Online visual detection device

By designing a three-axis adjustable platform structure and adjustable angle adjustment components, the microscope's posture limitations and inconvenience in operating when observing IC cassette products are solved, and the microscope's flexible adjustment and change of observation angle is realized, improving detection efficiency and product quality.

CN222545254UActive Publication Date: 2025-02-28MUEHLBAUER TECH WUXI CO LTD
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Patent Information

Application Number
CN202323392458.X
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2023-12-13
Publication Date
2025-02-28
Estimated Expiration
2033-12-13

AI Technical Summary

Technical Problem

In the prior art, microscopes have problems such as posture limitations, inability to adjust the observation angle and inconvenient operation when observing IC cassette products, resulting in low detection efficiency and low product quality.

Method used

An online visual inspection device is designed, including a three-axis adjustable platform structure and an adjustable angle adjustment component. Through the X-axis, Y-axis, Z-axis adjustment mechanism and adjustment components, the microscope can be flexibly adjusted and the observation angle change.

Benefits of technology

It improves the environmental adaptability of the microscope, avoids the limitations of body posture and observation angle, enhances the accuracy of detection and the life of the equipment, and is economical and practical.

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Abstract

The utility model relates to an online visual detection device, and belongs to the technical field of vision. According to the utility model, through the arrangement of the three-axis adjustable platform structure and the angle-adjustable adjusting assembly, the flexible adjustment of the microscope during the observation and detection of an IC card belt product is realized, the environmental adaptability of the microscope is improved, and the limitation problem of the body posture and the observation angle is avoided; meanwhile, the guide piece, the copper sleeve and other structures are additionally arranged, so that the observation and detection accuracy is further improved, the service life of equipment is prolonged, and economy and practicability are achieved.
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Description

Technical Field

[0001] The utility model relates to an online visual detection device, belonging to the field of visual technology. Background Art

[0002] After the IC card has been chip tested or the glue has been UV cured, a microscope is needed to be used to observe the actual situation of the IC card product on the product track. However, the current prior art uses a microscope to observe the actual situation of the IC card product, which has the problems of limited posture when using the microscope, inability to adjust the observation angle of the microscope, inconvenient operation, and inconvenient adjustment, resulting in inconvenient observation of the product.

[0003] Therefore, there is an urgent need to find a device that can flexibly adjust the observation angle and observation position of a microscope to improve the work efficiency of detection and observation and improve product quality. Utility Model Content

[0004] In order to solve the above problems, the utility model provides an online visual inspection device, comprising:

[0005] a platform having support feet mounted thereon; and

[0006] An X-axis adjustment mechanism, mounted on the platform, the X-axis adjustment mechanism being movable in the X-axis direction; and

[0007] A Z-axis adjustment mechanism, mounted on the X-axis adjustment mechanism, the Z-axis adjustment mechanism being movable in the Z-axis direction; and

[0008] A product track mounted on the platform; and

[0009] A Y-axis adjustment mechanism connected to the Z-axis adjustment mechanism, wherein the Y-axis adjustment mechanism includes an adjustment component that can move in the Y-axis direction; and

[0010] A microscope is connected to the adjustment component, and the adjustment component can change the angle of the microscope.

[0011] It should be understood that the IC card product can be placed on the product track, and the spatial position of the microscope can be adjusted by adjusting the X-axis adjustment mechanism, the Y-axis adjustment mechanism, and the Z-axis adjustment mechanism. The observation angle of the microscope can also be adjusted by adjusting the components. The purpose of setting the support feet is to be on the back side of the IC card gluing machine or the IC card testing machine frame.

[0012] Furthermore, the X-axis adjustment mechanism includes a support connected to the platform and an X-axis linear module installed on the support, the X-axis linear module includes an X-axis slide rail and an X-axis slider installed on the X-axis slide rail; the Z-axis adjustment mechanism includes a Z-axis slide rail connected to the X-axis slider and a Z-axis slider installed on the Z-axis slide rail.

[0013] Furthermore, the adjustment component comprises:

[0014] At least one Y-axis slide rail connected to the Z-axis slider; and

[0015] A Y-axis slider, mounted on the Y-axis slide rail; and

[0016] A rotating member is arranged on the Y-axis slider and connected to the microscope, and the rotating member cooperates with the handle.

[0017] It should be understood that the X-axis slide rail, the Y-axis slide rail, and the Z-axis slide rail are slide rails whose track directions are consistent with the X-axis, the Y-axis, and the Z-axis, respectively.

