Probe module and detection device

Abstract

The utility model relates to a probe module and a detection device. The probe module comprises an installation seat, a first connection module, a first probe and a first guide column. A mounting cavity is formed in the mounting seat, and the mounting seat is further provided with a first surface and a second surface which are arranged oppositely, and a first window penetrating through the first surface to be communicated with the mounting cavity; the first connecting module is limited in the mounting cavity; the first end of the first guide column and the first end of the first probe are connected to the first connection module from the first window. The first guide column is used for being in guide fit with a first guide hole in a carrier. The first connecting module can shake in the radial direction of the first guide column, then the first guide column is driven to shake in the radial direction of the first connecting module, and when a certain deviation exists in installation of the first guide column, it can be guaranteed that the first guide column can enter a first guide hole through shaking of the first guide column; therefore, the first guide column and the first guide hole can be conveniently aligned and matched, and the alignment precision requirement of the first guide column and the first guide hole is lowered.

Description

Technical Field

[0001] The utility model belongs to the technical field of circuit board testing, and in particular relates to a probe module and a detection device. Background Art

[0002] FPC (FPC is the abbreviation of Flexible Printed Circuit, and its Chinese name is flexible printed circuit board) is an important component in electronic products. FPC has good bendability and can make maximum use of the space of electronic products.

[0003] After the FPC is bent, it is usually necessary to use a corresponding detection device to detect it to confirm whether the FPC is damaged due to the bending. Among them, the detection device includes a workbench, a carrier, a drive module, a probe module and a detection module. The carrier and the drive module are connected to the workbench. The carrier is used to support the placement of the FPC. The drive module is connected to the probe module and is used to drive the probe module to approach or move away from the carrier. When the probe module approaches the carrier, the probe of the probe module can electrically conflict with the detection point of the FPC on the carrier. The detection module is connected to the probe module. When the probe module electrically conflicts with the detection point on the FPC, the detection module is electrically connected to the detection point of the FPC. The detection module detects whether there is electrical conduction between the corresponding detection points to determine whether the FPC is damaged.

[0004] In addition, the probe module is provided with a first guide structure, and the carrier is provided with a second guide structure. The cooperation of the first guide structure and the second guide structure can improve the alignment accuracy of the probe module and the carrier. The first guide structure can be a guide column, and the second guide structure can be a guide hole. This requires that the first guide structure and the second guide structure need to have a high alignment accuracy, thereby increasing the difficulty of assembly. Utility Model Content

[0005] The technical problem to be solved by the utility model is: in view of the problem in the prior art that the difficulty of assembly is increased in order to enable the probe module and the carrier to be accurately aligned, a probe module and a detection device are provided.

[0006] In order to solve the above problems, on the one hand, an embodiment of the utility model provides a probe module, including a mounting seat, a first connecting module, a first probe and a first guide column; the mounting seat is used to connect with the driving module, and a mounting cavity is provided in the mounting seat; the mounting seat also has a first surface and a second surface arranged opposite to each other, and a first window extending from the first surface to the mounting cavity; the first connecting module is limited in the mounting cavity and exposed from the first window; the first end of the first guide column and the first end of the first probe are both connected to the first connecting module from the first window; the second end of the first guide column and the second end of the first probe are located on the side of the first surface away from the second surface; the distance between the second end of the first guide column and the first surface is greater than the distance between the second end of the first probe and the first surface; the first guide column is used to cooperate with the first guide hole on the carrier for guidance; the first connecting module can swing radially along the first guide column.

[0007] Optionally, the probe module also includes a second guide column, a first end of which is connected to the mounting base for cooperating with a second guide hole on the carrier; the second end of the second guide column is located on the side of the first surface away from the second surface; the distance between the second end of the second guide column and the first surface is greater than the distance between the second end of the first guide column and the first surface, so that the first guide column can extend into the first guide hole after the second guide column extends into the second guide hole a certain distance.

[0008] Optionally, the first probe can move along the axial direction of the first guide column with the mounting base to contact the detection point of the circuit board to be tested on the carrier; the first connecting module can move relative to the mounting base along the axial direction of the first guide column to approach or move away from the first surface; the probe module includes an elastic member, which is connected to the first connecting module. When the first connecting module is away from the first surface, it can apply force to the elastic member to deform the elastic member.

