Rapid reflector optical axis verification device

Abstract

The utility model provides a rapid reflector optical axis verification device, and relates to the technical field of optical machine installation and adjustment, and the device comprises an out-cabin measurement assembly disposed outside a high-low temperature box, and an in-cabin test assembly disposed in the high-low temperature box. The extravehicular measuring assembly comprises a lifting platform, and a first autocollimator and a second autocollimator are adjustably arranged on the lifting platform; the in-cabin test assembly comprises a double-shaft rotary table and a quick reflecting mirror fixing assembly which is detachably arranged; the fast reflecting mirror fixing assembly comprises a fast reflecting mirror adapter for mounting a fast reflecting mirror and a microcrystal for forming a reference; the first autocollimator is used for being aligned with the fast reflecting mirror, and the second autocollimator is used for being aligned with the microcrystal. Through the combination of the in-cabin test assembly and the out-cabin measurement assembly, the device can quantitatively measure the optical axis change conditions of the fast reflecting mirror in high and low temperature environments, can measure the optical axis change conditions of fast reflecting mirrors of different specifications in high and low temperature environments through matching with different adapters, and has good versatility.

Description

Technical Field

[0001] The present application relates to the technical field of optical-mechanical assembly and adjustment, and in particular to a fast reflector optical axis verification device. Background Art

[0002] With the rapid development of optoelectronic technology, optoelectronic systems are increasingly used in many fields. In the development of optoelectronic system prototypes, fast reflectors (hereinafter referred to as fast reflectors) are key components for achieving high-speed, precise pointing, stabilization and tracking of light beams. The stability and accuracy of their performance are crucial to the operation of the entire system.

[0003] In practical applications, optoelectronic system prototypes usually need to work in various harsh environments, among which temperature change is one of the main factors affecting the stability of the performance of the fast mirror. Due to the wide range of temperature changes in the working environment of the prototype equipment, the fast mirror and its mounting structure will produce thermal expansion or contraction when heated or cooled, causing the optical axis of the mirror-reflected light beam to shift. This optical axis shift not only affects the pointing accuracy of the light beam, but may also cause the system to be unable to accurately track the target, seriously affecting the performance of the optoelectronic system.

[0004] As far as the applicant is aware, there are some devices for testing the performance of optical components, but these devices are often targeted at specific types of optical components and mainly focus on the inherent performance of the components rather than the changes in their optical axes under high and low temperature environments.

[0005] Therefore, in order to analyze the changes in the optical axis of the fast mirror in high and low temperature environments, quantitatively calculate the angle of optical axis deviation at different ambient temperatures, and then determine the working stability of the fast mirror, it is particularly important to design a fast mirror optical axis verification device. Utility Model Content

[0006] In order to overcome the above-mentioned defects in the testing device and method, the present application provides a fast reflection mirror optical axis verification device capable of quantitatively measuring the optical axis change of the fast reflection mirror in high and low temperature environments.

[0007] The present application is to solve the technical problem of the fast reflector optical axis verification device comprising:

[0008] An out-of-cabin measurement component disposed outside the high-temperature and low-temperature box and an in-cabin test component disposed inside the high-temperature and low-temperature box;

[0009] The extravehicular measurement assembly comprises a lifting platform, on which a first autocollimator and a second autocollimator are adjustably arranged;

[0010] The in-cabin test assembly includes a dual-axis turntable and a fast-reflection mirror fixing assembly detachably arranged on the dual-axis turntable; the fast-reflection mirror fixing assembly includes a fast-reflection mirror adapter for mounting a fast-reflection mirror and a microcrystal for forming a reference;

[0011] The first autocollimator is used for aligning with the fast reflection mirror, and the second autocollimator is used for aligning with the microcrystal.

[0012] As an improvement of the above-mentioned fast reflector optical axis verification device, the output light paths of the first autocollimator and the second autocollimator are parallel to each other.

[0013] As an improvement of the above-mentioned fast reflector optical axis verification device, the lifting platform includes a movable base, a lifting rod and a workbench, and the movable base is provided with rollers and supporting feet that can be adjusted up and down.

[0014] As an improvement of the above-mentioned fast reflector optical axis verification device, the dual-axis turntable includes a main axis and a driven axis, and the main axis and the driven axis are respectively responsible for two mutually perpendicular rotational movements, so that the turntable can achieve precise rotation in two dimensions.