[0018] In one embodiment of the utility model, there are two Y-axis slide rails, including a first Y-axis slide rail and a second Y-axis slide rail; the Y-axis slider is installed on the first Y-axis slide rail; the Y-axis slider is also connected to a guide member, and the guide member cooperates with the second Y-axis slide rail.

[0019] In one embodiment of the present invention, the Y-axis slider is installed on the first Y-axis slide rail through a copper sleeve, wherein the copper sleeve has a self-lubricating effect and can reduce damage caused by friction.

[0020] Furthermore, the guide member includes at least one guide wheel shaft connected to the Y-axis slider and a guide wheel installed on the guide wheel shaft, and the guide wheel cooperates with the second Y-axis slide rail; the rotating member includes a rotating member that passes through the Y-axis slider and is connected to the microscope; the Y-axis slider has a clamping mechanism, and the clamping mechanism clamps the guide member; the clamping mechanism has a through hole, and a fastening screw is fitted in the through hole.

[0021] It should be understood that the smooth rolling cooperation between the guide wheel and the second Y-axis slide rail can ensure that the Y-axis position of the microscope is adjusted more slowly and accurately, thereby improving the accuracy of inspecting IC card products; and when the Y-axis slider and the microscope are moved to the appropriate position on the Y-axis, they can be positioned by tightening the fastening screws, conversely, the Y-axis slider and the microscope can be moved by loosening the fastening screws.

[0022] Beneficial effects of the utility model:

[0023] The utility model realizes flexible adjustment of the microscope when observing and detecting IC card products by providing a three-axis adjustable platform structure and an adjustable angle adjustment component, improves the environmental adaptability of the microscope, and avoids the limitations of body position and observation angle; at the same time, the addition of guide parts, copper sleeves and other structures further improves the accuracy of observation and detection and the life of the equipment, which is economical and practical. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 It is a schematic diagram of the overall structure of one implementation of the utility model.

[0025] Figure 2 It is a schematic diagram of the structure on the platform in one embodiment of the utility model.

[0026] Figure 3 It is a structural schematic diagram of an adjustment component in one embodiment of the utility model.

[0027] In the figure, 1: platform, 2: supporting feet, 3: X-axis adjustment mechanism, 4: Y-axis adjustment mechanism, 5: Z-axis adjustment mechanism, 6: adjustment component, 7: microscope, 8: product track, 9: copper sleeve, 10: guide part, 11: clamping mechanism, 12: rotating part, 13: handle, 14: through hole; 31: X-axis slide rail, 32: X-axis slider, 411: first Y-axis slide rail, 412: second Y-axis slide rail, 42: Y-axis slider, 51: Z-axis slide rail, 52: Z-axis slider. DETAILED DESCRIPTION

[0028] Example 1

[0029] The utility model provides an online visual detection device, comprising:

[0030] A platform 1, wherein the platform has a support foot 2, and the support foot 2 is mounted on an IC card tape gluing machine or an IC card tape testing machine frame; and

[0031] An X-axis adjustment mechanism 3 is installed on the platform 1, the X-axis adjustment mechanism 3 includes a support connected to the platform and an X-axis linear module installed on the support, the X-axis linear module includes an X-axis slide rail 31 and an X-axis slider 32 installed on the X-axis slide rail 31; and

[0032] A Z-axis adjustment mechanism 5 is installed on the X-axis adjustment mechanism 3; the Z-axis adjustment mechanism 5 includes a Z-axis slide rail 51 connected to the X-axis slide block 32 and a Z-axis slide block 52 installed on the Z-axis slide rail 51; and

[0033] A product track 8 mounted on the platform 1; and

[0034] A Y-axis adjustment mechanism 4 connected to the Z-axis adjustment mechanism 5, wherein the Y-axis adjustment mechanism 4 includes an adjustment component 6 that can move in the Y-axis direction; and

[0035] The microscope 7 is connected to the adjustment component 6 , and the adjustment component 6 can change the angle of the microscope 7 .

[0036] The IC card product can be placed on the product track 8, and the spatial position of the microscope 7 can be adjusted by adjusting the X-axis adjustment mechanism 3, the Y-axis adjustment mechanism 4, and the Z-axis adjustment mechanism 5. The observation angle of the microscope 7 can also be adjusted by adjusting the component 6. The support foot 2 is set at the rear side of the IC card gluing machine or the IC card testing machine frame.

