Integrated circuit probe card cleaning device

Abstract

The utility model relates to an integrated circuit probe card cleaning device in the technical field of integrated circuit probe card cleaning, which comprises a device body, one end of the device body is fixedly connected with a plurality of cleaning brushes, the middle part of the device body is provided with a gas flow regulating valve, and one end of the device body far away from the cleaning brushes is fixedly connected with a gas pipe. The probe card cleaning device can perform brushing and purging operations simultaneously, thereby reducing total time required for cleaning a probe card, reducing a plurality of steps required in the cleaning process, reducing complexity of manual operation, improving efficiency of cleaning work, more effectively removing small particles at the tip of a probe, reducing particle residues on the surface of a needle tip, and improving working efficiency of the probe card cleaning device. The cleaning quality is improved, and the flow of gas is adjusted through the gas flow adjusting valve, so that the optimal cleaning effect is achieved. By using the improved cleaning device, the time for manually cleaning the needle point by releasing a card every day in the production process can be greatly reduced, so that the operation efficiency of a production line is improved.

Description

Technical Field

[0001] The utility model relates to the technical field of integrated circuit probe card cleaning, in particular to an integrated circuit probe card cleaning device. Background Art

[0002] Probe cards are important in the production of semiconductors or electronic components. They are used to contact chips and perform electrical tests to ensure component functionality and performance. However, probe cards gradually accumulate dust, particles, and other contaminants during use, which can cause poor contact, inaccurate test results, or component damage. Therefore, regular cleaning of probe cards is a necessary step to ensure smooth operation of the production line.

[0003] In the prior art, the cleaning process of the probe card generally includes the following steps:

[0004] Prepare the brush: First, you need to prepare a suitable brush to remove contaminants from the probe tip;

[0005] Clean the brush: Before using the brush, blow it clean with gas (such as the air flow generated by an air gun) to ensure that there is no residual contaminant on the brush;

[0006] Blowing the P / C with gas: The operator uses an air gun to blow air from the edges of the square to remove large particles of contaminants on the probe card;

[0007] Clean the needle with a brush: Finally, use a brush that has been blown clean with air to remove tiny particles from the probe tip to ensure the probe is clean.

[0008] Traditional cleaning methods have some limitations, such as:

[0009] Time-consuming: The entire cleaning process takes a long time, and it takes about 40 minutes to clean each probe card;

[0010] Low efficiency: According to the traditional method, the number of probe cards that can be cleaned in one day is limited, only about 10 pieces.

[0011] Multiple steps: The cleaning process involves multiple steps, first cleaning the brush, then removing particles from the probe card, and finally cleaning the needle tip, which increases the complexity of the operation.

[0012] Therefore, in order to improve the efficiency and effectiveness of probe card cleaning, it is necessary to develop a new type of cleaning tool that can quickly blow away particles on the probe card while cleaning the needle tip. Utility Model Content

[0013] The utility model aims to solve the shortcomings in the prior art and proposes an integrated circuit probe card cleaning device.

[0014] In order to achieve the above-mentioned purpose, the utility model adopts the following technical scheme: an integrated circuit probe card cleaning device, including a device body, one end of which is fixedly connected to a plurality of cleaning brushes, a gas flow regulating valve is arranged in the middle of the device body, an end of the device body away from the cleaning brush is fixedly connected to an air pipe, and a gas nozzle is fixedly installed at one end of the device body, and the gas nozzle is installed inside the cleaning brush.

[0015] As a further description of the above technical solution:

[0016] The gas pipe passes through the interior of the device body and is connected to the gas flow regulating valve and the gas nozzle.

[0017] As a further description of the above technical solution:

[0018] Gas particles are passed through the trachea.

[0019] As a further description of the above technical solution:

[0020] The gas flow regulating valve can regulate the connection between the gas pipe and the gas nozzle and the size of the gas flow.

[0021] As a further description of the above technical solution:

[0022] One end of the air pipe away from the device body is connected to the air gun.