[0015] As an improvement of the above-mentioned fast reflection mirror optical axis verification device, the fast reflection mirror fixing assembly includes a base plate for being fixedly connected to the dual-axis turntable, a vertical plate arranged perpendicular to the base plate is fixedly connected to the middle of the base plate, the fast reflection mirror adapter and the microcrystal are detachably arranged in the middle of the vertical plate, and the microcrystal is fixedly connected to the vertical plate via a pressing block.

[0016] As an improvement of the above-mentioned fast reflector optical axis verification device, side ribs are provided between the bottom plate and the vertical plate.

[0017] As an improvement of the above-mentioned fast reflection mirror optical axis verification device, the fast reflection mirror and the microcrystal are horizontally arranged on a side of the vertical plate away from the side ribs.

[0018] As an improvement of the above-mentioned fast reflection mirror optical axis verification device, the thermal expansion coefficient of the material of the fast reflection mirror fixing component is smaller than the thermal expansion coefficient of the fast reflection mirror.

[0019] As an improvement of the above-mentioned fast reflection mirror optical axis verification device, the material of the fast reflection mirror fixing component is Invar.

[0020] As an improvement to the above-mentioned fast reflection mirror optical axis verification device, the thermal expansion coefficient of the microcrystal is smaller than the thermal expansion coefficient of the fast reflection mirror.

[0021] Beneficial effects:

[0022] Compared with the technology known to the applicant, the fast-reflex mirror optical axis verification device of the present application, through the combination of in-cabin test components and out-of-cabin measurement components, can quantitatively measure the optical axis changes of the fast-reflex mirror in high and low temperature environments, and provides an important reference for evaluating the working stability of the fast-reflex mirror in high and low temperature environments; by matching different fast-reflex mirror adapters, it can measure the optical axis changes of fast-reflex mirrors of different specifications in high and low temperature environments, and has a certain degree of versatility. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] Figure 1 A schematic diagram of a fast reflector optical axis verification device according to an embodiment of the present application;

[0024] Figure 2 is a schematic structural diagram of an extravehicular measurement assembly according to an embodiment of the present application;

[0025] Figure 3 is a schematic structural diagram of an in-cabin measurement assembly according to an embodiment of the present application;

[0026] Figure 4 Schematic diagram of the structure of a fast mirror fixing assembly according to an embodiment of the present application.

[0027] Reference numerals:

[0028] Extracabin measurement assembly 1; lifting platform 1-1; first autocollimator 1-2; second autocollimator 1-3; in-cabin test assembly 2; fast-reflection mirror fixing assembly 2-1; bottom plate 2-1-1; vertical plate 2-1-2; side ribs 2-1-3; fast-reflection mirror adapter 2-1-4; microcrystal 2-1-5; pressing block 2-1-6; fast-reflection mirror 2-1-7; dual-axis turntable 2-2. DETAILED DESCRIPTION

[0029] In order to further explain the technical means and effects adopted by the present application to achieve the predetermined purpose, the technical solutions in the embodiments of the present application are clearly described. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field belong to the scope of protection of the present application.

[0030] The terms "first", "second", etc. in the specification and claims of the present application are used to distinguish similar objects, and are not used to describe a specific order or sequence. It should be understood that the terms used in this way are interchangeable where appropriate, so that the embodiments of the present application can be implemented in an order other than those illustrated or described herein, and the objects distinguished by "first", "second", etc. are generally of one type, and the number of objects is not limited. For example, the first object can be one or more. In addition, "and / or" in the specification and claims represents at least one of the connected objects, and the character " / " generally indicates that the objects associated with each other are in an "or" relationship.

[0031] The following is a detailed description of the fast reflector optical axis verification device provided by the embodiment of the application in conjunction with the accompanying drawings and preferred embodiments.

[0032] Since the working environment of the prototype equipment is relatively harsh, mainly due to the extremely large temperature variation range, based on the above-mentioned defects in the test device and method, a high and low temperature box is used to simulate the temperature changes in the actual working environment, and the fast reflector optical axis verification device is used to analyze the optical axis changes of the mirror reflected light beam in high and low temperature environments. The angle of optical axis deviation under different ambient temperatures is quantitatively calculated to determine the working stability of the fast reflector.

