Micrometer with supporting mechanism

Abstract

The utility model discloses a micrometer with a supporting mechanism, which comprises a micrometer main body, the bottom of the micrometer main body is provided with a clamping mechanism used for fixing the micrometer main body, the clamping mechanism is movably connected to a cleaning mechanism, the cleaning mechanism comprises a bottom plate, a groove is arranged in the bottom plate, and the supporting mechanism is arranged on the bottom plate. A sliding rod is fixedly connected to the interior of a groove of the bottom plate, two rotating rods are movably connected to the sliding rod, and the opposite side faces of the two rotating rods are fixedly connected through an extension spring; through the equipment, the problems that the measuring head of the micrometer cannot be stably contacted with the surface of the workpiece, so that a measured value deviates from an actual value, the measuring error is increased, and if hard particles or abrasion particles exist on the surface of the workpiece to be detected, abrasion of the measuring head of the micrometer is possibly accelerated, the precision of the micrometer is reduced, and the service life of the micrometer is prolonged can be solved. And unstable factors caused by holding the micrometer by hand can be avoided.

Description

Technical Field

[0001] The utility model relates to the technical field of a micrometer support frame, in particular to a micrometer with a supporting mechanism. Background Art

[0002] Digital micrometers are widely used in the processing and production of machinery and various precision parts due to their high precision, smart structure and easy use. Moreover, with the development of industry, existing micrometers are equipped with digital display devices, which have higher accuracy and smaller errors.

[0003] Patent application number "CN202221374357.2" describes "a digital micrometer with a supporting mechanism, including a base, and the upper end surface of the base is provided with two symmetrically arranged grooves. By rotating the adjusting screw, the moving block is driven to move under the action of the limit groove, and then the moving block drives the moving plate to approach the fixed plate while clamping the digital micrometer. When the volume of the digital micrometer to be measured is too large, the rotating ring is driven to move toward each other under the action of the rotating shaft to adapt to the clamping of digital micrometers of different sizes, thereby solving the problem of not needing manual hand-holding during the measurement process, and improving the measurement accuracy."

[0004] However, during the use of the above-mentioned equipment, the surface of the workpiece to be inspected cannot be cleaned in advance, so that impurities on the workpiece may cause the measured value to deviate from the actual value, thereby increasing the measurement error. At the same time, if there are hard particles or wear particles on the surface of the workpiece, it may accelerate the wear of the micrometer probe and reduce the accuracy and life of the micrometer.

[0005] Therefore, the utility model provides a micrometer with a supporting mechanism to solve the above problems. Utility Model Content

[0006] In view of the deficiencies in the prior art, the utility model provides a micrometer with a supporting mechanism, which solves the above-mentioned problem that the surface of the workpiece to be inspected cannot be cleaned in advance, resulting in impurities on the workpiece causing the measured value to deviate from the actual value, thereby increasing the measurement error.

[0007] To achieve the above objectives, the utility model is implemented through the following technical solutions: a micrometer with a supporting mechanism, comprising a micrometer body, a clamping mechanism for fixing the micrometer body is arranged at the bottom of the micrometer body, the clamping mechanism is movably connected to a cleaning mechanism, the cleaning mechanism comprises a bottom plate with a groove formed inside, a sliding rod is fixedly connected inside the groove of the bottom plate, two rotating rods are movably connected to the sliding rod, and the opposite sides of the two rotating rods are fixedly connected by a tension spring, cleaning rollers for cleaning the surface of a workpiece to be measured are rotatably connected to the two rotating rods, and the groove inside the bottom plate matches the cleaning roller, and the bottom of the cleaning mechanism is movably connected to a fixing mechanism through a clamping mechanism.

[0008] Preferably: the clamping mechanism includes a fixed block movably connected to the bottom plate, a clamp for adjusting the angle is rotatably connected to the fixed block, and an adjusting knob for adjusting the tightness is movably connected to the connection between the clamp and the fixed block, and the front end of the clamp is movably connected to the top plate via a clamping screw.

