Probe driving mechanism of flying probe tester

Abstract

The utility model discloses a probe driving mechanism of a flying probe testing machine, which is simple in structure and can be used for executing telescopic operation of a probe so as to complete testing work of a point to be detected of a circuit board. According to the technical scheme, the probe driving mechanism of the flying probe testing machine comprises an installation base, a belt assembly and a probe installation assembly, the belt assembly comprises a driver, a driving wheel, a driven wheel and a belt which are arranged on the installation base, the driven wheel is rotationally arranged on the installation base through a rotating shaft, the probe installation assembly comprises a probe clamp and a probe, and the probe clamp is arranged on the belt. The probe clamp comprises a first clamping head and a second clamping head, the first clamping head is matched with the belt, the second clamping head is matched with the probe, a counter bore is formed in the second clamping head, a locking screw is arranged in the counter bore, and the tail of the locking screw extends out and is screwed to the mounting seat. The utility model relates to the technical field of circuit board testing.

Description

Technical Field

[0001] The utility model relates to the technical field of circuit board testing, in particular to a probe drive mechanism of a flying probe testing machine. Background Art

[0002] In the prior art, circuit board testing is generally completed by the needle bed method and the flying probe test method. For the flying probe test, two or more probes are installed on a vertical structure for fixed-point testing. After the probe is moved to the position of the point to be tested on the circuit board, the probe needs to be pushed to the point to be tested for testing. Therefore, the utility model proposes a probe drive mechanism of a flying probe tester, which can accurately perform the extension and retraction operation of the probe to complete the testing work of the point to be tested on the circuit board. Utility Model Content

[0003] In order to solve the deficiencies of the prior art, the utility model provides a probe driving mechanism of a flying probe tester, which has a simple structure and can be used to perform the extension and retraction operation of the probe to complete the test work on the to-be-tested point of the circuit board.

[0004] The technical problem to be solved by the utility model is achieved through the following technical means: a probe driving mechanism of a flying probe tester, which includes a mounting seat, a belt assembly and a probe mounting assembly, the belt assembly includes a driver arranged on the mounting seat, a driving wheel arranged on the output shaft of the driver, a driven wheel arranged at the same height on one side of the driving wheel in the horizontal direction, and a belt arranged between the driving wheel and the driven wheel, the driven wheel is rotatably arranged on the mounting seat through a rotating shaft, the probe mounting assembly includes a probe clamp and a probe, the probe clamp includes a first chuck and a second chuck, the first chuck cooperates with the belt, the second chuck cooperates with the probe, the second chuck is provided with a countersunk hole, a locking screw is provided in the countersunk hole, and the tail of the locking screw extends out and is screwed to the mounting seat.

[0005] In the above scheme, the belt can be driven to move back and forth, and the first chuck clamps one side of the belt so that the first probe fixture can move synchronously with the belt. In addition, the second chuck clamps the probe, so that the probe can finally be moved by the drive of the belt to achieve approaching and moving away from the test point of the circuit board, thereby testing the circuit board; in addition, since the countersunk hole is designed on the second chuck and can be matched with the locking screw, the installation angle of the second chuck can be changed, so that the installation angle of the probe can also be adjusted and changed. Among them, when changing the installation angle of the second chuck, it is only necessary to loosen the locking screw, adjust the angle of the second chuck, and then lock the locking screw to fix the second chuck. In the utility model, the movement of the probe is simply and directly achieved by belt transmission, that is, the telescopic action when testing the circuit board, and the effect is good.

[0006] In one embodiment, the driver is a stepper motor, the mounting base includes an upper mounting plate and a rear mounting plate arranged below the rear portion of the upper mounting plate, the lower portion of the upper mounting plate and the front portion of the rear mounting plate are combined to form a mounting area, the driver is arranged at the upper portion of the upper mounting plate, the output shaft of the driver passes through the upper mounting plate and penetrates into the mounting area, and the driving wheel, the driven wheel and the probe mounting assembly are all located in the mounting area.

[0007] In one embodiment, the probe clamp includes a moving block, the first clamp is arranged in the upper middle of the moving block, the second clamp is arranged on the right side of the moving block, a sensing component is arranged on the left side of the moving block, and the mounting seat is arranged on the left side of the probe clamp with a travel limit sensor adapted to the sensing component.