[0009] Optionally, the mounting seat includes a mounting plate and a back plate; the mounting plate is provided with a mounting groove, and the back plate closes the mounting groove to form the mounting cavity; the first window is arranged on the bottom surface of the mounting groove and penetrates to the surface of the mounting plate away from the back plate.

[0010] Optionally, a avoidance hole is provided on the back plate, and the avoidance hole penetrates from the surface of the back plate away from the first surface to communicate with the installation cavity; the first probe can be electrically connected to the detector through the avoidance hole.

[0011] Optionally, the first connecting module includes a limiting portion and a connecting portion connected in sequence, the limiting portion is limited within the installation cavity, the connecting portion extends out of the installation cavity from the first window, and the first probe and the first guide column are both connected to the connecting portion.

[0012] Optionally, the probe module also includes a driving unit, a second probe and a second connecting module; the driving unit is connected to the mounting base and to the second connecting module; the second probe is connected to the second connecting module and is located on the side of the first surface away from the second surface; the driving unit is used to drive the second connecting module to move radially along the first guide column so that the second probe can contact the detection point of the circuit board to be tested placed on the carrier.

[0013] Optionally, the driving unit includes a power source and a support plate; the power source is connected to the mounting seat and to the support plate, and is used to drive the support plate to move radially along the guide column; the support plate is located on the side of the second surface away from the first surface, and a second window is provided on the mounting plate, and the second connecting module is connected to the support plate from the second window.

[0014] Optionally, the probe module also includes a connecting column and a protective plate; the protective plate is connected to the mounting seat via the connecting column, and the protective plate is located on the side of the second surface away from the first surface; the power source and the support plate are both located between the protective plate and the mounting plate.

[0015] In order to solve the above problems, on the other hand, an embodiment of the utility model provides a detection device, including a carrier, a driving module and the probe module described in any one of the above items; the carrier is used to place the circuit board to be tested, and the carrier is provided with a first guide hole; the driving module is connected to the probe module, and is used to drive the probe module to approach or move away from the carrier; when the probe module is close to the carrier, the first guide column can extend into the first guide hole, and the first probe can electrically interfere with the detection point of the circuit board to be tested on the carrier.

[0016] In the probe module and detection device provided in the embodiment of the utility model, the first connecting module can shake along the radial direction of the first guide column, thereby driving the first guide column to shake along its own radial direction. When the installation of the first guide column has a certain deviation, it can ensure that the first guide column can enter the first guide hole through its own shaking, so that the alignment and cooperation between the first guide column and the first guide hole can be facilitated, and the positioning accuracy requirement of the first guide column and the first guide hole can be reduced, thereby reducing the installation accuracy requirement of the first guide column during assembly, thereby facilitating the assembly of the probe module. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 This is a schematic diagram of the structure of a probe module provided by an embodiment of the utility model. Figure 1 ;

[0018] Figure 2 The structure of the probe module provided by an embodiment of the utility model is schematically shown in FIG. Figure 2 ;

[0019] Figure 3 Figure 2 A magnified view of the N region;

[0020] Figure 4 An exploded view of a probe module provided by an embodiment of the utility model;

[0021] Figure 5 A schematic structural diagram of a first connecting module of a probe module provided in another embodiment of the present invention.

[0022] The reference numerals in the specification are as follows:

[0023] 100. Probe module; 1. Mounting seat; 11. First surface; 12. Second surface; 13. First window; 14. Mounting plate; 15. Back plate; 151. Avoidance hole; 2. First connecting module; 21. Limiting part; 22. Connecting part; 3. First probe; 4. First guide column; 6. Second guide column; 7. Limiting block; 8. Driving unit; 81. Power source; 82. Support plate; 9. Second probe; 10. Second connecting module; 101. First section structure; 102. Second section structure; 103. Third section structure; 20. Stop member; 30. Connecting column; 40. Protective plate. DETAILED DESCRIPTION

[0024] In order to make the technical problems, technical solutions and beneficial effects solved by the utility model more clear, the utility model is further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the utility model and are not used to limit the utility model.

[0025] like Figure 1As shown, in one embodiment, the detection device includes a workbench, a carrier, a drive module and a probe module 100. The carrier and the drive module are both connected to the workbench, the carrier is used to place the circuit board to be tested, and the drive module is connected to the probe module 100, and is used to drive the probe module 100 to approach or move away from the carrier. When the needle mold module 100 approaches the carrier, the needle mold module 100 can electrically conflict with the detection point of the circuit board to be tested on the carrier. Among them, there are multiple detection points, each detection point can electrically conflict with the needle mold module 100 at the same time, or a part of each detection point can electrically conflict with the probe module at the same time. In addition, "multiple" means greater than or equal to two. In addition, the circuit board to be tested can be an FPC or a PCB.

