Photovoltaic cell testing mechanism

Abstract

The utility model provides a photovoltaic cell testing mechanism which comprises at least two supports arranged at intervals, and each support is provided with at least one reed. Each reed comprises a bottom plate and a plurality of supporting legs, each supporting leg is connected with the bottom plate and is suspended above the bottom plate, the supporting legs on the same reed are used for being in contact with isotropic test points of a battery piece to be tested, and a gap is formed between every two adjacent supporting legs. The reeds comprising a plurality of supporting feet are adopted to be in contact with the homopolarity test points of the back contact battery piece, and the gaps are arranged between the adjacent supporting feet, so that the reeds on the adjacent supports can be aligned and in contact with the homopolarity test points of the battery piece, IV, EL, hot spot and other tests can be conveniently carried out, the structure is simple, replacement is convenient, the cost is low, and the cost is low. Therefore, the problems that an existing IV testing device is complex in structure, inconvenient to replace and align and high in cost are effectively solved.

Description

Technical Field

[0001] The present application relates to the technical field of photovoltaic cell testing, and in particular to a busbar-free photovoltaic cell testing mechanism. Background Art

[0002] When conducting IV performance tests on photovoltaic cells, the number of probe rows required needs to be determined based on the arrangement of the test points on the cell. Each probe row has the same number of mutually insulated current and voltage probes. The above test method requires precise alignment of the probe rows and the test points of the cell.

[0003] Each probe needle in the existing IV test device is equipped with a probe cover and a spring, which has a complex structure. It is not only expensive, but also inconvenient to align and replace. It is not suitable for testing a main grid-free back contact solar cell with a large number of test points only on the back. Utility Model Content

[0004] The technical problem to be solved by the present application is to provide a photovoltaic cell testing mechanism to solve the problems of the existing IV testing device having a complex structure, being inconvenient to replace and align, and having a high cost.

[0005] In order to solve the above problems, the present application is implemented through the following technical solutions:

[0006] The present application proposes a photovoltaic cell testing mechanism, wherein the testing mechanism comprises at least two brackets arranged at intervals, each of the brackets being provided with at least one reed;

[0007] Each of the spring sheets comprises a base plate and a plurality of legs, each of the legs is connected to the base plate and suspended above the base plate, the legs on the same spring sheet are used to contact the same-sex test points of the battery sheet to be tested, and there is a gap between adjacent legs.

[0008] Optionally, in the testing mechanism, the legs on the same reed sheet are used to contact a first gate line or a first test point; optionally, the gap between adjacent legs is used for allowing a second gate line to pass through, the first gate line is one of the positive gate line and the negative gate line of the back contact battery cell, the second gate line is the other of the positive gate line and the negative gate line, the first test point is a test point on the first gate line, or the first test point is a test point outside the first gate line and is electrically connected to the first gate line.

[0009] Optionally, in the testing mechanism, two reeds are spaced apart on the same bracket, and the two reeds on the same bracket are used to contact the positive electrode test point and the negative electrode test point of the back contact battery cell respectively.

[0010] Optionally, in the testing mechanism, at least one end of the support leg is connected to a side edge of the base plate.

[0011] Optionally, in the testing mechanism, the support leg is in an arch shape with its opening facing the base plate.

[0012] Optionally, in the testing mechanism, the support leg includes a first arc portion, a second arc portion and a third arc portion connected in sequence, the first arc portion is connected to the base plate, the third arc portion is located above the base plate, the opening of the third arc portion faces the base plate, and the first arc portion and the third arc portion are connected through the second arc portion.

[0013] Optionally, in the testing mechanism, the base plate includes two stacked sub-base plates, and both ends of the support legs are respectively connected to one of the sub-base plates.

[0014] Optionally, the testing mechanism further comprises a flexible support rod, wherein the flexible support rod is filled in the cavity between the support leg and the bottom plate.