[0009] Preferably: the fixing mechanism includes a clamping plate, both sides of the clamping plate are fixedly connected with anti-skid pads to prevent the device from sliding, and the corresponding position at the bottom of the base plate is also fixedly connected with a rubber pad to prevent the device from sliding, and the bottom of the fixing block passes through the base plate and the clamping plate and is rotatably connected with a fixing bolt, and the fixing bolt matches the thread on the bottom of the fixing block.

[0010] Preferably, a handle is fixedly connected to the front end of the rotating rod for facilitating the rotation of the rotating rod, and a limiting groove matching the handle is provided on the side surface of the bottom plate.

[0011] Preferably, a damping pad is fixedly connected on the side surfaces opposite to the top plate and the clamp to facilitate clamping and fixing the micrometer body, and the damping pad matches the friction pad on the micrometer body.

[0012] Preferably, a protective cover is rotatably connected to one side of the bottom plate, and the protective cover matches a groove provided on the bottom plate, and a dustproof ring is fixedly connected to the surface of the protective cover in contact with the bottom plate.

[0013] The utility model provides a micrometer with a supporting mechanism. Compared with the prior art, it has the following beneficial effects:

[0014] (1) The micrometer with a supporting mechanism is rotated out from the inside of the bottom plate through the two rotating rods of the handles at both ends of the bottom plate, and the workpiece to be inspected passes through the middle of the two cleaning rollers and is clamped inside the two cleaning rollers. The impurities on both sides of the workpiece to be inspected can be removed by the rotation and friction of the two cleaning rollers, thereby preventing the micrometer probe from being unable to stably contact the workpiece surface, thereby causing the measured value to deviate from the actual value, thereby increasing the measurement error. At the same time, if there are hard particles or wear particles on the surface of the workpiece to be inspected, the wear of the micrometer probe may be accelerated, reducing the accuracy and life of the micrometer.

[0015] (2) The micrometer with a supporting mechanism can clamp the micrometer body by raising the top plate by rotating the clamping screw, and adjust the required detection angle by using the fixing block and the adjusting knob, and fix it by rotating the adjusting knob. At the same time, the fixing bolt is rotated so that the device can be fixed on the table and the anti-slip pad on the clamping plate can ensure that the device will not shift on the table, thereby ensuring that its position and direction relative to the workpiece remain stable, which helps to improve the accuracy and repeatability of the measurement and can avoid the instability caused by holding the micrometer. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] Figure 1 This is a three-dimensional diagram of the external structure of the utility model in working state;

[0017] Figure 2 This is a three-dimensional diagram of the cleaning mechanism structure of the utility model;

[0018] Figure 3 It is an expanded stereogram of the cleaning mechanism structure of the utility model;

[0019] Figure 4 This is a structural disassembly diagram of the clamping mechanism, cleaning mechanism and fixing mechanism of the utility model.

[0020] In the figure, 1 is the main body of the micrometer; 2 is the clamping mechanism; 21 is the fixing block; 22 is the clamp; 23 is the adjusting knob; 24 is the top plate; 25 is the clamping screw; 3 is the cleaning mechanism; 31 is the bottom plate; 32 is the protective cover; 33 is the rotating rod; 34 is the cleaning roller; 35 is the handle; 36 is the tension spring; 37 is the sliding rod; 4 is the fixing mechanism; 41 is the splint; 42 is the anti-skid pad; 43 is the fixing bolt. DETAILED DESCRIPTION

[0021] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0022] Embodiment 1:

[0023] See also Figures 1 to 4 A micrometer with a supporting mechanism comprises a micrometer body 1, a clamping mechanism 2 for fixing the micrometer body 1 is arranged at the bottom of the micrometer body 1, the clamping mechanism 2 is movably connected to a cleaning mechanism 3, the cleaning mechanism 3 comprises a bottom plate 31 with a groove formed inside, a slide bar 37 is fixedly connected inside the groove of the bottom plate 31, two rotating rods 33 are movably connected to the slide bar 37, and the opposite sides of the two rotating rods 33 are fixedly connected by a tension spring 36, and the two rotating rods 33 are both rotatably connected to the useful The cleaning roller 34 is used to clean the surface of the workpiece to be measured, and the groove inside the bottom plate 31 matches the cleaning roller 34. The bottom of the cleaning mechanism 3 is movably connected to the fixing mechanism 4 through the clamping mechanism 2. The front end of the rotating rod 33 is fixedly connected to a handle 35 for facilitating the rotation of the rotating rod 33, and a limiting groove matching the handle 35 is provided on the side of the bottom plate 31. A protective cover 32 is rotatably connected to one side of the bottom plate 31, and the protective cover 32 matches the groove provided on the bottom plate 31. The protective cover 32 is connected to the bottom plate 31. The protective cover 32 is flipped out from the bottom plate 31, and at the same time, the two rotating rods 33 are rotated out from the inside of the bottom plate 31 through the handles 35 at both ends of the bottom plate 31, so that the bottom plate 31 releases the restraint on the rotating rod 33, and under the action of the tension spring 36, the rotating rods 33 at both ends of the slide bar 37 are gathered to the middle, and the workpiece to be inspected passes through the middle of the two cleaning rollers 34 and is clamped inside the two cleaning rollers 34. The impurities on both sides of the workpiece to be inspected can be removed by the rotation friction of the two cleaning rollers 34, so as to avoid the micrometer probe from being unable to stably contact the workpiece surface, thereby causing the measured value to deviate from the actual value, thereby increasing the measurement error. At the same time, if there are hard particles or wear particles on the surface of the workpiece to be inspected, it may accelerate the wear of the micrometer probe and reduce the accuracy and life of the micrometer. In addition, the workpiece to be inspected can also be clamped on the cleaning mechanism 3 with the cooperation of the two cleaning rollers 34 and the tension spring 36, so as to facilitate the operation of the staff.

[0024] Embodiment 2:

[0025] See also Figures 1 to 4This embodiment provides a technical solution based on the first embodiment: the clamping mechanism 2 includes a fixed block 21 movably connected to the bottom plate 31, the fixed block 21 is rotatably connected with a clamp 22 for adjusting the angle, and the connection between the clamp 22 and the fixed block 21 is movably connected with an adjusting knob 23 for adjusting the tightness, the front end of the clamp 22 is movably connected with a top plate 24 through a clamping screw 25, and the top plate 24 and the clamp 22 are fixedly connected on the opposite sides thereof with a damping pad for clamping and fixing the micrometer body 1, and the damping pad matches the friction pad on the micrometer body 1, the fixing mechanism 4 includes a clamping plate 41, both sides of the clamping plate 41 are fixedly connected with anti-skid pads 42 for preventing the device from sliding, and the corresponding position at the bottom of the bottom plate 31 is also fixedly connected with a rubber pad for preventing the device from sliding, and the bottom of the fixed block 21 passes through the bottom plate 31 and is rotatably connected with the clamping plate 41 There is a fixing bolt 43, and the fixing bolt 43 matches the thread on the bottom of the fixing block 21. The friction pad of the micrometer body 1 is placed between the clamp 22 and the top plate 24. The top plate 24 is raised by rotating the clamping screw 25 so that the micrometer body 1 can be clamped, and the required detection angle is adjusted by the fixing block 21 and the adjusting knob 23, and the adjusting knob 23 is rotated to fix it. At the same time, the device is inserted on the table so that the table is between the bottom plate 31 and the clamping plate 41. At the same time, the fixing bolt 43 is rotated so that the device can be fixed on the table and the anti-slip pad 42 on the clamping plate 41 can ensure that the device will not be offset on the table, thereby ensuring that its position and direction relative to the workpiece remain stable, which helps to improve the accuracy and repeatability of the measurement, and can avoid the instability caused by holding the micrometer.

[0026] Meanwhile, the contents not described in detail in this specification belong to the prior art known to those skilled in the art.

