Connection fault diagnosis device of processor chip test board
By designing the connection fault diagnosis device of the processor chip test board, using LED lights and gold fingers to detect the connection fault of the processor chip test board, the problem of difficulty in fault location during the test is solved, and the testing efficiency and fault coverage are improved.
Patent Information
- Application Number
- CN202420884385.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-04-26
- Publication Date
- 2025-02-25
- Estimated Expiration
- 2034-04-26
AI Technical Summary
In the processor chip test, there are problems such as large test vectors, large test power consumption, high test temperature and difficult positioning of test board faults.
A connection fault diagnosis device for the processor chip test board is designed, including power supply, switch, resistor, LED lamp and gold finger. The PIN pin of the processor chip is connected through the gold finger and the LED lamp is turned on and off. Fault.
The failure path positioning of the processor chip is realized, testing efficiency and fault coverage are improved, and the effective utilization efficiency of automatic test equipment (ATE) is improved.
Smart Images
Figure CN222529477U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of integrated circuit testing, and more specifically to a connection fault diagnosis device for a processor chip testing board. Background Art
[0002] The processor chip includes interfaces such as MM0, MM1, I2C0, I2C1, I2C2, PCIE, UART, SPI, SPI0, SPI1, SPI2, and SPI3. The ultra-high-speed interface rate is above 10Gbps, and the number of chip pins is ≥4000pin. The processor chip has many pins, large scale, large memory, and high power consumption, which makes testing difficult. It is difficult to perform high fault coverage testing on the processor chip only through ATE. The processor chip has high power consumption, and excessively high temperatures when the chip is working may damage the chip. It is necessary to monitor the temperature in real time during the chip testing process to ensure the stability and accuracy of the chip testing. At the same time, the processor chip test board has many pins and a large scale, which is prone to problems such as contact failure. Summary of the invention
[0003] The utility model aims to solve at least one of the technical problems existing in the prior art and provides a connection fault diagnosis device for a processor chip test board to solve the problems existing in the prior art of large processor chip test vectors, high test power consumption, high test temperature and test board fault locating.
[0004] As a first aspect of the utility model, a connection fault diagnosis device for a processor chip test board is provided, which is used for diagnosing the connection fault of the processor chip test board. The connection fault diagnosis device for the processor chip test board comprises a power supply, a switch, a resistor, an LED lamp and a gold finger, the power supply is connected to the switch, the switch is connected to the resistor, the resistor is connected to the LED lamp, and the LED lamp is connected to the PIN pin of the gold finger; a DDR slot and a socket are arranged on the processor chip test board, a processor chip is arranged on the socket, the connection fault diagnosis device for the processor chip test board is installed inside the DDR slot through the gold finger, the gold finger is connected to the PIN pin of the processor chip through the processor chip test board and the socket, and the PIN pin of the processor chip is connected to the ground through the diode inside the processor chip; if the LED lamp does not emit light, it means that there is a fault in the connection of the processor chip test board; if the LED lamp emits light, it means that there is no fault in the connection of the processor chip test board.
[0005] Furthermore, the connection fault diagnosis device of the processor chip test board also includes a power supply module, the power supply module includes a power supply voltage regulator chip U1, the LED lamp is a light-emitting diode, the power supply voltage regulator chip U1 is connected to a resistor through a button switch S1, the resistor is connected to the positive electrode of the light-emitting diode, and the negative electrode of the light-emitting diode is connected to the PIN pin of the gold finger; the power supply voltage regulator chip U1 converts an external 5V power supply into a stable 3.3V power supply, and the 3.3V power supply powers the connection fault diagnosis device of the processor chip test board.
[0006] Furthermore, the model of the power supply voltage regulator chip U1 is MP2104.
[0007] Furthermore, the size of the gold finger is consistent with the size of the DDR slot.
[0008] Furthermore, the processor chip includes a temperature sensor and MM0, MM1, I2C0, I2C1, I2C2, PCIE, UART, SPI, SPI0, SPI1, SPI2, and SPI3 interfaces. The processor chip is connected to the DDR memory stick through the MM0 and MM1 interfaces, the processor chip is connected to the FLASH chip through the SPI, SPI0, SPI1, SPI2, and SPI3 interfaces, and the processor chip is connected to the EEPROM chip through the I2C0, I2C1, and I2C2 interfaces; the I2C2 interface is also connected to the temperature sensor TEMP.
[0009] Furthermore, the DDR memory bar is connected to the processor chip test board via a DDR slot, and the EEPROM chip and the FLASH chip are both mounted on the processor chip test board via a soldering process.