[0023] As a further description of the above technical solution:

[0024] The integrated circuit probe card cleaning device is suitable for use on various probe cards.

[0025] As a further description of the above technical solution:

[0026] The time it takes for the integrated circuit probe card cleaning device to clean a probe card is 20 minutes.

[0027] The utility model has the following beneficial effects: in the utility model, by integrating the cleaning brush and the gas nozzle into a single device, the operator can perform brushing and purging operations in one step, thereby significantly reducing the total time required for cleaning the probe card; due to the integrated design of the cleaning device, the multiple steps required in the traditional cleaning process are reduced, the complexity of manual operation is reduced, and the efficiency of the cleaning work is improved; the improved cleaning brush design, combined with the direct action of the gas nozzle, can more effectively remove tiny particles at the tip of the probe, reduce the residual particles on the surface of the needle tip, and improve the cleaning quality; by setting the gas flow regulating valve, the operator can adjust the gas flow according to the actual situation of the probe card and the cleaning requirements to achieve the best cleaning effect; using the improved cleaning device can greatly reduce the time required for manual cleaning of the needle tip during the production process every day, thereby improving the operating efficiency of the production line. The utility model can perform more effective cleaning, help ensure the performance of the probe card, reduce the potential damage to the probe card caused by pollutants, thereby improving the accuracy of electrical testing when in contact with the chip and extending the service life of the probe card. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 This is a schematic diagram of the structure of the integrated circuit probe card cleaning device proposed by the utility model;

[0029] Figure 2 for Figure 1 Enlarged view of point A in the middle.

[0030] Legend:

[0031] 1. Device body; 2. Cleaning brush; 3. Gas flow regulating valve; 4. Air pipe; 5. Gas nozzle. DETAILED DESCRIPTION

[0032] The following will be combined with the drawings in the embodiments of the utility model to clearly and completely describe the technical solutions in the embodiments of the utility model. Obviously, the described embodiments are only part of the embodiments of the utility model, not all of the embodiments. Based on the embodiments in the utility model, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the utility model.

[0033] Reference Figure 1The utility model provides an embodiment: an integrated circuit probe card cleaning device, including a device body 1, the device body 1 serves as the base of the cleaning device, carrying all other components to ensure the stability and durability of the overall structure, and a plurality of cleaning brushes 2 are fixedly connected to one end of the device body 1, and the cleaning brushes 2 directly contact the surface of the probe card for physical cleaning. The design of multiple cleaning brushes 2 can increase the cleaning area and improve the cleaning efficiency. A gas flow regulating valve 3 is arranged in the middle of the device body 1, and the body flow regulating valve is used to control the gas flow through the air pipe 4, allowing the operator to adjust the air flow size according to different cleaning requirements and optimize the cleaning effect. The end of the device body 1 away from the cleaning brush 2 is fixedly connected to the air pipe 4, which transmits compressed gas to the cleaning device to ensure the stability and convenience of gas delivery. A gas nozzle 5 is fixedly installed at one end of the device body 1, and the gas nozzle 5 is responsible for directly applying compressed gas to the probe card to remove particles through airflow. The gas nozzle 5 is installed inside the cleaning brush 2.

[0034] The gas pipe 4 passes through the interior of the device body 1 and is connected to the gas flow regulating valve 3 and the gas nozzle 5 .

[0035] Gas particles are passed through the air pipe 4. The gas particles are compressed air or other inert gases transmitted in the air pipe 4. The gas particles are output through the nozzle in the form of high-speed airflow, which helps to quickly remove pollutants on the probe card.

[0036] The air pipe 4 is made of pressure-resistant and flexible material to adapt to cleaning operations at different angles and positions, while also being able to reduce wear.

[0037] The gas flow regulating valve 3 can adjust the on-off state between the gas pipe 4 and the gas nozzle 5 and the size of the gas flow. The gas flow regulating valve 3 allows the operator to adjust the gas flow according to the cleaning difficulty of different probe cards to optimize the cleaning effect.

