Testing tool for integrated circuit chip

Abstract

The utility model relates to the technical field of chip testing, and discloses a testing tool of an integrated circuit chip, which comprises a working table, a U-shaped testing table is fixedly connected to the middle position of the top of the working table, a rectangular hole is formed in the middle position of the top of the working table close to the rear end, and four limiting rods are fixedly connected to the bottom of the U-shaped testing table. The bottoms of the four limiting rods penetrate through the rectangular holes, the circumferential surfaces of the four limiting rods are slidably sleeved with the same T-shaped lifting plate, round holes matched with the limiting rods are formed in the four corners of the bottom of the T-shaped lifting plate, the bottoms of the four limiting rods are fixedly connected with limiting blocks, and clamping grooves are formed in the bottoms of the back faces of the limiting rods. According to the utility model, a user only needs to align the chip with the pin jacks, the chip can be automatically plugged and pushed out, the user does not need to plug and pull the chip, and the technical effects of convenience and rapidness, saving of manpower consumption of workers, strong practicability and improvement of test efficiency are realized.

Description

Technical Field

[0001] The utility model relates to the technical field of chip testing, in particular to a testing tool for integrated circuit chips. Background Art

[0002] Integrated circuit chips are the foundation of modern electronic technology. They are widely used in various electronic devices, such as computers, mobile phones, and household appliances. Electronic devices can achieve more complex functions while being smaller in size and consuming less energy. The development of integrated circuit chips has also promoted the progress of the entire electronics industry and provided strong support for the development of high-tech fields such as information technology, communication technology, and artificial intelligence.

[0003] Chips with pins need to be tested by staff before leaving the factory. In the prior art, when testing pin chips, staff generally insert the pin chips into the test equipment and fix them to perform the test. After the test is completed, the pin chip needs to be pulled out of the test equipment and a new pin chip needs to be inserted. The long-term plugging and unplugging of chips makes the staff's fingers sore, so a test tool for integrated circuit chips is designed. Utility Model Content

[0004] The utility model aims to solve the shortcomings in the prior art and proposes a testing tool for integrated circuit chips.

[0005] In order to achieve the above purpose, the utility model adopts the following technical solutions:

[0006] A testing tool for integrated circuit chips comprises a workbench, a U-shaped test bench is fixedly connected to the middle position of the top of the workbench, a rectangular hole is opened near the rear end of the middle position of the top of the workbench, four limit rods are fixedly connected to the bottom of the U-shaped test bench, and the bottoms of the four limit rods all pass through the rectangular holes, the circumferential surfaces of the four limit rods are slidingly sleeved with the same T-shaped lifting plate, four corners of the bottom of the T-shaped lifting plate are opened with circular holes adapted to the limit rods, the bottoms of the four limit rods are fixedly connected to limit blocks, a card slot is opened at the bottom of the back of the limit rod, a strip hole adapted to the T-shaped lifting plate is opened in the middle position of the top of the U-shaped test bench, a U-shaped frame is fixedly connected to the bottom of the workbench near the rear end, a micro-electric push rod is fixedly connected to the top of the U-shaped frame, a lifting plate is fixedly connected to the top of the micro-electric push rod, a back plate is connected to the top of the lifting plate, and a pressing plate is fixedly connected to the top of the back plate through the rectangular hole, and a linkage mechanism is arranged on the back plate.

[0007] As a further solution of the present invention, the linkage mechanism includes a block slidably sleeved on the back plate near the bottom, and the block is adapted to the slot, a square hole adapted to the block is provided on the back plate, the rear end of the block is fixedly connected to a vertical plate, the top and bottom of the vertical plate are slidably connected to a slide rod, two circular holes adapted to the slide rod are provided on the vertical plate, one end of the two slide rods are fixedly connected to the back plate, the other ends of the two slide rods are fixedly connected to the same limit plate, the two slide rods are located between the vertical plate and the limit plate and are sleeved with a spring, and the block is located at the top of the front side of the back plate and is fixedly connected to a right-angled trapezoidal plate.

[0008] As a further solution of the utility model, a same blocking rod is fixedly connected to both sides of the bottom of the U-shaped test bench near the middle of the rear end, and the blocking rod is adapted to the right-angle trapezoidal plate.

