Electrical testing clamp

Abstract

According to the electrical testing clamp provided by the utility model, a simple structural design is adopted, the TFT is fixed on the silica gel area through the TFT limiting groove, the TP limiting groove is matched with the pressing plate through the movable clamping column and the golden finger area, and the TP and the TFT are in full contact to achieve a simulated attaching state after external force is applied, so that a function test is carried out under the condition that the attaching state of the single TP and the TFT is good, and the test efficiency is improved. The electrical test standard is unified, the accuracy and comparability of the test result are ensured, the performance and quality of the product can be effectively evaluated, and the product yield is improved.

Description

Technical Field

[0001] The utility model relates to an electric measuring fixture, in particular to an electric measuring fixture for laminating single TP and TFT. Background Art

[0002] The touch screen is now one of the indispensable configurations in the car, but in the process of making goods, some samples with normal appearance but abnormal functions can only be effectively detected through functional electrical testing software, which requires high accuracy of the electrical testing software. The unified electrical testing standard is a series of specifications and guidelines formulated to ensure the accuracy and comparability of the test results. In the test after the single TP and TFT are bonded, these standards also need to be followed to ensure the effectiveness and reliability of the test. When the single TP and TFT are successfully bonded, the integrity and functionality of the entire display module can be realized, and general tests are based on the status of this position. The electrical testing software has a lot to do with the test environment, which will cause the test to be OK in the single TP state. After the TFT bonding position, misjudgment occurs due to inconsistent test standards, reducing the production yield and increasing the company's losses. Utility Model Content

[0003] The purpose of the utility model is to overcome the shortcomings of the prior art and provide an electrical testing fixture to fix the TFT on the electrical testing fixture so that the single TP can also complete the functional test based on the bonding state with the TFT, thereby achieving a unified electrical testing standard and improving the production yield.

[0004] The purpose of this utility model is achieved through the following technical solutions:

[0005] An electrical testing fixture comprises a fixture body, a groove area and a pressure plate, wherein the groove area comprises a bottom groove, a silicone area and a positioning groove from bottom to top, wherein the positioning groove is provided with a TFT limiting groove and a TP limiting groove, wherein the silicone area is provided on the bottom groove, wherein the TFT limiting groove is used to fix the TFT on the silicone area, wherein the TP limiting groove is provided on the TFT limiting groove, wherein the TP limiting groove is provided with an active positioning column for mounting the TP, wherein the TP limiting groove is further provided with a gold finger area, wherein when the pressure plate is pressed down, the active positioning column moves downward so that the TP is fitted with the TFT, wherein the FPC gold finger bound to the TP contacts the pressing component connected to the pressure plate upward, and contacts the gold finger area downward fully.

[0006] In this way, the bottom groove can be used to absorb the silicone overflowing from the silicone area after the pressure plate is pressed down. The TFT limit groove is used to fix the TFT on the silicone area. The movable clamp is in a lifted state when there is no external force pressing it. When the external force is applied, it moves downward so that the TP and the TFT are fully in contact to achieve a simulated bonding state. When the pressure plate presses down on the TP after the TP is placed, the gold finger area and the FPC gold finger bound to the TP and the pressing parts of the pressure plate are accurately aligned and fully in contact to complete the electrical test.

[0007] Furthermore, inverted trapezoidal grooves are evenly arranged in a matrix on the bottom groove.

[0008] Furthermore, the gold finger area adopts a probe structure, and during testing, the probe head of the probe is connected to the FPC gold finger.

[0009] Furthermore, the pressure plate is of a flip-cover design, and the pressing component connected to the pressure plate is a probe pressure head, which is located in the area corresponding to the gold finger area. When the pressure plate is pressed down, the probe pressure head moves downward and contacts the gold finger.

[0010] Furthermore, the silicone area is evenly laid in the groove according to a predetermined shape and size using a silicone extruder or a glue coating machine.

[0011] Furthermore, the movable locking column adopts a telescopic structure, and the movable locking column is externally connected to a flatness detection and control device to ensure the flatness of the TP and to fully fit with the TFT.

[0012] Furthermore, a first avoidance position is provided in the middle of the upper side of the clamp body, and the first avoidance position is a avoidance position for taking TP.

[0013] Furthermore, a second avoidance position is provided on the lower side of the clamp body, and the second avoidance position is the FPC avoidance position bound to the TP. The position of the second avoidance position is set according to the position of the FPC, and its size can at least accommodate the gold finger area of ​​the TP limit groove and the probe pressure head area of ​​the pressure plate.