[0026] In an actual scenario, the probe module 100 is located above the carrier, and the driving module mainly drives the probe module 100 to move downward, thereby making the probe module 100 close to the carrier.

[0027] The detection device also includes a detector, which is electrically connected to the probe module 100. When the probe module 100 is electrically in contact with the detection point of the circuit board to be tested, the electrical connection between the detector and the detection point can be achieved, and the detector can then detect the circuit board to be tested. The detection of the circuit board to be tested by the detector belongs to the prior art, and the detector can also be of an existing design.

[0028] like Figures 1 to 4 As shown, in one embodiment, the probe module 100 includes a mounting seat 1, a first connecting module 2, a first probe 3 and a first guide column 4. The mounting seat 1 is used to connect with the driving module, and a mounting cavity is provided in the mounting seat 1; the mounting seat 1 also has a first surface 11 and a second surface 12 arranged opposite to each other, and a first window 13 extending from the first surface 11 to the mounting cavity; the first connecting module 2 is limited in the mounting cavity and exposed from the first window 13; the first end of the first guide column 4 and the first end of the first probe 3 are both connected to the first connecting module 2 through the first window 13; the second end of the first guide column 4 and the second end of the first probe 3 are located on the side of the first surface 11 away from the second surface 12; the distance between the second end of the first guide column 4 and the first surface 11 is greater than the first The distance between the second end of the probe 3 and the first surface 11; the first guide column is used to cooperate with the first guide hole on the carrier; the first connecting module 2 can shake along the radial direction of the first guide column 4, thereby driving the first guide column 4 to shake along its own radial direction. When the installation of the first guide column 4 has a certain deviation, it can ensure that the first guide column 4 can enter the first guide hole through its own shaking, so that the alignment and cooperation between the first guide column 4 and the first guide hole can be facilitated, and the positioning accuracy requirements of the first guide column 4 and the first guide hole can be reduced, thereby reducing the requirements for the installation accuracy of the first guide column 4 during assembly, thereby facilitating the assembly of the probe module.

[0029] In an actual scenario, the first surface 11 is located below the second surface 12. In addition, the shaking distance of the first guide column 4 along its own radial direction is usually small, so that the first guide column 4 can always be opposite to the opening of the first guide hole.

[0030] In this embodiment, the first connecting module 2 is limited to be located in the installation cavity, which means that at least a portion of the first connecting module 2 is located in the installation cavity, and when the portion moves in the installation cavity, it can interfere with the side wall of the installation cavity to prevent the portion from moving out of the installation cavity, so that the first connecting module 2 is always installed together.

[0031] In this embodiment, the first end of the first guide post 4 is connected to the first connection module 2 from the first window 13, which may mean that: the first end of the first guide post 4 extends into the accommodating cavity and is connected to the first connection module 2, or a part of the first connection module 2 is located in the first window 13, and the first end of the first guide post 4 is connected to the first connection module 2 in the first window 13; or a part of the first connection module 2 extends from the first window 13 (protrudes below the first surface 11), and in this case, the first end of the first guide post 4 is connected to the first connection module 2 below the first surface 11. Similarly, the first end of the first probe 3 is connected to the first connection module 2 from the first window 13, which may mean that: the first end of the first probe 3 extends into the accommodating cavity and is connected to the first connection module 2, or a part of the first connection module 2 is located in the first window 13, and the first end of the first probe 3 is connected to the first connection module 2 in the first window 13; or a part of the first connection module 2 extends from the first window 13 (protrudes below the first surface 11), and in this case, the first end of the first probe 3 is connected to the first connection module 2 below the first surface 11.

[0032] In this embodiment, the first end of the first guide column 4 and the second end of the first guide column 4 are two opposite ends of the first guide column 4 in the axial direction, and the first end of the first probe 3 and the second end of the first probe 3 are two opposite ends of the first probe 3 in the axial direction. The distance between the second end of the first guide column 4 and the first surface 11 refers to the distance between the end surface of the second end of the first guide column 4 and the first surface 11, and the distance between the second end of the first probe 3 and the first surface 11 refers to the distance between the end surface of the second end of the first probe 3 and the first surface 11.