[0015] Optionally, the testing mechanism also includes a conductive voltage bar, a limiting column is arranged on the conductive voltage bar, a first limiting hole matching the limiting column is arranged on the base plate, a second limiting hole matching the limiting column is arranged on the bracket, the conductive voltage bar is pressed onto the base plate, and the conductive voltage bar is fixed to the bracket, and the limiting column is inserted into the first limiting hole and the second limiting hole.

[0016] Optionally, in the test mechanism, the material of the reed is beryllium copper; and / or the material of the conductive voltage bar is beryllium copper.

[0017] Optionally, in the testing mechanism, the support legs are integrated with the base plate.

[0018] Optionally, in the testing mechanism, the spacing between adjacent legs is 0.5 mm to 1 mm.

[0019] Optionally, in the testing mechanism, the reed is used to obtain the current parameters of the battery cell, and the testing mechanism also includes a voltage probe. A first probe hole is also provided at the end of the bracket, and a second probe hole is correspondingly provided on the conductive voltage bar. The voltage probe is inserted into the first probe hole and protrudes from the surface of the conductive voltage bar after passing through the second probe.

[0020] Optionally, the testing mechanism further comprises a base, and each of the brackets is arranged side by side on the base.

[0021] Compared with the prior art, this application has the following advantages:

[0022] The photovoltaic cell testing mechanism in the present application comprises at least two brackets arranged at intervals, each bracket being provided with at least one spring; each spring comprises a base plate and a plurality of legs, each leg being connected to the base plate and suspended above the base plate, the legs on the same spring being used to contact with the same-sex test points of the cell to be tested, and there being gaps between adjacent legs; wherein, a spring comprising a plurality of legs is used to contact with the same-sex test points of the cell, and a gap is provided between adjacent legs, so that the springs on adjacent brackets can be aligned and contacted with the opposite-sex test points of the cell, which is convenient for IV, EL and hot spot tests, and the structure is simple, easy to replace and low in cost, thereby effectively improving the problems of the existing IV testing device being complex in structure, inconvenient to replace and align and high in cost.

[0023] It should be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] Figure 1 An overall schematic diagram of a photovoltaic cell testing mechanism provided in an embodiment of the present application;

[0025] Figure 2 A schematic diagram of the combination of a bracket and a spring of a photovoltaic cell testing mechanism provided in an embodiment of the present application;

[0026] Figure 3 for Figure 2 Explosion effect diagram;

[0027] Figure 4 This is a front view of the reed in the embodiment of the present application;

[0028] Figure 5 This is a first angle schematic diagram of a reed in one embodiment of the present application;

[0029] Figure 6 for Figure 5 An enlarged schematic diagram of the end of the middle reed;

[0030] Figure 7 A second angle schematic diagram of a reed in one embodiment of the present application;

[0031] Figure 8 for Figure 7 An enlarged schematic diagram of the end of the middle reed;

[0032] Fig. 9 A schematic diagram of a reed in an embodiment of the present application from a third angle;

[0033] Fig.10 A schematic diagram of a reed at a fourth angle in an embodiment of the present application;

[0034] Fig.11This is a schematic diagram of the combination of a reed and a flexible support rod in one embodiment of the present application;

[0035] Fig.12 for Fig.11 An enlarged schematic diagram of the end of the middle reed;

[0036] Fig.13 This is a schematic diagram of a reed in another embodiment of the present application from a first angle;

[0037] Fig.14 This is a first angle schematic diagram of the combination of a reed and a flexible support rod in another embodiment of the present application;

[0038] Fig.15 for Fig.14 An enlarged schematic diagram of the end of the middle reed;

[0039] Fig.16 A second angle schematic diagram of the combination of the reed and the flexible support rod in another embodiment of the present application;

[0040] Fig.17 This is a schematic diagram of the structure of the conductive voltage bar in the embodiment of the present application;

[0041] Fig.18 Schematic diagram of the structure of the bracket in the embodiment of the present application. DETAILED DESCRIPTION

[0042] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of this application.