[0033] See also Figure 1 , Figure 1 This is a schematic diagram of the fast reflector optical axis verification device. Figure 1 As shown, the fast reflector optical axis verification device of the embodiment of the present application includes an extracabin measurement component 1 and an incabin test component 2. The extracabin measurement component 1 is arranged outside the high and low temperature box for measurement, and the incabin test component 2 is arranged inside the high and low temperature box for high and low temperature testing.

[0034] See also Figure 2 , Figure 2 It is a schematic diagram of the structure of the extravehicular measurement components. Figure 2 As shown, the extravehicular measurement assembly 1 includes a lifting platform 1-1, which includes a movable base, a lifting rod and a workbench. The movable base is provided with rollers and support feet that can be adjusted up and down, so that the lifting platform can be easily moved and positioned on a flat ground. The first autocollimator 1-2 and the second autocollimator 1-3 are adjustably provided on the workbench of the lifting platform 1-1, and the output optical paths of the first autocollimator 1-2 and the second autocollimator 1-3 are parallel to each other. Specifically, the first autocollimator 1-2 and the second autocollimator 1-3 can adopt TAUS 300-57 model autocollimators, and when connected, they can be fixed to the lifting platform 1-1 by screws.

[0035] See also Figure 3 , Figure 3 It is a schematic diagram of the structure of the measurement components in the cabin, such as Figure 3 As shown, the in-cabin test assembly 2 includes a dual-axis turntable 2-2 and a fast-reflection mirror fixing assembly 2-1 arranged on the dual-axis turntable 2-2. The dual-axis turntable 2-2 includes a main shaft and a driven shaft. The main shaft and the driven shaft are respectively responsible for two mutually perpendicular rotational movements, so that the turntable can achieve precise rotation in two dimensions. Exemplarily, the dual-axis turntable 2-2 can adopt a 902C-2 dual-axis turntable.

[0036] See also Figure 4 , Figure 4 is a schematic diagram of the structure of the fast mirror fixing assembly, such as Figure 4As shown, the above-mentioned quick reflex mirror fixing assembly 2-1 mainly includes a base plate 2-1-1 for fixedly connecting with the dual-axis turntable 2-2, a vertical plate 2-1-2 is fixedly connected to the middle of the base plate 2-1-1, the base plate 2-1-1 and the vertical plate 2-1-2 are arranged perpendicular to each other, a quick reflex mirror adapter 2-1-4 and a microcrystal 2-1-5 are detachably arranged in the middle of the vertical plate 2-1-2, the microcrystal 2-1-5 is fixedly connected with the vertical plate 2-1-2 through a pressing block 2-1-6, and the quick reflex mirror adapter 2-1-4 is used to install the quick reflex mirror 2-1-7. Among them, the thermal expansion coefficient of the microcrystal 2-1-5 is smaller than that of the fast mirror 2-1-7, and the material of the fast mirror fixing component 2-1 is Invar, which has a smaller thermal expansion coefficient than that of the fast mirror 2-1-7. Their thermal expansion and contraction in high and low temperature environments are negligible. Therefore, during use, by aligning the second autocollimator 1-3 with the microcrystal 2-1-5, it is possible to ensure that there is a stable reference point during the measurement process, so as to more accurately evaluate the angular deviation of the fast mirror. By comparing the autocollimator reading aligned with the microcrystal 2-1-5 (as a reference) and the autocollimator reading aligned with the fast mirror, the optical axis deviation angle caused by deformation of the fast mirror in high and low temperature environments can be calculated.

[0037] Optionally, in order to strengthen the lateral rigidity and reduce the deformation caused by thermal expansion and contraction, side ribs 2-1-3 may be provided between the bottom plate 2-1-1 and the vertical plate 2-1-2 to enhance the stability of the device.

[0038] In the specific implementation process, the vertical plate 2-1-2 is installed on the bottom plate 2-1-1, the side ribs 2-1-3 are installed between the bottom plate 2-1-1 and the vertical plate 2-1-2 to strengthen the overall rigidity, the quick reflex mirror adapter 2-1-4 is installed on the vertical plate 2-1-2, the quick reflex mirror 2-1-7 is installed on the quick reflex mirror adapter 2-1-4, and the microcrystal 2-1-5 is fixed to the vertical plate by the pressing block 2-1-6. In this embodiment, the quick reflex mirror 2-1-7 can be a FSM-DWL57E model quick reflex mirror. When connected, the quick reflex mirror fixing assembly 2-1 can be fixedly connected to the dual-axis turntable 2-2 by screws.

