Temperature sensor chip aging test device

Abstract

The utility model relates to the technical field of temperature sensor chip aging test, and discloses a temperature sensor chip aging test device, which solves the problems that in the use process of an aging test device for a temperature sensor chip, the chip is inconvenient to take out quickly after test, the operation of people is influenced, and the service life of the chip is prolonged. The tester comprises a tester main body, positioning supporting strips are symmetrically and fixedly mounted at the top of the tester main body, a placement seat is fixedly mounted between the top ends of the two positioning supporting strips, a placement groove is formed in the top of the placement seat, and a circular groove is formed in the middle of the bottom end in the placement groove; a through hole is formed in the middle of the bottom end of the circular groove; an adjusting pushing assembly is mounted at the top of the tester main body; according to the aging test device for the temperature sensor chip, the chip can be conveniently and rapidly taken out after testing in the using process of the aging test device for the temperature sensor chip, so that people can better operate the aging test device, and better practicability can be conveniently achieved.

Description

Technical Field

[0001] The utility model belongs to the technical field of temperature sensor chip aging test, in particular to a temperature sensor chip aging test device. Background Art

[0002] A temperature sensor is a sensor that can sense temperature and convert it into a usable output signal. It is the core part of a temperature measuring instrument. It can be divided into two categories according to the measurement method: contact and non-contact. It can be divided into two categories: thermal resistors and thermocouples according to the sensor material and electronic component characteristics. The chip inside the temperature sensor is an important component. When performing an aging test on the temperature sensor chip, an aging test device is required. When using the aging test device for the temperature sensor chip, it is not convenient to quickly remove the chip after the test, which affects people's operation and is not convenient to achieve better practicality. Utility Model Content

[0003] In view of the above situation, in order to overcome the defects of the prior art, the utility model provides a temperature sensor chip aging test device, which effectively solves the problem that during the use of the temperature sensor chip aging test device, it is not convenient to quickly take out the chip after the test, which affects people's operation and is not convenient to achieve better practicality.

[0004] To achieve the above-mentioned purpose, the utility model provides the following technical solutions: a temperature sensor chip aging test device, including a tester body, a positioning support bar is symmetrically fixedly installed on the top of the tester body, a placement seat is fixedly installed between the top ends of the two positioning support bars, a placement groove is opened on the top of the placement seat, a circular groove is opened in the middle of the inner bottom end of the placement groove, a through hole is opened in the middle of the bottom end of the circular groove, and the bottom of the through hole extends to the bottom of the placement seat, an adjustment push assembly is installed on the top of the tester body, and the top end of the adjustment push assembly is connected to the placement seat, and the adjustment push assembly is located between the two positioning support bars.

[0005] Preferably, the adjustment pushing assembly includes a supporting base, and the bottom of the supporting base is fixedly connected to the top of the tester body, a reduction motor is fixedly installed on the top of the supporting base, a rotating disk is fixedly installed on the output shaft of the reduction motor, a first connecting shaft is fixedly installed on the bottom end of the rotating disk away from the reduction motor, a movable bar is rotatably installed on the first connecting shaft, a second connecting shaft is rotatably installed on the end of the movable bar away from the first connecting shaft, a movable plate is fixedly installed on the top of the second connecting shaft, a movable rod is fixedly installed on the top of the movable plate, a circular plate is movably installed inside the circular groove, and the top of the movable rod movably passes through the through hole and is fixedly connected to the middle part of the bottom end of the circular plate.

[0006] Preferably, a positioning slide bar is fixedly mounted on the bottom of the movable plate, a positioning sleeve is provided on the outer sliding sleeve of the positioning slide bar, and the positioning sleeve is fixedly mounted on the top of the tester body.

[0007] Preferably, four positioning sliders are evenly fixedly installed on the outer side of the bottom end of the positioning slide rod, four positioning slots are evenly penetrated through the outer side of the positioning sleeve, and the four positioning sliders are respectively slidably penetrated and installed inside the four positioning slots.

[0008] Preferably, a supporting base plate is fixedly installed at the bottom of the tester body, and fixing holes are formed through the four corners of the supporting base plate.