[0043] It should be understood that the references to "one embodiment" or "an embodiment" throughout the specification mean that the specific features, structures, or characteristics associated with the embodiment are included in at least one embodiment of the present application. Therefore, the references to "in one embodiment" or "in an embodiment" appearing throughout the specification do not necessarily refer to the same embodiment. In addition, these specific features, structures, or characteristics may be combined in any suitable manner in one or more embodiments.

[0044] Since the arrangement of the test points corresponds to the arrangement of the main grid lines or pad columns, in the prior art, when performing IV testing on a battery cell, it is necessary to determine the number of required test rows based on the arrangement of the test points, for example, based on the arrangement of the main grid lines or pad columns, and each test row has the same number of current needles and voltage needles that are insulated from each other. The above-mentioned test method has high requirements for the alignment of each probe row and the test point. In the existing test device, each needle of the probe row is equipped with a spring, which has a complex structure, is inconvenient to replace, has a high cost, and is difficult to adjust the alignment. It should be noted that the above-mentioned pad column refers to a plurality of pads arranged perpendicular to the direction of the fine grid lines.

[0045] The busbarless solar cell only has fine grid lines on the back, no busbar lines on the back, and is interconnected with welding strips at the module end. Because the busbarless solar cell only has fine grid lines on the back, when performing IV performance tests on it, it is necessary to perform electrical performance tests on thousands of test points on the busbarless solar cell, which requires higher precision for the probe row, making the overall structure of the probe row more complex and more inconvenient to replace; at the same time, because the fine grid line spacing is less than 1mm, and the probe cover size of each probe is greater than 1mm, the conventional method of using a probe row to perform electrical performance tests on the test points on the busbarless solar cell is no longer applicable.

[0046] In view of the above problems, the embodiment of the present application provides a photovoltaic cell testing mechanism 100, which is described below by taking a back contact cell IV testing mechanism as an example. Figures 1 to 18 As shown, it includes at least two brackets 10 arranged at intervals, each bracket 10 is provided with at least one spring 20, and the springs 20 on adjacent brackets 10 are respectively used to contact the positive test point and the negative test point of the back contact battery cell; each spring 20 includes a bottom plate 21 and a plurality of legs 22, each leg 22 is connected to the bottom plate 21 and suspended above the bottom plate 21, which can provide an extrusion deformation space for the spring 20 to ensure close contact with the test point; at the same time, the legs 22 on the same spring 20 are used to contact the same-sex test point of the battery cell to be tested, and there is a gap between adjacent legs.

[0047] The test point may be located on the gate line, or the test point may be located outside the gate line and electrically connected to the gate line; the test point of the same sex may be a positive test point or a negative test point.

[0048] Optionally, in one embodiment, the legs 22 on the same spring sheet 20 are used to contact the first grid line or the first test point, and the gap 23 between adjacent legs 22 is for the second grid line to pass through, the first grid line is one of the positive grid line and the negative grid line of the back contact battery sheet, and the second grid line is the other of the positive grid line and the negative grid line. It should be noted that the first test point is a test point on the first grid line, or the first test point is a test point outside the first grid line and is electrically connected to the first grid line. Each bracket 10 may also be provided with multiple spring sheets 20, for example Figure 1 and 2 As shown, two reeds 20 are provided on each bracket 10: a first reed and a second reed. The first reed and the second reed can be reeds for overlapping grid lines of different polarities, and in this embodiment, the first reed and the second reed are electrically insulated; or, the first reed and the second reed can be reeds for overlapping grid lines of the same polarity. It should be noted that the bottom plate 21 and the support leg 22 can be separate components connected by welding or the like; or, the bottom plate 21 and the support leg 22 are an integral part formed by integral molding.

[0049] The bracket 10 is made of insulating material, and its overall structure may be in the shape of a boss, so as to better receive the spring leaf 20 .