[0038] One end of the air pipe 4 away from the device body 1 is connected to the air gun, and the cleaning device is connected to the air gun through a standard quick connector to ensure the stability and convenience of gas delivery.

[0039] The integrated circuit probe card cleaning device is suitable for use on various probe cards.

[0040] The integrated circuit probe card cleaning device takes 20 minutes to clean a probe card and can clean about 20 probe cards a day. The traditional wind takes about 40 minutes to clean each probe card, and the number of probe cards that can be cleaned in a day is limited, only about 10 probe cards.

[0041] Working principle:

[0042] Preparation stage: The operator connects the air gun to the air pipe 4 of the cleaning device. Through the gas flow regulating valve 3, the operator can preset the size of the gas flow to meet different cleaning needs;

[0043] Cleaning start: The operator turns on the air gun, and the gas is transmitted to the gas nozzle 5 through the gas pipe 4. Since the gas nozzle 5 is installed inside the cleaning brush 2, the gas can not only blow directly to the probe card, but also drive the cleaning brush 2 to swing;

[0044] Synchronous cleaning: The synchronous action of the cleaning brush 2 and the gas nozzle 5 causes the contaminants on the probe card to be subjected to forces in two directions: one is the airflow directly blown out by the gas nozzle 5, which can quickly remove larger or looser particles; the other is through the physical contact of the brush, which can effectively remove stubborn or smaller particles;

[0045] Flow regulation: During the entire cleaning process, the operator can adjust the size of the gas flow in real time through the gas flow regulating valve 3 according to the actual situation of the contaminants on the probe card to meet the needs of the cleaning process;

[0046] Cleaning completed: After the contaminants on the probe card have been effectively removed, the operator can turn off the air gun, thus ending the cleaning process;

[0047] The design of the cleaning device shortens the time for cleaning a probe card to about 20 minutes, and 20 probe cards can be cleaned a day. Compared with the traditional cleaning method, which takes 40 minutes and can only clean about 10 probe cards, the efficiency of the cleaning device is significantly improved. Due to the integrated design of the cleaning brush 2 and the gas nozzle 5, the cleaning process is more uniform and thorough, ensuring the cleaning quality of the probe card. The design of the cleaning brush 2 allows quick replacement, ensuring the long-term and effective operation of the cleaning device.

[0048] Finally, it should be noted that the above are only preferred embodiments of the present invention and are not intended to limit the present invention. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art can still modify the technical solutions described in the aforementioned embodiments or make equivalent substitutions for some of the technical features therein. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. An integrated circuit probe card cleaning device, comprising a device body (1), characterized in that: A plurality of cleaning brushes (2) are fixedly connected to one end of the device body (1); a gas flow regulating valve (3) is arranged in the middle of the device body (1); an air pipe (4) is fixedly connected to one end of the device body (1) away from the cleaning brushes (2); a gas nozzle (5) is fixedly installed at one end of the device body (1); and the gas nozzle (5) is installed inside the cleaning brush (2).

2. The integrated circuit probe card cleaning device according to claim 1, characterized in that: The gas pipe (4) passes through the interior of the device body (1) and is connected to the gas flow regulating valve (3) and the gas nozzle (5).

3. The integrated circuit probe card cleaning device according to claim 2, characterized in that: Gas particles are passed through the air pipe (4).

4. The integrated circuit probe card cleaning device according to claim 3, characterized in that: The gas flow regulating valve (3) can regulate the connection between the gas pipe (4) and the gas nozzle (5) as well as the size of the gas flow.

5. The integrated circuit probe card cleaning device according to claim 4, characterized in that: One end of the air pipe (4) away from the device body (1) is connected to the air gun.

6. The integrated circuit probe card cleaning device according to claim 5, characterized in that: The integrated circuit probe card cleaning device is suitable for use on various probe cards.

7. The integrated circuit probe card cleaning device according to claim 5, characterized in that: The time it takes for the integrated circuit probe card cleaning device to clean a probe card is 20 minutes.

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