[0033] In addition, the distance between the second end of the first guide column 4 and the first surface 11 is set to be greater than the distance between the second end of the first probe 3 and the first surface 11, so that the first guide column 4 can protect the first probe 3. For example, when the probe module 100 does not match the carrier, or the carrier is blocked by other objects, if the probe module 100 is close to the carrier, the first guide column 4 can hit the carrier (or other blocking objects) before the probe, thereby preventing the probe from being damaged by collision. In addition, the first end of the first guide column 4 and the second end of the first guide column 4 can be arranged along the direction from the second surface 12 to the first surface 11, and the first end of the first probe 3 and the second end of the first probe 3 can be arranged along the direction from the second surface 12 to the first surface 11. At the same time, the axis of the first guide column 4 can also be parallel to the axis of the first probe 3.

[0034] In one embodiment, in order to facilitate the first guide post 4 to enter the first guide hole, the second end of the first guide post 4 has a certain taper, and the cross-sectional diameter of the second end gradually decreases along the direction from the second end of the first guide post 4 to the second end of the first guide post 4. In addition, there are multiple first guide posts 4, each of which is arranged at intervals. In this case, there are also multiple first guide holes, and one first guide post 4 is matched with one first guide hole.

[0035] In addition, along the axial direction of the first guide hole, the first guide hole includes a first hole and a second hole connected in sequence, wherein the first hole is located between the second hole and the mounting seat 1 (i.e., the first hole is located above the second hole), and along the direction from the first hole to the second hole, the cross-sectional diameter of the first hole gradually decreases, the cross-sectional diameter of the second hole can remain unchanged, and the minimum cross-sectional diameter of the first hole can be equal to the cross-sectional diameter of the second hole. During operation, the first hole can guide the first guide column 4, which is conducive to the first guide column 4 entering the first guide hole. At the same time, when the first guide column 4 enters the second hole, the relative position relationship between the first connection module 2 and the carrier can be defined through the cooperation of the second hole and the first guide column 4.

[0036] In one embodiment, the first probe 3 can move along the axis direction of the first guide column 4 with the mounting seat 1 to contact the detection point of the circuit board to be tested on the carrier; the first connecting module 2 can move relative to the mounting seat 1 along the axial direction of the first guide column 4 to approach or move away from the first surface 11; that is, the first connecting module 2 can shake in the vertical direction in addition to being able to shake horizontally. The probe module 100 includes an elastic member, which is connected to the first connecting module 2. When the first connecting module 2 is away from the first surface 11, it can apply force to the elastic member to deform the elastic member. When the first probe 3 contacts the detection point of the circuit board to be tested, the first probe 3 can be buffered by the elastic member to reduce the impact force of the first probe 3 on the circuit board to be tested, which can also reduce the impact force received by the first probe 3, thereby increasing the service life of the first probe 3. In addition, through the reaction force applied by the elastic member to the first connecting module 2, the first connecting module 2 can also be pressed tightly against the carrier, thereby ensuring the compression amount when the first probe 3 contacts the circuit board to be tested on the carrier.

[0037] The elastic member may be a spring, etc., which may be compressed between the first connection module 2 and the side wall of the installation cavity, wherein the elastic member is located in the installation cavity and above the first connection module 2. In addition, a corresponding accommodating hole is provided on the first connection module 2, and the elastic member is installed in the accommodating hole and extends out of the accommodating hole so as to contact the side wall of the accommodating cavity.

[0038] like Figure 1 and Figure 4 As shown, in one embodiment, the mounting seat 1 includes a mounting plate 14 and a back plate 15; the mounting plate 14 is provided with a mounting groove 141, and the back plate 15 closes the mounting groove 141 to form a mounting cavity; the first window 13 is arranged on the bottom surface of the mounting groove 141, and penetrates to the surface of the mounting plate 14 away from the back plate 15. Among them, the mounting groove 141 is arranged on the upper surface of the mounting plate 14, and the back plate 15 is also arranged on the upper surface of the mounting plate 14, and closes the opening of the mounting groove located on the upper surface of the mounting plate 14 to enclose and form a mounting cavity. In addition, the first surface 11 and the second surface 12 of the mounting seat 1 can both be surfaces of the mounting plate 14, wherein the first surface 11 can be the lower surface of the mounting plate 14, and the second surface 12 can be the upper surface of the mounting plate 14.