[0050] Optionally, in the embodiment of the present application, when the back contact cell is a busbar-free back contact cell, the positive and negative grid lines are both thin grid lines. Because the legs 22 on the same spring sheet 20 are connected together through the bottom plate 21, and at the same time, a gap 23 is provided between adjacent legs 22, so that the spring sheet 20 can cross at least one positive fine grid line to contact multiple negative fine grid lines of the back contact cell, or cross at least one negative fine grid line to contact multiple positive fine grid lines of the back contact cell, and can obtain parameters such as voltage and current, so as to perform IV, EL and hot spot tests.

[0051] In the embodiment of the present application, a spring sheet 20 including a plurality of legs 22 is used to contact the grid line or test point of the back contact cell, and a gap 23 for the opposite grid line to pass through is set between adjacent legs 22, so that the spring sheets 20 on adjacent brackets 10 can be aligned and contacted with the positive grid line and the negative grid line of the back contact cell, respectively, which is convenient for IV, EL and hot spot tests, and its structure is simple and easy to replace, thus effectively improving the problem that the existing IV test device has a complex structure and is not convenient for replacement and alignment. In addition, the above-mentioned test mechanism overcomes the size limitation of the probe cover of each probe in the prior art, so that the spacing between adjacent legs can be set to less than 1 mm, which can be applied to the test of the back contact cell without a main grid.

[0052] Optionally, the spacing between adjacent legs in the spring sheet is 0.5 mm to 1 mm, so as to be suitable for testing a battery cell without a main grid back contact.

[0053] During the test, the spring sheet 20 as a whole is perpendicular to the extension direction of the thin grid line, and the adjacent legs 22 are in contact with the first grid line, while the second grid line passes through the gap 23 between the adjacent legs 22; or the adjacent legs 22 are in contact with the first grid line, while the first grid line passes through the gap 23 between the adjacent legs 22.

[0054] Optionally, the width of the above-mentioned support legs 22 matches the width of the gate line, and specifically may be less than or equal to the width of the gate line, and the width of the gap 23 between the above-mentioned support legs 22 is slightly greater than the width of the gate line.

[0055] Optionally, the positive and negative grid lines are both fine grids, that is, the support legs 22 structure matches the fine grids and is suitable for contacting the fine grids, so that the test mechanism provided in the embodiment of the present application can test the main grid-free back contact battery cell.

[0056] Optionally, in one embodiment, two of the above-mentioned spring sheets 20 are spaced apart on the above-mentioned bracket 10, and the two spring sheets 20 on the same bracket 10 are respectively used to contact the positive grid line and the negative grid line, so that one bracket 10 is used to contact the grid lines of two adjacent half-cell battery cells, thereby realizing testing of the two adjacent half-cell battery cells.

[0057] Optionally, in a specific embodiment, insulating glue is provided at the gap 23 between adjacent reeds 20 to avoid short circuit caused by contact between adjacent reeds 20 when they are deformed under pressure.

[0058] Optionally, the material of the reed 20 is beryllium copper, so that the reed 20 has good elasticity while taking into account high strength, wear resistance and corrosion resistance. Optionally, the surface of the reed 20 is gold-plated or silver-plated, which can effectively increase the conductivity and thus improve the detection accuracy.

[0059] Optionally, in one embodiment, the support leg 22 is in the shape of an arch with its opening toward the base plate 21, and the base plate 21 is fixed on the bracket 10, so that the base plate 21 and the bracket 10 can provide sufficient lateral support for the support leg 22 to ensure the pressure-bearing performance, and the support leg 22 is raised away from a layer of the base plate 21, which can better contact the grid line and ensure the accuracy of the test results.

[0060] Optionally, in one embodiment, at least one end of the above-mentioned support leg 22 is connected to the side of the base plate 21, so that the support leg 22 can withstand the pressure generated when contacting the grid line of the battery cell through the supporting effect of the side of the base plate 21, so that the support leg 22 can be in close contact with the grid line to ensure the test effect.