[0009] Compared with the prior art, the beneficial effects of the utility model are:

[0010] 1) During operation, through the interaction of the tester body, the positioning support bar, the placement seat, the placement groove, the circular groove, the through hole and the adjustment and pushing assembly, the temperature sensor chip aging test device can be used to quickly take out the chip after the test, so that people can better operate it, thereby achieving better practicality;

[0011] 2) During operation, through the interaction of the positioning slide rod, the positioning sleeve, the positioning slide groove and the positioning slider, the movable plate can achieve better stability when moving, thereby ensuring that the adjustment push assembly can work stably. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. They are used together with the embodiments of the present invention to explain the present invention and do not constitute a limitation to the present invention.

[0013] In the attached picture:

[0014] Figure 1 This is a schematic diagram of the structure of a temperature sensor chip aging test device of the utility model;

[0015] Figure 2 This is a schematic diagram of the structure of the placement seat of the utility model;

[0016] Figure 3 This is a schematic diagram of the structure of the adjustment and pushing component of the utility model;

[0017] Figure 4 It is a schematic diagram of the disassembled structure of the positioning slide bar part of the utility model.

[0018] In the figure: 1. Tester body; 2. Positioning support bar; 3. Placement seat; 4. Placement slot; 5. Circular slot; 6. Through hole; 7. Adjustment push assembly; 8. Support base; 9. Reducer motor; 10. Rotating disk; 11. First connecting shaft; 12. Movable bar; 13. Second connecting shaft; 14. Movable plate; 15. Movable rod; 16. Circular plate; 17. Positioning slide bar; 18. Positioning sleeve; 19. Positioning slide block; 20. Positioning slide slot; 21. Support base plate; 22. Fixed mounting hole. DETAILED DESCRIPTION

[0019] The technical solutions in the embodiments of the utility model will be clearly and completely described below in conjunction with the drawings in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, rather than all of the embodiments; based on the embodiments of the utility model, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the utility model.

[0020] Embodiment 1, by Figure 1 , Figure 2 , Figure 3 and Figure 4 The utility model includes a tester body 1, a support base plate 21 is fixedly installed at the bottom of the tester body 1, and the four corners of the support base plate 21 are penetrated with fixed installation holes 22, a positioning support bar 2 is symmetrically fixedly installed at the top of the tester body 1, a placement seat 3 is fixedly installed between the top ends of the two positioning support bars 2, a placement groove 4 is opened at the top of the placement seat 3, a circular groove 5 is opened at the middle of the bottom end of the placement groove 4, a through hole 6 is opened at the middle of the bottom end of the circular groove 5, and the bottom of the through hole 6 extends to the bottom of the placement seat 3, an adjustment push component 7 is installed on the top of the tester body 1, and the top end of the adjustment push component 7 is connected to the placement seat 3, and the adjustment push component 7 is located between the two positioning support bars 2;

[0021] The adjustment and pushing assembly 7 includes a support base 8, and the bottom of the support base 8 is fixedly connected to the top of the tester body 1, a reduction motor 9 is fixedly installed on the top of the support base 8, a rotating disk 10 is fixedly installed on the output shaft of the reduction motor 9, a first connecting shaft 11 is fixedly installed on the bottom end of the rotating disk 10 away from the reduction motor 9, a movable bar 12 is rotatably installed on the first connecting shaft 11, a second connecting shaft 13 is rotatably installed on the end of the movable bar 12 away from the first connecting shaft 11, a movable plate 14 is fixedly installed on the top of the second connecting shaft 13, and a movable rod 15 is fixedly installed on the top of the movable plate 14 A circular plate 16 is movably installed inside the circular groove 5, and the top of the movable rod 15 movably penetrates the through hole 6 and is fixedly connected to the middle part of the bottom end of the circular plate 16. A positioning slide rod 17 is fixedly installed at the bottom of the movable plate 14. A positioning sleeve 18 is slidably sleeved on the outer side of the positioning slide rod 17, and the positioning sleeve 18 is fixedly installed on the top of the tester body 1. Four positioning sliders 19 are evenly fixedly installed on the outer side of the bottom end of the positioning slide rod 17. Four positioning slide grooves 20 are evenly penetrated on the outer side of the positioning sleeve 18, and the four positioning sliders 19 are respectively slidably penetrated and installed in the inside of the four positioning slide grooves 20.