[0039] like Figure 1 As shown, the back plate 15 is provided with an avoidance hole 151, which penetrates from the surface of the back plate 15 away from the first surface 11 to communicate with the installation cavity; the first probe 3 can be electrically connected to the detector through the avoidance hole 151. Among them, the first probe 3 can be electrically connected to the detector through a corresponding conductive wire. This arrangement can separate the conductive wire connecting the first probe 3 and the detector from the first probe 3 and the first guide column 4, etc., up and down, effectively avoiding the occurrence of interference problems.

[0040] In one embodiment, a mounting hole is provided on the first connection module 2, and the mounting hole passes through the upper surface of the first connection module 2 to the lower surface of the first connection module 2. The first probe is installed in the mounting hole and extends out of the mounting hole from the lower end of the mounting hole. One end of the conductive wire can be electrically connected to the upper end of the probe in the mounting hole, and the other end of the conductive wire is electrically connected to the detector. When the lower end of the first probe is electrically in contact with the detection point of the circuit board to be tested, the detector is electrically connected to the detection point.

[0041] like Figure 3 and Figure 5 As shown, in one embodiment, the first connecting module 2 can extend out of the installation cavity from the first window 13. Specifically, the first connecting module 2 includes a limiting portion 21 and a connecting portion 22 connected in sequence, the limiting portion 21 is limited in the installation cavity, and the connecting portion 22 extends out of the installation cavity from the first window 13, and the first probe 3 and the first guide column 4 are both connected to the connecting portion 22.

[0042] In one embodiment, there are multiple first connection modules 2 and multiple installation cavities, one first connection module 2 is limited in one installation cavity, and one or more first probes are provided on each first connection module 2. In this case, the probe module 100 can be used to contact multiple circuit boards to be tested at the same time.

[0043] like Figure 1 and Figure 4 As shown, in one embodiment, the probe module 100 also includes a second guide column 6, the first end of which is connected to the mounting seat 1, and is used to cooperate with the second guide hole on the carrier; the second end of the second guide column 6 is located on the side of the first surface 11 away from the second surface 12, that is, the second end of the second guide column 6 and the second end of the first guide column 4 are located on the same side of the first surface 11; the distance between the second end of the second guide column 6 and the first surface 11 is greater than the distance between the second end of the first guide column 4 and the first surface 11, so that the first guide column 4 can extend into the first guide hole after the second guide column 6 extends into the second guide hole for a certain distance. Wherein, there are multiple second guide columns 6, and each second guide column 6 is arranged at intervals. At this time, there are also multiple second guide holes, and one second guide column cooperates with one second guide hole.

[0044] The first end of the second guide column 6 and the second end of the second guide column 6 are two opposite ends in the axial direction of the second guide column 6. The second guide column 6 can be installed below the mounting seat 1.

[0045] In this embodiment, when the probe module 100 moves toward the carrier, the second guide post 6 can first extend into the second guide hole; then, when the probe module 100 continues to approach the carrier, the first guide post 4 extends into the first guide hole. In addition, the second guide post 6 and the second guide hole can be used to position the probe module 100 and the carrier, so that the first guide post 4 is opposite to the opening of the first guide hole, ensuring that when the probe module continues to approach the carrier, the first guide post 4 can smoothly enter the first guide hole.

[0046] The matching tolerance between the second guide post 6 and the second guide hole is greater than the matching tolerance between the first guide post 4 and the first guide hole; wherein, the matching tolerance between the second guide post 6 and the second guide hole is larger, and the relative position of the probe module 100 and the carrier can be roughly positioned; the matching tolerance between the first guide post 4 and the first guide hole is smaller, and the relative position of the probe module 100 and the carrier can be accurately positioned. At this time, the machining accuracy requirement of the second guide post 6 is lower than that of the first guide post 4, and the machining accuracy requirement of the second guide hole is lower than that of the first guide hole.

[0047] Moreover, the first guide post 4 can be protected by the second guide post 6. For example, when the probe module 100 does not match the carrier, or the carrier is blocked by other objects, if the probe module 100 is close to the carrier, the second guide post 6 can contact the carrier (or other blocking objects) before the first guide post 4, thereby preventing the first guide post 4 from being damaged by collision. Since the processing accuracy of the second guide post 6 is lower than that of the first guide post 4, the cost of the second guide post 6 is lower than that of the first guide post 4. Protecting the first guide post 4 by the second guide post 6 can also reduce maintenance costs.