[0037] The adjustment component 6 comprises:

[0038] Two Y-axis slide rails are connected to the Z-axis slide block, the Y-axis slide rails include a first Y-axis slide rail 411 and a second Y-axis slide rail 412; the Y-axis slide block 42 is installed on the first Y-axis slide rail 411; the Y-axis slide block 42 is also connected to a guide member 10, and the guide member 10 cooperates with the second Y-axis slide rail 412; and

[0039] A Y-axis slider 42 is mounted on the first Y-axis slide rail 411 through a copper sleeve 9; and

[0040] The rotating member 12 is disposed on the Y-axis slider 42 and connected to the microscope 7 . The rotating member 12 cooperates with the handle 13 .

[0041] The guide member 10 includes two guide wheel shafts connected to the Y-axis slider 42 and a guide wheel installed on the guide wheel shaft, and the guide wheel cooperates with the second Y-axis slide rail 412; the rotating member 12 includes a rotating member that passes through the Y-axis slider 42 and is connected to the microscope 7; the Y-axis slider 42 has a clamping mechanism 11, and the clamping mechanism 11 clamps the guide member 10; the clamping mechanism 11 has a through hole 14, and a fastening screw is fitted in the through hole 14.

[0042] The guide wheel and the second Y-axis slide rail 412 roll smoothly together, which can ensure that the Y-axis position of the microscope 7 is adjusted more slowly and accurately, thereby improving the accuracy of inspecting IC card products; when the Y-axis slider 42 and the microscope 7 are moved to the appropriate position on the Y-axis, they can be positioned by tightening the fastening screws, conversely, the Y-axis slider 42 and the microscope 7 can be moved by loosening the fastening screws.

[0043] Although the present invention has been disclosed as above in terms of preferred embodiments, it is not intended to limit the present invention. Anyone familiar with the technology may make various changes and modifications without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention should be based on the definition of the claims.

Claims

1. An online visual inspection device, characterized in that: include: A platform, wherein the platform has supporting feet, and the supporting feet are installed on the rear side of the frame of the IC card tape gluing machine or the IC card tape testing machine; as well as An X-axis adjustment mechanism is installed on the platform, and the X-axis adjustment mechanism can move in the X-axis direction; as well as A Z-axis adjustment mechanism, mounted on the X-axis adjustment mechanism, the Z-axis adjustment mechanism being able to move in the Z-axis direction; as well as A product track, mounted on the platform; as well as A Y-axis adjustment mechanism connected to the Z-axis adjustment mechanism, wherein the Y-axis adjustment mechanism includes an adjustment component that can move in the Y-axis direction; as well as A microscope is connected to the adjustment component, and the adjustment component can change the angle of the microscope.

2. An online visual inspection device according to claim 1, characterized in that: The X-axis adjustment mechanism includes a support connected to the platform and an X-axis linear module installed on the support, and the X-axis linear module includes an X-axis slide rail and an X-axis slider installed on the X-axis slide rail.

3. An online visual inspection device according to claim 2, characterized in that: The Z-axis adjustment mechanism includes a Z-axis slide rail connected to the X-axis slide block and a Z-axis slide block installed on the Z-axis slide rail.

4. An online visual inspection device according to claim 3, characterized in that: The adjustment component comprises: At least one Y-axis slide rail connected to the Z-axis slider; and A Y-axis slider, mounted on the Y-axis slide rail; and A rotating member is arranged on the Y-axis slider and connected to the microscope, and the rotating member cooperates with the handle.

5. An online visual inspection device according to claim 4, characterized in that: There are two Y-axis slide rails, including a first Y-axis slide rail and a second Y-axis slide rail; the Y-axis slider is installed on the first Y-axis slide rail; the Y-axis slider is also connected to a guide member, and the guide member cooperates with the second Y-axis slide rail.

6. An online visual inspection device according to claim 5, characterized in that: The Y-axis sliding block is installed on the first Y-axis sliding rail through a copper sleeve.

7. An online visual inspection device according to claim 5, characterized in that: The guide member includes at least one guide wheel shaft connected to the Y-axis slider and a guide wheel installed on the guide wheel shaft, and the guide wheel cooperates with the second Y-axis slide rail.

8. An online visual inspection device according to claim 5, characterized in that: The rotating member includes a rotating member that penetrates the Y-axis slider and is connected to the microscope.

9. An online visual inspection device according to claim 5, characterized in that: The Y-axis slider has a clamping mechanism, and the clamping mechanism clamps the guide member.

10. An online visual inspection device according to claim 9, characterized in that: The clamping mechanism has a through hole, and a fastening screw is fitted in the through hole.