[0008] In the above scheme, the travel limit sensor and the sensing element cooperate to detect whether the probe fixture and the probe are over-traveled when moving. In addition, the travel limit sensor and the sensing element are conventional components for travel detection in mechanical design.

[0009] In one embodiment, a slide rail adapted to the moving block is disposed on the mounting seat.

[0010] In one embodiment, an electrical module is disposed at the rear of the rear mounting plate, and the electrical module includes an electrical component mounting plate and a plurality of electrical components mounted on the electrical component mounting plate.

[0011] In one embodiment, the rotating shaft is fixedly disposed on the mounting seat, and the driven wheel is rotationally matched with the rotating shaft.

[0012] In one embodiment, the driven wheel is located directly to the right of the driving wheel.

[0013] In one embodiment, a screw hole matching the locking screw is provided on the mounting seat. BRIEF DESCRIPTION OF THE DRAWINGS

[0014] Figure 1 This is a schematic diagram of the structure of the utility model in an embodiment;

[0015] Figure 2 It is a schematic structural diagram of the utility model in another embodiment from another angle. DETAILED DESCRIPTION

[0016] The present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only the parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0017] like Figure 1 and Figure 2 As shown, the technical solution adopted by the utility model is that the utility model is a probe driving mechanism of a flying probe tester, which includes a mounting seat 1, a belt assembly and a probe mounting assembly, the belt assembly includes a driver 2 arranged on the mounting seat 1, a driving wheel 3 arranged on the output shaft of the driver 2, a driven wheel 4 arranged at the same height on one side of the horizontal direction of the driving wheel 3, and a belt 5 arranged between the driving wheel 3 and the driven wheel 4, the driven wheel 4 is rotatably arranged on the mounting seat 1 through a rotating shaft, the probe mounting assembly includes a probe fixture 6 and a probe 7, the probe fixture 6 includes a first chuck 8 and a second chuck 9, the first chuck 8 cooperates with the belt 5, the second chuck 9 cooperates with the probe 7, the second chuck 9 is provided with a countersunk hole 10, the countersunk hole 10 is provided with a locking screw 11, and the tail of the locking screw 11 extends out and is screwed to the mounting seat 1.

[0018] In the above scheme, the belt 5 can be driven to move back and forth, and the first chuck 8 clamps one side of the belt 5 so that the first probe fixture 6 can move synchronously with the belt 5. In addition, the second chuck 9 clamps the probe 7, so that the probe 7 can finally be moved by the drive of the belt 5 to achieve approaching and moving away from the test point of the circuit board, thereby testing the circuit board; in addition, since the countersunk hole 10 is designed on the second chuck 9 and can be matched with the locking screw 11, the installation angle of the second chuck 9 can be changed, so that the installation angle of the probe 7 can also be adjusted and changed. When changing the installation angle of the second chuck 9, it is only necessary to loosen the locking screw 11, adjust the angle of the second chuck 9, and then lock the locking screw 11 to fix the second chuck 9. In the utility model, the movement of the probe 7 is simply and directly achieved by belt transmission, that is, the telescopic action when testing the circuit board, and the effect is good.

[0019] In one embodiment, the driver 2 is a stepper motor, the mounting base 1 includes an upper mounting plate 12 and a rear mounting plate 13 arranged below the rear portion of the upper mounting plate 12, the lower portion of the upper mounting plate 12 and the front portion of the rear mounting plate 13 are combined to form a mounting area 14, the driver 2 is arranged at the upper portion of the upper mounting plate 12, the output shaft of the driver 2 passes through the upper mounting plate 12 and penetrates into the mounting area 14, the driving wheel 3, the driven wheel 4 and the probe mounting assembly are all located in the mounting area 14.

[0020] In one embodiment, the probe clamp 6 includes a moving block 15, the first chuck 8 is arranged in the upper middle of the moving block 15, the second chuck 9 is arranged on the right side of the moving block 15, a sensing element 16 is arranged on the left side of the moving block 15, and the mounting base 1 is provided with a travel limit sensor 17 adapted to the sensing element 16 on the left side of the probe clamp 6.