[0048] In addition, the first end of the second guide column 6 and the second end of the second guide column 6 may be arranged along the direction from the second surface 12 to the first surface 11 , and the axis of the second guide column 6 may also be parallel to the axis of the first guide column 4 .

[0049] like Figure 1 and Figure 4 As shown, in one embodiment, the probe module 100 further includes a stopper 7, which is connected to the first surface 11 of the mounting base 1. When the mounting base 1 is close to the carrier, the stopper 7 can collide with the carrier, thereby limiting the maximum distance of the first probe 3 moving close to the carrier. When the stopper 7 collide with the carrier, the first probe 3 has already collided with the detection point of the circuit board to be tested on the carrier.

[0050] like Figure 1As shown, in one embodiment, the probe module 100 also includes a driving unit 8, a second probe 9 and a second connection module 10; the driving unit 8 is connected to the mounting base 1 and is connected to the second connection module 10; the second probe 9 is connected to the second connection module 10 and is located on the side of the first surface 11 away from the second surface 12; the driving unit 8 is used to drive the second connection module 10 to move radially along the first guide column 4, so that the second probe 9 can contact the detection point of the circuit board to be tested placed on the carrier. That is, the probe module 100 in this solution can be used to detect the circuit board to be tested from two directions, so that even if the circuit board to be tested is an L-shaped structure, the probe module 100 of this embodiment can be used to lead out the detection points on the two L-shaped board surfaces to be electrically connected to the detector, thereby improving the scope of application of the probe module 100.

[0051] like Figure 1 and Figure 4 As shown, in one embodiment, the driving unit 8 includes a power source 81 and a support plate 82; the power source 81 is connected to the mounting seat 1 and is connected to the support plate 82, and is used to drive the support plate 82 to move radially along the first guide column; the support plate 82 is located on the side of the second surface 12 away from the first surface 11, and a second window 142 is provided on the mounting plate 14, and the second connecting module 10 is connected to the support plate 82 from the second window 142. This arrangement can make the entire probe module 100 more compact and integrated. Among them, the setting of the second window 142 is mainly to play a evasive role, so as to facilitate the connection between the support plate 82 and the second connecting module 10. In addition, the power source 81 can be a device such as a cylinder that can drive an object to move in a straight line. In addition, the power source 81 is connected to the mounting plate 14.

[0052] like Figure 4 As shown, the support plate 82 is provided with a third window 821, and the back plate 15 is located in the third window 821, wherein the third window 821 is for avoiding interference between the support plate and the back plate 15, and at the same time, this can also make the entire probe module more integrated. In addition, the third window 821 can be through the surface of the support plate 82 close to the mounting plate 14 to the surface of the support plate 82 away from the mounting plate 14.

[0053] like Figure 4 As shown, the driving unit 8 further includes a guide mechanism 83, which connects the mounting seat 1 and the support plate 82 and is used to guide the radial movement of the support plate 82 along the first guide column 4. The guide mechanism 83 actually connects the mounting plate 14 and the support plate 82. In addition, the guide mechanism 83 can be a mechanism composed of a guide rail slider.

[0054] like Figure 1 and Figure 4As shown, in one embodiment, the probe module 100 further includes a stopper 20, which is connected to the mounting base 1. When the power source 81 drives the support plate 82 to move radially along the first guide column 4, so that the second probe 9 approaches the circuit board to be tested on the carrier, the support plate 82 can contact the stopper 20 to limit the maximum moving distance of the second probe 9 toward the carrier. The stopper 20 is actually installed on the upper surface of the support plate 82.

[0055] like Figure 4 As shown, in one embodiment, the second connecting module 10 includes a first section structure 101, a second section structure 102 and a third section structure 103 which are connected in sequence, wherein the first section structure 101, the second section structure 102 and the third section structure 103 are connected to form a Z-shaped structure, the side of the first section structure 101 facing away from the second section structure 102 is connected to the support plate 82, the third section structure 103 is located on the side of the second section structure facing away from the support plate 82, and the second probe 9 is connected to the third section structure.