[0010] The connection fault diagnosis device for the processor chip test board provided by the utility model has the following advantages: it can realize the failure path positioning of the processor chip, improve the test efficiency and test fault coverage of the processor chip, and improve the effective utilization efficiency of ATE. BRIEF DESCRIPTION OF THE DRAWINGS
[0011] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the following specific embodiments, they are used to explain the present invention, but do not constitute a limitation to the present invention.
[0012] Figure 1 This is a schematic diagram of a connection fault diagnosis device for a processor chip test board according to an embodiment of the utility model for diagnosing the test board.
[0013] Figure 2It is a schematic diagram of a connection fault diagnosis device of a processor chip test board and a PIN pin schematic diagram of a processor chip in an embodiment of the utility model.
[0014] Figure 3 The present invention is a circuit diagram of a connection fault diagnosis device for a processor chip test board according to an embodiment of the present invention.
[0015] Figure 4 The present invention is a flowchart of a method for diagnosing connection faults of a processor chip test board according to an embodiment of the present invention.
[0016] Figure 5 This is an overall test diagram of the processor chip of an embodiment of the present utility model.
[0017] Figure 6 This is a PCIE loop test diagram of an embodiment of the present utility model.
[0018] Figure 7 This is a UART serial port test diagram of an embodiment of the utility model.
[0019] Figure 8 This is an I2C interface test diagram of an embodiment of the present utility model.
[0020] Fig. 9 This is a SPI interface test diagram of an embodiment of the utility model. DETAILED DESCRIPTION
[0021] In order to further explain the technical means and effects adopted by the present invention to achieve the predetermined purpose of the utility model, the specific implementation method, structure, characteristics and effects of the connection fault diagnosis device of the processor chip test board proposed by the present invention are described in detail below in combination with the accompanying drawings and preferred embodiments. Obviously, the described embodiments are part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work belong to the protection scope of the present invention.
[0022] It should be noted that the terms "first", "second", etc. in the specification and claims of the utility model and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so as to describe the embodiments of the utility model described here. In addition, the terms "including" and "having" and any of their variations are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.
[0023] In this embodiment, a connection fault diagnosis device for a processor chip test board is provided. Figure 1-2 As shown, the connection fault diagnosis device of the processor chip test board is used to diagnose the connection fault of the processor chip test board, and the connection fault diagnosis device of the processor chip test board includes a power supply, a switch, a resistor, an LED lamp and a gold finger, the power supply is connected to the switch, the switch is connected to the resistor, the resistor is connected to the LED lamp, and the LED lamp is connected to the PIN pin of the gold finger; a DDR slot and a socket are arranged on the processor chip test board, a processor chip is arranged on the socket, the connection fault diagnosis device of the processor chip test board is installed inside the DDR slot through the gold finger, the gold finger is connected to the PIN pin of the processor chip through the processor chip test board and the socket, and the PIN pin of the processor chip is connected to the ground through the diode inside the processor chip; if the LED lamp does not emit light, it means that there is a fault in the connection of the processor chip test board; if the LED lamp emits light, it means that there is no fault in the connection of the processor chip test board.
[0024] It should be noted that the connection fault diagnosis device of the processor chip test board can be a fault diagnosis board, the size of the gold finger is consistent with the size of the DDR slot, the fault diagnosis board is inserted into the DDR slot through the gold finger, the fault diagnosis board is inserted into the DDR4 slot through the gold finger to connect the power supply and ground, and is connected to the processor chip to be tested through the test board and the socket. Based on the on and off of the LED light of the fault diagnosis board, the failure path between the processor chip-socket-test board-DDR slot is located.
[0025] Preferably, if Figure 3 As shown, the connection fault diagnosis device of the processor chip test board also includes a power supply module, the power supply module includes a power supply voltage regulator chip U1, the LED lamp is a light emitting diode, the power supply voltage regulator chip U1 is connected to a resistor via a button switch S1, the button switch S1 plays a role of on and off, the resistor plays a role of voltage division protection, the resistor is connected to the positive electrode of the light emitting diode, and the negative electrode of the light emitting diode is connected to the PIN pin (signal communication pin) of the gold finger; the gold finger has a total of 288 pins, among which the signal communication pins (DQ, ADD signal pins) are respectively connected to the negative electrode of the light emitting diode.