[0014] The utility model adopts a simple structural design, and fixes the TFT on the silicone area through the TFT limiting groove. The TP limiting groove cooperates with the movable clamping column, the gold finger area and the pressure plate. When external force is applied, the TP and the TFT are fully in contact to achieve a simulated fitting state, thereby ensuring that the single TP and the TFT are in good fitting state, and performing functional testing, unifying electrical measurement standards, ensuring the accuracy and comparability of test results, and being able to effectively evaluate the performance and quality of the product and improve the production yield. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] In order to more clearly illustrate the technical solutions of the embodiments of the utility model, the drawings required for use in the embodiments will be briefly introduced below. It should be understood that the following drawings only show certain embodiments of the utility model and therefore should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can be obtained based on these drawings without paying creative work.

[0016] Figure 1 This is a top view of the electrical measuring fixture;

[0017] Figure 2 This is the side view of the assembled electrical test fixture;

[0018] Figure 3 This is a top view of the assembled electrical testing fixture. DETAILED DESCRIPTION

[0019] In order to facilitate the understanding of the present invention, the present invention will be described more comprehensively with reference to the relevant drawings. The drawings provide preferred embodiments of the present invention. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present invention more thoroughly and comprehensively understood.

[0020] It should be noted that when an element is considered to be "connected" to another element, it may be directly connected to the other element or there may be a central element at the same time. The terms "first", "second", "upper side", "lower side" and similar expressions used herein are only for illustrative purposes and do not represent the only implementation method.

[0021] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art in the technical field of the present invention. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more related listed items.

[0022] See also Figure 1 , Figure 2An embodiment of the electric measuring fixture of the utility model includes a fixture body 1, a groove area and a pressing plate 3. The groove area includes a bottom groove 21, a silicone area 22 and a positioning groove from bottom to top. The positioning groove is provided with a TFT limiting groove 231 and a TP limiting groove 232. The silicone area 22 is arranged on the bottom groove 21. The TFT limiting groove 231 is used to fix the TFT on the silicone area 22. The TP limiting groove 232 is arranged on the TFT limiting groove 231. The TP limiting groove 232 is provided with a movable clamping column to mount the TP. The TP limiting groove 232 is also provided with a gold finger area 41. When the pressing plate 3 is pressed down, the movable clamping column moves downward to make the TP fit with the TFT. The FPC gold finger 42 bound to the TP contacts the pressing component connected to the pressing plate 3 upward and fully contacts the gold finger area 41 downward.

[0023] The assembly principle of this implementation is to first put the TFT into the TFT limiting groove 231, then put the TP bound with the FPC into the TP limiting groove 232, and then cover it with the pressure plate 3, and apply a certain pressure on the pressure plate 3. The TP on the TP limiting groove 232 is pressed to make the movable positioning column move downward, so that the TP and the TFT are completely fitted together, and the pressing component on the pressure plate is pressed on the FPC gold finger, and the FPC gold finger 42 is in full contact with the gold finger area 41 of the TP limiting groove 232. The fixture ensures that there will be no relative displacement between the TP and the TFT during the alignment and fitting process, and realizes the simulated fitting electrical measurement of a single TP and a TFT, thereby unifying the electrical measurement standards.

[0024] During the assembly process, the silicone area 22 is also affected by the downward pressure, and the overflowing silicone will be absorbed by the bottom groove 21. Therefore, the silicone area 22 can provide buffering, protect the TFT and enhance the sealing between it and the fixture, while effectively preventing damage to the TFT by external factors such as vibration, impact and dust, and at the same time ensure the stability and accuracy of the TFT during the test process.

[0025] See also Figure 3 In the second embodiment, in this embodiment, the inverted trapezoidal grooves 211 are evenly arranged in a matrix on the bottom groove 21, so that the silicone absorbed by the bottom groove 21 during the test can enhance the resilience of the absorbed silicone after the test is completed and the test piece is removed.

[0026] In this embodiment, the gold finger area 41 adopts a probe structure to ensure that the probe is accurately aligned with the test point on the touch panel, which helps to improve the accuracy and repeatability of the test. Furthermore, the pressing component connected to the pressure plate is a probe pressure head, which is located in the area corresponding to the gold finger area 41. When the pressure plate 3 is pressed down, the probe pressure head moves downward and contacts the gold finger, thereby ensuring good contact between the pressure head probe and the gold finger 42, while avoiding damage to the gold finger 42 or the probe due to excessive pressure. At this time, the probe probe is also connected to the FPC gold finger 42 bound to the TP. After the probe contacts the gold finger 42, an electrical connection is formed. The test equipment can transmit test signals to the gold finger 42 through this connection, or receive signals from the device under test from the gold finger 42.

