 10, the lower end of the drill rod 10 is a grinding head, the lower end of the drill rod 10 is also fixedly connected with an auxiliary fan blade 11, a negative pressure dust collecting cover 12 is fixedly provided on the outer side of the drill rod 10, a dust collecting groove 14 is provided on the upper end of the negative pressure dust collecting cover 12, a negative pressure fan 16 is fixedly connected to the upper end of the dust collecting groove 14, and an elastic expansion zone 13 is provided at the lower part of the negative pressure dust collecting cover 12.

[0020] A control panel 4 is arranged in front of the base plate 1, and Z-axis drive motors 7 are arranged on the left and right sides of the base plate 1. A Z-axis support rod 3 is arranged on the upper end of the Z-axis drive motor 7, and a transverse slide rail 5 is slidably connected to the outer surface of the Z-axis support rod 3. When the Z-axis drive motor 7 is working, it drives the support rod 3 to rotate, thereby controlling the transverse slide rail 5 to move in the Z-axis direction.

[0021] The negative pressure dust collecting hood 12 and the elastic expansion area 13 are both made of elastic rubber material. The auxiliary fan blades 11 are located inside the negative pressure dust collecting hood 12 . The airflow generated by the auxiliary fan blades 11 when working is directed toward the dust collecting groove 14 .

[0022] When the drill rod 10 is being polished, the auxiliary fan blades 11 will rotate synchronously, forming a negative pressure airflow that will flow along the center line of the drill rod 10 into the dust collecting trough 14; a filter is provided between the dust collecting trough 14 and the negative pressure fan 16, and a dust exhaust port 15 is provided on the side of the dust collecting trough 14 for regularly discharging dust.

[0023] A test fixture 2 for fixing the chip to be tested is fixedly arranged on the upper surface of the base plate 1, and a polishing drive motor 8 is slidably connected to the transverse slide rail 5 through a sliding bracket, and a transverse drive motor 6 is arranged on one side of the sliding bracket.

[0024] The working principle and use process of the utility model are as follows: after the utility model is installed, the chip to be polished is placed under the test fixture 2 for fixing, and the lifting and lowering of the drill rod 10 is controlled by the control panel 4. After the polishing reference surface and the polishing amount are set, the polishing drive motor 8 is started; the polishing drive motor 8 starts to work, driving the drill rod 10 and the auxiliary fan blades 11 to rotate, and the polishing head at the lower end of the drill rod 10 polishes the chip surface.

[0025] After the negative pressure fan 16 starts working, a negative pressure airflow is generated in the dust collecting groove 14 and the negative pressure dust collecting cover 12. The area between the lower end of the negative pressure dust collecting cover 12 and the chip is the air inlet. At this time, the dust generated by grinding is collected by the negative pressure dust collecting cover 12; the rotation of the auxiliary fan blades 11 will accelerate the speed of the airflow in the negative pressure dust collecting cover 12, that is, increase the pressure difference of the negative pressure airflow, and then the cover body at the lower end of the negative pressure dust collecting cover 12 will stretch the elastic expansion zone 13 to extend further downward, shrinking the area between the lower end of the negative pressure dust collecting cover 12 and the chip, and accelerating the collection of dust on the chip surface.

[0026] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A chip circuit tester, comprising a base plate (1) and a test fixture (2), characterized in that: A transverse slide rail (5) is arranged above the base plate (1); a grinding drive motor (8) is slidably connected to the outer surface of the transverse slide rail (5); a coupling (9) is fixedly connected to the output shaft end of the grinding drive motor (8); a drill rod (10) is fixedly connected to the lower end of the coupling (9); the lower end of the drill rod (10) is a grinding head; the lower end of the drill rod (10) is also fixedly connected to an auxiliary fan blade (11); a negative pressure dust collecting hood (12) is fixedly arranged on the outer side of the drill rod (10); a dust collecting groove (14) is arranged at the upper end of the negative pressure dust collecting hood (12); a negative pressure fan (16) is fixedly connected to the upper end of the dust collecting groove (14); and an elastic expansion area (13) is arranged at the lower part of the negative pressure dust collecting hood (12).

2. A chip circuit tester according to claim 1, characterized in that: A control panel (4) is arranged in front of the base plate (1), a Z-axis drive motor (7) is arranged on both the left and right sides of the base plate (1), a Z-axis support rod (3) is arranged at the upper end of the Z-axis drive motor (7), and a transverse slide rail (5) is slidably connected to the outer surface of the Z-axis support rod (3).

3. A chip circuit tester according to claim 1, characterized in that: The negative pressure dust collecting hood (12) and the elastic expansion area (13) are both made of elastic rubber material, and the auxiliary fan blades (11) are located inside the negative pressure dust collecting hood (12).

4. A chip circuit tester according to claim 1, characterized in that: When the drill rod (10) is being polished, the auxiliary fan blades (11) will rotate synchronously, forming a negative pressure airflow that will flow along the center line of the drill rod (10) into the dust collecting trough (14); a filter is provided between the dust collecting trough (14) and the negative pressure fan (16), and a dust exhaust port (15) for regularly exhausting dust is provided on the side of the dust collecting trough (14).

5. A chip circuit tester according to claim 1, characterized in that: A test fixture (2) for fixing the chip to be tested is fixedly arranged on the upper surface of the base plate (1); the polishing drive motor (8) is slidably connected to the transverse slide rail (5) via a sliding bracket; and a transverse drive motor (6) is arranged on one side of the sliding bracket.

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