[0026] The power supply voltage regulator chip U1 converts the external 5V power supply into a stable 3.3V power supply, and the 3.3V power supply powers the connection fault diagnosis device of the processor chip test board. The 3.3V power supply passes through the LED lamp and the PIN pin on the gold finger, and is grounded through the processor chip pin and the diode. When a path is formed, the LED lamp lights up, otherwise the LED lamp does not light up.
[0027] It should be noted that the fault diagnosis board is powered on by power supply. If the LED on the fault diagnosis board lights up, it means that the corresponding processor chip pin is in good contact with the DDR slot; if the LED on the fault diagnosis board does not light up, it means that the corresponding processor chip pin is failing to contact with the DDR slot.
[0028] Specifically, the model of the power supply voltage regulator chip U1 is MP2104.
[0029] Specifically, Figure 5 As shown, the processor chip includes a temperature sensor and MM0, MM1, I2C0, I2C1, I2C2, PCIE, UART, SPI, SPI0, SPI1, SPI2, and SPI3 interfaces. The processor chip is connected to the DDR memory stick through the MM0 and MM1 interfaces, the processor chip is connected to the FLASH chip through the SPI, SPI0, SPI1, SPI2, and SPI3 interfaces, and the processor chip is connected to the EEPROM chip through the I2C0, I2C1, and I2C2 interfaces; the I2C2 interface is also connected to the temperature sensor TEMP.
[0030] In the embodiment of the utility model, the processor chip test board implements ultra-high-speed interface testing through an inner loop test; implements memory access testing of the processor chip based on an external DDR memory stick, supports multiple data transmission rates such as 2133 / 2400 / 2667 / 3200Mbps, and supports memory sticks of three types of particles: x4, x8 and x16; records the temperature sensor information of the test board through an external EEPROM chip to achieve real-time monitoring of the test temperature; and burns test instructions based on an external FLASH chip to achieve automated testing of the processor chip.
[0031] Specifically, the ultra-high-speed interface test mainly includes interface tests such as PCIE and UART. The processor chip includes a PCIE4.0x16 interface, which is 1 x16 or split into 2 x8. The test board implements the PCIE interface test through an inner loop connection, such as Figure 6 This part is the PCIE loopback test loopback system. TX passes through a 0.1uF (C1005X7R1C104K) capacitor to RX, which can support a test rate of more than 5Gbps. TX / RX can pass through a 0R resistor to the ATE test system to achieve continuity testing.
[0032] Specifically, the processor chip includes an ASP_UART interface, which is serially connected to the DMRS-9P connector and looped back to implement a two-way communication test of the ASP_UART interface, such as Figure 7As shown in the figure, this part is the UART serial port test solution. The UART serial port uses a DMRS-9P connector. It can realize bidirectional data transmission through the four-way data signals of RXD / TXD / RTS / CTS, and can receive data while transmitting data.
[0033] Specifically, the external EEPROM chip is connected to the I2C interface, and the I2C is also connected to the temperature sensor (TEMP) of the processor. By reading and writing the EEPROM, the sensor temperature information is read, and the temperature of the test board is monitored online and in real time. Figure 8 This part is the I2C interface test solution. The processor has three I2C interfaces, which are connected to three EEPROMs (256-Kbit CMOS EEPROM) through two SCL / SDA signal lines. I2C2 is also connected to the processor's temperature sensor to read and record temperature information.
[0034] Specifically, the external FLASH chip is connected to the SPI interface of the processor chip, and is mainly used to store SROM, HMCODE, BIOS files and for ASP firmware loading and function testing, such as Fig. 9 This part is the SPI interface test solution. The processor has four SPI interfaces. Through the external connection of four Flash chips (GD5F4GQ6REYIG), SPI3 is connected to the ATE test system through a 0 ohm resistor for continuity test.
[0035] Specifically, the DDR memory bar is connected to the processor chip test board through a DDR slot, and the EEPROM chip and the FLASH chip are both mounted on the processor chip test board through a soldering process.
[0036] The external EEPROM, FLASH, sensors and other devices have fewer pins connected to the test board and are connected through surface mounting technology, so no on-off failure occurs.
[0037] The external DDR memory stick has many pins connected to the test board, and is connected through a slot, which is prone to on-off failure. Contact failure points exist between the processor chip and the socket, between the socket and the test board, and between the test board and the DDR slot, such as Figure 4 As shown, as long as there is a poor contact at one position, the DDR memory bar will fail to contact, thereby affecting the processor chip test. Therefore, the connection fault diagnosis device of the processor chip test board provided by the utility model is used to diagnose the connection fault during the test of the processor chip test board.