[0022] During use, through the interaction of the set tester body 1, positioning support bar 2, placement seat 3, placement groove 4, circular groove 5, through hole 6 and adjustment push component 7, the temperature sensor chip aging test device can be used in the process of use. After the test, the chip can be quickly taken out, so that people can better operate it, thereby achieving better practicality, and through the interaction of the set positioning slide bar 17, positioning sleeve 18, positioning slide groove 20 and positioning slider 19, the movable plate 14 can achieve better stability when moving, thereby ensuring that the adjustment push component 7 can work stably.

[0023] Working principle: When working, first place the temperature sensor chip inside the placement slot 4 for testing. After the test is completed, start the reduction motor 9 to drive the rotating disk 10 to rotate. During the first half of the rotation of the rotating disk 10, the first connecting shaft 11 is driven to move upward in an arc shape. The first connecting shaft 11 drives the movable bar 12 to move. The movable bar 12 pushes the movable plate 14 to move upward through the second connecting shaft 13. The movable plate 14 drives the positioning slide bar 17 to slide upward inside the positioning sleeve 18. The positioning slide bar 17 drives the positioning slide block 19 to slide inside the positioning slide slot 20, which can ensure that the movable plate 14 Better stability is achieved during movement, and at the same time, the movable plate 14 drives the movable rod 15 to move upward, the movable rod 15 pushes the circular plate 16 to move upward, the circular plate 16 pushes the chip upward to move out of the placement groove 4, and then the chip can be removed. When the rotating disk 10 rotates the second half of the circle, it will drive the first connecting shaft 11 to move downward in an arc, so that the circular plate 16 moves downward and resets, and then the reduction motor 9 is turned off, so that the temperature sensor chip aging test device can be used in the process of use. After the test, the chip can be quickly taken out, so that people can better operate it, thereby achieving better practicality.

Claims

1. A temperature sensor chip aging test device, comprising a tester body (1), characterized in that: The top of the tester body (1) is symmetrically fixedly mounted with positioning support bars (2); a placement seat (3) is fixedly mounted between the top ends of the two positioning support bars (2); a placement groove (4) is provided on the top of the placement seat (3); a circular groove (5) is provided in the middle of the bottom end of the placement groove (4); a through hole (6) is provided in the middle of the bottom end of the circular groove (5); and the bottom of the through hole (6) extends to the bottom of the placement seat (3); an adjustment push component (7) is installed on the top of the tester body (1); and the top end of the adjustment push component (7) is connected to the placement seat (3); and the adjustment push component (7) is located between the two positioning support bars (2).

2. The temperature sensor chip aging test device according to claim 1, characterized in that: The adjusting and pushing assembly (7) comprises a supporting base (8), and the bottom of the supporting base (8) is fixedly connected to the top of the tester body (1), a reduction motor (9) is fixedly installed on the top of the supporting base (8), a rotating disk (10) is fixedly installed on the output shaft of the reduction motor (9), a first connecting shaft (11) is fixedly installed on the bottom end of the rotating disk (10) away from the reduction motor (9), a movable bar (12) is rotatably installed on the first connecting shaft (11), a second connecting shaft (13) is rotatably installed on the end of the movable bar (12) away from the first connecting shaft (11), a movable plate (14) is fixedly installed on the top of the second connecting shaft (13), a movable rod (15) is fixedly installed on the top of the movable plate (14), a circular plate (16) is movably installed inside the circular groove (5), and the top of the movable rod (15) movably passes through the through hole (6) and is fixedly connected to the middle part of the bottom end of the circular plate (16).

3. A temperature sensor chip aging test device according to claim 2, characterized in that: A positioning slide bar (17) is fixedly mounted on the bottom of the movable plate (14), a positioning sleeve (18) is provided on the outer sliding sleeve of the positioning slide bar (17), and the positioning sleeve (18) is fixedly mounted on the top of the tester body (1).

4. The temperature sensor chip aging test device according to claim 3, characterized in that: Four positioning slide blocks (19) are evenly fixedly installed on the outer side of the bottom end of the positioning slide rod (17), and four positioning slide grooves (20) are evenly penetrated on the outer side of the positioning sleeve (18), and the four positioning slide blocks (19) are respectively slidably penetrated and installed inside the four positioning slide grooves (20).

5. The temperature sensor chip aging test device according to claim 1, characterized in that: A supporting base plate (21) is fixedly mounted on the bottom of the tester body (1), and fixing holes (22) are provided through the four corners of the supporting base plate (21).

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