[0009] As a further solution of the utility model, the front and rear ends of the top of the U-shaped test bench are both provided with T-slots, T-strips are slidably connected in the two T-slots, and the tops of the two T-strips are both provided with a plurality of pin sockets.

[0010] As a further solution of the utility model, magnetic blocks are fixedly connected on both sides of the top of the U-shaped test bench, and the side sliding sleeve of the U-shaped test bench is provided with an iron rectangular cover. The arrangement of the magnetic blocks and the iron rectangular cover realizes the limitation of the T-bar and prevents the T-bar from sliding.

[0011] As a further solution of the utility model, a control console is fixedly connected to the front end of the top of the workbench, and the control console is respectively connected to the T-bar and the micro electric push rod. A display screen and buttons are provided on the control console, and the display screen enables viewing of the test results.

[0012] The beneficial effects of the utility model are:

[0013] The utility model adopts technical means such as a card block, a right-angle trapezoidal plate, a vertical plate, a T-shaped lifting plate and a limit rod, and starts the micro-electric push rod to retract, and presses the pin chip downward through the pressing plate to achieve contact between the pin chip and the contact in the pin socket. After completion, the micro-electric push rod is started to extend, and the T-shaped lifting plate is driven to rise together, thereby pushing the pin chip out of the pin socket to loosen it, and the pressing plate continues to rise. At this time, the user can take away the tested pin chip, which effectively solves the problem raised in the background technology, and then the user only needs to align the chip with the pin socket to achieve automatic chip insertion and ejection, so that the user does not need to plug and unplug, which is convenient and fast, saves the manpower consumption of the staff, has strong practicality, and has the technical effect of improving the efficiency of testing.

[0014] The utility model provides a T-shaped bar, a pin socket, a magnetic block and an iron rectangular cover. When the T-shaped bar needs to be replaced, the iron rectangular cover is separated from the magnetic block, the T-shaped bar is slid out, and a new T-shaped bar is inserted to replace the pin socket, thereby testing chips with different pins, further improving practicality. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 This is a schematic diagram of the overall structure of an integrated circuit chip testing tool proposed by the utility model;

[0016] Figure 2 This is a schematic cross-sectional structural diagram of a workbench of an integrated circuit chip testing tool proposed by the utility model;

[0017] Figure 3 This is a structural schematic diagram of the back plate of a testing tool for an integrated circuit chip proposed by the utility model;

[0018] Figure 4 The utility model is a schematic diagram of the disassembled structure of a U-shaped test bench of a test tool for an integrated circuit chip.

[0019] In the figure: 1. workbench; 2. control console; 201. display screen; 202. button; 3. U-shaped frame; 301. micro electric push rod; 302. lifting plate; 303. back plate; 304. pressing plate; 4. U-shaped test bench; 401. bar hole; 402. stop rod; 403. T-shaped bar; 404. pin socket; 405. magnetic block; 406. iron rectangular cover; 5. card block; 501. right-angle trapezoidal plate; 502. vertical plate; 503. sliding rod; 504. spring; 505. limit plate; 6. T-shaped lifting plate; 601. card slot; 602. limit rod. DETAILED DESCRIPTION

[0020] The technical solutions in the embodiments of the present invention will be described clearly and completely below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all of the embodiments.

[0021] It should be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present application can be combined with each other. The present utility model will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0022] Reference Figure 1-Figure 4A test fixture for integrated circuit chips includes a workbench 1, a U-shaped test table 4 is fixedly connected to the middle position of the top of the workbench 1, a rectangular hole is opened near the rear end of the middle position of the top of the workbench 1, four limit rods 602 are fixedly connected to the bottom of the U-shaped test table 4, and the bottoms of the four limit rods 602 all pass through the rectangular holes, and the circumferential surfaces of the four limit rods 602 are slidingly sleeved with the same T-shaped lifting plate 6, and the four corners of the bottom of the T-shaped lifting plate 6 are opened with circular holes adapted to the limit rods 602, and the bottoms of the four limit rods 602 are fixedly connected A limit block is connected, a card slot 601 is opened at the bottom of the back side of the limit rod 602, a strip hole 401 adapted to the T-shaped lifting plate 6 is opened in the middle position of the top of the U-shaped test bench 4, a U-shaped frame 3 is fixedly connected to the bottom of the workbench 1 near the rear end, a micro electric push rod 301 is fixedly connected to the top of the U-shaped frame 3, a lifting plate 302 is fixedly connected to the top of the micro electric push rod 301, a back plate 303 is connected to the top of the lifting plate 302, and a pressing plate 304 is fixedly connected to the top of the back plate 303 through a rectangular hole, and a linkage mechanism is arranged on the back plate 303.