[0021] In the above scheme, the travel limit sensor 17 and the sensing element 16 cooperate to detect whether the probe fixture 6 and the probe 7 exceed the travel when moving. In addition, the travel limit sensor 17 and the sensing element 16 are conventional components for travel detection in mechanical design.

[0022] In one embodiment, a slide rail 18 adapted to the moving block 15 is disposed on the mounting seat 1 .

[0023] In one embodiment, an electrical module is disposed at the rear of the rear mounting plate 13 , and the electrical module includes an electrical component mounting plate 19 and a plurality of electrical components 20 mounted on the electrical component mounting plate 19 .

[0024] In one embodiment, the rotating shaft is fixedly disposed on the mounting seat 1, and the driven wheel 4 is rotationally matched with the rotating shaft.

[0025] In one embodiment, the driven wheel 4 is located directly to the right of the driving wheel 3 .

[0026] In one embodiment, a screw hole matching the locking screw 11 is provided on the mounting seat 1 .

Claims

1. The probe drive mechanism of the flying probe tester is characterized by: The invention comprises a mounting seat (1), a belt assembly and a probe mounting assembly, wherein the belt assembly comprises a driver (2) arranged on the mounting seat (1), a driving wheel (3) arranged on the output shaft of the driver (2), a driven wheel (4) arranged at the same height on one side of the driving wheel (3) in the horizontal direction, and a belt (5) arranged between the driving wheel (3) and the driven wheel (4), wherein the driven wheel (4) is rotatably arranged on the mounting seat (1) via a rotating shaft, and the probe mounting assembly comprises a probe clamp (6) and a probe (7), wherein the probe clamp (6) comprises a first clamp (8) and a second clamp (9), wherein the first clamp (8) cooperates with the belt (5), and the second clamp (9) cooperates with the probe (7), and the second clamp (9) is provided with a countersunk hole (10), wherein a locking screw (11) is provided in the countersunk hole (10), and the tail of the locking screw (11) extends out and is screwed to the mounting seat (1).

2. The probe drive mechanism of the flying probe tester according to claim 1, characterized in that: The driver (2) is a stepper motor. The mounting seat (1) comprises an upper mounting plate (12) and a rear mounting plate (13) arranged below the rear of the upper mounting plate (12). The lower part of the upper mounting plate (12) and the front part of the rear mounting plate (13) are combined to form a mounting area (14). The driver (2) is arranged on the upper part of the upper mounting plate (12). The output shaft of the driver (2) passes through the upper mounting plate (12) and penetrates into the mounting area (14). The driving wheel (3), the driven wheel (4) and the probe mounting assembly are all located in the mounting area (14).

3. The probe drive mechanism of the flying probe tester according to claim 1, characterized in that: The probe clamp (6) comprises a moving block (15), the first clamp (8) is arranged in the middle of the upper part of the moving block (15), the second clamp (9) is arranged on the right side of the moving block (15), a sensing element (16) is arranged on the left side of the moving block (15), and the mounting seat (1) is provided with a travel limit sensor (17) adapted to the sensing element (16) on the left side of the probe clamp (6).

4. The probe drive mechanism of the flying probe tester according to claim 3, characterized in that: The mounting seat (1) is provided with a slide rail (18) adapted to the moving block (15).

5. The probe drive mechanism of the flying probe tester according to claim 2, characterized in that: An electrical module is arranged at the rear of the rear mounting plate (13), and the electrical module comprises an electrical component mounting plate (19) and a plurality of electrical components (20) mounted on the electrical component mounting plate (19).

6. The probe drive mechanism of the flying probe tester according to claim 1, characterized in that: The rotating shaft is fixedly arranged on the mounting seat (1), and the driven wheel (4) is rotationally matched with the rotating shaft.

7. The probe drive mechanism of the flying probe tester according to claim 1, characterized in that: The driven wheel (4) is located directly to the right of the driving wheel (3).

8. The probe drive mechanism of the flying probe tester according to claim 1, characterized in that: The mounting seat (1) is provided with a screw hole matched with the locking screw (11).

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