[0061] Alternatively, if Figures 5 to 12 As shown, one end of the above-mentioned support leg 22 is connected to the side of the base plate 21, that is, an elastic structure can be formed, and the base plate 21 is used to support the support leg 22, ensuring that the support leg 22 is in close contact with the tested grid line, thereby improving the test accuracy; at the same time, one end of the support leg 22 is connected to the side of the base plate 21, and the other end of the support leg 22 is suspended above the base plate 21. The structural state can further increase the extrusion deformation space of the spring leaf 20, and the elastic deformation height caused by the pressure can reach 20-30% of its own height, and it is also easy to process and shape, which can reduce production costs.

[0062] Optionally, in a specific embodiment, the above-mentioned support leg 22 includes a first arc portion 221, a second arc portion 222 and a third arc portion 223 which are connected in sequence, the first arc portion 221 is connected to the bottom plate 21, the third arc portion 223 is located above the bottom plate 21, and the opening of the third arc portion 223 faces the bottom plate 21. Through the connection of the second arc portion 222, the first arc portion 221 and the third arc portion 223 are connected as a whole, which not only ensures the elasticity of the overall support leg 22, but also can utilize the arc-shaped protruding part of the third arc portion 223 to contact the gate line of the tested battery cell.

[0063] Alternatively, in a more specific embodiment, as Fig. 9 As shown, the first arc portion 221 is tangent to the bottom plate 21, and the second arc portion 222 is tangent to the first arc portion 221 and the third arc portion 223, which is convenient for processing and forming the spring leaf 20 and can ensure sufficient structural strength and elasticity. Optionally, the angle of the first arc portion 221 corresponding to the arc can be specifically 180°, so as to better support the second arc portion 222 and the third arc portion 223 and improve their bearing performance.

[0064] Alternatively, in another embodiment, Figures 13 to 18 As shown, the two ends of the support leg 22 are respectively connected to the two opposite sides of the bottom plate 21, so that the bottom plate 21 forms a support effect on the two ends of the support leg 22, ensuring the structural strength of the support leg 22, thereby improving its pressure bearing performance.

[0065] Optionally, in a specific embodiment, the base plate 21 includes two stacked sub-base plates.

[0066] 211, and both ends of the support leg 22 are respectively connected to the side of a sub-bottom plate 211. In this embodiment, the bottom plate 21 is composed of two stacked sub-bottom plates 211, one end of the support leg 22 is connected to the side of one sub-bottom plate 211, and the other end of the support leg 22 is connected to the side of the other sub-bottom plate 211, so that the two sub-bottom plates 211 form a support effect on the two ends of the support leg 22, thereby improving its pressure bearing performance.

[0067] Optionally, in one embodiment, the test mechanism provided in the embodiment of the present application further includes a flexible support rod 30, which is filled in the cavity between the support leg 22 and the bottom plate 21. Because the support leg 22 is suspended above the bottom plate 21, there is a cavity between the two, and the use of the flexible support rod 30 to fill the above cavity can further improve the pressure bearing performance of the support leg 22. Among them, the material of the above-mentioned flexible support rod 30 is an insulating material to prevent the positive and negative pole grid lines from short-circuiting due to contact through the flexible support rod 30, and the peripheral part of the insulating flexible support rod 30 can be filled in the gap 23 to isolate the overlap of the positive and negative pole grid lines.

[0068] Optionally, in the embodiment of the present application, the support leg 22 is integrated with the bottom plate 21, which has high processing precision, low cost, and is easy to replace. In practical applications, the spring 20 can be made into a desired shape using beryllium copper as required, and then hollowed out to form the above-mentioned gap 23, that is, to form the above-mentioned support leg 22, by integrated machining or laser engraving, to ensure processing and manufacturing precision.