[0023] In this embodiment, the linkage mechanism includes a block 5 slidably sleeved on the back plate 303 near the bottom, and the block 5 is adapted to the slot 601. The back plate 303 is provided with a square hole adapted to the block 5. The rear end of the block 5 is fixedly connected to a vertical plate 502. The top and bottom of the vertical plate 502 are slidably connected to a slide rod 503. The vertical plate 502 is provided with two round holes adapted to the slide rod 503. One end of the two slide rods 503 is fixedly connected to the back plate 303. The other ends of the two slide rods 503 are fixedly connected to the same limit plate 505. The two slide rods 503 are located between the vertical plate 502 and the limit plate 505. A spring 504 is sleeved on the position of the two slide rods 503. The block 5 is located on the top of the front side of the back plate 303 and is fixedly connected to a right-angle trapezoidal plate 501.

[0024] In this embodiment, the same baffle rod 402 is fixedly connected to the middle of the rear end on both sides of the bottom of the U-shaped test bench 4, and the baffle rod 402 is adapted to the right-angle trapezoidal plate 501. The baffle rod 402 realizes the contraction of the card block 5, so that the card block 5 is separated from the card slot 601, and the T-shaped lifting plate 6 will not rise all the time, and the chip can be pushed out and loosened.

[0025] In this embodiment, T-slots are provided at the front and rear ends of the top of the U-shaped test bench 4 , T-slots are slidably connected with T-bars 403 , and a plurality of pin sockets 404 are provided at the tops of the two T-bars 403 .

[0026] In this embodiment, magnetic blocks 405 are fixedly connected to both sides of the top of the U-shaped test bench 4, and an iron rectangular cover 406 is provided on the side sliding sleeve of the U-shaped test bench 4. The iron rectangular cover 406 limits the T-bar 403 so that the T-bar 403 does not slide. Metal contacts are provided between the U-shaped test bench 4 and the T-bar 403. When the T-bar 403 needs to be replaced, the iron rectangular cover 406 is separated from the magnetic block 405, the T-bar 403 is slid out, and the new T-bar 403 is inserted to test chips with different pins.

[0027] In this embodiment, a control console 2 is fixedly connected to the front end of the top of the workbench 1 , and the control console 2 is respectively connected to the T-bar 403 and the micro electric push rod 301 . A display screen 201 and buttons 202 are provided on the control console 2 .

[0028] Working principle: A test fixture for integrated circuit chips. When in use, the pin chip is placed on the top of the U-shaped test bench 4, so that the pins of the pin chip are aligned with the pin socket 404 of the T-shaped bar 403, and the micro-electric push rod 301 is started to retract, so that the lifting plate 302 with the back plate 303 and the pressing plate 304 are lowered, and the pin chip is pressed downward by the pressing plate 304 to achieve contact between the pin chip and the contact points in the pin socket 404. When the back plate 303 drops to the lowest point, the card block 5 is just stuck in the card slot 601, and the result of the pin chip is viewed through the display screen 201. After completion, the micro-electric push rod 301 is started to extend, so that the back plate 3 03 etc. rise, and since the card block 5 is stuck in the card slot 601, it drives the T-shaped lifting plate 6 to rise together, and then the pin chip is ejected from the pin socket 404. When the right-angled trapezoidal plate 501 contacts the baffle 402, the baffle 402 pushes the top of the right-angled trapezoidal plate 501, so that the card block 5 and the vertical plate 502 are contracted, and the slide bar 503 is compressed. At this time, the card block 5 is separated from the card slot 601, and the T-shaped lifting plate 6 descends under the action of gravity, and the pressing plate 304 continues to rise. At this time, the user can take away the tested pin chip and put a new pin chip on it to continue testing, so that the user does not need to insert and fix the pin chip and then pull it out.