[0039] Here’s how this application works:

[0040] In order to verify the angular deviation of the optical axis of the fast mirror under high and low temperature environments, the in-cabin test assembly 2 is placed in a high and low temperature box to facilitate the adjustment of the ambient temperature of the fast mirror; the out-cabin measurement assembly 1 is placed outside the high and low temperature box to facilitate personnel to record the autocollimator data while protecting the autocollimator from the high and low temperature environment. Before the test, the first autocollimator 1-2 and the second autocollimator 1-3 in the out-cabin measurement assembly 1 are respectively aligned with the fast mirror 2-1-7 and the microcrystal 2-1-5 in the in-cabin test assembly 2 through the observation window glass on the high and low temperature box, and the angles of the two autocollimators are adjusted to zero respectively. At this time, the preparation work for the deviation test of the optical axis of the fast mirror under high and low temperature is completed.

[0041] Adjust the ambient temperature in the high and low temperature box. The test assembly 2 in the cabin will expand and contract due to the ambient temperature, causing the mirror surface of the quick mirror 2-1-7 to deform. The corresponding beam angle of the reflection autocollimator will also change. After the temperature in the high and low temperature box is stable, the deformation of the mirror surface of the quick mirror will gradually decrease and stabilize. When the angle of the reflected light beam displayed on the two autocollimators is stable, adjust the azimuth and pitch angles of the dual-axis turntable 2-2 in the test assembly 2 in the cabin so that the display angle of the second autocollimator 1-3 aimed at the microcrystal 2-1-5 is zero. At this time, record the display angle of the first autocollimator 1-2 aimed at the quick mirror 2-1-7. This angle is the angle deviation between the emission light beam of the first autocollimator 1-2 and the light beam reflected back through the mirror surface of the quick mirror. Half of this angle is the optical axis deviation angle caused by the deformation of the quick mirror 2-1-7 in the high and low temperature environment. This completes the measurement of the optical axis deviation of the quick mirror 2-1-7 in the high and low temperature environment, which provides an important reference for evaluating the stability of the quick mirror 2-1-7 in the high and low temperature environment.

[0042] During the specific implementation process, the in-cabin test component 2 is placed in a high and low temperature box to facilitate the adjustment of the ambient temperature of the quick reflection mirror 2-1-7; the out-cabin measurement component 1 is placed outside the high and low temperature box to facilitate personnel to record the autocollimator data while protecting the autocollimator from the influence of high and low temperature environments.

[0043] Before the test, the first autocollimator 1-2 and the second autocollimator 1-3 in the extra-cabin measurement assembly 1 are respectively aligned with the quick reflector 2-1-7 and the microcrystal 2-1-5 in the in-cabin test assembly 2 through the observation window glass on the high-temperature and low-temperature box, and the angles of the two autocollimators are adjusted to zero respectively. Then, the ambient temperature in the high-temperature and low-temperature box is adjusted. After the temperature in the high-temperature and low-temperature box is stable, that is, when the angles of the reflected light beams displayed on the two autocollimators are stable, the azimuth and pitch angles of the dual-axis turntable 2-2 in the in-cabin test assembly 2 are adjusted so that the display angle of the second autocollimator 1-3 aligned with the microcrystal 2-1-5 is zero. At this time, the display angle of the left autocollimator 1-2 aligned with the quick reflector 2-1-7 is recorded. This angle is the angle deviation between the emitted light beam of the left autocollimator 1-2 and the light beam reflected back by the mirror surface of the quick reflector 2-1-7. Half of this angle is the optical axis deviation angle caused by the deformation of the quick reflector 2-1-7 in the high-temperature and low-temperature environment.

[0044] Compared with the technology known to the applicant, the fast mirror optical axis verification device described in the present application, through the combination of in-cabin test components and out-of-cabin measurement components, can quantitatively measure the optical axis changes of the fast mirror in high and low temperature environments, providing an important reference for evaluating the working stability of the fast mirror in high and low temperature environments.

[0045] The fast-reflex mirror optical axis verification device of the present application, when used with different fast-reflex mirror adapters, can measure the optical axis changes of fast-reflex mirrors of different specifications in high and low temperature environments, and has a certain degree of versatility.