[0038] As another embodiment of the present invention, Figure 4As shown, a connection fault diagnosis method for a processor chip test board is provided, and the test is implemented by the connection fault diagnosis device for the processor chip test board described above. The connection fault diagnosis method for the processor chip test board includes:
[0039] After the switch is closed, the connection fault of the processor chip test board is diagnosed according to the on and off condition of the LED lamp;
[0040] When the LED light is on, it is determined that there is no fault in the connection of the processor chip test board;
[0041] When the LED lamp does not emit light, it is determined that there is a fault in the connection of the processor chip test board.
[0042] Preferably, when the LED light is on, it is determined that there are no faults in the contact between the processor chip and the socket, the contact between the socket and the processor chip test board, and the contact between the processor chip test board and the DDR slot; conversely, when the LED light is not on, it is determined that there are faults in the contact between the processor chip and the socket, the contact between the socket and the processor chip test board, and the contact between the processor chip test board and the DDR slot.
[0043] The connection fault diagnosis method of the processor chip test board provided by the utility model can realize the failure path positioning of the processor chip, improve the test efficiency and test fault coverage of the processor chip, and improve the effective utilization efficiency of ATE.
[0044] The above description is only a preferred embodiment of the utility model, and does not limit the utility model in any form. Although the utility model has been disclosed as a preferred embodiment as above, it is not used to limit the utility model. Any technician familiar with this profession can make some changes or modify the technical contents disclosed above into equivalent embodiments without departing from the scope of the technical solution of the utility model. However, any simple modification, equivalent change and modification made to the above embodiments based on the technical essence of the utility model without departing from the content of the technical solution of the utility model still fall within the scope of the technical solution of the utility model.
Claims
1. A connection fault diagnosis device for a processor chip test board, used for diagnosing a connection fault of a processor chip test board, characterized in that: The connection fault diagnosis device of the processor chip test board includes a power supply, a switch, a resistor, an LED lamp and a gold finger, the power supply is connected to the switch, the switch is connected to the resistor, the resistor is connected to the LED lamp, and the LED lamp is connected to the PIN pin of the gold finger; a DDR slot and a socket are arranged on the processor chip test board, a processor chip is arranged on the socket, the connection fault diagnosis device of the processor chip test board is installed inside the DDR slot through the gold finger, the gold finger is connected to the PIN pin of the processor chip through the processor chip test board and the socket, and the PIN pin of the processor chip is connected to the ground through the diode inside the processor chip; if the LED lamp does not emit light, it means that there is a fault in the connection of the processor chip test board; if the LED lamp emits light, it means that there is no fault in the connection of the processor chip test board.
2. A connection fault diagnosis device for a processor chip test board according to claim 1, characterized in that: The connection fault diagnosis device of the processor chip test board also includes a power supply module, which includes a power supply voltage regulator chip U1. The LED lamp is a light-emitting diode. The power supply voltage regulator chip U1 is connected to a resistor through a button switch S1. The resistor is connected to the positive electrode of the light-emitting diode, and the negative electrode of the light-emitting diode is connected to the PIN pin of the gold finger. The power supply voltage regulator chip U1 converts an external 5V power supply into a stable 3.3V power supply, and the 3.3V power supply powers the connection fault diagnosis device of the processor chip test board.
3. A connection fault diagnosis device for a processor chip test board according to claim 1, characterized in that: The model of the power supply voltage regulator chip U1 is MP2104.
4. A connection fault diagnosis device for a processor chip test board according to claim 1, characterized in that: The size of the gold finger is consistent with the size of the DDR slot.
5. The connection fault diagnosis device for a processor chip test board according to claim 1, characterized in that: The processor chip includes a temperature sensor and MM0, MM1, I2C0, I2C1, I2C2, PCIE, UART, SPI, SPI0, SPI1, SPI2, and SPI3 interfaces. The processor chip is connected to a DDR memory stick through the MM0 and MM1 interfaces. The processor chip is connected to a FLASH chip through the SPI, SPI0, SPI1, SPI2, and SPI3 interfaces. The processor chip is connected to an EEPROM chip through the I2C0, I2C1, and I2C2 interfaces. The I2C2 interface is also connected to a temperature sensor TEMP.
6. A connection fault diagnosis device for a processor chip test board according to claim 5, characterized in that: The DDR memory bar is connected to the processor chip test board through a DDR slot, and the EEPROM chip and the FLASH chip are both mounted on the processor chip test board through a soldering process.