[0029] For ease of description, spatially relative terms such as "above", "above", "on the upper surface of", "above", etc. may be used here to describe the spatial positional relationship between a device or feature and other devices or features as shown in the figure. It should be understood that spatially relative terms are intended to include different orientations of the device in use or operation in addition to the orientation described in the figure. For example, if the device in the accompanying drawings is inverted, the device described as "above other devices or structures" or "above other devices or structures" will be positioned as "below other devices or structures" or "below other devices or structures". Thus, the exemplary term "above" can include both "above" and "below". The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatially relative descriptions used here are interpreted accordingly.

[0030] It should be noted that the terms used herein are only for describing specific embodiments and are not intended to limit the exemplary embodiments according to the present application. As used herein, unless the context clearly indicates otherwise, the singular form is also intended to include the plural form. In addition, it should be understood that when the terms "comprise" and / or "include" are used in this specification, it indicates the presence of features, steps, operations, devices, components and / or combinations thereof.

[0031] The above description is only the preferred embodiment of the utility model, and is not intended to limit the utility model. For those skilled in the art, the utility model can have various modifications and changes. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the utility model shall be included in the protection scope of the utility model.

Claims

1. A test fixture for an integrated circuit chip, comprising a workbench (1), characterized in that: A U-shaped test bench (4) is fixedly connected to the middle position of the top of the workbench (1); a rectangular hole is opened near the rear end of the middle position of the top of the workbench (1); four limit rods (602) are fixedly connected to the bottom of the U-shaped test bench (4); the bottoms of the four limit rods (602) all pass through the rectangular holes; the circumferential surfaces of the four limit rods (602) are slidably sleeved with the same T-shaped lifting plate (6); the four corners of the bottom of the T-shaped lifting plate (6) are all provided with circular holes that are compatible with the limit rods (602); the bottoms of the four limit rods (602) are fixedly connected to limit blocks; the backs of the limit rods (602) are A card slot (601) is provided at the bottom of the surface, a strip hole (401) adapted to the T-shaped lifting plate (6) is provided at the middle position of the top of the U-shaped test bench (4), a U-shaped frame (3) is fixedly connected to the bottom of the workbench (1) near the rear end, a micro electric push rod (301) is fixedly connected to the top of the U-shaped frame (3), a lifting plate (302) is fixedly connected to the top of the micro electric push rod (301), a back plate (303) is connected to the top of the lifting plate (302), and a pressing plate (304) is fixedly connected to the top of the back plate (303) through a rectangular hole, and a linkage mechanism is provided on the back plate (303).

2. The integrated circuit chip testing tool according to claim 1, characterized in that: The linkage mechanism comprises a card block (5) slidably sleeved on the back plate (303) near the bottom, and the card block (5) is adapted to the card slot (601), a square hole adapted to the card block (5) is provided on the back plate (303), a vertical plate (502) is fixedly connected to the rear end of the card block (5), the top and bottom of the vertical plate (502) are both slidably connected to a sliding rod (503), and the vertical plate (502) is provided with two The two sliding bars (503) are fixedly connected to the back plate (303) at one end, and the other end of the two sliding bars (503) is fixedly connected to the same limiting plate (505). The two sliding bars (503) are located between the vertical plate (502) and the limiting plate (505) and are sleeved with springs (504). The clamping block (5) is located at the top of the front side of the back plate (303) and is fixedly connected to a right-angled trapezoidal plate (501).

3. The integrated circuit chip testing tool according to claim 2, characterized in that: The bottom sides of the U-shaped test bench (4) are fixedly connected to a same blocking rod (402) near the middle of the rear end, and the blocking rod (402) is matched with the right-angle trapezoidal plate (501).

4. The integrated circuit chip testing tool according to claim 1, characterized in that: The front and rear ends of the top of the U-shaped test bench (4) are both provided with T-shaped slots, T-shaped bars (403) are slidably connected in the two T-shaped slots, and the tops of the two T-shaped bars (403) are both provided with a plurality of pin sockets (404).

5. The integrated circuit chip testing tool according to claim 1, characterized in that: Magnetic blocks (405) are fixedly connected to both sides of the top of the U-shaped test bench (4), and an iron rectangular cover (406) is slidably sleeved on the side of the U-shaped test bench (4).

6. The integrated circuit chip testing tool according to claim 1, characterized in that: A control console (2) is fixedly connected to the front end of the top of the workbench (1), and the control console (2) is respectively connected to the T-shaped bar (403) and the micro electric push rod (301), and a display screen (201) and buttons (202) are provided on the control console (2).

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