[0046] The reflector fixing assembly in the athermal fast mirror optical axis verification device described in the present application has a main structure made of Invar and microcrystals with extremely low thermal expansion coefficients. Thermal expansion and contraction in high and low temperature environments are negligible, and it is an athermal design relative to the fast mirror.

[0047] The dual-axis turntable in the fast-reflection mirror optical axis verification device of the present application can achieve changes in azimuth and pitch angles through servo control. The tester can complete the adjustment of the angle of the fast-reflection mirror and the microcrystal relative to the autocollimator without entering the high and low temperature chamber, thereby improving the testing environment for the personnel and improving work efficiency.

[0048] It should be noted that, in this article, the terms "comprise", "include" or any other variant thereof are intended to cover non-exclusive inclusion, so that the process, method, article or device including a series of elements includes not only those elements, but also includes other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise one..." do not exclude the presence of other identical elements in the process, method, article or device including the element. In addition, it should be pointed out that the scope of the methods and devices in the embodiments of the present application is not limited to performing functions in the order shown or discussed, and may also include performing functions in a substantially simultaneous manner or in reverse order according to the functions involved, for example, the described method may be performed in an order different from that described, and various steps may also be added, omitted, or combined. In addition, the features described with reference to certain examples may be combined in other examples.

[0049] The embodiments of the present application are described above in conjunction with the accompanying drawings, but the present application is not limited to the above-mentioned specific implementation methods. The above-mentioned specific implementation methods are merely illustrative and not restrictive. Under the guidance of the present application, ordinary technicians in this field can also make many forms without departing from the purpose of the present application and the scope of protection of the claims, all of which are within the protection of the present application.

Claims

1. A fast reflector optical axis verification device, characterized in that: include: An out-of-cabin measurement component disposed outside the high-temperature and low-temperature box and an in-cabin test component disposed inside the high-temperature and low-temperature box; The extravehicular measurement assembly comprises a lifting platform, on which a first autocollimator and a second autocollimator are adjustably arranged; The in-cabin test assembly includes a dual-axis turntable and a fast-reflection mirror fixing assembly detachably arranged on the dual-axis turntable; the fast-reflection mirror fixing assembly includes a fast-reflection mirror adapter for mounting a fast-reflection mirror and a microcrystal for forming a reference; The first autocollimator is used for aligning with the fast reflection mirror, and the second autocollimator is used for aligning with the microcrystal.

2. The fast reflector optical axis verification device according to claim 1, characterized in that: The output light paths of the first autocollimator and the second autocollimator are parallel to each other.

3. The fast reflector optical axis verification device according to claim 1, characterized in that: The lifting platform comprises a movable base, a lifting rod and a workbench; the movable base is provided with rollers and supporting feet which can be adjusted up and down.

4. The fast reflector optical axis verification device according to claim 1, characterized in that: The dual-axis turntable includes a main axis and a driven axis, and the main axis and the driven axis are respectively responsible for two mutually perpendicular rotational movements, so that the turntable can achieve precise rotation in two dimensions. The dual-axis turntable achieves changes in azimuth and pitch angles through servo control.

5. The fast reflector optical axis verification device according to claim 1, characterized in that: The fast reflex mirror fixing assembly includes a base plate for fixedly connecting to the dual-axis turntable, a vertical plate arranged perpendicular to the base plate is fixedly connected to the middle of the base plate, the fast reflex mirror adapter and the microcrystal are detachably arranged in the middle of the vertical plate, and the microcrystal is fixedly connected to the vertical plate via a pressing block.

6. The fast reflector optical axis verification device according to claim 5, characterized in that: Side ribs are arranged between the bottom plate and the vertical plate.

7. The fast reflector optical axis verification device according to claim 6, characterized in that: The quick reflection mirror and the microcrystal are horizontally arranged on a side of the vertical plate away from the side ribs.

8. The fast reflector optical axis verification device according to any one of claims 1 to 7, characterized in that: The thermal expansion coefficient of the material of the fast-reflecting mirror fixing component is smaller than the thermal expansion coefficient of the fast-reflecting mirror.

9. The fast reflector optical axis verification device according to any one of claims 1 to 7, characterized in that: The material of the fast reflection mirror fixing component is Invar.

10. The fast reflector optical axis verification device according to any one of claims 1 to 7, characterized in that: The thermal expansion coefficient of the microcrystal is smaller than that of the fast mirror.

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