[0027] The alignment of the gold finger 42 and the probe and the probe head can be externally connected to a high-precision alignment device and system in the prior art to ensure the alignment accuracy, thereby ensuring that the touch electrodes on the TP are accurately aligned with the display pixels on the TFT.

[0028] In this embodiment, the pressing plate 3 adopts a flip cover design, and the TP is placed in the third layer under the back cover to press down the TP. At the same time, the gold finger is in full contact with the probe to complete the electrical test.

[0029] In this embodiment, the silicone area 22 is evenly laid in the groove according to a predetermined shape and size using a silicone extruder or a glue coater to ensure that the thickness of the silicone layer in the silicone area 22 is uniform, free of bubbles and cracks, and tightly fits on the surface of the bottom groove 21.

[0030] In this embodiment, the movable locking column adopts a telescopic structure. When there is no external force pressing on it, it is in a raised state to play a locking role. When an external force is applied, the TP will fully contact the TFT to achieve a simulated fitting state.

[0031] In this embodiment, the movable locking post is externally connected to the flatness detection and control device. During the test, when the pressure plate is pressed down, the TP on the movable locking post can pass downward through the external flatness detection and control device to ensure the flatness of the TP, so that it can fully fit with the TFT, thereby ensuring the stability of the test process and no damage to the TP / TFT.

[0032] In this embodiment, a first avoidance position 51 is provided in the middle of the upper side of the clamp body 1 for conveniently taking TP.

[0033] In this embodiment, a second avoidance position 52 is provided on the lower side of the fixture body 1 for avoiding the TP-bound FPC. The position of the second avoidance position is set according to the position of the TP-bound FPC, and its size can at least accommodate the gold finger area 41 of the TP limit groove and the probe head area of ​​the pressure plate.

[0034] The above-mentioned embodiments only express several implementation methods of the utility model, and the description is relatively specific and detailed, but it cannot be understood as limiting the scope of the utility model patent. It should be pointed out that for ordinary technicians in this field, several modifications and improvements can be made without departing from the concept of the utility model, which all belong to the protection scope of the utility model. Therefore, the protection scope of the utility model patent shall be based on the attached claims.

Claims

1. An electrical measuring fixture, characterized in that: It includes a fixture body, a groove area and a pressure plate. The groove area includes a bottom groove, a silicone area and a positioning groove from bottom to top. The positioning groove is provided with a TFT limiting groove and a TP limiting groove. The silicone area is arranged on the bottom groove. The TFT limiting groove is used to fix the TFT on the silicone area. The TP limiting groove is arranged on the TFT limiting groove. The TP limiting groove is provided with an active positioning column to mount the TP. The TP limiting groove is also provided with a gold finger area. When the pressure plate is pressed down, the active positioning column moves downward to make the TP fit with the TFT. The FPC gold finger bound to the TP contacts the pressing component connected to the pressure plate upward and fully contacts the gold finger area downward.

2. The electrical testing fixture according to claim 1, characterized in that: Inverted trapezoidal grooves are evenly arranged in a matrix on the bottom groove.

3. The electrical testing fixture according to claim 1, characterized in that: The gold finger area adopts a probe structure, and during testing, the probe head of the probe is connected to the FPC gold finger.

4. The electrical testing fixture according to claim 3, characterized in that: The pressing component is a probe pressure head, which is arranged in the area corresponding to the gold finger area.

5. The electrical testing fixture according to claim 1, characterized in that: The silicone rubber area is evenly laid in the groove according to a predetermined shape and size by using a silicone rubber extruder or a glue coating machine.

6. The electrical testing fixture according to claim 1, characterized in that: The movable positioning column adopts a telescopic structure and is externally connected to a flatness detection and control device to ensure the flatness of the TP and to fully fit the TFT.

7. The electrical testing fixture according to claim 1, characterized in that: The pressing plate adopts a flip cover design.

8. The electrical testing fixture according to claim 1, characterized in that: A first avoidance position is provided in the middle of the upper side of the clamp body, and the first avoidance position is a avoidance position for taking TP.

9. The electric measuring fixture according to claim 1, characterized in that: A second avoidance position is provided on the lower side of the clamp body, and the second avoidance position is an avoidance position of the FPC bound to the TP.

10. The electric measuring fixture according to claim 9, characterized in that: The position of the second avoidance position is set according to the position of the FPC, and its width can at least accommodate the gold finger area of ​​the TP limiting groove and the probe pressure head area of ​​the pressure plate.

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