[0027] Working principle: When working, first flip the protective cover 32 out from the bottom plate 31, and at the same time, the two rotating rods 33 are rotated out from the inside of the bottom plate 31 through the handles 35 at both ends of the bottom plate 31, so that the bottom plate 31 releases the restraint on the rotating rod 33, and under the action of the tension spring 36, the rotating rods 33 at both ends of the slide bar 37 are gathered to the middle, and the workpiece to be inspected passes through the middle of the two cleaning rollers 34 and is clamped inside the two cleaning rollers 34. The impurities on both sides of the workpiece to be inspected can be removed through the rotation and friction of the two cleaning rollers 34, so as to avoid the micrometer probe from being unable to stably contact the workpiece surface, thereby causing the measured value to deviate from the actual value, thereby increasing the measurement error. At the same time, if there are hard particles or wear particles on the surface of the workpiece to be inspected, it may accelerate the wear of the micrometer probe, reduce the accuracy and life of the micrometer, and through the two cleaning rollers 34 and With the cooperation of the tension spring 36, the workpiece to be inspected can also be clamped on the cleaning mechanism 3 to facilitate the operation of the staff. At the same time, the friction pad of the micrometer body 1 is placed between the clamp 22 and the top plate 24. The top plate 24 is raised by rotating the clamping screw 25 so that the micrometer body 1 can be clamped, and the required detection angle is adjusted by the fixing block 21 and the adjusting knob 23, and fixed by rotating the adjusting knob 23. At the same time, the device is inserted on the table so that the table is between the base plate 31 and the clamping plate 41. At the same time, the fixing bolt 43 is rotated so that the device can be fixed on the table and the anti-slip pad 42 on the clamping plate 41 can ensure that the device will not be offset on the table, thereby ensuring that its position and direction relative to the workpiece remain stable, which helps to improve the accuracy and repeatability of the measurement, and can avoid instability factors caused by holding the micrometer.

[0028] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device.

[0029] Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and variations may be made to the embodiments without departing from the principles and spirit of the present invention, and that the scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A micrometer with a support mechanism, comprising a micrometer body (1), characterized in that: The bottom of the micrometer body (1) is provided with a clamping mechanism (2) for fixing the micrometer body (1), the clamping mechanism (2) is movably connected to a cleaning mechanism (3), the cleaning mechanism (3) comprises a bottom plate (31) with a groove formed therein, a sliding rod (37) is fixedly connected to the groove of the bottom plate (31), two rotating rods (33) are movably connected to the sliding rod (37), and the two rotating rods (33) are fixedly connected on opposite sides by a tension spring (36), the two rotating rods (33) are rotatably connected to cleaning rollers (34) for cleaning the surface of a workpiece to be measured, and the groove inside the bottom plate (31) matches the cleaning rollers (34), and the bottom of the cleaning mechanism (3) is movably connected to a fixing mechanism (4) via the clamping mechanism (2).

2. A micrometer with a supporting mechanism according to claim 1, characterized in that: The clamping mechanism (2) comprises a fixed block (21) movably connected to a bottom plate (31); a clamp (22) for adjusting the angle is rotatably connected to the fixed block (21); an adjusting knob (23) for adjusting the tightness is movably connected to the connection between the clamp (22) and the fixed block (21); and a front end of the clamp (22) is movably connected to a top plate (24) via a clamping screw (25).

3. A micrometer with a supporting mechanism according to claim 2, characterized in that: The fixing mechanism (4) comprises a clamping plate (41), both sides of which are fixedly connected with anti-skid pads (42) for preventing the device from sliding, and a rubber pad for preventing the device from sliding is also fixedly connected at a corresponding position at the bottom of the base plate (31), and the bottom of the fixing block (21) is rotatably connected with a fixing bolt (43) that passes through the base plate (31) and the clamping plate (41), and the fixing bolt (43) matches the thread on the bottom of the fixing block (21).

4. A micrometer with a supporting mechanism according to claim 1, characterized in that: A handle (35) is fixedly connected to the front end of the rotating rod (33) for facilitating the rotation of the rotating rod (33), and a limiting groove matching the handle (35) is provided on the side surface of the bottom plate (31).

5. A micrometer with a supporting mechanism according to claim 2, characterized in that: A damping pad is fixedly connected on the opposite sides of the top plate (24) and the clamp (22) to facilitate clamping and fixing the micrometer body (1), and the damping pad matches the friction pad on the micrometer body (1).

6. A micrometer with a supporting mechanism according to claim 1, characterized in that: A protective cover (32) is rotatably connected to one side of the bottom plate (31), and the protective cover (32) matches a groove provided on the bottom plate (31). A dustproof ring is fixedly connected to the surface where the protective cover (32) contacts the bottom plate (31).

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