[0069] Optionally, in one embodiment, the testing mechanism provided in the embodiment of the present application also includes a conductive voltage bar 40, a limiting column 41 is arranged on the conductive voltage bar 40, a first limiting hole 212 matching the limiting column 41 is arranged on the base plate 21, a second limiting hole 11 matching the limiting column 41 is arranged on the bracket 10, the conductive voltage bar 40 is pressed onto the base plate 21, the limiting column 41 is inserted into the first limiting hole 212 and the second limiting hole 11, and the conductive voltage bar 40 is fixed to the bracket 10.

[0070] Among them, a first screw hole 42 and a second screw hole 12 can be respectively set on both ends of the conductive voltage bar 40 and the bracket 10, so that the conductive voltage bar 40 can be fixed to the bracket 10 by bolts or the like; and the limiting column 41 on the conductive voltage bar 40 is inserted into the first limiting hole 212 of the base plate 21 and the second limiting hole 11 of the bracket 10, so that the base plate 21 can be fixed to the bracket 10 through the cooperation of the limiting column 41 with the first limiting hole 212 and the second limiting hole 11.

[0071] In this embodiment, the conductive voltage strip 40 with the limiting column 41 is used to limit the bottom plate 21, so that the entire spring leaf 20 is fixed on the bracket 10, and the overall high-precision alignment is achieved.

[0072] In practical applications, the above-mentioned limiting column 41 can be round, square, etc., and the first limiting hole 212,

[0073] The second limiting hole 11 is circular, square, etc. that matches the limiting hole.

[0074] Optionally, the material of the conductive voltage bar 40 is beryllium copper, so that the conductive voltage bar 40 has higher strength, wear resistance and corrosion resistance.

[0075] In an embodiment of the present application, the above-mentioned reed 20 is used to obtain the current parameters of the battery cell, and a first current lead-out hole 13 is provided on the bracket 10, and a first current lead-out hole 43 is correspondingly provided on the conductive voltage bar 40; optionally, in one embodiment, the testing mechanism 100 also includes a voltage probe 50, and a first probe hole 14 is also provided at the end of the bracket 10, and a second probe hole 44 is correspondingly provided on the conductive voltage bar 40. The voltage probe 50 is plugged into the first probe hole 14, and protrudes from the surface of the conductive voltage bar 40 after passing through the second probe 43, so that the above-mentioned voltage probe can smoothly contact the battery cell, thereby obtaining its voltage parameters.

[0076] In this embodiment, by providing a probe hole 14 at the end of the bracket 10 and inserting a voltage probe 50 into the probe hole 14, the voltage parameters of the battery cell can be obtained, and the above-mentioned spring 20 can obtain current parameters, so that IV testing can be carried out smoothly.

[0077] Optionally, in one embodiment, the test mechanism 100 further includes a base 60 , and the brackets 10 are arranged side by side on the base 60 , so as to fix the brackets 10 and the springs 20 , and facilitate accurate testing of the battery cells.

[0078] In summary, in the present embodiment, the photovoltaic cell testing mechanism in the present application includes at least two spaced-apart brackets 10, each bracket 10 is provided with at least one reed 20; each reed 20 includes a base plate 21 and a plurality of legs 22, each leg 22 is connected to the base plate 21 and suspended above the base plate 21, the legs 22 on the same reed 20 are used to contact with the same-sex test points of the cell to be tested, and there is a gap 23 between adjacent legs 22; wherein, the reed 20 including a plurality of legs 22 is used to contact with the same-sex test points of the cell, and a gap 23 is provided between adjacent legs 22, so that the reeds 20 on adjacent brackets 10 can be aligned and contacted with the opposite-sex test points of the cell, which is convenient for IV, EL and hot spot tests, and its structure is simple, easy to replace and low in cost, thereby effectively improving the problems that the existing IV, EL and hot spot test devices have complex structures, are not convenient for replacement and alignment, and are high in cost. In addition, the above-mentioned testing mechanism overcomes the size limitation of the probe cover of each probe in the prior art, so that the spacing between adjacent legs can be set to less than 1 mm, which is applicable to the testing of cells without main grid back contact. It should be noted that each embodiment in this specification is described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same and similar parts between the embodiments can be referred to each other.