[0056] like Figure 1 and Figure 4 As shown, in one embodiment, the probe module 100 further includes a connecting column 30 and a protective plate 40, the protective plate 40 is connected to the mounting seat 1 through the connecting column 30, and the protective plate 40 is located on the side of the second surface 12 away from the first surface 11; the power source 81 and the support plate 82 are both located between the protective plate 40 and the mounting plate 14, and the parts between the two can be protected by the protective plate 40 and the mounting seat 1, effectively avoiding collision with other parts. In addition, the drive module can be the side of the connected protective plate 40 away from the mounting seat 1.

[0057] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0058] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A probe module, characterized in that: It includes a mounting seat, a first connecting module, a first probe and a first guide column; The mounting seat is used to connect with the driving module, and a mounting cavity is provided in the mounting seat; the mounting seat also has a first surface and a second surface arranged opposite to each other, and a first window extending from the first surface to the first window communicating with the mounting cavity; The first connection module is limited in the installation cavity and exposed from the first window; The first end of the first guide column and the first end of the first probe are both connected to the first connection module through the first window; The second end of the first guide column and the second end of the first probe are located on a side of the first surface away from the second surface; the distance between the second end of the first guide column and the first surface is greater than the distance between the second end of the first probe and the first surface; The first guide column is used for guiding and cooperating with the first guide hole on the carrier; The first connecting module can rock along the radial direction of the first guide column.

2. The probe module according to claim 1, characterized in that: The probe module further includes a second guide column, a first end of which is connected to the mounting seat and is used to cooperate with a second guide hole on the carrier; The second end of the second guide post is located on a side of the first surface away from the second surface; The distance between the second end of the second guide post and the first surface is greater than the distance between the second end of the first guide post and the first surface, so that the first guide post can extend into the first guide hole after the second guide post extends into the second guide hole for a certain distance.

3. The probe module according to claim 1, characterized in that: The first probe can move along the axis direction of the first guide column with the mounting seat to contact the detection point of the circuit board to be tested on the carrier; The first connecting module can move relative to the mounting seat along the axial direction of the first guide column to approach or move away from the first surface; The probe module includes an elastic member, and the elastic member is connected to the first connection module. When the first connection module is away from the first surface, force can be applied to the elastic member to deform the elastic member.

4. The probe module according to claim 1, characterized in that: The mounting base includes a mounting plate and a back plate; The mounting plate is provided with a mounting groove, and the back plate closes the mounting groove to form the mounting cavity; The first window is arranged on the bottom surface of the mounting groove and penetrates to the surface of the mounting plate facing away from the back plate.

5. The probe module according to claim 4, characterized in that: The back plate is provided with an avoidance hole, and the avoidance hole penetrates from the surface of the back plate away from the first surface to communicate with the installation cavity; The first probe can be electrically connected to a detector through the avoidance hole.

6. The probe module according to claim 1, characterized in that: The first connection module includes a limiting portion and a connecting portion connected in sequence, the limiting portion is limited in the installation cavity, the connecting portion extends out of the installation cavity from the first window, and the first probe and the first guide column are both connected to the connecting portion.

7. The probe module according to claim 4, characterized in that: The probe module also includes a driving unit, a second probe and a second connection module; The driving unit is connected to the mounting seat and is connected to the second connecting module; The second probe is connected to the second connection module and is located on a side of the first surface facing away from the second surface; The driving unit is used to drive the second connection module to move along the radial direction of the first guide column, so that the second probe can contact the detection point of the circuit board to be tested placed on the carrier.

8. The probe module according to claim 7, characterized in that: The driving unit includes a power source and a support plate; The power source is connected to the mounting seat and to the support plate, and is used to drive the support plate to move radially along the first guide column; The support plate is located on a side of the second surface away from the first surface, a second window is provided on the mounting plate, and the second connecting module is connected to the support plate through the second window.

9. The probe module according to claim 8, characterized in that: The probe module also includes a connecting column and a protective plate; The protective plate is connected to the mounting seat through the connecting column, and the protective plate is located on a side of the second surface away from the first surface; The power source and the support plate are both located between the protection plate and the mounting plate.

10. A detection device, characterized in that: It comprises a carrier, a driving module and the probe module according to any one of claims 1 to 9; The carrier is used to place the circuit board to be tested, and a first guide hole is provided on the carrier; The driving module is connected to the probe module and is used to drive the probe module to approach or move away from the carrier; When the probe module is close to the carrier, the first guide column can extend into the first guide hole, and the first probe can electrically contact the detection point of the circuit board to be tested on the carrier.

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