[0079] Although the optional embodiments of the present application have been described, those skilled in the art may make additional changes and modifications to these embodiments once they have learned the basic creative concept. Therefore, the appended claims are intended to be interpreted as including optional embodiments and all changes and modifications that fall within the scope of the present application.

[0080] Finally, it should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity from another entity, and do not necessarily require or imply any such actual relationship or order between these entities. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that an article or terminal device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such article or terminal device. In the absence of further restrictions, the elements defined by the sentence "including one..." do not exclude the existence of other identical elements in the article or terminal device including the elements.

[0081] The technical solution provided by the present application is introduced in detail above. Specific examples are used in this article to illustrate the principles and implementation methods of the present application. At the same time, for those skilled in the art, according to the principles and implementation methods of the present application, there may be changes in the specific implementation methods and application scopes. In summary, the content of this specification should not be understood as limiting the present application.

Claims

1. A photovoltaic cell testing mechanism, characterized in that: The testing mechanism comprises at least two brackets arranged at intervals, each of the brackets being provided with at least one reed; Each of the spring sheets comprises a base plate and a plurality of legs, each of the legs is connected to the base plate and suspended above the base plate, the legs on the same spring sheet are used to contact the same-sex test points of the battery sheet to be tested, and there is a gap between adjacent legs.

2. The testing mechanism according to claim 1, characterized in that: The legs on the same spring sheet are used to contact a first grid line or a first test point, and the gap between adjacent legs is used for a second grid line to pass through, the first grid line is one of a positive grid line and a negative grid line of a back contact battery cell, the second grid line is the other of the positive grid line and the negative grid line, the first test point is a test point on the first grid line, or the first test point is a test point outside the first grid line and is electrically connected to the first grid line.

3. The testing mechanism according to claim 1, characterized in that: Two spring sheets are arranged at intervals on the same bracket, and the two spring sheets on the same bracket are respectively used to contact the positive electrode test point and the negative electrode test point of the back contact battery sheet.

4. The testing mechanism according to claim 1, characterized in that: At least one end of the support leg is connected to the side edge of the bottom plate.

5. The testing mechanism according to claim 4, characterized in that: The supporting legs are in an arc shape with an opening facing toward the bottom plate.

6. The testing mechanism according to claim 4, characterized in that: The support leg includes a first arc portion, a second arc portion and a third arc portion which are connected in sequence, the first arc portion is connected to the base plate, the third arc portion is located above the base plate, the opening of the third arc portion faces the base plate, and the first arc portion and the third arc portion are connected through the second arc portion.

7. The testing mechanism according to claim 4, characterized in that: The bottom plate comprises two stacked sub-bottom plates, and two ends of the supporting legs are respectively connected to the side edges of one of the sub-bottom plates.

8. The testing mechanism according to claim 1, characterized in that: The testing mechanism further comprises a flexible support rod, and the flexible support rod is filled in the cavity between the supporting foot and the bottom plate.

9. The testing mechanism according to claim 1, characterized in that: The testing mechanism also includes a conductive voltage strip, a limiting column is arranged on the conductive voltage strip, a first limiting hole matching the limiting column is arranged on the base plate, a second limiting hole matching the limiting column is arranged on the bracket, the conductive voltage strip is pressed onto the base plate, the limiting column is inserted into the first limiting hole and the second limiting hole, and the conductive voltage strip is fixed to the bracket.

10. The testing mechanism according to claim 1, characterized in that: The material of the reed is beryllium copper.

11. The testing mechanism according to claim 1, characterized in that: The supporting feet are integrally arranged with the bottom plate.

12. The testing mechanism according to claim 1, characterized in that: The distance between adjacent legs is 0.5 mm to 1 mm.

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